CN104865409A - 基于新型音叉探针的双频原子力测试系统与方法 - Google Patents
基于新型音叉探针的双频原子力测试系统与方法 Download PDFInfo
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Cited By (4)
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CN111751577A (zh) * | 2019-03-29 | 2020-10-09 | 中国科学院物理研究所 | 音叉型原子力显微镜探头和应用 |
CN113092826A (zh) * | 2021-03-05 | 2021-07-09 | 中山大学 | 扫描探针显微镜系统及其测量方法 |
CN113155080A (zh) * | 2017-03-28 | 2021-07-23 | 日本株式会社日立高新技术科学 | 扫描型探针显微镜及其探针扫描方法 |
WO2022258084A1 (en) | 2021-07-13 | 2022-12-15 | Ceske Vysoke Uceni Technicke V Praze | A method of examining a sample in an atomic force microscope |
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Title |
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JOSE R. LOZANO,RICARDO GARCIA: "Theory of Multifrequency Atomic Force Microscopy", 《PHYSICAL REVIEW LETTERS》 * |
RICARDO GARCIA,ELENA T. HERRUZO: "The emergence of multifrequency force microscopy", 《NATURE NANOTECHNOLOGY》 * |
王思明: "基于新型音叉探针的动态原子力显微测量系统开发", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113155080A (zh) * | 2017-03-28 | 2021-07-23 | 日本株式会社日立高新技术科学 | 扫描型探针显微镜及其探针扫描方法 |
CN111751577A (zh) * | 2019-03-29 | 2020-10-09 | 中国科学院物理研究所 | 音叉型原子力显微镜探头和应用 |
CN113092826A (zh) * | 2021-03-05 | 2021-07-09 | 中山大学 | 扫描探针显微镜系统及其测量方法 |
WO2022258084A1 (en) | 2021-07-13 | 2022-12-15 | Ceske Vysoke Uceni Technicke V Praze | A method of examining a sample in an atomic force microscope |
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