CN105157865A - Heat welding test bed and test method of diode - Google Patents
Heat welding test bed and test method of diode Download PDFInfo
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- CN105157865A CN105157865A CN201510506208.5A CN201510506208A CN105157865A CN 105157865 A CN105157865 A CN 105157865A CN 201510506208 A CN201510506208 A CN 201510506208A CN 105157865 A CN105157865 A CN 105157865A
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Abstract
The invention discloses a heat welding test bed and test method of a diode. According to the heat welding test bed of the diode, a temperature control part and a pressure acting time control part are additionally adopted, so that the temperature and pressure acting time in diode heat welding can be controlled, and therefore, the diode can be welded under different temperature and pressure acting time, and the electrical performance of the diode can be tested, and as a result, temperature and pressure acting time which are most suitable for diode welding can be obtained. With the heat welding test bed and test method of the invention adopted, the temperature and pressure acting time suitable for diode heat welding can be obtained, and a series of problems caused by diode failure which is further caused by the inaccuracy of welding temperature and pressure can be solved, and great economic benefits can be created.
Description
Technical field
The present invention relates to a kind of diode thermal weld test and the diode thermal weld test method based on this testing table, belong to welding diode technical field.
Background technology
In solar panel, in order to realize the stable power supply continued, sun power will first be collected in battery, then gives electric power supply.Electric energy is changed into by cell panel at sun power, then in the process of energy-storage battery charging, must have the device preventing energy-storage battery reverse reflux, this device is extremely important, and its importance is to prevent the store electrical energy reverse reflux inside battery from impacting solar panel.Based on this object, utilize the single-phase conductive characteristic of diode, weld the wire with insulation course respectively at the two ends of diode, the wire of one end is connected with the output terminal of solar panel, and the other end is connected with energy-storage battery, realizes this function.
Present production technology utilizes high temperature scolding tin pressing process by wire and welding diode in one, and in this welding process, temperature and pressure is the key factor affecting welding quality.As too high in temperature or pressure is oversize for action time, the chip of diode can be made very easily to be subject to temperatures involved, thus to produce the change of electrical aspect, serious meeting makes diode breakdown, cause back-flow preventer to lose efficacy, cause solar panel to damage, cause serious consequence.And temperature is too low or pressure is too short for action time, also not prison welding admittedly quality problems can be caused.Therefore before the diode of each batch carries out high-temperature soldering, all need to carry out soldering test, to guarantee that diode under appropriate conditions of temperature and pressure, reach good electrical performance and welding effect.
Summary of the invention
For the defect of prior art, the invention provides a kind of diode thermal weld testing table and test method, temperature and pressure parameter action time accurately can be obtained, guarantee the electric property after diode high-temperature soldering and welding effect, ensure welding quality.
In order to solve the technical problem, the technical solution used in the present invention is: a kind of diode thermal weld testing table, comprise heating part, exert pressure partly and control section, described heating part comprises warm table and is positioned at the heating tube of warm table inside, and warm table is provided with lower clamp groove; Described pressure portion divides the travel mechanism comprising clip groove movement in clip groove, drive, described upper clip groove and lower clamp groove are U-lag, upper clip groove is positioned at directly over lower clamp groove, upper clip groove under the drive of travel mechanism near or away from lower clamp groove, when lower clamp groove, the U-shaped opening of upper and lower clip groove is combined to form the cavity of fixing diode; Described control section comprises temprature control unit and time controling part, described temprature control unit comprises thermopair and temperature controller, thermopair is positioned at the thermocouple hole of warm table, thermopair, heating tube are electrically connected with temperature controller, the temperature that temperature controller records according to thermopair controls heating tube work, and described time controling part comprises the trigger switch of timer and shot timers action.
Diode thermal weld testing table of the present invention, the U-shaped opening surface of described upper clip groove and lower clamp groove is provided with the locating slot of fixing diode.
Diode thermal weld testing table of the present invention, the arm lever that described travel mechanism comprises meshed gears and tooth bar, driven gear rotates and the return spring retracting tooth bar, upper clip groove is positioned at the end of tooth bar, return spring is fixed between the top of tooth bar and entablature, and the resistance arm of arm lever is connected to the center of circle of gear.
Diode thermal weld testing table of the present invention, described gear and tooth bar are arranged in 1 U-lag, and trigger switch is arranged on U-lag, are provided with the triggering block opening and closing this trigger switch directly over trigger switch.
Diode thermal weld testing table of the present invention, described triggering block is fixed on the tip-end-side of tooth bar, and under original state, namely go up clip groove not toward under the state pressed down, the distance between triggering block and trigger switch equals the distance between upper and lower clip groove.
Diode thermal weld testing table of the present invention, described warm table is fixed on horizontal operation table top, is filled with heat-barrier material between warm table and worktable, warm table outer cladding one layer of heat preservation material.
The invention also discloses a kind of diode thermal weld test method based on above-mentioned testing table, said method comprising the steps of:
1), the installation of TC in thermocouple hole, the other end, the heating tube of thermopair are all electrically connected to temperature controller, and check heating tube and whether getting loose with the line everywhere of temperature controller, whether thermopair is in place, and then opens temperature controller power supply;
2), adjust temperature controller and timer, the time of design temperature and pressure effect, heating tube starts heating;
3), when temperature arrives setting value, neat for diode to be tested is put into lower clamp notch;
4), pin lever arm of force with hand down to move, make the opening of the opening of clip groove and lower clamp groove involutory, namely diode is exerted pressure fixing, the trigger switch of triggering block shot timers simultaneously, timer starts timing, until it is bright to arrive timing timer lamp, unclamps lever arm of force, lever arm of force, under the effect of return spring, gets back to original position;
5), with tweezers take off at the diode of lower clamp groove through high temperature and pressure test, carry out testing electrical property, draw the temperature and pressure action time of the most applicable diode thermal weld.
Beneficial effect of the present invention: diode thermal weld testing table of the present invention comprises heating part, exert pressure part and control section, described control section is by temperature when thermopair and temperature controller control diode thermal weld, by the time that Timer Controlling welds, by this testing table and test method, test out best welding temperature and the pressure of diode, solve the series of problems because welding temperature and the inaccurate diode fails caused of pressure cause, create good economic benefit.
Accompanying drawing explanation
Fig. 1 is the structural representation of testing table of the present invention;
Fig. 2 is the structural representation of the warm table of testing table;
In figure: 1, warm table, 2, heating tube, 3, lower clamp groove, 4, upper clip groove, 5, thermocouple hole, 6, trigger switch, 7, gear, 8, tooth bar, 9, arm lever, 10, return spring, 11, entablature, 12, U-lag, 13, triggering block, 14, worktable.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described further and limit.
As shown in Figure 1, 2, a kind of diode thermal weld testing table, comprises heating part, exerts pressure partly and control section, and described heating part comprises warm table 1 and is positioned at the heating tube 2 of warm table 1 inside, and warm table 1 is provided with lower clamp groove 3; Described pressure portion divides the travel mechanism comprising clip groove 4 movement in clip groove 4, drive, described upper clip groove 4 and lower clamp groove 3 are U-lag, upper clip groove 4 is positioned at directly over lower clamp groove 3, upper clip groove 4 under the drive of travel mechanism near or away from lower clamp groove 3, when lower clamp groove 3, the U-shaped opening of upper and lower clip groove is combined to form the cavity of fixing diode; Described control section comprises temprature control unit and time controling part, described temprature control unit comprises thermopair and temperature controller, thermopair is positioned at the thermocouple hole 5 of warm table 1, thermopair, heating tube 2 are electrically connected with temperature controller, temperature controller controls heating tube 2 according to the temperature that thermopair records and works, and described time controling part comprises the trigger switch 6 of timer and shot timers action.
In the present embodiment, the U-shaped opening surface of described upper clip groove 4 and lower clamp groove 3 is provided with the locating slot of fixing diode.The width of upper clip groove 4 and lower clamp groove 3 is slightly larger than the axial diameter of plastic-sealed body in the middle of diode, and upper and lower groove is symmetrical.Described upper clip groove 3 and lower clamp groove 3 adopt brass to form through linear cutter.
In the present embodiment, the arm lever 9 that described travel mechanism comprises meshed gears 7 and tooth bar 8, driven gear 7 rotates and the return spring 10 retracting tooth bar 8, upper clip groove 4 is positioned at the end of tooth bar 7, return spring 10 is fixed between the top of tooth bar 8 and entablature 11, and the resistance arm of arm lever 9 is connected to the center of circle of gear 8.Rotating force arm bar 9, can drive clip groove 4 to move.
Described gear 7 and tooth bar 8 are arranged in 1 U-lag 12, and trigger switch 6 is arranged on U-lag 12, are provided with the triggering block 13 opening and closing this trigger switch 6 directly over trigger switch 6.Described triggering block 13 is fixed on the tip-end-side of tooth bar 8, and under original state, namely go up clip groove 4 not toward under the state pressed down, the distance between triggering block 13 and trigger switch 6 equals the distance between upper and lower clip groove.When upper clip groove 4 move down touch lower clamp groove 3 time, when namely starting to apply pressure to diode, triggering block 13 also triggers trigger switch 6, and timer starts timing.
In the present embodiment, described warm table 1 is fixed on the worktable 14 of level, is filled with heat-barrier material between warm table 1 and worktable 14, warm table 1 outer cladding one layer of heat preservation material.In the present embodiment, described heat-barrier material is for being sheet asbestos, and described insulation material is asbestos.
Diode thermal weld test method based on above-mentioned testing table described in the present embodiment comprises the following steps:
1), the installation of TC in thermocouple hole 5, the other end, the heating tube 2 of thermopair are all electrically connected to temperature controller, and check heating tube 2 and whether getting loose with the line everywhere of temperature controller, whether thermopair is in place, and then opens temperature controller power supply;
2), adjust temperature controller and timer, the time of design temperature and pressure effect, heating tube 2 starts heating;
3), when temperature arrives setting value, neat for diode to be tested is put into lower clamp groove 3 mouthfuls;
4), pin lever arm of force 9 with hand down to move, make the opening of the opening of clip groove 4 and lower clamp groove 3 involutory, namely diode is exerted pressure fixing, the trigger switch 6 of triggering block 13 shot timers simultaneously, timer starts timing, until it is bright to arrive timing timer lamp, unclamps lever arm of force 9, arm lever 9, under the effect of return spring 10, gets back to original position;
5), with tweezers take off at the diode of lower clamp groove 3 through high temperature and pressure test, carry out testing electrical property, draw the temperature and pressure action time of the most applicable diode thermal weld.
The temperature and pressure action time of applicable diode thermal weld can be obtained by testing table of the present invention and test method, solve the series of problems because welding temperature and the inaccurate diode fails caused of pressure cause, create good economic benefit.Above only describes ultimate principle of the present invention and preferred implementation, those skilled in the art can make many changes and improvements according to foregoing description, and these changes and improvements should belong to protection scope of the present invention.
Claims (7)
1. a diode thermal weld testing table, is characterized in that: comprise heating part, exert pressure partly and control section, described heating part comprises warm table and is positioned at the heating tube of warm table inside, and warm table is provided with lower clamp groove; Described pressure portion divides the travel mechanism comprising clip groove movement in clip groove, drive, described upper clip groove and lower clamp groove are U-lag, upper clip groove is positioned at directly over lower clamp groove, upper clip groove under the drive of travel mechanism near or away from lower clamp groove, when lower clamp groove, the U-shaped opening of upper and lower clip groove is combined to form the cavity of fixing diode; Described control section comprises temprature control unit and time controling part, described temprature control unit comprises thermopair and temperature controller, thermopair is positioned at the thermocouple hole of warm table, thermopair, heating tube are electrically connected with temperature controller, the temperature that temperature controller records according to thermopair controls heating tube work, and described time controling part comprises the trigger switch of timer and shot timers action.
2. diode thermal weld testing table according to claim 1, is characterized in that: the U-shaped opening surface of described upper clip groove and lower clamp groove is provided with the locating slot of fixing diode.
3. diode thermal weld testing table according to claim 1 and 2, it is characterized in that: the arm lever that described travel mechanism comprises meshed gears and tooth bar, driven gear rotates and the return spring retracting tooth bar, upper clip groove is positioned at the end of tooth bar, return spring is fixed between the top of tooth bar and entablature, and the resistance arm of arm lever is connected to the center of circle of gear.
4. diode thermal weld testing table according to claim 3, is characterized in that: described gear and tooth bar are arranged in 1 U-lag, and trigger switch is arranged on U-lag, is provided with the triggering block opening and closing this trigger switch directly over trigger switch.
5. diode thermal weld testing table according to claim 4, is characterized in that: described triggering block is fixed on the tip-end-side of tooth bar, and under original state, the distance between triggering block and trigger switch equals the distance between upper and lower clip groove.
6. diode thermal weld testing table according to claim 5, is characterized in that: described warm table is fixed on horizontal operation table top, is filled with heat-barrier material between warm table and worktable, warm table outer cladding one layer of heat preservation material.
7., based on a diode thermal weld test method for above-mentioned testing table, it is characterized in that: comprise the following steps:
1), the installation of TC in thermocouple hole, the other end, the heating tube of thermopair are all electrically connected to temperature controller, and check heating tube and whether getting loose with the line everywhere of temperature controller, whether thermopair is in place, and then opens temperature controller power supply;
2), adjust temperature controller and timer, the time of design temperature and pressure effect, heating tube starts heating;
3), when temperature arrives setting value, neat for diode to be tested is put into lower clamp notch;
4), pin lever arm of force with hand down to move, make the opening of the opening of clip groove and lower clamp groove involutory, namely diode is exerted pressure fixing, the trigger switch of triggering block shot timers simultaneously, timer starts timing, until it is bright to arrive timing timer lamp, unclamps lever arm of force, lever arm of force, under the effect of return spring, gets back to original position;
5), with tweezers take off at the diode of lower clamp groove through high temperature and pressure test, carry out testing electrical property, draw the temperature and pressure action time of the most applicable diode thermal weld.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510506208.5A CN105157865B (en) | 2015-08-17 | 2015-08-17 | The thermal weld testing stand and test method of diode |
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| CN201510506208.5A CN105157865B (en) | 2015-08-17 | 2015-08-17 | The thermal weld testing stand and test method of diode |
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| CN105157865A true CN105157865A (en) | 2015-12-16 |
| CN105157865B CN105157865B (en) | 2017-07-11 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107796703A (en) * | 2017-11-17 | 2018-03-13 | 济南晶恒电子有限责任公司 | Intensity detecting device and method at the exit of axial lead device and sealing |
| CN111524440A (en) * | 2020-06-04 | 2020-08-11 | 北京智扬北方国际教育科技有限公司 | Engine running state demonstration device |
| CN111590170A (en) * | 2019-02-21 | 2020-08-28 | 上海亚尔光源有限公司 | Forming method of high-toughness bending sub-needle |
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| JPH0755879A (en) * | 1993-08-19 | 1995-03-03 | Fujitsu Ltd | Ic testing device |
| CN1526076A (en) * | 2001-07-12 | 2004-09-01 | ��ʽ���簮������� | Apparatus for handling electronic components and method for controlling temperature of electronic components |
| CN101248361A (en) * | 2005-08-25 | 2008-08-20 | 株式会社爱德万测试 | Electronic device testing device and its temperature control method |
| CN104603626A (en) * | 2012-09-11 | 2015-05-06 | 夏普株式会社 | Testing jig, inspection device, mounting device, and testing device |
| CN204855001U (en) * | 2015-08-17 | 2015-12-09 | 济南晶恒电子有限责任公司 | Hot welding test platform of diode |
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Patent Citations (5)
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| JPH0755879A (en) * | 1993-08-19 | 1995-03-03 | Fujitsu Ltd | Ic testing device |
| CN1526076A (en) * | 2001-07-12 | 2004-09-01 | ��ʽ���簮������� | Apparatus for handling electronic components and method for controlling temperature of electronic components |
| CN101248361A (en) * | 2005-08-25 | 2008-08-20 | 株式会社爱德万测试 | Electronic device testing device and its temperature control method |
| CN104603626A (en) * | 2012-09-11 | 2015-05-06 | 夏普株式会社 | Testing jig, inspection device, mounting device, and testing device |
| CN204855001U (en) * | 2015-08-17 | 2015-12-09 | 济南晶恒电子有限责任公司 | Hot welding test platform of diode |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107796703A (en) * | 2017-11-17 | 2018-03-13 | 济南晶恒电子有限责任公司 | Intensity detecting device and method at the exit of axial lead device and sealing |
| CN107796703B (en) * | 2017-11-17 | 2024-03-26 | 济南晶恒电子有限责任公司 | Device and method for detecting strength of leading-out end and sealing part of axial lead device |
| CN111590170A (en) * | 2019-02-21 | 2020-08-28 | 上海亚尔光源有限公司 | Forming method of high-toughness bending sub-needle |
| CN111590170B (en) * | 2019-02-21 | 2021-12-21 | 上海亚尔光源有限公司 | Forming method of high-toughness bending sub-needle |
| CN111524440A (en) * | 2020-06-04 | 2020-08-11 | 北京智扬北方国际教育科技有限公司 | Engine running state demonstration device |
| CN111524440B (en) * | 2020-06-04 | 2021-09-21 | 北京智扬北方国际教育科技有限公司 | Engine running state demonstration device |
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| CN105157865B (en) | 2017-07-11 |
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