CN104749610A - Verification source box used for special-shaped alpha and beta probes - Google Patents
Verification source box used for special-shaped alpha and beta probes Download PDFInfo
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- CN104749610A CN104749610A CN201510163082.6A CN201510163082A CN104749610A CN 104749610 A CN104749610 A CN 104749610A CN 201510163082 A CN201510163082 A CN 201510163082A CN 104749610 A CN104749610 A CN 104749610A
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- arc
- inlay card
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Abstract
The invention provides a verification source box used for special-shaped alpha and beta probes. The verification source box is used for ionizing radiation metering verification and calibration of various alpha and beta probes different in shape. The verification source box comprises an arc-shaped fixed embedding-clamping curved surface, a rotary embedding window, an underframe and a shielding dustproof cover. An embedding-clamping arc I of the arc-shaped fixed embedding-clamping curved surface and an embedding-clamping arc II of the rotary embedding window are arranged correspondingly, the arc-shaped fixed embedding-clamping curved surface as well as the rotary embedding window and a detecting probe of a to-be-verified probe are arranged correspondingly, and diameter of the underframe is matched with that of each of the arc-shaped fixed embedding-clamping curved surface and the rotary embedding window. In the process of verification and calibration of the special-shaped alpha and beta probes, the verification source box is controllable in distance, multiple in function, safe and simple, convenient and quick in operation process, accuracy and reliability in transmission of metering and verification quantity value are guaranteed, and the verification source box has the advantages of simplicity, reliability and easiness in realization.
Description
Technical field
The invention belongs to ionising radiation metering calibrating, calibration field, be specifically related to a kind of calibrating source capsule for special-shaped α, beta probe, can be used in calibrating, calibrate special-shaped α, beta probe and storage α, β standard radioactive source.
Background technology
In strategic arms beforehand research, test and elimination of nuclear facilities process, a large amount of special-shaped α, beta probe need be used.Along with the needs to radioactivity place surface monitoring, each nuclear instrument companies develops different α, β surface pollution measuring instrument, its probe detection window shape, size are not quite similar, and have circle, rectangle, square, even on a probe, are provided with multiple detection window.By ionising radiation metering vertification regulation JJG478-96 regulation, α, β surface pollution measuring instrument is examined and determine, strict distribution experiment operation platform need be had when calibrating.In the face of α, β surface pollution measuring instrument that these are examined by force, to the distance between standard radioactive source surface and detector, geometric center position, prior art can not meet numerous different α, beta probe are examined and determine, calibration operation, thus cause the uncertainty increase of calibrating, calibration result, reduce the reliability of calibrating, calibration data.
Summary of the invention
In order to overcome in prior art examine and determine source capsule be difficult to meet to numerous different α, beta probe calibrating, calibration deficiency, the invention provides a kind of calibrating source capsule for special-shaped α, beta probe.
The technical solution used in the present invention is: the calibrating source capsule for special-shaped α, beta probe of the present invention, be characterized in, described calibrating source capsule comprises arc and fixes inlay card curved surface, rotaryly embeddingly gets window, chassis, dustproof, shielding lid, wherein, described arc is fixed inlay card curved surface and is contained barber-pole stripes I, puts card taking point I, inlay card arc I, described rotary embedding window of getting contains and puts card taking point II, inlay card arc II, fixing spiral shell button, and described chassis is provided with barber-pole stripes II.Its annexation is, described arc fixes inlay card curved surface arranged outside barber-pole stripes I, and inner side is provided with inlay card arc I, is provided with and puts card taking point I, puts card taking point III at inlay card arc I two-end-point.Described rotary embedding window inner side of getting is provided with inlay card arc II, is provided with and puts card taking point II, puts card taking point IV at inlay card arc II two-end-point.Rotary embedding window one end points of getting is provided with fixing spiral shell button.Described chassis is provided with barber-pole stripes II.Described arc is fixed inlay card curved surface and is fixed on side on chassis, rotary embedding window of getting is fixed on opposite side on chassis by fixing spiral shell button, rotary embedding window of getting makes to put card taking point I by fixing spiral shell button and puts card taking point II phase inlay card, put card taking point III and put card taking point IV phase inlay card.Described arc fixes inlay card curved surface, rotary embedding window of getting is separately positioned on same axial line both sides.Dustproof, shielding lid is provided with the internal thread corresponding with barber-pole stripes I, barber-pole stripes II.Arc is fixed inlay card curved surface, is rotaryly embeddingly got window, chassis is fixed in dustproof, shielding lid.
The described arc inlay card arc I of fixing inlay card curved surface is corresponding with the rotary embedding inlay card arc II getting window to be arranged.
Described arc fixes inlay card curved surface, rotary embedding window of getting to be popped one's head in corresponding setting with treating the detection of test examination instrument.
The diameter on described chassis fixes inlay card curved surface respectively with arc, the rotary embedding diameter getting window matches, and fixes inlay card curved surface 1 and rotaryly embeddingly get the circumference that window 2 forms and mate with chassis 3 by arc.
Described arc fixes inlay card curved surface by the polytetrafluoroethylmaterial material of low atomic number and being fixedly connected with of chassis.
What arrange in the present invention puts card taking point I, inlay card arc I, puts card taking point II, inlay card arc II so that standard radioactive source
Insert, take out, store, fix control criterion radioactive source surface and special-shaped α, beta probe simultaneously and protect distance between aperture plate, geometric center position, the not contaminated damage of protecting standard radioactive source is built on chassis, dustproof, shielding.
According to ionising radiation metering vertification regulation JJG478-96 regulation, when examining and determine, calibrating special-shaped α, the beta probe of α, β surface pollution measuring instrument, special-shaped α, beta probe protection aperture plate has different requirement from the spacing on standard radioactive source surface.Wherein, when examining and determine, calibrate the special-shaped alpha probe of α, β surface pollution measuring instrument, α standard radioactive source surface and special-shaped alpha probe protect distance between aperture plate to be 5mm.When examining and determine, calibrate the special-shaped beta probe of α, β surface pollution measuring instrument, β standard radioactive source surface and special-shaped beta probe protect distance between aperture plate to be 10mm.
The invention has the beneficial effects as follows, distance controlling: effectively fixing control criterion radioactive source surface and special-shaped α, beta probe protects distance between aperture plate, geometric center position, reduce data uncertainty, thus improve examine and determine, the accuracy of calibration data; Multi-functional: α, β surface pollution measuring instrument being applicable to α, different, the many detection window of beta probe shape size; Security: solve the damage of standard radioactive source, pollution; Operating process is simple and convenient: effectively improve calibrating, calibrate the work efficiency of special-shaped α, beta probe.In calibrating, calibrate in the process of special-shaped α, beta probe, calibrating source capsule for special-shaped α, beta probe guarantees measurement verification transmission of quantity value accurately and reliably on the simple and convenient basis of distance controlling, multifunctionality, security, operating process, has advantage that is simple, reliable, that easily realize.
Accompanying drawing explanation
Fig. 1 is the analysis diagram of the calibrating source capsule for special-shaped α, beta probe of the present invention;
In figure, 1. arc is fixed rotary embedding window 3. chassis 4. barber-pole stripes I 5. of getting of inlay card curved surface 2. and is put fixing spiral shell button 14. barber-pole stripes II 15. of card taking point I 6. inlay card arc I 7. and put card taking point II 16. inlay card arc II.
Embodiment
Describe the present invention below in conjunction with accompanying drawing.
Embodiment 1
Fig. 1 is the analysis diagram of the calibrating source capsule for special-shaped α, beta probe of the present invention
In FIG, calibrating source capsule for special-shaped α, beta probe of the present invention, comprise arc to fix inlay card curved surface 1, rotaryly embeddingly get window 2, chassis 3, dustproof, shielding lid, wherein, described arc is fixed inlay card curved surface 1 and is contained barber-pole stripes I 4, puts card taking point I 5, inlay card arc I 6, described rotary embedding window 2 of getting is containing putting card taking point II 15, inlay card arc II 16, fixing spiral shell button 7, and described chassis 3 is provided with barber-pole stripes II 14.Its annexation is, described arc fixes inlay card curved surface 1 arranged outside barber-pole stripes I 4, and inner side is provided with inlay card arc I 6, is provided with and puts card taking point I 5, puts card taking point III at inlay card arc I 6 two-end-point.Described rotary embedding getting inside window 2 is provided with inlay card arc II 16, is provided with and puts card taking point II 15, puts card taking point IV at inlay card arc II 16 two-end-point.Rotary embedding window 2 one end points of getting is provided with fixing spiral shell button 7.Described chassis 3 is provided with barber-pole stripes II 14.Described arc is fixed inlay card curved surface 1 and is fixed on side on chassis 3, and rotary embedding window 2 of getting is fixed on opposite side on chassis 3 by fixing spiral shell button 7.Described arc fixes inlay card curved surface 1, rotary embedding window 2 of getting is separately positioned on same axial line both sides.Dustproof, shielding lid is provided with the internal thread corresponding with barber-pole stripes I 4, barber-pole stripes II 14.Arc is fixed inlay card curved surface 1, is rotaryly embeddingly got window 2, chassis 3 is fixed in dustproof, shielding lid.
The described arc inlay card arc I 6 of fixing inlay card curved surface 1 is corresponding with the rotary embedding inlay card arc II 16 getting window 2 to be arranged.
Described arc fixes inlay card curved surface 1, rotary embedding window 2 of getting to be popped one's head in corresponding setting with treating the detection of test examination instrument.
The diameter on described chassis 3 fixes inlay card curved surface 1 respectively with arc, the rotary embedding diameter getting window 2 matches, and fixes inlay card curved surface 1 and rotaryly embeddingly get the circumference that window 2 forms and mate with chassis 3 by arc.
Described arc fixes inlay card curved surface 1 by the polytetrafluoroethylmaterial material of low atomic number and being fixedly connected with of chassis 3.
Arc in the present invention is fixed inlay card curved surface 1 and is fixed on side on chassis 3, the rotary embedding window 2 got is fixed on opposite side on chassis 3 by fixing spiral shell button 7, rotary embedding window 2 of getting makes to put card taking point I 5 by fixing spiral shell button 7 and puts card taking point II 15 phase inlay card, put card taking point III and put card taking point IV phase inlay card.
Put card taking point I 5, inlay card arc I 6, put card taking point II 15, inlay card arc II 16 is so that the inserting of standard radioactive source, take out, store; fix control criterion radioactive source surface and α, beta probe protect distance between aperture plate, geometric center position, the not contaminated damage of protecting standard radioactive source is built on chassis, dustproof, shielding simultaneously.
According to ionising radiation metering vertification regulation JJG478-96 regulation, when examining and determine, calibrating special-shaped α, the beta probe of α, β surface pollution measuring instrument, special-shaped α, beta probe protection aperture plate has different requirement from the spacing on standard radioactive source surface.Wherein, when examining and determine, calibrate the special-shaped alpha probe of α, β surface pollution measuring instrument, α standard radioactive source surface and special-shaped alpha probe protect distance between aperture plate to be 5mm.When examining and determine, calibrate the special-shaped beta probe of α, β surface pollution measuring instrument, β standard radioactive source surface and special-shaped beta probe protect distance between aperture plate to be 10mm.
Calibrating source capsule for special-shaped α, beta probe of the present invention is applicable to calibrating, calibrates numerous different α, beta probe, when examining and determine, calibrating special-shaped α, beta probe, dustproof, shielding lid is opened, treating that the detection probe of test examination instrument is placed on that arc fixes inlay card curved surface 1, rotary embedding getting on window 2 is fitted completely, calibrating, calibration operation can be started.
Claims (5)
1. the calibrating source capsule for special-shaped α, beta probe, it is characterized in that: described calibrating source capsule comprises arc and fixes inlay card curved surface (1), rotaryly embeddingly gets window (2), chassis (3), dustproof, shielding lid, wherein, described arc fix inlay card curved surface (1) containing barber-pole stripes I (4), put card taking point I (5), inlay card arc I (6), described rotary embedding window (2) of getting is containing putting card taking point II (15), inlay card arc II (16), fixing spiral shell button (7), and described chassis (3) is provided with barber-pole stripes II (14); Its annexation is, described arc fixes inlay card curved surface (1) arranged outside barber-pole stripes I (4), and inner side is provided with inlay card arc I (6), is provided with and puts card taking point I (5), puts card taking point III at inlay card arc I (6) two-end-point; Described rotary embedding window (2) inner side of getting is provided with inlay card arc II (16), is provided with and puts card taking point II (15), puts card taking point IV at inlay card arc II (16) two-end-point; Rotary embedding window (2) end points of getting is provided with fixing spiral shell button (7); Described chassis (3) is provided with barber-pole stripes II (14); Described arc is fixed inlay card curved surface (1) and is fixed on side on chassis (3), rotary embedding window (2) of getting is fixed on opposite side on chassis (3) by fixing spiral shell button (7), rotary embedding window (2) of getting makes to put card taking point I (5) by fixing spiral shell button (7) and puts card taking point II (15) phase inlay card, put card taking point III and put card taking point IV phase inlay card; Described arc fixes inlay card curved surface (1), rotary embedding window (2) of getting is separately positioned on same axial line both sides; Dustproof, shielding lid is provided with the internal thread corresponding with barber-pole stripes I (4), barber-pole stripes II (14); Arc is fixed inlay card curved surface (1), is rotaryly embeddingly got window (2), chassis (3) are fixed in dustproof, shielding lid.
2. the calibrating source capsule for special-shaped α, beta probe according to claim 1, is characterized in that: the described arc inlay card arc I (6) of fixing inlay card curved surface (1) is corresponding with the rotary embedding inlay card arc II (16) getting window (2) to be arranged.
3. the calibrating source capsule for special-shaped α, beta probe according to claim 1, is characterized in that: described arc fixes inlay card curved surface (1), rotary embedding window (2) of getting to be popped one's head in corresponding setting with treating the detection of test examination instrument.
4. the calibrating source capsule for special-shaped α, beta probe according to claim 1, is characterized in that: the diameter on described chassis (3) fixes inlay card curved surface (1) respectively with arc, the rotary embedding diameter getting window (2) matches.
5. the calibrating source capsule for special-shaped α, beta probe according to claim 1, is characterized in that: described arc fixes inlay card curved surface (1) by the polytetrafluoroethylmaterial material of low atomic number and being fixedly connected with of chassis (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510163082.6A CN104749610B (en) | 2015-04-09 | 2015-04-09 | Verification source box used for special-shaped alpha and beta probes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510163082.6A CN104749610B (en) | 2015-04-09 | 2015-04-09 | Verification source box used for special-shaped alpha and beta probes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104749610A true CN104749610A (en) | 2015-07-01 |
| CN104749610B CN104749610B (en) | 2017-05-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510163082.6A Expired - Fee Related CN104749610B (en) | 2015-04-09 | 2015-04-09 | Verification source box used for special-shaped alpha and beta probes |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203759254U (en) * | 2014-03-18 | 2014-08-06 | 西北核技术研究所 | Flat source box for efficiency calibration of gram-scale solid powder sample |
| CN203773060U (en) * | 2013-12-30 | 2014-08-13 | 中国辐射防护研究院 | Tool used for calibration of surface pollution monitor |
| CN104316951A (en) * | 2014-11-05 | 2015-01-28 | 中国工程物理研究院核物理与化学研究所 | Portable large-area alpha and beta surface contamination detecting source box |
| CN204496012U (en) * | 2015-04-09 | 2015-07-22 | 中国工程物理研究院核物理与化学研究所 | A kind of calibrating source capsule for special-shaped α, beta probe |
-
2015
- 2015-04-09 CN CN201510163082.6A patent/CN104749610B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203773060U (en) * | 2013-12-30 | 2014-08-13 | 中国辐射防护研究院 | Tool used for calibration of surface pollution monitor |
| CN203759254U (en) * | 2014-03-18 | 2014-08-06 | 西北核技术研究所 | Flat source box for efficiency calibration of gram-scale solid powder sample |
| CN104316951A (en) * | 2014-11-05 | 2015-01-28 | 中国工程物理研究院核物理与化学研究所 | Portable large-area alpha and beta surface contamination detecting source box |
| CN204496012U (en) * | 2015-04-09 | 2015-07-22 | 中国工程物理研究院核物理与化学研究所 | A kind of calibrating source capsule for special-shaped α, beta probe |
Non-Patent Citations (1)
| Title |
|---|
| 郑慧，文德智，成晶，卓仁鸿，张少华: "α、β 表面沾污检定仪研制", 《核电子学与探测技术》 * |
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| CN104749610B (en) | 2017-05-10 |
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Granted publication date: 20170510 Termination date: 20190409 |