CN104965164A - Silicon controlled rectifier tester - Google Patents
Silicon controlled rectifier tester Download PDFInfo
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- CN104965164A CN104965164A CN201510405601.5A CN201510405601A CN104965164A CN 104965164 A CN104965164 A CN 104965164A CN 201510405601 A CN201510405601 A CN 201510405601A CN 104965164 A CN104965164 A CN 104965164A
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Abstract
The invention provides a silicon controlled rectifier tester comprising an isolation step-down transformer, a static test circuit and a dynamic test circuit. The dynamic test circuit comprises a rectification circuit, a trigger circuit, a double-throw switch and a display circuit. The static test circuit comprises a rectification filter circuit and a voltage-stabilizing circuit. The input end of the isolation step-down transformer is connected with a power supply via a fuse, and the output end is respectively connected with the input ends of the display circuit and the rectification filter circuit. The output end of the display circuit is connected with the fixed end of one side of the double-throw switch through the rectification circuit and the trigger circuit in turn. The output end of the rectification filter circuit is connected with the fixed end of the other side of the double-throw switch through the voltage stabilizing circuit, an indicating lamp and a trigger switch in turn. The connecting end of the static test circuit and the dynamic circuit is the cathode test end of a silicon controlled rectifier. The moving ends of the double-throw switch are respectively the anode test end and the control electrode test end of the silicon controlled rectifier. The silicon controlled rectifier tester is small in size and low in weight, and the silicon controlled rectifier is tested via a static and dynamic combination mode so that the test is simple and reliable, maintenance quality and working efficiency of the silicon controlled rectifier can be enhanced and safety of maintenance personnel can be effectively guaranteed.
Description
Technical field
The present invention relates to controllable silicon technical field of measurement and test, be specifically related to a kind of controllable silicon tester.
Background technology
Controllable silicon is thyristor again, it is a kind of high power switch type semiconductor devices, have unidirectional, two-way, can turn off and the several types such as light-operated, there is the advantages such as volume is little, lightweight, efficiency is high, the life-span is long, control is convenient, be widely used in the occasion of the various automatic controls such as controlled rectification, pressure regulation, inversion and noncontacting switch and the conversion of powerful electric energy.Silicon controlled major parameter: trigger voltage, trigger current, On current, forward voltage etc. are generally measured by silicon controlled testing tool.
At present, there is the problems such as volume is large, heavy, difficult operation in the silicon controlled testing tool used on the market.And most of silicon controlled testing tool is all directly from civil power power taking by controllable silicon, for controllable silicon provides trigger voltage and trigger current, not only there is larger potential safety hazard in this way to take power, and its test process is loaded down with trivial details time-consuming for amateur tester.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind ofly tests controllable silicon tester that is simple, use safety.
For solving the problems of the technologies described above, the present invention is by the following technical solutions: comprise insulate step-down transformer, static test circuit and dynamic test circuit, described dynamic test circuit comprises rectification circuit, trigger circuit, double throw switch and the display circuit for showing this connecting and disconnecting of the circuit, and described static test circuit comprises current rectifying and wave filtering circuit and mu balanced circuit; The input end of described insulate step-down transformer is connected with power supply through insurance, its output terminal is connected with the input end of current rectifying and wave filtering circuit with display circuit respectively, the output terminal of described display circuit is connected with the input end of trigger circuit through rectification circuit, and the output terminal of described trigger circuit is connected with the not moved end of double throw switch side; The output terminal of described current rectifying and wave filtering circuit is connected with the input end of mu balanced circuit, the output terminal of described mu balanced circuit is connected with the not moved end of double throw switch opposite side with trigger switch through pilot lamp successively, the link of described static test circuit and dynamic circuit is silicon controlled cathode test end, and the moved end of described double throw switch is respectively silicon controlled anode test lead and controls pole test lead.
Further, described display circuit is made up of load bulb and the voltage table that is connected in parallel on load bulb side.
Further, described rectification circuit comprises commutation diode, and described trigger circuit comprise unijunction transistor, resistance, electric capacity and potentiometer; The anode of first, second commutation diode described is connected with the negative electrode of the 3rd, the 4th commutation diode respectively, the negative electrode of first, second commutation diode is connected with the not moved end of double throw switch, and the anode of described 3rd, the 4th commutation diode is connected with silicon controlled cathode test end; One end of described first resistance is connected between the second commutation diode and double throw switch, and its other end is connected through potentiometer one end with the 4th electric capacity, and the other end of the 4th electric capacity is connected with silicon controlled cathode test end; One base terminal of described unijunction transistor is connected between double throw switch and the first resistance through the second resistance, another base terminal of unijunction transistor is connected to the Nodes between potentiometer and the 4th electric capacity, the emitter of described unijunction transistor is connected with silicon controlled cathode test end through the 3rd resistance, and the not moved end of described double throw switch is connected with the emitter of unijunction transistor.
Further, described current rectifying and wave filtering circuit comprises commutation diode, electric capacity, and described mu balanced circuit is made up of three-terminal voltage-stabilizing pipe and the 3rd electric capacity, described 5th, the anode of the 6th commutation diode is connected with silicon controlled cathode test end, its negative electrode is respectively with the 7th, the anode of the 8th commutation diode is connected, described 7th, the negative electrode of the 8th commutation diode is connected with the input end of three-terminal voltage-stabilizing pipe, the control end of described three-terminal voltage-stabilizing pipe is connected with silicon controlled cathode test end, the output terminal of three-terminal voltage-stabilizing pipe is connected with one end of trigger switch through pilot lamp, the other end of described trigger switch is connected with the not moved end of double throw switch, the output terminal of described pilot lamp is connected with the not moved end of double throw switch, described first electric capacity is connected with silicon controlled cathode test end with one end of the second electric capacity, its other end is connected to the Nodes between the 8th commutation diode and three-terminal voltage-stabilizing pipe, one end of described 3rd electric capacity is connected with silicon controlled cathode test end, its other end is connected with the output terminal of three-terminal voltage-stabilizing pipe.
The invention has the beneficial effects as follows: controllable silicon tester volume of the present invention is little, lightweight, be made up of dynamic test circuit and static test circuit, the mode combined by Static and dynamic is tested controllable silicon, its test is simple and reliable, not only increase silicon controlled repair quality and work efficiency, effectively can ensure the safety of maintainer simultaneously.
Accompanying drawing explanation
Fig. 1 is circuit block diagram of the present invention;
Fig. 2 is circuit theory diagrams of the present invention.
Embodiment
Below in conjunction with accompanying drawing, the invention will be further described.
As shown in Figure 1, the controllable silicon tester of the present embodiment, comprise insulate step-down transformer T, static test circuit and dynamic test circuit, dynamic test circuit comprises rectification circuit 1, trigger circuit 2, double throw switch 3 and the display circuit for showing this connecting and disconnecting of the circuit, and static test circuit comprises current rectifying and wave filtering circuit 4 and mu balanced circuit 5; The input end of insulate step-down transformer T is connected with power supply through insurance FU, in order to export the alternating voltage of different size, the output terminal of this insulate step-down transformer T has two secondary winding, one of them secondary winding is connected with the input end of rectification circuit through display circuit, and another secondary winding is connected with the input end of current rectifying and wave filtering circuit 4.The output terminal of rectification circuit 1 is connected with the input end of trigger circuit 2, and the output terminal of trigger circuit 2 is connected with the not moved end of double throw switch 3 side; The output terminal of current rectifying and wave filtering circuit 4 is connected with the input end of mu balanced circuit 5, the output terminal of mu balanced circuit 5 is connected with the not moved end of double throw switch 3 opposite side with trigger switch SB through pilot lamp HL successively, the link of static test circuit and dynamic circuit is silicon controlled cathode test end K, and the moved end of double throw switch 3 is respectively silicon controlled anode test lead A and controls pole test lead G.
As shown in Figure 2, display circuit is made up of load bulb EL and the voltage table V that is connected in parallel on load bulb EL two ends, one end of this load bulb EL is connected with one end of a secondary winding of insulate step-down transformer T, and the other end of this secondary winding is connected with rectification circuit 1.This rectification circuit 1 is made up of commutation diode V1, V2, V3 and V4, and trigger circuit 2 are by unijunction transistor V9, resistance R1, R3, R4, and electric capacity C4 and potentiometer RP2 forms; The anode of first, second commutation diode V1 with V2 is connected with the negative electrode of the 4th commutation diode V4 with the 3rd commutation diode V3 respectively, first commutation diode V1 is connected with the not moved end K2 of double throw switch 3 with the negative electrode of the second commutation diode V2, and the 3rd commutation diode V3 is connected with silicon controlled cathode test end K with the anode of the 4th commutation diode V4; One end of first resistance R1 is connected between the second commutation diode V2 and double throw switch 3, and the first resistance R1 other end is connected with one end of the 4th electric capacity C4 through potentiometer RP2, and the other end of the 4th electric capacity C4 is connected with silicon controlled cathode test end K; Unijunction transistor V9 has two base terminals, one of them base terminal of unijunction transistor V9 is connected between double throw switch 3 and the first resistance R1 through the second resistance R3, another base terminal of unijunction transistor V9 is connected to the Nodes between potentiometer RP2 and the 4th electric capacity C4, the emitter of unijunction transistor V9 is connected with silicon controlled cathode test end K through the 3rd resistance R4, and the not moved end K1 of double throw switch 3 is connected with the emitter of unijunction transistor V9.
As shown in Figure 2, current rectifying and wave filtering circuit 4 is by commutation diode V5, V6, V7, V8, and electric capacity C1 and C2 forms, and mu balanced circuit 5 is made up of three-terminal voltage-stabilizing pipe V11 and the 3rd electric capacity C3, 5th commutation diode V5 is connected with silicon controlled cathode test end K with the anode of the 6th commutation diode V6, its negative electrode is connected with the anode of the 8th commutation diode V8 with the 7th commutation diode V7 respectively, 7th commutation diode V7 is connected with the input end of three-terminal voltage-stabilizing pipe V11 with the negative electrode of the 8th commutation diode V8, the control end of three-terminal voltage-stabilizing pipe V11 is connected with silicon controlled cathode test end K, the output terminal of three-terminal voltage-stabilizing pipe V11 is connected with one end of trigger switch SB through pilot lamp HL, the other end of trigger switch SB is connected with the not moved end K5 of double throw switch 3, the output terminal of pilot lamp HL is connected with the not moved end K6 of double throw switch 3, first electric capacity C1 is connected with silicon controlled cathode test end K with one end of the second electric capacity C2, its other end is connected to the Nodes between the 8th commutation diode V8 and three-terminal voltage-stabilizing pipe V11, one end of 3rd electric capacity C3 is connected with silicon controlled cathode test end K, its other end is connected with the output terminal of three-terminal voltage-stabilizing pipe V11.
Static test: the 9V alternating voltage that insulate step-down transformer T exports after current rectifying and wave filtering circuit 4 by three-terminal voltage-stabilizing pipe V11 and electric capacity C3 filtering, voltage stabilization at 5V, using as tested silicon controlled operating voltage.Double throw switch 3 is pushed static test shelves K5 and K6 to hold, then K3 and the K5 conducting of double throw switch, K4 and K6 conducting, tested silicon controlled anode voltage is by K4 and K6 conducting, then p-wire A is communicated with the anode of tested controllable silicon V10, presses trigger button SB, trigger voltage delivers to the control pole of tested controllable silicon V10 by K3 and p-wire G, now tested controllable silicon V10 is by triggering and conducting, and now pilot lamp HL is lit, then illustrate that controllable silicon has been triggered conducting; When unclamping trigger button SB, pilot lamp HL continues bright, illustrates that controllable silicon can maintain conducting, can determine that tested controllable silicon does not damage.The object of this static test circuit of design increase is the silicon controlled quality in order to test low-voltage small area analysis.
Dynamic test: the 65V alternating voltage that insulate step-down transformer T exports is delivered in rectification circuit 1 and trigger circuit 2 by load bulb EL, when the positive half cycle of alternating current, commutating voltage is charged to the 4th electric capacity C4 by the first resistance R1 potentiometer RP2, when the voltage on the 4th electric capacity C4 reaches unijunction transistor V9 peak point voltage, unijunction transistor V9 becomes conducting from cut-off, the voltage at the 4th electric capacity C4 two ends is discharged rapidly by unijunction transistor V9 and the 3rd resistance R4, now, acquisition spike pulse on 3rd resistance R4, the control that this spike pulse holds circuit-closing contacts to be sent to tested controllable silicon V10 as control signal by K1 and K3 of double throw switch 3 is extremely gone up, to make tested controllable silicon V10 conducting.Tube voltage drop after tested controllable silicon V10 conducting is very low, is generally less than 1V, triggers concussion and quits work; When alternating current is by zero point, tested controllable silicon V10 automatically shuts down, and when alternating current negative half period, regulator potentiometer RP2 can change the charging rate of the 4th electric capacity C4, the length of tested controllable silicon V10 ON time can be changed, thus control rectifier output voltage.When potentiometer RP2 be transferred to resistance larger time, the time that 4th electric capacity C4 is flushed to peak point voltage is longer, therefore tested silicon controlled conduction angle is smaller, the voltage that controlled rectification exports is just low, load bulb EL is comparatively dark, on the contrary potentiometer RP be transferred to resistance less time, tested silicon controlled conduction angle is larger, the voltage that controlled rectification exports is just high, and EL is brighter for load bulb.The object of this dynamic circuit designs is the size being controlled tested controllable silicon V10 conduction angle by trigger circuit 2, to realize dynamic test controllable silicon being driven to load capacity.Double throw switch 3 pushes dynamic test shelves, K1 and the K3 conducting of double throw switch, K2 and K4 conducting, now trigger voltage is communicated with tested controllable silicon V10 with p-wire by K1 with K3 of double throw switch and K2 with K4, tested controllable silicon V10 is now by triggering and conducting, then regulator potentiometer RP2, and voltage table V indicates by the size adjusting voltage along with the adjustment of potentiometer RP2, load lamp is also along with the change that the adjustment display of potentiometer RP2 is bright or dark simultaneously, and observation is directly perceived.After comprehensively above-mentioned two kinds of steps are measured controllable silicon, namely can determine tested silicon controlled quality.
Above-described embodiment is only be described the preferred embodiment of the present invention; not scope of the present invention is limited; under not departing from the present invention and designing the prerequisite of spirit; the various distortion that those of ordinary skill in the art make technical scheme of the present invention and improvement, all should fall in protection domain that claims of the present invention determines.
Claims (4)
1. a controllable silicon tester, it is characterized in that: comprise insulate step-down transformer (T), static test circuit and dynamic test circuit, described dynamic test circuit comprises rectification circuit (1), trigger circuit (2), double throw switch (3) and the display circuit for showing this connecting and disconnecting of the circuit, and described static test circuit comprises current rectifying and wave filtering circuit (4) and mu balanced circuit (5); The input end of described insulate step-down transformer (T) is connected with power supply through insurance (FU), its output terminal is connected with the input end of display circuit with current rectifying and wave filtering circuit (4) respectively, the output terminal of described display circuit is connected through the input end of rectification circuit (1) with trigger circuit (2), and the output terminal of described trigger circuit (2) is connected with the not moved end of double throw switch (3) side; The output terminal of described current rectifying and wave filtering circuit (4) is connected with the input end of mu balanced circuit (5), the output terminal of described mu balanced circuit (5) is connected with the not moved end of trigger switch (SB) with double throw switch (3) opposite side through pilot lamp (HL) successively, the link of described static test circuit and dynamic circuit is silicon controlled cathode test end (K), and the moved end of described double throw switch (3) is respectively silicon controlled anode test lead (A) and controls pole test lead (G).
2. controllable silicon tester according to claim 1, is characterized in that: described display circuit is made up of load bulb (EL) and the voltage table (V) that is connected in parallel on load bulb (EL) two ends.
3. controllable silicon tester according to claim 1, is characterized in that: described rectification circuit (1) comprises commutation diode (V1; V2; V3; V4), described trigger circuit (2) comprise unijunction transistor (V9), resistance (R1; R3; R4), electric capacity (C4) and potentiometer (RP2); Described first, second commutation diode (V1; V2) anode respectively with the 3rd, the 4th commutation diode (V3; V4) negative electrode is connected, first, second commutation diode (V1; V2) negative electrode is connected with the not moved end (K2) of double throw switch (3), described 3rd, the 4th commutation diode (V3; V4) anode is connected with silicon controlled cathode test end (K); One end of described first resistance (R1) is connected between the second commutation diode (V2) and double throw switch (3), its other end is connected through potentiometer (RP2) one end with the 4th electric capacity (C4), and the other end of the 4th electric capacity (C4) is connected with silicon controlled cathode test end (K); One base terminal of described unijunction transistor (V9) is connected between double throw switch (3) and the first resistance (R1) through the second resistance (R3), another base terminal of unijunction transistor (V9) is connected to the Nodes between potentiometer (RP2) and the 4th electric capacity (C4), the emitter of described unijunction transistor (V9) is connected with silicon controlled cathode test end (K) through the 3rd resistance (R4), and the not moved end (K1) of described double throw switch (3) is connected with the emitter of unijunction transistor (V9).
4. the controllable silicon tester according to claim 1 or 3, is characterized in that: described current rectifying and wave filtering circuit (4) comprises commutation diode (V5, V6, V7, V8), electric capacity (C1, C2), described mu balanced circuit (5) is made up of three-terminal voltage-stabilizing pipe (V11) and the 3rd electric capacity (C3), described 5th, the 6th commutation diode (V5, V6) anode is connected with silicon controlled cathode test end (K), its negative electrode respectively with the 7th, the 8th commutation diode (V7, V8) anode is connected, described 7th, the 8th commutation diode (V7, V8) negative electrode is connected with the input end of three-terminal voltage-stabilizing pipe (V11), the control end of described three-terminal voltage-stabilizing pipe (V11) is connected with silicon controlled cathode test end (K), the output terminal of three-terminal voltage-stabilizing pipe (V11) is connected through pilot lamp (HL) one end with trigger switch (SB), the other end of described trigger switch (SB) is connected with the not moved end (K5) of double throw switch (3), the output terminal of described pilot lamp (HL) is connected with the not moved end (K6) of double throw switch (3), described first electric capacity (C1) is connected with silicon controlled cathode test end (K) with one end of the second electric capacity (C2), its other end is connected to the Nodes between the 8th commutation diode (V8) and three-terminal voltage-stabilizing pipe (V11), one end of described 3rd electric capacity (C3) is connected with silicon controlled cathode test end (K), its other end is connected with the output terminal of three-terminal voltage-stabilizing pipe (V11).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510405601.5A CN104965164B (en) | 2015-07-09 | 2015-07-09 | A kind of controllable silicon tester |
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| CN201510405601.5A CN104965164B (en) | 2015-07-09 | 2015-07-09 | A kind of controllable silicon tester |
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| CN104965164A true CN104965164A (en) | 2015-10-07 |
| CN104965164B CN104965164B (en) | 2018-03-09 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109696613A (en) * | 2018-01-25 | 2019-04-30 | 陕西开尔文测控技术有限公司 | A kind of hand-held semi-conductor discrete device test device |
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2015
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| CN109696613A (en) * | 2018-01-25 | 2019-04-30 | 陕西开尔文测控技术有限公司 | A kind of hand-held semi-conductor discrete device test device |
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