CN104915695A - Method and device for testing dual-interface IC card - Google Patents
Method and device for testing dual-interface IC card Download PDFInfo
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- CN104915695A CN104915695A CN201510354755.6A CN201510354755A CN104915695A CN 104915695 A CN104915695 A CN 104915695A CN 201510354755 A CN201510354755 A CN 201510354755A CN 104915695 A CN104915695 A CN 104915695A
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Abstract
The invention discloses a method and a device for testing a dual-interface IC card, and relates to the technical field of dual-interface IC card testing. The method comprises the steps of establishing a plurality of function test libraries according to functions supported by a dual-interface IC card to be tested; reading information of the dual-interface IC card, selecting the corresponding function test library to act as a function test library to be tested according to the information of the dual-interface IC card and test requirements, and importing data of the function test library to be tested; testing the dual-interface IC card to be tested by using the data of the function test library to be tested; judging whether the dual-interface IC card passes the test or not, outputting a correct test result if the dual-interface IC card passes the test, and putting an end to the test; and otherwise, returning an error prompt message, outputting an incorrect test result, and putting an end to the test. The method and the device disclosed by the invention can realize automatic tests for the dual-interface IC card, the work intensity is reduced, the work efficiency is improved, and the product quality of the dual-interface IC card is effectively ensured.
Description
Technical field
The present invention relates to double-interface IC card technical field of measurement and test, is specifically a kind of method of testing and equipment of double-interface IC card.
Background technology
Along with the continuous popularization of smart card techniques and perfect, national requirements bank completes the progressively replacement of magnetic stripe card to chip card (smart card), and then makes the use of double-interface IC card also more and more extensive.Double-interface IC card is a kind of smart card integrating contact and non-contact interface, has contact interface and non-contact interface two operation interfaces, realizes the access to chip by the way of contact and cordless.
In order to meet the different demands of different industries under contact interface and non-contact interface use, before product is issued, need to carry out dependence test to guarantee product quality to double-interface IC card.Therefore, the test of double-interface IC card is made to become a requisite important step in double-interface IC card production.
That existing double-interface IC card test adopts is manual testing.In test process, tester needs artificial switching frequently under contact and non-contacting test environment, with the actual use scenes of analog subscriber, not only working strength is large, efficiency is lower, and manual switching processing ease generation mistakes and omissions, the product quality of double-interface IC card can be affected time serious.
Summary of the invention
The object of the invention is the deficiency in order to overcome above-mentioned background technology, a kind of method of testing and equipment of double-interface IC card are provided, the automatic test of double-interface IC card can be realized, reduce working strength, increase work efficiency, and effectively ensure that the product quality of double-interface IC card.
For reaching above object, the technical scheme that the present invention takes is: the method for testing providing a kind of double-interface IC card, comprises the following steps:
A, the function supported according to double-interface IC card to be measured, create multiple functional test storehouse, forward step B to;
B, read the information of double-interface IC card, select corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, import the data in functional test storehouse to be measured, forward step C to;
C, utilize the data in functional test storehouse to be measured to test double-interface IC card to be measured, forward step D to;
D, judge test whether pass through, if so, export correct test result, terminate; Otherwise return miscue information, output error test result, terminate.
On the basis of technique scheme, the function of the support of double-interface IC card described in steps A is contact interface function, non-contact interface function and two interface alternation function; Contact interface function correspondence contact functional test storehouse, the corresponding non-contact function test library of non-contact interface function, the corresponding two interface alternation functional test storehouse of two interface alternation function.
On the basis of technique scheme, create multiple functional test storehouse described in steps A, specifically comprise the following steps:
When creating contact functional test storehouse according to contact interface function, define the switching command for being switched to contact interface, and write the engaged test result for the engaged test instruction and expection testing contact function;
When creating non-contact function test library according to non-contact interface function, define the switching command for being switched to non-contact interface, and write the non-contact testing result for the non-contact testing instruction and expection testing non-contact function;
When creating two interface alternation functional test storehouse according to two interface alternation function, definition is for being switched to the switching command of contact interface and the switching command for being switched to non-contact interface, and write is for testing two interactive testing instruction of interface alternation function and the interactive testing result of expection.
On the basis of technique scheme, step C specifically comprises the following steps: the switching command utilizing functional test storehouse to be measured, is switched to corresponding interface by double-interface IC card to be measured; Test instruction according to functional test storehouse to be measured is tested double-interface IC card to be measured, and logging test results.
On the basis of technique scheme, step D specifically comprises the following steps: the test result of expecting described in the test result recorded in step C and steps A contrasted, if comparing result is consistent, is then judged as that test is passed through, export correct test result, terminate; If comparing result is inconsistent, is then judged as that test is not passed through, returns miscue information, output error test result, terminate.
The present invention also provides a kind of testing apparatus realizing the double-interface IC card of said method, comprises test library creation module, test library data importing module, testing execution module and test result output module;
Described test library creation module is used for: the function supported according to double-interface IC card to be measured, creates multiple functional test storehouse, sends lead-in signal to test library data importing module;
Described test library data importing module is used for: after receiving lead-in signal, read the information of double-interface IC card, select corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, by the data importing in functional test storehouse to be measured in testing execution module, and send executive signal to testing execution module;
Described testing execution module is used for: after receiving executive signal, utilizes the data in functional test storehouse to be measured to test double-interface IC card to be measured, sends result output signal to test result output module;
Described test result output module is used for: after receiving result output signal, judges whether test is passed through, and if so, exports correct test result, terminates; Otherwise return miscue information, output error test result, terminate.
On the basis of technique scheme, the function of described double-interface IC card support is contact interface function, non-contact interface function and two interface alternation function; Contact interface function correspondence contact functional test storehouse, the corresponding non-contact function test library of non-contact interface function, the corresponding two interface alternation functional test storehouse of two interface alternation function.
On the basis of technique scheme, the content in described contact functional test storehouse comprises switching command for being switched to contact interface, engaged test result for the engaged test instruction and expection of testing contact function; The content of described non-contact function test library comprises switching command for being switched to non-contact interface, non-contact testing result for the non-contact testing instruction and expection of testing non-contact function; The content in described pair of interface alternation functional test storehouse comprise switching command for being switched to contact interface, for be switched to non-contact interface switching command, for testing two interactive testing instruction of interface alternation function and the interactive testing result of expection.
Beneficial effect of the present invention is:
(1) in the present invention, according to the function that double-interface IC card to be measured is supported, create multiple functional test storehouse, select one or more functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement during test, import the data in this functional test storehouse to be measured, utilize the data imported to test double-interface IC card to be measured.With need compared with a large amount of manual operation in prior art, whole test process of the present invention all completes automatically, without the need to a large amount of hand fit, only need operator, make test automation degree high, not only considerably improve production efficiency, and effectively can also ensure the reliability of test mass.
(2) in the present invention, when creating multiple functional test storehouse, predefined is understood for being switched to contact interface or/and the switching command of non-contact interface; When testing, can switching command be utilized, automatically double-interface IC card to be measured is first switched to corresponding interface, then carrying out corresponding test.With need in prior art tester artificial contact with non-contacting test environment under carry out blocked operation frequently and compare, the present invention can carry out changing interface operation automatically, not only working strength can be reduced, increase work efficiency, and the mistakes and omissions problem that can also effectively avoid manual switching to operate, make test accuracy rate high, good product quality.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the method for testing of double-interface IC card in the embodiment of the present invention.
Embodiment
Below in conjunction with drawings and the specific embodiments, the present invention is described in further detail.
Shown in Figure 1, the embodiment of the present invention provides a kind of method of testing of double-interface IC card, comprises the following steps:
S1: the function supported according to double-interface IC card to be measured, creates multiple functional test storehouse, forward S2 to.
In S1, multiple functional test storehouse comprises contact functional test storehouse, non-contact function test library and two interface alternation functional test storehouse.
S2: read the information of double-interface IC card, selects corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, imports the data in functional test storehouse to be measured, forward S3 to.
S3: utilize the data in functional test storehouse to be measured to test double-interface IC card to be measured, judges whether test is passed through, and if so, forwards S4 to; Otherwise forward S5 to.
S4: directly export correct test result, terminates.
S5: after returning miscue information, output error test result, terminates.
The function of double-interface IC card support in S1 is contact interface function, non-contact interface function and two interface alternation function; Contact interface function correspondence contact functional test storehouse, the corresponding non-contact function test library of non-contact interface function, the corresponding two interface alternation functional test storehouse of two interface alternation function.
During practical operation, multiple functional test storehouse is created in S1, specifically comprise the following steps: when creating contact functional test storehouse according to contact interface function, the switching command of definition for being switched to contact interface, and write the engaged test result for the engaged test instruction and expection testing contact function; When creating non-contact function test library according to non-contact interface function, define the switching command for being switched to non-contact interface, and write the non-contact testing result for the non-contact testing instruction and expection testing non-contact function; When creating two interface alternation functional test storehouse according to two interface alternation function, definition is for being switched to the switching command of contact interface and the switching command for being switched to non-contact interface, and write is for testing two interactive testing instruction of interface alternation function and the interactive testing result of expection.
Utilize functional test storehouse to be measured to test double-interface IC card to be measured in S3, specifically comprise the following steps: the switching command utilizing functional test storehouse to be measured, is switched to corresponding interface by double-interface IC card to be measured; Test instruction according to functional test storehouse to be measured is tested double-interface IC card to be measured, and logging test results.
Judge in S3 whether test is passed through, and specifically comprises the following steps: the test result of expecting in the test result of record and S1 contrasted, if comparing result is consistent, be then judged as that test is passed through, and forwards S4 to; If comparing result is inconsistent, is then judged as that test is not passed through, forwards S5 to.
A kind of testing apparatus realizing the double-interface IC card of said method is also provided in the embodiment of the present invention, comprises test library creation module, test library data importing module, testing execution module and test result output module, wherein:
Test library creation module is used for: the function supported according to double-interface IC card to be measured, creates multiple functional test storehouse, sends lead-in signal to test library data importing module;
Test library data importing module is used for: after receiving lead-in signal, read the information of double-interface IC card, select corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, by the data importing in functional test storehouse to be measured in testing execution module, and send executive signal to testing execution module;
Testing execution module is used for: after receiving executive signal, utilizes the data in functional test storehouse to be measured to test double-interface IC card to be measured, sends result output signal to test result output module;
Test result output module is used for: after receiving result output signal, judges whether test is passed through, and if so, exports correct test result, terminates; Otherwise return miscue information, output error test result, terminate.
The present invention is not limited to above-mentioned embodiment, and for those skilled in the art, under the premise without departing from the principles of the invention, can also make some improvements and modifications, these improvements and modifications are also considered as within protection scope of the present invention.The content be not described in detail in this instructions belongs to the known prior art of professional and technical personnel in the field.
Claims (8)
1. a method of testing for double-interface IC card, is characterized in that, comprises the following steps:
A, the function supported according to double-interface IC card to be measured, create multiple functional test storehouse, forward step B to;
B, read the information of double-interface IC card, select corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, import the data in functional test storehouse to be measured, forward step C to;
C, utilize the data in functional test storehouse to be measured to test double-interface IC card to be measured, forward step D to;
D, judge test whether pass through, if so, export correct test result, terminate; Otherwise return miscue information, output error test result, terminate.
2. the method for testing of double-interface IC card as claimed in claim 1, is characterized in that: the function of the support of double-interface IC card described in steps A is contact interface function, non-contact interface function and two interface alternation function; Contact interface function correspondence contact functional test storehouse, the corresponding non-contact function test library of non-contact interface function, the corresponding two interface alternation functional test storehouse of two interface alternation function.
3. the method for testing of double-interface IC card as claimed in claim 2, is characterized in that, create multiple functional test storehouse, specifically comprise the following steps described in steps A:
When creating contact functional test storehouse according to contact interface function, define the switching command for being switched to contact interface, and write the engaged test result for the engaged test instruction and expection testing contact function;
When creating non-contact function test library according to non-contact interface function, define the switching command for being switched to non-contact interface, and write the non-contact testing result for the non-contact testing instruction and expection testing non-contact function;
When creating two interface alternation functional test storehouse according to two interface alternation function, definition is for being switched to the switching command of contact interface and the switching command for being switched to non-contact interface, and write is for testing two interactive testing instruction of interface alternation function and the interactive testing result of expection.
4. the method for testing of double-interface IC card as claimed in claim 2, it is characterized in that, step C specifically comprises the following steps: the switching command utilizing functional test storehouse to be measured, is switched to corresponding interface by double-interface IC card to be measured; Test instruction according to functional test storehouse to be measured is tested double-interface IC card to be measured, and logging test results.
5. the method for testing of double-interface IC card as claimed in claim 4, it is characterized in that, step D specifically comprises the following steps: the test result of expecting described in the test result recorded in step C and steps A contrasted, if comparing result is consistent, then be judged as that test is passed through, export correct test result, terminate; If comparing result is inconsistent, is then judged as that test is not passed through, returns miscue information, output error test result, terminate.
6. realize a testing apparatus for the double-interface IC card of method described in claim 1, it is characterized in that: this testing apparatus comprises test library creation module, test library data importing module, testing execution module and test result output module;
Described test library creation module is used for: the function supported according to double-interface IC card to be measured, creates multiple functional test storehouse, sends lead-in signal to test library data importing module;
Described test library data importing module is used for: after receiving lead-in signal, read the information of double-interface IC card, select corresponding functional test storehouse as functional test storehouse to be measured according to the information of double-interface IC card and testing requirement, by the data importing in functional test storehouse to be measured in testing execution module, and send executive signal to testing execution module;
Described testing execution module is used for: after receiving executive signal, utilizes the data in functional test storehouse to be measured to test double-interface IC card to be measured, sends result output signal to test result output module;
Described test result output module is used for: after receiving result output signal, judges whether test is passed through, and if so, exports correct test result, terminates; Otherwise return miscue information, output error test result, terminate.
7. the testing apparatus of double-interface IC card as claimed in claim 6, is characterized in that: the function of described double-interface IC card support is contact interface function, non-contact interface function and two interface alternation function; Contact interface function correspondence contact functional test storehouse, the corresponding non-contact function test library of non-contact interface function, the corresponding two interface alternation functional test storehouse of two interface alternation function.
8. the testing apparatus of double-interface IC card as claimed in claim 7, is characterized in that:
The content in described contact functional test storehouse comprises switching command for being switched to contact interface, engaged test result for the engaged test instruction and expection of testing contact function;
The content of described non-contact function test library comprises switching command for being switched to non-contact interface, non-contact testing result for the non-contact testing instruction and expection of testing non-contact function;
The content in described pair of interface alternation functional test storehouse comprise switching command for being switched to contact interface, for be switched to non-contact interface switching command, for testing two interactive testing instruction of interface alternation function and the interactive testing result of expection.
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| CN201510354755.6A CN104915695A (en) | 2015-06-24 | 2015-06-24 | Method and device for testing dual-interface IC card |
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| CN201510354755.6A CN104915695A (en) | 2015-06-24 | 2015-06-24 | Method and device for testing dual-interface IC card |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106203199A (en) * | 2016-06-28 | 2016-12-07 | 武汉天喻信息产业股份有限公司 | A kind of method and device of double-interface card performance test |
| CN110569950A (en) * | 2019-09-09 | 2019-12-13 | 东信和平科技股份有限公司 | Test method and system of double-interface IC card and double-interface reader-writer |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201340445Y (en) * | 2008-09-12 | 2009-11-04 | 惠州华阳通用电子有限公司 | Automatic testing system for electronic products |
| CN103186756A (en) * | 2011-12-31 | 2013-07-03 | 国民技术股份有限公司 | Testing device and testing method for card reader |
| CN103345444A (en) * | 2013-06-28 | 2013-10-09 | 中国南方电网有限责任公司 | Method and device for testing operating system function of power secondary system |
-
2015
- 2015-06-24 CN CN201510354755.6A patent/CN104915695A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201340445Y (en) * | 2008-09-12 | 2009-11-04 | 惠州华阳通用电子有限公司 | Automatic testing system for electronic products |
| CN103186756A (en) * | 2011-12-31 | 2013-07-03 | 国民技术股份有限公司 | Testing device and testing method for card reader |
| CN103345444A (en) * | 2013-06-28 | 2013-10-09 | 中国南方电网有限责任公司 | Method and device for testing operating system function of power secondary system |
Non-Patent Citations (1)
| Title |
|---|
| 小方的走狗: "中国电信双界面卡测试规范", 《《HTTP://WWW.DOC88.COM/P-408985192893.HTML》》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106203199A (en) * | 2016-06-28 | 2016-12-07 | 武汉天喻信息产业股份有限公司 | A kind of method and device of double-interface card performance test |
| CN110569950A (en) * | 2019-09-09 | 2019-12-13 | 东信和平科技股份有限公司 | Test method and system of double-interface IC card and double-interface reader-writer |
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Application publication date: 20150916 |