CN104931771A - Pulse voltage amplitude measurement device - Google Patents
Pulse voltage amplitude measurement device Download PDFInfo
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- CN104931771A CN104931771A CN201510260046.1A CN201510260046A CN104931771A CN 104931771 A CN104931771 A CN 104931771A CN 201510260046 A CN201510260046 A CN 201510260046A CN 104931771 A CN104931771 A CN 104931771A
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- 238000005259 measurement Methods 0.000 title claims abstract description 43
- 238000005070 sampling Methods 0.000 claims abstract description 10
- 239000000523 sample Substances 0.000 abstract description 5
- 238000012360 testing method Methods 0.000 description 23
- 239000004065 semiconductor Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 5
- 230000006641 stabilisation Effects 0.000 description 5
- 238000011105 stabilization Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
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Abstract
The invention discloses a pulse voltage amplitude measurement device, which is characterized by comprising a high-voltage pulse attenuator and a digitizer. The low voltage output end of the high-voltage pulse attenuator is connected with the V+ end of the digitizer. The grounding end of the high-voltage pulse attenuator is connected with the V- end of the digitizer. Meanwhile, a measuring probe is reserved at the high voltage output end and the grounding end of the high-voltage pulse attenuator, respectively. The measuring probe at the high voltage output end of the high-voltage pulse attenuator is used for being connected with the voltage output terminal + end of the high-voltage power supply of to-be-measured equipment. The measuring probe at the grounding end of the high-voltage pulse attenuator is used for being connected with the voltage output terminal - end of the high-voltage power supply of to-be-measured equipment. According to the technical scheme of the invention, the digitizer and the high-voltage pulse attenuator are sufficiently large in bandwidth, sufficiently high in sampling rate, sufficiently fast in response speed, and sufficiently high in technical index of pulse voltage measurement. Therefore, the device can be used for quickly and accurately measuring the amplitude of the pulsed voltage.
Description
Technical field
The present invention relates to a kind of measurement mechanism, be specifically related to a kind of pulse voltage amplitude measurement mechanism.
Background technology
Power semiconductor device has the excellent performance such as input impedance is high, driving power is little, control circuit is simple, switching loss is little, break-make speed is fast, frequency of operation is high, element volume is large.The voltage of power semiconductor device can reach several kilovolts, electric current can reach kiloampere, power can reach a few megawatt, when carrying out pulse test in such a situa-tion, the pulse width obtained is often between a few microsecond to hundreds of microsecond, and thus power semiconductor device is widely used in the guided missile launcher etc. on the Switching Power Supply of the domain-specific such as Aeronautics and Astronautics and military project electronics, AC Motor Control system, naval vessels.
Power semiconductor device testing apparatus is the equipment being specifically designed to measured power semiconductor device parameter.When power semiconductor device testing apparatus carries out parameter testing to power semiconductor device, widely use pulse testing method, namely test apply the condition of bias pulse voltage source and bias pulse current source at power semiconductor device under, the test condition making measured device both meet parameter testing to specify, meets again the test environment temperature of regulation.And for the parameter testing of power IGBT module, the pulse power applied needs larger, the pulse width adopted is also more strict, the testing apparatus that current use amount is larger is the TRDS series of products of LEMSYS company of Switzerland and domestic CESI series of products, these two serial products all adopt 50 μ s methods of testing, namely apply pulse voltage and the pulse current time is all limited in 50 μ s.
By discovery of investigating to domestic and international power semiconductor device testing apparatus, when power semiconductor device testing apparatus measures power IGBT module parameter, power IGBT module parameter is determined according to pulse stabilization part reading averaged, such equipment development producer is according to the technical feature of designed impulse source, for 50 μ s single pulse width, its rise time general is within 10 μ s, fall time is at 10 μ s, pulse stabilization part is at middle 30 μ s, in test process, ensure test synchronously in input (applying), export (measurement) terminal to measure, general measure point is 1/3 ~ 2/3 (20 μ s ~ 30 μ s part) averaged of steady component, as the input of measurement result, the value of correlation parameter is calculated according to measurement result.
Domestic generally use oscilloscope measurement pulse voltage amplitude at present, especially by oscillograph and high-voltage probe ranging pulse voltage, owing to being subject to the many factors impacts such as oscillograph technical indicator is lower, high-voltage probe bandwidth, oscilloscope measurement pulse voltage amplitude is subject to certain restrictions.
Summary of the invention
For solving the deficiencies in the prior art, the object of the present invention is to provide a kind of can the measurement mechanism of ranging pulse voltage amplitude fast and accurately.
In order to realize above-mentioned target, the present invention adopts following technical scheme:
A kind of pulse voltage amplitude measurement mechanism, it is characterized in that, be made up of voltage divider for high-voltage pulse (1) and digitizer (2), the input adapter form of aforementioned digital instrument (2) is BNC revolution joint, and the low-voltage output of aforementioned voltage divider for high-voltage pulse (1) is connected to " V of digitizer (2)
+" end, earth terminal be connected to the " V of digitizer (2)
-" end; the simultaneously high-voltage output end of voltage divider for high-voltage pulse (1) and earth terminal reserved measuring sonde (4; 5) respectively; the measuring sonde (4) being positioned at the high-voltage output end of voltage divider for high-voltage pulse (1), for connecting high-voltage power supply output voltage terminals "+" end of measured equipment (3), is positioned at the measuring sonde (5) of the earth terminal of voltage divider for high-voltage pulse (1) for connecting high-voltage power supply output voltage terminals "-" end of measured equipment (3).
Aforesaid pulse voltage amplitude measurement mechanism, is characterized in that, the intrinsic standoff ratio of aforementioned voltage divider for high-voltage pulse (1) is 1000:1.
Aforesaid pulse voltage amplitude measurement mechanism, is characterized in that, the sampling rate >=500kS/s of aforementioned digital instrument (2), bandwidth >=10MHz.
Aforesaid pulse voltage amplitude measurement mechanism, is characterized in that, aforementioned digital instrument (2) adopts the PXI 5122 type digitizer of NI company.
Usefulness of the present invention is:
(1) because the digitizer that adopts and voltage divider for high-voltage pulse bandwidth are enough large, sampling rate is enough high, and response speed is enough fast, so measurement mechanism of the present invention can Quick Measurement pulse voltage amplitude;
(2) because the digitizer that adopts and voltage divider for high-voltage pulse pulse voltage measuring technique index enough high, sampling rate is enough high, so measurement mechanism of the present invention can Measurement accuracy pulse voltage amplitude.
Accompanying drawing explanation
Fig. 1 is the composition schematic diagram of measurement mechanism of the present invention;
Fig. 2 is measurement mechanism in Fig. 1 and the connection diagram between measured equipment.
The implication of Reference numeral in figure: 1-voltage divider for high-voltage pulse, 2-digitizer, the measured equipment of 3-, 4-connector, 5-connector, A-high voltage input terminal, B-low-voltage output, C-earth terminal.
Embodiment
Below in conjunction with the drawings and specific embodiments, concrete introduction is done to the present invention.
See figures.1.and.2, pulse voltage amplitude measurement mechanism of the present invention, it is made up of voltage divider for high-voltage pulse 1 and digitizer 2, wherein, the input adapter form of digitizer 2 is BNC revolution joint, and the low-voltage output B of voltage divider for high-voltage pulse 1 is connected to the " V of digitizer 2
+" end, earth terminal C is connected to the " V of digitizer 2
-" end; meanwhile; the high-voltage output end A of voltage divider for high-voltage pulse 1 and earth terminal C is also reserved with connector 4 and connector 5 respectively; connector 4 is positioned at the high-voltage output end A of voltage divider for high-voltage pulse 1; for connecting high-voltage power supply output voltage terminals "+" end of measured equipment 3; connector 5 is positioned at the earth terminal C of voltage divider for high-voltage pulse 1, for connecting high-voltage power supply output voltage terminals "-" end of measured equipment 3.
In the present invention, the intrinsic standoff ratio of voltage divider for high-voltage pulse 1 is 1000:1, and this intrinsic standoff ratio is conducive to high voltage pulse signal to be converted to low voltage signal, makes it to be within the scope of digitizer measures.
Voltage divider for high-voltage pulse 1 preferably adopts the model of technology standardization research institute of China Electronics development to be the voltage divider for high-voltage pulse of CESI001, its technical indicator of the voltage divider for high-voltage pulse of this model is better than ± and 1%, time constant is better than 10 μ s, within 20 μ s ~ 30 μ s periods, the relative standard deviation of voltage magnitude is lower than ± 0.2%, and DC power is greater than 10W.
In the present invention, sampling rate >=the 500kS/s of digitizer 2, bandwidth >=10MHz, fully ensure that in the pulse width of 50 μ s, the measure portion chosen is middle 10 μ s parts, can collect 5 sampled points, measured like this amplitude can reduce the impact of uncertainty of measurement repetitive element.
Digitizer 2 preferably adopts the PXI 5122 type digitizer of NI company.Digitizer uncertainty of measurement component under the sampling rate of 500kS/s of this model is better than 0.3%.
In the present invention, what measured equipment 3 was selected is power semiconductor device test macro, and it realizes the transmission of signal and power supply in the mode of motherboard.
According to power semiconductor device measuring principle, except measurement mechanism separately has regulation, the calibration steps of measurement mechanism should be consistent with the measuring principle of measurement mechanism, and the mean value for 1/3 ~ 2/3 part (20 μ s-30 μ s) of pulse voltage source steady component is measured.If power semiconductor device test macro (measured equipment 3) mode of operation is pressurization flow measurement pattern, arranging internal pulses high-voltage power supply exports as V, through voltage divider for high-voltage pulse 1, (its scale-up factor is set to k), the data point collected can be carried out record by digitizer 2, is designated as V in calibration region averaged
1, its measured value calculates by following formula:
V
0＝V
1×k。
By investigating to domestic and international power IGBT testing apparatus, for power IGBT module testing apparatus, when measuring power IGBT module parameter, determine according to pulse stabilization part reading averaged, such equipment development producer is according to the technical feature of designed impulse source, for 50 μ s single pulse width, its rise time general is within 10 μ s, fall time is at 10 μ s, pulse stabilization part is at middle 30 μ s (50 μ s-10 μ s-10 μ s), in test process, ensure test synchronously in input (applying), export (measurement) terminal to measure, general measure point is 1/3 ~ 2/3 (20 μ s ~ 30 μ s part) averaged of steady component, as the input of measurement result, the value of correlation parameter is calculated according to measurement result.
In the present invention, sampling rate >=the 500kS/s of digitizer 2, namely every 2 μ s gather a sampled point, for the pulse stabilization part of 10 μ s, 5 points can be collected, averaged is as pulse current amplitude measurement result, due to digitizer 2 bandwidth >=10MHz, can calculate as 35ns on rise time impact, for 50 μ s single pulse, the measure portion that we choose is middle 10 μ s parts, front edge portion is better than 20 μ s, due to 35ns<<20 μ s, so can measurement demand be met completely.
Analyze:
(1) because institute's employing digitizer and high voltage pulse voltage divider bandwidth are enough large, sampling rate is enough high, and response speed is enough fast, so measurement mechanism of the present invention can Quick Measurement pulse voltage amplitude.
(2) because the digitizer that adopts and voltage divider for high-voltage pulse pulse voltage measuring technique index enough high, sampling rate is enough high, so measurement mechanism of the present invention can Measurement accuracy pulse voltage amplitude.
Measurement mechanism of the present invention is except being used for measuring except the internal pulses voltage amplitude of power semiconductor device test macro, and its application also may extend to communication and radio art, is used for measuring the pulse voltage amplitude etc. that power electronic devices parameter applies.
It should be noted that, above-described embodiment does not limit the present invention in any form, the technical scheme that the mode that all employings are equal to replacement or equivalent transformation obtains, and all drops in protection scope of the present invention.
Claims (4)
1. a pulse voltage amplitude measurement mechanism, it is characterized in that, be made up of voltage divider for high-voltage pulse (1) and digitizer (2), the input adapter form of described digitizer (2) is BNC revolution joint, and the low-voltage output of described voltage divider for high-voltage pulse (1) is connected to " V of digitizer (2)
+" end, earth terminal be connected to the " V of digitizer (2)
-" end; simultaneously the high-voltage output end of voltage divider for high-voltage pulse (1) and earth terminal are reserved with connector (4; 5) respectively; the connector (4) being positioned at the high-voltage output end of voltage divider for high-voltage pulse (1), for connecting high-voltage power supply output voltage terminals "+" end of measured equipment (3), is positioned at the connector (5) of the earth terminal of voltage divider for high-voltage pulse (1) for connecting high-voltage power supply output voltage terminals "-" end of measured equipment (3).
2. pulse voltage amplitude measurement mechanism according to claim 1, is characterized in that, the intrinsic standoff ratio of described voltage divider for high-voltage pulse (1) is 1000:1.
3. pulse voltage amplitude measurement mechanism according to claim 1 and 2, is characterized in that, the sampling rate >=500kS/s of described digitizer (2), bandwidth >=10MHz.
4. pulse voltage amplitude measurement mechanism according to claim 3, is characterized in that, described digitizer (2) adopts the PXI 5122 type digitizer of NI company.
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|---|---|---|---|
| CN201510260046.1A CN104931771A (en) | 2015-05-20 | 2015-05-20 | Pulse voltage amplitude measurement device |
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| CN201510260046.1A CN104931771A (en) | 2015-05-20 | 2015-05-20 | Pulse voltage amplitude measurement device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342800A (en) * | 2018-11-29 | 2019-02-15 | 贵州航天计量测试技术研究所 | A kind of calibrating installation and calibration method of pulse plating power pulse current |
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|---|---|---|---|---|
| JP2002048829A (en) * | 2000-08-03 | 2002-02-15 | Mitsubishi Electric Corp | Impulse voltage measuring device |
| CN201935949U (en) * | 2010-12-28 | 2011-08-17 | 中国工程物理研究院流体物理研究所 | Pulse measurement signal ground potential isolator |
| CN102288806A (en) * | 2011-07-05 | 2011-12-21 | 江苏东方航天校准检测有限公司 | Device and method for measuring pulse high-voltage peak and time parameter |
| CN102323561A (en) * | 2011-08-03 | 2012-01-18 | 刘冲 | Pulse high-current amplitude calibrating device for semiconductor device test system |
| CN204241638U (en) * | 2014-12-05 | 2015-04-01 | 中国电子技术标准化研究院 | The pulse current amplitude calibrating installation of power IGBT module testing apparatus |
| CN204789743U (en) * | 2015-05-20 | 2015-11-18 | 中国电子技术标准化研究院 | Pulse voltage width of cloth measuring device |
-
2015
- 2015-05-20 CN CN201510260046.1A patent/CN104931771A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002048829A (en) * | 2000-08-03 | 2002-02-15 | Mitsubishi Electric Corp | Impulse voltage measuring device |
| CN201935949U (en) * | 2010-12-28 | 2011-08-17 | 中国工程物理研究院流体物理研究所 | Pulse measurement signal ground potential isolator |
| CN102288806A (en) * | 2011-07-05 | 2011-12-21 | 江苏东方航天校准检测有限公司 | Device and method for measuring pulse high-voltage peak and time parameter |
| CN102323561A (en) * | 2011-08-03 | 2012-01-18 | 刘冲 | Pulse high-current amplitude calibrating device for semiconductor device test system |
| CN204241638U (en) * | 2014-12-05 | 2015-04-01 | 中国电子技术标准化研究院 | The pulse current amplitude calibrating installation of power IGBT module testing apparatus |
| CN204789743U (en) * | 2015-05-20 | 2015-11-18 | 中国电子技术标准化研究院 | Pulse voltage width of cloth measuring device |
Non-Patent Citations (1)
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|---|
| 杨宾 等: "高电压毫微秒脉冲分压器测试系统的研制" * |
Cited By (1)
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|---|---|---|---|---|
| CN109342800A (en) * | 2018-11-29 | 2019-02-15 | 贵州航天计量测试技术研究所 | A kind of calibrating installation and calibration method of pulse plating power pulse current |
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Application publication date: 20150923 |