CN104941958A - On-track pollution cleaning device used for Langmuir probe sensing instrument - Google Patents
On-track pollution cleaning device used for Langmuir probe sensing instrument Download PDFInfo
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- CN104941958A CN104941958A CN201410114383.5A CN201410114383A CN104941958A CN 104941958 A CN104941958 A CN 104941958A CN 201410114383 A CN201410114383 A CN 201410114383A CN 104941958 A CN104941958 A CN 104941958A
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- orbit
- relay
- decontamination apparatus
- high voltage
- sensor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
Abstract
The invention provides an on-track pollution cleaning device used for a Langmuir probe sensing instrument. The device comprises a high voltage module, a voltage stabilizing diode, a relay and a power module; the power module is used for driving the high voltage module to generate high voltage and generating a relay control signal at the same time; the voltage stabilizing diode is used for restraining high voltage ripple waves in the high voltage and limiting the voltage value of the high voltage within a set range; a touch spot of the relay controls a circuit between a sensor and the on-track pollution cleaning device to be powered on or powered off through the relay control signal. By means of the on-track pollution cleaning device, the pollution on the surface of the sensor can be removed fast and effectively in the on-track process, and the sensor materials are prevented from damage such as oxidation on account of high-temperature pollution removal; the isolation between the pollution device and a measuring circuit is achieved through the relay, cables inside the sensor are shared, and the under the condition that the internal structure of the sensor is not changed, the structural design is simplified.
Description
Technical field
The present invention relates to the technical field of space exploration, particularly relate to a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument.
Background technology
Langmuir probe sensing instrument is the visual plant of measurement space plasma, and sensor is it realizes the critical component of scientific exploration.When Langmuir probe sensing instrument operation on orbit, if its sensor surface is contaminated, comparatively big error can be produced to the result of scientific measurement, and this error is unpredictable.Therefore, along with the progressively application of Langmuir probe sensing instrument in Chinese Space detection, need to propose one and namely can realize removing sensor sheet surface pollution in-orbit, technical method fast and effectively again.
At present, the method for Langmuir probe sensing instrument depollution normally adopts high temperature depollution technology.As shown in Figure 1, the principle of high temperature depollution is by sensor heating, strengthens the molecule of sensor surface absorption or the warm-up movement of particle, thus removes surface contamination.Specifically at the sensor internal of Langmuir probe, heat filament is installed, makes it generate heat by increasing heater current, thus make sensor surface be in the condition of high temperature, realize surperficial depollution.
And high temperature depollution technology Problems existing comprises: 1. inefficiency, scrubbing time are long; 2. complex structure is realized; 3. sensor material accelerated ageing can be made.This method for separating polluted particles is in implementation procedure, and for avoiding affecting the correct measurement of Langmuir probe in orbit in process, heat filament can not direct feeler surface, and the transmission of its heat is mainly by radiation, and therefore scrubbing efficiency is very low.And after depollution, sensor surface temperature needs the longer time just can return to initial temperature state, and this time is even tens of hours a few hours.
In addition, due to the size of sensor less (being generally cm magnitude), its inner space is limited, and the structural design of the heat filament therefore installed is comparatively complicated, and there is security risk.
In high temperature depollution process, sensor sheet surface temperature can reach up to a hundred degrees Celsius, inevitably causes the accelerated ageing of material, affects its service life.
Summary of the invention
The object of the invention is to, there is inefficiency, scrubbing time long, complex structure for the high temperature method for separating polluted particles solving existing Langmuir probe sensing instrument and easily cause the technical problem that sensor material is aging, the invention provides a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument.This in-orbit decontamination apparatus be by loading high pressure on Langmuir probe sensor, realize the depollution of sensor surface.Its essence is when loading high pressure on Langmuir probe sensor, accelerates to attract space charged particle bombardment sensor surface, thus the molecule or particle that are adsorbed on sensor surface is removed.
For achieving the above object, the invention provides a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument, comprising: high-pressure modular, Zener diode, current-limiting resistance, relay and power module.Described power module produces high voltage for driving high-pressure modular, and produces relay control signal simultaneously; Described Zener diode is used for suppressing the high pressure ripple in high voltage, and is limited in the scope of setting by this high-tension magnitude of voltage; The contact of described relay, by relay control signal, controls sensor and the connecting and disconnecting of the circuit in-orbit between decontamination apparatus.
High pressure depollution can remove sensor sheet surface pollution fast and effectively, and after depollution end-of-job, relay is switched to normal measuring circuit immediately, namely returns to inflight measurement state immediately.The sensor surface temperature that there is not high temperature depollution technology is slowly returned to the process of initial temperature state by high temperature.
As the further improvement of technique scheme, described decontamination apparatus in-orbit also comprises current-limiting resistance, and this current-limiting resistance is used for carrying out current amplitude restriction to the Absorption Current produced in depolluting processes.
As the further improvement of technique scheme, described relay adopts T12PF70YS type electromagnetic relay; The original state of its contact is set as connecting measuring circuit.
As the further improvement of technique scheme, described high-pressure modular produces the high voltage of 100V, and described Zener diode adopts BWC57 type Zener diode.
As the further improvement of technique scheme, described high-pressure modular produces the high voltage of 200V, and described Zener diode adopts 1N6031 type Zener diode.
The advantage of a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument of the present invention is:
Decontamination apparatus in-orbit of the present invention utilizes high pressure depollution, can realize removing sensor sheet surface pollution fast and effectively in process in-orbit, avoids high temperature depollution to cause oxidation equivalent damage to sensor material; Current-limiting resistance is set, effectively can suppresses the Absorption Current produced in depollution process, make it be no more than the maximum rated current of high-pressure modular, play self-protection function; Adopt relay, achieve the isolation of decontamination apparatus and measuring circuit, and share sensor inside cable, simplify the structure when not changing sensor internal structure design.
Accompanying drawing explanation
Fig. 1 is the high temperature scrubbing schematic diagram of existing Langmuir probe sensing instrument.
Fig. 2 is the structural representation of the decontamination apparatus in-orbit for Langmuir probe sensing instrument of the present invention.
Fig. 3 is the structural representation of a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument in the embodiment of the present invention.
Fig. 4 is the relation curve of current-limiting resistance in the present invention and on-load voltage/load current.
Fig. 5 utilizes decontamination apparatus in-orbit of the present invention to carry out the schematic diagram of scrubbing experiment.
Detailed description of the invention
Below in conjunction with drawings and Examples, a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument of the present invention is described in detail.
A kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument of the present invention, comprising: high-pressure modular, Zener diode, relay and power module; Described power module produces high voltage for driving high-pressure modular, and produces relay control signal simultaneously; Described Zener diode is used for suppressing the high pressure ripple in high voltage, and is limited in the scope of setting by this high-tension magnitude of voltage; The contact of described relay, by relay control signal, controls sensor and the connecting and disconnecting of the circuit in-orbit between decontamination apparatus.
This circuit theory is one and produces high pressure by high-pressure modular, is stabilized in scope of design by Zener diode by high voltage; Meanwhile, be switched to the circuit of decontamination apparatus in-orbit by the enable relay of relay control signal, make high voltage be loaded into sensor surface, thus realize high pressure depollution.
As shown in Figure 2, based on the above-mentioned decontamination apparatus in-orbit for Langmuir probe sensing instrument, this in-orbit decontamination apparatus also comprise current-limiting resistance, this current-limiting resistance be used for current amplitude restriction is carried out to the Absorption Current produced in depolluting processes.Owing to sensor being loaded with high pressure in depollution process, Absorption Current can be produced while acceleration absorbs space charged particle bombardment sensor surface.The major function of current-limiting resistance carries out current amplitude restriction to the Absorption Current produced in depollution process, with the maximum rated current avoiding this Absorption Current to exceed high-pressure modular, causes the inefficacy of high-pressure modular.Therefore, the resistance of this current-limiting resistance is selected relevant with maximum rated current to the output high-voltage value of high-pressure modular, is typically chosen in k Ω magnitude resistance.
V
1=V
0-V
rformula (1)
In above formula, V
1for being loaded into the virtual voltage on the sensor of Langmuir probe sensing instrument, V
0for the output voltage of high-pressure modular, V
rfor current-limiting resistance pressure drop, and have:
V
r=IR formula (2)
In above formula, R is current-limiting resistance resistance, and I is Absorption Current value.
+ 200V high pressure is exported as set high-pressure modular, when maximum rated current is 10mA, as shown in Figure 4, the virtual voltage of current-limiting resistance and loading and the relation curve of load current.
As we know from the figure, when current-limiting resistance resistance is 0 Ω, be loaded into the virtual voltage V on the sensor of Langmuir probe sensing instrument
1be+200V, maximum Absorbable rod electric current is 10mA.Along with the increase of current-limiting resistance resistance, its resistance drop V
rincrease, be loaded into the virtual voltage V on the sensor of Langmuir probe sensing instrument
1corresponding reduction; As voltage V
1during reduction, sensor surface absorbs the electric current also corresponding reduction that space charged particle produces, and therefore Absorption Current can not exceed maximum rated current, thus plays a protective role.
The high pressure that described high-pressure modular produces is usually between tens volts to hundreds of volt.This high-pressure modular can be selected to be realized by transformer and peripheral circuit thereof, also can select to be realized by the integrated high voltage module of EMCO company.
Described Zener diode is difference according to high tension voltage value and selected.As design needs the high-pressure modular loading+100V high pressure, the BWC57 Zener diode of BW series can be selected; Design needs the high-pressure modular loading+200V high pressure, can select the 1N6031 Zener diode of 1N series.
Described relay can realize the isolation of decontamination apparatus and measuring circuit in-orbit, makes the depollution work of Langmuir probe sensing instrument and detection operations is separate in-orbit, and does not cause and interfere with each other.This relay can select the T12PF70YS type electromagnetic relay of STPI company.
In the present embodiment, as shown in Figure 3, the original state of T12PF70YS type electromagnetic relay is set as that contact connects measuring circuit.When the work of decontamination apparatus in-orbit, namely power module powers up, and produces relay control signal, and the contact change-over of enable relay, to the circuit of decontamination apparatus in-orbit, realizes and the isolation of measuring circuit simultaneously, thus do not form mutual interference.When decontamination apparatus end-of-job in-orbit, i.e. power module power-off, no longer produces relay control signal, and now relay automatically restores to original state.
The feature of T12PF70YS type electromagnetic relay is that two stationary contact is respectively normally opened contact and normally-closed contact, and its original state is movable contact and normally-closed contact adhesive.When relay coil flows through certain electric current, produce galvanomagnetic-effect, under the effect of electromagnetic attracting force, movable contact and normally-closed contact discharge, with normally opened contact adhesive, thus the object of the conducting reached in circuit and cut-out.
In the circuit structure shown in Fig. 3, sensor connection movable contact, and measuring circuit connection normally-closed contact, be namely initially sensor and measuring circuit is in conducting state.Decontamination apparatus connects normally opened contact in-orbit, is namely initially sensor and is in off-state with decontamination apparatus in-orbit.When decontamination apparatus does not power up in-orbit, relay is in original state all the time.After the power module of decontamination apparatus in-orbit powers up, its current driving apparatus works on power, and produce relay control signal, namely generation current flows through relay coil, enable movable contact and normally-closed contact discharge, with normally opened contact adhesive, namely to disconnect with measuring circuit, and decontamination apparatus conducting in-orbit.When after decontamination apparatus power-off in-orbit, current driving apparatus quits work, and does not produce relay control signal, and no longer include electric current and flow through relay coil, relay automatically restores to original state, and namely sensor and measuring circuit recover conducting state.
As shown in Figure 5, based on above-mentioned a kind of decontamination apparatus in-orbit for Langmuir probe sensing instrument, the computer simulated plasma experimental facilities taking notice of border astrophysics research institute interplanetary space CAS Institute of Physics (INAF-IFSI) that benefits the nation greatly carries out depollution test.
Experimental conditions is as follows:
Respectively the contaminated state of sensor surface of Langmuir probe sensing instrument and loading+200V voltage are depolluted and test, the plasma parameter that each test obtains is compared, in table 1.
Table 1 experimental result data compare of analysis table
Can be found out by above-mentioned experimental result, when sensor surface is contaminated, there is very large relative error in its measurement result and a reference value.After employing high pressure depollution, the relative error measuring the parameters such as plasma electron density, electron temperature and the plasma potential obtained and a reference value is better than 10%, effectively eliminates the pollution of sensor surface.
It should be noted last that, above embodiment is only in order to illustrate technical scheme of the present invention and unrestricted.Although with reference to embodiment to invention has been detailed description, those of ordinary skill in the art is to be understood that, modify to technical scheme of the present invention or equivalent replacement, do not depart from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of right of the present invention.
Claims (5)
1. for a decontamination apparatus in-orbit for Langmuir probe sensing instrument, it is characterized in that, described decontamination apparatus in-orbit comprises: high-pressure modular, Zener diode, relay and power module; Described power module produces high voltage for driving high-pressure modular, and produces relay control signal simultaneously; Described Zener diode is used for suppressing the high pressure ripple in high voltage, and is limited in the scope of setting by this high-tension magnitude of voltage; The contact of described relay, by relay control signal, controls sensor and the connecting and disconnecting of the circuit in-orbit between decontamination apparatus.
2. the decontamination apparatus in-orbit for Langmuir probe sensing instrument according to claim 1, is characterized in that, described decontamination apparatus in-orbit also comprises current-limiting resistance, and this current-limiting resistance is used for carrying out current amplitude restriction to the Absorption Current produced in depolluting processes.
3. the decontamination apparatus in-orbit for Langmuir probe sensing instrument according to claim 1, is characterized in that, described relay adopts T12PF70YS type electromagnetic relay; The original state of its contact is set as connecting measuring circuit.
4. the decontamination apparatus in-orbit for Langmuir probe sensing instrument according to claim 1, is characterized in that, described high-pressure modular produces the high voltage of 100V, and described Zener diode adopts BWC57 type Zener diode.
5. the decontamination apparatus in-orbit for Langmuir probe sensing instrument according to claim 1, is characterized in that, described high-pressure modular produces the high voltage of 200V, and described Zener diode adopts 1N6031 type Zener diode.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410114383.5A CN104941958A (en) | 2014-03-25 | 2014-03-25 | On-track pollution cleaning device used for Langmuir probe sensing instrument |
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| CN201410114383.5A CN104941958A (en) | 2014-03-25 | 2014-03-25 | On-track pollution cleaning device used for Langmuir probe sensing instrument |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113194591A (en) * | 2021-04-23 | 2021-07-30 | 山东大学 | Langmuir probe, system and method for on-orbit decontamination |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4432904A1 (en) * | 1994-09-15 | 1996-03-28 | Alexandre Prof Dr Smolianitski | Method for cleaning sediment from articles |
| CN1538734A (en) * | 2003-04-15 | 2004-10-20 | 彩虹彩色显像管总厂 | Protective circuit for preventing film burn |
| CN101650230A (en) * | 2009-09-09 | 2010-02-17 | 大连理工大学 | Multifunctional probe for plasma diagnosis |
| CN101701926A (en) * | 2009-10-13 | 2010-05-05 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device for cleaning contaminants on surface of spherical Langmuir probe |
| WO2010057721A1 (en) * | 2008-11-21 | 2010-05-27 | Cameca | Tomography atomic probe comprising a high voltage electric pulse electro-optical generator |
| CN202013853U (en) * | 2010-12-13 | 2011-10-19 | 宁波信泰机械有限公司 | High-voltage relay service life prolonging protective circuit for electric automobile |
| CN202150743U (en) * | 2011-07-01 | 2012-02-22 | 广东电网公司电力科学研究院 | Coupling energy taking power supply system for high voltage transmission line fault monitoring |
| EP2521158A1 (en) * | 2011-05-05 | 2012-11-07 | Imec | Plasma probe and method for plasma diagnostics |
| CN103140009A (en) * | 2013-01-31 | 2013-06-05 | 北京航空航天大学 | Langmuir multi-probe control circuit used for plasma diagnosis |
-
2014
- 2014-03-25 CN CN201410114383.5A patent/CN104941958A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4432904A1 (en) * | 1994-09-15 | 1996-03-28 | Alexandre Prof Dr Smolianitski | Method for cleaning sediment from articles |
| CN1538734A (en) * | 2003-04-15 | 2004-10-20 | 彩虹彩色显像管总厂 | Protective circuit for preventing film burn |
| WO2010057721A1 (en) * | 2008-11-21 | 2010-05-27 | Cameca | Tomography atomic probe comprising a high voltage electric pulse electro-optical generator |
| CN101650230A (en) * | 2009-09-09 | 2010-02-17 | 大连理工大学 | Multifunctional probe for plasma diagnosis |
| CN101701926A (en) * | 2009-10-13 | 2010-05-05 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device for cleaning contaminants on surface of spherical Langmuir probe |
| CN202013853U (en) * | 2010-12-13 | 2011-10-19 | 宁波信泰机械有限公司 | High-voltage relay service life prolonging protective circuit for electric automobile |
| EP2521158A1 (en) * | 2011-05-05 | 2012-11-07 | Imec | Plasma probe and method for plasma diagnostics |
| CN202150743U (en) * | 2011-07-01 | 2012-02-22 | 广东电网公司电力科学研究院 | Coupling energy taking power supply system for high voltage transmission line fault monitoring |
| CN103140009A (en) * | 2013-01-31 | 2013-06-05 | 北京航空航天大学 | Langmuir multi-probe control circuit used for plasma diagnosis |
Non-Patent Citations (1)
| Title |
|---|
| 刘超等: "朗缪尔探针在轨快速除污染技术研究", 《空间科学学报》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113194591A (en) * | 2021-04-23 | 2021-07-30 | 山东大学 | Langmuir probe, system and method for on-orbit decontamination |
| CN113194591B (en) * | 2021-04-23 | 2022-08-26 | 山东大学 | Langmuir probe, system and method for on-orbit decontamination |
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