CN104714166A - System and method for testing multiple resistor analog acquisition passages in device - Google Patents
System and method for testing multiple resistor analog acquisition passages in device Download PDFInfo
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- CN104714166A CN104714166A CN201310685204.9A CN201310685204A CN104714166A CN 104714166 A CN104714166 A CN 104714166A CN 201310685204 A CN201310685204 A CN 201310685204A CN 104714166 A CN104714166 A CN 104714166A
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Abstract
The invention discloses a system and method for testing multiple resistor analog acquisition passages in a device. The system comprises a test tool and an upper computer, wherein the test tool is applied to a resistor. The resistor can be connected with the resistor analog acquisition passages in the device, so that the resistance values of the resistor are collected by the resistor analog acquisition passages. The upper computer is connected with the device and used for receiving the resistance values collected by the resistor analog acquisition passages, judging working states of the resistor analog acquisition passages in the device according to the collected resistance values, and outputting a judgment result. By means of the system and method, efficient, safe and low-cost test for the resistor analog acquisition passages can be achieved.
Description
Technical field
The present invention relates to a kind of system to the multiple resistor-type analog acquisition path testings in equipment and a kind of method to the multiple resistor-type analog acquisition path testings in equipment.
Background technology
The non-electrical physical quantitys such as displacement, power, pressure, acceleration, moment of torsion are converted to the sensor widespread use on automobile of resistance value.Usual entire car controller, digital instrumentation, vehicle body control unit gather resistance value analog quantity that these sensors export and are converted to digital quantity and make it participate in necessary control algorithm.In order to whether the resistor-type analog quantity confirming that whether multiple analog acquisition paths of the equipment such as entire car controller are working properly, gather is correct, all need to test multiple path before equipment dispatches from the factory.Under normal circumstances, adopt the artificial resistance that configures voluntarily to test one by one individual channel on equipment, but this mode not only spended time is long, and easily to make mistakes.
Summary of the invention
The object of this invention is to provide a kind of system to the multiple resistor-type analog acquisition path testings in equipment and a kind of method to the multiple resistor-type analog acquisition path testings in equipment, to overcome in prior art, the mode spended time that individual channel is tested one by one is grown and the defect of easily makeing mistakes.
To achieve these goals, the invention provides a kind of system to the multiple resistor-type analog acquisition path testings in equipment, this system comprises: the test fixture comprising resistance, described resistance can be connected with the multiple resistor-type analog acquisition paths in described equipment, to make the resistance value of described resistance by the collection of described multiple resistor-type analog acquisition path; And host computer, with described equipment connection, for receiving the resistance value that described multiple resistor-type analog acquisition path gathers, judging the duty of the multiple resistor-type analog acquisition paths in described equipment according to gathered resistance value and exporting judged result.
According to a kind of embodiment, the duty of the described multiple resistor-type analog acquisition paths judged in described equipment according to gathered resistance value comprises: gathered resistance value compared with the corresponding rated value of resistance prestored; When the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in normal operating conditions; And when the difference of the rated value of resistance of gathered resistance value and described resistance is outside predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in abnormal operating state.
According to a kind of embodiment, described resistance is multiple, multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, and described switchgear is for controlling connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path.
According to a kind of embodiment, described switchgear comprises multiple switch, one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
According to a kind of embodiment, described switchgear comprises multiple switch and multiple gate-controlled switch with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.
According to a kind of embodiment, described host computer is communicated with described equipment by CAN.
Present invention also offers a kind of method to the multiple resistor-type analog acquisition path testings in equipment, the method comprises: the resistance value of the resistance included by test fixture is gathered by the multiple resistor-type analog acquisition paths in connected described equipment; And receive by host computer the resistance value that described multiple resistor-type analog acquisition path gathers, judge the duty of the multiple resistor-type analog acquisition paths in described equipment according to gathered resistance value and export judged result.
According to a kind of embodiment, the duty of the described multiple resistor-type analog acquisition paths judged in described equipment according to gathered resistance value comprises: gathered resistance value compared with the corresponding rated value of resistance prestored; When the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in normal operating conditions; And when the difference of the rated value of resistance of gathered resistance value and described resistance is outside predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in abnormal operating state.
According to a kind of embodiment, described resistance is multiple, multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, is controlled connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path by described switchgear.
According to a kind of embodiment, described switchgear comprises multiple switch, one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
According to a kind of embodiment, described switchgear comprises multiple switch and multiple gate-controlled switch with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.
According to a kind of embodiment, described host computer is communicated with described equipment by CAN.
Pass through technique scheme, the test fixture and host computer that comprise resistance can be set, described resistance can be connected with the multiple resistor-type analog acquisition paths in described equipment, to make the resistance value of described resistance by the collection of described multiple resistor-type analog acquisition path, host computer receives the resistance value that described multiple resistor-type analog acquisition path gathers, and judges the duty of the multiple resistor-type analog acquisition paths in described equipment and export judged result according to gathered resistance value.Thus, can be gathered by the resistance of multiple resistor-type analog acquisition paths to the resistance included by test fixture in equipment, to judge the duty of multiple resistor-type analog acquisition path (such as according to the resistance value gathered, normally/abnormal operating state), thus the test of efficient, safety, the low cost to multiple resistor-type analog acquisition path can be realized.
Other features and advantages of the present invention are described in detail in embodiment part subsequently.
Accompanying drawing explanation
Accompanying drawing is used to provide a further understanding of the present invention, and forms a part for instructions, is used from explanation the present invention, but is not construed as limiting the invention with embodiment one below.In the accompanying drawings:
Fig. 1 is the block scheme of the system to the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides;
Fig. 2 is the process flow diagram of the method to the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides; And
Fig. 3 is the circuit theory diagrams to the test fixture included by the system of the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides.
Embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in detail.Should be understood that, embodiment described herein, only for instruction and explanation of the present invention, is not limited to the present invention.
Fig. 1 is the block scheme of the system to the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides.
As shown in Figure 1, what one embodiment of the present invention provided comprises the system of the multiple resistor-type analog acquisition path testings in equipment: the test fixture 10 comprising resistance, described resistance can with multiple resistor-type analog acquisition path (the RAD1-RAD n in described equipment 12, n be greater than 1 integer) connect, to make the resistance value of described resistance by the collection of described multiple resistor-type analog acquisition path; And host computer 14, with described equipment connection, for receiving the resistance value that described multiple resistor-type analog acquisition path gathers, judging the duty of the multiple resistor-type analog acquisition paths in described equipment 12 according to gathered resistance value and exporting judged result.
Wherein, equipment 12 can provide constant electric current for multiple resistor-type analog acquisition path, the resistance value that multiple resistor-type analog acquisition path gathers to be converted to magnitude of voltage corresponding with it.
By arranging the test fixture 10 and the host computer 14 that comprise resistance, described resistance can be connected with the multiple resistor-type analog acquisition paths in described equipment 12, to make the resistance value of described resistance by the collection of described multiple resistor-type analog acquisition path, host computer 14 receives the resistance value that described multiple resistor-type analog acquisition path gathers, and judges the duty of the multiple resistor-type analog acquisition paths in described equipment and export judged result according to gathered resistance value.Thus, can be gathered by the resistance of multiple resistor-type analog acquisition paths to the resistance included by test fixture in equipment 12, to judge the duty of multiple resistor-type analog acquisition path (such as according to the resistance value gathered, normally/fly normal operating conditions), thus the automatic test of multiple resistor-type analog acquisition path can be realized.
According to one embodiment of the present invention, the duty of the described multiple resistor-type analog acquisition paths judged in described equipment 12 according to gathered resistance value comprises: gathered resistance value compared with the corresponding rated value of resistance prestored; When the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment 12 are in normal operating conditions; And when the difference of the rated value of resistance of gathered resistance value and described resistance is outside predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment 12 are in abnormal operating state.
Described predetermined Standard resistance range can be arranged according to the needs of practical operation, and the present invention does not limit it.
Wherein, described host computer 14 is also for generating test report according to judged result.
According to one embodiment of the present invention, this system also comprises display device (not shown), for showing described judged result.
According to one embodiment of the present invention, described resistance is multiple, multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, and described switchgear is for controlling connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path.
According to a kind of embodiment, described switchgear can comprise multiple switch (not shown), one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
Such as, when resistance be 3 (being respectively the first resistance, the second resistance and the 3rd resistance), resistor-type analog acquisition paths is 6, one end ground connection of these 3 resistance, the other end of 3 resistance is connected with 6 the resistor-type analog acquisition paths be connected in parallel respectively by 3 switches (the first switch, second switch and the 3rd switch that are connected with the first resistance, the second resistance and the 3rd resistance respectively), namely, when the first switch closes, the first resistance is connected with 6 resistor-type analog acquisition paths simultaneously; When second switch closes, the second resistance is connected with 6 resistor-type analog acquisition paths simultaneously; When the 3rd switch closes, the 3rd resistance is connected with 6 resistor-type analog acquisition paths simultaneously.
According to another kind of embodiment, described switchgear can comprise multiple switch and multiple gate-controlled switch (as shown in Figure 3) with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.
Wherein, described multiple gate-controlled switch with control end can adopt triode (such as, field effect transistor), as shown in Figure 3.
According to one embodiment of the present invention, described host computer 14 is communicated with described equipment 12 by CAN.
In the above-described embodiment, those skilled in the art can determine quantity and the resistance size of resistance according to actual needs.
Preferably, can store in memory storage in the device 12 by the resistance value of multiple resistor-type analog acquisition path collection, receive the reading order of host computer 14 transmission at equipment 12 after, then gathered resistance value be sent to host computer 14.
Fig. 2 is the process flow diagram of the method to the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides.
As shown in Figure 2, what one embodiment of the present invention provided comprises the method for the multiple resistor-type analog acquisition path testings in equipment:
S200, the resistance value of the resistance included by test fixture is gathered by the multiple resistor-type analog acquisition paths in connected described equipment; And
S202, receives by host computer the resistance value that described multiple resistor-type analog acquisition path gathers, judges the duty of the multiple resistor-type analog acquisition paths in described equipment and export judged result according to gathered resistance value.
Wherein, S202 comprises:
S2020, receives by host computer the resistance value that described multiple resistor-type analog acquisition path gathers;
S2022, gathered resistance value is compared with the corresponding rated value of resistance prestored, when the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, goes to step S2024, otherwise go to step S2026;
S2024, judges that the multiple resistor-type analog acquisition paths in described equipment are in normal operating conditions;
S2026, judges that the multiple resistor-type analog acquisition paths in described equipment are in abnormal operating state.
Wherein, the method also comprises: generate test report by host computer according to judged result.
Preferably, the method also comprises: show described judged result by display device.
According to one embodiment of the present invention, described resistance is multiple, multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, and described switchgear is for controlling connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path.
According to a kind of embodiment, described switchgear can comprise multiple switch (not shown), one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
According to another kind of embodiment, described switchgear can comprise multiple switch and multiple gate-controlled switch (as shown in Figure 3) with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.Wherein, described multiple gate-controlled switch with control end can adopt triode (such as, field effect transistor, as shown in Figure 3).
According to one embodiment of the present invention, described host computer is communicated with described equipment by CAN.
Fig. 3 is the circuit theory diagrams to the test fixture included by the system of the multiple resistor-type analog acquisition path testings in equipment that one embodiment of the present invention provides.
For Fig. 3, the connection of multiple resistance by the switchgear and described multiple resistor-type analog acquisition path that comprise multiple switch and multiple triode is described below.
Particularly, 6 resistor-type analog acquisition path (RAD1 – RAD6 have been shown in Fig. 3, for succinct object, RAD3 – RAD5 is eliminated) in figure, 2 switches (S1 and S2), to there being two triodes, (this triode can be such as field effect transistor to each resistor-type analog acquisition path, wherein G represents grid, D represents drain electrode, S represents source electrode) and three resistance (R1, R2 and R3), described three resistant series connect, the grid G of each triode is connected with switch S 1 and S2 respectively and is connected to power supply (this power supply can be such as 12V), the drain D of each triode and resistance in series R1, (one end of R1, one end of R2 and R3, connect as shown in Figure 3) and be connected to resistor-type analog acquisition path, the source S of each triode is connected to described resistance in series R1, between every two resistance of R2 and R3 (in Fig. 3 be: between R1 and R2, between R2 and R3), described resistance in series R1, the other end (one end of R3 of R2 and R3, ground connection as shown in Figure 3).In addition, the resistance R0 be connected between switch and triode grid shown in Fig. 3 forms current-limiting apparatus and plays metering function.
As shown in Figure 3, when switch S 1 and S2 are all off, now triode is all in cut-off state, described 6 resistor-type analog acquisition paths are connected with resistance in series R1, R2 and R3 in fact respectively, namely, the resistance that 6 resistor-type analog acquisition paths are to be measured is R1+R2+R3; When switch S 1 is closed, S2 disconnects, now the source S triode be connected between R1 and R2 is in conducting state and the source S triode be connected between R2 and R3 is in cut-off state, resistance R2 and R3 that described 6 resistor-type analog acquisition paths are connected with two in fact is respectively connected, namely, the resistance that 6 resistor-type analog acquisition paths are to be measured is R2+R3; When switch S 1 disconnects, S2 is closed, now the source S triode be connected between R1 and R2 is in cut-off state and the source S triode be connected between R2 and R3 is in conducting state, described 6 resistor-type analog acquisition paths are connected with R3 in fact respectively, namely, the resistance that 6 resistor-type analog acquisition paths are to be measured is R3.
By using the test fixture shown in Fig. 3, the test of multiple resistances of multiple resistor-type analog acquisition path can be realized, and the steady current that can prevent equipment from providing is superimposed upon on resistance, avoids the impact on test process.
The quantity that it should be appreciated by those skilled in the art that the quantity of the resistance related in the present invention, resistance, triode quantity, type and resistor-type analog acquisition path is only exemplary, is not intended to limit the present invention.In addition, although for each resistor-type analog acquisition path is to having two triodes and three resistance shown in Fig. 3, but the present invention is not limited thereto, such as, also can be that only corresponding two triodes and three resistance are (namely for multiple resistor-type analog acquisition path, circuit structure shown in Fig. 3 is out of shape, the drain D of triode and one end of resistance in series of former RAD1 connection will be connected to after 6 resistor-type analog acquisition path in parallel, omit triode and the resistance in series of former RAD2-RAD6 connection), like this, the quantity of components and parts can be reduced, reduce costs.
Below the preferred embodiment of the present invention is described in detail by reference to the accompanying drawings; but; the present invention is not limited to the detail in above-mentioned embodiment; within the scope of technical conceive of the present invention; can carry out multiple simple variant to technical scheme of the present invention, these simple variant all belong to protection scope of the present invention.
It should be noted that in addition, each the concrete technical characteristic described in above-mentioned embodiment, in reconcilable situation, can be combined by any suitable mode.In order to avoid unnecessary repetition, the present invention illustrates no longer separately to various possible array mode.
In addition, also can carry out combination in any between various different embodiment of the present invention, as long as it is without prejudice to thought of the present invention, it should be considered as content disclosed in this invention equally.
Claims (12)
1., to a system for the multiple resistor-type analog acquisition path testings in equipment, wherein, this system comprises:
Comprise the test fixture of resistance, described resistance can be connected with the multiple resistor-type analog acquisition paths in described equipment, to make the resistance value of described resistance by the collection of described multiple resistor-type analog acquisition path; And
Host computer, with described equipment connection, for receiving the resistance value that described multiple resistor-type analog acquisition path gathers, judging the duty of the multiple resistor-type analog acquisition paths in described equipment according to gathered resistance value and exporting judged result.
2. system according to claim 1, wherein, the duty of the described multiple resistor-type analog acquisition paths judged in described equipment according to gathered resistance value comprises:
Gathered resistance value is compared with the corresponding rated value of resistance prestored;
When the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in normal operating conditions; And
When the difference of the rated value of resistance of gathered resistance value and described resistance is outside predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in abnormal operating state.
3. system according to claim 2, wherein, described resistance is multiple, multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, and described switchgear is for controlling connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path.
4. system according to claim 3, wherein, described switchgear comprises multiple switch, one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
5. system according to claim 3, wherein, described switchgear comprises multiple switch and multiple gate-controlled switch with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.
6. system according to claim 1, wherein, described host computer is communicated with described equipment by CAN.
7., to a method for the multiple resistor-type analog acquisition path testings in equipment, wherein, the method comprises:
The resistance value of the resistance included by test fixture is gathered by the multiple resistor-type analog acquisition paths in connected described equipment; And
Receive by host computer the resistance value that described multiple resistor-type analog acquisition path gathers, judge the duty of the multiple resistor-type analog acquisition paths in described equipment according to gathered resistance value and export judged result.
8. method according to claim 7, wherein, the duty of the described multiple resistor-type analog acquisition paths judged in described equipment according to gathered resistance value comprises:
Gathered resistance value is compared with the corresponding rated value of resistance prestored;
When the difference of the rated value of resistance of gathered resistance value and described resistance is within predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in normal operating conditions; And
When the difference of the rated value of resistance of gathered resistance value and described resistance is outside predetermined Standard resistance range, judge that the multiple resistor-type analog acquisition paths in described equipment are in abnormal operating state.
9. method according to claim 8, wherein, described resistance is multiple, and multiple described resistance is connected with described multiple resistor-type analog acquisition path by switchgear, is controlled connection and the disconnection of described multiple resistance and described multiple resistor-type analog acquisition path by described switchgear.
10. method according to claim 9, wherein, described switchgear comprises multiple switch, one end ground connection of described multiple resistance, the other end of described multiple resistance is connected with described multiple resistor-type analog acquisition path respectively by described multiple switch, and the resistance value of described multiple resistance is different.
11. methods according to claim 9, wherein, described switchgear comprises multiple switch and multiple gate-controlled switch with control end, described multiple resistant series connects, the control end of described gate-controlled switch is connected with described multiple switch and is connected to power supply respectively, one end of described gate-controlled switch is connected with one end of resistance in series and is connected to described multiple resistor-type analog acquisition path, the other end of described gate-controlled switch is connected between every two resistance of described resistance in series, the other end ground connection of described series resistance.
12. methods according to claim 7, wherein, described host computer is communicated with described equipment by CAN.
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| CN201310685204.9A CN104714166B (en) | 2013-12-13 | 2013-12-13 | To the system and method for multiple resistor-type analog acquisition path testings in equipment |
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| CN201310685204.9A CN104714166B (en) | 2013-12-13 | 2013-12-13 | To the system and method for multiple resistor-type analog acquisition path testings in equipment |
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| CN104714166B CN104714166B (en) | 2017-10-13 |
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| CN104714166B (en) | 2017-10-13 |
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