CN104635059A - Dynamic measuring method and dynamic measuring device for contact resistance of switch contact - Google Patents
Dynamic measuring method and dynamic measuring device for contact resistance of switch contact Download PDFInfo
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- CN104635059A CN104635059A CN201510075653.0A CN201510075653A CN104635059A CN 104635059 A CN104635059 A CN 104635059A CN 201510075653 A CN201510075653 A CN 201510075653A CN 104635059 A CN104635059 A CN 104635059A
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Abstract
The invention relates to a dynamic measuring method and a dynamic measuring device for contact resistance of a switch contact, which belongs to the field of dynamic test of a switch, and is used for solving the problems that the measuring of the contact resistance of the switch contact is difficult and a plurality of switches cannot be dynamically and continuously measured under the existing dynamic condition. A base is respectively fixedly connected with a supporting plate I through a slide lead screw, two slide guide rails and two support columns, a supporting plate II respectively sleeve the slide lead screws and the two slide guide rails, a support is fixed on the front end of the supporting plate II, the top end of the support is fixedly provided with a force sensor, a movable platform is relatively arranged on the lower end of the force sensor, the movable platform is fixed on the base, the movable platform is used for placing a detected switch resistance measuring device, a liquid crystal display device is used for displaying a contact force of the detected contact switch and a resistance value of the detected contact switch. The dynamic measuring method and the dynamic measuring device can be used for measuring the contact resistance of the switch contact.
Description
Technical field
The present invention relates to switch contact contact resistance dynamic measurement method and dynamic measurement device.Belong to switch dynamic test field.
Background technology
Day by day complicated and intelligent along with electric system, require also more and more higher to the switch performance used in system, especially the performance requirement of some crucial occasions such as Aeronautics and Astronautics to switch is higher, this just requires that switch carries out 100% detection to the contact force of its contact, contacting travel and contact resistance in process of production, and namely the dynamic property of switch detects.So switch contact is one of vitals of break-make electrical system, switch contact contact resistance is one of index weighing its performance and reliability.Measurement due to switch contact contact resistance carries out in a dynamic condition, and contact resistance is milliohm level, there is instantaneous touch resistance and catch difficulty, on the impact of measurement result comparatively obviously, this just requires that switch contact measuring contact resistance unit has response time, stronger antijamming capability, higher measuring accuracy faster for the high frequency noise that industrial environment and circuit self produce and white Gaussian noise.
The accurate measurement of faint resistance under the key problem of switch contact measuring contact resistance is dynamic condition.The contact resistance of dynamic condition refers to be pressed under certain velocity conditions by slowdown monitoring switch, the resistance value that switch contact Contact captures.Due to weak output signal, and useful signal is easily flooded by various noise in a dynamic condition, also can be subject to the impact such as temperature drift, zero point drift.Small resistance measurement method conventional at present has constant pressure source resistance measurement, constant current source resistance measurement and the resistance measurement of low-frequency ac source.Constant pressure source, constant current source resistance measurement are more typical temperature sensor resistance measurement methods, and its metering circuit principle is simple, easily realizes.The resistance measurement of low-frequency ac source applies low-frequency ac signal at temperature sensor two ends, obtains the change of low-frequency ac signal amplitude, thus obtain the resistance change of temperature sensor.The method has higher noise inhibiting ability, but hardware circuit realizes relative constant pressure source, constant current source resistance measurement two kinds of method complexity.Because contact resistance is milliohm level, the impact of circuit board leads on measurement result be can not ignore, and resistance measurement mode of connection conventional at present has two-wire system, three-wire system, four-wire system.When adopting two-wire system line, the contact resistance recorded comprises conductor resistance, and conductor resistance and contact resistance are at the same order of magnitude, so the impact of conductor resistance be can not ignore.Three-wire system effectively can eliminate the impact of connection resistance on measurement result in theory, needs to realize identical with three wire internal resistances that measured resistance connects, and namely the material of wire, wire diameter, length, working temperature are all identical, and through engineering approaches realization is more difficult.Four-wire system is a kind of mode of connection comparatively general on engineer applied, and its pumping signal and detection signal, in different loops, effectively eliminate the impact of connection resistance on measurement result.
Summary of the invention
The present invention is to solve switch contact measuring contact resistance difficulty under existing dynamic condition, can not carrying out the problem of successive dynamic measuring to multiple switch.Switch contact contact resistance dynamic measurement method and dynamic measurement device are now provided.
Switch contact contact resistance dynamic measurement method, it is realized by following steps:
Tested contact switch contact and measuring resistance are connected in resistance measurement loop, pumping signal in this loop is sinusoidal excitation signal, control tested contact switch contact at the uniform velocity closed, and in closing course the force value of this tested contact switch contact of Real-Time Monitoring, when described force value is greater than 0.1N, high-speed a/d collector is adopted to monitor the voltage signal at two ends, tested contact switch contact, when sinusoidal signal being detected, control tested contact switch contact stop motion, complete the closed of tested contact switch contact, adopt the contact resistance exchanging the tested contact switch contact of comparative method for measuring.
Switch contact contact resistance dynamic measurement device, it comprises base, mobile platform, force snesor, back up pad, No. two back up pads, lead screw, two rail plates, two pillars, support and liquid crystal display,
Described base is fixedly connected with a back up pad with two pillars respectively by lead screw, two rail plates, No. two back up pads are all nested in outside lead screw and two rail plates, support is fixed on the front end of No. two back up pads, and the top of support is fixed with force snesor
The lower end of described force snesor is relatively set with mobile platform, and described mobile platform is fixed on base, for placing tested contact switch electric resistance measuring apparatus on described mobile platform,
Described liquid crystal display for showing the resistance value of force snesor to the contact force of tested contact switch and tested contact switch,
Mobile platform comprises pedestal, iron plate, X-axis straight line slide unit base, X-axis straight line slide unit, Y-axis straight line slide unit base, Y-axis straight line slide unit, two slide unit leading screws, two slide unit guide rails, two slide unit motors and two proximity switches,
The described center at pedestal is provided with four support bars, four support bars are provided with Y-axis straight line slide unit base, in the upper and lower side of Y-axis straight line slide unit base, one through hole is set, Y-axis straight line slide unit is vertically provided with in four support bars on base, the bottom of this Y-axis straight line slide unit is provided with baffle plate, the right side of Y-axis straight line slide unit is provided with slide unit guide rail, baffle center is provided with a perforate, the top of Y-axis straight line slide unit is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and Y-axis straight line slide unit base, the inner side of slide unit motor is provided with two iron bars in the bottom of Y-axis straight line slide unit and the bottom of slide unit leading screw, the left side of two joint strips is for there being the one piece configuration of a through hole, the right side of two iron bars is fastened by bolts,
Y-axis straight line slide unit base is provided with four support bars, four support bars are provided with X-axis straight line slide unit base, in the two sides of X-axis straight line slide unit base, one through hole is set, X-axis straight line slide unit is horizontally arranged with in four support bars on base, the right-hand member of this X-axis straight line slide unit is provided with baffle plate, the left side of X-axis straight line slide unit is provided with slide unit guide rail, baffle center is provided with a perforate, the top of X-axis straight line slide unit is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and X-axis straight line slide unit base, the inner side of slide unit motor is provided with two iron bars in the bottom of X-axis straight line slide unit and the bottom of slide unit leading screw, the right side of two joint strips is for there being the one piece configuration of a through hole, two iron bars pass on left bolted,
The center that iron plate is positioned at X-axis straight line slide unit base is placed,
Tested contact switch electric resistance measuring apparatus comprises measuring resistance, tested contact switch, a high-speed a/d collector, No. two high-speed a/d collectors, transformer T1, No. two transformer T2, No. three transformer T3, voltage comparator LM1, No. two voltage comparator LM2, resistance R1, resistance R2, resistance R3 and resistance R4
One end of measuring resistance connects one end of one end of the secondary coil of a transformer T1 and the secondary coil of No. two transformer T2 simultaneously, the other end of measuring resistance connects the other end of the secondary coil of No. two transformer T2 simultaneously, connect one end of one end of tested contact switch and the secondary coil of No. three transformer T3, the other end of tested contact switch connects the other end of one end of the secondary coil of a transformer T1 and the secondary coil of No. three transformer T3 simultaneously, one end of the secondary coil of a transformer T1 is for being connected and fixed the sinusoidal signal of frequency, the other end of the primary coil of a transformer T1 connects power supply ground, one end of the primary coil of No. two transformer T2 connects power supply ground, the other end of the primary coil of No. two transformer T2 connects the in-phase input end of a voltage comparator LM1, one end of the inverting input contact resistance R1 of a voltage comparator LM1, one end of the other end of resistance R1 contact resistance R2 simultaneously, the output terminal of a voltage comparator LM1 and a high-speed a/d collector,
One end of the primary coil of No. three transformer T3 connects power supply ground, the other end of the primary coil of No. three transformer T3 connects the in-phase input end of No. two voltage comparator LM2, one end of the inverting input contact resistance R3 of No. two voltage comparator LM2, other end one end of contact resistance R4, the output terminal of No. two voltage comparator LM2 and No. two high-speed a/d collectors simultaneously of resistance R3.
Beneficial effect of the present invention is: adopt force snesor to contact tested contact switch, and when tested contact switch is pressed, contact moment, measuring circuit will have electric current and flow through, and be assumed to be I
cso sinusoidal excitation will be loaded into measuring resistance and tested switch ends, a high-speed a/d collector and No. two high-speed a/d collectors are adopted to gather measuring resistance and tested switch ends one-period signal respectively, crest voltage according to the measuring resistance collected and tested contact switch two ends key player on a team's signal calculates tested switch contact contact resistance, the method is adopted to measure tested switch contact contact resistance simple, and force snesor is used at the uniform velocity moving up and down, mobile platform also can move left and right, and conveniently carries out successive dynamic measuring to multiple switch.
Because the measurement of switch contact contact resistance is carried out in a dynamic condition, and under industrial production environment outside high frequency noise and the impact of white Gaussian noise on measurement result serious.For above problem, in conjunction with the resistance measurement method studied herein, propose to adopt harmonic analysis method to process signal.Adopt Fast Fourier Transform (FFT) (FFT) to obtain harmonic component and the noise signal feature of signal, obtain noise frequency, finally signal is reconstructed.According to Fourier transform analysis theories, as long as signal is carried out signal sampling according to the integral multiple of signal period, the frequency analysis of signal just can be realized.Suppose that signal frequency is f
a, carry out nth harmonic analysis, so the highest frequency f of signal harmonic component
mcan be represented by formula (2)
f
m＝n×f
a(2)
According to nyquist sampling theorem, as sample frequency f
swhen being greater than 2 times of highest frequency in signal, the information of the reservation original signal that the signal after sampling can be complete, i.e. f
s>2f
m.Record length N=f
s/ f
a.
Fourier transform
Suppose measured signal to be the cycle be the time-domain signal of T, be designated as x (t), this signal is carried out Fourier expansion, obtain formula (3)
Wherein, f
afor signal frequency, A
nfor the amplitude of nth harmonic,
for the starting phase angle of nth harmonic, a
0for DC component, a
nand b
nthe cosine of difference nth harmonic and sine term, can be represented by formula (4), (5), (6) respectively
Fourier transform plural form can ((7) obtain by formula
Wherein,
suppose that the sample space size of sampling to signal is N, the data sequence obtained is designated as
suppose that the cycle of signal is T, sampling time interval is △ t, i.e. T=N × △ t, and so sample frequency can be expressed as
so in spectrogram, spectral line interval can be expressed as
discrete Fourier transformation can be represented by formula (8)
X
ninverse discrete Fourier transform can be represented by formula (9)
Harmonic analysis method
The actual signal, power frequency interference signals, high-frequency interferencing signal etc. of sensor is comprised by the digital signal after A/D changes.When carrying out frequency analysis, should extract except original signal interference component, obtain interference source frequency, then adopt filtering technique by noise filtering, finally signal is reduced, obtains comparatively ideal actual value.
First N sampling is carried out to the signal of tested switch ends, discrete Fourier transformation is carried out to sampled signal, draws the amplitude A of this signal
1; Then carry out discrete Fourier transformation after N sampling being carried out to the signal in measuring resistance, obtain the amplitude A of signal in measuring resistance
2, obtain two groups of data sequences and be respectively x
n, y
n, according to formula (9) respectively to x
n, y
ncarry out Fourier transform, be designated as X
1, Y
1.Suppose X
1, Y
1real part and imaginary part be respectively X
a1, X
b1, Y
a1, Y
b1, shown in (10)
X
1＝X
a1+jX
b1
Y
1＝Y
a1+jY
b1(10)
So amplitude can be represented by formula (11)
Employing frequency is 1KHz, intensity is that the sinusoidal signal of+5V is as driving source, suppose that existence two frequencies are respectively 10KHz, 50KHz, intensity is respectively the high frequency noise of+1V ,+0.5V, and frequency is 50HZ, intensity is the Hz noise noise of+1V, and intensity is the white Gaussian noise of+1.5V.So original signal expression formula is such as formula shown in (12)
f(x)＝5sin(2π×1000t)+sin(2π×10000t)+0.5sin(2π×50000t)+1.5rand(size(t))
+sin(2π×50t)+5) (12)
Fig. 5 is for containing noisy signal, and Fig. 6 adopts harmonic analysis method to carry out to signal the amplitude versus frequency characte that spectrum analysis obtains signal.
Fundamental signal frequency f
a=1KHz, the noise highest frequency f existed in signal
m=50KHz, according to nyquist sampling theorem, sample frequency f
s>2 × 50KHz=100KHz, gets f here
s=128KHz, so sample space size N=f
s/ f
a=128000/1000=128.Fig. 7 is for containing noisy original signal waveform, and Fig. 8 is the signal waveform after adopting harmonic analysis method process.From simulation result, the method increase the antijamming capability of signal, can effectively suppress high frequency interference, Hz noise and white Gaussian noise on the impact of measuring.
Accompanying drawing explanation
Fig. 1 is the structural representation of the switch contact contact resistance dynamic measurement device described in embodiment one,
Fig. 2 is the structural representation of the mobile platform described in Fig. 1,
Fig. 3 is the measuring principle figure of the tested switch resistance measurement mechanism described in embodiment one, in figure
represent excitation line,
represent signal wire, Reference numeral 1-1 represents measuring resistance, and Reference numeral 1-2 represents tested contact switch, Reference numeral 1-5 represents tested contact switch contact, Reference numeral 1-3 represents a high-speed a/d collector, and Reference numeral 1-4 represents No. two high-speed a/d collectors
Fig. 4 is a sampling period signal waveforms,
Fig. 5 contains noisy original signal figure in adopting harmonic analysis method to process data,
Fig. 6 adopts harmonic analysis method to carry out to signal the amplitude frequency curve figure that spectrum analysis obtains signal,
Fig. 7 to be sample space N be 128 containing noisy original letter oscillogram,
Fig. 8 is sample space N is 128, adopts the signal waveforms after harmonic analysis method process,
Fig. 9 is switch schematic diagram,
Figure 10 is embodiment breaker in middle resistance measurement error map,
Figure 11 is contact resistance test curve figure in embodiment, and Reference numeral 31 represents the upper limit, and Reference numeral 32 represents lower limit, and Reference numeral 34 represents measured value, and Reference numeral 33 represents expectation value,
Figure 12 is touch test curve figure in embodiment,
Figure 13 is that in embodiment, contact forms test curve figure.
Embodiment
Embodiment one: the switch contact contact resistance dynamic measurement method described in present embodiment, it is realized by following steps:
Tested contact switch contact 1-5 and measuring resistance 1-1 is connected in resistance measurement loop, pumping signal in this loop is sinusoidal excitation signal, control tested contact switch contact at the uniform velocity closed, and in closing course the force value of this tested contact switch contact of Real-Time Monitoring, when described force value is greater than 0.1N, high-speed a/d collector is adopted to monitor the voltage signal at two ends, tested contact switch contact, when sinusoidal signal being detected, control tested contact switch contact stop motion, complete the closed of tested contact switch contact, adopt the contact resistance exchanging the tested contact switch contact of comparative method for measuring.
In present embodiment, the sinusoidal excitation of fixed frequency is applied to the loop that sample resistance is connected with temperature sensor, when being disconnected by slowdown monitoring switch, measuring resistance and tested switch ends do not have electric potential difference, and export is 0 simultaneously; When being pressed by slowdown monitoring switch, contact moment, measuring circuit will have electric current and flow through, and be assumed to be Ic, and so sinusoidal excitation will be loaded into measuring resistance and tested switch ends.
Embodiment two: illustrate present embodiment with reference to Fig. 4, the difference of present embodiment and the switch contact contact resistance dynamic measurement method described in embodiment two is, the method that employing exchanges the contact resistance of comparative method for measuring tested contact switch contact 1-5 is:
Two high-speed a/d collectors are adopted to gather terminal voltage signal in the one-period of measuring resistance and tested contact switch contact 1-5 respectively,
According to formula:
Obtain tested contact switch contact resistance R
x,
Wherein, V
1M, V
2Mbe respectively the crest voltage of measuring resistance and tested contact switch two ends sinusoidal signal, measuring resistance resistance is 100 milliohms, and precision is 0.01%, and temperature coefficient is 0.1ppm/ DEG C.
In present embodiment, start and first input by slowdown monitoring switch coordinate position before measuring, in measuring process, mobile platform will be automatically moved to by the position of slowdown monitoring switch, the Z axis that then force snesor is housed will at the uniform velocity move downwards, the output of force snesor in Real-Time Monitoring liquid crystal display in the process, when force snesor output is greater than 0.1N, force snesor touches tested switch surface, No. two height A/D collector monitoring switch contact resistance measurement loop voltages, when resistance measurement loop detects sinusoidal signal, the Z axis of force snesor stops moving down, adopt the contact resistance exchanging the tested switch contact of comparative method for measuring.High-speed a/d is adopted to gather measuring resistance and tested switch ends one-period signal, as shown in Figure 4.
Embodiment three: illustrate present embodiment referring to figs. 1 through Fig. 3, switch contact contact resistance dynamic measurement device described in present embodiment, it comprises base 4, mobile platform 3, force snesor 2, back up pad 5, No. two back up pads 6, lead screw 7, two rail plates 8, two pillars 9, support 1 and liquid crystal display
Described base 4 is fixedly connected with a back up pad 5 with two pillars respectively by lead screw, two rail plates, No. two back up pads 6 are all nested in outside lead screw and two rail plates, support is fixed on the front end of No. two back up pads 6, and the top of support is fixed with force snesor 2
The lower end of described force snesor 2 is relatively set with mobile platform 3, and described mobile platform 3 is fixed on base 4, for placing tested contact switch electric resistance measuring apparatus on described mobile platform 3,
Described liquid crystal display for showing the resistance value of force snesor 2 to the contact force of tested contact switch and tested contact switch,
Mobile platform 3 comprises pedestal, iron plate, X-axis straight line slide unit base 3-3, X-axis straight line slide unit 3-8, Y-axis straight line slide unit base 3-7, Y-axis straight line slide unit 3-6, slide unit leading screw 3-4, slide unit guide rail 3-5, slide unit motor 3-1 and proximity switch 3-2,
The described center at pedestal is provided with four support bars, four support bars are provided with Y-axis straight line slide unit base 3-7, in the upper and lower side of Y-axis straight line slide unit base 3-7, one through hole is set, Y-axis straight line slide unit 3-6 is vertically provided with in four support bars on base, the bottom of this Y-axis straight line slide unit 3-6 is provided with baffle plate, the right side of Y-axis straight line slide unit 3-6 is provided with slide unit guide rail, baffle center is provided with a perforate, the top of Y-axis straight line slide unit 3-6 is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and Y-axis straight line slide unit base 3-7, the inner side of slide unit motor is provided with two iron bars in the bottom of Y-axis straight line slide unit 3-6 and the bottom of slide unit leading screw, the left side of two joint strips is for there being the one piece configuration of a through hole, the right side of two iron bars is fastened by bolts,
Y-axis straight line slide unit base 3-7 is provided with four support bars, four support bars are provided with X-axis straight line slide unit base 3-3, in the two sides of X-axis straight line slide unit base 3-3, one through hole is set, X-axis straight line slide unit 3-8 is horizontally arranged with in four support bars on base, the right-hand member of this X-axis straight line slide unit 3-8 is provided with baffle plate, the left side of X-axis straight line slide unit 3-8 is provided with slide unit guide rail, baffle center is provided with a perforate, the top of X-axis straight line slide unit 3-8 is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and X-axis straight line slide unit 3-8 base 3-7, the inner side of slide unit motor is provided with two iron bars in the bottom of X-axis straight line slide unit 3-8 and the bottom of slide unit leading screw, the right side of two joint strips is for there being the one piece configuration of a through hole, two iron bars pass on left bolted,
The center that iron plate is positioned at X-axis straight line slide unit base 3-3 is placed,
Tested contact switch electric resistance measuring apparatus comprises measuring resistance 1-1, tested contact switch 1-2, high-speed a/d collector 1-3, No. two high-speed a/d collector 1-4, transformer T1, No. two transformer T2, No. three transformer T3, voltage comparator LM1, No. two voltage comparator LM2, resistance R1, resistance R2, resistance R3 and resistance R4
One end of measuring resistance 1-1 connects one end of one end of the secondary coil of a transformer T1 and the secondary coil of No. two transformer T2 simultaneously, the other end of measuring resistance 1-1 connects the other end of the secondary coil of No. two transformer T2 simultaneously, connect one end of one end of tested contact switch 1-2 and the secondary coil of No. three transformer T3, the other end of tested contact switch 1-2 connects the other end of one end of the secondary coil of a transformer T1 and the secondary coil of No. three transformer T3 simultaneously, one end of the secondary coil of a transformer T1 is for being connected and fixed the sinusoidal signal of frequency, the other end of the primary coil of a transformer T1 connects power supply ground, one end of the primary coil of No. two transformer T2 connects power supply ground, the other end of the primary coil of No. two transformer T2 connects the in-phase input end of a voltage comparator LM1, one end of the inverting input contact resistance R1 of a voltage comparator LM1, one end of the other end of resistance R1 contact resistance R2 simultaneously, the output terminal of a voltage comparator LM1 and a high-speed a/d collector 1-3,
One end of the primary coil of No. three transformer T3 connects power supply ground, the other end of the primary coil of No. three transformer T3 connects the in-phase input end of No. two voltage comparator LM2, one end of the inverting input contact resistance R3 of No. two voltage comparator LM2, other end one end of contact resistance R4, the output terminal of No. two voltage comparator LM2 and No. two high-speed a/d collector 1-4 simultaneously of resistance R3.
Switch dynamic characteristics measuring instrument designs
Switch contact contact resistance is when being pressed by slowdown monitoring switch, when contact is communicated with instantaneous measurement, also needs in the process to record its contact force and contacting travel.Contact force F be switch under force, switch upper and lower contact is progressively close, the power of the required applying when upper and lower contact is communicated with.Contacting travel S is the distance of switch contact upper surface and contact lower surface in its natural state.Fig. 9 is switch schematic diagram.
Embodiment:
The main measurement index of switch dynamic characteristics measuring instrument is as shown in table 1.
The main measurement index of table 1 switch dynamic characteristics measuring instrument
Contact resistance kinetic measurement is tested
Analysis of measurement errors
According to selecting test point principle and sample space size selection principle, have chosen 14 test points in range ability, be respectively 10m Ω, 20m Ω, 40m Ω, 60m Ω, 80m Ω, 100m Ω, 200m Ω, 400m Ω, 600m Ω, 800m Ω, 1 Ω, 10 Ω, 30 Ω, 50 Ω, its precision is 0.01%, temperature coefficient is that the measuring resistance of 0.1ppm/ DEG C carries out static experiment as measured resistance, thus obtains the measuring error of system.Table 2 is test result.
Table 2 resistance measurement error
Figure 10 is measuring error distribution.
From test result, when measured resistance is less than 400m Ω, system resistance measuring error is about 0.1m Ω, and when measured resistance is greater than 400m Ω, system resistance measuring error increases gradually, when measured resistance is 5 Ω, occurs maximum error of measuring, is 9.8m Ω.
The kinetic measurement of contact resistance is tested
Random selecting Bombadier Inc entrusts 110, certain model switch produced, and switch dynamic characteristics measuring instrument is tested, and experiment content comprises contact resistance, contact force, the contacting travel of detector switch simultaneously.Experimental result as shown in Figure 11 to Figure 13.Thick straight line represents the qualified upper limit, and thin straight line represents qualified lower limit, and dotted line represents expectation value.Known from contact resistance test experiments result, 110 switches chosen exceed the upper limit except No. 34 measured values, and reach 51.9m Ω, rest switch is all in allowed band, for this kind of tested model switch, as long as switch contact contact resistance just meets requirement of dispatching from the factory at 47 ± 3m Ω.Known from contact force test experiments result, measure switch contact forces beyond the upper limit for No. 34, its contact force is 8.8N, and test result shows that No. 34 switches exist assembling defect, and be defective switch, all the other 109 switch contact forces are all in allowed band.Known from contacting travel test experiments result, 110 the switch contacting travels chosen are all in allowed band.
Known from above-mentioned experimental result, although only have the discontented foot of 1 switch to produce requirement, but all there is obvious fluctuation with its contact resistance of a collection of switch, contact force, contacting travel, this is because switch contact causes because material, technique etc. exist certain difference in process of production.
Claims (3)
1. switch contact contact resistance dynamic measurement method, is characterized in that, it is realized by following steps:
Tested contact switch contact (1-5) and measuring resistance (1-1) are connected in resistance measurement loop, pumping signal in this loop is sinusoidal excitation signal, control tested contact switch contact at the uniform velocity closed, and in closing course the force value of this tested contact switch contact of Real-Time Monitoring, when described force value is greater than 0.1N, high-speed a/d collector is adopted to monitor the voltage signal at two ends, tested contact switch contact, when sinusoidal signal being detected, control tested contact switch contact stop motion, complete the closed of tested contact switch contact, adopt the contact resistance exchanging the tested contact switch contact of comparative method for measuring.
2. switch contact contact resistance dynamic measurement method according to claim 1, is characterized in that, the described method of the contact resistance exchanging the tested contact switch contact (1-5) of comparative method for measuring that adopts is:
Two high-speed a/d collectors are adopted to gather terminal voltage signal in the one-period of measuring resistance and tested contact switch contact (1-5) respectively,
According to formula:
Obtain tested contact switch contact resistance R
x,
Wherein, V
1M, V
2Mbe respectively the crest voltage of measuring resistance and tested contact switch two ends sinusoidal signal, measuring resistance resistance is 100 milliohms, and precision is 0.01%, and temperature coefficient is 0.1ppm/ DEG C.
3. switch contact contact resistance dynamic measurement device, it is characterized in that, it comprises base (4), mobile platform (3), force snesor (2), back up pad (5), No. two back up pads (6), lead screw (7), two rail plates (8), two pillars (9), support (1) and liquid crystal display
Described base (4) is fixedly connected with a back up pad (5) with two pillars respectively by lead screw, two rail plates, No. two back up pads (6) are all nested in outside lead screw and two rail plates, support is fixed on the front end of No. two back up pads (6), the top of support is fixed with force snesor (2)
The lower end of described force snesor (2) is relatively set with mobile platform (3), described mobile platform (3) is fixed on base (4), for placing tested contact switch electric resistance measuring apparatus on described mobile platform (3)
Described liquid crystal display for showing the resistance value of force snesor (2) to the contact force of tested contact switch and tested contact switch,
Mobile platform (3) comprises pedestal, iron plate, X-axis straight line slide unit base (3-3), X-axis straight line slide unit (3-8), Y-axis straight line slide unit base (3-7), Y-axis straight line slide unit (3-6), two slide unit leading screws (3-4), two slide unit guide rails (3-5), two slide unit motors (3-1) and two proximity switches (3-2)
The described center at pedestal is provided with four support bars, four support bars are provided with Y-axis straight line slide unit base (3-7), in the upper and lower side of Y-axis straight line slide unit base (3-7), a through hole is set, Y-axis straight line slide unit (3-6) is vertically provided with in four support bars on base, the bottom of this Y-axis straight line slide unit (3-6) is provided with baffle plate, the right side of Y-axis straight line slide unit (3-6) is provided with slide unit guide rail, baffle center is provided with a perforate, the top of Y-axis straight line slide unit (3-6) is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and Y-axis straight line slide unit base (3-7), the inner side of slide unit motor is provided with two iron bars in the bottom of Y-axis straight line slide unit (3-6) and the bottom of slide unit leading screw, the left side of two joint strips is for there being the one piece configuration of a through hole, the right side of two iron bars is fastened by bolts,
Y-axis straight line slide unit base (3-7) is provided with four support bars, four support bars are provided with X-axis straight line slide unit base (3-3), in the two sides of X-axis straight line slide unit base (3-3), a through hole is set, X-axis straight line slide unit (3-8) is horizontally arranged with in four support bars on base, the right-hand member of this X-axis straight line slide unit (3-8) is provided with baffle plate, the left side of X-axis straight line slide unit (3-8) is provided with slide unit guide rail, baffle center is provided with a perforate, the top of X-axis straight line slide unit (3-8) is provided with slide unit motor, motor center is provided with a perforate, slide unit leading screw is connected in the perforate of slide unit motor by the through hole of the perforate on baffle plate and X-axis straight line slide unit (3-8) base (3-7), the inner side of slide unit motor is provided with two iron bars in the bottom of X-axis straight line slide unit (3-8) and the bottom of slide unit leading screw, the right side of two joint strips is for there being the one piece configuration of a through hole, two iron bars pass on left bolted,
The center that iron plate is positioned at X-axis straight line slide unit base (3-3) is placed,
Tested contact switch electric resistance measuring apparatus comprises measuring resistance (1-1), tested contact switch (1-2), a high-speed a/d collector (1-3), No. two high-speed a/d collectors (1-4), transformer T1, No. two transformer T2, No. three transformer T3, voltage comparator LM1, No. two voltage comparator LM2, resistance R1, resistance R2, resistance R3 and resistance R4
One end of measuring resistance (1-1) connects one end of one end of the secondary coil of a transformer T1 and the secondary coil of No. two transformer T2 simultaneously, the other end of measuring resistance (1-1) connects the other end of the secondary coil of No. two transformer T2 simultaneously, connect one end of one end of tested contact switch (1-2) and the secondary coil of No. three transformer T3, the other end of tested contact switch (1-2) connects the other end of one end of the secondary coil of a transformer T1 and the secondary coil of No. three transformer T3 simultaneously, one end of the secondary coil of a transformer T1 is for being connected and fixed the sinusoidal signal of frequency, the other end of the primary coil of a transformer T1 connects power supply ground, one end of the primary coil of No. two transformer T2 connects power supply ground, the other end of the primary coil of No. two transformer T2 connects the in-phase input end of a voltage comparator LM1, one end of the inverting input contact resistance R1 of a voltage comparator LM1, one end of the other end of resistance R1 contact resistance R2 simultaneously, the output terminal of a voltage comparator LM1 and a high-speed a/d collector (1-3),
One end of the primary coil of No. three transformer T3 connects power supply ground, the other end of the primary coil of No. three transformer T3 connects the in-phase input end of No. two voltage comparator LM2, one end of the inverting input contact resistance R3 of No. two voltage comparator LM2, other end one end of contact resistance R4, the output terminal of No. two voltage comparator LM2 and No. two high-speed a/d collectors (1-4) simultaneously of resistance R3.
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| CN110058082A (en) * | 2019-05-17 | 2019-07-26 | 田楚兵 | A kind of novel resistor detection method and resistor detecting device |
| CN110455514A (en) * | 2019-08-20 | 2019-11-15 | 田楚兵 | A kind of power and resistance curve method for comprehensive detection and tester |
| CN110514901A (en) * | 2019-09-03 | 2019-11-29 | 福达合金材料股份有限公司 | Welded type electrical contact member contact resistance device for quick testing and its test method |
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