CN104942685A - Device for grinding ultrasonic wave guide probe - Google Patents
Device for grinding ultrasonic wave guide probe Download PDFInfo
- Publication number
- CN104942685A CN104942685A CN201510417175.7A CN201510417175A CN104942685A CN 104942685 A CN104942685 A CN 104942685A CN 201510417175 A CN201510417175 A CN 201510417175A CN 104942685 A CN104942685 A CN 104942685A
- Authority
- CN
- China
- Prior art keywords
- probe
- sample pipe
- cantilever
- pedestal
- holddown groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 113
- 238000000034 method Methods 0.000 claims abstract description 15
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 45
- 239000000463 material Substances 0.000 claims description 12
- 229910001220 stainless steel Inorganic materials 0.000 claims description 12
- 239000010935 stainless steel Substances 0.000 claims description 12
- 239000011435 rock Substances 0.000 claims description 5
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 239000000725 suspension Substances 0.000 abstract 3
- 238000003754 machining Methods 0.000 abstract 2
- 230000007547 defect Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 229910001651 emery Inorganic materials 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 229920005479 Lucite® Polymers 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 230000009711 regulatory function Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B23/00—Portable grinding machines, e.g. hand-guided; Accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
A device for grinding an ultrasonic wave guide probe comprises a base, a stand column, a suspension arm, a probe clamp, a sliding guide rail base, a V-shaped sample tube fixing tank and a sample tube fixing clamp, wherein the base is provided with adjustment components for adjusting the level of the base; the stand column is fixedly connected on one side of the base; one end of the suspension arm is clamped on the stand column and can slide up and down along the stand column; the probe clamp is fixed at the other end of the suspension arm and connected with a probe when used; the sliding guide rail base is arranged on the other side of the base, and machining sliding rails are arranged on the sliding guide rail base; the V-shaped sample tube fixing tank is mounted right above the sliding guide rail base, the top of the V-shaped sample tube fixing tank is used for accommodating a tube with the diameter identical to that of a required ground probe, and lower sliding rails in fit connection with the machining sliding rails are arranged at the bottom of the V-shaped sample tube fixing tank; the sample tube fixing clamp is arranged above the V-shaped sample tube fixing tank and penetrates through the tube arranged on the V-shaped sample tube fixing tank, two ends of the sample tube are fixed on outer sides of the V-shaped sample tube fixing tank, the sample tube fixing clamp is matched with the V-shaped sample tube fixing tank to fix the tube, and accordingly, the tube can be prevented from shaking in the probe grinding process.
Description
Technical field
The present invention relates to field of non destructive testing, be specifically related to a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave.
Background technology
Ultrasound examination is one of five large conventional Dynamic Non-Destruction Measurements.At present, it is that domestic and international application is the most extensive, frequency of utilization is the highest and develops a kind of Dynamic Non-Destruction Measurement faster.Ultrasonic guided wave detection technology utilizes low frequency distorted wave or compressional wave, can grow distance detect pipeline, pipeline, comprises and detecting for the long distance of underground buried tube under not cutting status.
Ultrasonic probe is the important component part in ultrasonic guided wave detecting system, utilize ultrasonic lead art carry out defects detection time, it directly contacts with pipeline, for encouraging in the duct and receiving supersonic guide-wave.
Ultrasonic probe is made up of 6 parts such as piezoelectric chip, damping block, diaphragm, wedge, cable, shells; wedge be probe in testing process with the part of tube contacts; general lucite is made, and situation about being coupled with pipeline directly has influence on the Detection results of whole detection system.
There is following problem in the ultrasonic probe adopted in correlation technique:
(1) because the probe wedge outer surface detecting pipe circumferential defect is plane, be linear contact lay when wedge plane contacts with the pipeline external surface of different tube diameters.Therefore, the interface sound waves energy inciding wedge and pipe can be very low, and during manual operations, probe easily rocks, and then Main beam cannot incide tube wall inside.
(2) for strengthening the sound wave inciding interface, static probe position, often needs the outside dimension coordinating tested pipeline, grinds arc groove by hand in Probe index position.Arc groove and pipe outer surface are that face contacts, and main beam incides tube wall by arc contact surface.Due to adopt the free-hand method ground to grind arc groove habitually in the past, exist firmly uneven, and easily cause the arc groove that grinds crooked, out-of-shape, thus in testing process, the surface of probe can not contact effectively with tube wall, detecting defect cannot accurately locate, affect testing result, cause probe to be scrapped.
Summary of the invention
The object of the invention is to avoid above-mentioned weak point of the prior art and provide a kind of to pop one's head in the device ground for ultrasonic wave guided wave.
Object of the present invention is achieved through the following technical solutions:
Popping one's head in the device ground for ultrasonic wave guided wave, for grinding probe, comprising the fixing card of pedestal, column, cantilever, probe gripper, rail plate base, V-type sample pipe holddown groove and sample pipe; Described pedestal is positioned at the bottom of described device, is provided with the adjustment means of adjustable described base level below it, is arranged at the side of described pedestal described uprights vertical, and it is fixedly connected with described pedestal by the bolt hole be arranged at above described pedestal; One end of described cantilever is connected on described column, and it can slide up and down along the length direction of described column, makes described cantilever automatically can regulate the position of cantilever on described column grinding in process of described device; Described probe gripper is vertically fixed in the other end of described cantilever, and for fixing described probe, during use, it is connected with probe, makes the length direction of described probe and described pedestal keep vertical; Described rail plate floor installation is in the opposite side of described pedestal, and its top is provided with processing slide rail; Described V-type sample pipe holddown groove is installed on directly over described rail plate base, and its top grinds the consistent tubing of caliber for placing with required probe, is provided with the below slide rail be connected with described processing slide rail bottom it; The axis place that card is arranged at contiguous described V-type sample pipe holddown groove fixed by described sample pipe, it is inner through the tubing be positioned on described V-type sample pipe holddown groove, the outside of described V-type sample pipe holddown groove is fixed at its two ends, coordinating with described V-type sample pipe holddown groove makes tubing fix, and prevents tubing from grinding in process at probe and rocks.
Preferably, regulate the adjustment means of described base level to be bolt, described bolt is provided with 4; Described adjustment means is vertically installed in the bottom of described pedestal; The cross section of described pedestal is square.
Preferably, described column is made up of stainless steel material; Described pedestal is made up of stainless steel material; Described cantilever is made up of stainless steel material; Described probe gripper is made up of stainless steel material; Described V-type sample pipe holddown groove is made up of stainless steel material.
Preferably, the cross section of the one end of the cantilever be flexibly connected with described column is square, and its length is greater than the width of described column, the cantilever lever that described cantilever extends to described rail plate base position in the horizontal direction and described base parallel.
Preferably, the cross section of described V-type sample pipe holddown groove be top to lower recess V-type, the length bottom it is mated with the length of described rail plate base.
Preferably, by described device, can grind and detect the probe with arc groove of diameter required for the caliber within the scope of 32mm ~ 219mm.
The beneficial effect of embodiment provided by the present invention:
(1) what embodiments of the invention provided a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, the top position that card is arranged at the axis of contiguous V-type sample pipe holddown groove fixed by its sample pipe arranged, it is inner through the tubing be positioned on V-type sample pipe holddown groove, the outside of V-type sample pipe holddown groove is fixed at its two ends, coordinate with V-type sample pipe holddown groove makes tubing fix simultaneously, prevent from tubing from grinding in process at probe to rock, make the Main beam of probe can incide the tube wall inside of tubing.
(2) what embodiments of the invention provided a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, and its probe arranged uses probe gripper to be fixed, and further enhancing the stabilization function of probe; In addition; the arc groove utilizing this device to grind is straight; and can keep vertical with the length direction of probe; in testing process, the surface of probe and the tube wall of tubing well present face and contact, and ensure that the accurate location detecting defect; utilize the regulatory function of the cantilever that can slide on column simultaneously; protection probe and the contact of tubing, extend the service life of probe, improve the operating efficiency ground.
(3) what provided by embodiments of the invention a kind ofly to be popped one's head in the device ground for ultrasonic wave guided wave, can grind the probe with arc groove required for all calibers detected within the scope of Φ 32mm ~ Φ 219mm; And then saved cost.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Wherein: 1-pedestal, 2-column, 3-cantilever, 4-probe gripper, 5-rail plate base, 6-V type sample pipe holddown groove, the fixing card of 7-sample pipe, 8-pops one's head in.
Detailed description of the invention
The invention will be further described with the following Examples.
What embodiments of the invention provided a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, for grinding probe 8, as shown in Figure 1, comprising pedestal 1, column 2, cantilever 3, probe gripper 4, rail plate base 5, V-type sample pipe holddown groove 6 and sample pipe and fixing card 7.
Pedestal 1 is positioned at the bottom of device, is provided with the adjustment means of adjustable described pedestal 1 level below it, and described adjustment means is vertical with described pedestal 1 to be arranged.Column 2 is arranged at the side of the top of pedestal 1, and as preferably, column 2 is vertical with pedestal 1, and column 2 is fixedly connected with pedestal 1 by the bolt hole be arranged at above pedestal 1.One end of cantilever 3 is connected on column 1, and it can slide up and down vertically along the length direction of column 2, makes cantilever 3 automatically can regulate the position of cantilever 3 on column 2 grinding in process of device.Probe gripper 4 is connected and fixed on the other end of cantilever 3, and for static probe 8, during use, it is connected with probe 8; Rail plate base 5 is installed on the opposite side of the upper end of pedestal 1, and its top is provided with processing slide rail.V-type sample pipe holddown groove 6 is installed on directly over rail plate base 5, and its top grinds the consistent tubing of caliber for placing with required probe, is provided with and the below slide rail processed slide rail and be connected bottom it.The top position that card 7 is arranged at the axis of contiguous V-type sample pipe holddown groove 6 fixed by sample pipe, it is inner through the tubing be positioned on V-type sample pipe holddown groove 6, the outside of V-type sample pipe holddown groove 6 is fixed at its two ends, and coordinate with V-type sample pipe holddown groove 6 tubing is fixed, prevent tubing from grinding in process at probe and rock.
In addition, the adjustment means regulating described pedestal 1 level is bolt, and in the present embodiment, bolt is provided with 4; The cross section of pedestal 1 is square; Pedestal 1 is made up of stainless steel material; Column 2, cantilever 3, probe gripper 4 and V-type sample pipe holddown groove 6 are all made up of stainless steel material; The cross section of the one end of the cantilever 3 be flexibly connected with column 2 is square, and its length is greater than the width of described column 2, and the cantilever lever that described cantilever 3 extends to described rail plate base 5 position is in the horizontal direction parallel with described pedestal 1.The cross section of V-type sample pipe holddown groove 6 is the V-type of top to lower recess, and the length bottom it is mated with the length of rail plate base 5.The device that the embodiment of the application of the invention provides, can grind and detect the probe with arc groove of diameter required for the caliber within the scope of 32mm ~ 219mm.
What provide utilizing embodiments of the invention a kind ofly carries out probe grind in process for the pop one's head in device that grinds of ultrasonic wave guided wave, and operating process is as follows:
(1) surface mount is fixed on V-type sample pipe holddown groove 6 by the predetermined tubing of emery cloth and sample pipe is fixed between card 7;
(2) will the probe 8 ground be needed to be fixed in probe gripper 4;
(3) length direction along column 2 vertically slides up and down, the height of adjustment cantilever 3, ensures that probe 8 contacts with the predetermined tubing of emery cloth;
(4) the predetermined tubing of manual promotion moves reciprocatingly vertically, thus grinds probe 8.
Finally should be noted that; above embodiment is only in order to illustrate technical scheme of the present invention; but not limiting the scope of the invention; although done to explain to the present invention with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can modify to technical scheme of the present invention or equivalent replacement, and not depart from essence and the scope of technical solution of the present invention.
Claims (6)
1. to pop one's head in the device ground for ultrasonic wave guided wave for one kind, for grinding probe (8), it is characterized in that: comprise the fixing card (7) of pedestal (1), column (2), cantilever (3), probe gripper (4), rail plate base (5), V-type sample pipe holddown groove (6) and sample pipe; Described pedestal (1) is positioned at the bottom of described device, is provided with the adjustment means of adjustable described pedestal (1) level below it; Described column (2) is arranged at the side of described pedestal (1), and it is fixedly connected with described pedestal (1) by the bolt hole being arranged at described pedestal (1) top; One end of described cantilever (3) is connected on described column (1), and it can slide up and down along the length direction of described column (2), make described cantilever (3) automatically can regulate the position of cantilever (3) on described column (2) grinding in process of described device; Described probe gripper (4) is vertically fixed in the other end of described cantilever (3), for fixing described probe (8), during use, it is connected with probe (8), makes the length direction of described probe (8) keep vertical with described pedestal (1); Described rail plate base (5) is installed on the opposite side of described pedestal (1), and its top is provided with processing slide rail; Described V-type sample pipe holddown groove (6) is installed on directly over described rail plate base (5), its top grinds the consistent tubing of caliber for placing with required probe, is provided with the below slide rail be connected with described processing slide rail bottom it; The fixing card (7) of described sample pipe is arranged at the axis place of described V-type sample pipe holddown groove (6), it is inner through the tubing be positioned on described V-type sample pipe holddown groove (6), the outside of described V-type sample pipe holddown groove (6) is fixed at its two ends, coordinating with described V-type sample pipe holddown groove (6) makes tubing fix, and prevents tubing from grinding in process at probe and rocks.
2. according to claim 1ly a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, it is characterized in that: the adjustment means regulating described pedestal (1) level is bolt, and described bolt is provided with 4; Described adjustment means is vertically installed in the bottom of described pedestal (1); The cross section of described pedestal (1) is square.
3. according to claim 1ly a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, it is characterized in that: described pedestal (1) is made up of stainless steel material; Described column (2) is made up of stainless steel material; Described cantilever (3) is made up of stainless steel material; Described probe gripper (4) is made up of stainless steel material; Described V-type sample pipe holddown groove (6) is made up of stainless steel material.
4. according to claim 1ly a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, it is characterized in that: the cross section of the one end of the cantilever (3) be flexibly connected with described column (2) is square, and its length is greater than the width of described column (2); The cantilever lever that described cantilever (3) extends to described rail plate base (5) position is in the horizontal direction parallel with described pedestal (1).
5. according to claim 1ly a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, it is characterized in that: the cross section of described V-type sample pipe holddown groove (6) is the V-type of top to lower recess, and the length bottom it is mated with the length of described rail plate base (5).
6. according to claim 1ly a kind ofly to pop one's head in the device ground for ultrasonic wave guided wave, it is characterized in that: by described device, can grind and detect the probe with arc groove of diameter required for the caliber within the scope of 32mm ~ 219mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510417175.7A CN104942685B (en) | 2015-07-15 | 2015-07-15 | A kind of device ground for ultrasonic wave guided wave probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510417175.7A CN104942685B (en) | 2015-07-15 | 2015-07-15 | A kind of device ground for ultrasonic wave guided wave probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104942685A true CN104942685A (en) | 2015-09-30 |
| CN104942685B CN104942685B (en) | 2017-03-08 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510417175.7A Active CN104942685B (en) | 2015-07-15 | 2015-07-15 | A kind of device ground for ultrasonic wave guided wave probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104942685B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108637853A (en) * | 2018-07-23 | 2018-10-12 | 山西省机电设计研究院 | Ultrasonic Nondestructive probe milling tools |
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| US20070161333A1 (en) * | 2002-08-28 | 2007-07-12 | Micron Technology, Inc. | In-situ chemical-mechanical planarization pad metrology using ultrasonic imaging |
| JP2007212272A (en) * | 2006-02-09 | 2007-08-23 | Jeol Ltd | Method for making double-curvature johansson x-ray spectrometer crystal |
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| CN101402183A (en) * | 2007-10-31 | 2009-04-08 | 王祖勇 | Polishing apparatus for curved surface piezoelectric wafer |
| CN201669614U (en) * | 2010-05-20 | 2010-12-15 | 常州超声电子有限公司 | Ultrasonic normal probe grinding machine |
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-
2015
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Cited By (1)
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| CN108637853A (en) * | 2018-07-23 | 2018-10-12 | 山西省机电设计研究院 | Ultrasonic Nondestructive probe milling tools |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104942685B (en) | 2017-03-08 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| CB03 | Change of inventor or designer information |
Inventor after: Ai Hong Inventor after: Xu Kai Inventor after: Hair people A Sihaer Inventor after: You Yi Inventor after: Wang Jian Inventor after: Zhang Ronghua Inventor after: MAIMAITIAILI ROUZI Inventor after: Zhou Yi Inventor after: Liu Yifan Inventor after: Yu Zhechen Inventor after: Wang Xinxin Inventor after: Wang Liang Inventor after: Zhao Jianping Inventor after: Xu Qiang Inventor after: Zhu Guangyi Inventor after: Zhang Long Inventor after: Zhang Siwen Inventor after: Ma Shurun Inventor after: Liu Yang Inventor before: Ai Hong Inventor before: Hair people A Sihaer Inventor before: You Yi Inventor before: Wang Jian Inventor before: Zhao Jianping Inventor before: Xu Qiang Inventor before: Zhang Long Inventor before: Zhang Siwen Inventor before: Wang Liang Inventor before: Ma Shurun Inventor before: Liu Yang Inventor before: Xu Kai |
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Effective date of registration: 20160411 Address after: 100031 Xicheng District West Chang'an Avenue, No. 86, Beijing Applicant after: State Grid Corporation of China Applicant after: Electric Power Research Institute, State Grid Xinjiang Electric Power Company Applicant after: Xinjiang Uygur Autonomous Region Institute of Special Equipment Inspection Address before: 100031 Xicheng District West Chang'an Avenue, No. 86, Beijing Applicant before: State Grid Corporation of China Applicant before: Electric Power Research Institute, State Grid Xinjiang Electric Power Company |
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