CN105187053B - A kind of metastable state and eliminate circuit for TDC - Google Patents

A kind of metastable state and eliminate circuit for TDC Download PDF

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CN105187053B
CN105187053B CN201510562858.1A CN201510562858A CN105187053B CN 105187053 B CN105187053 B CN 105187053B CN 201510562858 A CN201510562858 A CN 201510562858A CN 105187053 B CN105187053 B CN 105187053B
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flip
flop
rising edge
clock signal
input terminal
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CN105187053A (en
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甄少伟
刘俐宏
尤帅
艾国润
罗萍
贺雅娟
张波
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University of Electronic Science and Technology of China
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Abstract

The invention belongs to electronic circuit technology field, more particularly to a kind of metastable state and eliminate circuit for TDC.The circuit primary structure of the present invention is made up of the first rising edge d type flip flop, the second rising edge d type flip flop, the 3rd rising edge d type flip flop, the first trailing edge d type flip flop and the second trailing edge d type flip flop;The D input termination external input signals of the D inputs of first rising edge d type flip flop, the first trailing edge trigger;The Q output of second rising edge d type flip flop connects the clock signal input terminal of the 3rd rising edge d type flip flop;The Q output of second trailing edge d type flip flop connects the D inputs of the 3rd rising edge d type flip flop.Beneficial effects of the present invention are that while the result after ensureing that time figure quantifies has identical range and resolution ratio with traditional TDC, can effectively eliminate timing error caused by metastable state, greatly improve the reliability of TDC precision.

Description

一种用于TDC的亚稳态消除电路A Metastable Elimination Circuit for TDC

技术领域technical field

本发明属于电子电路技术领域,具体的说涉及一种用于TDC的亚稳态消除电路。The invention belongs to the technical field of electronic circuits, and in particular relates to a metastable state elimination circuit for TDC.

背景技术Background technique

时间间隔测量技术在很多领域都有着大量的应用。它不仅在原子物理、激光测距、定位定时等方面,还在时间间隔测量技术、自动检测设备领域有着广泛的应用;此外,在国防工业中,时间间隔测量作为一种重要的鉴别和探测手段,对精度的要求非常严格,甚至达到了皮秒量级。因此,高精度的TDC电路有着重要的作用。Time interval measurement technology has a large number of applications in many fields. It is not only widely used in atomic physics, laser ranging, positioning and timing, but also in the field of time interval measurement technology and automatic detection equipment; in addition, in the defense industry, time interval measurement is an important means of identification and detection , the requirements for accuracy are very strict, even reaching the level of picoseconds. Therefore, a high-precision TDC circuit plays an important role.

典型的全数字时间转换器采用DLL和计数器两级结构对时间进行量化。其基本思想是通过一个时钟计数测量start信号上升沿与stop信号上升沿之间这段时间,TDC的量程主要由计数器计数范围决定,而分辨率取决于DLL。一种典型的基于此思想的TDC电路图如图1,其时序图如图2,粗值计数器实现nTclk的计时;锁存编码模块实现△Tstart和△Tstop两部分的计时;数据处理模块将DLL采样得到的8位输出进行编码并计算得到两个计时部分的差值ε=△Tstop-△Tstart,然后根据差值给粗值计数模块一个进位信号c。数据处理模块与粗值计数器模块两部分计时输出并成转换时间△T,即为要测量的start与stop信号上升沿间的时间间隔。由图2可得△T=nTclk-△Tstart+△Tstop,其中Tclk为时钟周期,△Tstart和△Tstop为开始和结束的时间测量误差,n为△T内计数器的计数值。记时间到数字的转换误差为ε=△Tstop-△Tstart,可得△T=nTclk+ε。A typical all-digital time converter uses a DLL and a counter two-stage structure to quantify time. The basic idea is to measure the time between the rising edge of the start signal and the rising edge of the stop signal by counting a clock. The range of the TDC is mainly determined by the counting range of the counter, and the resolution depends on the DLL. A typical TDC circuit diagram based on this idea is shown in Figure 1, and its timing diagram is shown in Figure 2. The coarse value counter realizes the timing of nT clk ; the latch encoding module realizes the timing of △T start and △T stop ; the data processing module Encode the 8-bit output sampled by the DLL and calculate the difference between the two timing parts ε=△T stop -△T start , and then give a carry signal c to the rough value counting module according to the difference. The timing output of the data processing module and the rough value counter module is combined into a conversion time △T, which is the time interval between the rising edges of the start and stop signals to be measured. From Figure 2, △T=nT clk - △T start + △T stop , where T clk is the clock cycle, △T start and △T stop are the start and end time measurement errors, and n is the count of the counter in △T value. Note that the conversion error from time to number is ε=△T stop -△T start , and △T=nT clk +ε can be obtained.

图3是DLL的电路图,理想情况下,DLL将时钟均分为8个相位,start信号到来时对每个输出相位采样,其时序图如图4。实际上由于占空比畸变、信号抖动、延迟偏差等原因会有偏差,start在特殊采样位置可能出现亚稳态。由图1所示,△Tstart的计算只与d[7:0]的上升沿有关,所以考虑start信号到来时d[7:0]信号上升沿的位置。①②为一对采样位置,③④为另一对采样位置。Figure 3 is a circuit diagram of the DLL. Ideally, the DLL divides the clock into 8 phases, and samples each output phase when the start signal arrives. The timing diagram is shown in Figure 4. In fact, there will be deviations due to duty cycle distortion, signal jitter, delay deviation, etc., and start may appear metastable at a special sampling position. As shown in Figure 1, the calculation of △T start is only related to the rising edge of d[7:0], so consider the position of the rising edge of d[7:0] signal when the start signal arrives. ①② is a pair of sampling positions, ③④ is another pair of sampling positions.

由于采样时的D触发器存在建立和保持时间,在①②位置时,start对d[7:0]采样,由于d[7]处于翻转的状态,有可能出现亚稳态,导致采样结果错误。从而△Tstart有可能从Tclk到0ns的跳变;或者相反,有可能从0ns到Tclk的跳变,致使TDC的计数出现很大的偏差。Due to the setup and hold time of the D flip-flop during sampling, start samples d[7:0] at position ①②. Since d[7] is in an inverted state, a metastable state may occur, resulting in an error in the sampling result. Therefore, △T start may jump from T clk to 0ns; or on the contrary, it may jump from 0ns to T clk , resulting in a large deviation in the TDC count.

start在③④位置对d[7:0]采样时,由于d[2]处于翻转的状态,虽然也可能产生亚稳态,但是会在d[1]和d[3]处采样到正确的值,所以△Tstart只有一个相位的误差,可以忽略不计。When start samples d[7:0] at position ③④, since d[2] is in an inverted state, although a metastable state may also occur, the correct value will be sampled at d[1] and d[3] , so △T start has only one phase error, which can be ignored.

发明内容Contents of the invention

本发明所要解决的,就是针对上述问题,提出一种用于TDC的亚稳态消除电路。What the present invention aims to solve is to propose a metastability elimination circuit for TDC in view of the above problems.

为实现上述目的,本发明采用如下技术方案:To achieve the above object, the present invention adopts the following technical solutions:

一种用于TDC的亚稳态消除电路,该电路由第一上升沿D触发器、第二上升沿D触发器、第三上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器构成;A metastability elimination circuit for TDC, the circuit consists of a first rising edge D flip-flop, a second rising edge D flip-flop, a third rising edge D flip-flop, a first falling edge D flip-flop and a second falling edge D flip-flop Formed along the D flip-flop;

所述第一上升沿D触发器的D输入端接外部输入信号,其时钟信号输入端接外部时钟信号,其Q输出端接第二上升沿D触发器的D输入端;第二上升沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的时钟信号输入端;第一下降沿触发器的D输入端接外部输入信号,其时钟信号输入端接外部时钟信号,其Q输出端接第二下降沿D触发器的D输入端;第二下降沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的D输入端;所述第一上升沿D触发器、第二上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器连接相同的外部时钟信号;第三上升沿触发器的Q输出端为亚稳态消除电路的输出端。The D input terminal of the first rising edge D flip-flop is connected to an external input signal, its clock signal input terminal is connected to an external clock signal, and its Q output terminal is connected to the D input terminal of the second rising edge D flip-flop; the second rising edge D The clock signal input terminal of the flip-flop is connected to the external clock signal, and its Q output terminal is connected to the clock signal input terminal of the third rising edge D flip-flop; the D input terminal of the first falling edge flip-flop is connected to the external input signal, and its clock signal input terminal Connect the external clock signal, its Q output terminal is connected to the D input terminal of the second falling edge D flip-flop; the clock signal input terminal of the second falling edge D flip-flop is connected to the external clock signal, and its Q output terminal is connected to the third rising edge D trigger The D input terminal of the device; the first rising edge D flip-flop, the second rising edge D flip-flop, the first falling edge D flip-flop and the second falling edge D flip-flop are connected to the same external clock signal; the third rising edge The Q output terminal of the flip-flop is the output terminal of the metastability elimination circuit.

本发明的有益效果为,在保证时间数字量化后的结果与传统TDC具有相同量程及分辨率的同时,能有效消除亚稳态产生的计时误差,极大的提高了TDC精度的可靠性。The beneficial effect of the invention is that, while ensuring that the result of time digital quantization has the same range and resolution as the traditional TDC, it can effectively eliminate the timing error caused by the metastable state, and greatly improve the reliability of the TDC accuracy.

附图说明Description of drawings

图1典型TDC电路结构;Figure 1 Typical TDC circuit structure;

图2为典型时间数字转换原理时序图;Fig. 2 is a timing diagram of a typical time-to-digital conversion principle;

图3为DLL模块结构图;Fig. 3 is a DLL module structural diagram;

图4为start特殊采样可能出现亚稳态的位置示意图;Figure 4 is a schematic diagram of the position where the metastable state may occur in the special sampling of start;

图5为本发明亚稳态消除电路的逻辑结构示意图;Fig. 5 is a schematic diagram of the logical structure of the metastable state elimination circuit of the present invention;

图6为本发明亚稳态消除电路的应用图;Fig. 6 is the application diagram of the metastable state elimination circuit of the present invention;

图7为本发明电路在采样位置为图4中①位置处的时序图;Fig. 7 is the time sequence diagram at the sampling position of the circuit of the present invention at position ① in Fig. 4;

图8为本发明电路在采样位置为图4中②位置处的时序图;Fig. 8 is a timing diagram at the sampling position of the circuit of the present invention at position ② in Fig. 4;

图9含本发明结构的TDC的计数器部分时序图;Fig. 9 contains the partial sequence diagram of the counter of the TDC of structure of the present invention;

图10为传统TDC线性度示意图;Figure 10 is a schematic diagram of traditional TDC linearity;

图11为采用本发明电路结构的TDC线性度示意图。Fig. 11 is a schematic diagram of TDC linearity using the circuit structure of the present invention.

具体实施方式detailed description

下面结合附图和实施例,详细描述本发明的技术方案:Below in conjunction with accompanying drawing and embodiment, describe technical solution of the present invention in detail:

本发明为消除传统TDC采用DLL和计数器量化时间间隔时亚稳态情况产生的计时误差,添加了亚稳态消除逻辑电路。消除亚稳态后的TDC与典型TDC精度一样,唯一不同在于,当start在图4①②位置采样的时候,典型TDC很可能不能正确采样,使量化结果较正确结果有一个时钟周期的偏差,是非常严重的偏差。而增加亚稳态消除逻辑后的电路在不能正确采样后DLL的量化结果会有一个时钟周期的偏差,同时也会给计数器一个信号start_clk,使计数n也产生偏差1,如图9所示,其中start_clk是start经过边沿同步后产生的信号;stop_clk是stop经过边沿同步后产生的信号;start_stop是start_clk和stop_clk经过使能模块后产生的信号,作为计数器的使能信号;clk_dealy是clk经过延迟的信号;gated_clk_delay是start_stop和clk_dealy经过两输入与门后的信号,作为计数器的计数信号。由于,start亚稳态采样产生的n与△Tstart两部分量化误差抵消了,从而实现了start采样亚稳态的消除。In order to eliminate the timing error caused by metastable state when the traditional TDC adopts DLL and counter to quantify the time interval, the invention adds a metastable state elimination logic circuit. The TDC after eliminating the metastable state has the same accuracy as the typical TDC. The only difference is that when the start is sampled at the position ①② in Figure 4, the typical TDC may not be sampled correctly, so that the quantized result has a clock cycle deviation from the correct result, which is very Serious deviation. However, the circuit after adding the metastable state elimination logic will have a deviation of one clock period in the quantization result of the DLL after sampling incorrectly. At the same time, it will also give the counter a signal start_clk, so that the count n will also have a deviation of 1, as shown in Figure 9. Among them, start_clk is the signal generated by start after edge synchronization; stop_clk is the signal generated by stop after edge synchronization; start_stop is the signal generated by start_clk and stop_clk after passing through the enable module, as the enable signal of the counter; clk_dealy is the delayed clk Signal; gated_clk_delay is the signal after start_stop and clk_dealy pass through the two-input AND gate, which is used as the counting signal of the counter. Because the quantization errors of n and △T start produced by the start metastable state sampling are offset, the elimination of the start sampling metastable state is realized.

本发明的结构如图5所示,其中start_clk是start经过上升沿同步后产生的信号,start_nclk是start经过下降沿同步后产生的信号,Q_nclk是时钟下降沿对start采样输出信号,输出s_out是电路判断结果。The structure of the present invention is shown in Figure 5, wherein start_clk is the signal generated by start after rising edge synchronization, start_nclk is the signal generated by start after falling edge synchronization, Q_nclk is the sampling output signal of start on the falling edge of the clock, and the output s_out is the circuit critical result.

本发明的结构如图5所示,该电路由第一上升沿D触发器、第二上升沿D触发器、第三上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器构成;所述第一上升沿D触发器的D输入端接外部输入信号,其时钟信号输入端接外部时钟信号,其Q输出端接第二上升沿D触发器的D输出端;第二上升沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的时钟信号输入端;第一下降沿触发器的D输入端接外部输入信号t,其时钟信号输入端接外部时钟信号,其Q输出端接第二下降沿D触发器的D输入端;第二下降沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的D输入端;所述第一上升沿D触发器、第二上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器连接相同的外部时钟信号;第三上升沿触发器的Q输出端为亚稳态消除电路的输出端。The structure of the present invention is shown in Figure 5. The circuit consists of a first rising edge D flip-flop, a second rising edge D flip-flop, a third rising edge D flip-flop, a first falling edge D flip-flop and a second falling edge D flip-flop. A flip-flop is formed; the D input terminal of the first rising edge D flip-flop is connected to an external input signal, its clock signal input terminal is connected to an external clock signal, and its Q output terminal is connected to the D output terminal of the second rising edge D flip-flop; The clock signal input terminal of the second rising edge D flip-flop is connected to the external clock signal, and its Q output terminal is connected to the clock signal input terminal of the third rising edge D flip-flop; the D input terminal of the first falling edge flip-flop is connected to the external input signal t, Its clock signal input terminal is connected to an external clock signal, and its Q output terminal is connected to the D input terminal of the second falling edge D flip-flop; the clock signal input terminal of the second falling edge D flip-flop is connected to an external clock signal, and its Q output terminal is connected to the second falling edge D flip-flop. D input terminals of three rising edge D flip-flops; the first rising edge D flip-flop, the second rising edge D flip-flop, the first falling edge D flip-flop and the second falling edge D flip-flop are connected to the same external clock signal ; The Q output terminal of the third rising edge trigger is the output terminal of the metastability elimination circuit.

本例的工作原理为:This example works as follows:

如图4所示,在采样位置①或②时,不会出现d[x:x-1]=01(x=6~1)的情况。则图6中采样位置判断模块由此区分外部输入信号start(或stop)是否出现在图4中的采样位置①或②。当判断出采样位置在①或②时,编码器采用亚稳态消除电路的输出信号s_out的结果编码,即当s_out=0,△Tstart赋值为Tclk;s_out=1,△Tstart赋值为0ns。否则,编码器正常编码,不受s_out影响。As shown in Figure 4, at the sampling position ① or ②, the situation of d[x:x-1]=01 (x=6~1) does not appear. The sampling position judging module in FIG. 6 thus distinguishes whether the external input signal start (or stop) appears at the sampling position ① or ② in FIG. 4 . When it is judged that the sampling position is in ① or ②, the encoder uses the result encoding of the output signal s_out of the metastable state elimination circuit, that is, when s_out=0, △T start is assigned as T clk ; s_out=1, △T start is assigned as 0ns. Otherwise, the encoder encodes normally and is not affected by s_out.

当start在图4位置①采样d[7:0]时,亚稳态消除逻辑其时序图如图7,若外部输入信号start与外部时钟信号clk信号时间间隔不满足D触发器建立时间,即不能采样,start_clk信号同步错误,设其为start_clk_wrong,由图9可知此时计数器计数结果会减小一个Tclk。start_clk_wrong采样start_nclk得到信号s_out_wrong=1,此时令△Tstart为0ns,较正确采样s_out=0时,△Tstart减小了Tclk。结合△T=nTclk-△Tstart+△Tstop可以发现△Tstart产生的误差由nTclk处调整后被消除。When start samples d[7:0] at position ① in Figure 4, the timing diagram of the metastable state elimination logic is shown in Figure 7. If the time interval between the external input signal start and the external clock signal clk signal does not meet the D flip-flop setup time, that is Sampling is not possible, and the start_clk signal is synchronously wrong. Let it be start_clk_wrong. It can be seen from Figure 9 that the counting result of the counter will decrease by one T clk at this time. start_clk_wrong samples start_nclk to get the signal s_out_wrong=1, at this time, △T start is 0ns, compared with the correct sampling s_out=0, △T start reduces T clk . Combined with △T=nT clk - △T start + △T stop , it can be found that the error generated by △T start is eliminated after being adjusted at nT clk .

当start在图4位置②采样d[7:0]时,亚稳态消除逻辑其时序图如图8,若start与clk信号时间间隔不满足D触发器建立时间,即不能采样,start_clk信号同步错误,设其为start_clk_wrong,由图9可知此时计数器计数结果会增加一个Tclk。start_clk_wrong采样start_nclk得到信号s_out_wrong=1,此时令△Tstart为Tclk,较正确采样s_out=0时,△Tstart增加了Tclk。结合△T=nTclk-△Tstart+△Tstop可以发现△Tstart产生的误差由nTclk处调整后被消除。When start samples d[7:0] at position ② in Figure 4, the timing diagram of the metastable state elimination logic is shown in Figure 8. If the time interval between start and clk signals does not meet the D flip-flop setup time, it cannot be sampled, and the start_clk signal is synchronized Wrong, set it as start_clk_wrong, it can be seen from Figure 9 that the counting result of the counter will increase by one T clk at this time. start_clk_wrong samples start_nclk to get the signal s_out_wrong=1, at this time, △T start is T clk , compared with the correct sampling s_out=0, △T start increases T clk . Combined with △T=nT clk - △T start + △T stop , it can be found that the error generated by △T start is eliminated after being adjusted at nT clk .

同理:△Tstop产生的误差也可被消除,从而消除了由于亚稳态的出现导致的计时误差。In the same way: the error generated by △T stop can also be eliminated, thereby eliminating the timing error caused by the occurrence of metastable state.

如图10和图11所示,相比典型TDC,本发明提出的带可消除亚稳态电路的TDC线性度更好,极大提高了时间量化结果的可靠性。As shown in FIG. 10 and FIG. 11 , compared with a typical TDC, the TDC with a circuit that can eliminate the metastable state proposed by the present invention has better linearity, which greatly improves the reliability of the time quantization result.

Claims (1)

1.一种用于TDC的亚稳态消除电路,该电路由第一上升沿D触发器、第二上升沿D触发器、第三上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器构成;1. A metastability elimination circuit for TDC, the circuit consists of the first rising edge D flip-flop, the second rising edge D flip-flop, the third rising edge D flip-flop, the first falling edge D flip-flop and the first falling edge D flip-flop Two falling edge D flip-flops are formed; 所述第一上升沿D触发器的D输入端接外部输入信号,其时钟信号输入端接外部时钟信号,其Q输出端接第二上升沿D触发器的D输入端;第二上升沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的时钟信号输入端;第一下降沿触发器的D输入端接外部输入信号,其时钟信号输入端接外部时钟信号,其Q输出端接第二下降沿D触发器的D输入端;第二下降沿D触发器的时钟信号输入端接外部时钟信号,其Q输出端接第三上升沿D触发器的D输入端;所述第一上升沿D触发器、第二上升沿D触发器、第一下降沿D触发器和第二下降沿D触发器连接相同的外部时钟信号;第三上升沿触发器的Q输出端为亚稳态消除电路的输出端;所述亚稳态消除电路用于在TDC不能正确采样后,使DLL的量化结果会有一个时钟周期的偏差,同时也会给计数器一个信号start_clk,使计数n也产生偏差1,且产生的计数偏差与时钟周期偏差两部分量化误差抵消,实现了采样亚稳态的消除。The D input terminal of the first rising edge D flip-flop is connected to an external input signal, its clock signal input terminal is connected to an external clock signal, and its Q output terminal is connected to the D input terminal of the second rising edge D flip-flop; the second rising edge D The clock signal input terminal of the flip-flop is connected to the external clock signal, and its Q output terminal is connected to the clock signal input terminal of the third rising edge D flip-flop; the D input terminal of the first falling edge flip-flop is connected to the external input signal, and its clock signal input terminal Connect the external clock signal, its Q output terminal is connected to the D input terminal of the second falling edge D flip-flop; the clock signal input terminal of the second falling edge D flip-flop is connected to the external clock signal, and its Q output terminal is connected to the third rising edge D trigger The D input terminal of the device; the first rising edge D flip-flop, the second rising edge D flip-flop, the first falling edge D flip-flop and the second falling edge D flip-flop are connected to the same external clock signal; the third rising edge The Q output end of the flip-flop is the output end of the metastable state elimination circuit; the metastable state elimination circuit is used to make the quantization result of the DLL have a clock cycle deviation after the TDC cannot sample correctly, and also give the counter A signal start_clk causes the count n to have a deviation of 1, and the generated count deviation and the clock cycle deviation are offset by two parts of the quantization error, which realizes the elimination of the sampling metastable state.
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102880071A (en) * 2012-09-24 2013-01-16 电子科技大学 Data acquisition system with high time stamp accuracy

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7292670B2 (en) * 2003-08-06 2007-11-06 Gennum Corporation System and method for automatically correcting duty cycle distortion

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102880071A (en) * 2012-09-24 2013-01-16 电子科技大学 Data acquisition system with high time stamp accuracy

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
一种基于线性增强TDC的ADPLL设计;徐洪闪;《微电子学》;20150831;第45卷(第4期);第507-511页 *
一种自校准全数字TDC的设计;夏婷婷等;《微电子学》;20141031;第44卷(第5期);第597-600页 *

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