CN105032953A - Fast sample plate calibration method of gamma-ray thickness gauge - Google Patents
Fast sample plate calibration method of gamma-ray thickness gauge Download PDFInfo
- Publication number
- CN105032953A CN105032953A CN201510507473.5A CN201510507473A CN105032953A CN 105032953 A CN105032953 A CN 105032953A CN 201510507473 A CN201510507473 A CN 201510507473A CN 105032953 A CN105032953 A CN 105032953A
- Authority
- CN
- China
- Prior art keywords
- thickness
- model
- value
- silicon steel
- gamma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
A fast sample plate calibration method of a gamma-ray thickness gauge is mainly used for detecting the thickness of silicon steel. The method comprises the steps that 1, physical measurement is carried out on silicon steel sample plates of different thicknesses to obtain the absolute thickness values of the sample plates of all the thicknesses; 2, the silicon steel sample plates of the different thicknesses are manually measured on the gamma-ray thickness gauge one to five times, and the average manual measurement thickness value is calculated; 3, the thickness deviation value of the sample plates is calculated; 4, a compensation factor is determined, and meets the conditions that the absolute value of the thickness deviation value of the silicon steel sample plates with the thickness of 0.5 mm is not larger than 3 micrometers, and the absolute value of the thickness deviation value of the silicon steel sample plates of other thicknesses is not larger than 6 micrometers; and 5, the compensation factor is stored and calibrated on the gamma-ray thickness gauge. Calibration time ranges from 45 minutes to 1 hour; the number of times of starting a radiation source is 1/5 of original calibration time; calibration precision is higher than calibration of an original procedure; and the thickness quality of finished steel plates is improved.
Description
Technical field
The invention belongs to metal detection automatic field, mainly for detection of silicon steel thickness.Described gamma thickness gauge is the gamma thickness gauge that U.S. DMC (Rui Mei) company produces.
Background technology
Sendzimir mill is reversible cold-rolling 20 roller mill, it is the reciprocal rolling of 0.5mm finished product volume needs 5 passage by the silicon steel stock roll rolling of 2.6mm thickness, in the operation of rolling, thickness feedback is the gamma thickness gauge that U.S. DMC (Rui Mei) company produces, entrance and exit respectively has a C type frame, is provided with the identical source of penetrating of two covers and ionization reception amplifier.
Owing to being reciprocal rolling, calibrator needs the steel plate measuring different steel grade different-thickness, for ensureing detect thickness precision, must demarcate all models of different steel grade different-thickness, obtain different penalty coefficients after demarcation, during steel rolling, the voltage signal of ionisation chamber survey time and penalty coefficient calculate, and obtain steel plate actual (real) thickness value of feedback and deviate, realize closed loop thickness with rolling mill screwdown to control, roll out the steel plate of required thickness.
Because a kind of steel grade only has a penalty coefficient, so penalty coefficient can not meet full depth certainty of measurement (different-thickness is different with constituent content correlation source absorptivity).
Existing scaling method is: C type frame is placed 5,2.6mm--0.5mm identical steel grade different-thickness standard detection model (reference instrument is measured and demarcated well), each model demarcates 5 times, calibrator software calculation compensation coefficient mean value is also preserved, then each model is measured, observe thickness feedback value, as deviation re-executes calibrating procedure more greatly, until measure identical steel grade different-thickness model thickness deviation≤± 6 μm to think qualified, two C type frame survey calculation respectively, each steel grade is survey calculation respectively, can not obscure and intert.
Need manually to place model in above-mentioned calibration process to measure, must strictly confirm to prevent radiohazard.Each new steel clock nominal time reaches 3 hours.Along with the increase of high grade silicon steel kind and output, high grade silicon steel silicone content is higher, the small change of composition on demarcation success rate and certainty of measurement impact comparatively large, above-mentioned stated accuracy and nominal time can not adapt to high grade silicon steel thickness qualities and output.
Summary of the invention
In order to reduce the nominal time and improve stated accuracy, the invention provides gamma thickness gauge model quick calibrating method.
Technical scheme of the present invention: gamma thickness gauge model quick calibrating method, comprises the steps:
(1) also carrying out physical measurement to 0.5mm thickness and other thickness silicon steel model respectively obtains each thickness model absolute thickness value with other thickness silicon steel model to gather 0.5mm thickness;
(2) respectively 0.5mm thickness and other thickness silicon steel model are carried out 1 ~ 5 manual measurement on gamma thickness gauge, and calculate average manual measurement one-tenth-value thickness 1/10; Wherein 0.5mm thickness silicon steel model carries out 5 manual measurements on gamma thickness gauge; Other thickness silicon steel model carries out 1 ~ 2 manual measurement on gamma thickness gauge;
(3) calculate: model thickness deviation values=average manual measurement one-tenth-value thickness 1/10-model absolute thickness value;
(4) according to formula: model detect thickness value=penalty coefficient+ionisation chamber measuring voltage conversion value, determine penalty coefficient, penalty coefficient meets:
Thickness is that the absolute value of the silicon steel model thickness deviation values of 0.5mm is not more than 3 μm and the absolute value of other thickness model thickness deviation values is not more than 6 μm;
(5) on gamma thickness gauge, calibration compensation coefficient is preserved.
Ionisation chamber measuring voltage conversion value is after gamma-rays penetrates model, and the detect thickness value that ionisation chamber is converted to, it is obtained automatically by gamma thickness gauge program computation.
The silicon steel model of other thickness model described to be thickness be respectively 0.6mm, 1.0mm, 1.8mm, 2.6mm.
Other thickness model is the thickness of the pony-roughing pass of final product thickness 0.5mm model.
Determine that the method for penalty coefficient is: first setting compensation coefficient, if setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10 ≠ model detect thickness value, calculate again after adjustment setting compensation coefficient next time; So repeatedly calculate; Until setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10=model detect thickness value, this is optimum state.
Nominal time of the present invention is 45 minutes ~ 1 hour, and the source opening times of penetrating is 1/5 of the former nominal time, and stated accuracy is demarcated high than original program, improves finished steel plate thickness qualities thus reduces the production accidents such as the broken belt caused because thickness measure precision is low.
Detailed description of the invention
For 50W310 high grade silicon steel, model thickness is 0.5240mm, for ensureing finished product thickness precision, carries out manual Accurate Calibration according to 0.5240mm model.Its pony-roughing pass thickness is 2.6mm, 1.8mm, 1.0mm, 0.6mm respectively.
1, carry out at gamma thickness gauge operation interface the silicon steel model 5 times that manual measurement thickness is 0.5240mm, obtain 5 model detect thickness values, then by after 5 model detect thickness values summations except in 5=average measured thickness value;
2, the average measured thickness value of silicon steel and the absolute thickness value of 0.5240mm model are compared, obtain model thickness deviation values (i.e. model thickness deviation values=average measured thickness value-model absolute thickness value); Wherein the absolute thickness value of 0.5240mm model is that room physical measurement by experiment obtains; If the absolute value of model thickness deviation values is not more than 3 μm perform the 4th step; The model of other thickness is demarcated (performing the 3rd step);
If the absolute value of 0.5240mm model thickness deviation values is greater than 3 μm, repeatedly compensate coefficient setting, adjustment penalty coefficient is till the absolute value meeting model thickness deviation values is not more than 3 μm of requirements;
Penalty coefficient setting principle: first setting compensation coefficient, if setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10 ≠ model detect thickness value; Calculate again after adjustment (increase or reduce) setting compensation coefficient next time; So repeatedly calculate; Until setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10=model detect thickness value; Model detect thickness value is the instant measured value of gamma thickness gauge.
3, detect thickness is 0.6mm, 1.0mm, 1.8mm, 2.6mm silicon steel model respectively:
Carry out at gamma thickness gauge operation interface the silicon steel model 1 time that manual measurement thickness is 0.6mm, obtain model thickness measurements;
When the absolute value of model thickness measurements-model absolute thickness value is not more than 6 μm, determine penalty coefficient according to penalty coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10=model detect thickness value;
When the absolute value of model thickness measurements-model absolute thickness value is greater than 6 μm, repeatedly carry out adjustment penalty coefficient till the absolute value meeting model thickness deviation values is not more than 6 μm of requirements;
4, when the absolute value of 0.5240mm model thickness deviation values is less than 3 μm and the absolute value of 0.6mm, 1.0mm model thickness deviation values is less than 6 μm and the absolute value of 1.8mm model thickness deviation values is less than 6 μm and the absolute value of 2.6mm model thickness deviation values is less than 6 μm time setting compensation coefficient, be the calibration compensation coefficient of gamma thickness gauge.
The left calibrator penalty coefficient finally determining silicon steel model gamma thickness gauge is 1.0670; Right calibrator penalty coefficient is 1.0590;
4, input corresponding steel total number and Modify password and preserve, Fast Calibration 50W310 high grade silicon steel terminates.
0W350,50W290,50W270 demarcate identical with the method.
The left calibrator penalty coefficient of the silicon steel trade mark to be the thickness of 50W270 the be gamma thickness gauge of 0.4808mm is 1.0795; Right calibrator penalty coefficient is 1.0770.The silicon steel model penalty coefficient of other trade mark is identical with 50W310 high grade silicon steel, does not tire out and states.
Claims (3)
1. gamma thickness gauge model quick calibrating method, is characterized in that comprising the steps:
(1) gather 0.5mm thickness and other thickness silicon steel model respectively and physical measurement is carried out to 0.5mm thickness and other thickness silicon steel model and obtain each thickness model absolute thickness value;
(2) respectively 0.5mm thickness and other thickness silicon steel model are carried out 1 ~ 5 manual measurement on gamma thickness gauge, and calculate average manual measurement one-tenth-value thickness 1/10; Wherein 0.5mm thickness silicon steel model carries out 5 manual measurements on gamma thickness gauge; Other thickness silicon steel model carries out 1 ~ 2 manual measurement on gamma thickness gauge;
(3) calculate: model thickness deviation values=average manual measurement one-tenth-value thickness 1/10-model absolute thickness value;
(4) according to formula: model detect thickness value=penalty coefficient+ionisation chamber measuring voltage conversion value, determine penalty coefficient, wherein penalty coefficient meets:
Thickness is that the absolute value of the silicon steel model thickness deviation values of 0.5mm is not more than 3 μm and the absolute value of other thickness model thickness deviation values is not more than 6 μm;
(5) on gamma thickness gauge, calibration compensation coefficient is preserved.
2. gamma thickness gauge model quick calibrating method according to claim 1, it is characterized in that the method determining penalty coefficient is: first setting compensation coefficient, if setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10 ≠ model detect thickness value, calculates after adjustment setting compensation coefficient more next time; So repeatedly calculate; Until setting compensation coefficient+ionisation chamber measuring voltage conversion one-tenth-value thickness 1/10=model detect thickness value.
3. gamma thickness gauge model quick calibrating method according to claim 1, is characterized in that other thickness high grade silicon steel model described is 0.6mm, 1.0mm, 1.8mm, 2.6mm silicon steel model respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510507473.5A CN105032953B (en) | 2015-08-19 | 2015-08-19 | Fast sample plate calibration method of gamma-ray thickness gauge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510507473.5A CN105032953B (en) | 2015-08-19 | 2015-08-19 | Fast sample plate calibration method of gamma-ray thickness gauge |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105032953A true CN105032953A (en) | 2015-11-11 |
| CN105032953B CN105032953B (en) | 2017-04-26 |
Family
ID=54440254
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510507473.5A Active CN105032953B (en) | 2015-08-19 | 2015-08-19 | Fast sample plate calibration method of gamma-ray thickness gauge |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105032953B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107702667A (en) * | 2017-10-26 | 2018-02-16 | 武钢新日铁（武汉）镀锡板有限公司 | A kind of method for building up of new X-ray thickness gauge material compensation system |
| CN108645357A (en) * | 2018-05-15 | 2018-10-12 | 中冶宝钢技术服务有限公司 | Profile gauge automatic calibration device and scaling method |
| CN115096756A (en) * | 2022-07-27 | 2022-09-23 | 浙江双元科技股份有限公司 | Self-calibration surface density detector and calibration method thereof |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1597010A (en) * | 1977-02-03 | 1981-09-03 | Sangamo Weston | Non-contacting gage apparatus and method |
| GB2114732B (en) * | 1982-02-12 | 1985-10-02 | Tokyo Shibaura Electric Co | Non-contact radiation thickness gauge |
| CN102022987A (en) * | 2009-09-11 | 2011-04-20 | 株式会社东芝 | Radiation thickness gauge |
| CN102564361A (en) * | 2011-11-18 | 2012-07-11 | 北京金自天正智能控制股份有限公司 | Ray-type thickness gauge and calibration method thereof |
-
2015
- 2015-08-19 CN CN201510507473.5A patent/CN105032953B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1597010A (en) * | 1977-02-03 | 1981-09-03 | Sangamo Weston | Non-contacting gage apparatus and method |
| GB2114732B (en) * | 1982-02-12 | 1985-10-02 | Tokyo Shibaura Electric Co | Non-contact radiation thickness gauge |
| CN102022987A (en) * | 2009-09-11 | 2011-04-20 | 株式会社东芝 | Radiation thickness gauge |
| CN102564361A (en) * | 2011-11-18 | 2012-07-11 | 北京金自天正智能控制股份有限公司 | Ray-type thickness gauge and calibration method thereof |
Non-Patent Citations (2)
| Title |
|---|
| 宁芳青: "高性能伽马射线测厚仪的数据采集与处理系统设计", 《自动化与仪器仪表》 * |
| 邢一: "比利时IRM TVXR- 1- N 测厚仪简介及校准技术", 《科学之友》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107702667A (en) * | 2017-10-26 | 2018-02-16 | 武钢新日铁（武汉）镀锡板有限公司 | A kind of method for building up of new X-ray thickness gauge material compensation system |
| CN107702667B (en) * | 2017-10-26 | 2019-12-17 | 武钢新日铁（武汉）镀锡板有限公司 | method for establishing material compensation system of novel X-ray thickness gauge |
| CN108645357A (en) * | 2018-05-15 | 2018-10-12 | 中冶宝钢技术服务有限公司 | Profile gauge automatic calibration device and scaling method |
| CN115096756A (en) * | 2022-07-27 | 2022-09-23 | 浙江双元科技股份有限公司 | Self-calibration surface density detector and calibration method thereof |
| CN115096756B (en) * | 2022-07-27 | 2022-11-22 | 浙江双元科技股份有限公司 | Self-calibration surface density detector and calibration method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105032953B (en) | 2017-04-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105032953A (en) | Fast sample plate calibration method of gamma-ray thickness gauge | |
| CN104475462B (en) | A kind of on-line correction device and method of X-ray thickness gauge | |
| CN201455009U (en) | X-ray thickness gauge with automatic alloy compensation function | |
| CN105057369B (en) | Calibration method and device of centering precision of side guide plates of finishing mill | |
| CN103048653B (en) | Micro pulse lidar system constant calibration method | |
| CN108421832B (en) | Method and device for calibrating inlet side guide plate of finishing mill | |
| CN110146915B (en) | Low-activity gamma energy spectrum multimodal spectrum stabilization method | |
| CN105107849B (en) | A kind of hot continuous rolling workpiece thickness computational methods | |
| CN102397886B (en) | System for correcting plate detection error due to transverse temperature difference of cold-rolled strip | |
| CN109141611A (en) | A kind of self-supervisory method of coil of strip weight | |
| CN106424156A (en) | Cold tandem mill thickness control system and thickness control method of cold tandem mill process | |
| CN102286751B (en) | Method for judging pickling speed in cold rolling pickling technology | |
| CN109382414B (en) | Method for controlling edge shape defects of cold-rolled strip steel | |
| CN105372695A (en) | Nuclear spectrum single energy peak Gaussian function weighting least square fitting method | |
| CN116539463B (en) | Concrete strength detection method | |
| CN111400928B (en) | Rolling force compensation method and device based on multiple regression | |
| CN107520259B (en) | A kind of cold rolling new steel grade resistance of deformation coefficient rapid correction method | |
| CN103934287B (en) | A kind of method of accurate measurement finish rolling outlet steel plate width | |
| CN116008308A (en) | Improved sky-tilt curve calibration method and calibration device for microwave radiometer | |
| JP2012217994A (en) | Steel plate rolling control method, apparatus and program | |
| JP6031857B2 (en) | Radiation measurement method | |
| CN113009544A (en) | Method for judging peak range of radionuclide in seawater | |
| CN105136071A (en) | Method for correcting effective area method data measurement | |
| EP3035082B1 (en) | Method for measuring x-ray energy of an accelerator in an inspection system | |
| JPH0225210A (en) | Wedge control method in hot rolling |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |