CN105136118A - Intelligent temperature compensation method of high-precision inclinometer - Google Patents
Intelligent temperature compensation method of high-precision inclinometer Download PDFInfo
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- CN105136118A CN105136118A CN201510599780.0A CN201510599780A CN105136118A CN 105136118 A CN105136118 A CN 105136118A CN 201510599780 A CN201510599780 A CN 201510599780A CN 105136118 A CN105136118 A CN 105136118A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
Abstract
The invention discloses an intelligent temperature compensation method of a high-precision inclinometer, and relates to the field of inclination measurement or inclination monitoring. The method comprises steps as follows: a heating piece and a refrigerating piece are additionally arranged in the inclinometer, the power of the refrigerating piece and the power of the heating piece are loaded and unloaded step by step until the internal temperature of the inclinometer and temperature drift data are stabilized for a certain time period in each step, then the internal temperature of the inclinometer is raised from a temperature compensation lower-limit temperature, and meanwhile, the temperature and the temperature drift data are recorded at certain frequency; when the internal temperature of the inclinometer is raised to a temperature compensation upper-limit temperature, the heating piece is shut off and data recording is stopped. A group of stable data are extracted from data recorded during each step of loading and unloading and stored as a temperature drift array. When inclination is measured, the temperature during zero setting is recorded as the zero drift temperature of the measurement, and an actual inclination value is obtained by subtracting a relative temperature drift value of the current temperature relative to the zero drift temperature from a current measurement value. With the adoption of the intelligent temperature compensation method, the temperature compensation precision can be effectively improved, the temperature compensation workload can be reduced, and the work efficiency is improved.
Description
Technical field
The present invention relates to measurement of dip angle or monitoring field, inclination angle, specifically relate to a kind of Intelligent temperature compensating method of high-precision inclinometer.
Background technology
Along with the development of science and technology, the world progressively enters the Internet of Things epoch.Sensor is the main path and the technological means that obtain various information in nature and engineering field, and its performance quality is directly connected to accuracy and the authenticity of measurement result.Inclinator, as a kind of sensor measuring inclination angle, is applied widely in machinery, building and various engineering.
Measurement of dip angle material that chip uses in inclinator has its specific temperature property, therefore inclinator is when normally working, the heat of internal circuit generation and the impact of outside air temperature change can be subject to, also the impact of encapsulating structure and material can be subject to, be directly reflected as the temperature drift of measurement of dip angle data, be called for short temperature drift.Application number is Chinese utility model patent " the high precision band temperature compensation inclination angle module " proposition of 201220432150.6: obliquity sensor and temperature sensor heat-barrier material are closed, then people is for carrying out temperature compensation test, to reach the object overcoming temperature drift.
But to artificially carry out accurate temperature compensation to highly sensitive inclinator, need very harsh experimental enviroment: should consider to heat up, avoid again producing temperature compensation environment microseism or air current flow, temperature compensation workload is larger as far as possible.
In addition, in order to avoid inclinator produced temperature drift before starting to normal work, inclinator needed the preheated one-section time before starting to normal work, and this occupies certain working time, causes work efficiency to reduce.
Summary of the invention
The object of the invention is the deficiency in order to overcome above-mentioned background technology, a kind of Intelligent temperature compensating method of high-precision inclinometer is provided, the requirement to temperature compensation environment when inclinator normally works can be reduced, improve temperature compensation precision and reduce temperature compensation workload, reduce inclinator from the preheating time started to before normal work, effectively increase work efficiency.
The invention provides a kind of Intelligent temperature compensating method of high-precision inclinometer, comprise the following steps:
A, inclinator comprise measurement of dip angle chip and microcontroller, when measurement of dip angle chip internal is integrated with temperature measurement device, sets up heat sheet and cooling piece in inclinator inside; When measurement of dip angle chip internal is not integrated with temperature measurement device, set up in inclinator inside and heat sheet, cooling piece and temperature sensor, temperature sensor is placed in the side of measurement of dip angle chip;
B, inclinator intelligence obtains temperature drift array:
The microcontroller of B1, inclinator inside presets the temperature compensation ceiling temperature T in inclinator temperature compensation process
the upper limit, temperature compensation lower limit temperature T
lower limit; Inclinator is fixed on concrete shock insulation testing table; Inclinator normally works a period of time to its internal temperature and tilt readings when stablizing, and microprocessor controls inclinator is by current inclination reading automatic balancing;
B2, microcontroller start cooling piece, power loading is carried out in cooling piece classification, and every grade is loaded on inclinator inside and reaches thermal equilibrium, and namely the temperature of inclinator inside is all stable within a certain period of time with temperature drift data, cooling piece just carries out the loading of next stage power, until the temperature of inclinator inside is down to T
lower limittime following, cooling piece just stops loading power, and start classification and carry out power unloading, microcontroller starts with certain frequency collecting temperature data and temperature drift data simultaneously, automatically be kept in the storer of microcontroller, and the data gathered in every grade of uninstall process save as one group, every grade is offloaded to inclinator inside and reaches thermal equilibrium, cooling piece just carries out the unloading of next stage power, until the power of cooling piece is unloaded to zero;
B3, after inclinator inside reaches thermal equilibrium, microcontroller startup heats sheet, heat sheet classification and carry out power loading, every grade is loaded on after inclinator inside reaches thermal equilibrium, heat sheet and just carry out the loading of next stage power, microcontroller continues collecting temperature data and temperature drift data in above process, is automatically kept in the storer of microcontroller, and the data gathered in every grade of loading procedure save as one group, until the temperature of inclinator inside is raised to T
the upper limittime, heat sheet and quit work, microcontroller stops record temperature data and temperature drift data simultaneously;
B4, microcontroller process the data that Auto-grouping is kept in microcontroller:
Microcontroller is from the multi-group data preserved, extract often finally stabilised temperature value and warm drift value in group, as the temperature drift data of this group, be kept in temperature drift array, have some column datas in temperature drift array, n is total columns of temperature drift array, and m is the sequence number arranged in temperature drift array, n, m are positive integer, and 4≤m≤n; In temperature drift array, the temperature value of m row is T
m, in temperature drift array, the temperature drift value of m row is D
m, in temperature drift array, the temperature value of the n-th row is T
n, in temperature drift array, the temperature drift value of the n-th row is D
n;
C, use inclinator time, the microcontroller of inclinator inside completes temperature compensation automatically:
When inclination angle measured by C1, use inclinator, manually by the reading zero setting of inclinator, record temperature T during zero setting simultaneously
0, T
0for the drift temperature that this is measured, T
lower limit< T
0< T
the upper limit;
C2, measure after a period of time, the current inclination reading of inclinator is A
x, the Current Temperatures of temperature sensor record inclinator inside is T
x, inclinator is at Current Temperatures T
xunder relative to drift temperature T
0the temperature drift value occurred is D
x-0, microcontroller, by data interpolating method, in conjunction with temperature drift array, calculates warm drift value D
x-0;
C3, microcontroller are again according to the true measurement of dip angle value A of following formulae discovery
real: A
real=A
x-D
x-0, inclinator outwards exports true measurement of dip angle value A
real.
On the basis of technique scheme, in step C2, microcontroller calculates warm drift value D
x-0formula be:
Wherein, x, k, k-1, j, j-1 are the sequence number arranged in temperature drift array, and x, k, k-1, j, j-1 are positive integer, and the temperature value in temperature drift array in xth row is T
x, the temperature drift value in temperature drift array in xth row is D
x; Temperature value in temperature drift array in kth row is T
k, the temperature drift value in temperature drift array in kth row is D
k; Temperature value in temperature drift array in kth-1 row is T
k-1, the temperature drift value in temperature drift array in kth-1 row is D
k-1; Temperature value in temperature drift array in jth row is T
j, the temperature drift value in temperature drift array in jth row is D
j; Temperature value in temperature drift array in jth-1 row is T
j-1, in temperature drift array in jth-1 row is warm drift value D
j-1;
T
xtwo corresponding adjacent datas are classified as (T
k-1, D
k-1) and (T
k, D
k), the linear interpolation point of these two adjacent data row is D
x;
Work as T
lower limit< T
x< T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) temperature value satisfy condition: T
k-1≤ T
x≤ T
k; Work as T
x< T
lower limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get most first two columns data; Work as T
x> T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get last two column datas;
Drift temperature T
0in corresponding temperature drift array, two adjacent datas are classified as (T
j-1, D
j-1) and (T
j, D
j), the linear interpolation point of these two adjacent data row is D
0, the temperature value in these two adjacent data row satisfies condition: T
j-1≤ T
0≤ T
j.
On the basis of technique scheme, microcontroller described in step C2, by segmentation three Hermite Hermite interpolation methods, in conjunction with temperature drift array, calculates warm drift value D
x-0.
On the basis of technique scheme, the intelligence of inclinator described in step B obtains in the process of temperature drift array, and the temperature of external environment condition is between-10 DEG C ~ 35 DEG C.
On the basis of technique scheme, in step B2, cooling piece divides 5 ~ 20 grades to carry out power load or unload.
On the basis of technique scheme, in step B2, cooling piece divides 10 grades to carry out power load or unload.
On the basis of technique scheme, in step B2, inclinator inside reaches thermal equilibrium and refers to: temperature and the temperature drift data of inclinator inside are all stable in 1 ~ 2 minute.
On the basis of technique scheme, in step B2, microcontroller is with the frequency collection temperature data of 0.2 ~ 1HZ and temperature drift data.
On the basis of technique scheme, in step B2, microcontroller is with the frequency collection temperature data of 0.4HZ and temperature drift data.
On the basis of technique scheme, heat sheet classification in step B3 when carrying out power load or unload, the quantity heating sheet classification is identical with the quantity of cooling piece classification.
Compared with prior art, advantage of the present invention is as follows:
(1) the present invention heats sheet and cooling piece in the increase of inclinator inside, inclinator is placed on concrete shock insulation testing table, by the microcontroller of inclinator inside, hierarchical loading or load shedding are carried out to cooling piece, the power that heats sheet, every grade of load or unload reaches inclinator internal temperature and stablizes within a period of time with temperature drift data, makes inclinator internal temperature from temperature compensation lower limit temperature T
lower limitraise step by step, simultaneously with certain frequency record temperature and temperature drift data, inclinator internal temperature rises step by step, when rising to temperature compensation ceiling temperature T
the upper limittime, stop heating sheet work and data record.From the temperature and temperature drift data of every grade of load or unload record, extract temperature and the temperature drift data of one group of numerical stability, save as temperature drift array.When measuring inclination angle, during record zero setting, temperature is the drift temperature of this measurement, when the temperature varies, deducts the relatively warm drift value of Current Temperatures relative to drift temperature with current measurement value, namely obtain true inclination value, relatively warm drift value then utilizes temperature drift array and interpolation method to obtain.Method in the present invention has good feasibility and practicality, the requirement to temperature compensation environment when inclinator normally works can be reduced, make inclinator in common shock insulation experimental enviroment, automatically can complete the seizure of temperature drift data accurately, and it is for subsequent use to be stored in inclinator microcontroller.When measuring inclination angle, utilizing temperature drift array to carry out temperature compensation correction to the inclination angle measured, obtaining real inclination value, complete high-precision instrument temperature compensation, can effectively improve temperature compensation precision, and reduce temperature compensation workload.
(2) method in the present invention is adopted to realize the high precision temp added time, inclinator can be shortened from the preheating time started between normal work, after inclinator starts, within a short period of time can normally work, and effectively can increase work efficiency, not affect measurement result.
Accompanying drawing explanation
Fig. 1 is a kind of structured flowchart of inclinator in the embodiment of the present invention.
Fig. 2 is the another kind of structured flowchart of inclinator in the embodiment of the present invention.
Fig. 3 is that in the embodiment of the present invention, inclinator is placed in the structured flowchart on concrete shock insulation testing table.
Embodiment
Below in conjunction with drawings and the specific embodiments, the present invention is described in further detail.
The embodiment of the present invention provides a kind of Intelligent temperature compensating method of high-precision inclinometer, comprises the following steps:
A, inclinator comprise measurement of dip angle chip and microcontroller, shown in Figure 1, when measurement of dip angle chip internal is integrated with temperature measurement device, sets up in inclinator inside and heat sheet and cooling piece, heat sheet, the power of cooling piece, specification be determined on a case-by-case basis; Shown in Figure 2, when measurement of dip angle chip internal is not integrated with temperature measurement device, set up in inclinator inside and heat sheet, cooling piece and temperature sensor, temperature sensor is placed in the side of measurement of dip angle chip, heats sheet, the power of cooling piece, specification be determined on a case-by-case basis.
B, inclinator intelligence obtains temperature drift array:
The microcontroller of B1, inclinator inside presets the temperature compensation ceiling temperature T in inclinator temperature compensation process
the upper limit, temperature compensation lower limit temperature T
lower limit.Shown in Figure 3, be fixed on by inclinator on concrete shock insulation testing table, inclinator intelligence obtains in the process of temperature drift array, and the temperature of external environment condition, between-10 DEG C ~ 35 DEG C, allows environment temperature to have variation; Inclinator normally works a period of time to its internal temperature and tilt readings when stablizing, and microprocessor controls inclinator is by current inclination reading automatic balancing.
B2, microcontroller start cooling piece, power loading is carried out in cooling piece classification, 5 ~ 20 grades can be divided, be preferably 10 grades, every grade is loaded on inclinator inside and reaches thermal equilibrium, namely inclinator inside temperature and temperature drift data within a certain period of time (1 ~ 2 minute) all stable, cooling piece just carries out the loading of next stage power, until the temperature of inclinator inside is down to T
lower limittime following, cooling piece just stops loading power, and start classification and carry out power unloading, microcontroller starts with certain frequency collecting temperature data and temperature drift data simultaneously, and frequency can be 0.2 ~ 1HZ, be preferably 0.4HZ, automatically be kept in the storer of microcontroller, and the data gathered in every grade of uninstall process save as one group, every grade is offloaded to inclinator inside and reaches thermal equilibrium, cooling piece just carries out the unloading of next stage power, until the power of cooling piece is unloaded to zero.
B3, after inclinator inside reaches thermal equilibrium, microcontroller startup heats sheet, heat sheet classification and carry out power loading, the quantity heating sheet classification is preferably identical with the quantity of cooling piece classification, be divided into 5 ~ 20 grades, be preferably 10 grades, every grade is loaded on after inclinator inside reaches thermal equilibrium, heat sheet and just carry out the loading of next stage power, microcontroller continues collecting temperature data and temperature drift data in above process, automatically be kept in the storer of microcontroller, and the data gathered in every grade of loading procedure save as one group, until the temperature of inclinator inside is raised to T
the upper limittime, heat sheet and quit work, microcontroller stops record temperature data and temperature drift data simultaneously.
B4, microcontroller process the data that Auto-grouping is kept in microcontroller:
Microcontroller is from the multi-group data preserved, extract often finally stabilised temperature value and warm drift value in group, as the temperature drift data of this group, be kept in temperature drift array, ginseng is shown in Table 1, and has some column datas in temperature drift array, n is total columns of temperature drift array, m is the sequence number arranged in temperature drift array, and n, m are positive integer, and 4≤m≤n; In temperature drift array, the temperature value of m row is T
m, in temperature drift array, the temperature drift value of m row is D
m, in temperature drift array, the temperature value of the n-th row is T
n, in temperature drift array, the temperature drift value of the n-th row is D
n; The unit of temperature drift value be angular unit " (second), 1 "=(1/3600) °, 1 °=3600 ".
The data of table 1, temperature drift array
| Row sequence number | 1 | 2 | 3 | 4 | … | m | … | n |
| Temperature T/ DEG C | T 1 | T 2 | T 3 | T 4 | … | T m | … | T n |
| Temperature drift D/ " | D 1 | D 2 | D 3 | D 4 | … | D m | … | D n |
C, use inclinator time, the microcontroller of inclinator inside completes temperature compensation automatically:
When C1, use inclinator actual measurement inclination angle, conveniently reading, manually by the reading zero setting of inclinator, records temperature T during zero setting simultaneously
0(as zero setting again, then temperature when covering zero setting last time by temperature during zero setting again), T
0for the drift temperature that this is measured, T
under limit< T
0< T
the upper limit.Along with the change of external environment (temperature, illumination), inclinator internal temperature changes and produces temperature drift.
C2, measure after a period of time, the current inclination reading of inclinator is A
x, the Current Temperatures of temperature sensor record inclinator inside is T
x, inclinator is at Current Temperatures T
xunder relative to drift temperature T
0the temperature drift value occurred is D
x-0, microcontroller combines temperature drift array by data interpolating method and calculates warm drift value D
x-0.
In step C2, microcontroller calculates warm drift value D
x-0concrete formula be:
Wherein, x, k, k-1, j, j-1 are the sequence number arranged in temperature drift array, and x, k, k-1, j, j-1 are positive integer, and the temperature value in temperature drift array in xth row is T
x, the temperature drift value in temperature drift array in xth row is D
x; Temperature value in temperature drift array in kth row is T
k, the temperature drift value in temperature drift array in kth row is D
k; Temperature value in temperature drift array in kth-1 row is T
k-1, the temperature drift value in temperature drift array in kth-1 row is D
k-1; Temperature value in temperature drift array in jth row is T
j, the temperature drift value in temperature drift array in jth row is D
j; Temperature value in temperature drift array in jth-1 row is T
j-1, in temperature drift array in jth-1 row is warm drift value D
j-1;
T
xtwo corresponding adjacent datas are classified as (T
k-1, D
k-1) and (T
k, D
k), the linear interpolation point of these two adjacent data row is D
x;
Work as T
lower limit< T
x< T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) temperature value satisfy condition: T
k-1≤ T
x≤ T
k; Work as T
x< T
lower limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get most first two columns data; Work as T
x> T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get last two column datas.
Drift temperature T
0in corresponding temperature drift array, two adjacent datas are classified as (T
j-1, D
j-1) and (T
j, D
j), the linear interpolation point of these two adjacent data row is D
0, and the temperature value in these two adjacent data row satisfies condition: T
j-1≤ T
0≤ T
j.
Generally, above-mentioned data interpolating method adopts basic linear interpolation method; If temperature compensation experimental enviroment is better, when temperature compensation accuracy requirement is higher, data interpolating method can select segmentation three Hermite (Hermite) interpolation methods.
C3, microcontroller are again according to the true measurement of dip angle value A of following formulae discovery
real: A
real=A
x-D
x-0, inclinator outwards exports true measurement of dip angle value A
real.
Be described in detail below by a specific embodiment.
S1, inclinator comprise measurement of dip angle chip and microcontroller, and set up in inclinator inside and heat sheet, cooling piece and temperature sensor, temperature sensor is placed in the side of measurement of dip angle chip, shown in Figure 2.Inclinator Measurement Resolution in the present embodiment reaches 1 ", precision 5 ", range ± 15 °, belong to high-precision inclinometer.
S2, inclinator intelligence obtains temperature drift array:
S201, consider that electronic device generally can work between-20 DEG C ~ 80 DEG C, the microcontroller of inclinator inside presets the temperature compensation ceiling temperature T of inclinator temperature compensation process
the upper limitbe 70 DEG C, temperature compensation lower limit temperature T
lower limitfor-15 DEG C.Shown in Figure 3, inclinator is fixed on concrete shock insulation testing table.Inclinator intelligence obtains in the process of temperature drift array, and the temperature of external environment condition is between-10 DEG C ~ 35 DEG C.Inclinator normally works its internal temperature of a period of time and tilt readings when stablizing, and microprocessor controls inclinator is by current inclination reading automatic balancing.
S202, microcontroller starts cooling piece, cooling piece divides 10 grades to carry out power loading, every grade is loaded on inclinator inside and reaches thermal equilibrium, namely the temperature of inclinator inside is all stable within a period of time (1 minute) with temperature drift data, cooling piece just carries out the loading of next stage power, until when the temperature of inclinator inside is down to below-15 DEG C, cooling piece just stops loading power, and start classification and carry out power unloading, microcontroller starts with the frequency collection temperature data of 0.4HZ and temperature drift data simultaneously, automatically be kept in the storer of microcontroller, and the data gathered in every grade of uninstall process save as one group, every grade is offloaded to inclinator inside and reaches thermal equilibrium, cooling piece just carries out the unloading of next stage power, until the power of cooling piece is unloaded to zero,
S203, after inclinator inside reaches thermal equilibrium, microcontroller startup heats sheet, heating sheet also divides 10 grades to carry out power loading, every grade is loaded on after inclinator inside reaches thermal equilibrium, heat sheet and just carry out the loading of next stage power, microcontroller continues collecting temperature data and temperature drift data in above process, automatically be kept in the storer of microcontroller, and the data gathered in every grade of loading procedure save as one group, until when the temperature of inclinator inside is more than 70 DEG C, heat sheet to quit work, microcontroller stops record temperature value and warm drift value simultaneously.
S204, microcontroller process the data that Auto-grouping is kept in microcontroller:
Microcontroller sieve, from the multi-group data preserved, extracts often finally stabilised temperature value and warm drift value in group, and as the temperature drift data of this group, be kept in temperature drift array, ginseng is shown in Table 2.
Table 2, temperature drift array example
| Array sequence number | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 |
| Temperature T/ DEG C | -14.5 | -6.3 | 2.0 | 10.2 | 18.3 | 26.6 | 34.9 | 43.3 | 51.4 | 59.7 | 67.8 |
| Temperature drift D/ " | -306 | -180 | -75 | 15 | 102 | 201 | 318 | 444 | 579 | 735 | 912 |
S3, use inclinator time, the microcontroller of inclinator inside completes temperature compensation automatically:
When inclination angle measured by S301, use inclinator, manually by the reading zero setting of inclinator, record temperature T during zero setting simultaneously
0, T
0for the drift temperature that this is measured, T
lower limit< T
0< T
the upper limit;
S302, measure after a period of time, the current inclination reading of inclinator is A
x, the Current Temperatures of temperature sensor record inclinator inside is T
x, inclinator is at Current Temperatures T
xunder relative to drift temperature T
0the temperature drift value occurred is D
x-0, microcontroller, by data interpolating method, in conjunction with temperature drift array, calculates warm drift value D
x-0;
S303, microcontroller are again according to the true measurement of dip angle value A of following formulae discovery
real: A
real=A
x-D
x-0, inclinator outwards exports true measurement of dip angle value A
real.
Test for actual service condition, temperature compensation effect is as follows:
When using inclinator actual measurement inclination angle, inclinator is after startup 2 minutes (demonstrate and do not need longer preheating time), artificial by tilt readings zero setting, and then to rotate a low-angle (1800 " ~ 3600 ") static afterwards for inclinator, now measured value is 2391 " (1 °=3600 "), and record temperature value 21.2 DEG C now.Then daylight lamp (50 ~ 100 watts) is used to irradiate inclinator, with Reality simulation environment for use, inclinator internal temperature can raise, from 25 DEG C, every 8 DEG C of records tilt readings, when measured temperature is elevated to 49 °, turn off daylight lamp, inclinator cools naturally, until inclinator internal temperature (2 minutes) within a period of time is stablized, and tilt readings during record equilibrium temperature.
The test data of table 3, temperature compensation effect
| Sequentially | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 |
| Temperature T/ DEG C | 21.2 | 25 | 33 | 41 | 49 | 41 | 33 | 25 | 23.8 |
| Tilt readings A/ " | 2391 | 2385 | 2389 | 2396 | 2397 | 2392 | 2387 | 2386 | 2389 |
| Temperature drift D1/ " | 0 | -6 | -2 | 5 | 6 | 1 | -4 | -5 | -2 |
Concrete test result ginseng is shown in Table 3, can table 3 known: warm drift problem obtains good control.
Method in the present invention is simple, makes inclinator in common shock insulation experimental enviroment, automatically can complete the seizure of temperature drift data accurately, and it is for subsequent use to be stored in inclinator microcontroller.When measuring inclination angle, utilizing temperature drift array to carry out temperature compensation correction to the inclination angle measured, obtaining real inclination value, complete high-precision instrument temperature compensation; The high precision temp added time that method in the present invention is carried out, effectively can shorten inclinator preheating time, normally can work in the short period after startup, and can not measurement result be affected.
Those skilled in the art can carry out various modifications and variations to the embodiment of the present invention, if these amendments and modification are within the scope of the claims in the present invention and equivalent technologies thereof, then these revise and modification also within protection scope of the present invention.
The prior art that the content do not described in detail in instructions is known to the skilled person.
Claims (10)
1. an Intelligent temperature compensating method for high-precision inclinometer, is characterized in that, comprise the following steps:
A, inclinator comprise measurement of dip angle chip and microcontroller, when measurement of dip angle chip internal is integrated with temperature measurement device, sets up heat sheet and cooling piece in inclinator inside; When measurement of dip angle chip internal is not integrated with temperature measurement device, set up in inclinator inside and heat sheet, cooling piece and temperature sensor, temperature sensor is placed in the side of measurement of dip angle chip;
B, inclinator intelligence obtains temperature drift array:
The microcontroller of B1, inclinator inside presets the temperature compensation ceiling temperature T in inclinator temperature compensation process
the upper limit, temperature compensation lower limit temperature T
lower limit; Inclinator is fixed on concrete shock insulation testing table; Inclinator normally works a period of time to its internal temperature and tilt readings when stablizing, and microprocessor controls inclinator is by current inclination reading automatic balancing;
B2, microcontroller start cooling piece, power loading is carried out in cooling piece classification, and every grade is loaded on inclinator inside and reaches thermal equilibrium, and namely the temperature of inclinator inside is all stable within a certain period of time with temperature drift data, cooling piece just carries out the loading of next stage power, until the temperature of inclinator inside is down to T
lower limittime following, cooling piece just stops loading power, and start classification and carry out power unloading, microcontroller starts with certain frequency collecting temperature data and temperature drift data simultaneously, automatically be kept in the storer of microcontroller, and the data gathered in every grade of uninstall process save as one group, every grade is offloaded to inclinator inside and reaches thermal equilibrium, cooling piece just carries out the unloading of next stage power, until the power of cooling piece is unloaded to zero;
B3, after inclinator inside reaches thermal equilibrium, microcontroller startup heats sheet, heat sheet classification and carry out power loading, every grade is loaded on after inclinator inside reaches thermal equilibrium, heat sheet and just carry out the loading of next stage power, microcontroller continues collecting temperature data and temperature drift data in above process, is automatically kept in the storer of microcontroller, and the data gathered in every grade of loading procedure save as one group, until the temperature of inclinator inside is raised to T
the upper limittime, heat sheet and quit work, microcontroller stops record temperature data and temperature drift data simultaneously;
B4, microcontroller process the data that Auto-grouping is kept in microcontroller:
Microcontroller is from the multi-group data preserved, extract often finally stabilised temperature value and warm drift value in group, as the temperature drift data of this group, be kept in temperature drift array, have some column datas in temperature drift array, n is total columns of temperature drift array, and m is the sequence number arranged in temperature drift array, n, m are positive integer, and 4≤m≤n; In temperature drift array, the temperature value of m row is T
m, in temperature drift array, the temperature drift value of m row is D
m, in temperature drift array, the temperature value of the n-th row is T
n, in temperature drift array, the temperature drift value of the n-th row is D
n;
C, use inclinator time, the microcontroller of inclinator inside completes temperature compensation automatically:
When inclination angle measured by C1, use inclinator, manually by the reading zero setting of inclinator, record temperature T during zero setting simultaneously
0, T
0for the drift temperature that this is measured, T
lower limit< T
0< T
the upper limit;
C2, measure after a period of time, the current inclination reading of inclinator is A
x, the Current Temperatures of temperature sensor record inclinator inside is T
x, inclinator is at Current Temperatures T
xunder relative to drift temperature T
0the temperature drift value occurred is D
x-0, microcontroller, by data interpolating method, in conjunction with temperature drift array, calculates warm drift value D
x-0;
C3, microcontroller are again according to the true measurement of dip angle value A of following formulae discovery
real: A
real=A
x-D
x-0, inclinator outwards exports true measurement of dip angle value A
real.
2. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: in step C2, microcontroller calculates warm drift value D
x-0formula be:
Wherein, x, k, k-1, j, j-1 are the sequence number arranged in temperature drift array, and x, k, k-1, j, j-1 are positive integer, and the temperature value in temperature drift array in xth row is T
x, the temperature drift value in temperature drift array in xth row is D
x; Temperature value in temperature drift array in kth row is T
k, the temperature drift value in temperature drift array in kth row is D
k; Temperature value in temperature drift array in kth-1 row is T
k-1, the temperature drift value in temperature drift array in kth-1 row is D
k-1; Temperature value in temperature drift array in jth row is T
j, the temperature drift value in temperature drift array in jth row is D
j; Temperature value in temperature drift array in jth-1 row is T
j-1, in temperature drift array in jth-1 row is warm drift value D
j-1;
T
xtwo corresponding adjacent datas are classified as (T
k-1, D
k-1) and (T
k, D
k), the linear interpolation point of these two adjacent data row is D
x;
Work as T
lower limit< T
x< T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) temperature value satisfy condition: T
k-1≤ T
x≤ T
k; Work as T
x< T
lower limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get most first two columns data; Work as T
x> T
the upper limittime, two adjacent data row (T
k-1, D
k-1) and (T
k, D
k) get last two column datas;
Drift temperature T
0in corresponding temperature drift array, two adjacent datas are classified as (T
j-1, D
j-1) and (T
j, D
j), the linear interpolation point of these two adjacent data row is D
0, the temperature value in these two adjacent data row satisfies condition: T
j-1≤ T
0≤ T
j.
3. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: microcontroller described in step C2, by segmentation three Hermite Hermite interpolation methods, in conjunction with temperature drift array, calculates warm drift value D
x-0.
4. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: the intelligence of inclinator described in step B obtains in the process of temperature drift array, and the temperature of external environment condition is between-10 DEG C ~ 35 DEG C.
5. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: in step B2, cooling piece divides 5 ~ 20 grades to carry out power load or unload.
6. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 5, is characterized in that: in step B2, cooling piece divides 10 grades to carry out power load or unload.
7. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: in step B2, inclinator inside reaches thermal equilibrium and refers to: temperature and the temperature drift data of inclinator inside are all stable in 1 ~ 2 minute.
8. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 1, is characterized in that: in step B2, microcontroller is with the frequency collection temperature data of 0.2 ~ 1HZ and temperature drift data.
9. the Intelligent temperature compensating method of high-precision inclinometer as claimed in claim 8, is characterized in that: in step B2, microcontroller is with the frequency collection temperature data of 0.4HZ and temperature drift data.
10. the Intelligent temperature compensating method of as claimed in any one of claims 1-9 wherein high-precision inclinometer, is characterized in that: heat sheet classification in step B3 when carrying out power load or unload, the quantity heating sheet classification is identical with the quantity of cooling piece classification.
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