CN105115702A - Automated test control method of wavelength-correlative device - Google Patents
Automated test control method of wavelength-correlative device Download PDFInfo
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- CN105115702A CN105115702A CN201510509629.3A CN201510509629A CN105115702A CN 105115702 A CN105115702 A CN 105115702A CN 201510509629 A CN201510509629 A CN 201510509629A CN 105115702 A CN105115702 A CN 105115702A
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Abstract
The invention discloses an automated test control method of a wavelength-correlative device. The method comprises the following steps of: connecting a host with a computer via a GPIB-to-USB interface and opening Labview to communicate the host and a program; writing a command into the host; reading information that fed back to the program by the host after the host receives the command; converting a data format in a VISA READ reading buffer in order to convert data in the form of character strings into decimal data and form a table format; closing an GPIB interface after reading and writing are completed; extracting a numerical part about a wavelength 1550 from a VISA WRITE command; in a wavelength scanning process, extracting a power maximum value, a power minimum value, and wavelengths corresponding to the power maximum value and the power minimum value from the table by writing a program; and automatically generating a required EXCEL table file from an automatically-tested data table. The method achieves automated test control and is convenient and fast.
Description
Technical field
The present invention relates to a kind of method of testing of wavelength dependence device, particularly relate to a kind of automatic test control method of wavelength dependence device.
Background technology
Traditional test: utilize above-mentioned instrument to test wavelength dependence device, traditional method of testing is: suppose that the wavelength coverage needing test is 1550nm-1560nm, every 0.1nm test once, such as 1550.1nm, the wavelength that tunable laser is set is needed to be 1550.1nm, the wavelength arranging power meter is again 1550.1nm, now records the reading that power meter is corresponding; Next wavelength is set again, so ceaselessly reading is set repeatedly.About some settings of instrument parameter, need on instrument, to carry out repeatedly button by button and select to arrange.Said method carry out testing all to consume on time and manpower a lot, inefficiency.
Summary of the invention
The object of this invention is to provide a kind of automatic test control method of wavelength dependence device, the automatic test control method of this wavelength dependence device can realize automatic test and control, convenient and swift.
For realizing above-mentioned technical purpose, the technical scheme that the present invention takes is: the automatic test control method of wavelength dependence device, is characterized in that comprising the following steps:
The first step: turn USB interface by GPIB and connect main frame and computer, open Labview, realize the connection between main frame and program; Described main frame is Agilent8163B main frame; Described Agilent8163B main frame comprises the Agilent81634B power meter module of Agilent81960A tunable laser module and Wavelength tunable;
Second step: to host write command, namely writes Host Control Command in VISAWRITE function, and shown control command is followed successively by: arranging tunable laser wavelength is 1550nm, and arranging wavelength when power meter reads is 1550nm, readout power meter reading;
3rd step: read main frame and to receive orders the information of the program that feeds back to;
4th step: conversion VISAREAD reads the data layout in buffer zone, converts the data of character string forms to decimal data, and forms form;
5th step: read and write closedown gpib interface.
As further improved technical scheme of the present invention, further comprising the steps of:
6th step: in VISAWRITE write order about this numerical portion extraction and isolation of wavelength 1550 out; Then between VISAWRITE and VISAREAD, add a FOR loop program, the numerical portion 1550 extracted is realized the constantly cumulative of numeral by coding and FOR circulation; In program, the scanning wavelength scope of tunable laser and stepping wavelength can be arranged as required;
7th step: when in the process of carrying out length scanning, extracted the wavelength of power maximal value and minimum value and their correspondences in form by coding;
8th step: by the data form of automatic test, the Microsoft Excel file required for automatically generating on computers.
As further improved technical scheme of the present invention, in second step, write the parameter command of main frame simultaneously.
As further improved technical scheme of the present invention, described parameter command is: power meter unit is arranged, power meter reads set of time.
The present invention, on host interface, can regulate laser instrument or power meter wavelength and some correlation parameters by button; By Labview coding, realize, on programmed control panel, arranging required parameter, only need change some parameters, realize intuitively easy; Realize reading in real time the reading of power meter and preserving simultaneously.Although tunable laser has autoscan function, in the process of instrument designing scanning, the reading of power meter reading cannot be carried out; In a program, utilize the autoscan function of instrument, also cannot realize the reading to the corresponding power of each wavelength.Abandon the length scanning process that instrument carries for this reason, the scanning that coding realizes tunable laser wavelength is designed by Labview, and in the process of scanning, make the wavelength of power meter follow the tracks of laser scans wavelength all the time, in Labview, record the performance number of each scanning wavelength simultaneously.When whole scanning completes, design program isolate scanning wavelength process in the maximal value of power meter and minimum value and the wavelength corresponding to them; Simultaneously when program end of run time, generate Microsoft Excel corresponding to scan-data on computers.
Accompanying drawing explanation
Fig. 1 is the automatic test programming flowchart of wavelength dependence device;
Fig. 2 is the automatic test program actual motion front panel schematic diagram of wavelength dependence device;
Fig. 3 is that the automatic test data of wavelength dependence device generate Microsoft Excel figure automatically.
Embodiment
Embodiment 1
The automatic test control method of this wavelength dependence device comprises the following steps:
The first step: turn USB interface by GPIB and connect main frame and computer, open Labview, realize the connection between main frame and program; Described main frame is Agilent8163B main frame; Described Agilent8163B main frame comprises the Agilent81634B power meter module of Agilent81960A tunable laser module and Wavelength tunable;
Second step: to host write command; In VISAWRITE function, write Host Control Command, host computer control is followed successively by: arranging tunable laser wavelength is 1550nm, and arranging wavelength when power meter reads is 1550nm, readout power meter reading; Meanwhile, also can writing some parameter commands of instrument, as read set of time etc. to the setting of power meter unit, power meter, as settings need be changed, only need change corresponding numerical portion, simple and convenient.Such as sens1:pow:unit1; It is W that numeral 1 represents power meter unit; Numerical portion is changed into 0 and represent power meter unit;
3rd step: read main frame and to receive orders the information of the program that feeds back to;
4th step: conversion VISAREAD reads the data layout in buffer zone, converts the data of character string forms to decimal data, and forms form;
5th step: read and write closedown gpib interface;
When above-mentioned steps can realize arranging single wavelength, the reading of readout power meter; How to realize the wavelength continuously adjustabe of tunable laser, the wavelength of power meter is consistent simultaneously, the reading of readout power meter.Shown in following 6th step:
6th step: as shown in Figure 1, the method for realization be in VISAWRITE write order about this numerical portion extraction and isolation of wavelength 1550 out; Then between VISAWRITE and VISAREAD, add a FOR loop program; The numerical portion 1550 will extracted again, realizes the constantly cumulative of numeral by coding and FOR circulation; Stepping wavelength place is set to 0.1, and start wavelength is set to 1550, supposes that the times N of FOR circulation top is set to 11.Then when program is run time, time VISAWRITE and VISAREAD runs first time circulation, the wavelength 1550nm of tunable laser and power meter is set, then the readings of recording power meter; Program proceeds second time circular flow, and now go forward one by one as 1550.1nm in wavelength place, arranges the wavelength 1550.1nm of tunable laser and power meter, then the readings of recording power meter; The like, until circulation has completed for 11 times, now stopping wavelength has been 1551nm.Then the VISA that program enters below closes function down interface; In program, the scanning wavelength scope of tunable laser and stepping wavelength can be arranged as required;
7th step: when in the process of carrying out length scanning, the list data of generation generally can be more, extracted the wavelength of power maximal value and minimum value and their correspondences in form by coding.
8th step: by the data form of automatic test, the Microsoft Excel file required for automatically generating on computers.The present invention, on host interface, can regulate laser instrument or power meter wavelength and some correlation parameters by button; By Labview coding, realize, on programmed control panel, arranging required parameter, only need change some parameters, realize intuitively easy; Realize reading in real time the reading of power meter and preserving simultaneously.Fig. 2 is the automatic test program actual motion front panel schematic diagram of wavelength dependence device.
Although tunable laser has autoscan function, in the process of instrument designing scanning, the reading of power meter reading cannot be carried out; In a program, utilize the autoscan function of instrument, also cannot realize the reading to the corresponding power of each wavelength.Abandon the length scanning process that instrument carries for this reason, the scanning that coding realizes tunable laser wavelength is designed by Labview, and in the process of scanning, make the wavelength of power meter follow the tracks of laser scans wavelength all the time, in Labview, record the performance number of each scanning wavelength simultaneously.
When whole scanning completes, design program isolate scanning wavelength process in the maximal value of power meter and minimum value and the wavelength corresponding to them; Simultaneously when program end of run time, generate Microsoft Excel corresponding to scan-data on computers.When whole program design completes, suppose that wavelength is from 1550nm-1560nm, read a secondary data every 0.1nm, read 101 data and only need click program operation button, the result that after tens seconds, program is run as shown in Figure 3.
Claims (4)
1. an automatic test control method for wavelength dependence device, is characterized in that comprising the following steps:
The first step: turn USB interface by GPIB and connect main frame and computer, open Labview, realize the connection between main frame and program; Described main frame is Agilent8163B main frame; Described Agilent8163B main frame comprises the Agilent81634B power meter module of Agilent81960A tunable laser module and Wavelength tunable;
Second step: to host write command, namely writes Host Control Command in VISAWRITE function, and shown control command is followed successively by: arranging tunable laser wavelength is 1550nm, and arranging wavelength when power meter reads is 1550nm, readout power meter reading;
3rd step: read main frame and to receive orders the information of the program that feeds back to;
4th step: conversion VISAREAD reads the data layout in buffer zone, converts the data of character string forms to decimal data, and forms form;
5th step: read and write closedown gpib interface.
2. the automatic test control method of wavelength dependence device according to claim 1, characterized by further comprising following steps:
6th step: in VISAWRITE write order about this numerical portion extraction and isolation of wavelength 1550 out; Then between VISAWRITE and VISAREAD, add a FOR loop program, the numerical portion 1550 extracted is realized the constantly cumulative of numeral by coding and FOR circulation; In program, the scanning wavelength scope of tunable laser and stepping wavelength can be arranged as required;
7th step: when in the process of carrying out length scanning, extracted the wavelength of power maximal value and minimum value and their correspondences in form by coding;
8th step: by the data form of automatic test, the Microsoft Excel file required for automatically generating on computers.
3. the automatic test control method of wavelength dependence device according to claim 1 and 2, is characterized in that: in second step, writes the parameter command of main frame simultaneously.
4. the automatic test control method of wavelength dependence device according to claim 3, is characterized in that: described parameter command is: power meter unit is arranged, power meter reads set of time.
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| CN201510509629.3A CN105115702A (en) | 2015-08-18 | 2015-08-18 | Automated test control method of wavelength-correlative device |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1995936A (en) * | 2005-12-31 | 2007-07-11 | 中国科学院半导体研究所 | Automated test control system and method for wavelength tunable laser |
| US20080204712A1 (en) * | 2001-03-08 | 2008-08-28 | Busch Kenneth W | Dispersive near-infrared spectrometer with automatic wavelength calibration |
| CN101726806A (en) * | 2008-10-15 | 2010-06-09 | 中国科学院半导体研究所 | Automatic control system for aligning and coupling optical fiber and electrooptical modulator |
-
2015
- 2015-08-18 CN CN201510509629.3A patent/CN105115702A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080204712A1 (en) * | 2001-03-08 | 2008-08-28 | Busch Kenneth W | Dispersive near-infrared spectrometer with automatic wavelength calibration |
| CN1995936A (en) * | 2005-12-31 | 2007-07-11 | 中国科学院半导体研究所 | Automated test control system and method for wavelength tunable laser |
| CN101726806A (en) * | 2008-10-15 | 2010-06-09 | 中国科学院半导体研究所 | Automatic control system for aligning and coupling optical fiber and electrooptical modulator |
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Address after: 241003 No. 12, Zhanghe Road, hi tech Zone, Anhui, Wuhu Applicant after: Anhui Asky Quantum Technology Co., Ltd. Address before: 241002 Anhui science and technology innovation public service center, Wuhu national hi tech Zone, Yijiang Applicant before: Anhui Asky Quantum Technology Co., Ltd. |
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Application publication date: 20151202 |
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| RJ01 | Rejection of invention patent application after publication |