CN104865483A - Device testing special-purpose junction type field effect transistor - Google Patents
Device testing special-purpose junction type field effect transistor Download PDFInfo
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- CN104865483A CN104865483A CN201510272547.1A CN201510272547A CN104865483A CN 104865483 A CN104865483 A CN 104865483A CN 201510272547 A CN201510272547 A CN 201510272547A CN 104865483 A CN104865483 A CN 104865483A
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Abstract
The invention discloses a device testing a special-purpose junction type field effect transistor; a rotary-vibrating disc is fixed with a support through a bolt; an outlet of the rotary-vibrating disc is connected with an upper fixed track, and the other end of the upper fixed track is arranged right above a lower fixed track; another lower fixed track is arranged in parallel with the said lower fixed track; an upper interface of a movable track is connected with a lower interface of the fixed track; the other end of a movable guide rail is vertically arranged on a movable arm of a cylinder; an outlet of the upper fixed track is provided with a pipe block small cylinder; an outlet of the movable track is provided with another pipe block small cylinder; two sides of the lower fixed track and the other lower fixed track are respectively provided with a lighting diode and a photosensitive triode; tops of the movable guide rail and the upper fixed track are provided with a lighting diode and a photosensitive triode. The device realizes automatic testing grading, improves testing quality, and reduces product parameter influences by artificial factors.
Description
Technical field:
The present invention relates to proving installation, use when being specially adapted to the special technotron AC parameter test of microphone.
Background technology:
The test of the special technotron alternating-current parameter of current microphone, also substantially adopt manual mode, efficiency is low, and speed is slow, easily disturbs, so domestic production producer only carries out test point gear to DC parameter mostly, but this test can not reflect device performance completely, inefficacy ratio is difficult to control, and the independent output of an original people only can only test fifty-five million, have a strong impact on the progress of producing, constrain the development of enterprise.
Summary of the invention:
Task of the present invention proposes one to enhance productivity, and ensures the quality of production, the device of the special technotron of the test saved production cost.
Task of the present invention completes like this, test the device of special technotron, it is characterized in that: revolve the dish that shakes and fixed by bolt and support, revolving the dish exit that shakes is connected with on trapped orbit, the other end of upper trapped orbit is positioned at directly over lower trapped orbit, described lower trapped orbit side by side place is equipped with another lower trapped orbit, in movable rail, end interface is connected with end interface under trapped orbit, the other end of described movable guiding rail is vertically arranged on the lever arm of cylinder, the exit of upper trapped orbit is provided with the little cylinder of gear pipe, the exit of movable rail is provided with the little cylinder of another gear pipe, the both sides of lower trapped orbit and another lower trapped orbit are equipped with light emitting diode and phototriode respectively, light emitting diode and phototriode are equipped with in the top of movable guiding rail and upper trapped orbit.Lower trapped orbit and another lower trapped orbit are vertical installations, and its upper end is the entrance of measured device, and lower end is the outlet of measured device.
Lower trapped orbit upper end is the station of movable rail, and the upper end of another trapped orbit is another station of movable rail, and described lower trapped orbit, another lower trapped orbit, upper trapped orbit and movable rail all adopt cavity design.When the little cylinder of gear pipe is opened, air-flow exports, detected element under the effect of air-flow can not from trapped orbit lower end export, when only having the closedown gear little cylinder of pipe, detected element could export from trapped orbit lower end under gravity, and the little cylinder of above-described gear pipe changes control by AT89C51 by the level of I/O mouth respectively with the little cylinder of another gear pipe and opens and closes.When in track during measured device lazy weight, phototriode is not blocked, the I/O of AT89C51 detects low level, when detected element quantity in track is sufficient and when blocking phototriode, the I/O of AT89C51 detects high level under the effect of pull-up resistor R2.
The present invention has following effect: the technical program realizes self-feeding, realize point gear of test automatically, improve test mass, decrease the impact that human factor produces product parameters, by original people's split run output 5500, bring up to present one man operation ten test machines, split run output 180,000, be original 32.7 times, improve production efficiency, saved cost.
Accompanying drawing illustrates:
Fig. 1 is the front view of the technical program; Fig. 2 is the right view of Fig. 1; Fig. 3 is automatic material loading structure block diagram; Fig. 4 is that track full packages detects electrical schematic diagram; Fig. 5 is trapped orbit and movable rail sectional view.
Drawing illustrates: 1, revolve the dish that shakes, 2, upper trapped orbit, 3, revolve the dish regulator that shakes, 4, lower trapped orbit, 5, light emitting diode, 6, the little cylinder of gear pipe, 7, lever arm, 8, the little cylinder of another gear pipe, 9, movable rail, 10, cylinder, 11, phototriode, 12, another lower trapped orbit, 13, cavity.
Embodiment:
The technical program adopts feed mechanism and full packages to detect, realize self-feeding and test automatically, feed mechanism comprises trapped orbit 2, movable rail 9, lower trapped orbit 4 and another lower trapped orbit 12 and forms, it is the quantity adopting light emitting diode and phototriode to detect measured device that full packages detects, and realizes self-feeding.
Revolve the dish 1 that shakes to be fixed by support bolt and support, revolve in the dish that shakes and be arranged in sequence with detected element, the described dish exit that shakes of revolving is connected on trapped orbit 2, the other end of upper trapped orbit 2 is positioned at directly over lower trapped orbit 4, described lower trapped orbit is also installed with another lower trapped orbit 12 side by side, furtherly: lower trapped orbit 4 is vertical installation with another lower trapped orbit, its upper end is the entrance of measured device, lower end is the outlet of measured device, there is a movable rail 9 can run two track upper ends the centre of lower trapped orbit 4 and another lower trapped orbit 12, furtherly: lower trapped orbit 4 upper end is the station of movable rail 9, the upper end of another trapped orbit 12 is another station of movable rail 9, in movable rail 9, end interface and trapped orbit 2 times end interfaces are connected, the shape of interface adopts micro-horn-like, described lower trapped orbit 4, another lower trapped orbit 12, upper trapped orbit 2 and movable rail 9 all adopt cavity 13, (as shown in Figure 5), only allow detected element to be arranged in order direction along ng a path to run, and ensure that detected element operationally any upset can not occur.The other end of described movable guiding rail 9 is vertically arranged on the lever arm 7 of cylinder 10, during cylinder operation, lever arm tangential movement is driven to be connected with lower trapped orbit 4 upper end moving cylinder 9 lower end, during return hydraulic cylinder, lever arm 7 is driven to be connected lower to movable rail 9 lower end and another trapped orbit 12 upper end, revolving the dish regulator 3 that shakes is arranged on above frame on side plate, and adopting screw hole knockout to fix, is for regulating the rotational speed of revolving when shaking dish work.
In the course of the work, upper trapped orbit 2 is entered by revolving dish transmission detected element of shaking, movable rail 9 and lower trapped orbit 4, input is also continued for revolving the dish that shakes after overcoming full packages, the technical program is provided with the little cylinder 6 of gear pipe in the exit of upper trapped orbit 2, the exit of movable rail 9 is provided with the little cylinder 8 of another gear pipe, furtherly: when the little cylinder 6 of gear pipe is opened, air-flow exports, detected element under the effect of air-flow can not from trapped orbit 2 lower end export, when only having the closedown gear little cylinder 6 of pipe, detected element could export from trapped orbit 2 lower end under gravity, the little cylinder 6 of above-described gear pipe changes control by AT89C51 by the level of I/O mouth respectively with the little cylinder 8 of another gear pipe and opens and closes.
Shown in Figure 4, the both sides of lower trapped orbit 4 and another lower trapped orbit 12 are equipped with light emitting diode 5 and phototriode 11 respectively, light emitting diode and phototriode are equipped with in the top of movable guiding rail 9 and upper trapped orbit 2, when in track during measured device lazy weight, phototriode is not blocked, the I/O of AT89C51 detects low level, when detected element quantity in track is sufficient and when blocking phototriode, the I/O of AT89C51 detects high level under the effect of pull-up resistor R2.
During work, after system electrification, key in automatic key, the little cylinder 6 of gear pipe and the little cylinder 8 of another gear pipe are in closed condition, cylinder 10 is in opening and is connected with lower trapped orbit 4, revolve the dish 1 that shakes to vibrate and transmit detected element and enter trapped orbit 2, movable rail 9 and lower trapped orbit 4, instantly after trapped orbit 4 full packages, the little cylinder 8 of another gear pipe that movable rail 9 is installed is opened, revolve dish continuation vibration of shaking and sent survey element, when after movable rail also full packages, the gear that upper trapped orbit 2 is installed is managed little cylinder 6 and is opened, described lower trapped orbit full packages and movable rail full packages detect level change by the light emitting diode that track is installed and phototriode to realize automatic charging, monitor in track and after full packages, revolve dish stopping vibration of shaking, cylinder 10 is closed, movable rail 9 is connected with another lower trapped orbit under the lever arm of cylinder 10 drives, on it, the little cylinder 8 of another gear pipe of dress is closed, detected element is sent to another lower trapped orbit 12, transmit the little cylinder 8 of another gear pipe that rear movable rail 9 is installed to open, cylinder 10 moves and is connected with lower trapped orbit 4, the gear that upper trapped orbit 2 is installed is managed little cylinder 6 and is closed, AT89C51 controls to revolve the dish 1 that shakes and starts, until movable rail 9 full packages, upper trapped orbit 2 on it gear of dress manage little cylinder 6 and open, in test process, lower trapped orbit 4, the quantity of the detected element in another lower trapped orbit 12 reduces gradually, system by another track 12 and lower trapped orbit 4 install light emitting diode 5 and phototriode 11 detect, level change judges the quantity of detected element in lower trapped orbit 2, and be respectively lower trapped orbit 4 by movable guiding rail 9 and another lower trapped orbit 12 increases detected element.Because each track is equipped with test circuit separately, and from improve overall efficiency, reduce equipment investment cost.
Claims (5)
1. test the device of special technotron, it is characterized in that: revolve the dish that shakes and fixed by bolt and support, revolving the dish exit that shakes is connected with on trapped orbit, the other end of upper trapped orbit is positioned at directly over lower trapped orbit, described lower trapped orbit side by side place is equipped with another lower trapped orbit, in movable rail, end interface is connected with end interface under trapped orbit, the other end of described movable guiding rail is vertically arranged on the lever arm of cylinder, the exit of upper trapped orbit is provided with the little cylinder of gear pipe, the exit of movable rail is provided with the little cylinder of another gear pipe, the both sides of lower trapped orbit and another lower trapped orbit are equipped with light emitting diode and phototriode respectively, light emitting diode and phototriode are equipped with in the top of movable guiding rail and upper trapped orbit.
2. the device of the special technotron of test according to claim 1, is characterized in that: lower trapped orbit and another lower trapped orbit are vertical installations, and its upper end is the entrance of measured device, and lower end is the outlet of measured device.
3. the device of the special technotron of test according to claim 1, it is characterized in that: lower trapped orbit upper end is the station of movable rail, the upper end of another trapped orbit is another station of movable rail, and described lower trapped orbit, another lower trapped orbit, upper trapped orbit and movable rail all adopt cavity design.
4. the device of the special technotron of test according to claim 1, it is characterized in that: when the little cylinder of gear pipe is opened, air-flow exports, detected element under the effect of air-flow can not from trapped orbit lower end export, when only having the closedown gear little cylinder of pipe, detected element could export from trapped orbit lower end under gravity, and the little cylinder of above-described gear pipe changes control by AT89C51 by the level of I/O mouth respectively with the little cylinder of another gear pipe and opens and closes.
5. the device of the special technotron of the test according to claim 1 or 4, it is characterized in that: when in track during measured device lazy weight, phototriode is not blocked, the I/O of AT89C51 detects low level, when detected element quantity in track is sufficient and when blocking phototriode, the I/O of AT89C51 detects high level under the effect of pull-up resistor R2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510272547.1A CN104865483A (en) | 2015-05-25 | 2015-05-25 | Device testing special-purpose junction type field effect transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510272547.1A CN104865483A (en) | 2015-05-25 | 2015-05-25 | Device testing special-purpose junction type field effect transistor |
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| Publication Number | Publication Date |
|---|---|
| CN104865483A true CN104865483A (en) | 2015-08-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510272547.1A Pending CN104865483A (en) | 2015-05-25 | 2015-05-25 | Device testing special-purpose junction type field effect transistor |
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5466809A (en) * | 1977-11-08 | 1979-05-29 | Matsushita Electric Ind Co Ltd | Magnetic reproducer |
| JPH0921844A (en) * | 1995-07-04 | 1997-01-21 | Mitsubishi Electric Corp | Testing device for semiconductor module |
| CN201189518Y (en) * | 2008-04-11 | 2009-02-04 | 深圳市唐德机械有限公司 | Triode testing sorter |
| CN201586639U (en) * | 2009-11-16 | 2010-09-22 | 王晓军 | Four-testing-position gravity type test separator of integrated circuit |
| CN202362399U (en) * | 2011-11-18 | 2012-08-01 | 张世勇 | Testing guide rail of automatic testing device for semiconductor integrated package |
| CN102649115A (en) * | 2012-04-20 | 2012-08-29 | 汕头市宇信科技有限公司 | Gravity-type triode test separator |
| CN202606407U (en) * | 2012-04-06 | 2012-12-19 | 深圳市惠世光科技有限公司 | Novel full-automatic comprehensive tester for high-frequency transformer |
| CN203385829U (en) * | 2013-07-20 | 2014-01-08 | 福州方向自动化科技有限公司 | Integrated circuit chip testing sorting system double-channel testing device |
| CN203711344U (en) * | 2014-01-26 | 2014-07-16 | 陕西理工学院 | Automatic detection and control device for workpiece |
| CN204613337U (en) * | 2015-05-25 | 2015-09-02 | 河南芯睿电子科技有限公司 | Test the device of special technotron |
-
2015
- 2015-05-25 CN CN201510272547.1A patent/CN104865483A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5466809A (en) * | 1977-11-08 | 1979-05-29 | Matsushita Electric Ind Co Ltd | Magnetic reproducer |
| JPH0921844A (en) * | 1995-07-04 | 1997-01-21 | Mitsubishi Electric Corp | Testing device for semiconductor module |
| CN201189518Y (en) * | 2008-04-11 | 2009-02-04 | 深圳市唐德机械有限公司 | Triode testing sorter |
| CN201586639U (en) * | 2009-11-16 | 2010-09-22 | 王晓军 | Four-testing-position gravity type test separator of integrated circuit |
| CN202362399U (en) * | 2011-11-18 | 2012-08-01 | 张世勇 | Testing guide rail of automatic testing device for semiconductor integrated package |
| CN202606407U (en) * | 2012-04-06 | 2012-12-19 | 深圳市惠世光科技有限公司 | Novel full-automatic comprehensive tester for high-frequency transformer |
| CN102649115A (en) * | 2012-04-20 | 2012-08-29 | 汕头市宇信科技有限公司 | Gravity-type triode test separator |
| CN203385829U (en) * | 2013-07-20 | 2014-01-08 | 福州方向自动化科技有限公司 | Integrated circuit chip testing sorting system double-channel testing device |
| CN203711344U (en) * | 2014-01-26 | 2014-07-16 | 陕西理工学院 | Automatic detection and control device for workpiece |
| CN204613337U (en) * | 2015-05-25 | 2015-09-02 | 河南芯睿电子科技有限公司 | Test the device of special technotron |
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Application publication date: 20150826 |
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