CN104965164B - A kind of controllable silicon tester - Google Patents
A kind of controllable silicon tester Download PDFInfo
- Publication number
- CN104965164B CN104965164B CN201510405601.5A CN201510405601A CN104965164B CN 104965164 B CN104965164 B CN 104965164B CN 201510405601 A CN201510405601 A CN 201510405601A CN 104965164 B CN104965164 B CN 104965164B
- Authority
- CN
- China
- Prior art keywords
- circuit
- controllable silicon
- test
- commutator
- electric capacity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
A kind of controllable silicon tester of the present invention, including isolated buck transformer, static test circuit and dynamic test circuit, the dynamic test circuit includes rectification circuit, triggers circuit, commutator and display circuit, and the static test circuit includes current rectifying and wave filtering circuit and mu balanced circuit；The input of the isolated buck transformer is connected through insuring with power supply, input of its output end respectively with display circuit and current rectifying and wave filtering circuit is connected, and rectified circuit, triggers circuit are connected the output end of the display circuit with the not moved end of commutator side successively；The output end of the current rectifying and wave filtering circuit is connected through mu balanced circuit, indicator lamp and trigger switch with the not moved end of commutator opposite side successively, the connection end of the static test circuit and dynamic circuit is the cathode test end of controllable silicon, and the moved end of the commutator is respectively the anode test lead and control pole test lead of controllable silicon.It is small volume of the present invention, in light weight, controllable silicon is tested by way of static and dynamic is combined, its test is simple and reliable, not only increases the repair quality and operating efficiency of controllable silicon, while can effectively ensure that the safety of maintainer.
Description
Technical field
The present invention relates to controllable silicon technical field of measurement and test, and in particular to a kind of controllable silicon tester.
Background technology
Controllable silicon is called IGCT, is a kind of high power switch type semiconductor devices, have it is unidirectional, two-way, can turn off and light
The several types such as control, there is small volume, in light weight, efficiency high, long lifespan, easy to control, be widely used in controllable whole
The various occasions automatically controlled with the conversion of powerful electric energy such as stream, pressure regulation, inversion and noncontacting switch.Controllable silicon it is main
Parameter：Trigger voltage, trigger current, conducting electric current, conducting voltage etc. are typically measured by the tester of controllable silicon.
At present, the tester of the controllable silicon used on the market, the problems such as volume is big, heavy, hardly possible operates be present.It is and big
The tester of part controllable silicon is all to provide controllable silicon to trigger voltage and triggering electricity directly from civil power power taking for controllable silicon
Stream, not only for there is larger potential safety hazard in this way to take power, and its test process is numerous for amateur tester
It is trivial time-consuming.
The content of the invention
Controllable silicon tester simple, safe to use is tested the technical problem to be solved in the present invention is to provide a kind of.
In order to solve the above technical problems, the present invention uses following technical scheme：Including isolated buck transformer, static test
Circuit and dynamic test circuit, the dynamic test circuit include rectification circuit, triggers circuit, commutator and for showing
The display circuit of the connecting and disconnecting of the circuit, the static test circuit include current rectifying and wave filtering circuit and mu balanced circuit；The isolated buck
The input of transformer is connected with power supply through insuring, its output end input phase with display circuit and current rectifying and wave filtering circuit respectively
Even, the rectified circuit of output end of the display circuit is connected with the input of triggers circuit, the output end of the triggers circuit
It is connected with the not moved end of commutator side；The output end of the current rectifying and wave filtering circuit is connected with the input of mu balanced circuit, institute
The output end for stating mu balanced circuit is connected through indicator lamp and trigger switch with the not moved end of commutator opposite side successively, the static state
The connection end of test circuit and dynamic test circuit is the cathode test end of controllable silicon, and the moved end of the commutator is respectively can
Control the anode test lead and control pole test lead of silicon.
Further, the display circuit by load bulb and be connected in parallel on load bulb side voltmeter form.
Further, the rectification circuit includes commutation diode, and the triggers circuit includes unijunction transistor, resistance, electric capacity
And potentiometer；Negative electrode of the anode of first, second commutation diode respectively with the three, the 4th commutation diodes is connected, and first,
The negative electrode of two commutation diodes is connected with the not moved end of commutator, the anode of the three, the 4th commutation diode with it is controllable
The cathode test end of silicon is connected；One end of first resistor is connected between the second commutation diode and commutator, its other end
It is connected through potentiometer with one end of the 4th electric capacity, the other end of the 4th electric capacity is connected with the cathode test end of controllable silicon；The list
One base terminal of knot pipe is connected between commutator and first resistor through second resistance, and another base terminal of unijunction transistor is connected to
At node between potentiometer and the 4th electric capacity, cathode test end of the emitter stage through 3rd resistor and controllable silicon of the unijunction transistor
It is connected, the not moved end of the commutator is connected with the emitter stage of unijunction transistor.
Further, the current rectifying and wave filtering circuit includes commutation diode, electric capacity, and the mu balanced circuit is by three-terminal voltage-stabilizing pipe
Formed with the 3rd electric capacity；The anode of five, the 6th commutation diodes is connected with the cathode test end of controllable silicon, its negative electrode respectively with
The anode of seven, the 8th commutation diodes is connected, the negative electrode of the seven, the 8th commutation diode and the input of three-terminal voltage-stabilizing pipe
End is connected, and the control terminal of the three-terminal voltage-stabilizing pipe is connected with the cathode test end of controllable silicon, and the output end of three-terminal voltage-stabilizing pipe is through referring to
Show that lamp is connected with one end of trigger switch, the other end of the trigger switch is connected with the not moved end of commutator, the instruction
The output end of lamp is connected with the not moved end of commutator, the cathode test end of one end and controllable silicon of the first electric capacity and the second electric capacity
It is connected, its other end is connected at the node between the 8th commutation diode and three-terminal voltage-stabilizing pipe, one end of the 3rd electric capacity
It is connected with the cathode test end of controllable silicon, its other end is connected with the output end of three-terminal voltage-stabilizing pipe.
The beneficial effects of the invention are as follows：It is controllable silicon tester small volume of the present invention, in light weight, by dynamic test circuit
Forming with static test circuit, controllable silicon is tested by way of static and dynamic is combined, its test is simple and reliable,
The repair quality and operating efficiency of controllable silicon are not only increased, while can effectively ensure that the safety of maintainer.
Brief description of the drawings
Fig. 1 is the circuit block diagram of the present invention；
Fig. 2 is the circuit theory diagrams of the present invention.
Embodiment
The invention will be further described below in conjunction with the accompanying drawings.
As shown in figure 1, the controllable silicon tester of the present embodiment, including isolated buck transformer T, static test circuit and dynamic
State test circuit, dynamic test circuit include rectification circuit 1, triggers circuit 2, commutator 3 and for showing the connecting and disconnecting of the circuit
Display circuit, static test circuit includes current rectifying and wave filtering circuit 4 and mu balanced circuit 5；Isolated buck transformer T input warp
Insurance FU is connected with power supply, and in order to export different size of alternating voltage, isolated buck transformer T output end has two
Secondary windings, one of secondary windings are connected through display circuit with the input of rectification circuit, another secondary windings with it is whole
The input of stream filter circuit 4 is connected.The output end of rectification circuit 1 is connected with the input of triggers circuit 2, triggers circuit 2
Output end is connected with the not moved end of the side of commutator 3；The output end of current rectifying and wave filtering circuit 4 and the input phase of mu balanced circuit 5
Even, the output end of mu balanced circuit 5 is connected through indicator lamp HL and trigger switch SB with the not moved end of the opposite side of commutator 3 successively,
The connection end of static test circuit and dynamic test circuit is the cathode test end K of controllable silicon, and the moved end of commutator 3 is respectively
The anode test lead A and control pole test lead G of controllable silicon.
As shown in Fig. 2 display circuit is by load bulb EL and is connected in parallel on the voltmeter V at load bulb EL both ends and forms, should
Load bulb EL one end is connected with one end of an isolated buck transformer T secondary windings, the other end of the secondary windings
It is connected with rectification circuit 1.The rectification circuit 1 is made up of commutation diode V1, V2, V3 and V4, triggers circuit 2 by unijunction transistor V9,
Resistance R1, R3, R4, electric capacity C4 and potentiometer RP2 compositions；First, second commutation diode V1 and V2 anode is respectively with the 3rd
Commutation diode V3 and the 4th commutation diode V4 negative electrode are connected, the first commutation diode V1 and the second commutation diode V2's
Negative electrode is connected with the not moved end K2 of commutator 3, the 3rd commutation diode V3 and the 4th commutation diode V4 anode with it is controllable
The cathode test end K of silicon is connected；First resistor R1 one end is connected between the second commutation diode V2 and commutator 3, the
The one resistance R1 other ends are connected through potentiometer RP2 with the 4th electric capacity C4 one end, the 4th electric capacity C4 other end and controllable silicon
Cathode test end K is connected；Unijunction transistor V9 has two base terminals, and unijunction transistor V9 one of base terminal connects through second resistance R3
It is connected between commutator 3 and first resistor R1, unijunction transistor V9 another base terminal is connected to potentiometer RP2 and the 4th electric capacity C4
Between node at, unijunction transistor V9 emitter stage is connected through 3rd resistor R4 with the cathode test end K of controllable silicon, commutator 3
Not moved end K1 be connected with unijunction transistor V9 emitter stage.
As shown in Fig. 2 current rectifying and wave filtering circuit 4 is by commutation diode V5, V6, V7, V8, electric capacity C1 and C2 composition, voltage stabilizing electricity
Road 5 is made up of three-terminal voltage-stabilizing pipe V11 and the 3rd electric capacity C3；5th commutation diode V5 and the 6th commutation diode V6 anode with
The cathode test end K of controllable silicon is connected, its negative electrode anode with the 7th commutation diode V7 and the 8th commutation diode V8 respectively
It is connected, the 7th commutation diode V7 and the 8th commutation diode V8 negative electrode are connected with three-terminal voltage-stabilizing pipe V11 input, three ends
Voltage-stabiliser tube V11 control terminal is connected with the cathode test end K of controllable silicon, three-terminal voltage-stabilizing pipe V11 output end through indicator lamp HL with
Trigger switch SB one end is connected, and the trigger switch SB other end is connected with the not moved end K5 of commutator 3, and indicator lamp HL's is defeated
Go out end with the not moved end K6 of commutator 3 to be connected, the cathode test of the first electric capacity C1 and the second electric capacity C2 one end and controllable silicon
End K is connected, and its other end is connected at the node between the 8th commutation diode V8 and three-terminal voltage-stabilizing pipe V11, the 3rd electric capacity C3
One end be connected with the cathode test end K of controllable silicon, its other end is connected with three-terminal voltage-stabilizing pipe V11 output end.
Static test：Pass through three-terminal voltage-stabilizing after the rectified filter circuit 4 of 9V alternating voltages of isolated buck transformer T outputs
Pipe V11 and electric capacity C3 filtering, voltage stabilization in 5V, using the operating voltage as tested controllable silicon.Commutator 3 is pushed quiet
K3 and the K5 conducting at state test shelves K5 and K6 ends, then commutator, K4 and K6 conductings, the anode voltage of tested controllable silicon pass through K4
Turned on K6, then p-wire A connects with tested controllable silicon V10 anode, presses trigger button SB, and trigger voltage passes through K3 and survey
Examination line G is sent to tested controllable silicon V10 control pole, is now tested controllable silicon V10 by triggering and conducting, now indicator lamp HL is by point
It is bright, then illustrate that controllable silicon has been triggered conducting；When unclamping trigger button SB, indicator lamp HL is lasting bright, illustrates that controllable silicon can be protected
Handle conducting, it may be determined that tested controllable silicon does not damage.The purpose that design increases this static test circuit is low in order to test
The quality of the controllable silicon of voltage low current.
Dynamic is tested：The 65V alternating voltages of isolated buck transformer T outputs are sent to rectified circuit by loading bulb EL
1 and triggers circuit 2 in, in the positive half cycle of alternating current, commutating voltage is filled by first resistor R1 potentiometers RP2 to the 4th electric capacity C4
Electricity, when the voltage on the 4th electric capacity C4 reaches unijunction transistor V9 peak point voltages, unijunction transistor V9 is changed into turning on from ending, the 4th electric capacity
The voltage at C4 both ends is discharged rapidly by unijunction transistor V9 and 3rd resistor R4, now, a spike is obtained on 3rd resistor R4,
The spike is sent to tested controllable silicon V10 control as control signal by K1 the and K3 ends circuit-closing contacts of commutator 3
On extremely, so that tested controllable silicon V10 conductings.Tube voltage drop after tested controllable silicon V10 conductings is very low, generally less than 1V, triggering shake
Swing and be stopped；When alternating current passes through zero point, tested controllable silicon V10 is automatically shut down, and when alternating current negative half period, adjusts current potential
Device RP2 can change the 4th electric capacity C4 charging rate, you can change the length of tested controllable silicon V10 ON times, so as to control
Rectifier output voltage is made.When potentiometer RP2 be transferred to resistance it is larger when, the time that the 4th electric capacity C4 is flushed to peak point voltage is longer,
Therefore the conduction angle of tested controllable silicon is smaller, and the voltage of controlled rectification output is just low, and load bulb EL is dark, otherwise current potential
Device RP be transferred to resistance it is smaller when, be tested that the conduction angle of controllable silicon is bigger, the voltage of controlled rectification output is just high, loads bulb
EL is brighter.The purpose of this dynamic test circuit design is that the size of the tested controllable silicon V10 angles of flow is controlled by triggers circuit 2,
To realize that the dynamic to controllable silicon driving load ability is tested.Commutator 3 pushes dynamic test shelves, the K1 and K3 of commutator
Conducting, K2 and K4 are turned on, now K1 and K3 and K2 and K4 and p-wire and tested controllable silicon of the trigger voltage by commutator
V10 is connected, and is tested controllable silicon V10 now by triggering and conducting, is then adjusted potentiometer RP2, voltmeter V is with potentiometer RP2's
Adjust and indicate by the size of tune voltage, while load lamp shows bright or dark change also with potentiometer RP2 regulation, sees
Survey directly perceived.After two kinds of steps of summary are to controllable silica measurement, you can to determine the quality of tested controllable silicon.
Embodiment described above is only that the preferred embodiment of the present invention is described, not to the model of the present invention
Enclose and be defined, on the premise of design spirit of the present invention is not departed from, technical side of the those of ordinary skill in the art to the present invention
The various modifications and improvement that case is made, it all should fall into the protection domain of claims of the present invention determination.
Claims (4)
- A kind of 1. controllable silicon tester, it is characterised in that：Including isolated buck transformer（T）, static test circuit and dynamic survey Circuit is tried, the dynamic test circuit includes rectification circuit（1）, triggers circuit（2）, commutator（3）And for showing the electricity The display circuit of road break-make, the static test circuit include current rectifying and wave filtering circuit（4）And mu balanced circuit（5）；The isolation drop Pressure transformer（T）Input through insurance（FU）Be connected with power supply, its output end respectively with display circuit and current rectifying and wave filtering circuit （4）Input be connected, the rectified circuit of output end of the display circuit（1）With triggers circuit（2）Input be connected, institute State triggers circuit（2）Output end and commutator（3）The not moved end of side is connected；The current rectifying and wave filtering circuit（4）Output End and mu balanced circuit（5）Input be connected, the mu balanced circuit（5）Output end successively through indicator lamp（HL）And trigger switch （SB）With commutator（3）The not moved end of opposite side is connected, and the connection end of the static test circuit and dynamic test circuit is The cathode test end of controllable silicon（K）, the commutator（3）Moved end be respectively controllable silicon anode test lead（A）And control Pole test lead（G）.
- 2. controllable silicon tester according to claim 1, it is characterised in that：The display circuit is by load bulb（EL）And It is connected in parallel on load bulb（EL）The voltmeter at both ends（V）Composition.
- 3. controllable silicon tester according to claim 1, it is characterised in that：The rectification circuit（1）Including the pole of rectification two Pipe（V1；V2；V3；V4）, the triggers circuit（2）Including unijunction transistor（V9）, resistance（R1； R3；R4）, electric capacity（C4）And current potential Device（RP2）；First, second commutation diode（V1；V2）Anode respectively with the three, the 4th commutation diodes（V3；V4）The moon Extremely it is connected, first, second commutation diode（V1；V2）Negative electrode and commutator（3）Anode test lead（A）Corresponding not moved end K2 is connected, the three, the 4th commutation diode（V3 ；V4）Anode and controllable silicon cathode test end（K）It is connected；First Resistance（R1）One end be connected to the second commutation diode（V2）And commutator（3）Between, its other end is through potentiometer（RP2） With the 4th electric capacity（C4）One end be connected, the 4th electric capacity（C4）The other end and controllable silicon cathode test end（K）It is connected；It is described Unijunction transistor（V9）A base terminal through second resistance（R3）It is connected to commutator（3）And first resistor（R1）Between, unijunction transistor （V9）Another base terminal be connected to potentiometer（RP2）With the 4th electric capacity（C4）Between node at, the unijunction transistor（V9）'s Emitter stage is through 3rd resistor（R4）With the cathode test end of controllable silicon（K）It is connected, the commutator（3）Control pole test lead （G）Corresponding not moved end K1 and unijunction transistor（V9）Emitter stage be connected.
- 4. the controllable silicon tester according to claim 1 or 3, it is characterised in that：The current rectifying and wave filtering circuit（4）Including whole Flow diode（V5；V6；V7；V8）, electric capacity（C1、C2）, the mu balanced circuit（5）By three-terminal voltage-stabilizing pipe（V11）With the 3rd electric capacity （C3）Composition；Five, the 6th commutation diodes（V5；V6）Anode and controllable silicon cathode test end（K）It is connected, its negative electrode point Not with the seven, the 8th commutation diodes（V7；V8）Anode be connected, the seven, the 8th commutation diode（V7；V8）Negative electrode With three-terminal voltage-stabilizing pipe（V11）Input be connected, the three-terminal voltage-stabilizing pipe（V11）Control terminal and controllable silicon cathode test end （K）It is connected, three-terminal voltage-stabilizing pipe（V11）Output end through indicator lamp（HL）With trigger switch（SB）One end be connected, the triggering Switch（SB）The other end and commutator（3）Control pole test lead（G）Corresponding not moved end K5 is connected, the indicator lamp （HL）Output end and commutator（3）Anode test lead（A）Corresponding not moved end K6 is connected, the first electric capacity（C1）With the second electricity Hold（C2）One end and controllable silicon cathode test end（K）It is connected, its other end is connected to the 8th commutation diode（V8）With three Hold voltage-stabiliser tube（V11）Between node at, the 3rd electric capacity（C3）One end and controllable silicon cathode test end（K）It is connected, Its other end and three-terminal voltage-stabilizing pipe（V11）Output end be connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510405601.5A CN104965164B (en) | 2015-07-09 | 2015-07-09 | A kind of controllable silicon tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510405601.5A CN104965164B (en) | 2015-07-09 | 2015-07-09 | A kind of controllable silicon tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104965164A CN104965164A (en) | 2015-10-07 |
| CN104965164B true CN104965164B (en) | 2018-03-09 |
Family
ID=54219207
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510405601.5A Expired - Fee Related CN104965164B (en) | 2015-07-09 | 2015-07-09 | A kind of controllable silicon tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104965164B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109696613A (en) * | 2018-01-25 | 2019-04-30 | 陕西开尔文测控技术有限公司 | A kind of hand-held semi-conductor discrete device test device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3766475A (en) * | 1972-09-21 | 1973-10-16 | Honeywell Inf Systems | Silicon controlled rectifier tester |
| US7525777B2 (en) * | 2002-03-27 | 2009-04-28 | Tower Manufacturing Corporation | Fireguard circuit |
| CN202013404U (en) * | 2010-12-17 | 2011-10-19 | 杭州鸿雁电器有限公司 | Trigger tester of controlled silicon |
| CN203217045U (en) * | 2013-02-25 | 2013-09-25 | 翁策高 | Silicon controlled rectifier state tester |
| CN204256115U (en) * | 2014-11-20 | 2015-04-08 | 中国航空工业第六一八研究所 | A kind of thyristor checker |
| CN204903704U (en) * | 2015-07-09 | 2015-12-23 | 安徽淮化股份有限公司 | Silicon controlled rectifier tester |
-
2015
- 2015-07-09 CN CN201510405601.5A patent/CN104965164B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3766475A (en) * | 1972-09-21 | 1973-10-16 | Honeywell Inf Systems | Silicon controlled rectifier tester |
| US7525777B2 (en) * | 2002-03-27 | 2009-04-28 | Tower Manufacturing Corporation | Fireguard circuit |
| CN202013404U (en) * | 2010-12-17 | 2011-10-19 | 杭州鸿雁电器有限公司 | Trigger tester of controlled silicon |
| CN203217045U (en) * | 2013-02-25 | 2013-09-25 | 翁策高 | Silicon controlled rectifier state tester |
| CN204256115U (en) * | 2014-11-20 | 2015-04-08 | 中国航空工业第六一八研究所 | A kind of thyristor checker |
| CN204903704U (en) * | 2015-07-09 | 2015-12-23 | 安徽淮化股份有限公司 | Silicon controlled rectifier tester |
Non-Patent Citations (1)
| Title |
|---|
| 大功率晶闸管、整流管性能参数微机检测;华平 等;《机车车辆工艺》;20050831(第4期);第33-34页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104965164A (en) | 2015-10-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103399215B (en) | Phase-lack and low-voltage detection circuit for three-phase alternating current | |
| CN201218833Y (en) | Controlled silicon detection apparatus | |
| CN203164277U (en) | Overcurrent and overvoltage protection detection circuit | |
| WO2016086897A1 (en) | Current zero-crossing detection circuit and method, and load voltage detection circuit and method | |
| CN104965164B (en) | A kind of controllable silicon tester | |
| CN203896204U (en) | Direct-current voltage-stabilizing power supply having over-current adjusting and output stabilizing functions | |
| CN206673559U (en) | A kind of phase shortage monitoring and protecting circuit | |
| CN109239570A (en) | A kind of diode forward current surge experimental circuit | |
| CN204089158U (en) | A kind of novel shunt opening and device for under-voltage releasing equipment control circuit | |
| CN204903704U (en) | Silicon controlled rectifier tester | |
| CN205336141U (en) | Safety protection switch power supply circuit | |
| CN204481703U (en) | A kind of AC-DC change-over circuit | |
| CN203929900U (en) | Simple and easy three-phase power supply phase sequence indicator | |
| CN106602533A (en) | Overvoltage protection circuit used for power distribution cabinet | |
| CN204330872U (en) | The load voltage testing circuit of current zero-crossing point testing circuit and correspondence | |
| CN106300269A (en) | A kind of type voltage regulation overcurrent power-off indicating circuit | |
| CN207732658U (en) | A kind of synchronous rectification driving circuit for Switching Power Supply | |
| CN205385419U (en) | Dual output direct current adjustable power | |
| CN205490170U (en) | Full -automatic steady voltage controller | |
| CN203645582U (en) | Three-phase alternating current motor starting energy-saving device | |
| CN104348348B (en) | A kind of soft starting circuit | |
| CN204179980U (en) | A kind of generating set with voltage stabilization and current stabilization control circuit | |
| CN210201738U (en) | Positive and negative symmetrical stable power supply based on capacitance voltage reduction | |
| CN210092947U (en) | Controllable battery charger | |
| CN203522538U (en) | Adjustable DC voltage-stabilizing power circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210508 Address after: 234000 No. 157, Xichang Road, Suzhou, Anhui Patentee after: WANBEI COAL-ELECTRICITY GROUP Co.,Ltd. Address before: 232038 Anhui Province, Huainan city tianjia'an District Quanshan Patentee before: ANHUI HUAIHUA CHEMICAL GROUP Co.,Ltd. |
|
| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180309 Termination date: 20210709 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |