CN105044127A - OLED micro-display defect detection device and detection method - Google Patents
OLED micro-display defect detection device and detection method Download PDFInfo
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- CN105044127A CN105044127A CN201510464136.2A CN201510464136A CN105044127A CN 105044127 A CN105044127 A CN 105044127A CN 201510464136 A CN201510464136 A CN 201510464136A CN 105044127 A CN105044127 A CN 105044127A
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Abstract
The invention discloses an OLED micro-display defect detection device and a detection method applying the detection device. The detection device comprises a test plate, a camera and a computer; the camera is not in direct contact with a micro-display to be detected, so that new defects are prevented from being introduced into the detection; the detection device is rapid in response, real-time and reliable, and can be utilized for repeating the same operation, so that humans can be set free from simple and repeated works, and the detection consistency is high. According to the detection method, the quality of a defect image is improved through the pretreatment steps of median filtering, contrast improvement and geometric correction, so that a solid foundation is laid for subsequent computing and analysis; besides, the textural features of pixel distribution in the defect image are eliminated through three iterations of image differential computing, so that the definition of the defect image is further improved; the defect image is split according to an improved K-means clustering method, so that the number of iterations during subsequent computing is reduced, and the detection efficiency is improved.
Description
Technical field
The invention belongs to OLED production technical field, relate to a kind of OLED display pick-up unit, relate in particular to a kind of OLED minitype displayer defect detecting device and detection method.
Background technology
Organic Light Emitting Diode (Organic-EmittingDiode, be called for short OLED) display owing to having low-power consumption, wide viewing angle, active illuminating, be easy to realize the advantages such as flexible manufacturing and receive people and more and more pay close attention to, and will the display of future generation after TFT-LCD be become.Because the preparation process of oled panel is comparatively complicated, the panel finally obtained there will be some defects unavoidably, therefore carrying out defects detection to the oled panel that production line tentatively completes is very important step in oled panel production procedure, is the important guarantee of product yield and quality.
For a long time, the display defect inspection of OLED display is all adopt artificial mode to carry out, and for OLED minitype displayer, because it has size little (being less than 1 inch), the features such as resolution high (being not less than 800 × 600), naked eyes direct-detection does not have operability, usual reviewer uses microscope to amplify, then by display people for being divided into multiple region, manual switchover display image, the various bad of display is judged by the method inspection of artificial observation, this mode spended time is long, checkability is low, and assay is by the eyesight of checker, mood, color psychology, sense of responsibility, experience, the impact such as degree of fatigue is larger, check consistency is poor.
Summary of the invention
For this reason, technical matters to be solved by this invention is to adopt microscope to amplify in prior art and detects the bad of OLED minitype displayer by the method for artificial observation, detection time is long, efficiency is low, testing result is larger by checker's subjective impact, check consistency is poor, thus proposes a kind of detection time is short, efficiency is high, testing result is accurate, consistance is high OLED minitype displayer defect detecting device and detection method.
For solving the problems of the technologies described above, technical scheme of the present invention is:
The invention provides a kind of OLED minitype displayer defect detecting device, it comprises,
Test board, for fixing and driving described OLED minitype displayer;
Camera, is arranged at above described test board, for gathering the image of the described OLED minitype displayer on described test board;
Computing machine, with described phase mechatronics, for controlling described collected by camera test pattern, and analyzes described test pattern and exports analysis result.
As preferably, described camera is high resolution industrial camera.
The present invention also provides a kind of OLED minitype displayer defect inspection method, and it comprises the steps:
(1) fix with described test board and drive and light described OLED minitype displayer, described OLED minitype displayer is adjusted to test pictures;
(2) described computing machine controls test pictures described in described collected by camera, and the picture collected is transferred to described computing machine by described camera;
(3) pre-service is carried out to the picture collected;
(4) described OLED minitype displayer defect image is positioned;
(5) by the computing of described computing machine, defect is shown;
(6) split defect image, observe defect form, statistical shortcomings type and quantity.
As preferably, in described step (3), described pre-service comprises to be carried out medium filtering to the picture collected, strengthens contrast and geometry correction.
As preferably, in described step (4), described location is the pixel corner by determining defect image, then calculates the pixel wide of described defect image, level interval highly, between pixel and vertical spacing further.
As preferably, in described step (5), described computing is that three poor shadow computing iteration carry out algebraic operation, to remove the textural characteristics of described defect image pixel distribution to defect image.
As preferably, in described poor shadow computing, the match point of template is the described pixel corner of defect image.
As preferably, in described step (6), the method for segmentation defect image is the K-means clustering method improved.
As preferably, described improvement is specially: specify initial clustering to be 0, image maximum gradation value is initial prospect cluster centre.
Technique scheme of the present invention has the following advantages compared to existing technology:
(1) OLED minitype displayer defect detecting device provided by the invention, comprise the test board for fixing and drive described OLED minitype displayer, for gather display image on described test board camera and for controlling collected by camera test pattern, and test pattern is analyzed and exports the computing machine of analysis result, described camera does not directly contact with detected miniscope, avoids and introduces new defect in the detection; Camera resolution is high, clearly can identify display defect, and machine vision response fast, in real time reliably, can repeat identical operation, people is freed from the simple duplication of labour, check consistency is good.
(2) OLED minitype displayer defect inspection method provided by the invention, by medium filtering, the pre-treatment step strengthening contrast and geometry correction, improve the quality of defect image, for good basis has been laid in subsequent calculations analysis, and adopt three poor shadow computing iteration to remove the textural characteristics of described defect image pixel distribution, defect image sharpness is improved further, by the K-means clustering method segmentation defect image improved, decrease the iterations in subsequent arithmetic process, improve detection efficiency.
Accompanying drawing explanation
In order to make content of the present invention be more likely to be clearly understood, below according to a particular embodiment of the invention and by reference to the accompanying drawings, the present invention is further detailed explanation, wherein
Fig. 1 is the structural representation of OLED minitype displayer defect detecting device of the present invention.
In figure, Reference numeral is expressed as: 1-test board; 2-camera; 3-computing machine; 4-data-interface.
Embodiment
Embodiment
The invention provides a kind of OLED minitype displayer defect detecting device, it comprises,
Test board 1, for fixing and driving described OLED minitype displayer;
Camera 2 is high resolution industrial camera, is arranged at above described test board 1, and its distance apart from described test board 1 is adjustable, for gathering the image of the described OLED minitype displayer on described test board 1;
Computing machine 3, is electrically connected with described camera 2, is provided with data-interface 4, can receive the image that described camera 2 collects, and described computing machine 3 for controlling described camera 2 collecting test pattern, and is analyzed described test pattern and exports analysis result.
OLED minitype displayer defect detecting device described in the present embodiment, described camera 2 does not directly contact with detected miniscope, avoids and introduces new defect in the detection; Camera 2 high resolution industrial camera, clearly can identify display defect; Described device eye response fast, in real time reliably, can repeat identical operation, people is freed from the simple duplication of labour, check consistency is good.
The present invention also provides a kind of and applies the method that described OLED minitype displayer carries out defects detection, and it comprises the steps:
(1) fix with described test board 1 and drive and light described OLED minitype displayer, described OLED minitype displayer is adjusted to test pictures;
(2) computing machine 3 controls described camera 2 and gathers described test pictures, and the picture collected is transferred to described computing machine 3 by described camera 2 through data-interface 4;
(3) picture collected is carried out to medium filtering, strengthens contrast and geometry correction pre-service;
(4) described OLED minitype displayer defect image is positioned: the pixel corner determining defect image, then calculate further the pixel wide of described defect image, level interval highly, between pixel and vertical spacing;
(5) by three poor shadow computing iteration algebraic operation is carried out to defect image, remove the textural characteristics of described defect image pixel distribution, show the defect part of display apparatus test picture;
(6) specify initial clustering to be 0, image maximum gradation value is initial prospect cluster centre, then with K-means clustering method segmentation defect image, observes defect form, statistical shortcomings type and quantity.
OLED minitype displayer defect inspection method described in the present embodiment, before computing machine 3 carries out computing, by medium filtering, the pre-treatment step strengthening contrast and geometry correction, improve the quality of defect image, for good basis has been laid in subsequent calculations analysis; Adopt three poor shadow computing iteration to remove the textural characteristics of described defect image pixel distribution, defect image sharpness is improved further; By the K-means clustering method segmentation defect image improved, decrease the iterations in subsequent arithmetic process, improve detection efficiency.
Obviously, above-described embodiment is only for clearly example being described, and the restriction not to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all embodiments.And thus the apparent change of extending out or variation be still among the protection domain of the invention.
Claims (9)
1. an OLED minitype displayer defect detecting device, is characterized in that, comprises,
Test board, for fixing and driving described OLED minitype displayer;
Camera, is arranged at above described test board, for gathering the image of the described OLED minitype displayer on described test board;
Computing machine, with described phase mechatronics, for controlling described collected by camera test pattern, and analyzes described test pattern and exports analysis result.
2. OLED minitype displayer defect detecting device according to claim 1, is characterized in that, described camera is high resolution industrial camera.
3. an OLED minitype displayer defect inspection method, is characterized in that, comprises the steps:
(1) fix with described test board and drive and light described OLED minitype displayer, described OLED minitype displayer is adjusted to test pictures;
(2) described computing machine controls test pictures described in described collected by camera, and the picture collected is transferred to described computing machine by described camera;
(3) pre-service is carried out to the picture collected;
(4) described OLED minitype displayer defect image is positioned;
(5) by the computing of described computing machine, defect is shown;
(6) split defect image, observe defect form, statistical shortcomings type and quantity.
4. OLED minitype displayer defect inspection method according to claim 3, is characterized in that, in described step (3), described pre-service comprises to be carried out medium filtering to the picture collected, strengthen contrast and geometry correction.
5. the OLED minitype displayer defect inspection method according to claim 3 or 4, it is characterized in that, in described step (4), described location is the pixel corner by determining defect image, then calculates further the pixel wide of described defect image, level interval highly, between pixel and vertical spacing.
6. OLED minitype displayer defect inspection method according to claim 5, it is characterized in that, in described step (5), described computing is that three poor shadow computing iteration carry out algebraic operation, to remove the textural characteristics of described defect image pixel distribution to defect image.
7. OLED minitype displayer defect inspection method according to claim 6, is characterized in that, in described poor shadow computing, the match point of template is the described pixel corner of defect image.
8. OLED minitype displayer defect inspection method according to claim 7, is characterized in that, in described step (6), the method for segmentation defect image is the K-means clustering method improved.
9. OLED minitype displayer defect inspection method according to claim 8, is characterized in that, described improvement is specially: specify initial clustering to be 0, image maximum gradation value is initial prospect cluster centre.
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| CN108020563A (en) * | 2018-01-08 | 2018-05-11 | 凯吉凯精密电子技术开发（苏州）有限公司 | Oled panel open defect detecting system and its detection method |
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| CN108833873A (en) * | 2018-06-15 | 2018-11-16 | 冠捷显示科技（厦门）有限公司 | A kind of luminance uniformity motion compensation process |
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| CN107275245A (en) * | 2017-05-22 | 2017-10-20 | 茆胜 | A kind of OLED minitype displayer Rapid checking device and its method for quickly detecting |
| CN107316594A (en) * | 2017-05-22 | 2017-11-03 | 茆胜 | A kind of OLED minitype displayer automatic checkout system and method |
| CN108020563A (en) * | 2018-01-08 | 2018-05-11 | 凯吉凯精密电子技术开发（苏州）有限公司 | Oled panel open defect detecting system and its detection method |
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| CN116642670B (en) * | 2023-07-27 | 2024-02-27 | 武汉精立电子技术有限公司 | Optical imaging method and device for micro display detection |
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