CN105115430B - 一种点栅透射式化学药液涂抹均匀性检测方法及装置 - Google Patents
一种点栅透射式化学药液涂抹均匀性检测方法及装置 Download PDFInfo
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1049045C (zh) * | 1992-09-15 | 2000-02-02 | 格拉沃贝尔公司 | 监测薄膜厚度的方法和设备 |
CN1264699A (zh) * | 1999-12-24 | 2000-08-30 | 厦门大学 | 高光学纯联萘二酚单孟基碳酸酯及其制备方法 |
CN100582655C (zh) * | 2005-07-29 | 2010-01-20 | 大日本网目版制造株式会社 | 不均匀检查装置及不均匀检查方法 |
EP2282186A2 (en) * | 2009-08-05 | 2011-02-09 | Emhart Glass S.A. | Glass container stress measurement using fluorescence |
CN202502055U (zh) * | 2012-04-16 | 2012-10-24 | 苏州中导光电设备有限公司 | 太阳能多晶硅电池片表面缺陷与沾污检测设备 |
CN103175478A (zh) * | 2013-03-08 | 2013-06-26 | 华中科技大学 | 一种基于红外成像的薄膜测厚仪 |
CN103558221A (zh) * | 2013-11-04 | 2014-02-05 | 武汉理工大学 | 一种红外光学材料的均匀性检测装置和方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN1049045C (zh) * | 1992-09-15 | 2000-02-02 | 格拉沃贝尔公司 | 监测薄膜厚度的方法和设备 |
CN1264699A (zh) * | 1999-12-24 | 2000-08-30 | 厦门大学 | 高光学纯联萘二酚单孟基碳酸酯及其制备方法 |
CN100582655C (zh) * | 2005-07-29 | 2010-01-20 | 大日本网目版制造株式会社 | 不均匀检查装置及不均匀检查方法 |
EP2282186A2 (en) * | 2009-08-05 | 2011-02-09 | Emhart Glass S.A. | Glass container stress measurement using fluorescence |
CN202502055U (zh) * | 2012-04-16 | 2012-10-24 | 苏州中导光电设备有限公司 | 太阳能多晶硅电池片表面缺陷与沾污检测设备 |
CN103175478A (zh) * | 2013-03-08 | 2013-06-26 | 华中科技大学 | 一种基于红外成像的薄膜测厚仪 |
CN103558221A (zh) * | 2013-11-04 | 2014-02-05 | 武汉理工大学 | 一种红外光学材料的均匀性检测装置和方法 |
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