CN103575387B - Pulsed light attenuation test method - Google Patents
Pulsed light attenuation test method Download PDFInfo
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- CN103575387B CN103575387B CN201310556273.XA CN201310556273A CN103575387B CN 103575387 B CN103575387 B CN 103575387B CN 201310556273 A CN201310556273 A CN 201310556273A CN 103575387 B CN103575387 B CN 103575387B
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Abstract
The invention provides a pulsed light attenuation test circuit and method capable of testing the pulsed light intensity. After the pulse width amplification is carried out on a millisecond pulse width signal output by a voltage comparing module, the millisecond pulse width signal is detected through a processing output module, and whether the intensity of the pulsed light reaches the set value or not can be accurately detected; wherein if not, an alarm is given, a user is reminded to replace a light source, and the circuit is very easy to achieve.
Description
Technical field
The present invention relates to sterilization technology field, is specifically a kind of pulsed light attenuation test circuit for pulsed light sterilization method treatment device and method of testing.
Background technology
Pulsed light technology is that one can in very short time (tens of to hundreds of microsecond), high-energy is discharged with optical radiation form, produce very high peak power thus and (reach as high as MW class, 100,000 times of sunlight intensity arriving bottom surface) luminous energy, pulsed light sterilization method treatment is exactly utilize high-octane ultraviolet in pulsed light to carry out sterilization to the mode that microorganism damages, and is a kind of green, energy-conservation, efficient method for disinfection.
Light source in pulsed light sterilization method treatment device is under needing to be operated in blink states, and its operating voltage is generally between 2800V-3600V, generally xenon lamp can be adopted, even if but adopt xenon lamp, this light source also than be easier to aging or damage, and under normal operating condition, life-span was at about three months, if and light source ages or damage can cause the remitted its fury of light, thus affect bactericidal effect, therefore, a kind of pulsed light attenuation test circuit can measuring the intensity of this light-pulse generator light of current urgent need, when the intensity of light is lower, then report to the police, light source is changed in prompting.Optical attenuation test circuit of the prior art is generally the intensity surveying continuous light, as we are used for the light source etc. that throws light on, also do not have a kind of can the pulsed light attenuation test circuit of test pulse light intensity and method of testing.
Summary of the invention
A technical matters to be solved by this invention overcomes the defect of prior art, provide a kind of can the pulsed light attenuation test circuit of test pulse light intensity.
For solving the problems of the technologies described above, the present invention proposes a kind of pulsed light attenuation test circuit, it comprises photoelectric conversion module, electric current turns voltage module, voltage comparison module, pulsewidth amplification module, process output module, detection trigger module and power module, described photoelectric conversion module, electric current turns voltage module, voltage comparison module, pulsewidth amplification module and process output module connect successively, described power module turns voltage module with electric current respectively, voltage comparison module, pulsewidth amplification module and process output module connect, described detection trigger module is connected with process output module.
After adopting said apparatus, the present invention can detect whether the intensity of pulsed light reaches setting value, if below standard, then reports to the police exactly, prompting changing light source, and circuit realiration is very simple.
Described pulsewidth amplification module and process output module all adopt single-chip microcomputer, and such pulsewidth is amplified more flexible, and controllability is good, and single-chip microcomputer coordinates with single-chip microcomputer, stable performance, controls simple and convenient.
Another technical matters that the present invention will solve there is provided a kind of can the pulsed light decay testing method of test pulse light intensity.
For solving the problems of the technologies described above, the present invention also proposes a kind of pulsed light decay testing method, and it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage comparison module;
(3), voltage comparison module with by voltage signal compared with setting voltage, if higher than setting voltage, then export high level to pulsewidth amplification module, if lower than setting voltage, then output low level is to pulsewidth amplification module;
(4) signal that, pulsewidth amplification module obtains from voltage comparison module carries out pulsewidth amplification, if the pulsewidth after amplifying is a;
(5), process output module and obtain detection signal from detection trigger module, often detect that a trigger pip just detects the output signal of pulsewidth amplification module after elapsed time b, and judge that whether the intensity of pulsed light is up to standard according to output signal, wherein time b is less than time a.
In step (5), if output signal is high level, then judge that the intensity of pulsed light is normal, if output signal is low level, then output processing module judges that the intensity of pulsed light is more weak, and sends alerting signal.
After adopting said method, the present invention passes through the pulse width signal of Millisecond voltage comparison module exported after pulsewidth is amplified, detect for process output module, can detect whether the intensity of pulsed light reaches setting value exactly, if below standard, then report to the police, prompting changing light source, and also circuit realiration is very simple.
Accompanying drawing explanation
Fig. 1 is the principle block diagram of pulsed light attenuation test circuit of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is further detailed explanation:
As shown in Figure 1: the invention provides a kind of pulsed light attenuation test circuit, it comprises photoelectric conversion module, electric current turns voltage module, voltage comparison module, pulsewidth amplification module, process output module, detection trigger module and power module, described photoelectric conversion module, electric current turns voltage module, voltage comparison module, pulsewidth amplification module and process output module connect successively, described power module turns voltage module with electric current respectively, voltage comparison module, pulsewidth amplification module and process output module connect, described detection trigger module is connected with process output module.
Photodiode is adopted in this enforcement of described photoelectric conversion module, for light signal is converted to electric signal, described electric current turns voltage module and adopts amplifier, for converting current signal to voltage signal, voltage comparison module adopts comparer, voltage signal and setting voltage are compared, described pulsewidth amplification module is the first single-chip microcomputer, described process output module is second singlechip, described power module is also connected with civil power input, voltage module is turned to electric current after Transformer Rectifier is carried out in civil power input, voltage comparison module, pulsewidth amplification module and process output module are powered, described detection trigger module is a trigger pip output module, voltage triggered can be adopted, or current trigger etc., in the present embodiment, detection trigger module is set as sending a trigger pip at set intervals to process output module.
Described pulsewidth amplification module and process output module all adopt single-chip microcomputer, and such pulsewidth is amplified more flexible, and controllability is good, and single-chip microcomputer coordinates with single-chip microcomputer, stable performance, controls simple and convenient.
Another technical matters that the present invention will solve there is provided a kind of can the pulsed light decay testing method of test pulse light intensity.
For solving the problems of the technologies described above, the present invention proposes a kind of pulsed light decay testing method, and it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage comparison module;
(3), voltage comparison module with by voltage signal compared with setting voltage, if higher than setting voltage, then export high level to pulsewidth amplification module, if lower than setting voltage, then output low level is to pulsewidth amplification module; The light sent due to pulsed light is pulse signal, therefore the output of voltage comparison module is also a signal of following that pulsed light frequency is identical, if when the intensity of pulsed light is up to standard, then the output of voltage comparison module is a square-wave signal, if when the intensity of pulsed light is not up to standard, then the output of voltage comparison module is always low level;
(4) signal that, pulsewidth amplification module obtains from voltage comparison module carries out pulsewidth amplification, if the pulsewidth after amplifying is a; Described pulsewidth is a time value,
(5), process output module and obtain detection signal from detection trigger module, often detect that a trigger pip just detects the output signal of pulsewidth amplification module after elapsed time b, and judge that whether the intensity of pulsed light is up to standard according to output signal, wherein time b is less than time a.Such detection just can detect that the pulsewidth receiving that moment of trigger pip exports.
In step (5), if output signal is high level, then judge that the intensity of pulsed light is normal, if output signal is low level, then output processing module judges that the intensity of pulsed light is more weak, and sends alerting signal.
After adopting said method, the present invention passes through the pulse width signal of Millisecond voltage comparison module exported after pulsewidth is amplified, detect for process output module, can detect whether the intensity of pulsed light reaches setting value exactly, if below standard, then report to the police, prompting changing light source, and also circuit realiration is very simple.
Claims (2)
1. a pulsed light decay testing method, is characterized in that: it comprises the following steps:
(1), light signal changes into current signal by photoelectric conversion module, sends to electric current to turn voltage module;
(2), electric current turns after current signal is converted to voltage signal by voltage module and sends to voltage comparison module;
(3), voltage comparison module with by voltage signal compared with setting voltage, if higher than setting voltage, then export high level to pulsewidth amplification module, if lower than setting voltage, then output low level is to pulsewidth amplification module;
(4) signal that, pulsewidth amplification module obtains from voltage comparison module carries out pulsewidth amplification, if the pulsewidth after amplifying is a;
(5), process output module and obtain detection signal from detection trigger module, often detect that a trigger pip just detects the output signal of pulsewidth amplification module after elapsed time b, and judge that whether the intensity of pulsed light is up to standard according to output signal, wherein time b is less than time a.
2. pulsed light decay testing method according to claim 1, it is characterized in that: in step (5), if output signal is high level, then judge that the intensity of pulsed light is normal, if output signal is low level, then output processing module judges that the intensity of pulsed light is more weak, and sends alerting signal.
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| CN201310556273.XA CN103575387B (en) | 2013-11-11 | 2013-11-11 | Pulsed light attenuation test method |
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| CN201310556273.XA CN103575387B (en) | 2013-11-11 | 2013-11-11 | Pulsed light attenuation test method |
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| CN104634448B (en) * | 2015-01-06 | 2017-04-12 | 宁波中物光电杀菌技术有限公司 | Pulse light attenuation testing circuit and testing method thereof as well as device provided with pulse light attenuation testing circuit |
| CN110220673A (en) * | 2018-03-02 | 2019-09-10 | 谱钜科技股份有限公司 | The light source of spectrometer measures monitoring method and its system |
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| CN101351067A (en) * | 2007-07-20 | 2009-01-21 | 广东昭信光电科技有限公司 | Intelligent control system for high power LED lighting lamp |
| EP2278344A3 (en) * | 2009-07-10 | 2014-10-08 | Avalon Innovation AB | Current sensing device |
| US20110087461A1 (en) * | 2009-10-10 | 2011-04-14 | Hollander Milton B | Wireless data logging device |
| CN102564592A (en) * | 2012-01-09 | 2012-07-11 | 中国科学院上海光学精密机械研究所 | Device and method for measuring radiation spectrum of pulse flashlight |
| CN103323109A (en) * | 2013-06-21 | 2013-09-25 | 中国科学院上海技术物理研究所 | Light intensity detecting system for mobile phone sterilizer ultraviolet lamp tube |
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Effective date of registration: 20190802 Address after: 550000 Room 05, Fifth Floor, No. 3 Platinum Avenue 3491, Shawen Science and Technology Park, Guiyang National High-tech Industrial Development Zone, Guiyang City, Guizhou Province Patentee after: Guizhou Zhongwu Juneng Technology Co., Ltd. Address before: 315105 No. 655-77 Qiming Road, Investment and Entrepreneurship Center, Yinzhou District, Ningbo City, Zhejiang Province Patentee before: Ningbo Pulselight Sterilization Technology Co., Ltd. |
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