CN104777237B - Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly - Google Patents

Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly Download PDF

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Publication number
CN104777237B
CN104777237B CN201510170184.0A CN201510170184A CN104777237B CN 104777237 B CN104777237 B CN 104777237B CN 201510170184 A CN201510170184 A CN 201510170184A CN 104777237 B CN104777237 B CN 104777237B
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test block
counterbore
thickness
groups
plate matrix
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CN104777237A (en
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裘揆
张国方
叶连慧
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Shanghai Hewu Precision Apparatus Co Ltd
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Shanghai Hewu Precision Apparatus Co Ltd
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Abstract

The present invention announces a kind of low-voltage electrical apparatus electric contact ultrasonic examination test block assembly, including a plate matrix and the inserted test block being assembled on plate matrix, test block is respectively slit-type test block, thickness resolution test block, plagiohedral test block and cabochon test block, and counterbore array is provided with the plate matrix;Four groups of test blocks are embedded on the plate matrix by the counterbore of the counterbore array.The present invention can coordinate ultrasound scanning, complete ultrasonic probe to different-thickness, different depth, different in width acoustics resolving power, thickness resolving power demarcation;Meet live common function needs, substitute test block specified in multiple standards, improve operating efficiency.

Description

Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly
Technical field
The invention belongs to ultrasonic examination equipment technology field, is to be related to a kind of low-voltage electrical apparatus electric contact more specifically Ultrasonic examination test block assembly.
Background technology
Ultrasound examination is one of lossless detection method being most widely used at present.Standard testing block is ultrasonic non-destructive inspection Indispensable element during survey, it is mainly used in probe, the performance test of detector, the adjustment of sensitivity, and measurement range The work of adjustment etc..In real work, needed because job specification is different and sample work piece is different using different Ultrasonic examination standard.At present, in Ultrasonic Nondestructive field, the kind of test block is single compared with multipurpose, and different states There is the standard of country variant in family, therefore, it is necessary to multiple standard testing block cooperations ability during staff's progress ultrasound examination Testing index can be completed, meanwhile, the ultrasound examination to Low Voltage Electrical Apparatus, existing standard testing block, which does not take into full account, to be treated The surface configuration of workpiece is surveyed, testing standard is simultaneously imperfect.
The content of the invention
For it is above-mentioned in the prior art the defects of, the purpose of the present invention is that a kind of low-voltage electrical apparatus electric contact ultrasonic wave of design is visited Wound test block assembly, can substitute multiple Special test blocks, can quick and precisely detection probe all kinds of indexs, take into full account simultaneously The surface configuration of electrical contact in electrical contact field, meets a variety of needs of work.
To achieve the above object, the technical solution adopted by the present invention is:
The present invention provides a kind of low-voltage electrical apparatus electric contact ultrasonic examination test block assembly, including a plate matrix and edge Embedded is assembled in four groups of test blocks on the plate matrix, and four groups of test blocks are respectively slit-type test block, the survey of thickness resolving power Test block, plagiohedral test block and cabochon test block;Wherein:Counterbore array is provided with the plate matrix;Four groups of test blocks lead to The counterbore for crossing the counterbore array is embedded on the plate matrix.
Preferably, the slit-type test block is embedded in above the counterbore array on the plate matrix in two row counterbores, The thickness resolution test block is embedded in the row counterbore of the left side two of four rows below the counterbore array on the plate matrix, institute State plagiohedral test block and cabochon test block is embedded in the right three of four rows below the counterbore array of the plate matrix respectively In row wherein in a row counterbore.
Preferably, the plate matrix is cuboid thin plate, and the thickness of the plate matrix is 40~50mm.
Preferably, the counterbore array, provided with multiple cylinder counterbores or multiple squares or cuboid counterbore.
Preferably, the slit-type test block shares ten groups, wherein five groups of counterbore battle arrays for being laterally embedded in the plate matrix In the counterbore of row, five groups are longitudinally embedded in the counterbore of the plate matrix in addition;The stainless-steel sheet pasted is embedded in institute State in first group of counterbore of plate matrix;Slit-type test block described in every group is by the stainless-steel sheet of polylith consistency of thickness with one Identical gap bonds and formed;The thickness of the stainless-steel sheet of the slit-type test block and gap are different between each group.
Preferably, the thickness resolution test block shares eight groups, and the thickness of thickness resolution test block is each described in eight groups Differ, thickness is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm;Correspondingly, The countersunk head depth for eight counterbores that the counterbore array is set be respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm, thickness resolution test block described in eight groups is mounted to counterbore corresponding to the counterbore array respectively It is interior.
Preferably, the plagiohedral test block is two groups of thickness blocks;It is corresponding, the counterbore battle array on the plate matrix It is provided with corresponding two counterbores in row, the height of the counterbore has that certain altitude is poor, and causes two counterbores in height Spend line and the horizontal direction of upper surface respectively in an inclination angle (two inclinations angle are acute angle, such as can be respectively 5 ° and 10 °), that is, make it that the plagiohedral test block is in an inclination angle after the counterbore being embedded on the plate matrix.It is more excellent Selection of land, the thickness of thickness block is 2mm in the plagiohedral test block.
Preferably, the cabochon test block is the detection block that two groups of surfaces are arc surface;By the cabochon test block It is embedded in the counterbore set on the plate matrix.It is highly preferred that the arc radius difference of the arc surface of detection block described in two groups For 15mm and 25mm, the detection block thickness is 5mm.
The processing technology that the technical solution adopted by the present invention is related to is simple.
By adopting the above-described technical solution, the beneficial effects of the invention are as follows:
Ultrasonic examination of the present invention test block assembly, can coordinate ultrasound scanning, complete ultrasonic wave The demarcation popped one's head in the acoustics resolving power, thickness resolving power of the situations such as different-thickness, different depth, different in width, and for surveying Common cambered surface and inclined-plane situation propose testing standard in trial work part.Meanwhile the present invention is simple, comprehensive, can meet scene Common function needs, test block specified in alternative multiple standards, improves operating efficiency, has very high popularization and application valency Value.
Brief description of the drawings
Fig. 1 is the plate basal body structure schematic diagram of one embodiment of the invention;
In figure:6 be the setting area of slit-type test block on plate matrix, and 7 be thickness resolution test block on plate matrix Setting area, 8 be the setting area of plate matrix ramp type test block, and 9 be the setting area of cabochon test block on plate matrix;
Fig. 2, Fig. 3 are respectively the main view profile and top view of the slit-type test block of one embodiment of the invention,
In figure:10 be slit-type test block, and 11 be the plate matrix of slit-type test block;
Fig. 4 is the main view profile of the thickness resolution test block of one embodiment of the invention;
In figure:12 be thickness resolution test block, and 13 be the plate matrix of thickness resolution test block;
Fig. 5 is the main view profile of the plagiohedral test block of one embodiment of the invention;
In figure:14 be plagiohedral test block, and 15 be the plate matrix of plagiohedral test block;
Fig. 6 is the main view profile of the cabochon test block of one embodiment of the invention,
In figure:16 be cabochon test block, and 17 be the plate matrix of cabochon test block.
Embodiment
Embodiments of the invention are elaborated below, following examples give detailed embodiment and specific Operating process, but protection scope of the present invention is not limited to following embodiments.
As shown in figures 1 to 6, low-voltage electrical apparatus electric contact ultrasonic examination of the present invention is illustrated with the implementation of test block assembly It is intended to, described test block assembly includes four groups of test blocks, and four groups of test blocks are inserted to be assembled on one piece of plate matrix;Four groups of surveys Test block be respectively slit-type test block (as shown in Figure 2), thickness resolution test block (as shown in Figure 4), plagiohedral test block (such as Shown in Fig. 5) and cabochon test block (as shown in Figure 6);Counterbore array is provided with the plate matrix;Four groups of test blocks pass through institute The counterbore for stating counterbore array is embedded on the plate matrix.
As a preferred embodiment, the plate matrix is square thin plate, and thickness is 40~50mm, is had on thin plate multiple certain The hole of size, the counterbore of the counterbore array is squared counter bore or cylindrical bore, and the present embodiment counterbore is arranged to 25, arrangement Arranged for 5 rows 5.Certainly, in other embodiments, the counterbore number of counterbore array can also be other numbers, and this does not influence this hair The essence of bright realization.
A preferred embodiment is used as shown in Figure 1, the slit-type test block there are 10 groups, wherein horizontal type slit test block has 5 Group, perpendicular type slit test block have 5 groups, and the slit-type test block is embedded in the setting area 6 of slit-type test block on plate matrix; The thickness resolution test block has 8 groups, is embedded in the setting area 7 of thickness resolution test block on plate matrix;The inclined-plane Type test block have 2 groups, the cabochon test block have 2 groups, be embedded in the setting area 8 of plate matrix ramp type test block respectively With the setting area 9 of cabochon test block on plate matrix.
As shown in Figure 2,3, the slit-type test block 10, it is certain thickness stainless by polylith as a preferred embodiment Steel steel plate is bonded with a certain size gap and formed, and steel plate is highly consistent in each group, adhesion gap one between steel plate and steel plate Cause.The steel plate thickness of test block is different with steel plate gap between every group.There are 0.1mm, 0.13mm in steel plate thickness and gap respectively, 0.15mm, 0.18mm, 0.2mm, each two sets, share ten groups.Every group of slit-type test block 10 has five pieces of steel plates bondings to form.And In slit-type test block 10 described in ten groups, a set of five groups therein are the heavy of the horizontal plate matrix 11 for being embedded in slit-type test block In hole, five groups of other set is that longitudinal direction is embedded in the counterbore of plate matrix 11 of slit-type test block.The slit-type that will have been pasted Test block 10 is embedded in by above-mentioned direction in the first kind counterbore 6 of the plate matrix 11 of slit-type test block.
As shown in figure 4, as a preferred embodiment, the thickness resolution test block 12 shares eight groups, and eight groups of thickness are each not Identical, thickness is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm.Correspondingly, it is thick The countersunk head depth for spending eight counterbores of the plate matrix 13 of resolution test block is respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm, eight groups of thickness resolution test blocks 12 are embedded in thickness resolution test block respectively In corresponding eight counterbores of plate matrix 13.
As shown in figure 5, as a preferred embodiment, the plagiohedral test block 14 is the thickness block that two groups of thickness are 2mm;With It is corresponding, two counterbores are provided with the plate matrix 15 of plagiohedral test block, especially, the height of counterbore are arranged to have There is certain difference in height, and make it that the line on surface is in 5 ° and 10 ° of inclination respectively with horizontal direction to two counterbores in height Angle, that is, cause plagiohedral test block 14 after two counterbores being embedded on the plate matrix 15 of plagiohedral test block in 5 ° and 10 ° of inclination angle.
As shown in fig. 6, as a preferred embodiment, the cabochon test block 16 is that two groups of surfaces are arc surface and circular arc Radius is respectively 15mm and 25mm detection block, and the thickness of cabochon test block 16 is 5mm, and cabochon test block 16 is embedded in into arc In the counterbore set on the plate matrix 17 of face type test block.
The acoustics, thickness, inclined-plane cambered surface resolution ratio to detecting instrument probe, detection performance are needed before ultrasound examination is started Test calibration is carried out, to ensure the stability of system.
Slit-type test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the survey to the acoustic capability of ultrasonic probe Examination, great slit width slit width how small in other words can be distinguished by being primarily to see probe.
Thickness type test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the thickness penetration capacity to ultrasonic probe Test, the steps of more thickness can be penetrated by being primarily to see probe.
Inclined-plane cabochon test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the inclined-plane cambered surface to ultrasonic probe The test of detectability, it is primarily to see the angle capability that probe differentiates inclined-plane and arc surface.
The present invention can coordinate ultrasound scanning, complete ultrasonic probe to different-thickness, different depth, different width The demarcation of the acoustics resolving power, thickness resolving power of the situation of degree etc., and for cambered surface and inclined-plane situation common in test piece Propose testing standard.Meanwhile the present invention is simple, comprehensively, live common function needs can be met, in alternative multiple standards Defined test block, operating efficiency is improved, is had highly application value.
Although present disclosure is discussed in detail by above preferred embodiment, but it should be appreciated that above-mentioned Description is not considered as limitation of the present invention.After those skilled in the art have read the above, for the present invention's A variety of modifications and substitutions all will be apparent.Therefore, protection scope of the present invention should be limited to the appended claims.

Claims (5)

1. a kind of low-voltage electrical apparatus electric contact ultrasonic examination test block assembly, it is characterised in that including a plate matrix and edge Embedded is assembled in four groups of test blocks on the plate matrix, and four groups of test blocks are respectively slit-type test block, the survey of thickness resolving power Test block, plagiohedral test block and cabochon test block;Wherein:Counterbore array is provided with the plate matrix;Four groups of test blocks lead to The counterbore for crossing the counterbore array is embedded on the plate matrix;
The slit-type test block is embedded in above the counterbore array on the plate matrix in two row counterbores, and the thickness is differentiated Power test block is embedded in the row counterbore of the left side two of four rows below the counterbore array on the plate matrix, the plagiohedral test Block and cabochon test block are embedded in wherein one in the row of the right three of four rows below the counterbore array of the plate matrix respectively In row counterbore;
The slit-type test block shares ten groups, wherein in the counterbore of five groups of counterbore arrays for being laterally embedded in the plate matrix, Other five groups are longitudinally embedded in the counterbore of the counterbore array;The stainless-steel sheet pasted is embedded in the plate matrix In first group of counterbore;Slit-type test block described in every group is glued by the stainless-steel sheet of polylith consistency of thickness with an identical gap Knot forms;The thickness of the stainless-steel sheet of the slit-type test block and gap are different between each group;
The thickness resolution test block shares eight groups, and the thickness of thickness resolution test block is different described in eight groups, thickness It is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm;Correspondingly, the counterbore array Set eight counterbores countersunk head depth be respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm, thickness resolution test block described in eight groups is mounted to corresponding to the counterbore array in counterbore respectively;
The plagiohedral test block is two groups of thickness blocks;It is corresponding, it is provided with the counterbore array on the plate matrix Corresponding two counterbores, the height of the counterbore have that certain altitude is poor, and causes two counterbores surface in height Line and horizontal direction are in an inclination angle respectively;
The cabochon test block is the detection block that two groups of surfaces are arc surface;The cabochon test block is embedded in the plate In the counterbore set on matrix.
A kind of 2. low-voltage electrical apparatus electric contact ultrasonic examination according to claim 1 test block assembly, it is characterised in that The counterbore array, provided with multiple cylinder counterbores or multiple squares or cuboid counterbore.
A kind of 3. low-voltage electrical apparatus electric contact ultrasonic examination according to claim 1 test block assembly, it is characterised in that The inclination angle is acute angle.
A kind of 4. low-voltage electrical apparatus electric contact ultrasonic examination according to claim 1 test block assembly, it is characterised in that The thickness of thickness block is 2mm in the plagiohedral test block.
A kind of 5. low-voltage electrical apparatus electric contact ultrasonic examination according to claim 1 test block assembly, it is characterised in that The arc radius of the arc surface of detection block described in two groups is respectively 15mm and 25mm, and the detection block thickness is 5mm.
CN201510170184.0A 2015-04-10 2015-04-10 Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly Active CN104777237B (en)

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JP6263665B1 (en) * 2017-01-24 2018-01-17 住友化学株式会社 Pseudo-defect sample and manufacturing method thereof, adjustment method of ultrasonic flaw detection measurement conditions, target material inspection method, and sputtering target manufacturing method
CN107462702B (en) * 2017-08-02 2019-05-31 东莞合安机电有限公司 Postpone test strips assembly line complete machine
CN109459502A (en) * 2018-12-03 2019-03-12 森松(江苏)重工有限公司 A kind of support frame for holding multiple pieces TOFD reference block

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CN2099974U (en) * 1991-08-01 1992-03-25 陶志强 Block-chain belt for radioactive ray detecting of defect depth of test block
US6938457B2 (en) * 2003-10-08 2005-09-06 General Electric Company Phased array ultrasonic reference block
JP2008185578A (en) * 2007-01-26 2008-08-14 Showa Seisakusho:Kk Ultrasonic reference block with artificial defect that resembles natural defect closely
CN201177619Y (en) * 2008-03-10 2009-01-07 山东济宁模具厂 Phased array test block
CN201259533Y (en) * 2008-09-23 2009-06-17 王国柱 A magnetic resonance quality control integrated test phantom
CN203688508U (en) * 2013-12-31 2014-07-02 北京有色金属研究总院 Test block for evaluating property of bar material phased array detection system
CN104597137B (en) * 2014-12-31 2017-03-22 广西南南铝加工有限公司 Ultrasonic testing block group for residual stress of aluminum alloy prestretching plate and application method thereof
CN204536282U (en) * 2015-04-10 2015-08-05 上海和伍新材料科技有限公司 Low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly

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