CN104655284B

CN104655284B - Analysis device, processing device, analysis method, and processing method

Info

Publication number: CN104655284B
Application number: CN201410691853.4A
Authority: CN
Inventors: 王浩
Original assignee: Hangzhou Mission Infrared Electro Optics Technology Co Ltd
Current assignee: Hangzhou Mission Infrared Electro Optics Technology Co Ltd
Priority date: 2013-11-25
Filing date: 2014-11-25
Publication date: 2022-04-19
Anticipated expiration: 2034-11-25
Also published as: CN104655284A

Abstract

The invention discloses an analysis device, a processing system, an analysis method and a processing method, and relates to the field of application of infrared detection. In the thermal image device in the prior art, when the setting operation sequence of the analysis areas is different, the positions of the shot objects corresponding to the analysis areas with the same number may be inconsistent, which causes difficulties in analysis and the like. According to the analysis device, the processing system, the analysis method and the processing method, the analysis area corresponding to the part information is set, and the thermal image data is analyzed according to the analysis mode related to the part information based on the set analysis area.

Description

Analysis device, processing device, analysis method, and processing method

Technical Field

The invention discloses an analysis device, a processing device, an analysis method and a processing method, and relates to the field of application of thermal image detection.

Background

When the subject thermal image needs to be analyzed, the user can set an analysis region of a point, a line, a plane, or the like for a specific portion of the subject thermal image to obtain an analysis result. For example, as shown in fig. 3(a), an analysis area selection column XZ3 is displayed on a display screen of a thermographic imaging device, a user may select analysis area composition data such as points, lines, frames, etc. from the selection column XZ3, and then position parameters of the analysis areas are set according to corresponding analysis portions of a thermal image of a subject in the displayed infrared thermal image, so as to set and obtain one or more analysis areas, and corresponding numbers such as S01, S02, and S03 may be automatically assigned to the sequentially set analysis areas according to a sequence of user operations.

The analysis mode can be edited for the set analysis area to analyze; the analysis mode represents an analysis calculation rule used for obtaining an analysis result by analyzing thermal image data determined based on the analysis areas, for example, in temperature analysis, a maximum temperature, an average temperature, a minimum temperature, a percentage content and the like are calculated, and a calculation relationship between the analysis areas, such as a temperature difference and the like, can also be included. As shown in fig. 3(a), according to the connector corresponding to S01, the upper part and the lower part of the body sleeve corresponding to S02 and S03, according to the specific industry criterion, the analysis mode edited by the analysis area number, such as S01MAX, S02MAX-S03MAX, obtains the analysis result of the analysis value; further, analysis patterns including diagnostic rules may be edited such as: and (3) normal: s01MAX is less than or equal to 50 ℃ and S02MAX-S03MAX is less than or equal to 1 ℃; the method has the following defects: the temperature is more than 50 ℃ and less than or equal to S01MAX and less than or equal to 90 ℃ or more than 1 ℃ and less than or equal to S02MAX-S03MAX and less than or equal to 2 ℃; critical defects: the temperature is more than S01MAX at 90 ℃ or more than S02MAX-S03MAX at 2 ℃; the state of the object is determined by the analysis result thus obtained.

The related art brings about a series of problems, for example, when the analysis region setting operation order is different, the parts of the subjects corresponding to the analysis regions of the same number may be inconsistent; as shown in fig. 3(b), the user sets the analysis regions S01, S02, S03; however, in fig. 3(a) and 3(b), the analysis regions S01, S03 with the same numbers set correspond to different locations in the subject thermal image, and the analysis mode and the diagnostic rule compiled for fig. 3(a) are not applicable to the analysis regions in fig. 3 (b). As a result, in the prior art, it is necessary to rearrange the analysis pattern according to the number of the analysis area in fig. 3(b) or adjust the number of the analysis area in fig. 3(b) for the analysis area set in fig. 3(b), which is very complicated. In addition, the setting workload of the analysis mode is large, and the user needs to be very familiar with the object thermal image analysis mode when setting the analysis mode, which makes the user have a very high demand.

Therefore, it is understood that there is a need for an analysis device that solves the problems of the prior art.

Disclosure of Invention

The invention provides an analysis device, a processing system, an analysis method and a processing method, aiming at the defects in the prior art, and can solve the problems in the prior art.

Therefore, the invention adopts the following technical scheme that the analysis device comprises:

a part information selection unit for selecting part information;

an analysis region setting section for specifying an analysis region corresponding to the site information;

and the thermal image analysis part is used for analyzing the acquired thermal image data according to the analysis mode related to the part information based on the analysis area.

In another aspect of the present invention, an analytical device includes,

a part information selection unit for selecting part information;

and the thermal image analysis part is used for analyzing the acquired thermal image data based on the analysis area according to a specified analysis mode and associating the obtained analysis result with the information related to the part information.

The processing device of the invention comprises a processing device,

the acquisition part is used for acquiring multi-frame thermal image data;

the analysis part is used for analyzing the part information related to the multi-frame thermal image data and analysis results related to the part information;

the processing part is used for obtaining the processing result of the multi-frame thermal image data according to the processing rule and the part information obtained by analysis of the analysis part and the analysis result corresponding to the part information; the processing comprises one of comparative analysis, classification, statistics, retrieval and presentation processing.

The analysis method comprises the following steps:

a part information selection step of selecting part information;

an analysis region setting step of determining an analysis region corresponding to the part information;

and a thermal image analysis step, which is used for analyzing the acquired thermal image data according to the analysis mode related to the part information based on the analysis area.

The processing method comprises the following steps:

an acquisition step, which is used for acquiring multi-frame thermal image data;

analyzing, namely analyzing the part information associated with the multi-frame thermal image data and the analysis result associated with the part information;

a processing step, which is used for obtaining the processing result of the multi-frame thermal image data according to the processing rule and the part information obtained by analysis in the analyzing step and the corresponding analysis result; the processing comprises one of comparative analysis, classification, statistics, retrieval and presentation processing.

Other aspects and advantages of the invention will become apparent from the following description.

Description of the drawings:

fig. 1 is a block diagram of an electrical structure of the thermal image device 13 of embodiment 1.

FIG. 2 is a profile view of the thermal image system 13 of example 2.

Fig. 3 is a display example of an analysis area selection column, an analysis area provided therein, and an analysis result according to the related art.

Fig. 4 is a display example of the region information selection field, the set analysis area, and the analysis result in example 1.

Fig. 5 is an example of information such as an analysis pattern associated with part information stored in the storage medium of embodiment 1.

FIG. 6 is a flowchart of example 1.

Fig. 7 is a display example of analysis areas set by infrared thermography including a plurality of object thermal images.

Fig. 8 is a display example of the subject information selection field, the part information selection field, and the set analysis region in embodiment 2.

Fig. 9 is a display example of a part information selection field and a set analysis area according to another embodiment.

Fig. 10 is a display example of a part information selection field and an analysis area provided in accordance with another embodiment.

Fig. 11 is a display example of an analysis area and a site information selection field in which site information can be selected according to still another embodiment.

FIG. 12 is a flowchart of example 3.

Detailed Description

The following examples are to be construed as being illustrative and not limitative of the scope of the present invention and are intended to be modified in various forms within the scope thereof. The thermal image data may be, for example, thermal image AD value data, image data of an infrared thermal image, or other data generated based on the thermal image AD value data, such as array data of temperature values.

Example 1

Embodiment 1 takes a portable thermal imaging device 13 with a photographing function as an example of an analysis device. The structure of the thermal image device 13 of embodiment 1 is explained with reference to fig. 1.

The thermal image device 13 is provided with a shooting part 1, an image processing part 2, a display control part 3, a display part 4, a communication I/F5, a temporary storage part 6, a memory card I/F7, a memory card 8, a flash memory 9, an operation part 10 and a control part 11, wherein the control part 11 is connected with the corresponding parts through a control and data bus 12 and is responsible for the overall control of the thermal image device 13.

The imaging unit 1 is configured by an optical component, a lens driving component, an infrared detector, a signal preprocessing circuit, and the like, which are not shown. The optical component is composed of an infrared optical lens for focusing the received infrared radiation to the infrared detector. The lens driving part drives the lens to perform focusing or zooming according to a control signal of the control part 11, or may be an optical part that is manually adjusted. An infrared detector, such as a refrigeration or non-refrigeration type infrared focal plane detector, converts infrared radiation passing through the optical components into electrical signals. The signal preprocessing circuit comprises a sampling circuit, an AD conversion circuit, a timing trigger circuit and the like, performs signal processing such as sampling on an electric signal output from the infrared detector in a specified period, and converts the electric signal into digital thermal image data through the AD conversion circuit, wherein the thermal image data comprises thermal image AD value data which is binary data such as 14 bits or 16 bits. The thermal image data is not limited to the intrinsic resolution of the infrared detector, and can be lower or higher than the resolution of the infrared detector; the thermal image data is not limited to being obtained by processing the analog signal output by the infrared detector, and may be obtained from a digital signal output from the infrared detector itself. In embodiment 1, the photographing part 1 functions as a thermal image acquiring part for acquiring thermal image data.

The image processing unit 2 performs predetermined processing on the thermal image data obtained by the image pickup unit 1, and the image processing unit 2 performs processing for converting the thermal image data into data suitable for display, recording, and the like, such as correction, interpolation, pseudo color, synthesis, compression, decompression, and the like. For example, the image processing unit 2 performs predetermined processing such as pseudo-color processing on thermal image data obtained by imaging by the imaging unit 1 to obtain image data of an infrared thermal image. The image processing unit 2 can be implemented by, for example, a DSP, another microprocessor, a programmable FPGA, or the like.

The display control unit 3 performs generation and output of a video signal from the image data for display stored in the temporary storage unit 6 under the control of the control unit 11, and the video signal is displayed on the display unit 4. Screen aspect ratios of 4: 3, a liquid crystal display screen; preferably, in order to clearly and clearly display the infrared thermal image, the position information, the shot object information and the like at the same time, a screen aspect ratio of 16: 9, a liquid crystal display panel.

The communication I/F5 is an interface for connecting and exchanging data between the thermal imaging device 13 and an external device such as a personal computer, a server, a PDA (personal digital assistant), another thermal imaging device, or a visible light camera, in accordance with a communication specification such as USB, 1394, or a network.

The temporary storage unit 6 is a volatile memory such as RAM, DRAM, or the like, and serves as a buffer memory for temporarily storing thermal image data output from the image pickup unit 1, and also serves as a work memory for the image processing unit 2 and the control unit 11, and temporarily stores data processed by the image processing unit 2 and the control unit 11.

The memory card I/F7 is connected to the memory card I/F7 as an interface of the memory card 8, as a rewritable nonvolatile memory, and is detachably mounted in a card slot of the thermal image device 13 main body, and records data such as thermal image data under the control of the control unit 11.

The flash memory 9 stores a program for control and various data used for control of each part.

The operation section 10: the control unit 11 executes a program corresponding to an operation signal from the operation unit 10 for a user to perform various operations. The operation unit 10 will be described with reference to fig. 2, and the keys for the user to operate include a record key 1, an analysis key 2, and the like; not limited to this, the touch panel 3, a voice recognition unit (not shown), or the like may be used to perform the relevant operation.

The control unit 11 controls the overall operation of the thermal imaging device 13, and a program for control and various data used in control of each unit are stored in a storage medium such as the flash memory 9. The control unit 11 is realized by, for example, a CPU, an MPU, an SOC, a programmable FPGA, or the like; the image processing unit 2 and the display control unit 3 may be a processor integrated with the control unit 11.

The control unit 11 functions as a part information selection unit for selecting part information. The part information may be information of a part, a shooting part, an angle, and the like, for example; preferably, the information includes at least information of the component, the imaging region, or the component and the imaging region; in one example, the part information is, for example, part information of the subject such as a joint, a sleeve, a base, and the like; and the location information may also be a subdivision of the component type, e.g. the joint may be divided into T-clamps, crimp tubes, parallel groove clamps, etc.; preferably, the location information may include various classification information suitable for industrial applications, such as voltage level, phase, etc.; in another example, the part information is, for example, shooting part information of the subject such as up, middle, down, and the like; in another example, the part information may be combination information of the part information and the photographing part or angle, such as the upper part of the sleeve, the lower part of the sleeve, and the like, and different part information should be prepared for parts related to different analysis, comparison, and the like; various kinds of site information can be prepared in advance as necessary. The part information may include one or a combination of letters, icons, numbers, and the like.

In one example, the correspondence between the specific key and the part information may be preset, and the part information may be selected by operating the specific key (e.g., dial key).

Preferably, the control unit 11 is a part information display control unit for controlling display of a mark in which part information is reflected; the mark can be characters, letters, icons, numbers and other marks expressing the part information, and the user can identify the part information represented by the mark. The location information may be stored in the storage medium in advance; preferably, the part information and the analysis area configuration data related thereto may be stored in advance in the storage medium, and the mark representing the information related to the part information and the analysis area configuration data related thereto may be displayed; the mark representing the related information of the analysis area configuration data can be an icon representing the analysis area configuration data, such as a thumbnail, or a text expression of the analysis area configuration data, such as a frame, a circle and the like.

The storage medium can be a storage medium in the thermal imaging device 13, such as a nonvolatile storage medium like a flash memory 9 and a memory card 8, and a volatile storage medium like a temporary storage 6; other storage media connected to the thermal imaging device 13 by wire or wirelessly may also be possible, such as storage media in other storage devices, thermal imaging devices, computers, etc., or storage media of network destinations through other devices connected to the communication I/F5 by wire or wirelessly.

The control section 11 as an analysis region setting section for determining the part information corresponding to the analysis region based on the selected part information;

information related to the selected part information may be associated with the corresponding analysis region based on the selected part information; in one example, the analysis area may be selected and designated and the corresponding part information may be added, and as shown in fig. 11, the analysis area S01 may be selected and the part information corresponding thereto may be selected and associated; for example, the analysis region S01 is associated with the analysis region S01 by selecting the corresponding site information "joint" from the displayed "joint", "upper casing portion", and "lower casing portion".

In another example, an analysis area is set based on a default position parameter of the analysis area and analysis area configuration data by selection of the part information, and the selected part information is associated with the set analysis area; the position parameters are, for example, the position of the analysis region in the infrared thermography or also the dimensions or also the angle of rotation. The application is, for example, a user taking a photograph of a thermal image of the subject based on the displayed analysis area and location information.

Preferably, the analysis region setting unit sets the corresponding analysis region based on the selected site information.

In one example, the analysis area is set by selecting the part information based on the position parameter of the analysis area and the analysis area configuration data associated therewith; the application is, for example, a user taking a photograph of a thermal image of the subject based on the displayed analysis area and location information.

In a preferred example, the analysis area setting unit sets the analysis area according to the analysis area position parameter and/or the analysis area configuration data set by the user based on the selected part information, and the set analysis area is associated with the information on the selected part information.

In one example, an analysis area is set according to the position parameter and/or analysis area configuration data set by the user based on the identifier of the selected part information, and the set analysis area is associated with the information related to the part information; the part information is the part information corresponding to the selected mark.

Preferably, the analysis area is set according to the position parameter set by the user based on the selected region information. When the part information does not have the analysis region configuration data associated therewith, for example, a default configuration data such as "frame" may be used to set the analysis region in accordance with the position parameter set by the user, and the analysis region may be applied to all the part information; when the selected part information is associated with the analysis area configuration data, the analysis area is set in accordance with the position parameter set by the user, and the part information and the associated analysis area configuration data and the like may be stored in the storage medium in advance. In another example, the part information may be associated with a plurality of analysis region configuration data suitable for different application conditions, and may be selected according to circumstances to set the analysis region according to the position parameters set by the user; this is also the case with the setting of an analysis area, the position parameters of which in the infrared thermography are obtained as default position parameters or as a function of the position parameters of the analysis area associated with the selected location information, and the analysis area configuration data are set by the user. For example, in one example, the position parameters of the analysis area are obtained by selecting the location information, the analysis area is set by setting the analysis area configuration data by the user, and then, for example, the user performs the photographing of the thermal image of the subject based on the displayed analysis area and the location information.

Information related to the part information may be, for example, part information and/or a number corresponding to the part information (hereinafter simply referred to as a part number), or the like; preferably, the correspondence between the part number and the part information is unique. In this way, it may be convenient to write an analysis pattern based on a relatively simplified site number. In one example, the analysis schema is written according to the site information and/or the site number; in another example, the analysis mode may be written according to an analysis region number that includes site information and/or a site number.

In a unique example, the part number has uniqueness corresponding to the part information; for example, the part number of the specific part information corresponds to only the specific part information, but the specific part information may correspond to a plurality of different part numbers. For example, numbers representing different application conditions are provided, so that a user can conveniently select and operate the application conditions, and the application conditions are distinguished from one another, such as day and night.

A preferable example of uniqueness is that the part number corresponds to the part information, and the part information has uniqueness corresponding to each other (one-to-one correspondence), that is, only the specific part number corresponds to the specific part information; the specific part number also corresponds to only the specific part information. Thus, it is more convenient to write an analysis pattern according to the part number. For example, in the same thermal image, one part information only corresponds to one part number uniquely, and one part number also corresponds to one part information uniquely.

In a preferred example, the part number represents the identity information of the specific part information.

In the case where there is no influence on processing such as analysis, there may be a plurality of identical part numbers corresponding to the same part information; for example, if a plurality of components are identical in processing such as analysis and the order of setting the analysis regions is not related to the analysis, there may be a plurality of analysis regions set by the plurality of components, having the same part number, and corresponding to the same part information.

Uniqueness, when embodied, should be understood to apply to a specific range of subjects; the specific range may be defined, for example, to subjects of the same model, the same type, the same jurisdiction, etc., depending on the user application; different uniqueness ranges can be set as desired.

In this embodiment, the control unit 11 is used as a thermal image analysis unit for analyzing the thermal image data according to a predetermined analysis mode based on the set analysis area; preferably, an analysis result corresponding to the part information is obtained, the part information being obtainable from information relating to the part information associated with the analysis area, for example;

in a preferred example, the control unit 11 is used as a thermal image analysis unit for analyzing the thermal image data based on an analysis area associated with information related to the selected portion information according to an analysis mode associated with the portion information.

In the embodiment, the thermal image data is converted into temperature values for analysis; however, the present invention is not limited to this, and for example, the analysis may be performed by converting the radiation energy value, the gradation value, the radiance value, and the like; obviously, the acquired thermal image data is analyzed, and is not limited to single-frame thermal image data, for example, multi-frame thermal image data stored in the temporary storage unit 6, or multi-frame thermal image data is subjected to integral operation to obtain one frame of processed thermal image data for analysis; the present invention is equally applicable to these situations. The technique for the detailed processing of the thermographic analysis is a technique well known to those skilled in the art, and the description is omitted.

The analysis mode can adopt a universal analysis mode and can be suitable for all set analysis areas;

preferably, the analysis pattern obtained based on the analysis pattern information associated with the part information may be an analysis pattern associated with the part information prepared in advance; in one example, the location information and the analysis mode related to the location information may be stored in a storage medium in advance to be applied to an analysis area corresponding to the location information; in another example, the location information and the analysis region configuration data associated therewith, the analysis pattern corresponding to the analysis region configuration data, and the like may be stored in advance in the storage medium so as to be applied to the analysis of the analysis region obtained by the analysis region configuration data, and in this case, the location information is associated with a plurality of analysis region configuration data for different applications. In yet another example, the location information may be associated with a plurality of analysis modes suitable for different application conditions, which may be selected according to circumstances.

The corresponding analysis mode relating to the analysis may be determined based on the analysis mode associated with each factor that determines the analysis area configuration data and/or the analysis area position parameter; for example, the analysis pattern obtained based on obtaining the analysis pattern information associated with the position parameter or the position rule related to the position parameter of the analysis area.

A real-time mode of storing the analysis region configuration data and the analysis pattern corresponding to the location information and the association thereof in the storage medium will be described with reference to the table shown in fig. 5. The table includes part information, part numbers, analysis region configuration data, an analysis mode 1, and a diagnosis rule 1; the analysis mode comprises an analysis mode 1 and a diagnosis rule 1, wherein the analysis mode can only comprise the analysis mode 1, and the analysis result of the analysis value obtained according to the analysis mode 1 can be obtained through the analysis of the thermographic analysis part, and the analysis result of the analysis value and/or the diagnosis conclusion can also be obtained according to the analysis mode 1 and the diagnosis rule 1. The diagnostic rule 1 may not include the "determination result" or the "remark", and may be, for example, a condition for triggering an alarm output such as "sound, light, or electricity", and thus the diagnostic result may be embodied as an alarm signal such as "sound, light, or electricity". The predetermined analysis pattern may be arranged according to the part information and/or the part number.

Further, the control unit 11 is used as an infrared thermal image display control unit for displaying an infrared thermal image generated by displaying the thermal image data obtained by shooting, preferably, the infrared thermal image and the selected part information are displayed on the same display screen.

Further, the control unit 11 is used as a recording unit for recording the information of the thermal image data related to the location information and the corresponding analysis result in a correlated manner.

Further, the analysis section has a diagnosis section for performing analysis in accordance with a predetermined analysis pattern including a diagnosis rule to obtain an analysis result including a diagnosis result.

Further, the control unit 11 serves as a presentation unit for presenting the site information and the analysis result corresponding thereto. The presentation mode of the part information and the analysis result corresponding thereto, for example, the presentation mode is not limited to display, and the presentation mode may be presented in various forms of "sound, light, electricity, vibration"; for example, the analysis result may be presented by an audio alarm, such as a method of transmitting the part information and the analysis result corresponding thereto to a predetermined destination. The user can know the defect of the part according to the presented analysis result. Various sound, light and electric presentation modes can be adopted, wherein when an analysis mode with a diagnosis rule is adopted, an alarm can be given according to a specified condition without presenting the part information.

The specific operation and control flow of embodiment 1 will be described in detail below. The application scene photographs, for example, a subject of a substation. After the power is turned on, the control unit 11 initializes the internal circuit, and then enters a shooting mode, that is, the shooting unit 1 obtains thermal image data by shooting, the image processing unit 2 performs a predetermined process on the thermal image data obtained by shooting by the shooting unit 1 and stores the data in the temporary storage unit 6, and the control unit 11 performs a control of the display control unit 3 so that the display unit 4 continuously displays infrared thermal images in the form of dynamic images and displays a selection column XZ4 of the part information, as shown in fig. 4 (a).

Fig. 4 is a schematic view of a display interface for setting and analyzing an analysis region of a thermal image of a subject. The control procedure of embodiment 1 is explained with reference to the flowchart of fig. 6.

In step a01, the display unit 4 displays a dynamic infrared thermal image, and displays a selection column XZ4 of location information, as shown in fig. 4(a), where the location information (including component information in this example) "joint", "upper casing part", "lower casing part", and the corresponding analysis area constitute data "circle", "frame", and "frame". Preferably, the infrared thermography and the location information are displayed on the same display screen. The user can identify the part information represented by the mark of the selection column XZ4 according to the displayed object thermal image to select the part information; wherein, the infrared thermal image can be frozen and displayed.

In another example, the location information may also be selected in steps, such as displaying a "sleeve," which when selected displays "up" and "down" options, from which the user may then select. This is applicable to a case where the part information includes multiple information.

In step a02, the control unit 11 sets an analysis region in accordance with the position parameter of the analysis region set by the user based on the selected site information.

When the part information does not have the associated analysis area configuration data, for example, default configuration data such as "frame" may be adopted, which is applied to all the part information; preferably, the analysis region configuration data associated with the selected part information is used as the analysis region configuration data associated with the set analysis region; then, the user can set the position parameters (such as the position, or the size, or the rotation angle, etc.) of the analysis area in the infrared thermal image, and can input the numerical value of the specific position parameters by pressing the keys of the operation part 10, or input the position parameters by moving the position of the set analysis area by the operation part 10; preferably, the position parameters are set by means of the touch screen 3.

Preferably, based on the selected part information, the control section 11 associates the set analysis area with information relating to the part information; the information related to the part information may be part information and/or a part number, and the part number may be associated with the part information in advance, may include a part number included in the part information, or may be generated from the part information or the like.

In one example, the part number has uniqueness with respect to the part information, which facilitates editing of the analysis mode according to the part number, and the part information may not be associated with the analysis area.

In another example, when the part number does not have uniqueness with respect to the part information, the analysis area is preferably associated with the part information, and the analysis mode may be edited in advance based on the part information.

Preferably, the selected part information, part number, and corresponding analysis area are associated, which facilitates editing the analysis mode without error. And is convenient for subsequent batch processing such as retrieval and the like according to the position information; the part information and/or the part number may be an analysis region number of the analysis region or a component of the analysis region number.

For example, a predetermined area stored in a storage medium such as the temporary storage section 6 may be associated; preferably, the control unit 11 may display the set analysis region and the corresponding site information thereof based on the site information corresponding to the analysis region; preferably, the analysis area number containing the part information and/or the part number is displayed near the analysis area (such as upper, lower, left, right, etc. of the analysis area), so that the user can conveniently identify the corresponding relationship between the two; the analysis regions "joint J", "casing upper portion TS", and "casing lower portion TS" shown in fig. 4(b) are analyzed. In the analysis area set in the way, the part numbers 'J', 'TS' and 'TX' in the analysis area can be associated with corresponding part information in advance, are irrelevant to the operation sequence set in sequence, and are not easy to make mistakes; thus, an analysis pattern, a diagnosis rule, and the like can be arranged in advance according to information on the part information, such as a part number, and at the time of analysis, analysis can be performed according to the arranged analysis pattern, for example. In addition, the part number can also be generated according to the part information, such as "J", "TS", "TX", can be generated according to the abbreviations of the part information "joint", "upper part of the sleeve" and "lower part of the sleeve", such as the hanyu pinyin abbreviations, respectively, obviously, the analysis mode, the diagnosis rule, etc. can be pre-arranged according to the hanyu pinyin abbreviations related to the part information. The part numbers "J", "TS", "TX" correspond to the part information "joint", "upper sleeve part", "lower sleeve part" and have uniqueness (here, one-to-one correspondence), which facilitates editing of the analysis mode according to the part number.

In another example, if there is no part number, an analysis pattern, a diagnosis rule, and the like may be laid out in advance based on the part information.

In another example, the analysis region may be divided into corresponding regions by associating different analysis region configuration data with different region information prepared in advance, without numbering the analysis region-associated region information or the associated region, for example, the different region information may correspond to a square, a circle, a triangle, a pentagon, or the like, and the analysis pattern may be arranged according to the type of the analysis region configuration data; in this case, the analysis region configuration data itself has a function of subsequently distinguishing the corresponding part information, and as a special case, may represent information related to the selected part information.

And A03, analyzing the acquired thermal image data according to the analysis mode associated with the position information to obtain an analysis result. Specifically, for example, the thermal image data determined by the analysis areas J, TS, and TX (e.g., in the analysis areas) is extracted and analyzed, and the analysis result is obtained by analyzing according to the analysis mode corresponding to each analysis area.

Further, the part information and the corresponding analysis result can be presented, as shown in fig. 4(b), the part information and the corresponding analysis result (analysis value ℃): "linker J: 150 "," casing upper portion TS: 25 "," lower casing TX: 25". The number of the analysis area containing the part information and/or the part number and the analysis result can be displayed near the analysis area, so that a user can conveniently identify the corresponding relation between the analysis area and the analysis area;

further, when an analysis is performed using an analysis mode having a diagnosis rule, an analysis result with a diagnosis result can be obtained, as shown in fig. 4(c), the site information and its corresponding diagnosis result are displayed: "Joint: critical defects, severe overheating of the joint "," bushing: the word "normal". Obviously, the diagnostic result can also be displayed in the vicinity of the analysis value.

Considering that a plurality of object thermal images may exist in the same infrared thermal image, preferably, the analysis region number can be obtained according to the position information and/or the position number and the setting sequence number, and the analysis region number and the set analysis region are stored in a correlated manner; the setting order number may be decided according to the order of selecting the same site information and setting the analysis region, for example. As shown in fig. 7, there are two subject thermal images IR1, IR2, the analysis area numbers (J1, TS1, TX1) set in IR1, which are obtained by combining the hanyu pinyin abbreviation of the selected location information with the setting order number "1", which represents that the user has first selected location information for the subject thermal image IR1 and has set the analysis area, and the analysis area numbers (J2, TS2, TX2) set in IR2, which are obtained by combining the hanyu pinyin abbreviation of the selected location information (or using the location information) with the setting order number "2", obviously, it is also very convenient to set analysis areas for a plurality of subject thermal images, and it is convenient to set one subject thermal image first and then another subject thermal image, which conforms to the setting operation habit of the user. The set analysis area is convenient for analysis by adopting an analysis mode arranged according to the information related to the part information; wherein the analysis of one of the subject thermal images IR1 may be performed according to the arranged setting order number such as "1"; and the comparison analysis of the same part between different object thermal images is convenient according to the difference of the serial numbers of the setting sequence. The analysis regions can be numbered by adopting various binding site information so as to achieve the purpose of distinguishing the thermal images of the sites and the shot objects.

Therefore, the technical problem of the existing analysis area setting is solved, and the set analysis area is standard and is simple to operate. Moreover, when the part numbers are irrelevant to the successively set operation sequence, analysis is conveniently carried out according to a preset analysis mode; moreover, even if a plurality of shot thermal images exist in the same thermal image data, the corresponding analysis area numbers can be arranged according to the position information and the sequence numbers, so that the analysis positions can be marked and distinguished; thus, analysis of multiple subject thermographies may also be performed using corresponding pre-programmed analysis patterns. Thereby solving the prior art problems. Moreover, if the part information is associated with the analysis mode in advance, the requirement on the user is reduced.

When the recording key is pressed, the position information, the corresponding analysis result and the like are controlled to be recorded in association with the thermal image data, for example, a thermal image file is generated and recorded in the memory card 8, and the thermal image file can be further analyzed according to the analysis result and the like corresponding to the position information during subsequent analysis and sorting. And the position information, the analysis result and the like are associated with the thermal image data and the like for recording, so that the subsequent batch processing analysis is facilitated.

Further, the recording part is used for associating and recording the specified recording information with the thermal image data and/or data obtained after the thermal image data is subjected to specified processing; the predetermined record information includes information on the selected part information and an analysis result related thereto. Further preferably, the predetermined recorded information further includes information on an analysis area (for example, analysis area configuration data and/or analysis area position parameters) set in correspondence with the information on the selected part information.

When a record key is pressed, controlling the specified record information and the thermal image data and/or the data obtained after the specified processing of the thermal image data to be recorded in an associated manner, for example, generating a thermal image picture file and recording the thermal image picture file in the memory card 8, and when the thermal image picture file is analyzed subsequently, obtaining an analysis result corresponding to the part information by analyzing the specified record information associated with the thermal image picture file; obviously, in one embodiment, when a plurality of thermal image picture files are associated with analysis results corresponding to the same position information, batch analysis is facilitated.

The recorded thermal image data and/or data obtained after the thermal image data is subjected to prescribed processing, for example, thermal image data (frames) obtained by reading signals by an infrared detector in response to the time indicated by the recording; for example; specified thermal image data (frames) among the thermal image data of the plurality of frames temporarily stored in the temporary storage 6 in response to the time of the recording instruction; for example, the thermal image data in the above case is data obtained after predetermined processing (one or more of predetermined processing such as correction, interpolation, pseudo color, conversion to a temperature value, pixel reduction, compression, analysis to obtain an analysis result, and the like); for example, recording thermal image data of a prescribed number of frames; for example, thermal image data (frames) obtained by performing predetermined processing on a predetermined number of frames of thermal image data, for example, integrating the thermal image data of the plurality of frames stored in the temporary storage unit 6 to obtain one frame of thermal image data after the processing; for example, one or more of the infrared data obtained in these cases may be used, such as simultaneously recording the temperature value of each pixel obtained from the thermal image data and the image data of the infrared thermal image.

Specifically, in one embodiment, in response to the recording instruction operation of the operating unit 10, the control unit 11 controls the infrared detector to read signals to obtain thermal image data, and causes the image processing unit 2 to perform a predetermined thermal image data compression process on the thermal image data, or performs a predetermined process such as correction and interpolation on the thermal image data, and then performs a compression process, and performs analysis on the thermal image data in an analysis area corresponding to the location information, so that the predetermined recording information in the temporary storage unit 6 is associated with the compressed thermal image data, and a thermal image file is generated and recorded in the memory card 8, and the process is ended. Further, the compression may be performed after the information is added.

Preferably, the thermal image file name can be generated according to the selected position information so as to facilitate subsequent processing; preferably, the recording part is provided with a file name generating unit for generating a file name of the thermal image file, and the generated file name of the thermal image file contains information related to the part information; for example, if a position information connector, the upper part of the sleeve and the lower part of the sleeve are selected, the generated thermal image file name is as follows: joint-upper casing-lower casing jpg; further, a file name, for example, joint-sleeve upper-sleeve lower-20130207. jpg, is generated as combined with the shooting time information "20130207".

In addition, the association recording process may record the predetermined recording information in an information file or an index file related to the thermal image file, and the control unit 11 may generate the information file or the index file. The essence of the correlation record is to record the location information and information about the analysis results that are needed to facilitate subsequent batch analysis.

In another embodiment, the thermal image recording unit continuously records the captured thermal image data to generate a multi-frame thermal image file including a plurality of frames of thermal images, wherein when a recording instruction associated with specified recording information is provided, the control unit 11 controls the thermal image recording unit to perform compression processing and corresponding analysis processing on the thermal image data obtained by reading signals by the infrared detector, so that the specified recording information in the temporary storage unit 6 and the compressed thermal image data are stored in the multi-frame thermal image file in an associated manner, wherein a frame timing position of the frame of thermal image data can be associated with the specified recording information and stored in an index area of the multi-frame thermal image file, and then subsequent dynamic recording processing is continued.

And the position information, the analysis result and the like are associated with the thermal image data and the like for recording, so that the subsequent batch processing analysis is facilitated.

Example 2

In embodiment 1, the location information is used for all the objects, and when there are many objects to be captured, there may be many location information to be selected; and the user may miss a portion of the subject to be set in the operation. Embodiment 2 takes a portable thermal imaging device 13 with a photographing function as an example of an analysis device. Refer to the structure of the thermal image system 13 of fig. 1.

Storing (at least one) object information, part information related to the object information, and analysis patterns related to the part information in a storage medium; thus, when the user selects the subject information based on the live subject, the part information display control unit displays the part information to be selected based on the selected subject information, thereby further simplifying the operation. Preferably, the storage medium stores (at least one) of the object information, the part information associated with the object information, the analysis region configuration data associated with the part information, and the analysis pattern; the operation is further simple and convenient, and the discreteness of the analysis result is small.

The information of the object is information related to the object, and can include information such as object identity information related to the object; the generated object indication information should allow the user to recognize and understand the corresponding object, and in the case of power industry application, the information represents the specific self-attribute of the object, such as the location, type, number, etc. of the object; in one example, the subject information includes information representing a location (such as a substation, an equipment area), a type (such as a transformer, a switch, and the like, or further including a voltage level, or further including a model, or further including a manufacturer, or further including a manufacturing lot, and the like), a phase (such as A, B, C phase), and the like of the subject; in another example, the subject information contains only information of the type or model number of the subject, or the like; in still another example, the information may further include information on one or more of an attribution unit, a voltage class, an importance class, a manufacturer, performance, and characteristics, a history of past shooting or inspection, a manufacturing date, a lifetime, an ID number, and the like of the object. In another example, the subject information may include specific portion information. The object information may have various configurations depending on the application.

Fig. 8 is a schematic view of a display interface for setting an analysis region for a subject thermal image.

As shown in fig. 8, in the shooting mode, the display section 4 may display a dynamic infrared thermal image, and display the object information column XZ81, as shown in fig. 8 (a). The subject indication information in the subject information field can be obtained based on the subject information stored in the storage medium, which is easy for the user to understand, and the user can perform page turning or the like of the subject indication information display (e.g., by adjusting a scroll bar or the like). It should be noted that the displayed object indication information may generally only include object identification information such as object location, type, and other information, which is convenient for the user to recognize during shooting, and does not necessarily display other information that may be included in the object information.

Preferably, a wide screen (such as a 16: 9 wide screen) is adopted, so that prompt information such as shot object indication information and the like can be displayed together with the infrared thermal image and can not be superposed on the infrared thermal image (generally 4: 3); further, the object indication information may also be superimposed in the infrared thermography.

When the user selects the subject instruction information "subject 1", the region information selection column XZ82 is displayed, and the analysis region configuration data "circle", "frame", and "frame" corresponding to the region information "joint", "upper sleeve portion", "lower sleeve portion", and the region information associated with the "subject 1" are displayed. As shown in fig. 8(b), when the subject 1 is photographed, the user can select and set an analysis region from among the regions, and then can perform analysis processing according to the analysis mode associated with the part information and the corresponding analysis region.

When the user photographs the object 2, the object instruction information "object 2" is selected, the region information selection column XZ83 is displayed, and the analysis region configuration data "circle", "frame", and "frame" corresponding to the region information "joint", "sleeve", "base", and region information "object 2" are displayed. As shown in fig. 8(c), the user can select the site information from the site information, set the analysis region, and then perform analysis processing according to the analysis mode associated with the site information and the corresponding analysis region.

The set analysis region is further standardized and is simple to operate, the analysis part of the shot object is not easy to omit, and the analysis is convenient to carry out according to the analysis mode related to the part information.

Further preferably, the analysis region number may be generated according to the position information in combination with the set sequence number, and is suitable for subsequent analysis of subject thermal images in which a plurality of different or same subject information appear in the same thermal infrared image.

Also, the set analysis region may associate information related to the part information (e.g., the part information and/or a part number corresponding to the part information); preferably, the set analysis region may associate information related to the selected subject information (e.g., complete information of the subject information, or specific keywords, IDs, etc. therein), information related to the part information, which may facilitate subsequent sorting analysis; the information on the selected subject information and the information on the part information may be the analysis area number or a component of the analysis area number.

Preferably, when the analysis pattern is arranged, the analysis pattern may be arranged by associating the object information and the information on the part with the analysis pattern, or by setting the object information and the information on the part as the analysis region number or a component thereof.

Preferably, when the recording instruction is given, the recording section records the selected subject information, the information related to the selected part information, and the analysis result corresponding to the part information in association with the thermal image data. This facilitates subsequent collation analysis. Preferably, the recording part is provided with a file name generating unit and is used for generating the file name of the thermal image file, and the generated file name of the thermal image file contains the selected shot object information or also contains related information such as part information and analysis results; for example, the generated thermal image file name: subject 1. jpg; further, a file name is generated as combined with the site information, such as subject 1-joint-sleeve upper-sleeve lower jpg; further, a file name, for example, subject 1-joint-sleeve upper portion-sleeve lower portion-20130207. jpg, is generated as combined with the shooting time information "20130207", facilitating reading of the above information at the time of subsequent batch analysis.

As described above, by selecting the subject information and the part information, the set analysis area is further standardized and simple to operate, and when the subject information, the part information, and the like are recorded in association with the thermal image data, and the like, the subsequent batch analysis is further facilitated.

Obviously, without being limited thereto, there may be no correlation between the subject information and the part information, or there may be no correlation between the part information and the analysis mode, the analysis region configuration data, and/or the analysis region position parameter, or the like; although the user's operation may be somewhat cumbersome. In this embodiment, if the subject information is recorded in association with the thermal image data in association with the selected location information, the analysis result obtained from the analysis area set by the corresponding location information set by the user, the subsequent analysis and batch processing can be facilitated.

According to the embodiment 1-2, the recording part is configured to associate the specified recording information with the thermal image data and/or data obtained after specified processing of the thermal image data for recording; the prescribed recording information may include one or more of:

1) information relating to the location information; for example, selected site information; however, in other examples, although not selected, other part information related to the selected part information may be recorded together for use in subsequent analysis.

2) Subject information; for example, the selected part information is selected based on the selected subject information and based on the associated part information;

3) analyzing information about the region; for example, the analysis area corresponds to the selected part information, and information related to the selected part information is associated with the analysis area;

4) analyzing information about the pattern; for example, an analysis mode is adopted for analyzing an analysis area corresponding to the part information; information relating to, for example, selected site information, its associated analysis mode;

5) analyzing the result; for example, an analysis result obtained by analyzing an analysis area corresponding to the partial information; preferably, the analysis result is obtained by analyzing an analysis area obtained based on the selected part information and based on information on the analysis area related to the information on the part information; and/or, based on the selected part information, analyzing according to the related analysis mode of the information related to the part information.

The above items 1) to 5) are related to the selected region information; preferably, the items 1), 2) and 3) can be recorded, and more preferably, all the items can be recorded, and the method can be applied to batch processing in a plurality of subsequent modes.

Example 3

Embodiment 3 takes a portable thermal imaging device 13 with a photographing function as an example of the processing device. When the acquired multi-frame thermal image data is processed, the processing device can perform specified processing on the multi-frame thermal image data according to specified conditions according to the specified position information to obtain a processing result, and specified processing such as comparative analysis, classification, statistics, retrieval, presentation and the like can be conveniently realized on the batch of thermal image data. The multi-frame thermal image data comprise a plurality of selected thermal image picture files containing single-frame thermal image data, such as thermal image video files containing multi-frame thermal image data; preferably, the predetermined processing is related to the location information associated with the thermographic data or is also related to the location information and its corresponding analysis result. Further, the information on the part information may be associated with a rule of a predetermined process and the predetermined condition.

The processing device comprises a processing device and a control device,

the acquisition part is used for confirming multi-frame thermal image data to be processed;

the analysis part is used for analyzing information related to the part information related to each frame of thermal image data in the multi-frame thermal image data and analysis results related to the part information;

and the processing part is used for obtaining a processing result of the specified processing of the multi-frame thermal image data according to specified conditions.

In one example, the analysis unit includes an analysis unit, an analysis region setting unit, and an analysis unit

The analysis unit is used for analyzing the information related to the part information associated with the acquired multi-frame thermal image data and the corresponding analysis area composition data and/or the position parameters of the analysis area;

an analysis region setting unit configured to set an analysis region related to each frame of thermal image data in the multi-frame thermal image data, according to the analysis region configuration data and/or the position parameter of the analysis region analyzed by the analysis portion;

and an analysis unit configured to obtain an analysis result associated with the part information based on a predetermined analysis pattern.

Prescribed conditions such as conditions including a longitudinal direction (for example, comparison of thermal image data taken at different times), a lateral direction (for example, comparison of thermal image data taken at prescribed times), and the like are generally employed to specify thermal image data of a plurality of frames for prescribed processing. The prescribed conditions may also be set according to various parameters associated with the acquisition of thermal image data by shooting, such as various parameters (e.g., radiance, shooting distance, lens parameters, etc.) of the thermal image device 13 during shooting, environmental conditions (e.g., ambient temperature, humidity, wind speed, etc.), parameters related to the subject (e.g., subject load parameters, current, voltage, rotational speed, etc.), and other external parameters (e.g., information of a device connected to the subject or the thermal image device 13, such as a GPS device, etc.). Further, when the thermal image data is associated with the object information, the specified conditions can be set according to the object information, for example, specified processing such as longitudinal comparison for the same object, and longitudinal and transverse processing such as comparison for thermal image data obtained by shooting the same group (for example, A, B, C; for example, the same equipment area and the same group conditions) of the object.

And comparing and analyzing, namely comparing analysis results obtained by appointed multi-frame thermal image data, and obtaining a further accurate comprehensive analysis result according to a comparison result by generally adopting comparison between analysis values. When the position information is adopted for carrying out comparison analysis, the method is more accurate. And if the acquired multi-frame thermal image data is acquired, performing comparative analysis according to the analysis value of the specific part to determine the state property of the thermal image data with the maximum analysis value. The method is generally used for transverse comparison and analysis of thermal image data of the same type of objects; historical comparison of thermal image data of the same shot object; comparative analysis of thermal image data of the same group (e.g., A, B, C phase) of subjects.

Classifying, for example, classifying and sorting the thermal image data (frames) according to the analysis result of the specific part and the set processing rule (classification rule) from the multi-frame thermal image data; and if the acquired multi-frame thermal image data is obtained, classifying the multi-frame thermal image data according to the state properties (normal, defective and dangerous) of the specific part, for example, classifying according to a specific folder.

Statistical processing, for example, performing statistics from the multi-frame thermal image data according to the analysis result of the specific portion and the set processing rule (statistical rule); for example, the obtained thermal image data of multiple frames is counted according to the number or percentage of state properties (normal, defective, and dangerous) of a specific part. For example, the user can obtain statistical data of the analysis result of the joint portion of the subject of a specific apparatus type by selecting "apparatus type" and portion information such as "joint".

Searching, for example, searching the thermal image data (frames) which are in accordance with the analysis result of the specific part and the set processing rule (searching rule) from the multi-frame thermal image data; and if the acquired multi-frame thermal image data are acquired, performing comparative analysis according to the analysis value of the specific part, and finding out the maximum analysis value and/or the corresponding thermal image data. For example, the multi-frame thermal image data is searched according to the state property (critical defect) of the specific part, and the thermal image data (frame) with the most serious defect of the specific part is obtained. For example, before the repair, the user can obtain the search result of critical defects of the joint part of the object of a specific equipment type by selecting the equipment type and the part information such as the joint, so as to reasonably arrange the emergency repair plan.

Batch data presentation processing: for example, the presentation results of batch data are obtained from the thermal image data of multiple frames according to the analysis results of specific parts and the set data set rule; if the acquired thermal image data of the multiple frames is acquired, extracting an analysis result obtained by analyzing a specific part, and generating a characteristic curve or generating a report or report of a data set; such as the image data can be generated according to one or more items of the shot object information, the part information, the frame number of the thermal image data and the like, and the analysis result is combined. For example, the frame number and the analysis value are used to generate a coordinate system of the characteristic curve, the abscissa of the coordinate system is the frame number, the ordinate is the analysis value, and the same part information is used to generate a characteristic curve in the coordinate system, which is convenient for the user to view.

The specific operation and control flow of embodiment 3 will be described in detail below. The application scene is used for shooting a shot object of a transformer substation, for example, part information is selected in the shooting process, analysis is carried out according to an analysis mode related to the part information to obtain an analysis result, and then the part information, the analysis result and thermal image data are recorded as a thermal image file in a related mode; and comprehensively analyzing the plurality of thermal image files obtained by the recording. The control procedure of embodiment 3 is explained with reference to the flowchart of fig. 12.

And step B01, acquiring multi-frame thermal image data, and acquiring a plurality of thermal image files to be processed from the memory card 8 if the user selects the thermal image data. Determining thermal image data to be processed according to the selected part information related to the processing and according to a specified condition; for example, the user sets prescribed conditions as: selecting part information of thermal image picture files shot in the same day: "Joint"; the thermal image data to be processed can be acquired according to the shooting time (specified condition) and the "joint" (position information) of the thermal image file, for example, the selected multi-frame thermal image data can be analyzed to determine whether the position information "joint" is associated, and the thermal image data associated with the "joint" and meeting the specified condition is used as the thermal image data to be processed. One or more pieces of information on the part related to the treatment can be selected, and the specified condition can be one or more conditions; the user may also not select and rely on default configurations.

B02, analyzing the analysis result corresponding to the part information associated with the multi-frame thermal image data;

in one example, the specified information associated with each frame of thermal image data comprises analysis results corresponding to the position information joints, and the plurality of thermal image picture files can be sequentially analyzed to obtain the position information and the analysis results associated with each frame of thermal image data;

in another example, for example, the acquired multiple frames of thermal image data are analyzed, and the analysis area corresponding to the position information joint associated with each frame of thermal image data forms data and/or position parameters of the analysis area; then, setting analysis areas related to the thermal image data according to the analysis area composition data analyzed by the analysis part and/or the position parameters of the analysis areas; next, an analysis result related to each thermal image data is obtained based on a predetermined analysis pattern (preferably, an analysis pattern corresponding to the analyzed part information is used).

Step B03, the processing part obtains the processing result of the multi-frame thermal image data according to the position information obtained by each thermal image data and the corresponding analysis result thereof according to the specified conditions; the processing result is, for example, one or more of a classification result, a statistical result, a search result, a comparative analysis result and a presentation result obtained based on the multi-frame thermal image data.

The above processing may be modified in various ways, for example, all of the selected thermal image files may be analyzed first, and then the processing result may be obtained according to the determined predetermined condition and/or the selected location information. The processing result can then preferably be presented on a display of the thermal image system 13.

And the method is also suitable for thermal image video files containing multi-frame thermal image data, and thermal image data (frames) in the thermal image video files can be processed according to specified conditions on the basis of analysis results corresponding to the specified position information to obtain processing results.

When the acquired thermal image data is associated with the object information, the specified conditions may be set to be more specific, for example, the thermal image data of multiple frames is specified by the generally adopted specified conditions, such as a longitudinal condition (for example, comparison of thermal image data of the same kind of objects photographed at different times or the same object), and a transverse condition (for example, comparison of thermal image data obtained by photographing the same kind of objects or the same group of A, B, C objects at the specified time) for performing the above processing. Preferably, the analysis part is used for analyzing the object information, the part information and the analysis result corresponding to the part information which are respectively associated with each frame of thermal image data of the multi-frame thermal image data; and obtaining a processing result of the multi-frame thermal image data according to the processing rule and the shot object information, the part information and the corresponding analysis result. Which can obtain a corresponding processing result according to the object information. Therefore, the user can further conveniently obtain the processing result corresponding to the shot object information by setting the shot object information, such as the transverse comparison and analysis of the thermal image data of the same type of shot objects and the longitudinal comparison and analysis of the thermal image data of the same shot object. Further, a presentation section is provided for presenting the processing result. Such as display, output (e.g., printing), sound, etc.

Other embodiments;

the example of the invention is not limited to the portable thermal image shooting device, but can also be applied to various on-line thermal image shooting devices; and is not essential to the function of the present invention for photographing to obtain thermal image data, the present invention is also applicable to a thermal image processing apparatus and the like for receiving and processing thermal image data from the outside. Thermal image processing devices such as computers, personal digital assistants, display devices used in cooperation with thermal image photographing devices having a photographing function, and the like are used as examples of the processing devices and the analysis region setting devices for setting and analyzing the analysis region. In one example, the position information and the corresponding analysis area are set and analyzed for the thermal image data obtained from the thermal image file selected by the user.

The portable thermal image capturing device is not limited to dynamic thermal image data (e.g., dynamically displayed infrared thermal images), but may also be applied to static thermal image data (e.g., statically displayed infrared thermal images, such as frozen infrared thermal images).

The processing device is not limited to having the thermal image acquisition unit, and may be, for example, a component or a functional module in a thermal image capturing device or a thermal image processing device having the thermal image acquisition unit.

Moreover, the displayed infrared thermal image is not limited to the infrared thermal image obtained from the thermal image data to be analyzed, for example, when the infrared video is analyzed, there may be thermal image data before the thermal image data to be analyzed is displayed, and there may be location information selection and setting of a related analysis area, and thus the displayed infrared thermal image is suitable for the subsequent thermal image data.

In addition, during the selection of the location information, the infrared thermal image may not be acquired or displayed, for example, in one example, the analysis area is directly set through the selection of the location information, and then the user performs the shooting of the thermal image of the object according to the displayed analysis area and the location information.

The selection of the subject information is not limited to the selection by the user, and in other examples, the subject information corresponding to the trigger information is automatically selected based on the received trigger information, for example, GPS.

The site information is not limited to one analysis region unit, and as shown in fig. 9, the same site information may correspond to a plurality of analysis region units (two frames correspond to the cannula).

Preferably, the part information is expressed as characters directly expressing the part information, such as chinese characters, but is not limited to chinese characters, and may be expressed in a language corresponding to the user, or may be information representing the meaning of the part information, such as letters, as shown in fig. 10.

The processing device comprises an acquisition part and a storage part, wherein the acquisition part is used for acquiring thermal image data; an analysis area setting part for the user to select the part information and the corresponding analysis area; and the thermal image analysis part is used for analyzing the thermal image data based on the set analysis area and according to the analysis mode related to the selected part information. When the analysis region is set, the site information may be selected and associated with each of the set analysis regions, and as shown in fig. 11, the corresponding site information may be selected and associated with the displayed "joint", "upper sleeve part", "lower sleeve part", and "base" of the set analysis region S01, and then the analysis may be performed according to the analysis mode associated with the selected site information.

And a control unit that performs control of predetermined processing on the acquired thermal image data based on information on the analysis area and the related part information. The present invention is not limited to the display, analysis, recording and other processing mentioned in the above embodiments, and other predetermined processing such as pseudo color, cutting and the like may be performed, for example, specific pseudo color processing and cutting processing may be performed according to information related to the analysis area and the related part information, according to thermal image data in the analysis area related to different part information, and according to part information (for example, pseudo color parameters and cutting parameters related to the part information).

Aspects of the present invention can also be realized by a computer of a system or apparatus (or devices such as a CPU, MPU, or the like) that executes a program recorded on a storage device to perform the functions of the above-described embodiments, and a method known by a computer of a system or apparatus through the steps thereof to perform the functions of the above-described embodiments by, for example, reading out and executing a program recorded on a storage device. For this purpose, the program is supplied to the computer, for example, via a network or from a recording medium of various types serving as a storage device (e.g., a computer-readable medium).

The present invention provides a computer program in which a digital signal formed by the computer program is recorded in a computer-readable recording medium such as a hard disk or a memory. After the program is operated, the following steps are executed:

a part information selection step of selecting part information;

Although particular functional blocks of the drawings may be implemented by hardware, software, or combinations thereof, there is generally no requirement that structures be provided which implement the functional blocks in a one-to-one correspondence; for example, a functional block may be implemented by one software or hardware unit, or a functional block may be implemented by multiple software or hardware units. In addition, some or all of the processing and control functions of the components of the present invention may be implemented using dedicated circuitry or a general purpose processor or a programmable FPGA.

In the embodiment, the subject application in the power industry is taken as an example of a scene, and the method is also applicable to various industries of infrared detection.

The foregoing describes only embodiments of the invention and is presented by way of illustration rather than limitation, and further modifications and variations of the embodiments may be made by persons skilled in the art in light of the foregoing description without departing from the spirit or scope of the invention.

Claims

1. An analysis device, characterized by comprising,

the display part is used for displaying the infrared thermal image;

a subject information selection section for selecting subject information;

a part information display control unit for displaying, based on the selected subject information, a plurality of marks representing part information and related information on which the analysis area configuration data is associated, based on the subject information-related part information;

a part information selection unit for sequentially selecting part information based on the selection of the user's marks for the plurality of part information;

the thermal image analysis part is used for analyzing the acquired thermal image data according to the analysis mode related to the part information based on the analysis area;

when a plurality of object thermal images exist in the same infrared thermal image, the number of the analysis area is obtained according to the position information and/or the position number and the setting sequence number, and the number of the analysis area and the set analysis area are stored in a correlation mode; the setting order number is decided according to the order of selecting the same part information and setting the analysis area;

the analysis mode related to the part information is pre-arranged based on the analysis area number;

and the recording part is used for associating and recording the specified recording information with the thermal image data and/or the data obtained after the thermal image data is subjected to specified processing.

2. An analysis device, characterized by comprising,

the display part is used for displaying the infrared thermal image;

a subject information selection section for selecting subject information;

a part information display control unit for displaying, based on the selected subject information and on part information associated with the subject information, a plurality of marks representing information related to the part information and associated analysis area configuration data;

the thermal image analysis part is used for analyzing the acquired thermal image data based on the analysis area according to a specified analysis mode and associating the obtained analysis result with information related to the part information;

the analysis mode is arranged based on the analysis area number;

3. The analysis apparatus according to claim 1, wherein the analysis region setting section sets the analysis region in accordance with the analysis region configuration data and/or the position parameter of the analysis region set by the user based on the selected site information.

4. The analytical device of claim 1, having

The display control part is used for numbering the analysis areas and the analysis areas based on the analysis areas and the corresponding part information thereof and displaying the analysis areas and the analysis areas together with the infrared thermal image; the analysis area number includes at least information related to part information; the analysis areas are displayed in the infrared thermal image, and the numbers of the analysis areas are displayed near the corresponding analysis areas.

5. The device of any one of claims 1 to 4, having

And the display control part displays the analysis area, the information related to the part information and the analysis result together with the infrared thermal image on the basis of the analysis area and the part information corresponding to the analysis area.

6. The analysis apparatus according to any one of claims 1 to 4, wherein the prescribed record information contains one or more of:

1) subject information;

2) information relating to the location information;

3) analyzing information about the region;

4) analyzing information about the pattern;

5) and (6) analyzing the result.

7. The analysis apparatus according to any one of claims 1 to 4, wherein the analysis section has a diagnosis section for performing analysis in accordance with the analysis pattern including a diagnosis rule to obtain an analysis result including a diagnosis result.

8. The analysis device according to any one of claims 1-2, having an acquisition section for acquiring thermographic data.

9. The analytical device of claim 1, comprising,

the acquisition part is used for acquiring multi-frame thermal image data;

the multi-frame thermal image data is associated with part information and analysis results corresponding to the part information;

the processing part is used for obtaining the processing result of the multi-frame thermal image data according to the specified conditions and the part information obtained by analysis of the analysis part and the analysis result corresponding to the part information; the processing comprises one of comparative analysis, classification, statistics, retrieval and batch data presentation processing;

the analysis unit includes an analysis unit, an analysis region unit setting unit, and an analysis unit;

the analysis region setting unit is used for setting an analysis region related to each frame of thermal image data in the multi-frame thermal image data according to the analysis region composition data analyzed by the analysis part and/or the position parameters of the analysis region;

the analysis unit is used for obtaining an analysis result related to the part information according to a specified analysis mode;

the specified conditions comprise longitudinal and transverse conditions to specify thermal image data of multiple frames for specified processing or set according to parameters when the thermal image data are obtained through shooting; when the thermal image data is associated with the shot object information, the specified condition is set according to the shot object information;

the comparison analysis is to compare analysis results obtained by the appointed multi-frame thermal image data, and further comprehensive analysis results are obtained according to the comparison results by adopting the comparison between analysis values;

the classification processing is to classify and sort the thermal image data from the multi-frame thermal image data according to the analysis result of the specific part and the set processing rule;

the statistical processing is carried out according to the analysis result of the specific part and a set statistical rule from the multi-frame thermal image data;

the retrieval processing is to retrieve the thermal image data which is in line with the multi-frame thermal image data according to the analysis result of the specific part and the set retrieval rule;

and the batch data presentation processing is to obtain the presentation result of the batch data from the thermal image data of multiple frames according to the analysis result of the specific part and the set data set rule.

10. An analytical method, comprising,

s101: a display step, which is used for displaying the infrared thermal image;

s102: a subject information selection step of selecting subject information;

s103: a part information display control step of displaying, based on the selected subject information, a plurality of marks representing information on the part information and related analysis area configuration data based on part information related to the subject information;

s104: a part information selection step of sequentially selecting part information based on selection of a user's mark of the plurality of part information;

s105: an analysis region setting step of determining an analysis region corresponding to the part information;

s106: a thermal image analysis step for analyzing the acquired thermal image data according to the analysis mode associated with the part information based on the analysis area;

s107: and a recording step, wherein the specified recording information is recorded in association with the thermal image data and/or data obtained after the thermal image data is specified and processed.

11. An analytical method, comprising,

s111: a display step, which is used for displaying the infrared thermal image;

s112: a subject information selection step of selecting subject information;

s113: a part information display control step of displaying, based on the selected subject information, a plurality of marks representing information on the part information and related analysis area configuration data based on part information related to the subject information;

s114: a part information selection step of sequentially selecting part information based on selection of a user's mark of the plurality of part information;

s115: an analysis region setting step of determining an analysis region corresponding to the part information;

s116: a thermal image analysis step for analyzing the acquired thermal image data based on the analysis area according to a specified analysis mode, and associating the obtained analysis result with information related to the part information;

the analysis mode is arranged based on the analysis area number;

s117: and a recording step, wherein the specified recording information is recorded in association with the thermal image data and/or data obtained after the thermal image data is specified and processed.

12. The analytical method of claim 10, further comprising a processing method, the processing method comprising the steps of: