CN104599719A - Memory test analysis system - Google Patents
Memory test analysis system Download PDFInfo
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- CN104599719A CN104599719A CN201410775071.9A CN201410775071A CN104599719A CN 104599719 A CN104599719 A CN 104599719A CN 201410775071 A CN201410775071 A CN 201410775071A CN 104599719 A CN104599719 A CN 104599719A
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Abstract
The invention provides a memory test analysis system. The memory test analysis system comprises a test database, a data analysis module, a display module and an inquiring module, wherein the test database is used for storing original data of memory test results of AT test equipment and ET test equipment; the data analysis module is used for generating an operational analysis result according to the original data; the display module is used for displaying the operation analysis result so as to be used for distinguishing true badness and false badness; the inquiring module is used for dividing and classifying the operation analysis result according to AT test and ET test so as to be used for classified inquiry. The full-automatic operation system replaces manual operation; data are derived automatically, and the data drawing list is reflected intuitively; the mass production abnormality Fail is reduced by the comparison difference of the memory test analysis system and the original manual organized data; the information of each product is valid according to the uniqueness (serial No.) of SPD information; the authenticity and accuracy of the volume production yield are improved greatly according the data inquiry of the memory test analysis system.
Description
Technical field
The present invention relates to technical field of manufacturing semiconductors, particularly relate to a kind of memory test analytic system.
Background technology
Module product line is existing to be needed first to collect a large amount of data (Test Log, yield, actual bad goods, materials and equipments) when analysis ET and AT is extremely bad; Then the SPD(Serial Presence Detect of all bad goods, materials and equipments is read) information, namely be the EEPROM(Electrically Erasable Programmable Read-Only Memory by IIC serial line interface, EEPROM (Electrically Erasable Programmable Read Only Memo)) information check that exists the module in memory bank; Finally according to SPD information, all data summarization arrangements are reached a conclusion to EXCEL.As can be seen here, existing analytic process is tediously long and loaded down with trivial details, lacks data reflection intuitively.
Summary of the invention
The shortcoming of prior art in view of the above, the object of the present invention is to provide a kind of memory test analytic system, solves the problem of prior art analysis result redundant and complicated.
For realizing above-mentioned target and other related objectives, the invention provides a kind of memory test analytic system, comprising: test database, for storing the raw data of the memory test result from AT testing apparatus and ET testing apparatus; Data analysis module, for according to described Raw Data Generation operational analysis result; Display module, for showing described operational analysis result, bad and false bad for the true property of differentiation; Enquiry module, for described operational analysis result being pressed AT test and ET test division classification, for classified inquiry.
Optionally, described ET test detects open circuit between each circuit of internal memory and components and parts, short circuit or leaky by ET testing apparatus according to memory voltage, electric current and frequency parameter; Described AT test, be by AT testing apparatus to each particle of internal memory whether can normally read and write to complete basic functional test.
Optionally, described division classification comprises: the volume production of AT device class carry out resume, internal memory life-span loss year of AT device class, direct current electrical classification test result and every day the poorest tested device automatically notify.
Optionally, described HITEMS software is for inquiring about Lot stored in EIS DB and testing apparatus information.
Optionally, described HITEMS software database, is associated with each self test results in SPD for the information essential information of preserving each memory article; HITEMS identification module, according to described automatic identification product category and parameter, the test result of display product information automatically, to guarantee that each memory article information is independent and complete.
Optionally, described memory test analytic system, also comprises: backup module, for backing up when memory test result sends to server.
As mentioned above, the invention provides a kind of memory test analytic system, comprising: test database, for storing the raw data of the memory test result from AT testing apparatus and ET testing apparatus; Data analysis module, for according to described Raw Data Generation operational analysis result; Display module, for showing described operational analysis result, bad and false bad for the true property of differentiation; Enquiry module, for described operational analysis result being pressed AT test and ET test division classification, for classified inquiry; Full-automatic operating system instead of manual operation, and automatic derived data, intuitively reflects data drawing list; By the otherness of memory test analytic system and original manual sorting Data Comparison, reduce the abnormal Fail of volume production; Uniqueness (Serial NO.) according to SPD information can guarantee that the information of each product is evidence-based; According to the data query of memory test analytic system, authenticity and the accuracy of volume production yield improve greatly.
Accompanying drawing explanation
Fig. 1 is shown as the structural representation of the memory test analytic system in one embodiment of the invention.
Element numbers illustrates: 1-memory test analytic system, 11-test database, 12-data analysis module, 13-display module, 14-enquiry module.
Embodiment
Below by way of specific instantiation, embodiments of the present invention are described, those skilled in the art the content disclosed by this instructions can understand other advantages of the present invention and effect easily.The present invention can also be implemented or be applied by embodiments different in addition, and the every details in this instructions also can based on different viewpoints and application, carries out various modification or change not deviating under spirit of the present invention.It should be noted that, when not conflicting, the embodiment in the application and the feature in embodiment can combine mutually.
As shown in Figure 1, the invention provides one and the invention provides a kind of memory test analytic system 1, comprising: test database 11, for storing the raw data of the memory test result from AT testing apparatus and ET testing apparatus; Data analysis module 12, for according to described Raw Data Generation operational analysis result; Display module 13, for showing described operational analysis result, bad and false bad for the true property of differentiation, utilize probability statistics can distinguish true property to data interpretation of result bad and false bad; Enquiry module 14, for described operational analysis result being pressed AT test and ET test division classification, for classified inquiry.
In one embodiment, described ET test detects open circuit between each circuit of internal memory and components and parts, short circuit or leaky by ET testing apparatus according to memory voltage, electric current and frequency parameter; Described AT test, be by AT testing apparatus to each particle of internal memory whether can normally read and write to complete basic functional test.
In one embodiment, Hitems software preferably can be adopted to carry out data storage and display etc., such as, computerese (C/C++) is utilized the raw data of database and operation result to be shown in software HITEMS (Test Equipment Management System, for inquiring about Lot stored in EIS DB and facility information) among, to check data result more intuitively: test (voltage for ET, electric current, frequency), detect the Open between each circuit of internal memory and components and parts, Short, the problems such as Leakage, AT is tested, whether each particle of Module can read and write normally, complete basic functional test to use.
In one embodiment, described division classification comprises: the volume production of AT device class carry out resume, internal memory life-span loss year of AT device class, direct current electrical classification test result and every day the poorest tested device automatically notify, concrete, namely by Software for Design by the Hitems modules classifying and dividing (resume that AT volume production is carried out, the other YLD Mornitoring of AT equipment, the other Test result of ELEC DC Item and Daily Worst Dut Auto Mailing), to inquire about targetedly).
In one embodiment, described HITEMS software is for inquiring about Lot stored in EIS DB and testing apparatus information.
In one embodiment, described HITEMS software database, for preserving the information essential information of each memory article at SPD(such as 256Byte EEPROM) in and be associated with each self test results; HITEMS identification module, according to described automatic identification product category and parameter, the test result of display product information automatically, to guarantee that each memory article information is independent and complete.
In one embodiment, described memory test analytic system 1, also comprise: backup module, for backing up when memory test result sends to server, concrete, such as, in order to ensure the accuracy of memory test result, this system development System self-test module, while test result sends Server, equipment can carry out Backup, no matter test result is non-defective unit or defective products, can carry out downloading true Log and carry out reference.
In sum, the invention provides a kind of memory test analytic system, comprising: test database, for storing the raw data of the memory test result from AT testing apparatus and ET testing apparatus; Data analysis module, for according to described Raw Data Generation operational analysis result; Display module, for showing described operational analysis result, bad and false bad for the true property of differentiation; Enquiry module, for described operational analysis result being pressed AT test and ET test division classification, for classified inquiry; Full-automatic operating system instead of manual operation, and automatic derived data, intuitively reflects data drawing list; By the otherness of memory test analytic system and original manual sorting Data Comparison, reduce the abnormal Fail of volume production; Uniqueness (Serial NO.) according to SPD information can guarantee that the information of each product is evidence-based; According to the data query of memory test analytic system, authenticity and the accuracy of volume production yield improve greatly.
Above-described embodiment is illustrative principle of the present invention and effect thereof only, but not for limiting the present invention.Any person skilled in the art scholar all without prejudice under spirit of the present invention and category, can modify above-described embodiment or changes.Therefore, such as have in art usually know the knowledgeable do not depart from complete under disclosed spirit and technological thought all equivalence modify or change, must be contained by claim of the present invention.
Claims (6)
1. a memory test analytic system, is characterized in that, comprising:
Test database, for storing the raw data of the memory test result from AT testing apparatus and ET testing apparatus;
Data analysis module, for according to described Raw Data Generation operational analysis result;
Display module, for showing described operational analysis result, bad and false bad for the true property of differentiation;
Enquiry module, for described operational analysis result being pressed AT test and ET test division classification, for classified inquiry.
2. memory test analytic system according to claim 1, it is characterized in that, described ET test detects open circuit between each circuit of internal memory and components and parts, short circuit or leaky by ET testing apparatus according to memory voltage, electric current and frequency parameter; Described AT test, be by AT testing apparatus to each particle of internal memory whether can normally read and write to complete basic functional test.
3. memory test analytic system according to claim 1, it is characterized in that, described division classification comprises: the volume production of AT device class carry out resume, internal memory life-span loss year of AT device class, direct current electrical classification test result and every day the poorest tested device automatically notify.
4. memory test analytic system according to claim 1, is characterized in that, described HITEMS software is for inquiring about Lot stored in EIS DB and testing apparatus information.
5. memory test analytic system according to claim 1, is characterized in that, described HITEMS software database, is associated in SPD for the information essential information of preserving each memory article with each self test results; HITEMS identification module, according to described automatic identification product category and parameter, the test result of display product information automatically, to guarantee that each memory article information is independent and complete.
6. memory test analytic system according to claim 1, is characterized in that, also comprise: backup module, for backing up when memory test result sends to server.
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| CN201410775071.9A CN104599719B (en) | 2014-12-15 | 2014-12-15 | A kind of memory test analysis system |
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| CN201410775071.9A CN104599719B (en) | 2014-12-15 | 2014-12-15 | A kind of memory test analysis system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106847343A (en) * | 2016-12-08 | 2017-06-13 | 上海精密计量测试研究所 | The method of testing of the mram memory based on ATE |
| CN110309374A (en) * | 2019-05-22 | 2019-10-08 | 深圳市金泰克半导体有限公司 | A kind of analytic method, system, terminal device and computer readable storage medium |
| CN111047125A (en) * | 2018-10-11 | 2020-04-21 | 鸿富锦精密电子（成都）有限公司 | Product failure analysis device, method and computer readable storage medium |
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| CN101521607A (en) * | 2009-04-13 | 2009-09-02 | 重庆重邮东电通信技术有限公司 | Method and device for testing Ethernet network performance |
| CN101834664A (en) * | 2010-04-29 | 2010-09-15 | 西安电子科技大学 | SDH (Synchronous Digital Hierarchy) multi-domain comprehensive test device and test method thereof |
| CN102012861A (en) * | 2010-11-01 | 2011-04-13 | 北京航空航天大学 | Method and system for real-time embedded software test result data analysis |
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| CN101521607A (en) * | 2009-04-13 | 2009-09-02 | 重庆重邮东电通信技术有限公司 | Method and device for testing Ethernet network performance |
| CN101834664A (en) * | 2010-04-29 | 2010-09-15 | 西安电子科技大学 | SDH (Synchronous Digital Hierarchy) multi-domain comprehensive test device and test method thereof |
| CN102012861A (en) * | 2010-11-01 | 2011-04-13 | 北京航空航天大学 | Method and system for real-time embedded software test result data analysis |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106847343A (en) * | 2016-12-08 | 2017-06-13 | 上海精密计量测试研究所 | The method of testing of the mram memory based on ATE |
| CN111047125A (en) * | 2018-10-11 | 2020-04-21 | 鸿富锦精密电子（成都）有限公司 | Product failure analysis device, method and computer readable storage medium |
| CN111047125B (en) * | 2018-10-11 | 2023-11-14 | 鸿富锦精密电子（成都）有限公司 | Product failure analysis apparatus, method, and computer-readable storage medium |
| CN110309374A (en) * | 2019-05-22 | 2019-10-08 | 深圳市金泰克半导体有限公司 | A kind of analytic method, system, terminal device and computer readable storage medium |
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| CN104599719B (en) | 2018-09-21 |
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