CN104685473A - 一种软件测试方法及装置 - Google Patents

一种软件测试方法及装置 Download PDF

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Publication number
CN104685473A
CN104685473A CN201380003956.0A CN201380003956A CN104685473A CN 104685473 A CN104685473 A CN 104685473A CN 201380003956 A CN201380003956 A CN 201380003956A CN 104685473 A CN104685473 A CN 104685473A
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time
measuring
object function
interval
residence time
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CN104685473B (zh
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严开恩
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3604—Software analysis for verifying properties of programs
    • G06F11/3612—Software analysis for verifying properties of programs by runtime analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Debugging And Monitoring (AREA)

Abstract

本发明实施例提供了一种软件测试方法，包括：获取待测软件中目标函数的代码地址区间；运行所述待测软件，并统计预置的测量时间内PC程序计数器指针在所述代码地址区间内的停留时间，所述测量时间为处理器时钟周期的整数倍；根据所述停留时间计算所述目标函数的负载信息。本发明实施例还提供了一种软件测试装置，采用本发明，可以准确的估计待测软件中目标函数的负载情况。

Description

PCT国内申请，说明书已公开。

Claims (1)

  1. PCT国内申请，权利要求书已公开。
CN201380003956.0A 2013-09-30 2013-09-30 一种软件测试方法及装置 Active CN104685473B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2013/084736 WO2015042964A1 (zh) 2013-09-30 2013-09-30 一种软件测试方法及装置

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CN104685473A true CN104685473A (zh) 2015-06-03
CN104685473B CN104685473B (zh) 2018-11-06

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WO (1) WO2015042964A1 (zh)

Families Citing this family (3)

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Publication number Priority date Publication date Assignee Title
CN107506293B (zh) * 2016-06-14 2022-04-22 中兴通讯股份有限公司 一种软件性能数据采集方法和装置
CN109144877B (zh) * 2018-08-31 2022-05-31 北京奇艺世纪科技有限公司 一种应用检测方法和装置
CN111414295B (zh) * 2020-03-09 2023-06-30 浙江大华技术股份有限公司 一种cpu占用率的统计方法、装置、设备及介质

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040103357A1 (en) * 2002-11-08 2004-05-27 Renesas Technology Corp. Semiconductor testing device
CN101329638A (zh) * 2007-06-18 2008-12-24 国际商业机器公司 程序代码的并行性的分析方法和系统
CN100456248C (zh) * 2005-12-02 2009-01-28 凌阳科技股份有限公司 获得程序代码和函数执行覆盖率及执行效率的装置及方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103077080B (zh) * 2013-01-07 2015-08-12 清华大学 基于高性能平台的并行程序性能数据采集方法及装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040103357A1 (en) * 2002-11-08 2004-05-27 Renesas Technology Corp. Semiconductor testing device
CN100456248C (zh) * 2005-12-02 2009-01-28 凌阳科技股份有限公司 获得程序代码和函数执行覆盖率及执行效率的装置及方法
CN101329638A (zh) * 2007-06-18 2008-12-24 国际商业机器公司 程序代码的并行性的分析方法和系统

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CN104685473B (zh) 2018-11-06
WO2015042964A1 (zh) 2015-04-02

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