CN105187053B - A kind of metastable state and eliminate circuit for TDC - Google Patents
A kind of metastable state and eliminate circuit for TDC Download PDFInfo
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- CN105187053B CN105187053B CN201510562858.1A CN201510562858A CN105187053B CN 105187053 B CN105187053 B CN 105187053B CN 201510562858 A CN201510562858 A CN 201510562858A CN 105187053 B CN105187053 B CN 105187053B
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- flip flop
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Abstract
The invention belongs to electronic circuit technology field, more particularly to a kind of metastable state and eliminate circuit for TDC.The circuit primary structure of the present invention is made up of the first rising edge d type flip flop, the second rising edge d type flip flop, the 3rd rising edge d type flip flop, the first trailing edge d type flip flop and the second trailing edge d type flip flop;The D input termination external input signals of the D inputs of first rising edge d type flip flop, the first trailing edge trigger;The Q output of second rising edge d type flip flop connects the clock signal input terminal of the 3rd rising edge d type flip flop;The Q output of second trailing edge d type flip flop connects the D inputs of the 3rd rising edge d type flip flop.Beneficial effects of the present invention are that while the result after ensureing that time figure quantifies has identical range and resolution ratio with traditional TDC, can effectively eliminate timing error caused by metastable state, greatly improve the reliability of TDC precision.
Description
Technical field
The invention belongs to electronic circuit technology field, more particularly to a kind of metastable state and eliminate circuit for TDC.
Background technology
Time interval measurement technology suffers from largely applying in many fields.It not only Atomic Physics, laser ranging,
Positioning timing etc., also had a wide range of applications in time interval measurement technology, automatic checkout equipment field;In addition, in state
In anti-industry, as a kind of important discriminating and detection means, the requirement to precision is very strict, or even reaches for time interval measurement
Picosecond magnitude is arrived.Therefore, high-precision TDC circuits play the role of important.
Typical digital time converter is quantified using DLL and counter two-layer configuration to the time.It thinks substantially
Think it is that this period, TDC range between start signals rising edge and stop signal rising edges are measured by a clock count
Mainly determined by rolling counters forward scope, and resolution ratio depends on DLL.A kind of typically TDC circuit diagrams based on this thought are such as
Fig. 1, its timing diagram such as Fig. 2, thick value counter realize nTclkTiming;Latch coding module and realize △ TstartWith △ TstopTwo
The timing divided;8 outputs that DLL is sampled to obtain by data processing module are encoded and the difference of two clocking portions are calculated
Value ε=△ Tstop-△Tstart, then give thick value counting module one carry signal c according to difference.Data processing module and thick value
The timing of counter module two parts exports and into conversion time △ T, between start the and stop signal rising edges as to be measured
Time interval.△ T=nT can be obtained by Fig. 2clk-△Tstart+△Tstop, wherein TclkFor clock cycle, △ TstartWith △ TstopFor
The time measurement error of beginning and end, n are the count value of △ T inside counting devices.The transformed error that numeral is arrived between clocking is ε=△
Tstop-△Tstart, △ T=nT can be obtainedclk+ε。
Fig. 3 is DLL circuit diagram, and ideally, clock is divided into 8 phases by DLL, when start signals arrive pair
Each output phase sampling, its timing diagram such as Fig. 4.Actually due to reason meetings such as dutycycle distortion, signal jitter, delay distortions
There is deviation, start is likely to occur metastable state in particular sample position.As shown in Figure 1, △ TstartCalculating only and d [7:0] upper
Rise along relevant, it is contemplated that d [7 when start signals arrive:0] position of signal rising edge.2. 1. it is a pair of sampling locations, 3.
4. it is another pair sampling location.
There is foundation and retention time in d type flip flop during due to sampling, at 1. 2. position, start is to d [7:0] sample,
Because d [7] is in the state of upset, it is possible to metastable state occur, cause sampled result mistake.So as to △ TstartBe possible to from
TclkTo 0ns saltus step;Or it is instead possible to from 0ns to TclkSaltus step, cause TDC counting very big deviation occur.
Start 3. 4. position to d [7:When 0] sampling, because d [2] is in the state of upset, although Asia may also be produced
Stable state, but correct value can be sampled in d [1] and d [3] place, so △ TstartThe error of only one phase, it can ignore
Disregard.
The content of the invention
It is to be solved by this invention, aiming above mentioned problem, propose a kind of metastable state and eliminate circuit for TDC.
To achieve the above object, the present invention adopts the following technical scheme that:
A kind of metastable state and eliminate circuit for TDC, the circuit are triggered by the first rising edge d type flip flop, the second rising edge D
Device, the 3rd rising edge d type flip flop, the first trailing edge d type flip flop and the second trailing edge d type flip flop are formed;
The D input termination external input signals of the first rising edge d type flip flop, when its clock signal input terminal connects outside
Clock signal, its Q output connect the D inputs of the second rising edge d type flip flop;The clock signal input of second rising edge d type flip flop
External timing signal is terminated, its Q output connects the clock signal input terminal of the 3rd rising edge d type flip flop;First trailing edge triggers
The D input termination external input signals of device, its clock signal input terminal connect external timing signal, and its Q output connects the second decline
Along the D inputs of d type flip flop;The clock signal input terminal of second trailing edge d type flip flop connects external timing signal, its Q output
Connect the D inputs of the 3rd rising edge d type flip flop;The first rising edge d type flip flop, the second rising edge d type flip flop, first decline
Along d type flip flop and the second trailing edge d type flip flop connection identical external timing signal;The Q output of 3rd rising edge flip-flops
For the output end of metastable state and eliminate circuit.
Beneficial effects of the present invention are, the result after ensureing that time figure quantifies and traditional TDC have identical range and
While resolution ratio, timing error caused by metastable state can be effectively eliminated, greatly improves the reliability of TDC precision.
Brief description of the drawings
Fig. 1 typical case's TDC circuit structures;
Fig. 2 is typical time period numeral transfer principle timing diagram;
Fig. 3 is DLL function structure charts;
Fig. 4 is that start particular samples are likely to occur metastable position view;
Fig. 5 is the logical construction schematic diagram of metastable state and eliminate circuit of the present invention;
Fig. 6 is the application drawing of metastable state and eliminate circuit of the present invention;
Fig. 7 is the 1. timing diagram of opening position during circuit of the present invention is Fig. 4 in sampling location;
Fig. 8 is the 2. timing diagram of opening position during circuit of the present invention is Fig. 4 in sampling location;
TDCs of the Fig. 9 containing structure of the present invention counter portion timing diagram;
Figure 10 is traditional TDC linearity degree schematic diagram;
Figure 11 is the TDC linearity degree schematic diagram using circuit structure of the present invention.
Embodiment
With reference to the accompanying drawings and examples, technical scheme is described in detail:
Timing caused by metastable state situation when the present invention uses DLL and counter quantization time interval for the traditional TDC of elimination
Error, it with the addition of metastable state eliminates logic circuit.The TDC after metastable state is eliminated as typical TDC precision, unique difference exists
In when start is when 1. 2. position samples Fig. 4, typical TDC is likely to correctly to sample, and makes quantized result more correct
As a result there is the deviation of a clock cycle, be very serious deviation.And increase the circuit after metastable state eliminates logic can not
DLL quantized result has the deviation of a clock cycle after correct sampling, while can also give one signal start_ of counter
Clk, counting n is set also to produce deviation 1, as shown in figure 9, wherein start_clk is start caused letters after edge synchronization
Number;Stop_clk is stop caused signals after edge synchronization;Start_stop is that start_clk and stop_clk passes through
Caused signal after enabled module, the enable signal as counter;Clk_dealy is signals of the clk by delay;gated_
Clk_delay is that start_stop and clk_dealy is inputted with signal behind the door by two, the count signal as counter.
Due to n and △ T caused by the sampling of start metastable statesstartTwo parts quantization error counteracts, it is achieved thereby that start samplings are sub-
The elimination of stable state.
The structure of the present invention as shown in figure 5, wherein start_clk is start caused signals after rising edge synch,
Start_nclk is start caused signals after trailing edge synchronization, and Q_nclk is that clock falling edge samples output to start
Signal, output s_out is circuit judges result.
The structure of the present invention as shown in figure 5, the circuit by the first rising edge d type flip flop, the second rising edge d type flip flop, the
Three rising edge d type flip flops, the first trailing edge d type flip flop and the second trailing edge d type flip flop are formed;The first rising edge D triggerings
The D input termination external input signals of device, its clock signal input terminal connect external timing signal, and its Q output connects the second rising
Along the D output ends of d type flip flop;The clock signal input terminal of second rising edge d type flip flop connects external timing signal, its Q output
Connect the clock signal input terminal of the 3rd rising edge d type flip flop;The D input termination external input signal t of first trailing edge trigger,
Its clock signal input terminal connects external timing signal, and its Q output connects the D inputs of the second trailing edge d type flip flop;Second declines
External timing signal is connect along the clock signal input terminal of d type flip flop, its Q output connects the D inputs of the 3rd rising edge d type flip flop
End;The first rising edge d type flip flop, the second rising edge d type flip flop, the first trailing edge d type flip flop and the second trailing edge D triggerings
Device connects identical external timing signal;The Q output of 3rd rising edge flip-flops is the output end of metastable state and eliminate circuit.
The operation principle of this example is:
As shown in figure 4, sampling location 1. or 2. when, be not in d [x:X-1]=01 (x=6~1) situation.Then scheme
In 6 thus sampling location judge module distinguishes whether external input signal start (or stop) sampling location in Fig. 4 occurs
1. or 2..1. or 2. when judging sampling location when, encoder using the output signal s_out of metastable state and eliminate circuit knot
Fruit encodes, that is, works as s_out=0, △ TstartIt is entered as Tclk;S_out=1, △ TstartIt is entered as 0ns.Otherwise, encoder is normal
Coding, is not influenceed by s_out.
When 1. start samples d [7 in Fig. 4 positions:When 0], metastable state eliminates logic its timing diagram such as Fig. 7, if outside input
Signal start is unsatisfactory for d type flip flop settling time with external timing signal clk signal time interval, i.e., can not sample, start_
Clk signal timing error, if it is start_clk_wrong, now rolling counters forward result can reduce one as shown in Figure 9
Tclk.Start_clk_wrong samplings start_nclk obtains signal s_out_wrong=1, this seasonal △ TstartFor 0ns, compared with
During correct sampling s_out=0, △ TstartReduce Tclk.With reference to △ T=nTclk-△Tstart+△TstopIt can be found that △ Tstart
Caused error is by nTclkIt is eliminated after place's adjustment.
When 2. start samples d [7 in Fig. 4 positions:When 0], metastable state eliminates logic its timing diagram such as Fig. 8, if start with
Clk signal time interval is unsatisfactory for d type flip flop settling time, i.e., can not sample, start_clk signal timing errors, if it is
Start_clk_wrong, now rolling counters forward result can increase a T as shown in Figure 9clk.Start_clk_wrong is sampled
Start_nclk obtains signal s_out_wrong=1, this seasonal △ TstartFor Tclk, when relatively correctly sampling s_out=0, △
TstartAdd Tclk.With reference to △ T=nTclk-△Tstart+△TstopIt can be found that △ TstartCaused error is by nTclkAdjust at place
It is eliminated after whole.
Similarly:△TstopCaused error can be also eliminated, so as to eliminate due to timing caused by metastable appearance
Error.
As shown in Figure 10 and Figure 11, the TDC linearity of metastable state circuit can be eliminated compared to typical TDC, band proposed by the present invention
Degree is more preferable, greatly improves the reliability of time quantization result.
Claims (1)
1. a kind of metastable state and eliminate circuit for TDC, the circuit is triggered by the first rising edge d type flip flop, the second rising edge D
Device, the 3rd rising edge d type flip flop, the first trailing edge d type flip flop and the second trailing edge d type flip flop are formed;
The D input termination external input signals of the first rising edge d type flip flop, its clock signal input terminal connect external clock letter
Number, its Q output connects the D inputs of the second rising edge d type flip flop;The clock signal input terminal of second rising edge d type flip flop connects
External timing signal, its Q output connect the clock signal input terminal of the 3rd rising edge d type flip flop;The D of first trailing edge trigger
Input termination external input signal, its clock signal input terminal connect external timing signal, and its Q output meets the second trailing edge D and touched
Send out the D inputs of device;The clock signal input terminal of second trailing edge d type flip flop connects external timing signal, and its Q output connects the 3rd
The D inputs of rising edge d type flip flop;The first rising edge d type flip flop, the second rising edge d type flip flop, the first trailing edge D are touched
Send out device and the second trailing edge d type flip flop connection identical external timing signal;The Q output of 3rd rising edge flip-flops is metastable
State eliminates the output end of circuit;The metastable state and eliminate circuit is used for after TDC can not be sampled correctly, makes DLL quantized result
The deviation of a clock cycle is had, while can also give one signal start_clk of counter, counting n is also produced deviation 1,
And caused counting deviation is offset with clock cycle deviation two parts quantization error, the metastable elimination of sampling is realized.
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CN111262583B (en) * | 2019-12-26 | 2021-01-29 | 普源精电科技股份有限公司 | Metastable state detection device and method and ADC circuit |
CN111262562B (en) * | 2020-03-02 | 2021-08-27 | 上海交通大学 | Metastable state detection circuit |
CN113835333B (en) * | 2021-09-29 | 2022-08-12 | 武汉市聚芯微电子有限责任公司 | Time-to-digital conversion device and time-to-digital conversion method |
CN114675525B (en) * | 2021-09-30 | 2022-09-02 | 绍兴圆方半导体有限公司 | Time-to-digital converter and clock synchronization system |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102880071A (en) * | 2012-09-24 | 2013-01-16 | 电子科技大学 | Data acquisition system with high time stamp accuracy |
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US7292670B2 (en) * | 2003-08-06 | 2007-11-06 | Gennum Corporation | System and method for automatically correcting duty cycle distortion |
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CN102880071A (en) * | 2012-09-24 | 2013-01-16 | 电子科技大学 | Data acquisition system with high time stamp accuracy |
Non-Patent Citations (2)
Title |
---|
一种基于线性增强TDC的ADPLL设计;徐洪闪;《微电子学》;20150831;第45卷(第4期);第507-511页 * |
一种自校准全数字TDC的设计;夏婷婷等;《微电子学》;20141031;第44卷(第5期);第597-600页 * |
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