CN104949940A - Device for measuring scattering object scattering function real and imaginary parts and method - Google Patents

Abstract

The invention relates to a device for measuring scattering object scattering function real and imaginary parts and a method, wherein collimation line polarized laser beams are sent out through a laser, and are uniformly divided into transmitted beams and reflected beams through a first spectroscope after being expanded through a beam expander, the transmitted beams which are transmitted through the first spectroscope are reflected onto a second spectroscope through the first spectroscope after passing through a neutral density filter, and the reflected beams which are reflected through the first spectroscope are reflected onto a scattering object through the second spectroscope after passing through the neutral density filter, thereby producing scattering beams which modulate scattering functions on the second spectroscope to coaxially superimpose. Mixed beam sources which are produced by superimposing are probed through a probe sensor, recorded image information obtains complete information of the scattering functions which are produced by the scattering object after being processed by a microcomputer program, and the complete information of the scattering functions contains real and imaginary parts of the scattering object.

Description

A kind of apparatus and method measuring scatterer scattering function real part and imaginary part

Technical field

The invention belongs to applied optics technical field, particularly relate to a kind of apparatus and method measuring scatterer scattering function real part and imaginary part, this measuring method can recover amplitude and the phase information of scatterer scattering function accurately, can be applied to the fields such as optical imagery, space remote sensing, astrosurveillance.

Background technology

In recent years, the scattering function of scatterer obtains the extensive concern of researchist, can extract the essential characteristic parameter of scatterer from the scattering function of object, thus for object imaging, detection etc. important technical foundation is provided.From statistical mechanics angle, scattering function generally can characterize with correlation function, correlation function refers to certain consistance a bit risen and fallen between the position (spatial domain) that space is different in different moment (time domain) or synchronization spatially, if there is on all four fluctuation characteristic in different moment or different both locus, be correlated with completely both so just saying, relating value is one; If the fluctuating of the two is completely independent, uncorrelated both so just saying, relating value is zero, and generally speaking, the relating value of light field is between these two ultimate values.

Therefore, we can obtain light beam fluctuating association over time and space by measurement 2 in the association in time domain or spatial domain, thus the information such as the structure of restore target object and space, this measurement means is with a wide range of applications in astronomical surveing, information encryption, biotechnology etc., particularly in optical detection, optical communication, beam shaping, capture of particles, optical imagery etc. field, obtain a wide range of applications.Therefore, the measurement of scattering function has important practice significance.But in practical application in the past, traditional measurement can not recover scattering function value (comprising real part and imaginary part information), and be merely able to the mould square obtaining scattering function, obviously this can not obtain the complete information of scattering function, this metering system tool has a serious limitation simultaneously, limit the further application to scattering function, up to the present also do not propose the method and apparatus of complete recovery scattering function.In addition, for a long time, the research for scattering function focuses on simple scattering function always, in recent years, along with the theory of more complicated scattering function and the development of experimental study, also expedite the emergence of the deeper practical application about scattering function, shown more wide application prospect.

In sum, scattering function is widely used in the major areas such as astronomical sight, national defence scientific research, health care because of its special architectural feature, be with a wide range of applications, but, exactly because its special architectural feature, how to measure and reduce its real part and imaginary part information thus obtain complete related information and seem particularly important accurately, also have important practical significance simultaneously.

Summary of the invention

For solving the problems of the technologies described above, the object of this invention is to provide a kind of apparatus and method measuring scatterer scattering function real part and imaginary part, the method proposed can measure real part and the imaginary part information of scattering function accurately, has important using value in encryption and transmission etc. the field of optical imagery, space remote sensing, astrosurveillance, information.

The device of measurement scatterer scattering function real part of the present invention and imaginary part, comprise laser instrument, the beam expander that the laser beam sent described laser instrument expands, described laser beam after expanding is divided into the first spectroscope of perpendicular transmitted light beam and folded light beam, respectively described transmitted light beam and described folded light beam are reflected the first catoptron and second catoptron of 90 °, and by described transmitted light beam second spectroscope that superpose coaxial with described folded light beam after reflection, the intensity signal of the light beam after superposition is converted to the acquisition sensor of pictorial information, and the microcomputer to communicate to connect with described acquisition sensor, scatterer is placed between described first catoptron and the second spectroscope or is placed between described second catoptron and the second spectroscope.

Further, described first spectroscope and be equipped with neutral density filter plate between described first catoptron and the second catoptron.

Further, described laser instrument is linear polarization single longitudinal mode He-Ne gas laser.

Further, described first spectroscope and second spectroscopical splitting ratio are 50:50.

The present invention also provides a kind of method measuring scatterer scattering function real part and imaginary part, comprises step:

(1) the linearly polarized laser light beams of the collimation produced by linear polarization He-Ne laser instrument expands through beam expanding lens, is evenly divided into transmitted light beam and folded light beam by the first spectroscope;

(2) by the completely relevant line of collimation light beam of the first spectroscope transmission, completely coherent light bundle is reflected into the second spectroscope by after neutral density filter plate through the first catoptron;

(3) by the completely relevant line of collimation light beam of the first dichroic mirror, reflex to a certain scatterer by after neutral density filter plate through the second catoptron, produce the scattered beam with the distribution of certain scattering function;

(4) scattered beam and the completely coherent light bundle that produce are superposed through the second spectroscope is coaxial, the superimposed light electron gun produced is received by acquisition sensor, obtains real part and the imaginary part information of scattering function after the data of acquisition sensor record are sent to microcomputer loader process.

Further, described microcomputer treatment step is:

(1) described microcomputer is according to light intensity matrix I (r) of described acquisition sensor record, the light field and intensity signal that described acquisition sensor receive superimposed light electron gun are expressed as the vector of light source electric field and the superposition of intensity signal of two superpositions, according to formula

$\begin{array}{c}{G}^{\left(2\right)}(r_1,r_2)=<I\left(r_1\right)I\left(r_2\right)>=<E_{\mathrm{\&alpha;}}^{*}\left(r_1\right)E_{\mathrm{\&alpha;}}\left(r_1\right)E_{\mathrm{\&alpha;}}^{*}\left(r_2\right)E_{\mathrm{\&alpha;}}\left(r_2\right)>\\ =<\&lsqb;E_{l\mathrm{\&alpha;}}^{*}\left(r_1\right)+E_{p\mathrm{\&alpha;}}^{*}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_1\right)+E_{p\mathrm{\&alpha;}}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}^{*}\left(r_2\right)+E_{p\mathrm{\&alpha;}}^{*}\left(r_2\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_2\right)+E_{p\mathrm{\&alpha;}}\left(r_2\right)\&rsqb;>\\ =(<I_l\left(r_1\right)>+<I_p\left(r_1\right)>)(<I_l\left(r_2\right)>+<I_p\left(r_2\right)>)+2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2){\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;+|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2\end{array}$

Wherein G ⁽²⁾(r ₁, r ₂) be quadravalence correlation function, < > is average value of a function, E _α(r), I _αr () is respectively electric field and light intensity, subscript " l, p " represents coherent light beam and partial coherence light beam respectively, r ₁≡ (x ₁, y ₁) and r ₂≡ (x ₂, y ₂) be respectively any two point coordinate in described acquisition sensor plane; I (r ₁) and I (r ₂) be this light intensity value of 2, Γ _l(r ₁, r ₂) and Γ _p(r ₁, r ₂) be respectively coherent light beam and scattered beam at this scattering function of 2, " Re " represents real.Measure the Two dimensional Distribution of scattering function real part:

$\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;=\frac{G^{\left(2\right)}(r_1,r_2)-(<I_l\left(r_1\right)>+<I_p\left(r_1\right)>)(<I_l\left(r_2\right)>+<I_p\left(r_2\right)>)-|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2}{2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2)\&rsqb;};$

(2) two-dimensional distribution of the mould of scattering function imaginary values is calculated:

$|\mathrm{Im}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;|=\sqrt{|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2-\mathrm{Re}{\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;}^2},$

Wherein " || " is modulo symbol, and " Im " is imaginary part symbol;

(3) by the local derviation numerical value of scattering function real part and scattering function imaginary values to column vector and the local derviation numerical symbol one_to_one corresponding to row vector, recover the Two dimensional Distribution of the imaginary part information of scatterer scattering function, determine the expression-form of scatterer scattering function: Γ _p(r ₁, r ₂)=Re [Γ _p(r ₁, r ₂)]+iIm [Γ _p(r ₁, r ₂)].

By such scheme, the advantage of the apparatus and method of measurement scatterer scattering function real part of the present invention and imaginary part is:

1, the one that technical solution of the present invention provides measures the device of scatterer (scattering-in or surface scattering) scattering function real part and imaginary part, propose real part and the imaginary part information of being measured the scattering function of scattered light electron gun by superposition completely coherent light bundle first, have initiative;

2, the device of the measurement correlation function real part that provides of technical solution of the present invention and imaginary part, compact conformation, measures accurately, has good operability and practicality, has application prospect widely;

3, the method that the one that technical solution of the present invention provides measures scatterer (scattering-in or surface scattering) scattering function real part and imaginary part has applicability widely, can measure real part and the imaginary part information of any scattering function;

4, utilize acquisition sensor detect and measure the real part of any scattering function and the measuring method of imaginary part information in the present invention, can obtain the distributed in three dimensions of scattering function, method is simple, directly perceived, quick, practical.

Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.

Accompanying drawing explanation

Fig. 1 is a kind of apparatus structure schematic diagram measuring scatterer scattering function real part and imaginary part that the embodiment of the present invention provides;

Fig. 2 is the contour distribution plan of a kind of scatterer scattering function mould of providing of the embodiment of the present invention square;

Fig. 3 is the contour distribution plan of a kind of scatterer scattering function real part that the embodiment of the present invention provides;

Fig. 4 is the contour distribution plan of a kind of scatterer scattering function imaginary part that the embodiment of the present invention provides.

Embodiment

Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples for illustration of the present invention, but are not used for limiting the scope of the invention.

See Fig. 1, a kind of device measuring scatterer scattering function real part and imaginary part described in a preferred embodiment of the present invention, comprises laser instrument 1, beam expanding lens 2, first spectroscope 3, second spectroscope 9, neutral density filter plate 4,6, the first catoptron 5, second catoptron 7, scatterer 8, acquisition sensor 10, microcomputer 11.

Send by laser instrument 1 the linearly polarized laser light beam that light distribution is Gaussian distribution, laser instrument 1 is single longitudinal mode helium-neon laser, power 100mw, and wavelength is 632.8nm; The linearly polarized laser light beam that laser instrument 1 is launched expands through continuous adjustable beam expanding lens 2, and beam expanding lens 2 is used for regulating the size with a tight waist of light beam, and beam expanding lens 2 is continuous adjustable plated film beam expanding lens; Linearly polarized laser light beam through expanding evenly is divided into perpendicular transmitted light beam and folded light beam by the first spectroscope 3, and the first spectroscope 3 is the unpolarized spectroscope of splitting ratio 50:50; Transmitted light beam is via after neutral density filter plate 4, the second spectroscope 9 is irradiated to after being reflected by the first catoptron 5, second spectroscope 9 is similarly the unpolarized spectroscope of splitting ratio 50:50, neutral density filter plate 4 is the neutral density filter plate of continuous adjustable, and the first catoptron 5 is aluminized for silver-plated surface and protected membranous type catoptron; The folded light beam reflected via the first spectroscope 3 is via after neutral density filter plate 6, and be radiated at scatterer 8 after being reflected by the second catoptron 7, neutral density filter plate 6 is similarly the neutral density filter plate of continuous adjustable; The completely coherent light bundle reflected via the first catoptron 5 and the scattered beam produced via scatterer are at the second spectroscope 9 place Coaxial Superimposed; The superimposed light electron gun produced is irradiated on acquisition sensor 10, and intensity signal is converted into 0-255 level gray scale pictorial information by acquisition sensor 10, and the gray scale pictorial information recorded via acquisition sensor 10 is saved on microcomputer 11.

Being recorded in pictorial information in microcomputer 11 can by following mode process: recorded the gray scale pictorial information ading up to N (N is positive integer) continuously by acquisition sensor 10, each pictures information can be expressed as light intensity matrix I (r) of A × B, A and B is for recorded picture is in horizontal and vertical pixel elements number, r=(x, y), [(x, y) ∈ (A, B)] be the coordinate figure of any one pixel elements on picture, I is gray-scale value and the light intensity value of each pixel elements, the space distribution of quadravalence correlation function (i.e. the mould square of scattering function) just can be obtained after the calculation process do as shown in (1) formula to matrix, its computer processing procedure is as follows:

$g^{\left(2\right)}(r_1,r_2)=\frac{<I\left(r_1\right)I\left(r_2\right)>}{<I\left(r_1\right)><I\left(r_2\right)>}=\frac{N\underset{n=1}{\overset{N}{\&Sigma;}}\&lsqb;I_n\left(r_1\right)I_n\left(r_2\right)\&rsqb;}{\underset{n=1}{\overset{N}{\&Sigma;}}{I}_n\left(r_1\right)\underset{n=1}{\overset{N}{\&Sigma;}}{I}_n\left(r_2\right)}---\left(1\right)$

Wherein g ⁽²⁾(r ₁, r ₂) be two pixel point r ₁and r ₂spatial fourth-order association, < > is the ensemble average of function; N and N is respectively a certain frame picture of detector shooting and taken total picture number; I _n(r ₁) and I _n(r ₂) distinguish the n-th pictures at r ₁and r ₂the light intensity value of point; Σ is summation symbol.R can be fixed in actual treatment ₁coordinate figure, calculate the light intensity value at this coordinate place and different r ₂the relating value of the light intensity value at place, try to achieve the mould square of scattering function, this disposal route can obtain the two dimensional surface distribution of scattering function mould square, the measuring accuracy of this measurement processing method depends on the picture number N of measurement, can guarantee the precision measured in process as N>4000.

Acquisition sensor 10 is charge coupled sensor, it receives the vector of light source electric field and the superposition of intensity signal that the light field of superimposed light electron gun and intensity signal can be expressed as two superpositions:

E _α(r)＝E _lα(r)+E _pα(r),(α＝x or y) (2)

I _α(r)＝I _lα(r)+I _pα(r),(α＝x or y) (3)

Wherein E _α(r), I _αr () is respectively electric field and light intensity, r ≡ (x, y) is that the polarization direction that subscript " α " is light field, subscript " l, p " represents coherent laser and partial coherence light beam respectively perpendicular to coordinate arbitrary in beam Propagation plane.

Do quadravalence association to the intensity signal be recorded in microcomputer 11, its expression formula can be expressed as:

$\begin{array}{c}{G}^{\left(2\right)}(r_1,r_2)=<I\left(r_1\right)I\left(r_2\right)>=<E_{\mathrm{\&alpha;}}^{*}\left(r_1\right)E_{\mathrm{\&alpha;}}\left(r_1\right)E_{\mathrm{\&alpha;}}^{*}\left(r_2\right)E_{\mathrm{\&alpha;}}\left(r_2\right)>\\ =<\&lsqb;E_{l\mathrm{\&alpha;}}^{*}\left(r_1\right)+E_{p\mathrm{\&alpha;}}^{*}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_1\right)+E_{p\mathrm{\&alpha;}}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}^{*}\left(r_2\right)+E_{p\mathrm{\&alpha;}}^{*}\left(r_2\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_2\right)+E_{p\mathrm{\&alpha;}}\left(r_2\right)\&rsqb;>\\ =(<I_l\left(r_1\right)>+<I_p\left(r_1\right)>)(<I_l\left(r_2\right)>+<I_p\left(r_2\right)>)+2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2){\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;+|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2\end{array}---\left(4\right)$

Wherein G ⁽²⁾(r ₁, r ₂) be quadravalence correlation function, < > is average value of a function.R ₁≡ (x ₁, y ₁) and r ₂≡ (x ₂, y ₂) be respectively any two point coordinate in acquisition sensor 10 plane; I (r ₁) and I (r ₂) be this light intensity value of 2, Γ _l(r ₁, r ₂) and Γ _p(r ₁, r ₂) be respectively coherent light beam and scattered beam at this scattering function of 2, " Re " represents real.Can (4) formula be write as following form:

$\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;=\frac{G^{\left(2\right)}(r_1,r_2)-(<I_l\left(r_1\right)>+<I_p\left(r_1\right)>)(<I_l\left(r_2\right)>+<I_p\left(r_2\right)>)-|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2}{2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2)\&rsqb;}---\left(5\right)$

The mould square of scattering function only can be measured according to measurement means in the past | Γ _p(r ₁, r ₂) | ²the measurement result of one dimension, and scattering function complete information and real part and imaginary part information cutter body numerical value really can not be measured.The real part of measurement scattering function that the present invention proposes and the method and apparatus of imaginary part, first acquisition sensor 10 is utilized to measure the method for scattering function mould square, measured the Two dimensional Distribution of the mould square of scattering function, the formula (5) be out of shape according to formula (3) and then can measure the Two dimensional Distribution of scattering function real part; According to the mould square of scattering function | Γ _p(r ₁, r ₂) | ²and scattering function real part Re [Γ _p(r ₁, r ₂)] Two dimensional Distribution figure, the two-dimensional distribution of the mould of scattering function imaginary values can be calculated:

$|\mathrm{Im}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;|=\sqrt{|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2-\mathrm{Re}{\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;}^2}---\left(6\right)$

" || " is modulo symbol, and " Im " is imaginary part symbol.

If the scattering function of scatterer 8 is the function of a complex variable of resolving, so according to Cauchy-Riemann condition: if function f (z)=u (x, y)+iv (x, y) determine in the D of region, so f (z) at a sufficient and necessary condition that z=x+iy ∈ D can lead is:

1, real part u (x, y) and imaginary part v (x, y) can be micro-at point (x, y) place;

2, u (x, y) and v (x, y) meets Cauchy-Riemann equations at point (x, y):

$\frac{\&part;u}{\&part;x}=\frac{\&part;v}{\&part;y},\frac{\&part;u}{\&part;y}=-\frac{\&part;v}{\&part;x}.$

Wherein, for partial differential symbol.Real part Re [the Γ of the scattering function obtained will be measured _p(r ₁, r ₂)] be expressed as a two-dimensional matrix form, respectively local derviation is asked to the row vector (x direction) of this matrix and column vector (y direction), by Cauchy-Riemann decision condition, the local derviation numerical value of scattering function real part should with scattering function imaginary values to column vector and corresponding to the local derviation numerical symbol of row vector, by this kind mode one to one, just can confirm the sign of scattering function imaginary values, the Two dimensional Distribution recovering the imaginary part information of scatterer scattering function that now just can be complete, and then determine the expression-form of scatterer scattering function:

Γ _p(r ₁,r ₂)＝Re[Γ _p(r ₁,r ₂)]+iIm[Γ _p(r ₁,r ₂)] (7)

The above-mentioned real part of measurement scattering function utilizing the present embodiment to provide and the device of imaginary part, its concrete operation steps is as follows:

1, by linear polarization single longitudinal mode He-Ne laser instrument 1 send a phase, stabilized intensity and light distribution is the laser beam of Gaussian distribution;

2, the laser beam launched evenly expands through continuous adjustable beam expanding lens 2, and is that 50:50 first spectroscope 3 is evenly divided into perpendicular transmitted light beam and folded light beam via splitting ratio;

3, transmitted light beam is irradiated to the second spectroscope 9 after regulating the power of completely coherent light bundle via the neutral density filter plate 4 of decay intensity continuous adjustable after being reflected by the first catoptron 5;

4, after the folded light beam reflected via the first spectroscope 3 regulates the power of light beam via decay intensity continuous adjustable neutral density filter plate 6, be radiated on scatterer 8 after being reflected by the second catoptron 7, produce the scattered beam with certain scattering function structure;

5, to be that second spectroscope 9 place of 50:50 is coaxial at splitting ratio superpose for the completely coherent light bundle reflected via the first catoptron 5 and the scattered beam produced via scatterer 8;

6, the superimposed light electron gun produced is irradiated on acquisition sensor 10 and intensity signal is converted into 0-255 level gray scale pictorial information, and the gray scale pictorial information recorded via acquisition sensor 10 is saved on microcomputer 11.

Below illustrate:

If the scattering function of a certain scatterer meets following scattering function formula:

$\mathrm{\&Gamma;}(r_1,r_2)=\exp (-\frac{r_1^2+r_2^2}{4{\mathrm{\&sigma;}}_0^2})g_x(x_1-x_2)g_y(y_1-y_2)---\left(8\right)$

Wherein Γ (r ₁, r ₂) be the scattering function of scatterer; r ₁≡ (x ₁, y ₁), r ₂≡ (x ₂, y ₂) be perpendicular to coordinate points any in beam Propagation plane; " exp " is exponential function; σ ₀for scattered beam waist radius; g _x(Δ x) and g _y(Δ y) is respectively the scattering function component in x direction and y direction; Δ x=x ₁-x ₂, Δ y=y ₁-y ₂be respectively x direction and y direction relative distance; δ ₀for the coherent length of scattered beam; A is the modulation parameter of scattering function; I is imaginary symbols; with be respectively the argument in x direction and y direction.

The present embodiment, for the method and apparatus of the real part and imaginary part of measuring scattering function, gives the contour distribution plan of the scattering function mould square of scatterer in example shown in accompanying drawing 2; Fig. 3 gives the contour distribution plan of scatterer scattering function real part in example; Fig. 4 shows the contour distribution plan of scatterer scattering function imaginary part in example.These data obtain consistent result in experiment measuring, demonstrate good operability and wide application prospect.

The above is only the preferred embodiment of the present invention; be not limited to the present invention; should be understood that; for those skilled in the art; under the prerequisite not departing from the technology of the present invention principle; can also make some improvement and modification, these improve and modification also should be considered as protection scope of the present invention.

Claims (6)

1. measure the device of scatterer scattering function real part and imaginary part for one kind, it is characterized in that: comprise laser instrument, the beam expander that the laser beam sent described laser instrument expands, described laser beam after expanding is divided into the first spectroscope of perpendicular transmitted light beam and folded light beam, respectively described transmitted light beam and described folded light beam are reflected the first catoptron and second catoptron of 90 °, and by described transmitted light beam second spectroscope that superpose coaxial with described folded light beam after reflection, the intensity signal of the light beam after superposition is converted to the acquisition sensor of pictorial information, and the microcomputer to communicate to connect with described acquisition sensor, scatterer is placed between described first catoptron and the second spectroscope or is placed between described second catoptron and the second spectroscope.

2. the device of measurement scatterer scattering function real part according to claim 1 and imaginary part, is characterized in that: described first spectroscope and be equipped with neutral density filter plate between described first catoptron and the second catoptron.

3. the device of measurement scatterer scattering function real part according to claim 2 and imaginary part, is characterized in that: described laser instrument is linear polarization single longitudinal mode He-Ne gas laser.

4. the device of measurement scatterer scattering function real part according to claim 3 and imaginary part, is characterized in that: described first spectroscope and second spectroscopical splitting ratio are 50:50.

5. measure a method for scatterer scattering function real part and imaginary part, it is characterized in that, comprise step:

(1) the linearly polarized laser light beams of the collimation produced by linear polarization He-Ne laser instrument expands through beam expanding lens, is evenly divided into transmitted light beam and folded light beam by the first spectroscope;

(2) by the completely relevant line of collimation light beam of the first spectroscope transmission, completely coherent light bundle is reflected into the second spectroscope by after neutral density filter plate through the first catoptron;

(3) by the completely relevant line of collimation light beam of the first dichroic mirror, reflex to a certain scatterer by after neutral density filter plate through the second catoptron, produce the scattered beam with the distribution of certain scattering function;

(4) scattered beam and the completely coherent light bundle that produce are superposed through the second spectroscope is coaxial, the superimposed light electron gun produced is received by acquisition sensor, obtains real part and the imaginary part information of scattering function after the data of acquisition sensor record are sent to microcomputer loader process.

6. the method for measurement scatterer scattering function real part according to claim 3 and imaginary part, is characterized in that, described microcomputer treatment step is:

(1) described microcomputer is according to light intensity matrix I (r) of described acquisition sensor record, the light field and intensity signal that described acquisition sensor receive superimposed light electron gun are expressed as the vector of light source electric field and the superposition of intensity signal of two superpositions, according to formula

$\begin{array}{c}{G}^{\left(2\right)}(r_1,r_2)=<I\left(r_1\right)I\left(r_2\right)>=<E_{\mathrm{\&alpha;}}^{*}\left(r_1\right)E_{\mathrm{\&alpha;}}\left(r_1\right)E_{\mathrm{\&alpha;}}^{*}\left(r_2\right)E_{\mathrm{\&alpha;}}\left(r_2\right)>\\ =<\&lsqb;E_{\mathrm{\&alpha;}}^{*}\left(r_1\right)E_{p\mathrm{\&alpha;}}^{*}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_1\right)E_{p\mathrm{\&alpha;}}\left(r_1\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}^{*}\left(r_2\right)E_{p\mathrm{\&alpha;}}^{*}\left(r_2\right)\&rsqb;\&lsqb;E_{l\mathrm{\&alpha;}}\left(r_2\right)E_{p\mathrm{\&alpha;}}\left(r_2\right)\&rsqb;>\\ =(<I_l(r_1)>+<I_p\left(r_1\right)>)(<I_l(r_2)>+<I_p\left(r_2\right)>)+2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2){\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;+|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2\end{array}$ Wherein G ⁽²⁾(r ₁, r ₂) be quadravalence correlation function, <> is average value of a function, E _α(r), I _αr () is respectively electric field and light intensity, subscript " l, p " represents coherent light beam and partial coherence light beam respectively, r ₁≡ (x ₁, y ₁) and r ₂≡ (x ₂, y ₂) be respectively any two point coordinate in described acquisition sensor plane; I (r ₁) and I (r ₂) be this light intensity value of 2, Γ _l(r ₁, r ₂) and Γ _p(r ₁, r ₂) be respectively coherent light beam and scattered beam at this scattering function of 2, " Re " represents that real measures the Two dimensional Distribution of scattering function real part:

$\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;=\frac{G^{\left(2\right)}(r_1,r_2)-(\&lang;I_l(r_1)\&rang;+\&lang;I_p\left(r_1\right)\&rang;)(\&lang;I_l(r_2)\&rang;+\&lang;I_p\left(r_2\right)\&rang;)-|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2}{2\mathrm{Re}\&lsqb;{\mathrm{\&Gamma;}}_l(r_1,r_2)\&rsqb;};$

(2) two-dimensional distribution of the mould of scattering function imaginary values is calculated:

$|\mathrm{Im}\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;|=\sqrt{|{\mathrm{\&Gamma;}}_p(r_1,r_2){|}^2-\mathrm{Re}{\&lsqb;{\mathrm{\&Gamma;}}_p(r_1,r_2)\&rsqb;}^2},$ Wherein " || " is modulo symbol, and " Im " is imaginary part symbol;

(3) by the local derviation numerical value of scattering function real part and scattering function imaginary values to column vector and the local derviation numerical symbol one_to_one corresponding to row vector, recover the Two dimensional Distribution of the imaginary part information of scatterer scattering function, determine the expression-form of scatterer scattering function: Γ _p(r ₁, r ₂)=Re [Γ _p(r ₁, r ₂)]+iIm [Γ _p(r ₁, r ₂)].