CN104991103B - A kind of precision glass fixed grid test machine - Google Patents
A kind of precision glass fixed grid test machine Download PDFInfo
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- CN104991103B CN104991103B CN201510385201.2A CN201510385201A CN104991103B CN 104991103 B CN104991103 B CN 104991103B CN 201510385201 A CN201510385201 A CN 201510385201A CN 104991103 B CN104991103 B CN 104991103B
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Abstract
The invention discloses a kind of precision glass fixed grid test machines, including the electrode detection mechanism that can be detected simultaneously in multiple detection zones to multiple glass to be measured, multiple comparison amplifiers of connection, and the single-chip microcontroller connecting with the multiple comparison amplifier are matched with the output end of each detection zone in the electrode detection mechanism.Precision glass fixed grid test machine of the present invention, the defects of can overcoming in the prior art that stability is poor, precision is low and is at high cost, to realize that stability is good, precision is high and advantage at low cost.
Description
Technical field
The present invention relates to field of mechanical technique, and in particular, to a kind of precision glass fixed grid test machine.
Background technique
Precision glass fixed grid is the gauge of the digital display reading Pyrex material on measurer, it has, and precision is high, reading
Stablize, thermal stability is good, weatherproof, the leading level in the world.
Precision glass fixed grid has hundreds of to thousands of sensing electrode units, and thickness of electrode is small (about 300 nanometers), electrode spacing
Small (several microns -- tens microns), line is thin (several microns -- tens microns), is easy to appear adhesion, micro-short circuit between electrode, can make
It is unstable at gauge reading accuracy decline.
Original method: 1, checking respectively for each sensing electrode unit with microscope, 2, surveyed between adjacent electrode respectively, electrode connects
Line resistance value.Two methods efficiency is extremely low, is easy to appear erroneous judgement to micro-force sensing (conductive film is carved incomplete adjacent electrode), visitor
Family is low using the online qualification rate of product, high production cost.
In the implementation of the present invention, inventor's discovery at least have that stability is poor, precision is low in the prior art and at
The defects of this is high.
Summary of the invention
It is an object of the present invention in view of the above-mentioned problems, a kind of precision glass fixed grid test machine be proposed, to realize stability
Good, precision height and advantage at low cost.
To achieve the above object, the technical solution adopted by the present invention is that: a kind of precision glass fixed grid test machine, including can
The electrode detection mechanism that multiple glass to be measured are detected simultaneously in multiple detection zones, in the electrode detection mechanism
Multiple comparison amplifiers of the output end matching connection of each detection zone, and the list being connect with the multiple comparison amplifier
Piece machine.
Further, the electrode detection mechanism, the platform including glass plate to be measured can be adsorbed, on the platform simultaneously
Row is provided with multiple detection zones for adsorbing multiple glass plates to be measured, is equipped in the same end of the multiple detection zone
For gland multiple glass same ends to be measured insulation board, and be fixedly installed on the insulation board with it is each to be measured
Multiple probes that glass plate present position matches.
Further, between the insulation board and glass plate to be measured, the product being additionally provided with close to glass plate to be measured is cut
The diaphragm plate of line setting, and the electrode layer being located on the diaphragm plate；
Several probes in same detection zone, connect with the input terminal of the comparison amplifier with relevant voltage respectively；Each to
Survey glass plate sucked on platform, each probe be respectively aligned to glass plate to be detected corresponding detection zone start position,
And press to reliable contacts glass surface；Platform starts sliding until corresponding detection zone end, and the detection zone is all adjacent
When occurring between electrode adhesion and/or micro-short circuit phenomenon between electrode between respective electrode when correspondent probe is tested to preset times, than
There is voltage change compared with amplifier in, comparison amplifier output end has output, and single-chip microcontroller records comparison amplifier input terminal
There is corresponding position when voltage change in corresponding detection zone, filters out corresponding glass plate to be measured.
Further, the electrode layer includes multiple SEG layers be arranged being matched with multiple detection zones, and be located at each
AB layer in SEG layers；The multiple probe is located proximate to AB layers of setting on insulation board.
Further, the platform is specially capable of the vacuum platform of linear slide.
The precision glass fixed grid test machine of various embodiments of the present invention, due to include can be in multiple detection zones to multiple
The electrode detection mechanism that glass to be measured is detected simultaneously, matches company with the output end of each detection zone in electrode detection mechanism
The multiple comparison amplifiers connect, and the single-chip microcontroller being connect with multiple comparison amplifiers；It is steady in the prior art so as to overcome
Qualitative defect poor, precision is low and at high cost, to realize that stability is good, precision is high and advantage at low cost.
Other features and advantages of the present invention will be illustrated in the following description, also, partly becomes from specification
It obtains it is clear that understand through the implementation of the invention.
Below by drawings and examples, technical scheme of the present invention will be described in further detail.
Detailed description of the invention
Attached drawing is used to provide further understanding of the present invention, and constitutes part of specification, with reality of the invention
It applies example to be used to explain the present invention together, not be construed as limiting the invention.In the accompanying drawings:
Fig. 1 is glass fixed grid localizing electrode and trace-diagram in the present invention；In Fig. 1, arrow indicates that glass is mobile when test
Direction；
Fig. 2 is the partial enlargement diagram in the portion A in Fig. 1；
Fig. 3 is the partial enlargement diagram in the portion C in Fig. 2；
Fig. 4 is platform, glass, insulation board and probe schematic diagram in the present invention；In fig 2 it is indicated by arrows that glass when test
Moving direction；
Fig. 5 is the partial enlargement diagram in the portion B in Fig. 4.
In conjunction with attached drawing, appended drawing reference is as follows in the embodiment of the present invention:
1- diaphragm plate；AB layer (uniform electric field layer) in 2- electrode layer；3- probe；SEG layer (signal electrode in 4- electrode layer
Layer)；5- product cutting line；6- platform；7- glass plate；8- insulation board.
Specific embodiment
Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings, it should be understood that preferred reality described herein
Apply example only for the purpose of illustrating and explaining the present invention and is not intended to limit the present invention.
According to embodiments of the present invention, as Figure 1-Figure 5, a kind of precision glass fixed grid test machine is provided.
The precision glass fixed grid test machine of the present embodiment, including can be same to multiple glass to be measured in multiple detection zones
The electrode detection mechanism of Shi Jinhang detection, multiple ratios of connection are matched with the output end of each detection zone in electrode detection mechanism
Compared with amplifier, and the single-chip microcontroller being connect with multiple comparison amplifiers.
Wherein, electrode detection mechanism, the platform (such as platform 6) including that can adsorb glass plate to be measured are parallel on platform
Multiple detection zones for adsorbing multiple glass plates to be measured (such as glass plate 7) are provided with, in the same side of multiple detection zones
Portion is equipped with the insulation board (such as insulation board 8) for gland in multiple glass same ends to be measured, and fixation is set on insulation board
It is equipped with the multiple probes (such as probe 3) to match with each glass plate present position to be measured.The platform, specially being capable of straight line cunning
Dynamic vacuum platform.
Between insulation board and glass plate to be measured, it is additionally provided with product cutting line (such as product cutting close to glass plate to be measured
Line 5) setting diaphragm plate (such as diaphragm plate 1), and the electrode layer being located on diaphragm plate；Electrode layer includes matching to set with multiple detection zones
Multiple SEG layers (such as SEG layers 4) set, and the AB layer (such as AB layer 2) being located in SEG layers each；Multiple probes are on insulation board
Be located proximate to AB layers setting.Several probes in same detection zone, respectively with the input terminal of the comparison amplifier with relevant voltage
Connection；Each glass plate to be measured is sucked on platform, and each probe is respectively aligned to glass plate to be detected in corresponding detection zone
Start position and press to reliable contacts glass surface；Platform starts sliding until corresponding detection zone end, the detection zone
Occur adhesion and/or micro-short circuit between electrode between all adjacent electrodes in domain between respective electrode when correspondent probe is tested to preset times
When phenomenon, there is voltage change in comparison amplifier input terminal, and comparison amplifier output end has output, and single-chip microcontroller record compares amplification
There is corresponding position when voltage change in corresponding detection zone in device input terminal, filters out corresponding glass plate to be measured.
In the inventive solutions, a plurality of probe presses product specification, takes matching position to be fixed on insulation board, is producing
In product examine survey, it is multi-product while tests, each product has a corresponding detection zone, several probes difference in same detection zone
It is connect with band relevant voltage (several hundred kilohms to one megohm of high internal resistance) comparison amplifier input terminal, product to be measured is sucked
Can be on linear slide vacuum platform, probe is respectively aligned to need region starting point (contraposition) to be tested, and pushes reliable contacts glass
Surface, platform start sliding until (spacing less than 0.5MM) all between product test area distal, all adjacent electrodes of detection zone
There is probe test to twice, once there is adhesion between electrode, micro-short circuit, voltage change occurs in comparison amplifier input terminal, amplification
Device has output, and single-chip microcontroller records bad position, and makes marks；Due to being multiple product full pages while testing, in full page product
It after cutting into monolithic product, will be selected containing the product that bad position marks, remaining is qualified product.
In the inventive solutions, precision glass fixed grid test machine, using the continuous dynamic acquisition of multiple spot information, fecund
Product are tested simultaneously, and test information automatically analyzes, and bad point memory, bad product is read automatically；Efficiency improves 100 times or more (detection limits
Greater than 30000/day), the online qualification rate of product improves 10 times (fraction defective is less than 0.1%), and unit product production cost is low.
The characteristics of technical solution of the present invention:
Precision glass fixed grid test machine: a plurality of probe, the continuous dynamic acquisition of multiple spot information, multi-product are tested simultaneously；Probe
Location parameter, by voltage, equal high-resistance power supply is not fed each probe respectively in same detection zone.
Finally, it should be noted that the foregoing is only a preferred embodiment of the present invention, it is not intended to restrict the invention,
Although the present invention is described in detail referring to the foregoing embodiments, for those skilled in the art, still may be used
To modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features.
All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in of the invention
Within protection scope.
Claims (3)
1. a kind of precision glass fixed grid test machine, which is characterized in that including can be in multiple detection zones to multiple glass to be measured
The electrode detection mechanism that glass is detected simultaneously, matches connection with the output end of each detection zone in the electrode detection mechanism
Multiple comparison amplifiers, and the single-chip microcontroller being connect with the multiple comparison amplifier；
The electrode detection mechanism, the platform including that can adsorb glass plate to be measured, is provided with parallel is used on the platform
The multiple detection zones for adsorbing multiple glass plates to be measured are equipped with for gland in the same end of the multiple detection zone more
The insulation board of a glass same end to be measured, and be fixedly installed and position locating for each glass plate to be measured on the insulation board
Set the multiple probes to match；
Between the insulation board and glass plate to be measured, it is additionally provided with the diaphragm plate being arranged close to the product cutting line of glass plate to be measured,
And it is located at the electrode layer on the diaphragm plate；
Several probes in same detection zone, connect with the input terminal of the comparison amplifier with relevant voltage respectively；Each glass to be measured
Glass plate is sucked on platform, and each probe is respectively aligned to glass plate to be measured in the start position of corresponding detection zone and pushes
To reliable contacts glass pane surface to be measured；Platform starts sliding until corresponding detection zone end, and the detection zone is all adjacent
Correspondent probe test preset times compare once occurring adhesion and/or micro-short circuit phenomenon between electrode between respective electrode between electrode
There is voltage change in amplifier in, and comparison amplifier output end has output, and single-chip microcontroller record comparison amplifier input is brought out
Corresponding position when existing voltage change in corresponding detection zone filters out corresponding glass plate to be measured.
2. the precision glass fixed grid test machine according to claim 1, which is characterized in that the electrode layer include with it is multiple
Multiple SEG layers of detection zone matching setting, and the AB layer being located in SEG layers each；The multiple probe is in insulation board
On be located proximate to AB layers setting.
3. precision glass fixed grid test machine according to claim 1 or 2, which is characterized in that the platform specially can
The vacuum platform of linear slide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510385201.2A CN104991103B (en) | 2015-07-03 | 2015-07-03 | A kind of precision glass fixed grid test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510385201.2A CN104991103B (en) | 2015-07-03 | 2015-07-03 | A kind of precision glass fixed grid test machine |
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| Publication Number | Publication Date |
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| CN104991103A CN104991103A (en) | 2015-10-21 |
| CN104991103B true CN104991103B (en) | 2019-02-26 |
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| CN201510385201.2A Active CN104991103B (en) | 2015-07-03 | 2015-07-03 | A kind of precision glass fixed grid test machine |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03156492A (en) * | 1989-11-15 | 1991-07-04 | Fujitsu Ltd | Method for inspecting inter-electrode short circuit |
| JP2007278943A (en) * | 2006-04-10 | 2007-10-25 | Nippon Electric Glass Co Ltd | Method and apparatus for inspecting substrate, and method and apparatus for repairing substrate |
| CN201387525Y (en) * | 2009-03-04 | 2010-01-20 | 深圳市宇顺电子股份有限公司 | Device for testing baseplate of liquid crystal display |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN202330608U (en) * | 2011-11-16 | 2012-07-11 | 东莞市润华光电有限公司 | Short circuit detector for big sheets of indium tin oxide (ITO) glass |
| CN202599892U (en) * | 2012-05-03 | 2012-12-12 | 深圳市创益科技发展有限公司 | Automatic detection device for laser scribed lines of thin film solar cell |
| CN202770910U (en) * | 2012-09-21 | 2013-03-06 | 南京汇金锦元光电材料有限公司 | Sheet resistance testing device |
-
2015
- 2015-07-03 CN CN201510385201.2A patent/CN104991103B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03156492A (en) * | 1989-11-15 | 1991-07-04 | Fujitsu Ltd | Method for inspecting inter-electrode short circuit |
| JP2007278943A (en) * | 2006-04-10 | 2007-10-25 | Nippon Electric Glass Co Ltd | Method and apparatus for inspecting substrate, and method and apparatus for repairing substrate |
| CN201387525Y (en) * | 2009-03-04 | 2010-01-20 | 深圳市宇顺电子股份有限公司 | Device for testing baseplate of liquid crystal display |
| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN202330608U (en) * | 2011-11-16 | 2012-07-11 | 东莞市润华光电有限公司 | Short circuit detector for big sheets of indium tin oxide (ITO) glass |
| CN202599892U (en) * | 2012-05-03 | 2012-12-12 | 深圳市创益科技发展有限公司 | Automatic detection device for laser scribed lines of thin film solar cell |
| CN202770910U (en) * | 2012-09-21 | 2013-03-06 | 南京汇金锦元光电材料有限公司 | Sheet resistance testing device |
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| Publication number | Publication date |
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| CN104991103A (en) | 2015-10-21 |
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