CN105140145A - Photovoltaic cell grid line measuring method - Google Patents

Photovoltaic cell grid line measuring method Download PDF

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Publication number
CN105140145A
CN105140145A CN201510376582.8A CN201510376582A CN105140145A CN 105140145 A CN105140145 A CN 105140145A CN 201510376582 A CN201510376582 A CN 201510376582A CN 105140145 A CN105140145 A CN 105140145A
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CN
China
Prior art keywords
grid line
photovoltaic cell
line
edge
sides
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Pending
Application number
CN201510376582.8A
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Chinese (zh)
Inventor
黄海深
袁占强
袁江芝
吴波
杨秀德
周庭艳
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Zunyi Normal University
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Zunyi Normal University
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Publication date
Application filed by Zunyi Normal University filed Critical Zunyi Normal University
Priority to CN201510376582.8A priority Critical patent/CN105140145A/en
Publication of CN105140145A publication Critical patent/CN105140145A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Abstract

The invention discloses a photovoltaic cell grid line measuring method, which realizes automatic measurement for the width of a grid line. The photovoltaic cell grid line measuring method comprise the steps of 1) acquiring an image of a photovoltaic cell grid line; 2) recording coordinate values of the grid line edge; 3) fitting the grid line edge into a line segment; 4) averaging the slopes of line segments at two sides of the grid line edge so as to acquire an inclination factor, correcting the distance between the centers of the line segments at the two sides of the grid line edge by using the inclination factor, and using the corrected distance between the centers of the line segments at the two sides of the grid line edge to act as the width of the grid line. According to the method disclosed by the invention, automatic measurement can be realized in the process of measuring the width of the grid line, and artificial subjective judgment is removed, thereby enabling a value of grid line measurement to be the most close to the objectiveness. The accuracy of detection is improved through introducing the inclination factor. The whole scheme improves the measurement speed, saves the manpower, and has an auxiliary function for improving the production capacity.

Description

A kind of photovoltaic cell grid line method of measurement
Technical field
The invention belongs to technical field of solar cells, be specifically related to a kind of photovoltaic cell grid line method of measurement.
Background technology
Solar cell is a kind of is directly the device of electric energy by light energy conversion based on photovoltaic effect.Have certain grid line in order to collected current at the frontal design of battery, this grid line possesses certain shading-area, causes loss in efficiency.In order to reduce the loss in efficiency of this part, must monitor in real time the width of grid line in large-scale production process, to pursue higher efficiency and benefit.General metering system is for adopting plant equipment and program, grating figure picture is obtained, human subjective judges grid line edge, obtain the width of grid line, this kind of method of measurement has certain limitation, 1) use silk screen printing, swooning along with some and open and burr in grid line edge, not easily formulates the criterion at grid line edge; 2) adopt human subjective to judge, different grid line orientation measurement the possibility of result is different, is vulnerable to subjective impact; 3) production that becomes more meticulous is unfavorable for.
Whole specification is to any discussion of background technology, and not representing this background technology must be the prior art that one of ordinary skill in the art know; Not representing any discussion of prior art in whole specification thinks that the prior art must be well-known or certain common practise forming this area.
Summary of the invention
In order to overcome the deficiencies in the prior art, the invention provides a kind of photovoltaic cell grid line method of measurement.Realize the automatic measurement of grid line width.
Comprise the steps:
1) image of photovoltaic cell grid line is obtained;
2) coordinate figure at grid line edge is carried out record;
3) grid line edge fitting is line segment;
4) slope of grid line both sides of edges line segment is averaged as obliquity factor, and utilizes the distance at obliquity factor correction grid line both sides of edges line segment center, using the distance at revised grid line both sides of edges line segment center as the width of grid line.
Grid line edge refers to the border of grid line both sides.
This program can realize automatic measurement in the width process measuring grid line, remove human subjective from and judge, thus the value that grid line is measured is closest to objective, and improves by the introducing of obliquity factor the accuracy detected.Whole scheme improves measuring speed, saves manpower, has booster action to the lifting of production capacity.
Further, after described step 1, carry out preliminary treatment to improve the definition of grid line profile to image, described preprocessing means comprises fuzzy, convolution, setting contrast and removes impurity point wherein one or more.The result processed is that the profile of grid line in picture is comparatively clear, and other noises of picture are less, are convenient to judge grid line border clearly.
Further, before described step 2, in image, grid line edge uses threshold value to carry out image binaryzation process, corrodes and/or expansive working grid line edge in image.What the object of this step was to provide grid line border can identification, can improve definition and the continuity on grid line border to the corrosion at grid line edge in image and/or expansive working.
Further, in described step 2, then use pointer algorithm to scan picture, stored by the coordinate figure at grid line edge, the object of this step is the coordinate figure obtaining grid line edge, carries out computing with suitable algorithm easy to use.
Further, in described step 3, the coordinate figure at two grid line edges uses least square method to carry out matching respectively, obtains two line segments and calculate the spacing of its slope and two line segment mid points after matching.The benefit of least square fitting carries out linear fit to two edges, instead of simply average, and line segment spacing and this two relating to parameters: the obliquity factor of line segment central point spacing and line segment, after carrying out matching, these two parameters are easier to obtain.
Further, in described step 4, in order to make two uneven impacts in edge reduce, adopt the slope of two line segments on average as obliquity factor.Line segment central point spacing and modifying factor, through the computing of slope and cosine or SIN function, can draw line segment spacing easily.Line segment spacing is grid line width.
Further, in described step 1, picture adopts the matrix of 3*3 to carry out convolution blur operation.
Accompanying drawing explanation
Fig. 1 is the flow chart of program;
Fig. 2 is grid line picture;
Fig. 3 is the picture after binary conversion treatment;
Fig. 4 is grid line Border delineation figure;
Fig. 5 is the calculating schematic diagram of grating spacing.
Embodiment
As shown in Figure 1, concrete scheme is as follows for the flow process of embodiment:
(1) grid line picture is read as shown in Figure 2, picture adopts the matrix of 3*3 to carry out convolution blur operation, then picture is carried out setting contrast, makes background color even, the contrast of grid line and background is strong, then area in picture is less than assorted point and the surrounding pixel point equalization of 200 square.
(2) interval maximum variance scanning is carried out to picture, make program obtain optimal threshold, and use threshold value by picture binary conversion treatment.The matrix of 3*3 is adopted to carry out dilation and erosion operation to two-value picture, grid line edge clear and continuously.As shown in Figure 3.
(3) be stored into array to the coordinate at grid line edge in above-mentioned picture by pointer algorithm, as shown in Figure 4, and adopt the mode of least square to carry out matching to array, two boundary curves fit to two line segments, and obtain the distance at slope and line segment center.
(4) two line segment slopes are averaged, are considered as the obliquity factor of grid line, use this angle to revise line segment centre distance, obtain the width of grid line.Shown in Fig. 5 is the schematic diagram of grating spacing L2 and obliquity factor K and line segment centre distance L1, and the mode of correction is the calculating of obliquity factor and cosine or sine.
Above-described is only embodiments of the invention, and in scheme, the general knowledge such as known concrete structure and characteristic does not do too much description at this.Should be understood that; for a person skilled in the art, under the prerequisite not departing from structure of the present invention, some distortion and improvement can also be made; these also should be considered as protection scope of the present invention, and these all can not affect effect of the invention process and practical applicability.The protection range that this application claims should be as the criterion with the content of its claim, and the embodiment in specification etc. record the content that may be used for explaining claim.

Claims (7)

1. a photovoltaic cell grid line method of measurement, is characterized in that comprising the steps:
1) image of photovoltaic cell grid line is obtained;
2) coordinate figure at grid line edge is carried out record;
3) grid line edge fitting is line segment;
4) slope of grid line both sides of edges line segment is averaged as obliquity factor, and utilizes the distance at obliquity factor correction grid line both sides of edges line segment center, using the distance at revised grid line both sides of edges line segment center as the width of grid line.
2. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, after described step 1, carry out preliminary treatment to improve the definition of grid line profile to image, described preprocessing means comprises fuzzy, convolution, setting contrast and removes impurity point wherein one or more.
3. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, before described step 2, use threshold value to carry out image binaryzation process to image, and grid line edge in image is corroded and/or expansive working.
4. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, in described step 2, use pointer algorithm to scan picture, the coordinate figure at grid line edge is stored.
5. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, in described step 3, the coordinate figure at two grid line edges uses least square method to carry out matching respectively, obtains two line segments and calculate the spacing of its slope and two line segment mid points after matching.
6. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, in described step 4, obliquity factor is that the slope of both sides line segment is average, and modification method is slope and cosine or SIN function.
7. require described a kind of photovoltaic cell grid line method of measurement according to right 1, it is characterized in that, in described step 1, picture adopts the matrix of 3*3 to carry out convolution blur operation.
CN201510376582.8A 2015-07-01 2015-07-01 Photovoltaic cell grid line measuring method Pending CN105140145A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510376582.8A CN105140145A (en) 2015-07-01 2015-07-01 Photovoltaic cell grid line measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510376582.8A CN105140145A (en) 2015-07-01 2015-07-01 Photovoltaic cell grid line measuring method

Publications (1)

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CN105140145A true CN105140145A (en) 2015-12-09

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106328553A (en) * 2016-08-19 2017-01-11 晶澳太阳能有限公司 Full-automatic crystalline silicon solar cell quality testing machine
CN109470139A (en) * 2018-10-29 2019-03-15 东莞市微大软件科技有限公司 Solar energy surveys multi-thread method without net knot thin one screen of grid center line of printing screen plate
CN110807404A (en) * 2019-10-29 2020-02-18 上海眼控科技股份有限公司 Form line detection method, device, terminal and storage medium based on deep learning
CN116525480A (en) * 2023-05-10 2023-08-01 广东空天科技研究院(南沙) Microscopic image-based automatic detection method for forming quality of laser grid line

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1097866A (en) * 1994-02-05 1995-01-25 中国科学院上海光学精密机械研究所 Method for automatic compensation of measuring error due to linear bar inclination
JP2007163417A (en) * 2005-12-16 2007-06-28 Horon:Kk Image position measuring method and image position measuring instrument
CN101706259A (en) * 2009-11-25 2010-05-12 天津大学 Concrete crack width test method based on wavefront coding technology and hand-held tester
CN103389041A (en) * 2013-07-30 2013-11-13 中节能太阳能科技(镇江)有限公司 Method for measuring width of grating line

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1097866A (en) * 1994-02-05 1995-01-25 中国科学院上海光学精密机械研究所 Method for automatic compensation of measuring error due to linear bar inclination
JP2007163417A (en) * 2005-12-16 2007-06-28 Horon:Kk Image position measuring method and image position measuring instrument
CN101706259A (en) * 2009-11-25 2010-05-12 天津大学 Concrete crack width test method based on wavefront coding technology and hand-held tester
CN103389041A (en) * 2013-07-30 2013-11-13 中节能太阳能科技(镇江)有限公司 Method for measuring width of grating line

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106328553A (en) * 2016-08-19 2017-01-11 晶澳太阳能有限公司 Full-automatic crystalline silicon solar cell quality testing machine
CN106328553B (en) * 2016-08-19 2019-08-09 晶澳太阳能有限公司 A kind of automatic crystal silicon solar cell quality tester
CN109470139A (en) * 2018-10-29 2019-03-15 东莞市微大软件科技有限公司 Solar energy surveys multi-thread method without net knot thin one screen of grid center line of printing screen plate
CN109470139B (en) * 2018-10-29 2019-07-23 东莞市微大软件科技有限公司 Solar energy surveys multi-thread method without net knot thin one screen of grid center line of printing screen plate
CN110807404A (en) * 2019-10-29 2020-02-18 上海眼控科技股份有限公司 Form line detection method, device, terminal and storage medium based on deep learning
CN116525480A (en) * 2023-05-10 2023-08-01 广东空天科技研究院(南沙) Microscopic image-based automatic detection method for forming quality of laser grid line
CN116525480B (en) * 2023-05-10 2023-11-10 广东空天科技研究院(南沙) Microscopic image-based automatic detection method for forming quality of laser grid line

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