CN104931590A - Magnetic probe - Google Patents

Magnetic probe Download PDF

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Publication number
CN104931590A
CN104931590A CN201510420936.4A CN201510420936A CN104931590A CN 104931590 A CN104931590 A CN 104931590A CN 201510420936 A CN201510420936 A CN 201510420936A CN 104931590 A CN104931590 A CN 104931590A
Authority
CN
China
Prior art keywords
hole
wafer
probe
epoxy resin
voussoir
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510420936.4A
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Chinese (zh)
Inventor
王钲清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Co Ltd Of Normal Selectron Of Changzhou Research Institute
Original Assignee
Co Ltd Of Normal Selectron Of Changzhou Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Co Ltd Of Normal Selectron Of Changzhou Research Institute filed Critical Co Ltd Of Normal Selectron Of Changzhou Research Institute
Priority to CN201510420936.4A priority Critical patent/CN104931590A/en
Publication of CN104931590A publication Critical patent/CN104931590A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

The invention relates to the technical field of nondestructive tests, in particular to a magnetic probe which comprises a wafer and a wedge block with a slope. The wafer is arranged on the slope of the wedge block. A through hole is formed in the wedge block in the direction of wave beams emitted by the wafer. The shape of the section, perpendicular to the axis of the through hole, of the through hole is the same as that of the wafer. Epoxy resin is poured in the through hole. A groove is formed in the bottom face of the wedge block. A magnet matched with the groove is arranged in the groove. By forming the through hole in the slope of the wedge block in the direction of the wave beams emitted by the wafer and filling the through hole with the high-price epoxy resin, on one hand, the detection precision of the probe can be improved; on the other hand, the epoxy resin is only adopted in the through hole, the overall cost is low, and the probe can be attracted to the surface of a workpiece through the magnet during detection.

Description

Magnetic probe
Technical field
The present invention relates to technical field of nondestructive inspection, especially a kind of magnetic probe.
Background technology
The propagation of vibration in elastic medium is called fluctuation, be called for short ripple, frequency is higher than the mechanical wave of 20KHz, be called ultrasound wave, when ultrasound wave by a kind of medium incident to another kind of medium time, because in two media, velocity of propagation is different, medium face can produce the phenomenons such as reflection, refraction and waveform transformation, probe can only launch the row wave beam suitable with probe wafer size, be the sensing range of this probe, angle probe is all got used to making wedge with organic glass, to form the sound wave incident angle needed for, and reaches the object of shape transformation.A two normal probe of one receipts type partition type and double oblique probe are also all using organic glass as sound penetrating wedge, this is because organic glass acoustical behavior is good, but its velocity of sound variation with temperature changes and easy to wear to some extent, so should often test the angle of probe and revise, epoxy resin acoustical behavior is good, but expensive, if adopt epoxy resin to make the high cost that wedge can cause angle probe, existing angle probe can not well and surface of the work fit.
Summary of the invention
The technical problem to be solved in the present invention is: in order to solve, existing probe can not well and surface of the work be fitted, wedge made by a kind of organic glass that adopts, but the velocity of sound variation with temperature of organic glass changes to some extent and the easy to wear and another kind of epoxy resin that adopts causes the deficiency of probe high cost as wedge, a kind of magnetic probe is now provided, it can easily machine-shaping, cost is low and acoustical behavior good, can be adsorbed on surface of the work.
The technical solution adopted for the present invention to solve the technical problems is: a kind of magnetic probe, comprise wafer and the voussoir with an inclined-plane, described wafer is installed on the inclined-plane of described voussoir, described voussoir offers through hole along the direction of wafer launching beam, described through hole is consistent with the shape of described wafer perpendicular to the cross section of its axis, epoxy resin is cast with in described through hole, , the bottom surface of described voussoir offers groove, the magnet matched with it is provided with in described groove, in the place of the acoustic beam process that wafer is launched, but epoxy resin that acoustical behavior good more expensive by price, the detection accuracy of probe can be improved on the one hand, another aspect is that epoxy resin is so holistic cost is relatively low because of what only have the interior employing of through hole, magnet can make voussoir be adsorbed on surface of the work.
For the ease of processing, further, the material of described voussoir is organic glass, and organic glass is easy to machine-shaping.
The invention has the beneficial effects as follows: magnetic probe of the present invention by offering through hole along the direction of wafer transmitted beam on the inclined-plane of voussoir, expensive epoxy resin is filled in through hole, the detection accuracy of probe can be improved on the one hand, another aspect is that epoxy resin is so holistic cost is relatively low because of what only have the interior employing of through hole, when detecting, magnet can make probe be adsorbed on surface of the work.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the present invention is further described.
Fig. 1 is the schematic diagram of magnetic probe of the present invention.
In figure: 1, inclined-plane, 2, voussoir, 3, wafer, 4, through hole, 5, magnet.
Embodiment
In conjunction with the accompanying drawings, the present invention is further detailed explanation.These accompanying drawings are the schematic diagram of simplification, only basic structure of the present invention are described in a schematic way, and therefore it only shows the formation relevant with the present invention.
Embodiment 1
As shown in Figure 1, a kind of magnetic probe, comprise wafer 3 and the voussoir 2 with an inclined-plane 1, described wafer 3 is installed on the inclined-plane 1 of described voussoir 2, described voussoir 2 offers through hole 4 along the direction of wafer 3 launching beam, described through hole 4 is consistent with the shape of described wafer 3 perpendicular to the cross section of its axis, epoxy resin is cast with in described through hole 4, the bottom surface of described voussoir 2 offers groove, the magnet 5 matched with it is provided with in described groove, in the place of the acoustic beam process that wafer 3 is launched, but epoxy resin that acoustical behavior good more expensive by price, the detection accuracy of probe can be improved on the one hand, another aspect is that epoxy resin is so holistic cost is relatively low because of what only have the interior employing of through hole 4, when detecting, magnet 5 can make voussoir 2 be adsorbed on surface of the work.
The material of described voussoir 2 is organic glass, and organic glass is easy to machine-shaping.
Compared with prior art this probe by offering through hole 4 along the direction of wafer 3 transmitted beam on the inclined-plane 1 of voussoir 2, expensive epoxy resin is filled in through hole 4, the detection accuracy of probe can be improved on the one hand, on the other hand because only have adopt in through hole 4 be epoxy resin so holistic cost is relatively low, when detecting, magnet 5 can make probe be adsorbed on surface of the work.
Above-mentioned is enlightenment according to desirable embodiment of the present invention, and by above-mentioned description, relevant staff in the scope not departing from this invention technological thought, can carry out various change and amendment completely.The technical scope of this invention is not limited to the content on instructions, must determine its technical scope according to right.

Claims (2)

1. a magnetic probe, comprise wafer (3) and there is the voussoir (2) of an inclined-plane (1), it is characterized in that: the inclined-plane (1) of described voussoir (2) is upper installs described wafer (3), described voussoir (2) offers through hole (4) along the direction of wafer (3) launching beam, described through hole (4) is consistent with the shape of described wafer (3) perpendicular to the cross section of its axis, described through hole is cast with epoxy resin in (4), the bottom surface of described voussoir (2) offers groove, the magnet (5) matched with it is provided with in described groove.
2. magnetic probe according to claim 1, is characterized in that: the material of described voussoir (2) is organic glass.
CN201510420936.4A 2015-07-16 2015-07-16 Magnetic probe Pending CN104931590A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510420936.4A CN104931590A (en) 2015-07-16 2015-07-16 Magnetic probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510420936.4A CN104931590A (en) 2015-07-16 2015-07-16 Magnetic probe

Publications (1)

Publication Number Publication Date
CN104931590A true CN104931590A (en) 2015-09-23

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510420936.4A Pending CN104931590A (en) 2015-07-16 2015-07-16 Magnetic probe

Country Status (1)

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CN (1) CN104931590A (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0259661A (en) * 1988-08-25 1990-02-28 Mitsubishi Electric Corp Ultrasonic probe
CN201408180Y (en) * 2009-03-18 2010-02-17 天津市电力公司 Ultrasonic guided wave probe for detection of electric power tower angle steels
CN103364492A (en) * 2013-07-17 2013-10-23 江苏省特种设备安全监督检验研究院镇江分院 Adjustable weld inspection guided wave probe and use method thereof
CN203502389U (en) * 2013-07-15 2014-03-26 中国石油天然气第一建设公司 Ultrasonic detection probe wedge block adopting time-of-flight diffraction method for welding joint of bending tube
CN203849218U (en) * 2014-05-27 2014-09-24 中国石油天然气集团公司 Probe wedge block structure for time of flight diffraction
CN204314260U (en) * 2014-12-24 2015-05-06 天津鼎安特金属检测科技有限公司 There is the phased array voussoir of wearing quality and adsorbability
CN204740231U (en) * 2015-07-16 2015-11-04 常州市常超电子研究所有限公司 Magnetism probe

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0259661A (en) * 1988-08-25 1990-02-28 Mitsubishi Electric Corp Ultrasonic probe
CN201408180Y (en) * 2009-03-18 2010-02-17 天津市电力公司 Ultrasonic guided wave probe for detection of electric power tower angle steels
CN203502389U (en) * 2013-07-15 2014-03-26 中国石油天然气第一建设公司 Ultrasonic detection probe wedge block adopting time-of-flight diffraction method for welding joint of bending tube
CN103364492A (en) * 2013-07-17 2013-10-23 江苏省特种设备安全监督检验研究院镇江分院 Adjustable weld inspection guided wave probe and use method thereof
CN203849218U (en) * 2014-05-27 2014-09-24 中国石油天然气集团公司 Probe wedge block structure for time of flight diffraction
CN204314260U (en) * 2014-12-24 2015-05-06 天津鼎安特金属检测科技有限公司 There is the phased array voussoir of wearing quality and adsorbability
CN204740231U (en) * 2015-07-16 2015-11-04 常州市常超电子研究所有限公司 Magnetism probe

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Application publication date: 20150923