CN104849646B - Hot-swappable test module and apply its test system - Google Patents
Hot-swappable test module and apply its test system Download PDFInfo
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- CN104849646B CN104849646B CN201410050561.2A CN201410050561A CN104849646B CN 104849646 B CN104849646 B CN 104849646B CN 201410050561 A CN201410050561 A CN 201410050561A CN 104849646 B CN104849646 B CN 104849646B
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Abstract
A kind of hot-swappable test module and apply its test system.The test system includes electronic device and test module.Electronic device includes functional circuit and protection circuit.Circuit is protected to couple functional circuit.The operating state information of circuit detecting functional circuit is protected to obtain detection signal, and when the level of detection signal is more than critical value, sends out protection enabling signal.Test module is coupled to electronic device hot-swappablely.Test module adjusts detection signal under test pattern, is more than critical value to enable the level of detection signal, and judge to protect whether circuit is in normal operating conditions based on the protection enabling signal that protection circuit is sent out.
Description
【Technical field】
The invention relates to a kind of measuring technologies of electronic device, and in particular to one kind for testing electronics dress
The hot-swappable test module for the protection circuit set and apply its test system.
【Background technology】
Electronic device is under some special/abnormal function situations in order to prevent（Such as over-loading operation or inner wire it is short out
Road etc.）, because the hardware feature of internal circuit unit can not bear extreme operating condition（Such as high temperature, high current or high voltage）
And damage or the failure of electronic device are caused, so usually in the design of electronic device, protection circuit can be provided with to be directed to
Above-mentioned possible special/abnormal function situation is detected.When the running of protection circuit detecting to electronic device reaches specific
Critical condition when（Such as temperature, current or voltage are more than preset critical value）, specific defencive function can be started to limit
The running of system/stopping electronic device, so as to enabling electronic device be unlikely to damage because of extreme operating condition.
However, after the completion of electronic device assembles, be generally embedded on the circuit board of electronic device due to protection circuit or
Person is directly set together with other circuit units with accumulating body, therefore circuit is protected usually can not to be individually tested.Therefore, it protects
Protection circuit could normal operation often need until electronic device is really abnormal just it can be seen that.
【Invention content】
The present invention provides a kind of hot-swappable test module and applies its test system, can be directed in electronic device
Protection circuit tested.
The test system of the present invention includes electronic device and test module.Electronic device includes functional circuit and protection
Circuit.Circuit is protected to couple functional circuit.Protect the operating state information of circuit detecting functional circuit to obtain detection signal, and
And when the level of detection signal is more than critical value, send out protection enabling signal.Test module is hot-swappablely（hot-
swappable）It is coupled to electronic device.Test module adjusts detection signal under test pattern, to enable the level of detection signal
Judge to protect circuit whether in normal work more than critical value, and based on the protection enabling signal that protection circuit is sent out
State.
In an embodiment of the present invention, when receiving protection enabling signal under test pattern when test module, mould is tested
Block judgement protection circuit is in normal operating conditions.
In an embodiment of the present invention, when not receiving protection enabling signal under test pattern when test module, test
Module judgement protection circuit is in abnormal operation.
In an embodiment of the present invention, protection circuit has state detecting end and protection output end, protects circuit from state
Sense terminal obtains the detection signal for being associated with operating state information, and sends out protection enabling signal from protection output end.
In an embodiment of the present invention, test module includes signal adjustment unit and microcontroller.Signal adjustment unit
It is coupled to state detecting end.Signal adjustment unit is adjusting the level of detection signal.Microcontroller couples signal adjustment unit
With protection output end.Microcontroller is controlling the running of signal adjustment unit.When microcontroller receives test commencing signal
When, test system enters test pattern, and microcontroller enable signal adjustment unit is to adjust the level of detection signal, then root
Judge to protect whether circuit is in normal operating conditions according to the signal on protection output end.
In an embodiment of the present invention, signal adjustment unit includes first switch.The first end coupling access status of first switch
The second end of sense terminal, first switch couples ground terminal, and the control terminal of first switch couples microcontroller.
In an embodiment of the present invention, test module further includes operating and controlling interface and prompt unit.Operating and controlling interface coupling is micro-
Controller.Operating and controlling interface triggers the interface of test commencing signal to provide.Prompt unit couples microcontroller.Prompt unit is used
To prompt the operating state of protection circuit according to the judging result of microcontroller.
In an embodiment of the present invention, test module further includes output switch unit.Switch unit is exported to according to survey
Whether test system into test pattern and is selectively coupled to one of functional circuit and microcontroller by protection output end.
In an embodiment of the present invention, when test system enters test pattern, microcontroller control output switch unit
Protection output end switching is coupled to microcontroller.
In an embodiment of the present invention, when test system does not enter test pattern, microcontroller control output switching is single
Member will protect output end switching to be coupled to functional circuit.
In an embodiment of the present invention, output switch unit includes second switch.The first end coupling protection of second switch
The second end of output end, second switch couples functional circuit, and the control terminal of the third end of second switch and first switch couples
Microcontroller.
In an embodiment of the present invention, signal adjustment unit and output switch unit at least one embedded be set to electricity
In sub-device.
In an embodiment of the present invention, functional circuit and microcontroller coupled in parallel are in protection output end.
In an embodiment of the present invention, test module is via universal input/output（GPIO）Interface is coupled with electronic device.
The hot-swappable test module of the present invention is suitable for testing the running of the protection circuit of electronic device.The test
Module includes signal adjustment unit and microcontroller.Signal adjustment unit is suitable for couple to electronic device.Signal adjustment unit is used
With the level for the detection signal that adjustment protection circuit is received, the wherein fortune of the functional circuit in detection signal instruction electronic device
Make status information.Microcontroller couples signal adjustment unit.Microcontroller is controlling the running of signal adjustment unit.Work as connection
Interface is coupled to electronic device and microcontroller receives when testing commencing signal, and microcontroller enable signal adjustment unit is to adjust
The level of whole detection signal judges to protect the whether normal work of circuit further according to the protection enabling signal that circuit is sent out is protected
Make.
Based on above-mentioned, the embodiment of the present invention proposes a kind of hot-swappable test module and applies its test system.Institute
Stating test module can be by the mode of the detection signal level received by adjustment protection circuit, copying circuit abnormal
Signal aspect, to judge to protect circuit whether can normal operation according to the signal that is sent out of protection circuit.In addition, due to
The test module of the embodiment of the present invention has the characteristic that can support hot plug, therefore in the shipment at factory end detection application, can
Contribute to the standardization of testing process, and reduces the work load of testing staff.
To make the foregoing features and advantages of the present invention clearer and more comprehensible, special embodiment below, and coordinate institute's accompanying drawings
It is described in detail below.
【Description of the drawings】
Fig. 1 is the function block schematic diagram of the test system of one embodiment of the invention.
Fig. 2 is the function block schematic diagram of the test system of one embodiment of the invention.
Fig. 3 is the function block schematic diagram of the test system of another embodiment of the present invention.
Fig. 4 is the circuit framework schematic diagram of the test module of one embodiment of the invention.
Fig. 5 is the circuit framework schematic diagram of the test module of another embodiment of the present invention.
【Specific implementation mode】
In order to allow the content of this exposure to be more easily illustrated, spy can actually evidence as this exposure for embodiment below
With the example of implementation.In addition, all possible places, use component/component/step of identical label in schema and embodiment,
Represent same or like component.
Fig. 1 is the function block schematic diagram of the test system of one embodiment of the invention.Fig. 1 is please referred to, test system 100 is wrapped
Include electronic device 110 and test module 120.Wherein, electronic device 110 be, for example, desktop PC, notebook computer,
Tablet computer, personal digital assistant（Personal digital assistant, PDA）, smartphone, pocket music broadcast
Put any kind of electronic device such as device, LCD TV, projector.
In the present embodiment, electronic device 110 includes functional circuit 112 and protection circuit 114.The functional circuit
112, for example, central processing unit in electronic device 110（CPU）, power-switching circuit, battery control circuit or it is other can
The circuit module of 110 specific function of electronic device is provided.And the protection circuit 114 couples functional circuit 112, and may be, for example,
The circuit module provided protection against for specific function circuit 112.For example, for being CPU with functional circuit 112, with
It can be over-temperature protection that it, which corresponds to the protection circuit 114 of configuration,（Over temperature protection, OTP）Circuit；Again
Alternatively, being the protection circuit 114 of corresponding configuration for power-switching circuit or battery control circuit with functional circuit 112
Can be OTP circuits, overvoltage protection（Over voltage protection, OVP）Circuit, under-voltage protection（under
Voltage protection, UVP）Circuit, overcurrent protection（Over current protection, OCP）, overpower protect
Shield（Over power protection, OPP）Circuit, overload protection（Over load protection, OLP）Circuit and
Low-voltage locks（Under voltage lock out, UVLO）One of circuit or more persons, end are needed regarding the design of designer
Depending on asking.Invention is not limited thereto.
Specifically, either above-mentioned what type of protection circuit 114, function mode substantially all borrows detecting work(
The operating state information of energy circuit 112（Such as temperature, voltage value or current value size）To obtain a corresponding detection signal（It can
For voltage or the signal of current forms）, and the level based on the detection signal obtained is to determine whether to functional circuit 112
Enable defencive function.In general, if protection circuit 114 is in normal operating conditions（That is, can be normally to functional circuit 112
The state protected）Under, then it can be more than a preset critical value in the level of the detection signal of instruction operating state information
（It can voluntarily be selected by designer）When, protection enabling signal is sent out to enable defencive function.Wherein, the defencive function is, for example,
Stop functional circuit 112 continue running or limitation/strangulation functional circuit 112 voltage, electric current etc., the present invention not as
Limit.
On the other hand, test module 120 can pass through connecting interface CI coupling electronic devices 110, so as to testing electronic device
Whether the protection circuit 114 in 110 can normal operation（I.e., if be in normal operating conditions）.Wherein, the connecting interface CI
May be, for example, universal input/output（GPIO）Interface etc. supports the connecting interface of hot plug.In other words, make in electronic device
110 under open state, and the test module 120 of the present embodiment also can pass through connecting interface CI and be linked up with electronic device 110；Together
Sample, test module 120 also can be directly removed under open state, without causing electronic device 110 that mistake occurs.
Specifically, when test module 120 is connected to electronic device 110, test module can be controlled and enter and survey
Die trial formula.In test mode, the detection signal that test module 120 can be received according to protection circuit 114, to enable detection signal
Level be more than critical value, and then the defencive function of trigger protection circuit 114, and protection circuit 114 is made to send out protection and start
Signal.Then, test module 120 is that can judge to protect circuit 114 according to the protection enabling signal that protection circuit 114 is sent out
Whether normal operating conditions is in.
Wherein, when test module 120 receives the protection enabling signal that protection circuit 114 is sent out under test pattern
When, indicate that protection circuit 114 can normally react on the triggering of protective condition（The level of detection signal is more than critical value）And it opens
Use defencive function.Therefore, test module 120 can judge that circuit 114 is protected to be in normal operating conditions at this time.On the contrary, when surveying
When die trial block 120 does not receive protection enabling signal under test pattern, indicate that protection circuit 114 does not react on abnormal detect
It surveys signal level and enables defencive function.Therefore, test module 120 can judge that circuit 114 is protected to be in abnormal work shape at this time
State（That is, the state that can not be normally protected to functional circuit 112）.
In other words, under the test pattern that test module 120 tests electronic device 110, functional circuit 112 is not
Exception is actually occurred, but adjusts the mode of detection signal by test module 120, what copying circuit 112 was abnormal
Signal aspect, to make protection circuit 114 send out protection enabling signal.
Base this, tester can be according to the test result of test module 120（That is, whether protection circuit 114 sends out protection
Enabling signal）Can the protection circuit 114 to judge in electronic device 110 normally execute the protection work(to functional circuit 112
Energy.
In this it is noted that in an exemplary embodiment, test module 120 can be built into electronic device 110.Also
That is, testing staff can be utilized respectively the corresponding test module 120 being configured in each electronic device 110 to electronic device
110 are tested.In another exemplary embodiment, test module 120 can be external in electronic device 110.Also that is, testing staff can
It is tested by one-to-many electronic device 110 using single test module 120.
For the protection circuit 114 of electronic device 110 is tested, the framework of the test system 100 based on the present embodiment,
Tester can directly by control it is external/be built into the test module 120 of electronic device 110 be directed to protect circuit 114
Running be detected, so as to effectively ensure that electronic device 110 protection circuit 114 running yield.
In addition, from the point of view of the detection application at factory end, testing staff can utilize the test module 120 of support hot plug one by one
Ground carries out each electronic device 110 Function detection of protection circuit 114.Due to and be not required in each electronic device 110
Corresponding test module 120 is set, therefore the design cost of electronic device 110 will not be significantly improved.Simultaneously as application is originally
The test module 120 of embodiment does not need to dismantling electronic device 110 when being tested, therefore can reduce the work of testing staff yet
It bears, and is conducive to the process standard of test jobs.
Following figure 2 is the example state sample implementation for illustrating the test module under different embodiments from Fig. 3.
Fig. 2 is the function block schematic diagram of the test system 200 of one embodiment of the invention.Fig. 2 is please referred to, system is tested
200 include an electronic device 210 and a test module 220.Electronic device 210 equally includes functional circuit 212 and protection electricity
Road 214, wherein functional circuit 212 and the specific implementation aspect of protection circuit 214 can refer to above-mentioned Fig. 1 embodiments with function mode
Explanation.In the present embodiment, protection circuit 214 has state detecting end TD and protection output end TP.Protect circuit 214 from shape
State sense terminal TD obtains the detection signal S_D for the operating state information for being associated with functional circuit 212, and according to detection signal S_
Whether the level of D is more than critical value to decide whether to send out protection enabling signal S_ENB from protection output end TP.
Test module 220 includes signal adjustment unit 222, microcontroller（Micro control unit, MCU）224, it grasps
Control interface 226 and prompt unit 228.The state detecting end TD of the coupling protection circuit 214 of signal adjustment unit 222, to adjust
The level of whole detection signal S_D.In one implements example, the signal adjustment unit 222 can be to be coupled to state detecting end
Switch between TD and ground terminal or other types of controllable load（controllable load）, can be controlled and adjust
Impedance on the TD of state detecting end, so as to adjusting the level of detection signal S_D（Example explanation is enumerated in subsequent implementation regular meeting）.But this
Invention is not limited only to this.In this it is noted that in one implements example, signal adjustment unit 222 may be disposed at test mould
Among the hardware of block 220, and through the state detecting end TD for being coupled to protection circuit 214 such as GPIO interface.In another implementation
In example, signal adjustment unit 222 can also be embedded and is set in electronic device 210 so that microcontroller 224 connects through such as GPIO
Mouth is coupled to signal adjustment unit 222, and invention is not limited thereto.
Microcontroller 224 is respectively coupled to signal adjustment unit 222 and protects the protection output end TP of circuit 214.Work as micro-control
When device 224 processed receives the test commencing signal S_TS from operating and controlling interface 226, test system 200 can enter test pattern, and
And microcontroller 224 can react on test commencing signal S_TS and enable signal adjustment unit 222, so as to adjust detection signal S_
The level of D.In addition, whether microcontroller 224 judges to protect circuit 214 in normal according to the signal on protection output end TP
Working condition.
Operating and controlling interface 226 couples microcontroller 224, can be used to provide the interface of triggering test commencing signal S_TS.More
Specifically, operating and controlling interface 226 is, for example, the operating and controlling interfaces such as button, the Trackpad operated for testing staff, can react on
The control of testing staff and send out test commencing signal S_TS to microcontroller 224.In addition, in one implements example, manipulation connects
Mouth 226 also can be the remote control interface that can receive wireless signal.Testing staff can be by remote control devices such as such as remote controlers
Test commencing signal S_TS is sent out to microcontroller 224 to control operating and controlling interface 226.
Prompt unit 228 couples microcontroller 224, can be used to send out prompt according to the judging result of microcontroller 224
Whether message is in normal operating conditions so as to the operating state of prompt protection circuit 214.For example, the prompt unit
228 prompting messages that send out are, for example, the sound of display lamp number, suggestion voice or particular form（Such as buzzer）.Base this, detection
Personnel can learn the protection circuit for the electronic device 210 currently tested based on the prompting message that prompt unit 228 is sent out
Whether 214 runnings are normal.
Fig. 3 is the function block schematic diagram of the test system 300 of another embodiment of the present invention.The test system of the present embodiment
300 frameworks are substantially identical as the test system 200 of Fig. 2 embodiments.Therefore about the functional circuit 312 in electronic device 310
With in protection circuit 314 and test module 320 signal adjustment unit 322, microcontroller 324, operating and controlling interface 326 and carry
Show that the specific implementation aspect of unit 328 all can refer to the explanation of above-mentioned Fig. 2 embodiments with function mode, is repeated no more in this.
Please refer to Fig. 3, the difference of the present embodiment and 2 embodiment of earlier figures is that test module 320 further includes output switching
Unit 329 (at the dotted line encirclement in Fig. 3).Wherein, output switch unit 329 to according to test system 300 whether into
Enter test pattern（That is, whether microcontroller 324 receives test commencing signal S_TS）And the protection of circuit 314 will be protected to export
End TP optionally switches are connected to functional circuit 312 or microcontroller 324.
More specifically, when testing system 300 into test pattern（That is, microcontroller 324, which receives test, starts letter
Number S_TS）, microcontroller 324, which can control output switch unit 329, will protect output end TP to switch and be coupled to microcontroller
324 so that when protection circuit 314 sends out protection enabling signal S_ENB, protection enabling signal S_ENB can be single via output switching
Member 329 and be provided to microcontroller 324, microcontroller 324 according to protection enabling signal S_ENB judge protection circuit 314 be
No is normal operating conditions.
On the other hand, when test system 300 does not enter test pattern（Start that is, microcontroller 324 does not receive test
Signal S_TS）, microcontroller 324 can then control that output switch unit 329 will protect output end TP switch and to be coupled to function electric
Road 312 so that when protection circuit 314 sends out protection enabling signal S_ENB, protection enabling signal S_ENB can switch via output
Unit 329 and be provided to functional circuit 312.
Under the framework of the present embodiment, only functional circuit 312 can receive protection with 324 one of which of microcontroller and open
Dynamic signal S_ENB.In other words, electronic device 310 in test mode will not actual start-up circuit protection mechanism.Therefore,
Even protect the defencive function performed by circuit 314 that there is disposable characteristic（Such as：Fuse wire when trigger protection）,
Test module 320 can still test protection circuit 314.
In this it is noted that the setting similar to aforementioned signal adjustment unit 222 illustrates, the outputting cutting of the present embodiment
Changing unit 329 can equally consider according to the design of designer and embed and be set in electronic device 210 so that microcontroller 324 is saturating
It crosses GPIO interface such as and is coupled to output switch unit 329；Or may be disposed among the hardware of test module 320, and penetrate
As GPIO interface is coupled to the protection output end TP of protection circuit 314.In other words, in one example of the present invention embodiment, letter
Number adjustment unit（Such as 224,324）With output switch unit（Such as 329）Can be that one is embedded at least within be set to electronic device
（Such as 210,310）In；Alternatively, both signal adjustment unit and output switch unit are all set to test module（Such as 220,320）
In, invention is not limited thereto.
In addition, in one implements example, the output switch unit 329 may be, for example, that one end is coupled to protection output end
TP, and in addition both ends are respectively coupled to the three-terminal switch of functional circuit 312 and microcontroller 324（Example is enumerated in subsequent implementation regular meeting
Explanation）.But the present invention is not limited only to this.
The practical application example of the test system of Fig. 4 and Fig. 5 is exemplified below to illustrate, but the present invention is not limited only to
This.Wherein, Fig. 4 is the circuit framework schematic diagram of the test module of one embodiment of the invention.Fig. 5 is another embodiment of the present invention
The circuit framework schematic diagram of test module.
Please also refer to Fig. 4, the present embodiment is that have overpower protection to test（OPP）410 conduct of electronic device of mechanism
Implement example.Electronic device 410 includes functional circuit 412 and overpower-protection circuit 414.Overpower-protection circuit 414 can
It is made of resistance R1, R2 and R3 and overpower detecting chip OPDC.Resistance R1, R2 are serially connected so that resistance R1's is another
One end is coupled to system voltage Vsys, and the first input end of the other end of resistance R2 coupling overpower detecting chip OPDC it
Between.Functional circuit 412 is coupled to the conode of resistance R1 and R2.Resistance R3 is then coupled to system voltage Vsys and is detectd with overpower
Survey the second input terminal of chip OPDC（That is, state detecting end）Between.
Test module 420 includes the signal adjustment unit realized with switch 422 and microcontroller 424.Wherein, it switchs
The second input terminal of 422 first end coupling overpower detecting chip OPDC（That is, state detecting end）.The second end of switch 422
Couple ground terminal GND.Also, the control terminal of switch 422 is via the GPIO Ports GPIO1 coupling microcontrollers for supporting hot plug
424.On the other hand, microcontroller 424 is via the connectivity ports the GPIO GPIO2 couplings in parallel with functional circuit 412 for supporting hot plug
It is connected to the output end of overpower detecting chip OPDC（That is, protection output end）, to receive protection enabling signal S_ENB.
In the present embodiment, the operation principle of overpower-protection circuit 414 is to detect chip OPDC by overpower to detect
Survey the pressure difference between first input end and the second input terminal（This pressure difference, that is, detection signal S_D）, so as to 412 institute of arbitration functions circuit
Whether the power of reception is more than predetermined power critical value.In the case where overpower-protection circuit 414 is in normal operating conditions, when
When the power that overpower detecting chip OPDC arbitration functions circuit 412 is received is more than predetermined power critical value, overpower
Detecting chip OPDC can send out protection enabling signal S_ENB and execute protection act with informing function circuit 412.
Under this framework, the specific motion flow that test module 420 tests electronic device 410 can refer to above-mentioned figure
The explanation of 2 embodiments, repeats no more in this.
Referring again to Fig. 5, the present embodiment is that have over-temperature protection to test（OTP）510 conduct of electronic device of mechanism
Implement example.Electronic device 510 includes functional circuit 512 and thermal-shutdown circuit 514.Thermal-shutdown circuit 514 can
Such as it is made of resistance R1, thermistor TR and excess temperature detecting chip OTDC.Resistance R1 mutually goes here and there with thermistor TR
After connection, it is coupled between the input terminal and ground terminal GND of power detecting chip OPDC.
Test module 520 includes signal adjustment unit, microcontroller 524 and the opening with three ends realized with switch 522
Close the 526 output switch units realized.Wherein, the input terminal of the first end coupling excess temperature detecting chip OTDC of switch 522
（That is, state detecting end）.The second end coupling ground terminal GND of switch 522.Also, the control terminal of switch 522 is hot slotting via supporting
The GPIO Ports GPIO1 coupling microcontrollers 524 pulled out.The output of the first end coupling excess temperature detecting chip 514 of switch 526
End（That is, protection output end）.The second end of switch 526 couples functional circuit 512.The third end of switch 526 is connected via GPIO
Port GPIO2 couples microcontroller 524.Also, the control terminal of switch 526 couples microcontroller via GPIO Ports GPIO3
524。
In the present embodiment, the operation principle of thermal-shutdown circuit 514 is to have temperature higher by thermistor TR
The lower characteristic of resistance value（That is, negative temperature coefficient）, enable the voltage quasi position of the conode of resistance R1 and thermistor TR（That is, detecing
Survey signal S_D）It reacts on the resistance change of thermistor TR and changes, so as to making excess temperature detecting chip OTDC can be according to detecing
The state of temperature money surveyed signal S_D and obtain functional circuit 512 is transported.It is in normal operating conditions in thermal-shutdown circuit 514
Under, when having served as the operational temperature of temperature detecting chip OTDC arbitration functions circuit 512 more than preset temperature critical value, excess temperature is detectd
Protection enabling signal S_ENB can be sent out with the execution protection act of informing function circuit 512 by surveying chip OTDC.
Under this framework, the specific motion flow that test module 520 tests 510 nearly row of electronic device can refer to above-mentioned figure
The explanation of 3 embodiments, repeats no more in this.
It should further be appreciated that in other exemplary embodiments, test module 520 also can only include switch 522 and micro-
Controller 524.Under this exemplary embodiment, microcontroller 524 can pass through GPIO Ports（GPIO2 or GPIO3）With function electricity
The output end of road 512 coupled in parallel excess temperature detecting chip OTDC, is sent out with receiving simultaneously by excess temperature detecting chip OTDC
Protection enabling signal S_ENB.The present invention is not limited only to this.
In conclusion the embodiment of the present invention proposes a kind of hot-swappable test module and applies its test system.Institute
Stating test module can be by the mode of the detection signal level received by adjustment protection circuit, copying circuit abnormal
Signal aspect, to judge to protect circuit whether can normal operation according to the signal that is sent out of protection circuit.In addition, due to
The test module of the embodiment of the present invention has the characteristic that can support hot plug, therefore in the shipment at factory end detection application, can
Contribute to the standardization of testing process, and reduces the work load of testing staff.
Although the present invention has been disclosed by way of example above, it is not intended to limit the present invention., any technical field
Middle tool usually intellectual, without departing from the spirit and scope of the present invention, when can make some changes and embellishment, thus it is of the invention
Protection domain should be defined by the scope of the appended claims.
Claims (20)
1. a kind of test system, which is characterized in that the test system includes：
One electronic device comprising：
One functional circuit；
One protection circuit, couples the functional circuit, wherein an operating state information of the protection circuit detecting functional circuit with
A detection signal is obtained, and when the level of the detection signal is more than a critical value, sends out a protection enabling signal；
One test module, hot-swappablely (hot-swappable) be coupled to the electronic device, wherein the test module in one survey
The detection signal is adjusted under die trial formula, is more than the critical value to enable the level of the detection signal, and be based on the protection circuit institute
The protection enabling signal that sends out and judge whether the protection circuit is in a normal operating conditions.
2. test system according to claim 1, which is characterized in that when the test module receives under the test pattern
When the protection enabling signal, which judges that the protection circuit is in the normal operating conditions.
3. test system according to claim 1, which is characterized in that when the test module does not receive under the test pattern
When to the protection enabling signal, which judges that the protection circuit is in an abnormal operation.
4. test system according to claim 1, which is characterized in that there is the protection circuit state detecting end to be protected with one
Output end is protected, which obtains from the state detecting end and is associated with the detection signal of the operating state information, and from
The protection output end sends out the protection enabling signal.
5. test system according to claim 4, which is characterized in that the test module includes：
One signal adjustment unit is coupled to the state detecting end, to adjust the level of the detection signal；
One microcontroller couples the signal adjustment unit and the protection output end, to control the running of the signal adjustment unit,
Wherein, when the microcontroller receives a test commencing signal, which enters the test pattern, and the microcontroller
The device enable signal adjustment unit judges this to adjust the level of the detection signal further according to the signal on the protection output end
Protect whether circuit is in the normal operating conditions.
6. test system according to claim 5, which is characterized in that the signal adjustment unit includes a first switch, should
One first end of first switch couples the state detecting end, and a second end of the first switch couples a ground terminal, and this first
One control terminal of switch couples the microcontroller.
7. test system according to claim 5, which is characterized in that the test module further includes：
One operating and controlling interface couples the microcontroller, to provide the interface for triggering the test commencing signal；
One prompt unit couples the microcontroller, to prompt the fortune of the protection circuit according to the judging result of the microcontroller
Make state.
8. test system according to claim 5, which is characterized in that the test module further includes：
One output switch unit, whether selectively to be exported the protection into the test pattern according to the test system
End is coupled to one of the functional circuit and the microcontroller.
9. test system according to claim 8, which is characterized in that, should when the test system enters the test pattern
Microcontroller controls the output switch unit and protection output end switching is coupled to the microcontroller.
10. test system according to claim 8, which is characterized in that when the test system does not enter the test pattern,
The microcontroller controls the output switch unit and protection output end switching is coupled to the functional circuit.
11. test system according to claim 8, which is characterized in that the output switch unit includes a second switch, should
One first end of second switch couples the protection output end, and a second end of the second switch couples the functional circuit, this second
One third end of switch couples the microcontroller, and the signal adjustment unit includes a first switch, and the one the of the first switch
One end couples the state detecting end, and a second end of the first switch couples a ground terminal, and a control terminal of the first switch
Couple the microcontroller.
12. test system according to claim 8, which is characterized in that the signal adjustment unit and the output switch unit
At least one embeds and is set in the electronic device.
13. test system according to claim 5, which is characterized in that the functional circuit and the microcontroller coupled in parallel
In the protection output end.
14. test system according to claim 1, which is characterized in that the test module is via universal input/output
(GPIO) interface is coupled with the electronic device.
15. a kind of hot-swappable test module, is suitable for testing the running of a protection circuit of an electronic device, feature exists
In the test module includes：
One signal adjustment unit is suitable for couple to the electronic device, and to adjust the detecting letter that the protection circuit is received
Number level, the wherein detection signal indicates an operating state information of the functional circuit in the electronic device；
One microcontroller couples the signal adjustment unit, to control the running of the signal adjustment unit, wherein when a connection
Interface is coupled to the electronic device and when the microcontroller receives a test commencing signal, the microcontroller enable signal tune
Whole unit is to adjust the level of the detection signal, further according to the protection circuit when level of the detection signal is more than a critical value
One sent out protects enabling signal to judge whether the protection circuit works normally.
16. hot-swappable test module according to claim 15, which is characterized in that the signal adjustment unit is one the
One switch, a first end of the first switch are suitable for coupling a state detecting end of the protection circuit via the connecting interface, should
One second end of first switch couples a ground terminal, and a control terminal of the first switch couples the microcontroller.
17. hot-swappable test module according to claim 15, which is characterized in that the hot-swappable test mould
Block further includes：
One operating and controlling interface couples the microcontroller, to provide the interface for triggering the test commencing signal；
One prompt unit couples the microcontroller, to prompt the fortune of the protection circuit according to the judging result of the microcontroller
Make state.
18. hot-swappable test module according to claim 15, which is characterized in that the hot-swappable test mould
Block further includes：
One output switch unit, to whether the test commencing signal is received according to the microcontroller and selectively by the guarantor
One protection output end of protection circuit is coupled to one of the functional circuit and the microcontroller.
19. hot-swappable test module according to claim 18, which is characterized in that the output switch unit is one the
One first end of two switches, the second switch couples the protection output end, and a second end of the second switch couples function electricity
The one third end on road, the second switch couples the microcontroller, and the signal adjustment unit is a first switch, the first switch
A first end be suitable for coupling a state detecting end of the protection circuit, a second end of the first switch via the connecting interface
A ground terminal is coupled, and a control terminal of the first switch couples the microcontroller.
20. hot-swappable test module according to claim 15, which is characterized in that the functional circuit and the microcontroller
Device coupled in parallel protects output end in the one of the protection circuit.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410050561.2A CN104849646B (en) | 2014-02-14 | 2014-02-14 | Hot-swappable test module and apply its test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410050561.2A CN104849646B (en) | 2014-02-14 | 2014-02-14 | Hot-swappable test module and apply its test system |
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| CN104849646B true CN104849646B (en) | 2018-08-10 |
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| CN106771708B (en) * | 2016-11-15 | 2020-02-14 | 深圳Tcl数字技术有限公司 | Hot plug test method and device for interconnection power supply of master equipment and slave equipment |
| CN112824985B (en) * | 2019-11-21 | 2022-06-24 | 新唐科技股份有限公司 | Built-in temperature detection device of single chip and protection mechanism thereof |
| CN112987698B (en) * | 2021-03-31 | 2024-04-30 | 北京品驰医疗设备有限公司 | Charging test method and device of external control device for implantable medical device |
| CN113126596B (en) * | 2021-03-31 | 2024-01-26 | 北京品驰医疗设备有限公司 | Charging test system of external control equipment for implantable medical device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1943714C3 (en) * | 1969-08-28 | 1976-01-08 | Heinrich 2117 Tostedt Helwig | Portable circuit tester |
| CN1467507A (en) * | 2002-07-08 | 2004-01-14 | 艾伦科技株式会社 | Apparatus and method for automatic testing normal operation of battery protection circuit module |
| JP2004297849A (en) * | 2003-03-25 | 2004-10-21 | Sanyo Electric Co Ltd | Base station equipment, and test method and test program therefor |
| CN101413983B (en) * | 2008-12-04 | 2010-12-08 | 吉林大学 | IGBT bridge circuit and drive protective circuit detection device |
| CN101750579B (en) * | 2008-12-18 | 2012-07-04 | 比亚迪股份有限公司 | Method for detecting faults of reverse protection circuit on flexible printed circuit |
| CN101527448B (en) * | 2009-04-21 | 2014-07-02 | 无锡中星微电子有限公司 | Battery protection circuit, testing device and method for battery protection circuit |
| CN102495348B (en) * | 2011-12-07 | 2014-10-22 | 成都芯源系统有限公司 | Fault detection circuit and method thereof |
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