CN104599933B - A kind of electron ionization sources - Google Patents
A kind of electron ionization sources Download PDFInfo
- Publication number
- CN104599933B CN104599933B CN201510010268.8A CN201510010268A CN104599933B CN 104599933 B CN104599933 B CN 104599933B CN 201510010268 A CN201510010268 A CN 201510010268A CN 104599933 B CN104599933 B CN 104599933B
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- China
- Prior art keywords
- cartridge
- ion
- annular element
- electron
- outlet
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
Abstract
The invention provides a kind of electron ionization sources, the ionization source includes electron source, repulsion electrode, ion lens；The electron ionization sources further comprise：First cartridge, the electron source are arranged on the sidepiece of first cartridge；The repulsion electrode is arranged in the first cartridge of both ends open；Annular element, the annular element are arranged on the side of first cartridge, wherein the side away from first cartridge has outlet, the internal diameter along ion exit direction of the hollow inside of the annular element gradually tapers up；Second cartridge, second cartridge are arranged in the outlet；The ion lens be arranged on the second cartridge side along on ion exit direction.The present invention has the advantages that ion exit efficiency high.
Description
Technical field
The present invention relates to mass spectral analysis, more particularly to electron ionization sources.
Background technology
Gas chromatography-mass spectrometry instrument is one of important member of field of analytic instrument, and the organic molecule of mixing passes through
Enter mass spectrum after crossing gas-chromatography post separation, mass spectrum ionizes organic molecule, and makes various ions in electric field or magnetic field
Under effect, separated according to mass-to-charge ratio size, and detect its corresponding intensity, obtained mass signal can be determined material
Property identification and quantitative analysis.
The ion gun of chromatography of gases-mass spectrometry instrument is mainly electron ionization sources (EI), and EI sources are semi-enclosed by one
Ion box and one group of lens are formed, and the chemical combination material flowed out from gas chromatographic column with carrier gas enters a semi-enclosed ion box
In, ion box both ends, which are placed with a kind of heating, can overflow the filament of electronics, and electronics enters in ion box to be carried out with compound molecule
Collision, the chemical bond for making compound shifted by energy transfer and electronics crack, so as to produce the fragment of compound from
Son.Fragment ion is transferred into level Four bar mass analyzer, by level Four in the presence of one group is applied with the lens of DC voltage
Bar is selected, finally according to the mass signal that response is produced on the ionic bombardment that mass analyzer filters out to detector.
Efficiency of transmission of the compound molecule in ion box and its lens group be influence sensitivity of mass spectrometry it is most important because
Element, the ion box of the gas chromatograph-mass spectrometer device of commercialization at present is all that ion is in repeller electrode using the tubular structure of cylinder
In the presence of voltage, lens group is entered by an aperture in ion cassette bottom portion, because ion box is placed in high vacuum, in order to tie up
Holding has certain compound density in ion box, the hole of ion exit can not open too big on ion box, typically 2-4mm it
Between.Electric field simulation is carried out to the ion box on current commercial mass spectrum by Ion optics simulation software, shown due to ion box
The less reason of perforate, outer lens are difficult the electric field having influence on inside ion box, and the electric field inside ion box is mainly pushed away
Denounce the influence of pole, Ion optics simulation shows that most of ion is all hit in ion box wall, only small part ion (only 40%)
The lens group of ion gun can be entered by aperture, ion transmission efficiency is low.
The content of the invention
In order to solve the deficiency in above-mentioned prior art, the invention provides a kind of electronics of ion exit efficiency high
Ion gun, the Ionization Efficiency of compound is favorably improved, improves the sensitivity of mass spectrometer.
The purpose of the present invention is achieved through the following technical solutions：
A kind of electron ionization sources, the ionization source include electron source, repulsion electrode, ion lens；The electron ionization sources
Further comprise：
First cartridge, the electron source are arranged on the sidepiece of first cartridge；The repulsion electrode is set
In the first cartridge of both ends open；
Annular element, the annular element are arranged on the side of first cartridge, wherein away from described first
The side of shape part has outlet, and the internal diameter along ion exit direction of the hollow inside of the annular element gradually tapers up；
Second cartridge, second cartridge are arranged in the outlet；The ion lens is arranged on described
Second cartridge side along on ion exit direction.
Compared with prior art, the device have the advantages that being：
Change the Electric Field Distribution in annular element so that caused most of ion can be focused at ion outlet, made
Most of ion can export out from ion box, improve ion exit efficiency, and then improve gas chromatograph-mass spectrometer device
Sensitivity to meet the needs of trace detection.
Brief description of the drawings
Referring to the drawings, the disclosure will be easier to understand.Skilled addressee readily understands that be：This
A little accompanying drawings are used only for illustrating technical scheme, and are not intended to and protection scope of the present invention is construed as limiting.
In figure：
Fig. 1 is the sectional view of electron ionization sources according to embodiments of the present invention.
Embodiment
Fig. 1 and following description describe the present invention optional embodiment with instruct those skilled in the art how to implement and
Reproduce the present invention.In order to instruct technical solution of the present invention, simplify or eliminate some conventional aspects.Those skilled in the art should
The understanding is derived from the modification of these embodiments or replacement will within the scope of the invention.Under those skilled in the art should understand that
Stating feature can combine to form multiple modifications of the present invention in a variety of ways.Thus, the invention is not limited in following optional
Embodiment, and only limited by claim and their equivalent.
Embodiment：
Fig. 1 schematically illustrates the sectional view of the electron ionization sources of the embodiment of the present invention, as shown in figure 1, the electronics
Ion gun includes：
Electron source, repulsion electrode 12, ion lens 15；
First cartridge 11, the electron source are arranged on the sidepiece of first cartridge；The repulsion electrode is set
Put in the first cartridge of both ends open；
Annular element 13, the annular element are arranged on the side of first cartridge, wherein away from described first
The side of cartridge is flat board, and the center of flat board has an ion outlet, the hollow inside of the annular element along ion
The internal diameter of exit direction gradually tapers up, and hollow space is in frustum；
Second cartridge 14, second cartridge are arranged in the outlet；The ion lens is arranged on institute
State the second cartridge side along on ion exit direction.
The course of work in above-mentioned electronic and ionic source is：
Power supply applies different DC voltages for the different parts in electronic and ionic source, e.g., in repeller electrode, the first cylindrical portion
The magnitude of voltage applied on part, annular element, the second cartridge and ion lens is respectively：2V、0V、1V、-15V、-20V、-
120V；
Compound analysis enters in the first cartridge, and electronics caused by electron source enters in the first cartridge, hits
Compound molecule makes its ionization, electric field caused by annular element by ion focusing at the ion outlet, it is saturating by ion
Mirror enters in mass analyzer after focusing on.
By simulative display, 60 mass-to-charge ratioes are 100 ion, and only 5 ions are knocked on ion box body, other
Ion can be focused and be transferred in mass analyzer.
Claims (1)
1. a kind of electron ionization sources, the ionization source includes electron source, repulsion electrode, ion lens；It is characterized in that：The electricity
Sub- ionization source further comprises：
First cartridge, the electron source are arranged on the sidepiece of first cartridge；The repulsion electrode is arranged on two
In first cartridge of end opening；
Annular element, the annular element are arranged on the side of first cartridge, wherein away from first cylindrical portion
The side of part is flat board, and the center of flat board has an ion outlet, the hollow inside of the annular element along ion exit side
To internal diameter gradually taper up, be in hollow frustum inside the annular element；
Second cartridge, second cartridge are arranged in the outlet；The ion lens is arranged on described second
Cartridge side along on ion exit direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510010268.8A CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510010268.8A CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104599933A CN104599933A (en) | 2015-05-06 |
| CN104599933B true CN104599933B (en) | 2017-12-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510010268.8A Active CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104599933B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018187162A1 (en) * | 2017-04-03 | 2018-10-11 | Perkinelmer Health Sciences Inc. | Ion transfer from electron ionization sources |
| GB201807914D0 (en) * | 2018-05-16 | 2018-06-27 | Micromass Ltd | Impactor spray or electrospray ionisation ion source |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6107628A (en) * | 1998-06-03 | 2000-08-22 | Battelle Memorial Institute | Method and apparatus for directing ions and other charged particles generated at near atmospheric pressures into a region under vacuum |
| US6885010B1 (en) * | 2003-11-12 | 2005-04-26 | Thermo Electron Corporation | Carbon nanotube electron ionization sources |
| US20090283674A1 (en) * | 2006-11-07 | 2009-11-19 | Reinhold Pesch | Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method |
| CN102290315B (en) * | 2011-07-21 | 2013-02-13 | 厦门大学 | Ion source suitable for flight time mass spectrometer |
| CN204464234U (en) * | 2015-01-08 | 2015-07-08 | 聚光科技(杭州)股份有限公司 | A kind of electron ionization sources |
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2015
- 2015-01-08 CN CN201510010268.8A patent/CN104599933B/en active Active
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| Publication number | Publication date |
|---|---|
| CN104599933A (en) | 2015-05-06 |
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| C06 | Publication | ||
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| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20171030 Address after: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 760 Applicant after: Focused Photonics (Hangzhou) Inc. Applicant after: Hangzhou Pu Yu development in science and technology Co., Ltd Address before: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 760 Applicant before: Focused Photonics (Hangzhou) Inc. |
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