CN104599719B - A kind of memory test analysis system - Google Patents
A kind of memory test analysis system Download PDFInfo
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- CN104599719B CN104599719B CN201410775071.9A CN201410775071A CN104599719B CN 104599719 B CN104599719 B CN 104599719B CN 201410775071 A CN201410775071 A CN 201410775071A CN 104599719 B CN104599719 B CN 104599719B
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Abstract
The present invention provides a kind of memory test analysis system, including：Test database, the initial data for storing the memory test result from AT test equipments and ET test equipments；Data analysis module, for according to the Raw Data Generation operational analysis result；Display module, for show the operational analysis as a result, for distinguish true property it is bad with it is false bad；Enquiry module, for the operational analysis result to be divided classification by AT tests and ET tests, for classified inquiry；Full-automatic operating system is derived automatically from data, intuitively reflects data drawing list instead of manual operation；By the otherness of memory test analysis system and original manual sorting data comparison, volume production exception Fail is reduced；According to the uniqueness of SPD information（Serial NO.）It may insure that the information of each product is evidence-based；According to the data query of memory test analysis system, authenticity and the accuracy of volume production yield greatly improve.
Description
Technical field
The present invention relates to technical field of manufacturing semiconductors, more particularly to a kind of memory test analysis system.
Background technology
Module producing line is existing to be needed first to collect a large amount of data when analyzing ET and AT extremely bad（Test
Log, yield, practical bad goods, materials and equipments）；Then the SPD of all bad goods, materials and equipments is read（Serial Presence Detect）Information,
It is the EEPROM by IIC serial line interfaces（Electrically Erasable Programmable Read-Only
Memory, Electrically Erasable Programmable Read-Only Memory）To information inspection existing for the module in memory bank；Finally believed according to SPD
Breath, which arranges all data summarizations to EXCEL, draws a conclusion.It can be seen that existing analytic process is tediously long and cumbersome, lack straight
The data of sight reflect.
Invention content
In view of the foregoing deficiencies of prior art, the purpose of the present invention is to provide a kind of memory test analysis system,
Solve the problems, such as prior art analysis result redundant and complicated.
For the above-mentioned target of realization and other related objectives, the present invention provides a kind of memory test analysis system, including：Test
Database, the initial data for storing the memory test result from AT test equipments and ET test equipments；Data analysis mould
Block, for according to the Raw Data Generation operational analysis result；Display module, for show the operational analysis as a result, with
For distinguish true property it is bad with it is false bad；Enquiry module, for dividing the operational analysis result by AT tests and ET tests
Classification, for classified inquiry.
Optionally, the ET tests, are detected according to memory voltage, electric current and frequency parameter by ET test equipments
Opening a way between each circuit and component of memory, short circuit or leaky；The AT tests are set by AT tests
Standby each particle to memory whether can normal read and write to complete basic functional test.
Optionally, the division, which is classified, includes：It is healthy that the volume production of AT device classes carries out resume, the memory of AT device classes
Life loss year, the electrical classification test result of direct current and daily worst tested device notify automatically.
Optionally, the HITEMS softwares are used to inquire the Lot and test equipment information of deposit EIS DB.
Optionally, the HITEMS software databases, for preserving the information essential information of each memory article in SPD
And it is associated with each self test results；HITEMS identification modules, it is automatic to show according to the automatic identification product category and parameter
The test result of product information, to ensure that each memory article information is independent and complete.
Optionally, the memory test analysis system further includes：Backup module, in memory test result to clothes
Business device is backed up when sending.
As described above, the present invention provides a kind of memory test analysis system, including：Test database comes from for storing
The initial data of the memory test result of AT test equipments and ET test equipments；Data analysis module, for according to described original
Data generate operational analysis result；Display module, for show the operational analysis as a result, for distinguish true property it is bad with it is false
It is bad；Enquiry module, for the operational analysis result to be divided classification by AT tests and ET tests, for classified inquiry；Entirely
Automatization operation system is derived automatically from data, intuitively reflects data drawing list instead of manual operation；It is analyzed by memory test and is
The otherness of system and original manual sorting data comparison reduces volume production exception Fail；According to the uniqueness of SPD information（Serial
NO.）It may insure that the information of each product is evidence-based；According to the data query of memory test analysis system, volume production yield
Authenticity greatly improved with accuracy.
Description of the drawings
Fig. 1 is shown as the structural schematic diagram of the memory test analysis system in one embodiment of the invention.
Component label instructions：1- memory test analysis systems, 11- test databases, 12- data analysis modules, 13- are shown
Module, 14- enquiry modules.
Specific implementation mode
Illustrate that embodiments of the present invention, those skilled in the art can be by this specification below by way of specific specific example
Disclosed content understands other advantages and effect of the present invention easily.The present invention can also pass through in addition different specific realities
The mode of applying is embodied or practiced, the various details in this specification can also be based on different viewpoints with application, without departing from
Various modifications or alterations are carried out under the spirit of the present invention.It should be noted that in the absence of conflict, the embodiment in the application
And the feature in embodiment can be combined with each other.
As shown in Figure 1, the present invention provides a kind of present invention offer a kind of memory test analysis system 1, including：Test data
Library 11, the initial data for storing the memory test result from AT test equipments and ET test equipments；Data analysis module
12, for according to the Raw Data Generation operational analysis result；Display module 13, for showing the operational analysis as a result,
For distinguish true property it is bad with it is false bad, using probability statistics to data interpretation of result can distinguish true property it is bad with it is false
It is bad；Enquiry module 14, for the operational analysis result to be divided classification by AT tests and ET tests, for classified inquiry.
In one embodiment, the ET tests are by ET test equipments according to memory voltage, electric current and frequency parameter
Opening a way between each circuit and component to detect memory, short circuit or leaky；The AT tests, are to pass through AT
Test equipment to each particle of memory whether can normal read and write to complete basic functional test.
In one embodiment, Hitems softwares preferably can be used to carry out data storage and display etc., for example, using calculating
Machine language（C/C++）The initial data of database and operation result are shown in software HITEMS (Test Equipment
Management System, Lot and facility information for inquiring deposit EIS DB) among, more intuitively to check data
As a result：(voltage, electric current, frequency) is tested for ET, detect Open, Short between each circuit and component of memory,
The problems such as Leakage, tests AT, each particle of Module whether can normal read and write, complete basic function
Property test use.
In one embodiment, the division, which is classified, includes：The volume productions of AT device classes carry out resume, AT device classes it is interior
It deposits life-span loss year, the electrical classification test result of direct current and daily worst tested device to notify automatically, specifically, i.e.
By Software for Design by Hitems modules classifying and dividing (AT volume productions carry out resume, the other YLD of AT equipment
The other Test results of Mornitoring, ELEC DC Item and Daily Worst Dut Auto Mailing), to be directed to
The inquiry of property）.
In one embodiment, the HITEMS softwares are used to inquire the Lot and test equipment information of deposit EIS DB.
In one embodiment, the HITEMS software databases, the information essential information for preserving each memory article
In SPD（Such as 256Byte EEPROM）In and it is associated with each self test results；HITEMS identification modules, according to described automatic
Identify product category and parameter, the automatic test result for showing product information, with ensure each memory article information it is independent with
Completely.
In one embodiment, the memory test analysis system 1 further includes：Backup module, in memory test knot
Fruit is backed up when being sent to server, specifically, for example, in order to ensure the accuracy of memory test result, the system development
System self-test module, equipment can carry out Backup while test result sends Server, no matter test result be non-defective unit also
It is defective products, can be carried out downloading true Log and referred to.
In conclusion the present invention provides a kind of memory test analysis system, including：Test database comes from for storing
The initial data of the memory test result of AT test equipments and ET test equipments；Data analysis module, for according to described original
Data generate operational analysis result；Display module, for show the operational analysis as a result, for distinguish true property it is bad with it is false
It is bad；Enquiry module, for the operational analysis result to be divided classification by AT tests and ET tests, for classified inquiry；Entirely
Automatization operation system is derived automatically from data, intuitively reflects data drawing list instead of manual operation；It is analyzed by memory test and is
The otherness of system and original manual sorting data comparison reduces volume production exception Fail；According to the uniqueness of SPD information（Serial
NO.）It may insure that the information of each product is evidence-based；According to the data query of memory test analysis system, volume production yield
Authenticity greatly improved with accuracy.
The above-described embodiments merely illustrate the principles and effects of the present invention, and is not intended to limit the present invention.It is any ripe
The personage for knowing this technology can all carry out modifications and changes to above-described embodiment without violating the spirit and scope of the present invention.Cause
This, institute is complete without departing from the spirit and technical ideas disclosed in the present invention by those of ordinary skill in the art such as
At all equivalent modifications or change, should by the present invention claim be covered.
Claims (3)
1. a kind of memory test analysis system, which is characterized in that including：
Test database, the initial data for storing the memory test result from AT test equipments and ET test equipments；
Data analysis module, for according to the Raw Data Generation operational analysis result；
Display module, for show the operational analysis as a result, for distinguish true property it is bad with it is false bad；
Enquiry module, for the operational analysis result to be divided classification by AT tests and ET tests, for classified inquiry；
Further include memory test analysis software be used for inquire deposit electrical characteristics test store database finished product minimum unit and
Test equipment information；
Include database in the memory test analysis software, the database is used to preserve the basic letter of each memory article
Breath is in SPD and associated with each self test results；Memory test analysis and identification module, can automatic identification product category and ginseng
Number, the automatic test result for showing product information, to ensure that each memory article information is independent and complete；
Further include：Backup module, for being backed up when memory test result is sent to server, the backup module is also set
It is equipped with System self-test module, while test result is sent server by the System self-test module, memory test analysis system
It can be backed up, no matter test result is non-defective unit or defective products, all be downloaded true record and referred to.
2. memory test analysis system according to claim 1, which is characterized in that the ET tests, are tested by ET
Opening a way, be short between each circuit and component of the equipment according to memory voltage, electric current and frequency parameter to detect memory
Road or leaky；Whether the AT tests, being being capable of normal read and write to each particle of memory by AT test equipments
Test.
3. memory test analysis system according to claim 1, which is characterized in that the division, which is classified, includes：AT equipment
The volume production of classification carries out resume, the memory life-span loss year of AT device classes, the electrical classification test result of direct current and daily
Worst tested device notifies automatically.
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| CN201410775071.9A CN104599719B (en) | 2014-12-15 | 2014-12-15 | A kind of memory test analysis system |
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| CN201410775071.9A CN104599719B (en) | 2014-12-15 | 2014-12-15 | A kind of memory test analysis system |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106847343A (en) * | 2016-12-08 | 2017-06-13 | 上海精密计量测试研究所 | The method of testing of the mram memory based on ATE |
| CN111047125B (en) * | 2018-10-11 | 2023-11-14 | 鸿富锦精密电子（成都）有限公司 | Product failure analysis apparatus, method, and computer-readable storage medium |
| CN110309374A (en) * | 2019-05-22 | 2019-10-08 | 深圳市金泰克半导体有限公司 | A kind of analytic method, system, terminal device and computer readable storage medium |
Citations (3)
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| CN101521607A (en) * | 2009-04-13 | 2009-09-02 | 重庆重邮东电通信技术有限公司 | Method and device for testing Ethernet network performance |
| CN101834664A (en) * | 2010-04-29 | 2010-09-15 | 西安电子科技大学 | SDH (Synchronous Digital Hierarchy) multi-domain comprehensive test device and test method thereof |
| CN102012861A (en) * | 2010-11-01 | 2011-04-13 | 北京航空航天大学 | Method and system for real-time embedded software test result data analysis |
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2014
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101521607A (en) * | 2009-04-13 | 2009-09-02 | 重庆重邮东电通信技术有限公司 | Method and device for testing Ethernet network performance |
| CN101834664A (en) * | 2010-04-29 | 2010-09-15 | 西安电子科技大学 | SDH (Synchronous Digital Hierarchy) multi-domain comprehensive test device and test method thereof |
| CN102012861A (en) * | 2010-11-01 | 2011-04-13 | 北京航空航天大学 | Method and system for real-time embedded software test result data analysis |
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