CN105043355B - Side slope Light deformation monitoring method and monitoring system based on similarity decision criteria - Google Patents

Side slope Light deformation monitoring method and monitoring system based on similarity decision criteria Download PDF

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CN105043355B
CN105043355B CN201510242170.5A CN201510242170A CN105043355B CN 105043355 B CN105043355 B CN 105043355B CN 201510242170 A CN201510242170 A CN 201510242170A CN 105043355 B CN105043355 B CN 105043355B
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image
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side slope
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CN105043355A (en
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璧佃唉
赵谦
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Xi'an Dishan Shiju Technology Co ltd
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Xian University of Science and Technology
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G01C11/12—Interpretation of pictures by comparison of two or more pictures of the same area the pictures being supported in the same relative position as when they were taken
    • G01C11/14—Interpretation of pictures by comparison of two or more pictures of the same area the pictures being supported in the same relative position as when they were taken with optical projection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C5/00—Measuring height; Measuring distances transverse to line of sight; Levelling between separated points; Surveyors' levels

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Abstract

The invention discloses a kind of side slope Light deformation monitoring method and monitoring system based on similarity decision criteria, its monitoring method includes step：First, IMAQ and synchronized upload：Side slope surface image to monitored area is acquired and uploads；Monitored area is divided into K region to be analyzed；2nd, image-receptive and synchronization process：Side slope surface image synchronization to being received is processed, and process is as follows：201st, the side slope surface image procossing of initial samples moment collection, calculates the similarity of the moment side slope surface image；202nd, the side slope surface image procossing of next sampling instant collection, calculates the similarity of the moment side slope surface image；203rd, Light deformation judges；Its monitoring system includes K digital projector, K image capture apparatus, image capture device and image processing equipment.Reasonable in design, realization of the invention is conveniently and using effect is good, and energy side slope Light deformation carries out easy, real-time, accurate measurements.

Description

Side slope Light deformation monitoring method and monitoring system based on similarity decision criteria
Technical field
The invention belongs to micro- change monitoring technical field, more particularly, to a kind of micro- change of the side slope based on similarity decision criteria Shape monitoring method and monitoring system.
Background technology
The monitoring of side slope surface Light deformation and Realtime Alerts are most important, and such as Slope of Open Pit Coal Mine surface Light deformation is supervised The micro- change monitoring and Realtime Alerts surveyed concern the major issue of miner's life security.Actual side slope surface Light deformation is monitored When, mainly the rock mass fission produced by sedimentation is monitored.It is presently used for detecting instrument or the side of side slope surface Light deformation Method has：Total powerstation, convergence instrument, optical fiber sensing technology etc., above-mentioned detection technique respectively have advantage, but also exist to some extent scarce Fall into and not enough, such as：To be very tired inside embedded fibers to side slope when carrying out the detection of side slope Light deformation using optical fiber sensing technology Difficult, and the sensitivity of detection need to be modeled analysis according to side slope attribute；Side slope is carried out using total powerstation and convergence instrument micro- During deformation detection, extensive work is done before measurement, including observation station is set, set up prism device etc., and it is every in measurement process It is secondary the three-dimensional data of an observation station can only be acquired, it is necessary to pointwise collection side slope surface to instrument distance, to simultaneously Workload is larger when the slope data of out-of-flatness is gathered, and need to take a long time, and is difficult to accomplish real-time, intellectual monitoring.
In recent years, image processing techniques achieves fast development with 3D reconstruction techniques.In image processing field, empirical modal (EMD) method of decomposition is a kind of signal analysis method with self adaptation time-frequency resolution capability, and two-dimensional empirical mode decomposition (BEMD) method is the further genralrlization of empirical mode decomposition (EMD) method, and it is a kind of data for not relying on basic function The adaptive approach of driving, in recent years two-dimensional empirical mode decomposition (BEMD) method be also widely used in Image Multiscale analysis.
Because measuring method has the advantages that noncontact, high precision, therefore it is widely used in three-dimensional measurement neck Domain.In three-dimensional measurement field, dynamic, real-time three-dimensional measurement are the difficult points of research.At present, the optical 3-dimensional being widely used is surveyed Amount method has structured light projection method, stereo vision method, laser scanning method, laser interferance method, time-of-flight method etc..Wherein, laser Scanning method is due to time-consuming more long, it is difficult to for dynamic object scanning；Laser interferance method and confocal are severe to environmental requirement Carve, equipment complex and expensive is generally used for the accurate measurement of specific industry；And it is applied to the 3D measuring methods that dynamic realtime is monitored, Mainly there are ToF, holographic imaging method, Structure light method and several classes of stereo vision method.
For defect and deficiency that existing side slope Light deformation monitoring method is present, if by 3D method for reconstructing and image procossing Method is combined, and is applied to the monitoring of side slope Light deformation, just can effectively solve existing side slope Light deformation monitoring method and corresponding prison Monitoring difficulty that measurement equipment is present is big, time-consuming, can not realize real-time monitoring, the problems such as monitoring effect is poor.In addition, existing Also there is the inaccurate defect of monitoring result, such as side slope lastblock rock in side slope Light deformation monitoring method and corresponding monitoring device When being dropped because of loosening, thus when side slope surface there is not Light deformation, it is very possible if now being alarmed to produce false-alarm.
To sum up, nowadays lack it is a kind of it is reasonable in design, realize convenient and using effect it is good based on similarity decision criteria Side slope Light deformation monitoring method and monitoring system, can side slope Light deformation carry out it is easy, in real time, accurate measurements.
The content of the invention
The technical problems to be solved by the invention are for above-mentioned deficiency of the prior art, there is provided one kind is based on similar The side slope Light deformation monitoring method of decision criteria is spent, its method and step is simple, reasonable in design and realizes that convenient, using effect is good, Energy side slope Light deformation carries out easy, real-time, accurate measurements.
In order to solve the above technical problems, the technical solution adopted by the present invention is：A kind of side based on similarity decision criteria Slope Light deformation monitoring method, it is characterised in that the method is comprised the following steps：
Step one, IMAQ and synchronized upload：Using image capture device and according to sample frequency f set in advance, Side slope surface image to monitored area is acquired, and the side slope surface image synchronization that each sampling instant is gathered is sent to Image processing equipment；
The monitored area is to need to carry out the region of Light deformation monitoring on side slope surface, and institute monitored area is divided into K and treats Analyzed area, the K region to be analyzed is square and its size all same；Wherein, K is positive integer and K >=2；It is described Side slope surface image is made up of K area image, and the K area image is respectively the K image in the region to be analyzed；
The sampling instant of described image collecting device, is denoted as th, th=t1+(h-1)×Δt；Wherein, h is positive integer and h =1,2,3 ..., t1It it is the initial samples moment of described image collecting device, Δ t is adjacent two before and after described image collecting device The time interval and Δ t=1/f of secondary sampling；
Step 2, image-receptive and synchronization process：Described image processing equipment receives image capture device when respectively sampling After carving gathered side slope surface image, the side slope surface image synchronization to being received is processed, and process is as follows：
Step 201, the side slope surface image procossing of initial samples moment collection：Using image processing equipment to initial samples The side slope surface image of moment image capture device collection is processed, and is comprised the following steps：
Step 2011, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the side The sampling instant t of slope surface image1Recorded；
Step 2012, elevation information are obtained：Call image processing module in step 2011 receive side slope surface image Processed, obtained the altitude data of each pixel on the side slope surface image, and the side slope surface image for being obtained The altitude data of upper each pixel is t1The elevation information of monitored area described in the moment；
The elevation information of the monitored area includes the K elevation information in the region to be analyzed, and each is described to be analyzed The altitude data of each pixel on the elevation information in the region area image including the region to be analyzed；
t1The elevation information of monitored area described in the moment includes t1The moment K elevation information in the region to be analyzed；Its In, t1Moment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(t1)；K is the numbering in the region to be analyzed, and k is Positive integer and k=1,2 ..., K；
Step 2013, elevation information storage：To the t obtained in step 20121The moment K height in the region to be analyzed Journey information, synchronizes storage；
Step 2014, Similarity Measure：According to formula(1), calculate Draw t1The image similarity X of monitored area described in the moment1,2…K(t1), wherein X1,2…K(t1)∈(0,1]；In formula (1), xk (t1) it is t1Moment numbering is the elevation average value in the region to be analyzed of k；
Step 202, the side slope surface image procossing of next sampling instant collection：Using image processing equipment to next The side slope surface image of sampling instant image capture device collection is processed, and is comprised the following steps：
Step 2021, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the side The sampling time t of slope surface imageDRecorded；Wherein, D is positive integer and D >=2；
Step 2022, elevation information are obtained：According to the method described in step 2012, t is obtainedDMonitored area described in moment Elevation information；
tDThe elevation information of monitored area described in the moment includes tDThe moment K elevation information in the region to be analyzed；Its In, tDMoment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(tD)；
Step 2023, elevation information storage：To the t obtained in step 2022DThe moment K height in the region to be analyzed Journey information, synchronizes storage；
Step 2024, Similarity Measure：According to formula(2), count Calculation draws tDThe image similarity X of monitored area described in the moment1,2…K(tD), wherein X1,2…K(tD)∈(0,1]；In formula (2), xk (tD) it is tDMoment numbering is the elevation average value in the region to be analyzed of k；
Step 203, Light deformation judge：The t that will be calculated in step 2024DThe image of monitored area described in the moment Similarity X1,2…K(tD), respectively with tDThe image similarity of monitored area is compared described in each moment before moment：Work as X1,2…K (tD) and tDWhen difference before moment between the image similarity of monitored area described in each moment is no more than ε, illustrate from t1When Carve to tDLight deformation in monitored area described in the moment, afterwards return to step 202 there is no, to the side slope of next sampling instant collection Surface image is processed；Otherwise, t is illustratedDThere is Light deformation, described image processing equipment control report in monitored area described in the moment Alert unit is alarmed, and the t to there is Light deformationDMoment is recorded；
Wherein, ε is Light deformation alarm threshold value set in advance and ε=0.01~0.1.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Step 2012 and step When elevation information acquisition is carried out in 2022, image processing module is called and according to three frequency color fringe projection three-dimensional measurement sides Method, obtains the altitude data of each pixel on the side slope surface image；The side slope surface image gathered in step one is institute State the deformation color fringe image of monitored area；
Before carrying out IMAQ and synchronized upload in step one, color fringe image is first generated using image processing equipment, Tri- Color Channels of RGB of the color fringe image are generated by the sine streak of low, medium and high three kinds of carrier frequency respectively；Afterwards, then will The color fringe image is projected to the monitored area simultaneously through tri- color channels of RGB of digital projector；Then, use Image capture apparatus shoot the deformation color fringe image of the monitored area；
When elevation information acquisition is carried out in step 2012 and step 2022, process is as follows：
The decoupling of step i, background subtraction and color：Bar containing high frequency in the deformation color fringe image that image capture device is gathered The Color Channel of line subtracts each other with the Color Channel containing intermediate frequency striped, obtains the compound bar graph of high and low frequency, then use two-dimensional empirical mould Formula is decomposed BEMD and is decomposed, and separates high, middle carrier component；Similarly, in containing in the deformation color fringe image, low frequency point The Color Channel of amount subtracts each other, in obtaining, the compound bar graph of low frequency, then decomposed with Bidimensional Empirical Mode Decomposition BEMD obtain in, Low carrier component；
Step ii, phase demodulating：Demodulated with two-dimentional short time discrete Fourier transform, height, the low each carrier component bag of neutralization for obtaining Wrap up in phase；
Step iii, phase unwrapping：Parcel algorithm is gone to be sequentially completed parcel phase by low, medium and high carrier component with change precision Position is launched, and obtains the expansion phase of high frequency carrier frequency, thus launches the height of monitored area described in phase recovery.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Image described in step 203 After processing equipment control alarm unit is alarmed, elevation information comparison module is called, to from t1Moment is to tDMoment K described The elevation average value of analyzed area to be analyzed is compared respectively, and according to comparative result, draws tDThere is Light deformation in the moment Region to be analyzed；Afterwards, described image processing equipment output tDThere is the numbering in the region to be analyzed of Light deformation in the moment；
Wherein, from t1Moment is to tDThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From t1Moment is to tDMoment any one region to be analyzed elevation average value when being compared, by tDMoment the region to be analyzed Elevation average value respectively with t1Moment is to tD-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Image described in step 203 Before processing equipment control alarm unit is alarmed, described image processing equipment also needs to call pseudo- deformation judge module, to tD Whether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is judged that process is as follows：
Step I, continuous monitoring：According to the method described in step 2021 to step 2024, to tD+1Moment is to tD+EMoment The side slope surface image of image capture device collection is processed, and calculates the image similarity of monitored area described in each moment X1,2…K(tF)；Wherein, F is positive integer and F=D+1~D+E；Wherein, tD+E-tD+1=Δ T, Δ T are continuous prison set in advance The survey time；E be positive integer and
Step II, pseudo- deformation judge：By tD+1Moment is to tD+EThe image similarity of monitored area described in each moment in moment X1,2…K(tF), respectively with tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) be compared：When X1,2…K(tF) and tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) between difference be all higher than ε When, illustrate tDThe Light deformation that monitored area described in moment occurs is true deformation, and now described image processing equipment control alarm is single Unit is alarmed；Otherwise, t is illustratedDThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Δ T=2s in step I~ 3min。
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Image described in step 203 After processing equipment control alarm unit is alarmed, into step 3；
Continued to monitor after step 3, first generation Light deformation, comprised the following steps：
Step 301, next sampling instant image procossing：It is right according to the method described in step 2021 to step 2024 tMThe side slope surface image of moment image capture device collection is processed, and calculates tMThe image of monitored area described in the moment Similarity X1,2…K(tM)；Wherein, M is positive integer and M >=D+1；
Step 302, Light deformation judge：The t that will be calculated in step 301MThe image of monitored area described in the moment Similarity X1,2…K(tM), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment： Work as X1,2…K(tM) and tDMoment is to tMDifference in moment between the image similarity of monitored area described in each moment is no more than ε When, illustrate from tDMoment is to tMLight deformation in monitored area described in the moment, afterwards return to step 301 there is no, during to next sampling The side slope surface image for carving collection is processed；Otherwise, t is illustratedMThere is Light deformation in monitored area described in the moment, at described image Reason equipment control alarm unit is alarmed, and the t to there is Light deformationMMoment and from t1Moment is to tMAlarmed described in moment single The alarm times of unit are recorded, afterwards into step 4；
Continued to monitor after step 4, next time generation Light deformation, comprised the following steps：
Step 401, next sampling instant image procossing：It is right according to the method described in step 2021 to step 2024 tNThe side slope surface image of moment image capture device collection is processed, and calculates tNThe image of monitored area described in the moment Similarity X1,2…K(tN)；Wherein, N is positive integer and N >=n, and wherein n is positive integer and tnMoment is tNMoment as described before is monitored The generation moment of region last time Light deformation；
Step 402, Light deformation judge：The t that will be calculated in step 401NThe image of monitored area described in the moment Similarity X1,2…K(tN), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment： Work as X1,2…K(tM) and tnMoment is to tNDifference in moment between the image similarity of monitored area described in each moment is no more than ε When, illustrate from tnMoment is to tNLight deformation in monitored area described in the moment, afterwards return to step 401 there is no, during to next sampling The side slope surface image for carving collection is processed；Otherwise, t is illustratedNThere is Light deformation in monitored area described in the moment, at described image Reason equipment control alarm unit is alarmed, and the t to there is Light deformationNMoment and from t1Moment is to tNAlarmed described in moment single The alarm times of unit are recorded, afterwards into step 5；
Step 5, one or many repeat step four, continue to monitor to the monitored area.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Image described in step 302 Before processing equipment control alarm unit is alarmed, described image processing equipment also needs to call pseudo- deformation judge module, to tM Whether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is judged that process is as follows：
Step I-11, continuous monitoring：According to the method described in step 2021 to step 2024, to tM+1Moment is to tM+E The side slope surface image of moment image capture device collection is processed, and calculates the image phase of monitored area described in each moment Like degree X1,2…K(tF1)；Wherein, F1 is positive integer and F1=M+1~M+E；Wherein, tM+E-tM+1=Δ T；
Step II-12, pseudo- deformation judge：By tM+1Moment is to tM+EThe image of monitored area is similar described in each moment in moment Degree X1,2…K(tF1), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment：When X1,2…K(tF1) and tDMoment is to tMWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, Illustrate tMThe Light deformation that monitored area described in moment occurs is true deformation, and now described image processing equipment control alarm unit enters Row alarm；Otherwise, t is illustratedMThe Light deformation that monitored area described in moment occurs deforms for pseudo-；
Before the control alarm unit of image processing equipment described in step 402 is alarmed, described image processing equipment is also Pseudo- deformation judge module need to be called, to tNWhether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is judged, mistake Journey is as follows：
Step I-21, continuous monitoring：According to the method described in step 2021 to step 2024, to tN+1Moment is to tN+EWhen The side slope surface image for carving image capture device collection is processed, and it is similar to calculate the image of monitored area described in each moment Degree X1,2…K(tF2)；Wherein, F2 is positive integer and F2=N+1~N+E；Wherein, tM+E-tM+1=Δ T；
Step II-22, pseudo- deformation judge：By tN+1Moment is to tN+EThe image of monitored area is similar described in each moment in moment Degree X1,2…K(tF2), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment：When X1,2…K(tF2) and tnMoment is to tNWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, Illustrate tNThe Light deformation that monitored area described in moment occurs is true deformation, and now described image processing equipment control alarm unit enters Row alarm；Otherwise, t is illustratedNThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
The above-mentioned side slope Light deformation monitoring method based on similarity decision criteria, it is characterized in that：Image described in step 302 After processing equipment control alarm unit is alarmed, elevation information comparison module is called, to from tDMoment is to tMMoment K described The elevation average value of analyzed area to be analyzed is compared respectively, and according to comparative result, draws tMThere is Light deformation in the moment Region to be analyzed；Afterwards, described image processing equipment output tMThere is the numbering in the region to be analyzed of Light deformation in the moment；
Wherein, from tDMoment is to tMThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From tDMoment is to tMMoment any one region to be analyzed elevation average value when being compared, by tMMoment the region to be analyzed Elevation average value respectively with tDMoment is to tM-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion；
After the control alarm unit of image processing equipment described in step 402 is alarmed, elevation information comparison module is called, To from tnMoment is to tNThe elevation average value of moment K analyzed areas to be analyzed is compared respectively, and according to comparing knot Really, t is drawnNThere is the region to be analyzed of Light deformation in the moment；Afterwards, described image processing equipment output tNThere is Light deformation in the moment Region to be analyzed numbering；
Wherein, from tnMoment is to tNThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From tnMoment is to tNMoment any one region to be analyzed elevation average value when being compared, by tNMoment the region to be analyzed Elevation average value respectively with tnMoment is to tN-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
Meanwhile, invention additionally discloses a kind of simple structure, reasonable in design, input cost it is low and using it is easy to operate, use The good side slope Light deformation monitoring system based on similarity decision criteria of effect, it is characterised in that：K is laid in respectively including K The digital projector of the individual overlying regions to be analyzed, the K figure for being absorbed to the image in the K region to be analyzed respectively The image capture device and and image capture device being acquired as pickup apparatus, to the side slope surface image of the monitored area The image processing equipment for connecting, K described image pickup apparatus are CCD camera and it connects with image capture device, K The individual digital projector connects with image processing equipment；It is individual described to be analyzed that the individual CCD cameras of K are laid in K respectively Overlying regions.
Said system, it is characterized in that：The digital projector and CCD camera are respectively positioned at the two of the region to be analyzed Side top.
The present invention has advantages below compared with prior art：
1st, the side slope Light deformation monitoring method step for being used is simple, reasonable in design and realizes conveniently.
2nd, the number of passes high of each pixel on side slope surface image is obtained using three-dimensional measurement method for triple-frequency color fringe projection According to obtaining the high precision of altitude data and image processing speed be fast.Meanwhile, image-capture field is big, can according to actual needs, And with reference to the size of monitored area, the quantity K for treating analyzed area is adjusted accordingly, and practical operation is very easy.Thus, The present invention is divided into K region to be analyzed by by monitored area, on the premise of monitoring accuracy is ensured, can meet different size The monitoring requirements of monitored area.
3rd, side slope Light deformation monitoring is carried out using similarity decision criteria, data processing amount is small and data processing speed is fast, Monitoring accuracy is high, and the micro- change process of side slope is accurately monitored, and certainty of measurement can reach 0.1mm or so；Also, monitoring velocity Hurry up, the side slope Light deformation monitoring process at each moment can be completed in 2 seconds.
4th, using effect is good and monitoring result is accurate, can become as side slope when side slope lastblock rock drops because of loosening is pseudo- Shape is identified, it is to avoid false-alarm, thus has the advantages that monitoring result is accurate, reliability is high, can realize real-time, dynamic monitoring, Popularizing application prospect is extensive.
5th, the side slope Light deformation monitoring system simple structure that is used, reasonable in design, equipment are installed and lay convenient and use Easy to operate, using effect is good, and input cost is relatively low.
In sum, the present invention is reasonable in design, realize that convenient and using effect is good, can side slope Light deformation carry out it is easy, In real time, accurate measurements.
Below by drawings and Examples, technical scheme is described in further detail.
Brief description of the drawings
Fig. 1 is that method flow block diagram when side slope Light deformation is monitored is carried out using the present invention.
Fig. 2 is the schematic block circuit diagram of side slope Light deformation monitoring system of the present invention.
Description of reference numerals:
1-image processing equipment；2-image capture device；3-digital projector；
4-CCD camera；5-alarm unit.
Specific embodiment
A kind of side slope Light deformation monitoring method based on similarity decision criteria as shown in Figure 1, comprises the following steps：
Step one, IMAQ and synchronized upload：Using image capture device 2 and according to sample frequency set in advance F, the side slope surface image to monitored area is acquired, and the side slope surface image synchronization transmission that each sampling instant is gathered To image processing equipment 1.
The monitored area is to need to carry out the region of Light deformation monitoring on side slope surface, and institute monitored area is divided into K and treats Analyzed area, the K region to be analyzed is square and its size all same；Wherein, K is positive integer and K >=2；It is described Side slope surface image is made up of K area image, and the K area image is respectively the K image in the region to be analyzed.
The sampling instant of described image collecting device, is denoted as th, th=t1+(h-1)×Δt；Wherein, h is positive integer and h =1,2,3 ..., t1It it is the initial samples moment of described image collecting device, Δ t is adjacent two before and after described image collecting device The time interval and Δ t=1/f of secondary sampling.
Step 2, image-receptive and synchronization process：Described image processing equipment 1 receives image capture device 2 and respectively samples After the side slope surface image that moment is gathered, the side slope surface image synchronization to being received is processed, and process is as follows：
Step 201, the side slope surface image procossing of initial samples moment collection：Initially adopted for 1 pair using image processing equipment The side slope surface image of the collection of sample moment image capture device 2 is processed, and is comprised the following steps：
Step 2011, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the side The sampling instant t of slope surface image1Recorded；
Step 2012, elevation information are obtained：Call image processing module in step 2011 receive side slope surface image Processed, obtained the altitude data of each pixel on the side slope surface image, and the side slope surface image for being obtained The altitude data of upper each pixel is t1The elevation information of monitored area described in the moment；
The elevation information of the monitored area includes the K elevation information in the region to be analyzed, and each is described to be analyzed The altitude data of each pixel on the elevation information in the region area image including the region to be analyzed；
t1The elevation information of monitored area described in the moment includes t1The moment K elevation information in the region to be analyzed；Its In, t1Moment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(t1)；K is the numbering in the region to be analyzed, and k is Positive integer and k=1,2 ..., K；
Step 2013, elevation information storage：To the t obtained in step 20121The moment K height in the region to be analyzed Journey information, synchronizes storage；
Step 2014, Similarity Measure：According to formula(1), calculate Draw t1The image similarity X of monitored area described in the moment1,2…K(t1), wherein X1,2…K(t1)∈(0,1]；In formula (1), xk(t1) It is t1Moment numbering is the elevation average value in the region to be analyzed of k；
Step 202, the side slope surface image procossing of next sampling instant collection：Using image processing equipment 1 to next The side slope surface image of the individual collection of sampling instant image capture device 2 is processed, and is comprised the following steps：
Step 2021, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the side The sampling time t of slope surface imageDRecorded；Wherein, D is positive integer and D >=2；
Step 2022, elevation information are obtained：According to the method described in step 2012, t is obtainedDMonitored area described in moment Elevation information；
tDThe elevation information of monitored area described in the moment includes tDThe moment K elevation information in the region to be analyzed；Its In, tDMoment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(tD)；
Step 2023, elevation information storage：To the t obtained in step 2022DThe moment K height in the region to be analyzed Journey information, synchronizes storage；
Step 2024, Similarity Measure：According to formula(2), count Calculation draws tDThe image similarity X of monitored area described in the moment1,2…K(tD), wherein X1,2…K(tD)∈(0,1]；In formula (2), xk (tD) it is tDMoment numbering is the elevation average value in the region to be analyzed of k；
Step 203, Light deformation judge：The t that will be calculated in step 2024DThe image of monitored area described in the moment Similarity X1,2…K(tD), respectively with tDThe image similarity of monitored area is compared described in each moment before moment：Work as X1,2…K (tD) and tDWhen difference before moment between the image similarity of monitored area described in each moment is no more than ε, illustrate from t1When Carve to tDLight deformation in monitored area described in the moment, afterwards return to step 202 there is no, to the side slope of next sampling instant collection Surface image is processed；Otherwise, t is illustratedDThere is Light deformation in monitored area described in the moment, described image processing equipment 1 is controlled Alarm unit 5 is alarmed, and the t to there is Light deformationDMoment is recorded；
Wherein, ε is Light deformation alarm threshold value set in advance and ε=0.01~0.1.
When actually used, can according to specific needs, the value to ε is adjusted accordingly.
In formula (1), min { x1(t1),x2(t1),…xK(t1) represent from x1(t1)、x2(t1)、…、xK(t1) in take most Small value, max { x1(t1),x2(t1),…xK(t1) represent from x1(t1)、x2(t1)、…、xK(t1) in take maximum；Formula (2) In, min { x1(tD),x2(tD),…xK(tD) represent from x1(tD)、x2(tD)、…、xK(tD) in take minimum value, max { x1(tD), x2(tD),…xK(tD) represent from x1(tD)、x2(tD)、…、xK(tD) in take maximum.
In the present embodiment, x in step 2014k(t1) it is t1Moment numbering is own on the area image in the region to be analyzed of k The altitude data average value of pixel, x in step 2024k(tD) it is tDMoment numbering is on the area image in region to be analyzed of k The altitude data average value of all pixels point.
Carried out in the present embodiment, in step 2012 and step 2022 elevation information obtain when, call image processing module and According to three-dimensional measurement method for triple-frequency color fringe projection, the altitude data of each pixel on the side slope surface image is obtained； The side slope surface image gathered in step one is the deformation color fringe image of the monitored area.
Before carrying out IMAQ and synchronized upload in step one, color fringe image is first generated using image processing equipment 1, Tri- Color Channels of RGB of the color fringe image are generated by the sine streak of low, medium and high three kinds of carrier frequency respectively；Afterwards, then will The color fringe image is projected to the monitored area simultaneously through tri- color channels of RGB of digital projector 3；Then, adopt The deformation color fringe image of the monitored area is shot with image capture apparatus；
When elevation information acquisition is carried out in step 2012 and step 2022, process is as follows：
The decoupling of step i, background subtraction and color：Contain high frequency in the deformation color fringe image that image capture device 2 is gathered The Color Channel of striped subtracts each other with the Color Channel containing intermediate frequency striped, obtains the compound bar graph of high and low frequency, then use two-dimensional empirical Mode Decomposition BEMD is decomposed, and separates high, middle carrier component；Similarly, will it is described deformation color fringe image in contain in, low frequency The Color Channel of component subtracts each other, and in obtaining, the compound bar graph of low frequency, then is decomposed with Bidimensional Empirical Mode Decomposition BEMD and obtained In, low carrier component；
Step ii, phase demodulating：Demodulated with two-dimentional short time discrete Fourier transform, height, the low each carrier component bag of neutralization for obtaining Wrap up in phase；
Step iii, phase unwrapping：Parcel algorithm is gone to be sequentially completed parcel phase by low, medium and high carrier component with change precision Position is launched, and obtains the expansion phase of high frequency carrier frequency, thus launches the height of monitored area described in phase recovery.
Thus, the present invention obtains the number of passes high of the monitored area using three-dimensional measurement method for triple-frequency color fringe projection According to the method for three-dimensional measurement is based on the three frequency color fringe projection technology of profiling of BEMD, reaches single image and shoots lower fringe phase High precision solution reconcile the purpose of wrapped phase reliability rapid deployment, while the texture information of testee can also be recovered, only need The accurate expansion phase for obtaining high frequency fringes carrier frequency, can just recover testee high accuracy three-dimensional profile information.It is described Tri- color channels of RGB of digital projector 3 are projected to the monitored area simultaneously after, described image pickup apparatus are (specific Coloured image pickup apparatus) from another angle shot through the monitored area high modulation colored deforming stripe figure (i.e. institute State deformation color fringe image).Wherein, background subtraction, color decoupling and phase unwrapping are the key technologies of the method for three-dimensional measurement, It is the principal element for influenceing precision and reliability.The three-dimensional sensing method merged with stereoscopic vision using color fringe projection, with Measurement DYNAMIC COMPLEX object.Three-dimensional measurement method for triple-frequency color fringe projection is a kind of two-way fusion mechanism, i.e., first color with three frequencies The phase distribution of vitta line instructs binocular stereo vision global registration, in turn, recycles binocular fringe gray level figure local more special The fine match correction initial phase distortion levied, anon-normal of this distortion from reflectivity noise, shape mutation and striped String, it is final to use stereoscopic vision solution room point position coordinates, reduce testee exact height information.When actually used, should Method for three-dimensional measurement energy is easy, the elevation information of monitored area described in quick obtaining, and accuracy is high.
When actually used, it would however also be possible to employ other method for three-dimensional measurement for being based on image procossing obtain the monitored area Altitude data.
In the present embodiment, the three-dimensional measurement method for triple-frequency color fringe projection for being used is disclosed on 01 18th, 2012 Publication No. CN102322822A, Patent No. 201110225971.2 and entitled《A kind of three frequency color fringe projections Method for three-dimensional measurement》Application for a patent for invention file disclosed in method for three-dimensional measurement.
Wherein, similarity decision criteria refers to carry out side slope Light deformation prison according to the size and change situation of image similarity Survey.Regard the elevation information of monitored area described in any instant as a fuzzy set, according to fuzzy mathematics theory, 2 obscure Close degree between set can be weighed with similarity (also referred to as approach degree).
In the present embodiment, the image similarity of the monitored area calculated in step 2014 and step 2024 takes Value scope for (0,1], when the value of image similarity is approximately 1, represent that tested side slope surface (i.e. described monitored area) is approximate Smooth, now all pixels point on the monitored area has maximum similarity；When the value of image similarity is close to 0 When, represent that tested slope table face has minimum similarity.
In the present embodiment, after the control alarm unit 5 of image processing equipment 1 described in step 203 is alarmed, into step Three；
Continued to monitor after step 3, first generation Light deformation, comprised the following steps：
Step 301, next sampling instant image procossing：It is right according to the method described in step 2021 to step 2024 tMThe side slope surface image of the collection of moment image capture device 2 is processed, and calculates tMThe image of monitored area described in the moment Similarity X1,2…K(tM)；Wherein, M is positive integer and M >=D+1；
Step 302, Light deformation judge：The t that will be calculated in step 301MThe image of monitored area described in the moment Similarity X1,2…K(tM), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment： Work as X1,2…K(tM) and tDMoment is to tMDifference in moment between the image similarity of monitored area described in each moment is no more than ε When, illustrate from tDMoment is to tMLight deformation in monitored area described in the moment, afterwards return to step 301 there is no, during to next sampling The side slope surface image for carving collection is processed；Otherwise, t is illustratedMThere is Light deformation in monitored area described in the moment, at described image The control alarm unit 5 of reason equipment 1 is alarmed, and the t to there is Light deformationMMoment and from t1Moment is to tMAlarmed described in moment The alarm times of unit 5 are recorded, afterwards into step 4；
Continued to monitor after step 4, next time generation Light deformation, comprised the following steps：
Step 401, next sampling instant image procossing：It is right according to the method described in step 2021 to step 2024 tNThe side slope surface image of the collection of moment image capture device 2 is processed, and calculates tNThe image of monitored area described in the moment Similarity X1,2…K(tN)；Wherein, N is positive integer and N >=n, and wherein n is positive integer and tnMoment is tNMoment as described before is monitored The generation moment of region last time Light deformation；
Step 402, Light deformation judge：The t that will be calculated in step 401NThe image of monitored area described in the moment Similarity X1,2…K(tN), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment： Work as X1,2…K(tM) and tnMoment is to tNDifference in moment between the image similarity of monitored area described in each moment is no more than ε When, illustrate from tnMoment is to tNLight deformation in monitored area described in the moment, afterwards return to step 401 there is no, during to next sampling The side slope surface image for carving collection is processed；Otherwise, t is illustratedNThere is Light deformation in monitored area described in the moment, at described image The control alarm unit 5 of reason equipment 1 is alarmed, and the t to there is Light deformationNMoment and from t1Moment is to tNAlarmed described in moment The alarm times of unit 5 are recorded, afterwards into step 5；
Step 5, one or many repeat step four, continue to monitor to the monitored area.
In the present embodiment, before the control alarm unit 5 of image processing equipment 1 described in step 203 is alarmed, the figure As processing equipment 1 also needs to call pseudo- deformation judge module, to tDWhether the Light deformation that monitored area described in the moment occurs is pseudo- change Shape is judged that process is as follows：
Step I, continuous monitoring：According to the method described in step 2021 to step 2024, to tD+1Moment is to tD+EMoment The side slope surface image of the collection of image capture device 2 is processed, and it is similar to calculate the image of monitored area described in each moment Degree X1,2…K(tF)；Wherein, F is positive integer and F=D+1~D+E；Wherein, tD+E-tD+1=Δ T, Δ T are set in advance continuous The monitoring time；E be positive integer and
Step II, pseudo- deformation judge：By tD+1Moment is to tD+EThe image similarity of monitored area described in each moment in moment X1,2…K(tF), respectively with tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) be compared：When X1,2…K(tF) and tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) between difference be all higher than ε When, illustrate tDThe Light deformation that monitored area described in moment occurs is true deformation, and the now control of described image processing equipment 1 alarm is single Unit 5 is alarmed；Otherwise, t is illustratedDThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
In the present embodiment, Δ T=2s~3min in step I.FormulaIn,Expression is rounded downwards.
When actually used, can according to specific needs, the value size to Δ T is adjusted accordingly.
In the present embodiment, before the control alarm unit 5 of image processing equipment 1 described in step 302 is alarmed, the figure As processing equipment 1 also needs to call pseudo- deformation judge module, to tMWhether the Light deformation that monitored area described in the moment occurs is pseudo- change Shape is judged that process is as follows：
Step I-11, continuous monitoring：According to the method described in step 2021 to step 2024, to tM+1Moment is to tM+EWhen The side slope surface image for carving the collection of image capture device 2 is processed, and calculates the image phase of monitored area described in each moment Like degree X1,2…K(tF1)；Wherein, F1 is positive integer and F1=M+1~M+E；Wherein, tM+E-tM+1=Δ T；
Step II-12, pseudo- deformation judge：By tM+1Moment is to tM+EThe image of monitored area is similar described in each moment in moment Degree X1,2…K(tF1), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment：When X1,2…K(tF1) and tDMoment is to tMWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, Illustrate tMThe Light deformation that monitored area described in moment occurs is true deformation, the now control of described image processing equipment 1 alarm unit 5 Alarmed；Otherwise, t is illustratedMThe Light deformation that monitored area described in moment occurs deforms for pseudo-；
Before the control alarm unit 5 of image processing equipment 1 described in step 402 is alarmed, described image processing equipment 1 Also need to call pseudo- deformation judge module, to tNWhether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is judged, Process is as follows：
Step I-21, continuous monitoring：According to the method described in step 2021 to step 2024, to tN+1Moment is to tN+EWhen The side slope surface image for carving the collection of image capture device 2 is processed, and calculates the image phase of monitored area described in each moment Like degree X1,2…K(tF2)；Wherein, F2 is positive integer and F2=N+1~N+E；Wherein, tM+E-tM+1=Δ T；
Step II-22, pseudo- deformation judge：By tN+1Moment is to tN+EThe image of monitored area is similar described in each moment in moment Degree X1,2…K(tF2), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment：When X1,2…K(tF2) and tnMoment is to tNWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, Illustrate tNThe Light deformation that monitored area described in moment occurs is true deformation, the now control of described image processing equipment 1 alarm unit 5 are alarmed；Otherwise, t is illustratedNThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
In the present embodiment, after the control alarm unit 5 of image processing equipment 1 described in step 203 is alarmed, elevation is called Information comparison module, to from t1Moment is to tDThe elevation average value of the moment K analyzed area to be analyzed is compared respectively, And according to comparative result, draw tDThere is the region to be analyzed of Light deformation in the moment；Afterwards, the output of described image processing equipment 1 tDWhen Carve the numbering in the region to be analyzed that Light deformation occurs；
Wherein, from t1Moment is to tDThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From t1Moment is to tDMoment any one region to be analyzed elevation average value when being compared, by tDMoment the region to be analyzed Elevation average value respectively with t1Moment is to tD-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
It is to realize convenient, presets elevation change alarm threshold value Δ H, to from t1Moment is to tDMoment, any one was to be analyzed When the elevation average value in region is compared, work as tDMoment the region to be analyzed elevation average value and t1Moment is to tD-1In moment Each moment the region to be analyzed elevation average value between difference no more than Δ H when, illustrate that the region to be analyzed does not occur Light deformation；Otherwise, illustrate that the region to be analyzed occurs Light deformation.
Wherein, elevation change alarm threshold value Δ H, according to actual monitoring demand, is artificially set.
Also, after the control alarm unit 5 of image processing equipment 1 described in step 302 is alarmed, call elevation information ratio Compared with module, to from tDMoment is to tMThe elevation average value of the moment K analyzed area to be analyzed is compared respectively, and according to Comparative result, draws tMThere is the region to be analyzed of Light deformation in the moment；Afterwards, the output of described image processing equipment 1 tMMoment occurs The numbering in the region to be analyzed of Light deformation；
Wherein, from tDMoment is to tMThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From tDMoment is to tMMoment any one region to be analyzed elevation average value when being compared, by tMMoment the region to be analyzed Elevation average value respectively with tDMoment is to tM-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
In the present embodiment, to from tDMoment is to tMMoment any one region to be analyzed elevation average value when being compared, Work as tMMoment the region to be analyzed elevation average value and tDMoment is to tM-1In moment each moment the region to be analyzed elevation put down When difference between average is no more than Δ H, illustrate that the region to be analyzed does not occur Light deformation；Otherwise, the area to be analyzed is illustrated There is Light deformation in domain.
After the control alarm unit 5 of image processing equipment 1 described in step 402 is alarmed, elevation information is called to compare mould Block, to from tnMoment is to tNThe elevation average value of moment K analyzed areas to be analyzed is compared respectively, and according to comparing As a result, t is drawnNThere is the region to be analyzed of Light deformation in the moment；Afterwards, the output of described image processing equipment 1 tNThere is micro- change in the moment The numbering in the region to be analyzed of shape；
Wherein, from tnMoment is to tNThe moment K comparative approach all same of the elevation average value in the region to be analyzed；It is right From tnMoment is to tNMoment any one region to be analyzed elevation average value when being compared, by tNMoment the region to be analyzed Elevation average value respectively with tnMoment is to tN-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
In the present embodiment, to from tnMoment is to tNMoment any one region to be analyzed elevation average value when being compared, when tNMoment the region to be analyzed elevation average value and tnMoment is to tN-1In moment each moment the region to be analyzed elevation it is average When difference between value is no more than Δ H, illustrate that the region to be analyzed does not occur Light deformation；Otherwise, the region to be analyzed is illustrated Generation Light deformation.
A kind of side slope Light deformation monitoring system based on similarity decision criteria as shown in Figure 2, including K laid respectively Absorbed in image of the K digital projector 3, K of the overlying regions to be analyzed respectively to the K region to be analyzed Image capture apparatus, the image capture device 2 that is acquired to the side slope surface image of the monitored area and adopted with image The image processing equipment 1 that collection equipment 2 connects, K described image pickup apparatus be CCD camera 4 and its and IMAQ Equipment 2 connects, and the K digital projector 3 connects with image processing equipment 1；The K CCD camera 4 is laid in respectively The K overlying regions to be analyzed.
In the present embodiment, the digital projector 3 and CCD camera 4 are located on the both sides in the region to be analyzed respectively Side.
Reality to digital projector 3 and CCD camera 4 lay when installing, and digital projector 3 is laid in into described treating The side top of analyzed area, and CCD camera 4 is laid in the opposite side top in the region to be analyzed.
The above, is only presently preferred embodiments of the present invention, and not the present invention is imposed any restrictions, every according to the present invention Any simple modification, change and equivalent structure change that technical spirit is made to above example, still fall within skill of the present invention In the protection domain of art scheme.

Claims (10)

1. a kind of side slope Light deformation monitoring method based on similarity decision criteria, it is characterised in that the method includes following step Suddenly：
Step one, IMAQ and synchronized upload：It is right using image capture device (2) and according to sample frequency f set in advance The side slope surface image of monitored area is acquired, and the side slope surface image synchronization that each sampling instant is gathered is sent to figure As processing equipment (1)；
The monitored area is to need to carry out the region of Light deformation monitoring on side slope surface, and it is individual to be analyzed that institute monitored area is divided into K Region, the K region to be analyzed is square and its size all same；Wherein, K is positive integer and K >=2；The side slope Surface image is made up of K area image, and the K area image is respectively the K image in the region to be analyzed；
The sampling instant of described image collecting device, is denoted as th, th=t1+(h-1)×Δt；Wherein, h be positive integer and h=1, 2nd, 3 ..., t1It it is the initial samples moment of described image collecting device, Δ t is adopted twice for adjacent before and after described image collecting device The time interval and Δ t=1/f of sample；
Step 2, image-receptive and synchronization process：Described image processing equipment (1) receives image capture device (2) and respectively samples After the side slope surface image that moment is gathered, the side slope surface image synchronization to being received is processed, and process is as follows：
Step 201, the side slope surface image procossing of initial samples moment collection：Using image processing equipment (1) to initial samples The side slope surface image of moment image capture device (2) collection is processed, and is comprised the following steps：
Step 2011, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the slope table The sampling instant t of face image1Recorded；
Step 2012, elevation information are obtained：Call image processing module is carried out to the side slope surface image received in step 2011 Treatment, obtains the altitude data of each pixel on the side slope surface image, and each on the side slope surface image for being obtained The altitude data of pixel is t1The elevation information of monitored area described in the moment；
The elevation information of the monitored area includes the K elevation information in the region to be analyzed, each described region to be analyzed Elevation information including the region to be analyzed area image on each pixel altitude data；
t1The elevation information of monitored area described in the moment includes t1The moment K elevation information in the region to be analyzed；Wherein, t1 Moment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(t1)；K is the numbering in the region to be analyzed, and k is positive integer And k=1,2 ..., K；
Step 2013, elevation information storage：To the t obtained in step 20121The moment K elevation letter in the region to be analyzed Breath, synchronizes storage；
Step 2014, Similarity Measure：According to formula(1), calculate t1The image similarity X of monitored area described in the moment1,2…K(t1), wherein X1,2…K(t1)∈(0,1]；In formula (1), xk(t1) it is t1 Moment numbering is the elevation average value in the region to be analyzed of k；
Step 202, the side slope surface image procossing of next sampling instant collection：Using image processing equipment (1) to next The side slope surface image of sampling instant image capture device (2) collection is processed, and is comprised the following steps：
Step 2021, the storage of side slope surface image：Side slope surface image to being currently received is stored, and to the slope table The sampling time t of face imageDRecorded；Wherein, D is positive integer and D >=2；
Step 2022, elevation information are obtained：According to the method described in step 2012, t is obtainedDThe height of monitored area described in the moment Journey information；
tDThe elevation information of monitored area described in the moment includes tDThe moment K elevation information in the region to be analyzed；Wherein, tD Moment numbering is the elevation information in the region to be analyzed of k, is denoted as Xk(tD)；
Step 2023, elevation information storage：To the t obtained in step 2022DThe moment K elevation letter in the region to be analyzed Breath, synchronizes storage；
Step 2024, Similarity Measure：According to formula(2), calculate Go out tDThe image similarity X of monitored area described in the moment1,2…K(tD), wherein X1,2…K(tD)∈(0,1]；In formula (2), xk(tD) be tDMoment numbering is the elevation average value in the region to be analyzed of k；
Step 203, Light deformation judge：The t that will be calculated in step 2024DThe image of monitored area described in the moment is similar Degree X1,2…K(tD), respectively with tDThe image similarity of monitored area is compared described in each moment before moment：Work as X1,2…K(tD) With tDWhen difference before moment between the image similarity of monitored area described in each moment is no more than ε, illustrate from t1Moment is extremely tDLight deformation in monitored area described in the moment, afterwards return to step 202 there is no, to the side slope surface of next sampling instant collection Image is processed；Otherwise, t is illustratedDThere is Light deformation, described image processing equipment (1) control report in monitored area described in the moment Alert unit (5) is alarmed, and the t to there is Light deformationDMoment is recorded；
Wherein, ε is Light deformation alarm threshold value set in advance and ε=0.01~0.1.
2. according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 1, it is characterised in that：Step Rapid 2012 and step 2022 in carry out elevation information obtain when, call image processing module and according to three frequency color fringe projections Method for three-dimensional measurement, obtains the altitude data of each pixel on the side slope surface image；The slope table gathered in step one Face image is the deformation color fringe image of the monitored area；
Before carrying out IMAQ and synchronized upload in step one, color fringe image is first generated using image processing equipment (1), should Tri- Color Channels of RGB of color fringe image are generated by the sine streak of low, medium and high three kinds of carrier frequency respectively；Afterwards, then by institute Color fringe image is stated to be projected to the monitored area simultaneously through tri- color channels of RGB of digital projector (3)；Then, adopt The deformation color fringe image of the monitored area is shot with image capture apparatus；
When elevation information acquisition is carried out in step 2012 and step 2022, process is as follows：
The decoupling of step i, background subtraction and color：Bar containing high frequency in the deformation color fringe image that image capture device (2) is gathered The Color Channel of line subtracts each other with the Color Channel containing intermediate frequency striped, obtains the compound bar graph of high and low frequency, then use two-dimensional empirical mould Formula is decomposed BEMD and is decomposed, and separates high, middle carrier component；Similarly, in containing in the deformation color fringe image, low frequency point The Color Channel of amount subtracts each other, in obtaining, the compound bar graph of low frequency, then decomposed with Bidimensional Empirical Mode Decomposition BEMD obtain in, Low carrier component；
Step ii, phase demodulating：Demodulated with two-dimentional short time discrete Fourier transform, height, the low each carrier component parcel phase of neutralization for obtaining Position；
Step iii, phase unwrapping：Parcel algorithm is gone to be sequentially completed wrapped phase exhibition by low, medium and high carrier component with change precision Open, obtain the expansion phase of high frequency carrier frequency, thus launch the height of monitored area described in phase recovery.
3., according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 1 or 2, its feature exists In：After image processing equipment described in step 203 (1) controls alarm unit (5) to be alarmed, elevation information is called to compare mould Block, to from t1Moment is to tDThe elevation average value of moment K analyzed areas to be analyzed is compared respectively, and according to comparing As a result, t is drawnDThere is the region to be analyzed of Light deformation in the moment；Afterwards, described image processing equipment (1) output tDMoment occurs micro- The numbering in the region to be analyzed of deformation；
Wherein, from t1Moment is to tDThe moment K comparative approach all same of the elevation average value in the region to be analyzed；To from t1 Moment is to tDMoment any one region to be analyzed elevation average value when being compared, by tDMoment the region to be analyzed elevation Average value respectively with t1Moment is to tD-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
4., according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 1 or 2, its feature exists In：Before image processing equipment described in step 203 (1) controls alarm unit (5) to be alarmed, described image processing equipment (1) also need to call pseudo- deformation judge module, to tDWhether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is sentenced Disconnected, process is as follows：
Step I, continuous monitoring：According to the method described in step 2021 to step 2024, to tD+1Moment is to tD+ETime chart picture The side slope surface image of collecting device (2) collection is processed, and calculates the image similarity of monitored area described in each moment X1,2…K(tF)；Wherein, F is positive integer and F=D+1~D+E；Wherein, tD+E-tD+1=Δ T, Δ T are continuous prison set in advance The survey time；E be positive integer and
Step II, pseudo- deformation judge：By tD+1Moment is to tD+EThe image similarity X of monitored area described in each moment in moment1,2…K (tF), respectively with tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) be compared：Work as X1,2…K (tF) and tDThe image similarity X of monitored area described in each moment before moment1,2…K(th) between difference when being all higher than ε, say Bright tDThe Light deformation that monitored area described in moment occurs is true deformation, now described image processing equipment (1) control alarm unit (5) alarmed；Otherwise, t is illustratedDThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
5. according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 4, it is characterised in that：Step Δ T=2s~3min in rapid I.
6., according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 1 or 2, its feature exists In：After image processing equipment described in step 203 (1) controls alarm unit (5) to be alarmed, into step 3；
Continued to monitor after step 3, first generation Light deformation, comprised the following steps：
Step 301, next sampling instant image procossing：According to the method described in step 2021 to step 2024, to tMMoment The side slope surface image of image capture device (2) collection is processed, and calculates tMThe image phase of monitored area described in the moment Like degree X1,2…K(tM)；Wherein, M is positive integer and M >=D+1；
Step 302, Light deformation judge：The t that will be calculated in step 301MThe image similarity of monitored area described in the moment X1,2…K(tM), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment：Work as X1,2…K (tM) and tDMoment is to tMWhen difference in moment between the image similarity of monitored area described in each moment is no more than ε, explanation From tDMoment is to tMLight deformation in monitored area described in the moment, afterwards return to step 301 there is no, and next sampling instant is gathered Side slope surface image processed；Otherwise, t is illustratedMThere is Light deformation, described image processing equipment in monitored area described in the moment (1) control alarm unit (5) is alarmed, and the t to there is Light deformationMMoment and from t1Moment is to tMAlarmed described in moment single The alarm times of first (5) are recorded, afterwards into step 4；
Continued to monitor after step 4, next time generation Light deformation, comprised the following steps：
Step 401, next sampling instant image procossing：According to the method described in step 2021 to step 2024, to tNMoment The side slope surface image of image capture device (2) collection is processed, and calculates tNThe image phase of monitored area described in the moment Like degree X1,2…K(tN)；Wherein, N is positive integer and N >=n, and wherein n is positive integer and tnMoment is tNMoment as described before monitoring section The generation moment of domain last time Light deformation；
Step 402, Light deformation judge：The t that will be calculated in step 401NThe image similarity of monitored area described in the moment X1,2…K(tN), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment：Work as X1,2…K (tM) and tnMoment is to tNWhen difference in moment between the image similarity of monitored area described in each moment is no more than ε, explanation From tnMoment is to tNLight deformation in monitored area described in the moment, afterwards return to step 401 there is no, and next sampling instant is gathered Side slope surface image processed；Otherwise, t is illustratedNThere is Light deformation, described image processing equipment in monitored area described in the moment (1) control alarm unit (5) is alarmed, and the t to there is Light deformationNMoment and from t1Moment is to tNAlarmed described in moment single The alarm times of first (5) are recorded, afterwards into step 5；
Step 5, one or many repeat step four, continue to monitor to the monitored area.
7. according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 6, it is characterised in that：Step Before image processing equipment (1) described in rapid 302 controls alarm unit (5) to be alarmed, described image processing equipment (1) is also needed Pseudo- deformation judge module is called, to tMWhether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is judged, process It is as follows：
Step I-11, continuous monitoring：According to the method described in step 2021 to step 2024, to tM+1Moment is to tM+ETime chart As the side slope surface image of collecting device (2) collection is processed, and it is similar to calculate the image of monitored area described in each moment Degree X1,2…K(tF1)；Wherein, F1 is positive integer and F1=M+1~M+E；Wherein, tM+E-tM+1=Δ T；
Step II-12, pseudo- deformation judge：By tM+1Moment is to tM+EThe image similarity of monitored area described in each moment in moment X1,2…K(tF1), respectively with tDMoment is to tMThe image similarity of monitored area is compared described in each moment in moment：Work as X1,2…K (tF1) and tDMoment is to tMWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, t is illustratedM The Light deformation that monitored area described in moment occurs is true deformation, and now described image processing equipment (1) controls alarm unit (5) to enter Row alarm；Otherwise, t is illustratedMThe Light deformation that monitored area described in moment occurs deforms for pseudo-；
Before image processing equipment described in step 402 (1) controls alarm unit (5) to be alarmed, described image processing equipment (1) also need to call pseudo- deformation judge module, to tNWhether the Light deformation that monitored area described in the moment occurs is that pseudo- deformation is sentenced Disconnected, process is as follows：
Step I-21, continuous monitoring：According to the method described in step 2021 to step 2024, to tN+1Moment is to tN+ETime chart As the side slope surface image of collecting device (2) collection is processed, and it is similar to calculate the image of monitored area described in each moment Degree X1,2…K(tF2)；Wherein, F2 is positive integer and F2=N+1~N+E；Wherein, tM+E-tM+1=Δ T；
Step II-22, pseudo- deformation judge：By tN+1Moment is to tN+EThe image similarity of monitored area described in each moment in moment X1,2…K(tF2), respectively with tnMoment is to tNThe image similarity of monitored area is compared described in each moment in moment：Work as X1,2…K (tF2) and tnMoment is to tNWhen difference in moment between the image similarity of monitored area described in each moment is all higher than ε, t is illustratedN The Light deformation that monitored area described in moment occurs is true deformation, and now described image processing equipment (1) controls alarm unit (5) to enter Row alarm；Otherwise, t is illustratedNThe Light deformation that monitored area described in moment occurs deforms for pseudo-.
8. according to the side slope Light deformation monitoring method based on similarity decision criteria described in claim 6, it is characterised in that：Step Image processing equipment (1) described in rapid 302 control alarm unit (5) alarmed after, call elevation information comparison module, to from tDMoment is to tMThe elevation average value of the moment K analyzed area to be analyzed is compared respectively, and according to comparative result, obtains Go out tMThere is the region to be analyzed of Light deformation in the moment；Afterwards, described image processing equipment (1) output tMThere is Light deformation in the moment The numbering in region to be analyzed；
Wherein, from tDMoment is to tMThe moment K comparative approach all same of the elevation average value in the region to be analyzed；To from tD Moment is to tMMoment any one region to be analyzed elevation average value when being compared, by tMMoment the region to be analyzed elevation Average value respectively with tDMoment is to tM-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion；
After image processing equipment described in step 402 (1) controls alarm unit (5) to be alarmed, elevation information is called to compare mould Block, to from tnMoment is to tNThe elevation average value of moment K analyzed areas to be analyzed is compared respectively, and according to comparing As a result, t is drawnNThere is the region to be analyzed of Light deformation in the moment；Afterwards, described image processing equipment (1) output tNMoment occurs micro- The numbering in the region to be analyzed of deformation；
Wherein, from tnMoment is to tNThe moment K comparative approach all same of the elevation average value in the region to be analyzed；To from tn Moment is to tNMoment any one region to be analyzed elevation average value when being compared, by tNMoment the region to be analyzed elevation Average value respectively with tnMoment is to tN-1In moment each moment the region to be analyzed elevation average value carry out difference comparsion.
9. a kind of system for carrying out side slope Light deformation using side slope Light deformation monitoring method as claimed in claim 2, its feature exists In：Including K be laid in respectively the K digital projector (3) of the overlying regions to be analyzed, K described to K respectively treat point Analyse the image capture apparatus that the image in region is absorbed, the image being acquired to the side slope surface image of the monitored area Collecting device (2) and the image processing equipment (1) connected with image capture device (2), K described image pickup apparatus are CCD camera (4) and its connect with image capture device (2), K digital projectors (3) are and image processing equipment (1) connect；The K CCD camera (4) is laid in the K overlying regions to be analyzed respectively.
10. according to the system described in claim 9, it is characterised in that：The digital projector (3) and CCD camera (4) are respectively Positioned at the both sides top in the region to be analyzed.
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