CN107742283B - Method for detecting defect of uneven thickness of grid line on appearance of battery piece - Google Patents
Method for detecting defect of uneven thickness of grid line on appearance of battery piece Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 44
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000007781 pre-processing Methods 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims description 16
- 238000009499 grossing Methods 0.000 claims description 8
- 238000012935 Averaging Methods 0.000 claims description 4
- 230000006740 morphological transformation Effects 0.000 claims description 4
- 230000002950 deficient Effects 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000010248 power generation Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
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- G—PHYSICS
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- G06T2207/30148—Semiconductor; IC; Wafer
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Abstract
The method for detecting the defect of uneven thickness of the grid line on the appearance of the battery piece is divided into three major parts, wherein the first part is an image preprocessing unit and is used for acquiring vertical discontinuous grid line information; the second part is a curve fitting unit which is used for fitting the average value of each row of grid lines; and the third part is a defect unit for detecting the thickness unevenness of the grid line, and the difference between the image array and the fitting curve is used for judging and detecting.
Description
Technical Field
The invention relates to the technical field of photovoltaic cell detection, and mainly relates to a method for detecting defects of uneven thickness of grid lines on the appearance of a polycrystalline silicon cell.
Background
Solar energy has gradually occupied an important proportion in the energy industry due to the characteristics of cleanness and no pollution, China is one of countries with rich solar energy resources, and the demand for the photovoltaic industry can be further increased in the future. In order to improve the conversion efficiency of solar energy, the solar cell is an important component of a power generation link, and the quality of the solar cell is particularly important. In the processing and preparation process of the solar cell, various defects of the solar cell are easily generated due to the complicated production process, the high-quality production technology, the characteristic of brittleness and thinness of the silicon cell and the like. The defects affect the service life and the power generation efficiency of the solar cell, and are therefore of great importance to the detection of the solar cell in the production link. At present, the demand of photovoltaic cells is greatly increased, so that the quality requirement of the cell is increasingly strict, and the improvement of the technology is needed in the aspect of detection. The conversion efficiency of the solar cell is reduced due to the defects on the surface of the solar cell, and the power generation efficiency is influenced by the local defects, so that the production quality is reduced. The uneven thickness of the grid lines is one of the defects on the surface of the solar cell, and the defects of uneven thickness of the grid lines are mainly represented by thick lines in normal grid lines, uneven thickness, thick lines at junctions of transverse grid lines and vertical grid lines and the like. The uneven thickness of the grid lines is caused by uneven thickness of the grid lines due to uneven slurry output during slurry printing, so that the appearance and the photoelectric conversion efficiency of the battery piece are affected. Therefore, the solar cell with uneven grid line thickness is detected and selected in the production link, the appearance and the quality of the product are improved, and the product of an enterprise has more production advantages.
At present, the main detection mode of the defects of uneven grid line thickness on the surface of the solar cell is manual spot inspection, and the application of machine vision in the domestic field is not mature. The manual detection relies on the naked eye to judge, has very big subjective consciousness, because the grid line is comparatively thin and long, long-time people's eye detects and probably can cause fatigue, leads to missing detection rate and false detection rate to rise, reduces the production quality of product.
Therefore, a method for detecting defects of uneven thickness of grid lines on the appearance of a battery cell is needed to improve the working efficiency and the detection quality of the battery cell and improve the degree of mechanization.
Disclosure of Invention
In view of this, the invention provides a method for detecting defects of uneven thickness of grid lines on the appearance of a battery piece, and the specific scheme is as follows:
a method for detecting defects of uneven thickness of grid lines on the appearance of a battery piece comprises three step units,
first step, image preprocessing unit
1-1, acquiring an HSI channel image: converting an RGB image acquired by an industrial camera into an HSI channel image, and taking information of the I channel image as a defect detection image;
1-2, extracting grid lines: on the basis of the step 1-1, extracting grid line information on the surface of the solar cell piece through morphological transformation to obtain discontinuous thin grid lines in the solar cell piece;
second step, curve fitting unit
2-1, averaging grid line labels: on the basis of the step 1-2, dividing the grid lines in the image into a plurality of grid lines, sequentially marking the grid lines respectively, and then solving the average value of each row of grid lines;
2-2, curve fitting: on the basis of the step 2-1, performing curve fitting on pixel values of grid lines of the image, and drawing to represent;
2-3, Gaussian smoothing: on the basis of the step 2-2, performing Gaussian smoothing on the fitted curve;
thirdly, judging defective units with uneven grid line thickness
3-1, calculating a difference value: on the basis of the step 2-3, making a difference value by using the image information of the step 1-2 and the Gaussian smooth curve fitted in the step 2-3, and solving an average value of the difference;
3-2, judging defects: and 3-1, judging whether the thickness unevenness defect exists or not according to the difference value of the image information and the fitting curve.
Specifically, in the steps 2-2 and 3-1, the image information is a two-dimensional curve image.
Specifically, the industrial camera used for image acquisition is 500 ten thousand pixels, the size of the acquired image is 2456 x 2054, and the accuracy is 0.08 mm/pixl.
In particular, the method is suitable for 156 mm-size battery pieces.
Specifically, the step 3-2 of determining the thickness unevenness defect is realized by comparing that when the difference is greater than 6, the count is increased by 1, and the count is greater than 4, the thickness unevenness defect is determined; when the count is greater than 4 and the difference is less than 15, judging that the thickness is uneven; and when the difference value is larger than 15, judging that the thickness is uneven.
The method for detecting the defect of uneven thickness of the grid line on the appearance of the battery piece is divided into three major parts, wherein the first part is an image preprocessing unit and is used for acquiring vertical discontinuous grid line information; the second part is a curve fitting unit which is used for fitting the average value of each row of grid lines; and the third part is a defect unit for detecting the thickness unevenness of the grid line, and the difference between the image array and the fitting curve is used for judging and detecting. The method comprises the steps of fitting grid line information into a curve, judging whether the defect is the defect of uneven grid line thickness by utilizing the difference value of image array information and the fitting curve, realizing the visual detection of the defect of uneven grid line thickness on the surface of the solar cell, and forming a defect detection method for uneven grid line thickness by 7 parts of HSI channel conversion, morphological transformation, grid line averaging, curve fitting, Gaussian smoothing, difference value making, defect judgment and the like. Has the following beneficial effects: 1. the working efficiency is improved. 2. The detection quality of the battery piece is improved. 3. Is suitable for on-line separation of production lines.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a flow chart of a defect detection method according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a flow chart of a defect detection method of the present invention, which is a method for detecting defects of uneven grid lines on the appearance of a battery cell, the method includes three steps,
first step, image preprocessing unit
1-1, acquiring an HSI channel image: converting an RGB image acquired by an industrial camera into an HSI channel image, and taking information of the I channel image as a defect detection image;
1-2, extracting grid lines: on the basis of the step 1-1, extracting grid line information on the surface of the solar cell piece through morphological transformation to obtain discontinuous thin grid lines in the solar cell piece;
second step, curve fitting unit
2-1, averaging grid line labels: on the basis of the step 1-2, dividing the grid lines in the image into a plurality of grid lines, sequentially marking the grid lines respectively, and then solving the average value of each row of grid lines;
2-2, curve fitting: on the basis of the step 2-1, performing curve fitting on pixel values of grid lines of the image, and drawing to represent;
2-3, Gaussian smoothing: on the basis of the step 2-2, performing Gaussian smoothing on the fitted curve;
thirdly, judging defective units with uneven grid line thickness
3-1, calculating a difference value: on the basis of the step 2-3, making a difference value by using the image information of the step 1-2 and the Gaussian smooth curve fitted in the step 2-3, and solving an average value of the difference;
3-2, judging defects: and 3-1, judging whether the thickness unevenness defect exists or not according to the difference value of the image information and the fitting curve.
Specifically, in the steps 2-2 and 3-1, the image information is a two-dimensional curve image.
Specifically, the industrial camera used for image acquisition is 500 ten thousand pixels, the size of the acquired image is 2456 x 2054, and the accuracy is 0.08 mm/pixl.
In particular, the method is suitable for 156 mm-size battery pieces.
Specifically, the step 3-2 of determining the thickness unevenness defect is realized by comparing that when the difference is greater than 6, the count is increased by 1, and the count is greater than 4, the thickness unevenness defect is determined; when the count is greater than 4 and the difference is less than 15, judging that the thickness is uneven; and when the difference value is larger than 15, judging that the thickness is uneven.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (4)
1. A method for detecting defects of uneven thickness of grid lines on the appearance of a battery piece is characterized by comprising the following steps: the method comprises three steps of units,
first step, image preprocessing unit
1-1, acquiring an HSI channel image: converting an RGB image acquired by an industrial camera into an HSI channel image, and taking information of the I channel image as a defect detection image;
1-2, extracting grid lines: on the basis of the step 1-1, extracting grid line information on the surface of the solar cell piece through morphological transformation to obtain discontinuous thin grid lines in the solar cell piece;
second step, curve fitting unit
2-1, averaging grid line labels: on the basis of the step 1-2, dividing the grid lines in the image into a plurality of grid lines, sequentially marking the grid lines respectively, and then solving the average value of each row of grid lines;
2-2, curve fitting: on the basis of the step 2-1, performing curve fitting on pixel values of grid lines of the image, and drawing to represent;
2-3, Gaussian smoothing: on the basis of the step 2-2, performing Gaussian smoothing on the fitted curve;
thirdly, judging defective units with uneven grid line thickness
3-1, calculating a difference value: on the basis of the step 2-3, making a difference value by using the grid line information of the step 1-2 and the Gaussian smooth curve fitted in the step 2-3, and solving an average value of the difference;
3-2, judging defects: on the basis of the step 3-1, judging whether the thickness unevenness defect exists or not according to the difference value of the image information and the fitting curve, and specifically judging the thickness unevenness defect through comparison, wherein when the difference value is greater than 6, the count is increased by 1, and when the count is greater than 4, the thickness unevenness defect is judged; when the count is greater than 4 and the difference is less than 15, judging that the thickness is uneven; and when the difference value is larger than 15, judging that the thickness is uneven.
2. The method for detecting the defects of uneven grid line thickness of the appearance of the battery piece as claimed in claim 1, wherein the method comprises the following steps: and performing curve fitting on the pixel values of the grid lines of the image in the step 2-2 and performing Gaussian smoothing on the curve fitted in the step 3-1 to obtain a two-dimensional curve image.
3. The method for detecting the defects of uneven grid line thickness of the appearance of the battery piece as claimed in claim 1, wherein the method comprises the following steps: the industrial camera used for image acquisition is 500 ten thousand pixels, and the size of the acquired image is 2456 x 2054 with the accuracy of 0.08 mm/pixl.
4. The method for detecting the defects of uneven grid line thickness of the appearance of the battery piece as claimed in claim 1, wherein the method comprises the following steps: the method is suitable for 156 mm-specification battery pieces.
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| CN110443278B (en) * | 2019-07-02 | 2022-02-15 | 广州大学 | Method, device and equipment for detecting thickness abnormality of grid line of solar cell |
| CN114210591B (en) * | 2021-12-02 | 2023-12-22 | 格林美股份有限公司 | Lithium battery echelon utilization sorting method and device based on IC curve |
| CN114264675B (en) * | 2022-01-04 | 2023-09-01 | 浙江工业大学 | Defect detection device and method for solar cell grid line |
| CN115359059B (en) * | 2022-10-20 | 2023-01-31 | 一道新能源科技(衢州)有限公司 | Solar cell performance test method and system |
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| JP6035279B2 (en) * | 2014-05-08 | 2016-11-30 | 東京エレクトロン株式会社 | Film thickness measuring apparatus, film thickness measuring method, program, and computer storage medium |
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