CN104617877B - Intelligent chip short-circuiting means for intelligent photovoltaic component test - Google Patents
Intelligent chip short-circuiting means for intelligent photovoltaic component test Download PDFInfo
- Publication number
- CN104617877B CN104617877B CN201510100788.8A CN201510100788A CN104617877B CN 104617877 B CN104617877 B CN 104617877B CN 201510100788 A CN201510100788 A CN 201510100788A CN 104617877 B CN104617877 B CN 104617877B
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- Prior art keywords
- metal piece
- short
- intelligent
- conductor metal
- optimum conductor
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- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 239000004020 conductor Substances 0.000 claims abstract description 74
- 239000002184 metal Substances 0.000 claims abstract description 64
- 238000003780 insertion Methods 0.000 claims description 3
- 230000037431 insertion Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 108010022579 ATP dependent 26S protease Proteins 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The invention discloses a kind of intelligent chip short-circuiting means for intelligent photovoltaic component test, it includes：First optimum conductor metal piece, described first optimum conductor metal piece is used for being electrically connected with the input phase of intelligent chip；Second optimum conductor metal piece, described second optimum conductor metal piece is used for being electrically connected with the outfan phase of intelligent chip, and has reserved short circuit interval region between the second optimum conductor metal piece and the first optimum conductor metal piece；Short-circuit component, described short-circuit component is arranged in reserved short circuit interval region, and when intelligent photovoltaic component is tested, described short-circuit component is electrically connected with the first optimum conductor metal piece and the second optimum conductor metal piece.The present invention can exclude the interference of intelligent chip circuit when intelligent photovoltaic component is tested, and so that testing reliability is improved, have dependable performance, simple for structure, lower-cost feature simultaneously.
Description
Technical field
The present invention relates to a kind of intelligent chip short-circuiting means for intelligent photovoltaic component test.
Background technology
At present, solar energy industry, as a kind of low-carbon (LC) regenerative resource, just worldwide flourishes, and various countries install
Amount increases year by year.Under this background, in industry, occur in that relatively advanced intelligent photovoltaic component, comparing common component has larger skill
Art advantage, commercially very competitive, in novel photovoltaic intelligent assembly, frequently with intelligent wiring box.Existing great majority
The chip circuit with control function can be connected between intelligent wiring box input and output, can be by certain rules control component
Output, to realizing corresponding intelligent effect.But in module testing, the chip circuit with control function is in larger journey
Test result can be affected on degree.The power of impact assembly determines in practice, the product of client is examined goods and tested I-V
The accuracy of curve, makes manufacturer and client that intelligent assembly is had a misgiving.
Content of the invention
The technical problem to be solved is the defect overcoming prior art, provides one kind to be used for intelligent photovoltaic component
The intelligent chip short-circuiting means of test, it can exclude the interference of intelligent chip circuit, make survey when intelligent photovoltaic component is tested
Examination reliability improves, and has dependable performance, simple for structure, lower-cost feature simultaneously.
In order to solve above-mentioned technical problem, the technical scheme is that：A kind of intelligence for intelligent photovoltaic component test
Energy chip short-circuiting means, it includes：
First optimum conductor metal piece, described first optimum conductor metal piece is used for mutually electrical with the input of intelligent chip
Connect；
Second optimum conductor metal piece, described second optimum conductor metal piece is used for mutually electrical with the outfan of intelligent chip
Connect, and between the second optimum conductor metal piece and the first optimum conductor metal piece, there is reserved short circuit interval region；
Short-circuit component, described short-circuit component is arranged in reserved short circuit interval region, when intelligent photovoltaic component is tested, institute
State short-circuit component and be electrically connected with the first optimum conductor metal piece and the second optimum conductor metal piece.
Further provide a kind of concrete structure of short-circuit component, described short-circuit component includes reserved TCH test channel and short
Drive test coupon, the bottom of short-circuit test rod is provided with optimum conductor termination, and it is optimum that the bottom of reserved TCH test channel is close to first
On conductor metal piece and the second optimum conductor metal piece, when intelligent photovoltaic component is tested, described short-circuit test rod insertion is pre-
Stay in TCH test channel, and the both sides of the bottom of optimum conductor termination of short-circuit test rod abut the first optimum conductor metal respectively
Piece and the second optimum conductor metal piece, electric current bypasses intelligent chip, from the first optimum conductor metal piece, the second optimum conductor metal
Flow through in the optimum conductor channel that piece, short-circuit test rod are formed.
Further for the reserved TCH test channel of protection, the intelligent chip short-circuiting means for intelligent photovoltaic component test also wraps
Include rubber stopper, and when intelligent photovoltaic component is not tested, this rubber stopper can be inserted in reserved TCH test channel.
After employing technique scheme, the present invention has following beneficial effect：
1st, the present invention solves in intelligent photovoltaic component, and intelligent chip changes assembly current path in testing, impact is surveyed
The key issue of test result effectiveness；
2nd, the present invention can effectively ensure the reliability of assembly in test link and routine use link.
3rd, the present invention has effectiveness for most of intelligent photovoltaic component, can ignore different intelligent light in application
The 26S Proteasome Structure and Function impact of volt product.
4th, the cost that the present invention realizes is relatively low, and method is easy-to-understand, and scene is easy to operate.
Brief description
Fig. 1 is the schematic internal view in the rosette of intelligent photovoltaic component of the present invention；
Fig. 2 is side view in test process for the present invention；
Fig. 3 is the structural representation in routine work for the present invention.
Specific embodiment
In order that present disclosure is easier to be clearly understood, below according to specific embodiment and combine accompanying drawing, right
The present invention is described in further detail.
As shown in Figures 1 to 3, a kind of intelligent chip short-circuiting means for intelligent photovoltaic component test, it includes：
First optimum conductor metal piece 1, the first optimum conductor metal piece 1 is used for mutually electrical with the input of intelligent chip 8
Connect；
Second optimum conductor metal piece 2, the second optimum conductor metal piece 3 is used for mutually electrical with the outfan of intelligent chip 8
Connect, and between the second optimum conductor metal piece 3 and the first optimum conductor metal piece 2, there is reserved short circuit interval region；Intelligence
During energy photovoltaic module normal work, insulate between the first optimum conductor metal piece 1 and the second optimum conductor metal piece 2 good；
Short-circuit component, described short-circuit component is arranged in reserved short circuit interval region, when intelligent photovoltaic component is tested, institute
State short-circuit component and be electrically connected with the first optimum conductor metal piece 1 and the second optimum conductor metal piece 2.
Short-circuit component includes reserved TCH test channel 3 and short-circuit test rod 4, and the bottom of short-circuit test rod 4 is provided with optimum leading
Body end head 4-1, the bottom of reserved TCH test channel 3 is close to the first optimum conductor metal piece 1 and the second optimum conductor metal piece 2
On, when intelligent photovoltaic component is tested, in the reserved TCH test channel 3 of short-circuit test rod 4 insertion, and short-circuit test rod 4 is optimum
The both sides of the bottom of conductor termination 4-1 abut the first optimum conductor metal piece 1 and the second optimum conductor metal piece 2, electric current respectively
Bypass intelligent chip 8, from the first optimum conductor metal piece 1, the second optimum conductor metal piece 2, short-circuit test rod 4 formed good
Flow through in property conductor channel.
Intelligent chip short-circuiting means for intelligent photovoltaic component test also includes rubber stopper 7, and works as intelligent photovoltaic group
When part is not tested, this rubber stopper 7 can be inserted in reserved TCH test channel 3.
This device installation process：
In intelligent photovoltaic terminal box install the first optimum conductor metal piece 1, the second optimum conductor metal piece 2 respectively with intelligence
The input of energy chip 8, outfan short circuit, leave between the first optimum conductor metal piece 1 and the second optimum conductor metal piece 2 simultaneously
Space it is ensured that both no electrical contacts, setting test reserved passageway 3 on online lid 5, test reserved passageway 3 bottom is close to the
One optimum conductor metal piece 1 and the second optimum conductor metal piece 2 upper surface；After the complete encapsulating of intelligent wiring box 6, only first
Optimum conductor metal piece 1 and the second optimum conductor metal piece 2 partial denudation in test reserved passageway 3 outside casting glue,
Short-circuit test rod 4 is passed through to test after reserved passageway 3 puts into, optimum conductor termination 4-1 and the exposed first optimum conductor metal
Piece 1 and the second optimum conductor metal piece 2 produce good electrical contact；During test, electric current bypasses intelligent chip 8, good from first
Property the optimum conductor channel that formed of conductor metal piece 1, the second optimum conductor metal piece 2, short-circuit test rod 4 in flow through, produce
In general components identical current loop, exclude the electric effect to test for the intelligent chip 8.It should be noted that being completed
Or when not needing short-circuit intelligent chip 8 short circuit, reserved passageway 3 will be tested with rubber stopper 7 and seal, prevent the shadow of external environment condition
Ring.
Particular embodiments described above, to present invention solves the technical problem that, technical scheme and beneficial effect carry out
Further describe, be should be understood that the specific embodiment that the foregoing is only the present invention, be not limited to this
Invention, all any modification, equivalent substitution and improvement within the spirit and principles in the present invention, done etc., should be included in this
Within bright protection domain.
Claims (3)
1. a kind of intelligent chip short-circuiting means for intelligent photovoltaic component test, intelligent photovoltaic component has intelligent wiring box,
Described intelligent chip is connected between the input of intelligent wiring box and output it is characterised in that it includes：
First optimum conductor metal piece (1), described first optimum conductor metal piece (1) is used for the input with intelligent chip (8)
Mutually it is electrically connected with；
Second optimum conductor metal piece (2), described second optimum conductor metal piece is used for mutually electric with the outfan of intelligent chip (8)
Property connect, and between the second optimum conductor metal piece and the first optimum conductor metal piece (2), there is reserved short circuit interval region；
Short-circuit component, described short-circuit component is arranged in reserved short circuit interval region, when intelligent photovoltaic component is tested, described short
Road assembly is electrically connected with the first optimum conductor metal piece (1) and the second optimum conductor metal piece (2).
2. the intelligent chip short-circuiting means for intelligent photovoltaic component test according to claim 1 it is characterised in that：Institute
The short-circuit component stated includes reserved TCH test channel (3) and short-circuit test rod (4), and the bottom of short-circuit test excellent (4) is provided with optimum
Conductor termination (4-1), the bottom of reserved TCH test channel (3) is close to the first optimum conductor metal piece (1) and the second optimum conductor
On sheet metal (2), when intelligent photovoltaic component is tested, in the described reserved TCH test channel (3) of short-circuit test rod (4) insertion, and
And short-circuit test rod (4) the bottom of optimum conductor termination (4-1) both sides abut respectively the first optimum conductor metal piece (1) and
Second optimum conductor metal piece (2), so that electric current bypasses intelligent chip (8), from the first optimum conductor metal piece (1), second good
Property conductor metal piece (2), flow through in short-circuit test rod (4) the optimum conductor channel that formed.
3. the intelligent chip short-circuiting means for intelligent photovoltaic component test according to claim 2 it is characterised in that：Also
Including rubber stopper (7), and when intelligent photovoltaic component is not tested, this rubber stopper (7) can be inserted in reserved TCH test channel (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510100788.8A CN104617877B (en) | 2015-03-06 | 2015-03-06 | Intelligent chip short-circuiting means for intelligent photovoltaic component test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510100788.8A CN104617877B (en) | 2015-03-06 | 2015-03-06 | Intelligent chip short-circuiting means for intelligent photovoltaic component test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104617877A CN104617877A (en) | 2015-05-13 |
| CN104617877B true CN104617877B (en) | 2017-03-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510100788.8A Active CN104617877B (en) | 2015-03-06 | 2015-03-06 | Intelligent chip short-circuiting means for intelligent photovoltaic component test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104617877B (en) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7271357B2 (en) * | 2004-05-04 | 2007-09-18 | Hubert Ostmeier | Interface test system |
| US9035491B2 (en) * | 2009-11-16 | 2015-05-19 | Omron Corporation | Voltage setting device, photovoltaic power generation system, and control method of voltage setting device |
| FR2964240B1 (en) * | 2010-09-01 | 2013-07-05 | Mersen France Sb Sas | SHORT CIRCUIT FOR PHOTOVOLTAIC INSTALLATION |
| CN204425273U (en) * | 2015-03-06 | 2015-06-24 | 常州天合光能有限公司 | For the intelligent chip short-circuiting means of intelligent photovoltaic component test |
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2015
- 2015-03-06 CN CN201510100788.8A patent/CN104617877B/en active Active
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| Publication number | Publication date |
|---|---|
| CN104617877A (en) | 2015-05-13 |
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| CP01 | Change in the name or title of a patent holder |
Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Patentee after: TRINA SOLAR Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Patentee before: trina solar Ltd. |
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| CP03 | Change of name, title or address |
Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Patentee after: trina solar Ltd. Address before: Tianhe Electronic Industrial Park Road 213022 north of Jiangsu Province, Changzhou City, No. 2 Patentee before: CHANGZHOU TRINA SOLAR ENERGY Co.,Ltd. |