CN104634448A - Pulse light attenuation testing circuit and testing method thereof as well as device provided with pulse light attenuation testing circuit - Google Patents
Pulse light attenuation testing circuit and testing method thereof as well as device provided with pulse light attenuation testing circuit Download PDFInfo
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Abstract
The invention discloses a pulse light attenuation testing circuit and a testing method thereof as well as a device provided with the pulse light attenuation testing circuit. The pulse light attenuation testing circuit comprises a photovoltaic conversion module, a current-to-voltage module and a power supply module, and further comprises a voltage amplification module, a central processing unit, a display module and a pulse threshold value comparing module, wherein the photovoltaic conversion module, the current-to-voltage module, the voltage amplification module, the central processing unit and the display module are electrically connected in sequence; the power supply module is electrically connected with the current-to-voltage module, the voltage amplification module, the pulse threshold value comparing module and the central processing unit respectively; the voltage amplification module, the pulse threshold value comparing module and the central processing unit are electrically connected in sequence. The pulse light attenuation testing circuit has the advantages that an energy state of an ultrasonic light source for sterilizing can be directly observed, so that the time for preparing to replace a light source is sufficient.
Description
Technical field
The present invention relates to pulsed light attenuation test circuit and method of testing thereof and be provided with the device of pulsed light attenuation test circuit.
Background technology
Pulsed light technology is that one can in very short time (tens of to hundreds of microsecond), high-energy is discharged with optical radiation form, produce very high peak power thus and (reach as high as MW class, 100,000 times of sunlight intensity arriving bottom surface) luminous energy, pulsed light sterilization method treatment is exactly utilize high-octane ultraviolet in pulsed light to carry out sterilization to the mode that microorganism damages, and is a kind of green, energy-conservation, efficient method for disinfection.
Light source in pulsed light sterilization method treatment device is under needing to be operated in blink states, and its operating voltage is generally between a few hectovolt to several ten thousand volts, generally xenon lamp can be adopted, even if but adopt xenon lamp, this light source ratio is easier to aging or damages, and under normal operating condition, the life-span was at about three months, if and light source ages or damage can cause the remitted its fury of light, thus affect bactericidal effect; Therefore, be badly in need of a kind of pulsed light attenuation test circuit can measuring the intensity of this light-pulse generator light at present, when the intensity of light is lower, then report to the police, light source is changed in prompting.
For the defect problem that above-mentioned situation exists, applicant on November 11st, 2013 submit applications application number be the patent application document of 201310556273. X, can be lower in the intensity when light (ultraviolet light for sterilization), start alert program, light source (ultraviolet source for sterilization) is changed in time in order to point out, the defect that such situation also exists is, the energy state of the ultraviolet source for sterilization can not be observed out intuitively, can only waiting system start report to the police after, we just have recognized the need to the operation carrying out the ultraviolet source changed for sterilization, not relevant equipment can the moment, show the intensity of ultraviolet light intuitively, obvious man-computer relation does not also arrive optimal state, also do not accomplish to allow people can view the intensity of the ultraviolet light for sterilization intuitively, there to be the sufficient time to carry out changing the preparation of light source.
Secondly, applicant on November 11st, 2013 submit applications application number be the patent application document of 201310556273. X, disclosed pulsed light attenuation test circuit, this circuit detect for be the intensity of full wave ultraviolet light, but in essence not full wave ultraviolet light all there is bactericidal effect.
Secondly, the pick-up unit of pulsed light attenuation test circuit has been installed, photosensitive body (being provided with the position of photoelectric conversion module) is communicated with the pipe of the hollow made by hard material between pick-up unit, so one, we are inconvenient to the position at the position adjusted for being provided with photoelectric conversion module, be unfavorable for the seizure for ultraviolet light, so one, there will be the ultraviolet ray intensity (energy value) that we detect to there are differences with in esse ultraviolet ray intensity, cause obtaining prohibited data detection true, occur that the intensity of ultraviolet light in fact can meet bactericidal effect, result we due to detect corrupt data, just the operation changing light source has been carried out, cause unnecessary waste.
Summary of the invention
The technical problem to be solved in the present invention is, provides a kind of energy state observing out the ultraviolet source for sterilization intuitively, there to be the sufficient time to carry out the pulsed light attenuation test circuit of the preparation changing light source.
For solving the problems of the technologies described above, technical scheme provided by the invention is: a kind of pulsed light attenuation test circuit, and it comprises photoelectric conversion module, electric current turns voltage module and power module; It comprises voltage amplification module, central processing unit, display module and pulse threshold values comparison module; Described photoelectric conversion module, electric current turn voltage module, voltage amplification module, central processing unit and display module and are electrically connected successively; Described power module turns voltage module, voltage amplification module, pulse threshold values comparison module and central processing unit respectively and is electrically connected with electric current; Described voltage amplification module, pulse threshold values comparison module and central processing unit are electrically connected successively.
As improvement, described central processing unit is dsp chip.
As improvement, described pulse threshold values comparison module comprises operational amplifier, resistance R1, resistance R2, resistance R3, electric capacity C1, reference voltage AVDD1 and reference voltage AVDD2; The normal phase input end of described operational amplifier is electrically connected with the output terminal of voltage amplification module; Described reference voltage AVDD1 is electrically connected with one end of resistance R1, and the other end of resistance R1 is electrically connected with the inverting input of operational amplifier and one end of resistance R2 respectively, the other end ground connection of resistance R2; Described reference power supply AVDD2 is used for powering to operational amplifier and the positive output end of reference power supply AVDD2 is electrically connected with direct earth capacitance C1; The output terminal of described operational amplifier is electrically connected with one end of resistance R3, and the other end of resistance R3 is electrically connected with central processing unit input end.
As improvement, the Voltage Feedback operational amplifier of described operational amplifier is model to be OPA835 or model be OPA2835.
Another technical matters that the present invention will solve is, provides a kind of energy state observing out the ultraviolet source for sterilization intuitively, there to be the sufficient time to carry out the pulsed light decay testing method of the preparation changing light source.
For solving the problems of the technologies described above, technical scheme provided by the invention is: a kind of method of testing of pulsed light attenuator circuit, and it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage amplification module;
(3) electric current is turned the voltage signal that voltage module passes over and carries out amplification in direct ratio by, voltage amplification module;
(4), by the irregular pulse voltage signal of voltage amplification module amplification, send to pulse threshold values comparison module and central processing unit respectively, when this voltage signal values is greater than the value preset in pulse threshold values comparison module time, pulse threshold values comparison module sends start trigger signal central processing unit, and the irregular pulse voltage signal values that central processing unit carries out being greater than the value preset in pulse threshold values comparison module carries out the operation of multiple spot integral and calculating;
(5), central processing unit sends to display module after proportionally being reduced by the signal value completing integral and calculating operation.
Another technical matters that the present invention will solve is, provides a kind of convenient detection position of adjustment for detecting ultraviolet light, in order to realize exactly to the device being provided with pulsed light attenuation test circuit of the seizure of ultraviolet light.
For solving the problems of the technologies described above, technical scheme provided by the invention is: a kind of device being provided with pulsed light attenuation test circuit, and it comprises device body and the housing for installing photoelectric conversion module; Be provided with electric current in described device body and turn voltage module, voltage amplification module, central processing unit, display module, pulse threshold values comparison module and power module; Described housing and the USB data line be provided with between device body for being communicated with both.
As improvement, described USB data line is arranged with bent connecting link.
As improvement, it also comprises 254nm narrow band pass filter; The cavity for installing photoelectric conversion module is provided with in described housing; The outer wall of described housing offers the opening for inlaying 254nm narrow band pass filter, the outer rim of described 254nm narrow band pass filter and the inwall of opening are fitted.
As improvement, described housing entirety adopts metal material or alloy material to make.
As improvement, described housing entirety adopts the thermoplastic plastic rubber of polycarbonate and polyacrylonitrile alloy to make.
Compared with prior art, technique effect of the present invention is: photoelectric conversion module is equivalent to the collection completing paired pulses light, amplify through voltage amplification module, the present invention arranges pulse threshold values comparison module, by pulse threshold values comparison module, voltage signal is compared, when the voltage signal values sent by voltage amplification module is greater than the value that we preset time, pulse threshold values comparison module sends start trigger signal central processing unit, and central processing unit carries out carrying out the operation of multiple spot integral and calculating to being greater than the voltage signal values that we preset; The signal completing integral and calculating operation is sent to display module by central processing unit after reducing.By display module, we can observe out the energy state of the ultraviolet source for sterilization, namely view the intensity of the ultraviolet source for sterilization very intuitively, there to be the sufficient time to carry out changing the preparation of light source.
Secondly, our device being provided with pulsed light attenuation test circuit.Described housing be provided with between device body for being communicated with both USB data line.The convenient adjustment for the position of the housing be provided with for installing photoelectric conversion module, particularly when USB data line is arranged with bent connecting link 3 time, under the prerequisite not by external support support, reality we the housing be provided with for installing photoelectric conversion module carried out to the operation of shift position, to find a comparatively reasonably position, realize exactly to the seizure of ultraviolet light.
More also it is pointed out that by arranging 254nm narrow band pass filter; The cavity for installing photoelectric conversion module is provided with in described housing; The outer wall of described housing offers the opening of the narrow band pass filter for inlaying 254nm, the outer rim of described 254nm narrow band pass filter and the inwall of opening are fitted; So one carrys out ultraviolet light is merely able to enter from opening, namely enter into the light of photoelectric conversion module, have passed through the filtering of the narrow band pass filter of 254nm, we only catch wavelength is the ultraviolet light of about 254nm, the light avoiding its all band directly enters into photoelectric conversion module, first be ensure that the intensity finally recording ultraviolet light most accurately can represent the sterilization effect of ultraviolet light, avoid the light of its all band to cause interference to final test data, avoid occurring false judgment.Secondly we are by filtering the ultraviolet light of its all band, can reduce the work load of the modules circuit in device body unintentionally, extend the serviceable life of modules circuit, finally ensure that the device serviceable life being provided with this circuit.
Last point it is to be noted, in order to prevent the ultraviolet light of its all band, penetrating housing, entering into the cavity of housing, we adopt metal material or alloy material to make housing, or adopt the thermoplastic plastic rubber of polycarbonate and polyacrylonitrile alloy to make housing.
Accompanying drawing explanation
Fig. 1 is electrical block diagram of the present invention.
Fig. 2 is the structural representation after device body of the present invention and housing break.
Fig. 3 is the electrical block diagram of pulse threshold values comparison module of the present invention and voltage amplification module and central processing unit entirety.
Fig. 4 is one-piece construction schematic diagram of the present invention.
Shown in figure: 1, device body, 101, display screen, 102, switch, 103, charging inlet, 104, public wire terminal, 2, housing, 201, opening, 3, bent connecting link, 301, busbar joint, 302, groove, 4,254nm narrow band filter slice.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail.
Shown in accompanying drawing 1 and accompanying drawing 3, pulsed light attenuation test circuit of the present invention, it comprises photoelectric conversion module, electric current turns voltage module and power module; It comprises voltage amplification module, central processing unit, display module and pulse threshold values comparison module; Described photoelectric conversion module, electric current turn voltage module, voltage amplification module, central processing unit and display module and are electrically connected successively; Described power module turns voltage module, voltage amplification module, pulse threshold values comparison module and central processing unit respectively and is electrically connected with electric current; Described voltage amplification module, pulse threshold values comparison module and central processing unit are electrically connected successively.Described central processing unit is dsp chip.Described pulse threshold values comparison module comprises operational amplifier, resistance R1, resistance R2, resistance R3, electric capacity C1, reference voltage AVDD1 and reference voltage AVDD2; The Voltage Feedback operational amplifier of described operational amplifier is model to be OPA835 or model be OPA2835; Reference voltage AVDD1 and reference voltage AVDD2 adopts 3.3V constant voltage; The normal phase input end of described operational amplifier is electrically connected with the output terminal of voltage amplification module; Described reference voltage AVDD1 is electrically connected with one end of resistance R1, and the other end of resistance R1 is electrically connected with the inverting input of operational amplifier and one end of resistance R2 respectively, the other end ground connection of resistance R2; Described reference power supply AVDD2 is used for powering to operational amplifier and the positive output end of reference power supply AVDD2 is electrically connected with direct earth capacitance C1; The output terminal of described operational amplifier is electrically connected with one end of resistance R3, and the other end of resistance R3 is electrically connected with central processing unit input end.
Pulsed light decay testing method of the present invention, it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage amplification module;
(3) electric current is turned the voltage signal that voltage module passes over and carries out amplification in direct ratio by, voltage amplification module;
(4), by the irregular pulse voltage signal of voltage amplification module amplification, send to pulse threshold values comparison module and central processing unit respectively, when this voltage signal values is greater than the value preset in pulse threshold values comparison module time, pulse threshold values comparison module sends start trigger signal central processing unit, and the irregular pulse voltage signal values that central processing unit carries out being greater than the value preset in pulse threshold values comparison module carries out the operation of multiple spot integral and calculating;
(5), central processing unit sends to display module after proportionally being reduced by the signal value completing integral and calculating operation.
In actual applications, central processing unit needs the magnitude of voltage completed irregular pulse is washed off in a hundreds of microsecond to carry out multiple spot integration operation, finally obtain the energy value (intensity) of each pulsed light, and value is exported, be presented on display module, central processing unit needs to adopt dsp chip, and not simple single-chip microcomputer just can realize, secondly the core of pulse threshold values comparison module is voltage comparator circuit module, but we are by the model of setting operational amplifier the Voltage Feedback operational amplifier of OPA2835 (to choose model be OPA835 or model be), the size of resistance R1, the size of resistance R2, the size of resistance R3, the size of electric capacity C1, the size of reference voltage AVDD1 and the size of reference voltage AVDD2, the size of resistance R1 we choose 0.6-2M ohm, the size of resistance R2 we choose 100-150K ohm, the size of resistance R3 we choose 80-150 ohm, the size of electric capacity C1 we choose 0.1 μ about F.
Shown in accompanying drawing 2, the present invention is provided with the device of pulsed light attenuation test circuit, it comprises device body 1,254nm narrow band pass filter 4 and the housing 2 for installing photoelectric conversion module, is provided with electric current and turns voltage module, voltage amplification module, central processing unit, display module, pulse threshold values comparison module and power module in described device body 1; The cavity for installing photoelectric conversion module is provided with in described housing 2; Described housing 2 and the USB data line 5 be provided with between device body 1 for being communicated with both, described USB data line 5 is arranged with bent connecting link 3, in practical operation, this bent connecting link 3 is right cylinder, its outside surface is provided with groove 302 to sequence interval, make connecting link 3 bendable be converted into different curvature, in order to find a comparatively reasonably position, realize exactly to the seizure of ultraviolet light.
Ultraviolet sterilization is exactly by ultraviolet irradiation, destroys and change the DNA(DNA (deoxyribonucleic acid) of microorganism) structure, make bacterium dead or irreproducible offspring at once, reach the object of sterilization.What really have bactericidal action is UVC ultraviolet, because C-band ultraviolet is very easily absorbed by the DNA of biosome, especially best with the ultraviolet of wavelength about 253.7nm.Therefore in actual applications, best situation, we are the intensity (energy value) of the ultraviolet (light source for sterilization) wanting determined wavelength about 253.7nm, could judge whether our external world also possesses stronger sterilizing function for the light source (ultraviolet) of sterilization exactly, in view of the above circumstances, we have employed wavelength is 254nm narrow band filter slice 4, wavelength is only allowed to be the filter plate that the ultraviolet light of about 254nm passes through exactly, the object of so enforcement prevents the ultraviolet light of other wavelength from entering into housing 2, the light wave reducing other wavelength is photoelectrically converted the probability that module captures, avoid the burden of the modules circuit caused in our device body 1, avoid the serviceable life of reducing modules circuit in device body 1, in order to prevent the ultraviolet light of its all band, penetrate housing, enter into the cavity of housing, we also improve, the outer wall of housing 2 offers the opening 201 for inlaying 254nm narrow band pass filter 4, the outer rim of 254nm narrow band pass filter 4 and the inwall of opening 202 are fitted, achieve 254nm narrow band pass filter better to coordinate with housing 2, we have employed metal material in addition or housing 2 made by alloy material, or we can also select to adopt the thermoplastic plastic rubber of polycarbonate and polyacrylonitrile alloy to make housing 2.
Be provided with the device of pulsed light attenuation test circuit in the process implementing test, as shown in Figure 2, the public wire terminal 301 of bent connecting link 3 is needed to be connected with the busbar joint 104 on device body 1, by displaying in figure 4 being set in USB data line 5() on bent connecting link 3 adjust, make housing 2 be in one and be beneficial to the position capturing ultraviolet light, then the starting switch 102 on starter gear body 1, the side of device body 1 is also provided with charging inlet 101, conveniently carries out charging operations.
Finally, from reduction installation cost angle, we only use only two laser-emitting diodes, two laser-emitting diodes be connected with display module are located on our outside surface of device body 1, i.e. display screen 101, by pulsed light decay testing method, records energy value (after scaled) and is presented on two laser-emitting diodes, be convenient to the energy state that we intuitively can arrive the ultraviolet source for sterilization, there to be the sufficient time to carry out changing the preparation of light source.
Claims (10)
1. a pulsed light attenuation test circuit, it comprises photoelectric conversion module, electric current turns voltage module and power module; It is characterized in that: it comprises voltage amplification module, central processing unit, display module and pulse threshold values comparison module; Described photoelectric conversion module, electric current turn voltage module, voltage amplification module, central processing unit and display module and are electrically connected successively; Described power module turns voltage module, voltage amplification module, pulse threshold values comparison module and central processing unit respectively and is electrically connected with electric current; Described voltage amplification module, pulse threshold values comparison module and central processing unit are electrically connected successively.
2. pulsed light attenuation test circuit according to claim 1, is characterized in that: described central processing unit is dsp chip.
3. pulsed light attenuation test circuit according to claim 1, is characterized in that: described pulse threshold values comparison module comprises operational amplifier, resistance R1, resistance R2, resistance R3, electric capacity C1, reference voltage AVDD1 and reference voltage AVDD2; The normal phase input end of described operational amplifier is electrically connected with the output terminal of voltage amplification module; Described reference voltage AVDD1 is electrically connected with one end of resistance R1, and the other end of resistance R1 is electrically connected with the inverting input of operational amplifier and one end of resistance R2 respectively, the other end ground connection of resistance R2; Described reference power supply AVDD2 is used for powering to operational amplifier and the positive output end of reference power supply AVDD2 is electrically connected with direct earth capacitance C1; The output terminal of described operational amplifier is electrically connected with one end of resistance R3, and the other end of resistance R3 is electrically connected with central processing unit input end.
4. pulsed light attenuation test circuit according to claim 3, is characterized in that: the Voltage Feedback operational amplifier of described operational amplifier is model to be OPA835 or model be OPA2835.
5. the method for testing for detecting ultraviolet ray intensity of pulsed light attenuator circuit according to claim 1, is characterized in that: it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage amplification module;
(3) electric current is turned the voltage signal that voltage module passes over and carries out amplification in direct ratio by, voltage amplification module;
(4), by the irregular pulse voltage signal of voltage amplification module amplification, send to pulse threshold values comparison module and central processing unit respectively, when this voltage signal values is greater than the value preset in pulse threshold values comparison module time, pulse threshold values comparison module sends start trigger signal central processing unit, and the irregular pulse voltage signal values that central processing unit carries out being greater than the value preset in pulse threshold values comparison module carries out the operation of multiple spot integral and calculating;
(5), central processing unit sends to display module after proportionally being reduced by the signal value completing integral and calculating operation.
6. be provided with a device for pulsed light attenuation test circuit according to claim 1, it is characterized in that: it comprises device body (1) and the housing (2) for installing photoelectric conversion module; Be provided with electric current in described device body (1) and turn voltage module, voltage amplification module, central processing unit, display module, pulse threshold values comparison module and power module; Described housing (2) and the USB data line (5) be provided with between device body (1) for being communicated with both.
7. the device being provided with pulsed light attenuation test circuit according to claim 6, is characterized in that: described USB data line (5) is arranged with bent connecting link (3).
8. the device being provided with pulsed light attenuation test circuit according to claim 6, is characterized in that: it also comprises 254nm narrow band pass filter (4); The cavity for installing photoelectric conversion module is provided with in described housing (2); The outer wall of described housing (2) offers the opening (202) for inlaying 254nm narrow band pass filter (4); The outer rim of described 254nm narrow band pass filter (4) and the inwall of opening (202) are fitted.
9. the device being provided with pulsed light attenuation test circuit according to claim 8, is characterized in that: described housing (2) entirety adopts metal material or alloy material to make.
10. the device being provided with pulsed light attenuation test circuit according to claim 8, is characterized in that: described housing (2) entirety adopts the thermoplastic plastic rubber of polycarbonate and polyacrylonitrile alloy to make.
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| CN201510006083.XA CN104634448B (en) | 2015-01-06 | 2015-01-06 | Pulse light attenuation testing circuit and testing method thereof as well as device provided with pulse light attenuation testing circuit |
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| CN201510006083.XA CN104634448B (en) | 2015-01-06 | 2015-01-06 | Pulse light attenuation testing circuit and testing method thereof as well as device provided with pulse light attenuation testing circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106289514A (en) * | 2016-07-25 | 2017-01-04 | 四川新健康成生物股份有限公司 | Multi-wavelength beam light-intensity test method, photoelectric switching circuit and biochemistry analyzer |
| CN106289516A (en) * | 2016-08-29 | 2017-01-04 | 烽火通信科技股份有限公司 | The control method of a kind of optical module received optical power detection and device thereof |
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