CN104729961B - The detection method of particle in a kind of anisotropic conductive film - Google Patents
The detection method of particle in a kind of anisotropic conductive film Download PDFInfo
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- CN104729961B CN104729961B CN201510140140.3A CN201510140140A CN104729961B CN 104729961 B CN104729961 B CN 104729961B CN 201510140140 A CN201510140140 A CN 201510140140A CN 104729961 B CN104729961 B CN 104729961B
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Abstract
The detection method of particle, is applied to the ACF particle automatic optical detection methods in COG, FOG processing procedure in a kind of anisotropic conductive film of the disclosure of the invention, more particularly to detects the conducting particles of compacting.The method carries out feature merging, then the quantization for passing through gradient fields according to the gray scale and position feature of particle picture, avoids substantial amounts of data operation, is entirely capable of keeping up with actual productive temp in arithmetic speed.This method detection accuracy is very high, can replace artificial electric detection and microscope detection, can be widely applied to the automatic optics inspection in COG and FOG productions.
Description
Technical field
A kind of ACF particle automatic optical detection methods being applied in COG, FOG processing procedure, what more particularly to detection was suppressed leads
Charged particle.
Background technology
Liquid crystal display must interlock driving chip and be used as the control of display signal in addition to liquid crystal panel, in its periphery
On the way.COG is that the abbreviation of chip on glass, i.e. chip are directly bound on glass；FOG is the abbreviation of FPC on Glass.
Both it is used for the processing mode of liquid-crystalline glasses and circuit electrical conducting.
ACF is the abbreviation of Anisotropic Conductive Film (anisotropic conductive film), and its feature is Z axis
Electrically conducting direction has obvious otherness with the resistance characteristic of XY insulating planars.When Z axis conduction resistance value and X/Y plane are exhausted
After the difference of edge resistance value exceedes certain ratio, good conductive anisotropy had both been can be described as.Conductivity principle is to utilize conducting particles
Connection IC chip makes conducting with substrate electrode between the two, while short circuit is turned between being avoided that adjacent two electrode again,
And reach purpose only in Z-direction conducting.
COG processing procedures are, using flip (Flip Chip) conduction mode, chip to be directly directed at the electrode on glass substrate,
By the use of ACF materials as the dielectric surface material of engagement, make two kinds of electrode conductions of binding object vertical direction.
Whether the two methods of present liquid crystal manufacturer detection qualified main use of conducting particles, one kind is electric test, another
It is the directly imaging of observation particle under the microscope to plant.Electric test is to connect test power supply to LCD screen, test electric current and
Whether voltage reaches requirement.Microscope test is directly to be observed under liquid crystal display is taken microscope by staff, sees that particle is suppressed
It is whether qualified.(test of context of methods principle and microscope be as, be all that judgement is analyzed to particle imaging), two kinds
Method is needed manually to being tested per a piece of screen, and efficiency is low, high cost.
The content of the invention
The present invention is directed to the deficiency of background technology, and technical problem to be solved is that design one kind is simple to operate, quick, has
Effect detection ACF particles compacting after whether the automatic optical detection method of validity, the validity of particle is effective particle number
Requirement is reached, conductive requirement can be met.
The detection method of particle in a kind of anisotropic conductive film of the present invention, the method includes：
Step 1：Using line-scan digital camera collection anisotropic conductive film in particle picture, the particle picture being amplified, and
Direction of illumination during records photographing image；
Step 2：Image to collecting carries out denoising；
Step 3：Greyscale transformation is carried out to denoising image using histogram equalization method, gray level image is obtained；
Step 4：The gray level image that step 3 is obtained is processed using direction of illumination differential technique；Direction of illumination is step 1
The direction of illumination of record；
Step 5：The image obtained to step 4 carries out binary conversion treatment, obtains background for black, and particle is the figure of white
Picture, thus calculates particle number；
Step 6：White portion position in image is obtained according to step 5, particle institute in image is determined after step 4 treatment
In position；
Step 7：The gradient fields of each particle in step 6 are obtained using Laplace operator, judges whether particle is qualified；According to
Illumination and environmental change set a threshold value, and the gradient fields for calculating are then qualified more than threshold value, less than then unqualified.
The specific method of the direction of illumination differential technique of the step 4 is：A pixel is chosen, then finds the pixel edge
Gray value minimum value on direction of illumination in the range of 1~D；The gray value of the gray value of selected pixels point and the minimum point is made
Difference, the difference for obtaining is assigned to the new gray value of selected pixels point；Wherein the value of D is carried out really according to the size of real image particle
Fixed, radius is r to particle in the picture, then D values are in 2*r ± 2.
The detection method of particle, gray scale and position of the method according to particle picture in a kind of anisotropic conductive film of the present invention
Feature is put, feature merging, then the quantization for passing through gradient fields is carried out, substantial amounts of data operation is avoided, in arithmetic speed completely
Actual productive temp can be kept up with.This method detection accuracy is very high, can replace artificial electric detection and microscope detection, can
With the automatic optics inspection being widely used in during COG and FOG is produced.
Brief description of the drawings
Fig. 1 is the particle picture for collecting；
Fig. 2 is the image after being processed using direction of illumination differential technique；
Fig. 3 is the curve synoptic diagram of particle properties after artwork and treatment.
Specific embodiment
The present invention is further detailed below in conjunction with the accompanying drawings.
Step 1：Motion platform is built as liquid crystal display objective table, the motion of PLC control platforms is 0.7um using rate respectively
Line-scan digital camera collection image, the camera lens along with 10 times is amplified, and records direction of illumination.
Step 2：High-frequency noise is removed using medium filtering, the scope that medium filtering template is 3 × 3 is taken.
Step 3：Histogram equalization is divided into 3 steps：
Step 3.1：The number of times of statistic histogram each gray level appearance；
Step 3.2：Add up normalized histogram；
Step 3.3：New pixel value is calculated, computing formula is as follows
H (v) represents that gray value is the new gray value of v, and f (v) represents that gray value is the accumulative occurrence number of v, fminRepresent ash
The minimum number of times of angle value occurrence number, M × N represents the length and width product of image, and L is number of greyscale levels, and image locating depth is 8, then gray scale
Series is 2^8=256.
Step 4：Direction of illumination differential technique processes image, the direction of illumination of the record of input step 1, then according to the side of illumination
To the gray value for recalculating pixel.
Step 5：Image particle characteristicses after difference are quite obvious, and OTSU binaryzations obtain particle region, in order to determine grain
Sub- position, the method using local maximum judged, the traversal of particle region is carried out with one 5 × 5 template, when template
When central point is maximum, and the difference of the minimum in the range of gray value and the template of maximum is when being more than given threshold value, this threshold
It is worth and there is also maximum situation in smooth region for rejecting image, then it is assumed that find a particle, particle position is currently
The center of template.
Step 6：Particle to finding makees Laplace operator computing, obtains a quantized values for particle gradient fields, when
Numerical value is bigger, illustrates that particle compacting is better, and numerical value is smaller, and the feature for illustrating particle is not it is obvious that in the presence of vacation pressure or particle quilt
The situation of crushing, this is all unqualified particle, it is necessary to exclude.
The Laplace operator for using for 3 × 3 template, it is whether qualified for particle to be judged using a threshold value,
Qualified particle is considered more than threshold value, less than not being then.It is exactly to judge the qualified particle on each pin that whether liquid crystal display is qualified
Whether number reaches requirement.
The feature of the bright dark change during as can be seen from Figure 3 particle is without original graph, but it is changed into only brighter
Feature, and contrast of this brightness in figure is more much larger than contrast in original graph compared with bright part, thus this
The local brighter feature of particle is more prone to extract relative to original graph.Because with the gray scale pole of current pixel and direction of illumination
After small value makees difference, the brighter areas in figure is just poor with darker area in figure, and the brighter areas for so obtaining is just than artwork more
It is prominent, it is easier to recognize, and above bright dark two feature unifications before a to feature, so make entirely to recognize
Cheng Gengjia is succinct, quick.
Claims (1)
1. in a kind of anisotropic conductive film particle detection method, the method includes：
Step 1：Using particle picture in line-scan digital camera collection anisotropic conductive film, the particle picture being amplified, and record
Direction of illumination during shooting image；
Step 2：Image to collecting carries out denoising；
Step 3：Greyscale transformation is carried out to denoising image using histogram equalization method, gray level image is obtained；
Step 4：The gray level image that step 3 is obtained is processed using direction of illumination differential technique；Direction of illumination is recorded for step 1
Direction of illumination；
Step 5：The image obtained to step 4 carries out binary conversion treatment, obtains background for black, and particle is the image of white, by
This calculates particle number；
Step 6：White portion position in image is obtained according to step 5, determines that particle institute is in place in image after step 4 treatment
Put；
Step 7：The gradient fields of each particle in step 6 are obtained using Laplace operator, judges whether particle is qualified；According to illumination
And environmental change sets a threshold value, the gradient fields for calculating are then qualified more than threshold value, less than then unqualified；
It is characterized in that the specific method of the direction of illumination differential technique of the step 4 is：A pixel is chosen, then finds the picture
Gray value minimum value of the vegetarian refreshments along direction of illumination in the range of 1~D；By the gray value of selected pixels point and the ash of the minimum point
Angle value is poor, and the difference for obtaining is assigned to the new gray value of selected pixels point；Wherein the value of D is entered according to the size of real image particle
Row determines that radius is r to particle in the picture, then D values are in 2*r ± 2.
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104952081B (en) * | 2015-07-20 | 2018-01-12 | 电子科技大学 | A kind of COG bias detecting methods based on extreme value difference statisticses feature |
| CN107730510B (en) * | 2017-09-13 | 2020-02-18 | 电子科技大学 | Partitioning method for bump in COG (chip on glass) by combining LTCD (Low temperature Co-fired ceramic) and Hu invariant moment |
| CN108918349A (en) * | 2018-03-23 | 2018-11-30 | 张家港康得新光电材料有限公司 | Measure the device and method of the dispersate number of particles and/or partial size in disperse system |
| CN109816653B (en) * | 2019-01-28 | 2021-06-18 | 宁波舜宇仪器有限公司 | Method for detecting conductive particles |
| CN110672474A (en) * | 2019-08-26 | 2020-01-10 | 苏州感知线智能科技有限公司 | ACF conductive particle pressing automatic detection method and device |
| CN110660043A (en) * | 2019-08-26 | 2020-01-07 | 苏州感知线智能科技有限公司 | Method and device for rapidly detecting number of conductive particles after anisotropic conductive film binding |
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| US8417012B2 (en) * | 2008-11-04 | 2013-04-09 | Beckman Coulter, Inc. | Non-linear histogram segmentation for particle analysis |
| US9372072B2 (en) * | 2010-04-01 | 2016-06-21 | Nippon Steel & Sumitomo Metal Corporation | Particle measuring device and particle measuring method |
| CN102494976B (en) * | 2011-11-18 | 2014-04-09 | 江苏大学 | Method for automatic measurement and morphological classification statistic of ultra-fine grain steel grains |
| CN102819765B (en) * | 2012-02-28 | 2016-01-20 | 浙江工业大学 | A kind of milk somatic cell method of counting based on computer vision |
| CN102779273B (en) * | 2012-06-29 | 2016-08-03 | 重庆邮电大学 | A kind of face identification method based on local contrast pattern |
| CN103308430B (en) * | 2013-06-03 | 2016-01-20 | 浙江大学 | A kind of method and device measuring thousand grain weigth |
| CN103903266B (en) * | 2014-04-08 | 2016-07-06 | 上海交通大学 | A kind of analyzing evaluation method of micro-nano granules dispersed and distributed |
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