CN105093255B - X-ray detection X method, apparatus, detector assembly and ray detector - Google Patents
X-ray detection X method, apparatus, detector assembly and ray detector Download PDFInfo
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Abstract
The present invention proposes a kind of X-ray detection X method, apparatus, detector assembly and ray detector, is related to radiographic imaging arts.Wherein, X-ray detection X method of the invention includes: the basic detection data for obtaining each conversion layer in detector assembly, wherein detector assembly includes the conversion layer of multiple stacked arrangements, and each conversion layer is used to detect the energy of predetermined investigative range；The combination of basic detection data based on multiple conversion layers obtains the X-ray detection X data of predetermined detection grade.By such method, it can be according to the needs of detection grade, basic detection data based on multiple conversion layers, according to the X-ray detection X data of the predetermined detection grade of basic detection data acquisition for the conversion layer for meeting predetermined detection grade, to realize the energy for flexibly detecting different-energy grade according to the needs of detection.
Description
Technical field
The present invention relates to radiographic imaging arts, especially a kind of X-ray detection X method, apparatus, detector assembly and ray are visited
Survey device.
Background technique
Line scanning imagery mode is generally used in radiant image safe examination system, detector array will transmit through object to be detected
X-ray or gamma-ray signal be converted to electric signal.X-ray is had an effect with substance, is passed through after photographed object is decayed by detector
Reception is converted into electric signal and forms image.Traditional Single energy X ray absorptionmetry perspective imaging provides photographed object on a perspective direction
The image that integral density information is formed, cannot provide the other informations such as material density or material composition.X with spectral distribution is penetrated
After line penetrates tested object, power spectrum can change, and change related with the atomic number Z of the material of tested object.In low energy
Region, photoelectric effect are dominant, and with Z strong correlation；Middle low energy region Compton scattering is dominant, and weak related to Z；Under two energy
The ratio of attenuation coefficient is monotonically changed with Z, can realize material identification according to the ratio.
In large-sized object radiation image-forming system, since checking matter volume is larger, such as van container detection needs to wear
Thicker steel plate thoroughly, it is current that the single energy detector of dual intensity radiation from machine source cooperation or single energy accelerator cooperation dual intensity is generally used to visit
Survey the dual-energy imaging material identification technical solution of device.
The dual intensity radiation from machine source of requirement by the way of to(for) detector is lower, but for radiation from machine source
Technical requirements are very high, need accelerator that can be spaced and generate two kinds of pulse rays of high and low energy, need to only use a kind of two kinds of energy of compatibility
The data of the photon signal respectively as high energy and low energy at the interval of the detector reception different time of X-ray detection are measured,
The disadvantages of this solution be dual intensity accelerator relative to it is single can accelerator technical difficulty is big, higher cost.
Another way is to realize separately detecting for high and low energy photon using dual-energy detector.Traditional dual-energy detector can
With the imaging system for single energy accelerator, what general single energy radiation from machine source generated is a continuous spectrum, can be used
Two different detectors, which separately detect two kinds of radiation components of the high and low energy in ray, can be obtained the data of two kinds of energy.Dual intensity
Detector is usually to be made of two detector superpositions of high and low energy, and wherein low energy detector is by a relatively thin scintillator and one
Photodiode composition, high energy detector are made of one block of thicker scintillator and another photodiode.Low energy detection
Device is disposed adjacent to the side of checking matter, and the main lower energy photon absorbed in X-ray energy spectrum, high energy detector is arranged in low energy spy
Survey the back of device, the main high-energy photon absorbed in ray energy spectrum.Generally also match between low energy detector and high energy detector
A filter plate is set further to absorb the extra low energy ray not absorbed by low energy detector in X-ray, so that dual intensity
The high and low energy signal of detector is closer to the high and low energy power spectrum ratio in X-ray energy spectrum.
There is a big difference under the ray of different-energy for dual intensity material identification technology.The case where for low energy dual intensity, such as
Fruit checking matter is single substance, and dual-energy x-ray is all single energy, according to substance under available two energy of pivoting results
Attenuation coefficient ratio, different material has different ratio.Mass attentuation coefficient and Z of the substance under the two energy4It is directly proportional,
To realize the separation of substance.The typical energy range of the low energy X ray of these dual intensity material identification technologies be 0.5MeV hereinafter,
Low energy X ray can only penetrate several centimetres of steel, it is impossible to which, for detecting van container and the vehicles, the application of this respect must
High quality radiant image must be provided using sigmatron (reaching 6MeV~9MeV, or higher).
If high-energy double-energy X-ray DR (Digital Radiography, Direct Digital flat panel X-ray imaging system) is imaged
X-ray used is also single energy, since mass attentuation coefficient also has the rule being monotonically changed with Z value at high energy, so
The method that similar low energy dual intensity single energy can be taken realizes the identification of substance.But in high energy region mass attentuation coefficient and Z
Be worth it is directly proportional, material recognition capability be not so good as under Low Energy Region, identical material atom ordinal number, equivalent matter of the high energy region than Low Energy Region
Amount attenuation coefficient difference is smaller, and the ability for distinguishing different materials is weaker.In addition several million-electron-volts of X-ray is usually produced by accelerator
Raw, such X-ray energy spectrum is continuous, and most of photon concentrates on Low Energy Region, as shown in figure 1 the result of Monte Carlo simulation
It is shown.When reaching 9MeV such as the highest energy of sigmatron, average energy maximum is no more than 2MeV, and most of photon is concentrated
In 4MeV or less.Known to be dominant in 1~4MeV Compton effect, the mass attentuation coefficient of the substance of different Z values is essentially identical, because
In this high energy range, the actual effect of double energy X-ray detecting material identification technology is still undesirable, i.e., when checking matter is by two kinds
Or when multiple material composition, the method for being compared to identify substance with high and low energy see-through fails.But in fact, although high energy X is penetrated
The power spectrum of line is very wide and high energy region proportion is less, and high energy electron pairing effect remains to provide certain material identification information.
The structure of traditional dual-energy detector, detector is made of back-to-back two groups of detectors, in X-ray incidence side
To including primary scintillator array, the first photodiode array, first filters chip arrays, pcb board (Printed Circuit
Board, printed circuit board), the second filter array, the second photodiode array, secondary fluor array, this structure exist
The problems such as two part assembly precisions of high and low energy are difficult to control.Another dual-energy x-ray improved detects in the prior art
Device is made of the first photoelectric detector, scintillator and the second photoelectric detector, and scintillator can be by single scintillator material
Overall structure is spliced or is bonded by the sub- scintillator of two or more.Such structure solves to a certain extent
It has determined above-mentioned problem, but as dual-energy detector, disadvantage, which coexists, still with traditional dual-energy detector not can avoid, i.e., due to dodging
The thickness of bright body is during fabrication it has been determined that therefore the detection energy range of detector already determines that applicability is not wide.
Summary of the invention
An object of the present invention is to provide a kind of ray detection regimes of flexibly detection different-energy grade energy.
According to an aspect of the present invention, propose a kind of X-ray detection X method, comprising: each turn is obtained in detector assembly
Change the basic detection data of layer, wherein detector assembly includes the conversion layer of multiple stacked arrangements, and each conversion layer is for detecting
The energy of predetermined investigative range；The ray that the combination of basic detection data based on multiple conversion layers obtains predetermined detection grade is visited
Measured data.
Optionally, the combination of the basic detection data based on multiple conversion layers obtains the X-ray detection X number of predetermined detection grade
According to including: to be added the basic detection data for the conversion layer that predetermined investigative range meets predetermined detection grade to obtain predetermined detection etc.
The X-ray detection X of grade is with data.
Optionally, the combination of the basic detection data based on multiple conversion layers obtains the X-ray detection X number of predetermined detection grade
The X-ray detection X data of multiple predetermined detection grades are obtained according to the combination for including: the basic detection data based on multiple conversion layers.
Optionally, further includes: carry out material identification according to the X-ray detection X data of different predetermined detection grades.
Optionally, making a reservation for detection grade includes low energy detection, the investigative range 200keV that investigative range is 0~200keV
The middle high energy detection that can be detected and/or investigative range is 3MeV~6MeV of~3MeV.
Optionally, make a reservation for detection grade include investigative range be 0~200keV low energy detection, investigative range be 200keV~
The middle high energy detection that can be detected and/or investigative range is 6MeV~9MeV of 6MeV.
By such method, can be according to the needs of detection grade, the basic detection data based on multiple conversion layers, root
The X-ray detection X data that predetermined detection grade is obtained according to the basic detection data for the conversion layer for meeting predetermined detection grade, thus real
The energy that different-energy grade is flexibly detected according to the needs of detection is showed.
According to another aspect of the present invention, a kind of ray detecting device is proposed, comprising: data acquisition module, for obtaining
Take the basic detection data of each conversion layer in detector assembly, wherein detector assembly includes the conversion of multiple stacked arrangements
Layer, each conversion layer are used to detect the energy of predetermined investigative range；Data processing module, for based on the basic of multiple conversion layers
The combination of detection data obtains the X-ray detection X data of predetermined detection grade.
Optionally, data processing module is also used to meet predetermined investigative range the base of the conversion layer of predetermined detection grade
This detection data is added the X-ray detection X data for obtaining predetermined detection grade.
Optionally, data processing module, the combination acquisition for being also used to the basic detection data based on multiple conversion layers are multiple
The X-ray detection X data of predetermined detection grade.
Optionally, further includes: material identification module, for according to the X-ray detection X data of different predetermined detection grades into
Row material identification.
Optionally, make a reservation for detection grade include investigative range be 0~200keV low energy detection, investigative range be 200keV~
The middle high energy detection that can be detected and/or investigative range is 3MeV~6MeV of 3MeV.
Optionally, make a reservation for detection grade include investigative range be 0~200keV low energy detection, investigative range be 200keV~
The middle high energy detection that can be detected and/or investigative range is 6MeV~9MeV of 6MeV.
Such device can be according to the needs of detection grade, the basic detection data based on multiple conversion layers, according to symbol
The basic detection data for closing the conversion layer of predetermined detection grade obtains the X-ray detection X data of predetermined detection grade, to realize
The energy of different-energy grade is flexibly detected according to the needs of detection.
According to a further aspect of the invention, a kind of detector assembly is proposed, comprising: multiple conversion layers and signal draw knot
Structure；Wherein, conversion layer stacked arrangement, signal deriving structure are located at the side of conversion layer, when so that X-ray incidence passing through conversion layer
Without signal deriving structure.
Optionally, conversion layer is solid scintillator converting unit, and solid scintillator converting unit includes scintillator and photoelectricity
Converter.
Optionally, scintillator layers stack arrangement, the joint face between scintillator are vertical with X-ray incident direction；Photoelectric conversion
Device is located at the side of scintillator, photoelectric converter connection signal deriving structure and joint face is parallel with X-ray incident direction.
Optionally, the other faces other than the side of scintillator coupling photoelectric converter cover reflecting layer.
Optionally, it is closely connected between scintillator by reflecting adhesive layer.
Optionally, scintillator is CsI:Tl scintillator or CdWO4Scintillator.
Optionally, photoelectric conversion unit is photodiode.
Optionally, scintillator thickness is 0.2mm~8mm.
Optionally, conversion layer is semiconductors transitions unit.
Optionally, the conversion layer of corresponding thickness is set according to every layer of conversion layer investigative range demand.
Optionally, detector assembly includes 3 layers or more conversion layers.
Such detector assembly includes the conversion layer of stacked arrangement and the signal deriving structure that connect with each conversion layer,
The basic detection data of each conversion layer can be obtained as needed；In addition, signal deriving structure is located at the side of conversion layer, make
It obtains when X-ray incidence passes through conversion layer without signal deriving structure, X-ray can be effectively prevent by conversion layer, improved
The sensitivity of X-ray detection X and signal-to-noise ratio.
In addition, according to an aspect of the present invention, a kind of ray detector is proposed, including any ray being mentioned above
Detection device and any detector assembly.
Optionally, ray detector includes multiple detector assemblies, and multiple detector assembly sides are closely coupled, and is connected
Signal deriving structure is fixed on substrate on one side.
Optionally, ray detector includes the substrate for being fixed with detector assembly of multiple stacked arrangements.
Such ray detector includes the ray detecting device and detector assembly being mentioned above, ray detecting device
Data processing can be carried out according to the demand of predetermined detection grade, obtained according to the basic detection data obtained from detector assembly
Take the X-ray detection X data of corresponding detection grade；It is tied simultaneously as X-ray incidence is drawn when passing through conversion layer without signal
Structure can effectively prevent X-ray by conversion layer, improve sensitivity and the signal-to-noise ratio of X-ray detection X.
Detailed description of the invention
The drawings described herein are used to provide a further understanding of the present invention, constitutes part of this application, this hair
Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In the accompanying drawings:
Fig. 1 is the spectral distribution Monte Carlo simulation results figure of accelerator source X-ray difference highest energy.
Fig. 2 is the flow chart of one embodiment of X-ray detection X method of the invention.
Fig. 3 is the equipment structure chart of one embodiment of X-ray detection X method of the invention.
Fig. 4 is the schematic diagram of one embodiment of ray detecting device of the invention.
Fig. 5 a is the perspective view of one embodiment of detector assembly of the invention.
Fig. 5 b is the sectional view of one embodiment of detector assembly of the invention.
Fig. 5 c is the perspective structure of one embodiment of detector assembly of the invention.
Fig. 5 d is the structural schematic diagram of one embodiment of detector assembly of the invention.
Fig. 6 is the schematic diagram of one embodiment of ray detector of the invention.
Specific embodiment
Below by drawings and examples, technical scheme of the present invention will be described in further detail.
The flow chart of one embodiment of X-ray detection X method of the invention is as shown in Figure 2.
In step 201, basic detection data is obtained from each conversion layer of detector.Detector assembly includes multiple layers
The conversion layer of stack arrangement, each conversion layer have predetermined investigative range, can detect the energy of predetermined power investigative range.
In step 202, according to the energy range of predetermined detection grade, which is located at based on energy detection range
The basic detection data of conversion layer determine the X-ray detection X data of predetermined detection grade.
By such method, can be according to the needs of detection grade, the basic detection data based on multiple conversion layers, root
The X-ray detection X data that predetermined detection grade is obtained according to the basic detection data for the conversion layer for meeting predetermined detection grade, thus real
The energy that different-energy grade is flexibly detected according to the needs of detection is showed.
In one embodiment, predetermined investigative range is met to the basic detection data phase of the conversion layer of predetermined detection grade
Add, determines the X-ray detection X data of predetermined detection grade.
By such method, the X-ray detection X data of predetermined detection grade, processing side can be obtained through simple calculations
Formula is simple, and the requirement for arithmetic facility or device is low.
In one embodiment, the X-ray detection X data of multiple predetermined detection grades, such as predetermined detection can also be obtained
Grade including 0~200keV low energy detection, investigative range be 200keV~3MeV it is middle can detection, investigative range be 3MeV~
The high energy of 6MeV detects, can be respectively according to the basic spy for belonging to low energy investigative range, middle energy investigative range, high energy investigative range
Measured data obtains the X-ray detection X data of corresponding predetermined detection grade.In one embodiment, making a reservation for detection grade can also wrap
Including investigative range is that the middle energy that 0~200keV low energy detects, investigative range is 200keV~6MeV detects and/or investigative range is
The high energy of 6MeV~9MeV detects.
By such method, the X-ray detection X data that can obtain multiple predetermined detection grades simultaneously, are applied to multipotency
It is more efficient when detection.
In one embodiment, can be judged according to the X-ray detection X aggregation of data of multiple predetermined detection grades of acquisition,
Carry out material identification.By such method, at the same obtain it is multiple it is predetermined detection grades X-ray detection X data and according to acquisition
It is multiple it is predetermined detection grades X-ray detection X data realize material identifications, it is more targeted to material identification and more convenient.
In one embodiment, as shown in figure 3, on the detector assembly of each imaging point position several (such as:
8) and photodiode (such as: respectively PD1, PD2 ... PD8) the collected electric signal of institute amplifies by preamplifier
Afterwards, digital signal (such as: corresponding to p1, p2 ... p8) is converted to using A/D analog-digital converter to be output to FPGA programmable
Processor.FPGA carries out operation to data, such as: the numerical value of several adjacent photodiode electric signals is added as to certain
One energy detection data (such as: p1 be low energy data, p2+p3 be it is middle can data, p4+p5+p6+p7+p8 be high energy data).
In one embodiment, the detector assembly detection data that can get multiple pixels of arrangement being aligned, is transmitted via FPGA
To computer carry out image procossing, obtain include energy resolution information scan image.
It by such method, can be according to investigative range it needs to be determined that making a reservation for the energy range of detection grade, flexibly
The basic detection data of corresponding conversion layer be added obtain corresponding X-ray detection X data, to keep X-ray detection X cleverer
It is living.
The schematic diagram of one embodiment of ray detecting device of the invention is as shown in Figure 4.Wherein, 401 be data acquisition
Module can obtain basic detection data from each conversion layer of detector.402 be data processing module, can be according to predetermined
The energy range for detecting grade is determined pre- based on the basic detection data that energy detection range is located at the conversion layer of the energy range
Surely the X-ray detection X data of grade are detected.
Such device can be according to the needs of detection grade, the basic detection data based on multiple conversion layers, according to symbol
The basic detection data for closing the conversion layer of predetermined detection grade obtains the X-ray detection X data of predetermined detection grade, to realize
The energy of different-energy grade is flexibly detected according to the needs of detection.
In one embodiment, predetermined investigative range is met the conversion layer of predetermined detection grade by data processing module 402
Basic detection data be added, obtain the X-ray detection X data of predetermined detection grade.Such device can be through simple calculations
The X-ray detection X data of predetermined detection grade are obtained, processing mode is simple, and the requirement for arithmetic facility or device is low.
In one embodiment, data processing module 402 can obtain the X-ray detection X data of multiple predetermined detection grades.
In one embodiment, the 1st conversion layer, the 2nd conversion layer ... N conversion layer are being followed successively by towards X-ray incident direction.Each turn
It changes layer and separately detects photon from low energy to high energy different-energy.From the foregoing it will be appreciated that x-ray photon energy caused by accelerator
It is concentrated mainly on low energy and intermediate energy region, high energy light subnumber is less.It therefore, can will be several below in order to improve high energy detection efficient
The data of a conversion layer are added the detection data as one group of high energy.Such as using the 1st layer of the data obtained as low energy data；2nd
It can data into the conduct of K layer data；+ 1 layer of kth ,+2 layers of kth ,+3 layers of kth ... the data of n-th layer (2≤k≤N-1) are added
As high energy detection data.The basic detection data combination of such conversion layer is not limited to form a kind of above-mentioned high energy data, can be with
Form multiple groups high energy data, such as the first high energy data, the second high energy data.Can according to the spectral distribution in different x-ray source,
It detects application and the different of scan image material identification performance is required to carry out flexible configuration.In one embodiment,
It may be configured to dual-energy detector, be combined into low energy detector, the remaining unit group of back with several probe units in front
High-energy synthetic detector.
In one embodiment, it can also include material identification module, be obtained according to data processing module multiple predetermined
The X-ray detection X aggregation of data judgement for detecting grade, carries out material identification.Such device obtains multiple predetermined detections etc. simultaneously
The X-ray detection X data of grade simultaneously realize material identification according to the X-ray detection X data of multiple predetermined detection grades of acquisition, to substance
It identifies more targeted and more convenient.
In one embodiment, make a reservation for detection grade include 0~200keV low energy detection, investigative range be 200keV~
3MeV it is middle can detection, investigative range be 3MeV~6MeV high energy detect, can respectively according to data low energy investigative range, in
It can investigative range, the X-ray detection X data of the corresponding predetermined detection grade of basic detection data acquisition of high energy investigative range.One
In a embodiment, predetermined detection grade can also include that investigative range is the detection of 0~200keV low energy, investigative range 200keV
The middle high energy detection that can be detected and/or investigative range is 6MeV~9MeV of~6MeV.Such predetermined detection grade more accords with
Actual demand is closed, material identification is convenient for.
The schematic diagram of one embodiment of detector assembly of the invention is as shown in Fig. 5 a-5d.Fig. 5 a is spy of the invention
Survey the perspective view of one embodiment of device assembly.Wherein, it is basic that direction shown in arrow, which is the incident direction 500,550 of ray,
Detector assembly, including multiple conversion layers along ray incident direction stacked arrangement.540 be signal deriving structure, is located at conversion
The side of layer, without going past signal deriving structure when X-ray incidence passes through conversion layer.
There is a kind of radiation detector with several conversion layers in the prior art, including at least one with lower attenuation coefficient
A primary conversion layers and at least one secondary conversion layer for photon with highly attenuating coefficient.Its primary conversion layers can be by
It realizes, is provided for detecting answering for radiation especially X-radiation with the silicon layer of associated energy resolution count electronics coupling
For composing the imaging system differentiated.This radiation detector is formed by stacking by each layer, needs to carry out the coupling between each layer and guarantor
Shield, manufacturing process is complex, and precision is not easy to guarantee, and signal deriving structure will cause certain X and penetrate between each conversion layer
Line loss consumption, it will sacrifice sensitivity and the signal-to-noise ratio of scan image.
Detector assembly in the present invention includes that the conversion layer of stacked arrangement and the signal connecting with each conversion layer are drawn
Structure can obtain the basic detection data of each conversion layer as needed；In addition, signal deriving structure is located at the side of conversion layer
Face, so that X-ray can be effectively prevent by conversion layer, mentioned without signal deriving structure when X-ray incidence passes through conversion layer
The sensitivity of high X-ray detection X and signal-to-noise ratio.
In one embodiment, the conversion layer of basic probe unit is semiconductor (such as CZT (cadmium zinc
Telluride, cadmium zinc telluride)) converting unit.In one embodiment, the conversion layer of basic probe unit is solid scintillator
Body converting unit, including scintillator and photoelectric converter.As illustrated in fig. 5 a, 510 be stacked arrangement scintillator, 530 be light
Power conversion device array is connected with each scintillator respectively.Such detector assembly is low in cost, can be compatible with current flashing
Body and PD manufacturing process, or even the scintillator and photodiode of current version are directly selected, furthermore it is also possible to according to detection model
It encloses, manufacture and basic probe unit that the selection of the demand of cost is suitable, to more targetedly be detected.
In one embodiment, as shown in Figure 5 b, multiple scintillators turn along 500 stacked arrangement of ray incident direction, photoelectricity
Converter array is located at flashing body side surface.Photoelectric converter connection signal deriving structure 540.In one embodiment, photoelectric conversion
Photodiode PD or silicon photomultiplier SiPM can be used in device.Such detector assembly, X-ray is without going past photoelectric conversion
Device, photoelectric converter will not cause to decay to the X-ray for entering detector assembly, to effectively increase the noise of detectable signal
Than.
In one embodiment, as shown in Fig. 5 c, 5d, detector assembly is by including 8 along 500 row of X-ray incident direction
The scintillator 511-518 stacked arrangement of column is at the side scintillator 511-518 is connected with photoelectric converter 531-538 respectively.Photoelectricity
Converter 531-538 connection signal deriving structure exports 8 basic detection datas respectively.Fig. 5 c, 5d embodiment in, detection
Device assembly includes 8 scintillators.It can according to need selection 3 or more scintillator and collectively form detector assembly, such as 4~16
It is a.In use, X-ray is without going past photoelectric converter and signal deriving structure, thus not for such detector assembly
The X-ray that detector assembly be entered can be caused to decay, thus the signal-to-noise ratio of effectively detectable signal；It can according to need selection to visit
The number for surveying solid scintillator converting unit in device assembly, to make to detect more flexible.
In one embodiment, the thickness for the checking matter that can be penetrated according to needed for different application, as container is examined
The basic detection data obtained from conversion layer is added so that obtained letter by survey, vehicle detection etc. using different combinations
Number value is adapted to the dynamic range of the data processing unit of rear end, realizes better material identification.It can will turn from connection photoelectricity
The data that the signal deriving structure of parallel operation 531 obtains, will be from connection photoelectricity as low energy (such as 0~200keV of detection) detection data
The data that the signal deriving structure of converter 532 and 533 obtains are added energy (such as 200keV~3MeV) detection data in conduct, will
The data obtained from the signal deriving structure of connection photoelectric converter 534~538 are added to obtain high energy (such as 3MeV~6MeV) spy
Measured data；Another application example be from connection photoelectric converter 531 signal deriving structure obtain data as low energy (such as
0~200keV) detection data, the data obtained from the signal deriving structure of connection photoelectric converter 532~534 are added conduct
Middle energy (such as 200keV~6MeV) detection data, the number that will be obtained from the signal deriving structure of connection photoelectric converter 535~538
High energy (such as 6MeV~9MeV) detection data is used as according to being added.Such detection grade more meets actual detection demand, helps
In material identification.
In one embodiment, the other faces other than the side of scintillator coupling photoelectric converter cover reflecting layer.Such as figure
Shown in 5c, 5d, 520 be reflecting layer.Reflecting layer can be improved photon in the collection efficiency of photoelectric converter, improve the accurate of detection
Degree.
In one embodiment, it is closely connected between each scintillator by reflecting adhesive layer.As shown in Fig. 5 c, 5d,
521-527 is reflection adhesive layer, can be avoided the scintillation photons crosstalk between each scintillator, makes the basic spy of each conversion layer
Measured data is more accurate, while also acting as the effect of bonding scintillator.
In one embodiment, the conversion layer of corresponding thickness can be set according to the demand of every layer of conversion layer investigative range.
The thickness of the scintillator of stacked arrangement can be uniformly, be also possible to it is non-uniform, such as along forward several of directions of rays
Scintillator slicce thickness is relatively thin, and such as 0.5mm~3mm, the several scintillator slicce thickness in back are thicker, such as 2mm~8mm, this
The detector assembly of sample can be optimized according to radiation source spectral distribution to improve detection efficient.
In one embodiment, CsI:Tl scintillator can be selected, scintillator size can be 5mm (incident end face width)
× 5mm (incident end face height) × 5mm (thickness)；CdWO can also be selected4Scintillator, scintillator size can be (incident for 8mm
End face width) × 5mm (incident end face height) × 4mm (thickness).It can according to need the flashing of selection correspondingly-sized, material
Body has more flexibility.
In one embodiment, photoelectric converter is photodiode.Back-illuminated type silicon photoelectric diode can be selected, it is discrete
Back-illuminated type silicon photoelectric diode be weldingly fixed in PCB substrate 539, and PCB substrate 539 and signal deriving structure 540 weld
It is integrated.The lead of back-illuminated photodiode is drawn out on pcb board from the back side, can be saved the space of pcb board, be made pcb board
Size no more than flashing body side surface, to realize close-packed arrays of multiple multipotency probe assemblies on detector panel.
Ray detector of the invention including the ray detecting device and detector assembly that are mentioned above.X-ray detection X
Device obtains the basic detection data that detector assembly obtains, and is flexibly handled according to the needs of detection grade, obtains corresponding predetermined
Detect the X-ray detection X data of grade.Simultaneously as without signal deriving structure when X-ray incidence passes through conversion layer, it can
It effectively prevent X-ray by conversion layer, improves sensitivity and the signal-to-noise ratio of X-ray detection X.
In one embodiment, as shown in Figure 6, wherein ray detector includes the detector group of several alignings
Part 6201~6232 is installed on substrate 601 by connector 6401~6432, and each detector assembly is as X-ray-scanning images of object
A pixel on imaging system detector arm.Ray incident direction 600 will not be worn as shown, when X-ray passes through conversion layer
Cross substrate or signal deriving structure.Also comprising amplifying and converting probe unit analog electrical signal on ray detector substrate 601
For the processing circuit and data output interface 603 of digital signal.Ray detector shown in fig. 6 includes 32 alignings
Detector assembly.It can according to need the number of setting detector assembly, such as 64.
Such ray detector can obtain the X-ray detection X data on a line simultaneously, realize line scanning.Detector
The size of component is small, and the detection data of acquisition can be used as a pixel on scanning imagery.It is closely arranged between detector assembly
Column effectively reduce measurement dead angle；Detector size precision be easy protect guarantee, detector assembly can cut in advance be packaged into it is whole
A neat column, it is simple and reliable for structure；The extraction of signal is not influenced by overlap-add operation, avoids the detection that may cause in overlap-add operation
Device dislocation and manufacturing defect problem；For X-ray without signal deriving structure, ray detector dead zone is few, helps to improve noise
Than.
In one embodiment, ray detector as shown in FIG. 6 can be laminated to close-packed arrays, while obtaining a face
On X-ray detection X data, realize two-dimensional detection, improve detection efficient.
With wide penetration depth range and sigmatron multipotency (power spectrum) radiant image for having material recognition capability it is large-scale
Detection system technology will likely make existing rays safety detection apparatus performance be greatly improved.Pass through the ray detector being mentioned above
It can obtain and the inclusion obtained after sweep object through overdamping is penetrated by single energy high energy acclerator generation continuum X-ray beam
The decay spectra of matter atomic number information obtains imaging key message using decay spectra.Multipotency detector above can be to even
The intensity of different-energy ray is accurately measured respectively in continuous X-ray spectrum, so that imaging is more accurate.
Finally it should be noted that: the above embodiments are merely illustrative of the technical solutions of the present invention and non-alignment limit；To the greatest extent
The present invention is described in detail with reference to preferred embodiments for pipe, it should be understood by those ordinary skilled in the art that: still
It can modify to a specific embodiment of the invention or some technical features can be equivalently replaced；Without departing from this hair
The spirit of bright technical solution should all cover within the scope of the technical scheme claimed by the invention.
Claims (16)
1. a kind of X-ray detection X method, which is characterized in that
Obtain the basic detection data of each conversion layer in detector assembly, wherein the detector assembly includes 3 layers with upper layer
The conversion layer of stack arrangement, each conversion layer are used to detect the energy of predetermined investigative range, and the conversion layer includes scintillator and light
Electric transducer, the scintillator layers stack arrangement belong to the joint face and X-ray incident direction between the scintillator of different switching layer
Vertically, the side that the photovoltaic converter is located at each scintillator makes X-ray without photoelectric converter；
The combination of basic detection data based on multiple conversion layers obtains the X-ray detection X data of predetermined detection grade, packet
It includes: the basic detection data that predetermined investigative range meets the conversion layer of the predetermined detection grade being added and is obtained in advance
Surely the X-ray detection X data of grade are detected, the predetermined detection grade includes low energy detection, middle energy detection and high energy detection.
2. the method according to claim 1, wherein the basic detection data based on multiple conversion layers
Combination obtain the X-ray detection X data of predetermined detection grade and include:
The combination of basic detection data based on multiple conversion layers obtains the X-ray detection X data of multiple predetermined detection grades.
3. according to the method described in claim 2, it is characterized by further comprising: being penetrated according to the predetermined detection grade of difference
Line detection data carries out material identification.
4. according to the method described in claim 1, it is characterized by: the predetermined detection grade include investigative range be 0~
The middle energy detection and/or investigative range that the low energy detection of 200keV, investigative range are 200keV~3MeV are 3MeV~6MeV's
High energy detection；
Or,
It is described it is predetermined detection grade include investigative range be 0~200keV low energy detection, investigative range be 200keV~6MeV
It is middle can detection and/or investigative range be 6MeV~9MeV high energy detect.
5. a kind of ray detecting device, which is characterized in that
Data acquisition module, for obtaining the basic detection data of each conversion layer in detector assembly, wherein the detector
Component includes the conversion layer of 3 layers or more stacked arrangements, and each conversion layer is used to detect the energy of predetermined investigative range, the conversion
Layer includes scintillator and photoelectric converter, and the scintillator layers stack arrangement belongs to the connection between the scintillator of different switching layer
Face is vertical with X-ray incident direction, and the side that the photovoltaic converter is located at each scintillator makes X-ray without photoelectricity
Converter；
Data processing module, the combination for the basic detection data based on multiple conversion layers obtain predetermined detection grade
X-ray detection X data, comprising: predetermined investigative range is met to the basic spy of the conversion layer of the predetermined detection grade
Measured data addition obtains the X-ray detection X data of predetermined detection grade, and the predetermined detection grade includes that low energy detects, middle energy is visited
It surveys and high energy detects.
6. device according to claim 5, which is characterized in that the data processing module is also used to based on multiple described
The combination of the basic detection data of conversion layer obtains the X-ray detection X data of multiple predetermined detection grades.
7. device according to claim 6, which is characterized in that further include: material identification module, for according to different pre-
Surely the X-ray detection X data for detecting grade carry out material identification.
8. device according to claim 5, it is characterised in that: the predetermined detection grade include investigative range be 0~
The middle height that can be detected and/or investigative range is 3MeV~6MeV that the detection of 200keV low energy, investigative range are 200keV~3MeV
It can detection；
Or,
The predetermined detection grade includes that investigative range is that 0~200keV low energy detects, investigative range is 200keV~6MeV's
The middle high energy detection that can be detected and/or investigative range is 6MeV~9MeV.
9. a kind of detector assembly characterized by comprising
3 layers or more conversion layers；With
Signal deriving structure；
Wherein, the conversion layer stacked arrangement, the signal deriving structure is located at the side of the conversion layer, so that X-ray enters
Without the signal deriving structure when being shot through the conversion layer；
The conversion layer is solid scintillator converting unit, and the solid scintillator converting unit includes scintillator and photoelectric conversion
Device, the scintillator layers stack arrangement, the joint face belonged between the scintillator of different switching layer is vertical with X-ray incident direction,
The side that the photovoltaic converter is located at each scintillator makes X-ray without photoelectric converter, the photoelectric converter
Basic detection data is exported, it is predetermined that the basic detection data for meeting the conversion layer of predetermined detection grade is added acquisition
The X-ray detection X data of grade are detected, the predetermined detection grade includes low energy detection, middle energy detection and high energy detection.
10. detector assembly according to claim 9, which is characterized in that the photoelectric converter connects the signal and draws
Structure and joint face is parallel with X-ray incident direction out.
11. detector assembly according to claim 9, which is characterized in that
The scintillator couples the covering of the other faces other than the side of photoelectric converter reflecting layer；And/or
It is closely connected between the scintillator by reflecting adhesive layer；And/or
The scintillator is CsI:Tl scintillator or CdWO4Scintillator；And/or
The photoelectric conversion unit is photodiode；And/or
The scintillator thickness is 0.2mm~8mm.
12. detector assembly according to claim 9, which is characterized in that the conversion layer is semiconductors transitions unit.
13. according to any detector assembly of claim 9~12, which is characterized in that
The conversion layer of corresponding thickness is set according to conversion layer investigative range demand described in every layer.
14. a kind of ray detector, which is characterized in that wanted including any ray detecting device of claim 5~8 and right
Seek 9~13 any detector assemblies.
15. ray detector according to claim 14, which is characterized in that the ray detector includes multiple spies
Device assembly is surveyed, multiple detector assembly sides are closely coupled, and connect the signal deriving structure is fixed on base on one side
Plate.
16. ray detector according to claim 15, which is characterized in that the ray detector includes multiple stacking rows
The substrate for being fixed with the detector assembly of column.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510568491.4A CN105093255B (en) | 2015-09-09 | 2015-09-09 | X-ray detection X method, apparatus, detector assembly and ray detector |
| HK16105883.1A HK1217998A1 (en) | 2015-09-09 | 2016-05-24 | Method, device for ray detection, detector assembly and detector for ray |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510568491.4A CN105093255B (en) | 2015-09-09 | 2015-09-09 | X-ray detection X method, apparatus, detector assembly and ray detector |
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| CN109738936B (en) * | 2019-02-11 | 2024-04-05 | 北京华力兴科技发展有限责任公司 | Substance detection method, device and system |
| CN112285758B (en) * | 2020-10-20 | 2023-04-21 | 南华大学 | Nuclear radiation field probe, detector and detection system |
| CN113192991B (en) * | 2021-04-28 | 2022-11-01 | 深圳先进技术研究院 | Flexible X-ray detector, preparation method thereof and three-dimensional flexible X-ray detector |
| CN113206120B (en) * | 2021-04-30 | 2022-11-22 | 深圳先进技术研究院 | Multi-spectrum X-ray detector and preparation method thereof |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101604023A (en) * | 2008-06-12 | 2009-12-16 | 清华大学 | The array solid probe that is used for radiation detection |
| CN102395901A (en) * | 2009-04-16 | 2012-03-28 | 皇家飞利浦电子股份有限公司 | Spectral imaging |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2004354271A (en) * | 2003-05-30 | 2004-12-16 | Tohken Co Ltd | Radiation detector |
| US8519338B2 (en) * | 2007-08-23 | 2013-08-27 | Arizona Board Of Regents On Behalf Of The University Of Arizona | X-ray detector including scintillator, a lens array, and an image intensifier |
| US8373132B2 (en) * | 2009-02-06 | 2013-02-12 | Koninklijke Philips Electronics N. V. | Radiation detector with a stack of scintillator elements and photodiode arrays |
| CN101937095B (en) * | 2009-06-30 | 2012-05-09 | 同方威视技术股份有限公司 | Dual energy X ray detector and dual energy X ray detector array device |
| JP2013231670A (en) * | 2012-04-27 | 2013-11-14 | Toshiba Corp | Radiation detector and method of manufacturing the same |
| CN205015485U (en) * | 2015-09-09 | 2016-02-03 | 同方威视技术股份有限公司 | Detector subassembly and X -ray detector |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101604023A (en) * | 2008-06-12 | 2009-12-16 | 清华大学 | The array solid probe that is used for radiation detection |
| CN102395901A (en) * | 2009-04-16 | 2012-03-28 | 皇家飞利浦电子股份有限公司 | Spectral imaging |
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| CN105093255A (en) | 2015-11-25 |
| HK1217998A1 (en) | 2017-01-27 |
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