CN104849043A - Gearbox testing system based on dynamic performance detection - Google Patents
Gearbox testing system based on dynamic performance detection Download PDFInfo
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- CN104849043A CN104849043A CN201510251143.4A CN201510251143A CN104849043A CN 104849043 A CN104849043 A CN 104849043A CN 201510251143 A CN201510251143 A CN 201510251143A CN 104849043 A CN104849043 A CN 104849043A
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- sheffer stroke
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Abstract
The invention discloses a gearbox testing system based on dynamic performance detection, which is characterized by comprising a gearbox (1), a driving module (2), a resistance system (3), a vibration sensor (6), a temperature sensor (5) and a torque sensor (4) connected with the gearbox (1), a torque signal processing module (8) connected with the torque sensor (4), and a single chip microcomputer (7) connected with the torque signal processing module (8), the temperature sensor (5) and the vibration sensor (6). Comprehensive performance of the gearbox in different road conditions can be tested, and the comprehensive performance of the gearbox can be evaluated.
Description
Technical field
The present invention relates to a kind of wheel box test macro, specifically refer to a kind of wheel box test macro detected based on dynamic property.
Background technology
Along with the fast development of auto industry technology, the automatic gear for vehicle of various ways occurs in succession.Mainly contain: hydraulic mechanical type wheel box (AT), electrical control automatic manual transmission case (AMT), mechanical stepless wheel box (CVT).Wherein, the favor that electrical control automatic manual transmission case (AMT) is simple with its structure, efficiency is high, cost performance advantages of higher is just being subject to each automobile vendor.Automation wheel box is as the core component of vehicle, and the dynamic property of its performance and car load, economy and comfortableness are closely related.And by experiment each performance of wheel box is tested, to go forward side by side line parameter analysis and contrast with the performance parameter obtaining wheel box, for the improvement of product and optimization provide reliable foundation, being the important means developing AMT, is also the necessary stage of carrying out the exploitation of AMT real vehicle.Therefore, the wheel box test macro for testing wheel box performance then seems by for important.But traditional wheel box test macro can not test out the performance of wheel box under different road conditions, this brings very large uncertainty just to the exploitation of AMT real vehicle.
Summary of the invention
The object of the invention is to overcome traditional wheel box test macro and cannot carry out the defect of testing for the performance of wheel box under different road conditions, a kind of wheel box test macro detected based on dynamic property is provided.
Object of the present invention is achieved through the following technical solutions: a kind of wheel box test macro detected based on dynamic property, by wheel box, the driver module be connected with wheel box, resistance system, vibration transducer, temperature sensor, torque sensor, the torque signal processing module be connected with torque sensor, and the single-chip microcomputer be simultaneously connected with torque signal processing module, temperature sensor, vibration transducer forms.
Further, described torque signal processing module is by input circuit, the logic control circuit be connected with input circuit, the transistor drive circuit that andlogic control circuit is connected, and the testing circuit that andlogic control circuit is connected with transistor drive circuit simultaneously forms.
Described input circuit is by triode VT1, triode VT2, one end is connected with the emitter of triode VT1, the other end then in turn through the resistance R2 that resistance R3 is connected with the emitter of triode VT2 after resistance R4, and one end is connected with the collector of triode VT1, the other end resistance R1 that then andlogic control circuit is connected forms; The base stage of described triode VT1 is then connected with the base stage of triode VT2 as the input end of this input circuit, its collector; The collector andlogic control circuit of described triode VT2 is connected.
Described logic control circuit is by Sheffer stroke gate IC1, Sheffer stroke gate IC2, Sheffer stroke gate IC3, field effect transistor Q1, one end is connected with the grid of field effect transistor Q1, the resistance R5 that the other end is then connected with the collector of triode VT1 after resistance R1, positive pole is connected with the output terminal of Sheffer stroke gate IC2, the electric capacity C2 that negative pole is then connected with testing circuit, positive pole is connected with the drain electrode of field effect transistor Q1, the electric capacity C1 that negative pole is then connected with the output terminal of Sheffer stroke gate IC1 after resistance R7, and one end is connected with the drain electrode of field effect transistor Q1, the resistance R6 that the other end is then connected with the positive pole of Sheffer stroke gate IC3 forms, the negative pole of described Sheffer stroke gate IC2 is connected with the collector of triode VT2, its positive pole is then connected with the output terminal of Sheffer stroke gate IC1, the negative pole of described Sheffer stroke gate IC1 is connected with the negative pole of Sheffer stroke gate IC2, its positive pole is then connected with the source electrode of field effect transistor Q1, its output terminal is then connected with the negative pole of Sheffer stroke gate IC3, the output terminal of described Sheffer stroke gate IC3 is connected with the negative pole of electric capacity C1 and transistor drive circuit respectively.
Described transistor drive circuit is by triode VT3, triode VT4, triode VT5, one end is connected with the collector of triode VT3, the resistance R13 of other end ground connection, one end is connected with the base stage of triode VT3, the resistance R14 that the other end is then connected with the emitter of triode VT3, one end is connected with the base stage of triode VT3, the resistance R15 that the other end is then connected with the emitter of triode VT4, the electric capacity C8 be in parallel with resistance R15, one end is connected with the collector of triode VT4, the resistance R16 that the other end is then connected with the collector of triode VT5, be serially connected in the resistance R17 between the emitter of triode VT5 and base stage, and positive pole is connected with the emitter of triode VT5, the electric capacity C9 that negative pole is then connected with testing circuit forms, the emitter of described triode VT3 is connected with the output terminal of Sheffer stroke gate IC3 and testing circuit respectively, ground connection while the emitter of described triode VT4 is connected with the emitter of triode VT3, its collector are then connected with the base stage of triode VT5, its base stage is then connected with the collector of triode VT5.
Described testing circuit is by detection chip U, amplifier P1, N pole is connected with the RLIM pin of detection chip U, P pole is the diode D1 of ground connection after electric capacity C3 then, one end is connected with the P pole of diode D1, the resistance R8 of ground connection while the other end is then connected with the LBO pin of detection chip U after resistance R9, positive pole is connected with the PGND pin of detection chip U, the electric capacity C4 of minus earth, positive pole is connected with the GND pin of detection chip U, the electric capacity C5 of minus earth, one end is connected with the negative pole of electric capacity C5, the resistance R12 that the other end is then connected with the positive pole of amplifier P1, positive pole is connected with the positive pole of amplifier P1, the electric capacity C6 of minus earth, be serially connected in the resistance R11 between the positive pole of amplifier P1 and output terminal, one end is connected with the LX pin of detection chip U, the resistance R10 that the other end is then connected with the positive pole of amplifier P1, and form with the electric capacity C7 that resistance R10 is in parallel, the VBAT pin of described detection chip U is connected with the emitter of triode VT3, its SHDN pin is then connected with the negative pole of electric capacity C2, its FB pin is then connected with the tie point of resistance R9 with resistance R8, its VOUT pin and LBI pin are connected with negative pole with the positive pole of amplifier P1 respectively, and its LX pin is then connected with the negative pole of electric capacity C9.
Described detection chip U is SP6648 integrated circuit.
The present invention comparatively prior art compares, and has the following advantages and beneficial effect:
(1) structure of the present invention is simple, and easy to operate, system cost is cheap.
(2) moment of torsion when the present invention can work to wheel box simultaneously, temperature, Vibration Condition are tested, and extrapolate its output power thus, and the combination property of wheel box is tested.
(3) the present invention can test the combination property of wheel box under different road conditions, to assess the combination property of wheel box.
Accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present invention;
Fig. 2 is torque signal processing module electrical block diagram of the present invention.
Reference numeral name in above accompanying drawing is called:
1-wheel box, 2-driver module, 3-resistance system, 4-torque sensor, 5-temperature sensor, 6-vibration transducer, 7-single-chip microcomputer, 8-torque signal processing module, 81-input circuit, 82-logic control circuit, 83-transistor drive circuit, 84-testing circuit.
Embodiment
Below in conjunction with embodiment, the present invention is described in further detail, but embodiments of the present invention are not limited to this.
Embodiment
As shown in Figure 1, the present invention is by wheel box 1, the driver module 2 be connected with wheel box 1, resistance system 3, vibration transducer 6, temperature sensor 5, torque sensor 4, the torque signal processing module 8 be connected with torque sensor 4, and the single-chip microcomputer 7 be simultaneously connected with torque signal processing module 8, temperature sensor 5, vibration transducer 6 forms.
Wherein, this driver module 2 is for providing driving power to wheel box.And resistance system 3 applies the second moment of torsion for giving wheel box 1, the direction of this second moment of torsion and driver module 2 to be supplied to the first torque direction of wheel box 1 contrary, namely the second moment of torsion and the first moment of torsion restrict mutually, then can simulate the resistance coefficient of wheel box 1 under different road conditions when the size of adjustment second moment of torsion.This torque sensor 4 is arranged on the clutch end of wheel box 1, for gathering the torque information of wheel box 1 under different road conditions.Temperature sensor 5 and vibration transducer 6 are then all arranged on the surface of wheel box 1, and this temperature sensor 5 is for gathering temperature signal when wheel box 1 works, and vibration transducer 6 is then for gathering vibration signal when wheel box 1 works.Torque signal processing module 8 processes for the torque signal exported wheel box 1.Torque signal, temperature signal, vibration signal all flow to single-chip microcomputer 7, carry out Macro or mass analysis, and can extrapolate the parameters such as the power of wheel box 1 thus by single-chip microcomputer 7.
In order to reach better effect, the JN338-AF type flange form torque rotary speed sensor that this torque sensor 4 preferentially adopts Beijing Sanjing Chuangye Technology Group Co.ltd to produce, this model torque sensor takes up room little when installing, torque measurement precision is high, rotating speed is applied widely, dynamic, the torque of static measurement connecting portion rotation axis, rotating speed, shaft power.Temperature sensor 5 is then preferably the JCJ100TW type temperature sensor that Beijing nine skill Development Co., Ltd of pure Rehabilitation produces, the features such as it has compact, is quick on the draw, waterproof antidetonation.The A308 type wireless vibration sensor that vibration transducer 6 preferentially adopts Beijing Bi Chuan Science and Technology Co., Ltd. to produce, its noise adopting wireless digital signal transmission mode to eliminate long cable transmission to bring, whole measuring system has high measuring accuracy and antijamming capability.Driver module 2, resistance system 3 and single-chip microcomputer 7 then adopt prior art to realize.Torque signal processing module 8 is emphasis place of the present invention.
As shown in Figure 2, this torque signal processing module 8 is by input circuit 81, the logic control circuit 82 be connected with input circuit 81, the transistor drive circuit 83 that andlogic control circuit 82 is connected, and the testing circuit 84 that andlogic control circuit 82 is connected with transistor drive circuit 83 simultaneously forms.
Input circuit 81 is wherein by triode VT1, triode VT2, one end is connected with the emitter of triode VT1, the other end then in turn through the resistance R2 that resistance R3 is connected with the emitter of triode VT2 after resistance R4, and one end is connected with the collector of triode VT1, the other end resistance R1 that then andlogic control circuit 82 is connected forms.The base stage of described triode VT1 is then connected with the base stage of triode VT2 as the input end of this input circuit 81, its collector.The collector andlogic control circuit 82 of described triode VT2 is connected.
Described logic control circuit 82 is by Sheffer stroke gate IC1, Sheffer stroke gate IC2, Sheffer stroke gate IC3, field effect transistor Q1, one end is connected with the grid of field effect transistor Q1, the resistance R5 that the other end is then connected with the collector of triode VT1 after resistance R1, positive pole is connected with the output terminal of Sheffer stroke gate IC2, the electric capacity C2 that negative pole is then connected with testing circuit 84, positive pole is connected with the drain electrode of field effect transistor Q1, the electric capacity C1 that negative pole is then connected with the output terminal of Sheffer stroke gate IC1 after resistance R7, and one end is connected with the drain electrode of field effect transistor Q1, the resistance R6 that the other end is then connected with the positive pole of Sheffer stroke gate IC3 forms.The negative pole of described Sheffer stroke gate IC2 is connected with the collector of triode VT2, its positive pole is then connected with the output terminal of Sheffer stroke gate IC1.The negative pole of described Sheffer stroke gate IC1 is connected with the negative pole of Sheffer stroke gate IC2, its positive pole is then connected with the source electrode of field effect transistor Q1, its output terminal is then connected with the negative pole of Sheffer stroke gate IC3.The output terminal of described Sheffer stroke gate IC3 is connected with the negative pole of electric capacity C1 and transistor drive circuit 83 respectively.
Described transistor drive circuit 83 is by triode VT3, triode VT4, triode VT5, one end is connected with the collector of triode VT3, the resistance R13 of other end ground connection, one end is connected with the base stage of triode VT3, the resistance R14 that the other end is then connected with the emitter of triode VT3, one end is connected with the base stage of triode VT3, the resistance R15 that the other end is then connected with the emitter of triode VT4, the electric capacity C8 be in parallel with resistance R15, one end is connected with the collector of triode VT4, the resistance R16 that the other end is then connected with the collector of triode VT5, be serially connected in the resistance R17 between the emitter of triode VT5 and base stage, and positive pole is connected with the emitter of triode VT5, the electric capacity C9 that negative pole is then connected with testing circuit 84 forms.The emitter of described triode VT3 is connected with the output terminal of Sheffer stroke gate IC3 and testing circuit 84 respectively.Ground connection while the emitter of described triode VT4 is connected with the emitter of triode VT3, its collector are then connected with the base stage of triode VT5, its base stage is then connected with the collector of triode VT5.
Described testing circuit 84 is by detection chip U, amplifier P1, N pole is connected with the RLIM pin of detection chip U, P pole is the diode D1 of ground connection after electric capacity C3 then, one end is connected with the P pole of diode D1, the resistance R8 of ground connection while the other end is then connected with the LBO pin of detection chip U after resistance R9, positive pole is connected with the PGND pin of detection chip U, the electric capacity C4 of minus earth, positive pole is connected with the GND pin of detection chip U, the electric capacity C5 of minus earth, one end is connected with the negative pole of electric capacity C5, the resistance R12 that the other end is then connected with the positive pole of amplifier P1, positive pole is connected with the positive pole of amplifier P1, the electric capacity C6 of minus earth, be serially connected in the resistance R11 between the positive pole of amplifier P1 and output terminal, one end is connected with the LX pin of detection chip U, the resistance R10 that the other end is then connected with the positive pole of amplifier P1, and form with the electric capacity C7 that resistance R10 is in parallel, the VBAT pin of described detection chip U is connected with the emitter of triode VT3, its SHDN pin is then connected with the negative pole of electric capacity C2, its FB pin is then connected with the tie point of resistance R9 with resistance R8, its VOUT pin and LBI pin are connected with negative pole with the positive pole of amplifier P1 respectively, and its LX pin is then connected with the negative pole of electric capacity C9.In order to reach better implementation result, described detection chip U preferentially adopts SP6648 integrated circuit to realize.
As mentioned above, just well the present invention can be realized.
Claims (6)
1. the wheel box test macro detected based on dynamic property, it is characterized in that: by wheel box (1), the driver module (2) be connected with wheel box (1), resistance system (3), vibration transducer (6), temperature sensor (5), torque sensor (4), the torque signal processing module (8) be connected with torque sensor (4), and the single-chip microcomputer (7) be simultaneously connected with torque signal processing module (8), temperature sensor (5), vibration transducer (6) forms; Described torque signal processing module (8) is by input circuit (81), the logic control circuit (82) be connected with input circuit (81), the transistor drive circuit (83) that andlogic control circuit (82) is connected, and the testing circuit (84) that andlogic control circuit (82) is connected with transistor drive circuit (83) simultaneously forms.
2. a kind of wheel box test macro detected based on dynamic property according to claim 1, it is characterized in that: described input circuit (81) is by triode VT1, triode VT2, one end is connected with the emitter of triode VT1, the other end then in turn through the resistance R2 that resistance R3 is connected with the emitter of triode VT2 after resistance R4, and one end is connected with the collector of triode VT1, the other end resistance R1 that then andlogic control circuit (82) is connected forms; The base stage of described triode VT1 is then connected with the base stage of triode VT2 as the input end of this input circuit (81), its collector; The collector andlogic control circuit (82) of described triode VT2 is connected.
3. a kind of wheel box test macro detected based on dynamic property according to claim 2, it is characterized in that: described logic control circuit (82) is by Sheffer stroke gate IC1, Sheffer stroke gate IC2, Sheffer stroke gate IC3, field effect transistor Q1, one end is connected with the grid of field effect transistor Q1, the resistance R5 that the other end is then connected with the collector of triode VT1 after resistance R1, positive pole is connected with the output terminal of Sheffer stroke gate IC2, the electric capacity C2 that negative pole is then connected with testing circuit (84), positive pole is connected with the drain electrode of field effect transistor Q1, the electric capacity C1 that negative pole is then connected with the output terminal of Sheffer stroke gate IC1 after resistance R7, and one end is connected with the drain electrode of field effect transistor Q1, the resistance R6 that the other end is then connected with the positive pole of Sheffer stroke gate IC3 forms, the negative pole of described Sheffer stroke gate IC2 is connected with the collector of triode VT2, its positive pole is then connected with the output terminal of Sheffer stroke gate IC1, the negative pole of described Sheffer stroke gate IC1 is connected with the negative pole of Sheffer stroke gate IC2, its positive pole is then connected with the source electrode of field effect transistor Q1, its output terminal is then connected with the negative pole of Sheffer stroke gate IC3, the output terminal of described Sheffer stroke gate IC3 is connected with the negative pole of electric capacity C1 and transistor drive circuit (83) respectively.
4. a kind of wheel box test macro detected based on dynamic property according to claim 3, it is characterized in that: described transistor drive circuit (83) is by triode VT3, triode VT4, triode VT5, one end is connected with the collector of triode VT3, the resistance R13 of other end ground connection, one end is connected with the base stage of triode VT3, the resistance R14 that the other end is then connected with the emitter of triode VT3, one end is connected with the base stage of triode VT3, the resistance R15 that the other end is then connected with the emitter of triode VT4, the electric capacity C8 be in parallel with resistance R15, one end is connected with the collector of triode VT4, the resistance R16 that the other end is then connected with the collector of triode VT5, be serially connected in the resistance R17 between the emitter of triode VT5 and base stage, and positive pole is connected with the emitter of triode VT5, the electric capacity C9 that negative pole is then connected with testing circuit (84) forms, the emitter of described triode VT3 is connected with the output terminal of Sheffer stroke gate IC3 and testing circuit (84) respectively, ground connection while the emitter of described triode VT4 is connected with the emitter of triode VT3, its collector are then connected with the base stage of triode VT5, its base stage is then connected with the collector of triode VT5.
5. a kind of wheel box test macro detected based on dynamic property according to claim 4, it is characterized in that: described testing circuit (84) is by detection chip U, amplifier P1, N pole is connected with the RLIM pin of detection chip U, P pole is the diode D1 of ground connection after electric capacity C3 then, one end is connected with the P pole of diode D1, the resistance R8 of ground connection while the other end is then connected with the LBO pin of detection chip U after resistance R9, positive pole is connected with the PGND pin of detection chip U, the electric capacity C4 of minus earth, positive pole is connected with the GND pin of detection chip U, the electric capacity C5 of minus earth, one end is connected with the negative pole of electric capacity C5, the resistance R12 that the other end is then connected with the positive pole of amplifier P1, positive pole is connected with the positive pole of amplifier P1, the electric capacity C6 of minus earth, be serially connected in the resistance R11 between the positive pole of amplifier P1 and output terminal, one end is connected with the LX pin of detection chip U, the resistance R10 that the other end is then connected with the positive pole of amplifier P1, and form with the electric capacity C7 that resistance R10 is in parallel, the VBAT pin of described detection chip U is connected with the emitter of triode VT3, its SHDN pin is then connected with the negative pole of electric capacity C2, its FB pin is then connected with the tie point of resistance R9 with resistance R8, its VOUT pin and LBI pin are connected with negative pole with the positive pole of amplifier P1 respectively, and its LX pin is then connected with the negative pole of electric capacity C9.
6. a kind of wheel box test macro detected based on dynamic property according to claim 5, is characterized in that: described detection chip U is SP6648 integrated circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510251143.4A CN104849043A (en) | 2015-05-17 | 2015-05-17 | Gearbox testing system based on dynamic performance detection |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510251143.4A CN104849043A (en) | 2015-05-17 | 2015-05-17 | Gearbox testing system based on dynamic performance detection |
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| CN104849043A true CN104849043A (en) | 2015-08-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510251143.4A Pending CN104849043A (en) | 2015-05-17 | 2015-05-17 | Gearbox testing system based on dynamic performance detection |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106353095A (en) * | 2016-11-30 | 2017-01-25 | 广州市花都全球自动变速箱有限公司 | Test system for automatic gearbox |
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2015
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| DE10235433A1 (en) * | 2002-04-25 | 2003-11-06 | Zahnradfabrik Friedrichshafen | Gear oil temperature determination method for a motor vehicle gearbox, whereby a temperature value for a coil integrated in an electromagnetic drive system for the gear unit hydraulic control is related to the oil temperature |
| CN2622695Y (en) * | 2003-03-25 | 2004-06-30 | 上海华龙测试仪器有限公司 | Microcomputer controlled torque tester |
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Application publication date: 20150819 |