CN104596566B - Lattice structure body examination test-run a machine target dot matrix structure self study method of testing - Google Patents
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing Download PDFInfo
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- CN104596566B CN104596566B CN201410851538.3A CN201410851538A CN104596566B CN 104596566 B CN104596566 B CN 104596566B CN 201410851538 A CN201410851538 A CN 201410851538A CN 104596566 B CN104596566 B CN 104596566B
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Abstract
The invention discloses lattice structure body examination test-run a machine target dot matrix structure self study method of testing, including lattice structure body examination test-run a machine, Function detection switches servicing unit and lattice structure body to be learned, intelligence test processing module is set in the lattice structure body examination test-run a machine, the bay insertion groove set with outside is connected, the Function detection switching servicing unit is provided with first end winding displacement and installs plug, wire harness winding displacement group and the second end winding displacement install plug, it is connected with each other successively, the lattice structure body examination test-run a machine is connected by bay insertion groove with lattice structure body to be learned, after the completion of connection, intelligence test processing module passes through a series of automatic execution steps, it can recognize that the specifications and models of lattice structure body to be learned, and automatically generate corresponding optimum test procedure combination.The present invention can allow the unknown trendy lattice structure body of lattice structure body examination test-run a machine automatic identification, test the test procedure is automatically generated for it, the conventional programs such as manual manufacture tool, programming, test are saved, substantial amounts of manpower has both been saved, material resources, also save the substantial amounts of time.
Description
Technical field
The present invention relates to a kind of fireworks production test instrument, and in particular to lattice structure body examination test-run a machine target dot matrix structure
Self study method of testing.
Background technology
Lattice structure body is the key components and parts for realizing figure line fireworks, determines the display of fireworks and can accomplish that user needs
The effect asked, is also that decision figure line fireworks can be minimized, the critical component of integration, the volume of lattice structure body, dot matrix
The step of dense degree, shaping efficiency, production cost and post-processing are handled all seriously constrains the holistic cost of figure line fireworks, peace
Quan Xing, reliability and production efficiency, lattice structure body need precision die, precise forming, a large amount of accurate post processing machining tools,
Quality testing instrument, shaping tool, tools for loading and anti-error, blast protection measure etc., the core component of figure line fireworks needs largely
The inter-trade new and high technology across technical field support and the original spirit dared to blaze new trails, dare to tested that existing every profession and trade lacks
Few corresponding technical support, the data that particularly industry fireworks technical field can be for reference is so tragic that one cannot bear to look at it, and oneself is needed everywhere
Go developing.
The content of the invention
It is an object of the invention to the problem above for overcoming prior art presence, there is provided lattice structure body examination test-run a machine target point
Battle array structure self study method of testing, the lattice structure body examination test-run a machine automatic identification unknown trendy lattice structure of the invention that can allow
Body, is that trendy lattice structure body automatically generates test the test procedure, saves the conventional programs such as manual manufacture tool, programming, test,
Both substantial amounts of manpower had been saved, material resources also save the substantial amounts of time.
To realize above-mentioned technical purpose and the technique effect, the present invention is achieved through the following technical solutions：
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, including lattice structure body examination test-run a machine（1）
With lattice structure body to be learned（4）, the lattice structure body examination test-run a machine（1）Intelligence test processing module is inside set, with outside setting
Bay insertion groove（3）Connection, the Function detection switches servicing unit（2）It is provided with first end winding displacement and plug is installed（5）, line
Beam winding displacement group（7）Plug is installed with the second end winding displacement（6）, it is connected with each other successively, the lattice structure body examination test-run a machine（1）By inserting
Frame insertion groove（3）With lattice structure body to be learned（4）Connection.
Further, the lattice structure body to be learned（4）Switch servicing unit with Function detection（2）Connection, the work(
Can detection switching servicing unit（2）Approbating and reprobating and combining comprising sensor, switch, electronic component and connector.
Further, the sensor includes temperature sensor, pressure sensor, displacement transducer, velocity sensor, wet
Spend sensor, light sensor, infrared sensor, electromagnetic sensor；The switch includes mechanical switch, electronic switch,
Electro-mechanical switches and the device with switching function；The electronic component includes diode, triode, electric capacity and with multiple
The circuit board of electronic component；The connector includes metal connector, plastics connector and composite connector.
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, intelligence test processing module is by one
Row are automatic to perform step, can recognize that the specifications and models of lattice structure body to be learned, and automatically generates corresponding optimal test
Suite, its step is as follows：
Step 1）By lattice structure body to be learned（4）Pass through bay insertion groove（3）With lattice structure body examination test-run a machine（1）Complete
Connection；
Step 2）Lattice structure body examination test-run a machine（1）Start intelligence test processing module；
Step 3）Intelligence test processing module passes through bay insertion groove（3）Export learning signal；
Step 4）Learning signal passes through lattice structure body to be learned（4）It is transmitted；
Step 5）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）The learning signal of transmission；
Step 6）Intelligence test processing module analyzes the composition and function for judging wire harness；
Step 7）Intelligence test processing module passes through bay insertion groove（3）Output checking signal；
Step 8）Checking signal passes through lattice structure body to be learned（4）It is transmitted；
Step 9）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）The checking signal of transmission；
Step 10）The analysis of intelligence test processing module judges checking signal, and the wire harness specification and test after generation study are provided
Material.
Further, the step 4）Learning signal passes through lattice structure body to be learned（4）By function when being transmitted
Detection switching servicing unit（2）Disturbance, the step 5）Lattice structure body examination test-run a machine（1）The learning signal received be by
Learning signal after disturbance.
Further, the step 7）Intelligence test processing module passes through bay insertion groove（3）Output checking signal and institute
State step 8）Checking signal passes through lattice structure body to be learned（4）When being transmitted, lattice structure body examination test-run a machine（1）It can remind
Operating personnel or operation device operating function detection switching servicing unit（2）, coordinate checking signal to be verified.
Further, the step 9）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）Pass
Defeated checking signal and step 10）The analysis of intelligence test processing module judges checking signal, complete when verifying that signal meets expected
Into lattice structure body to be learned（4）Study and checking.
Further, the step 9）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）Pass
Defeated checking signal and step 10）The analysis of intelligence test processing module judges checking signal, when verifying that signal does not meet expected,
Information and instruction are sent, operating function detection switching servicing unit is reminded（2）, number of times or operation overtime are reminded more than default, then
Authentication failed is pointed out, request relearns operation or takes out the lattice structure body to be learned of non-learning success（4）.
Further, the step 4）To step 7）Group can be weaved into, is repeated several times and occurs, the step 8）To step 10
Group can be weaved into, is repeated several times and occurs.
Further, the step 3）To step 10）Group can be weaved into, is repeated several times and occurs.
The beneficial effects of the invention are as follows:
The trendy lattice structure body that lattice structure body examination test-run a machine automatic identification can be allowed unknown is trendy lattice structure body from
Dynamic generation test the test procedure, saves the conventional programs such as manual manufacture tool, programming, test, has both saved substantial amounts of manpower, thing
Power, also saves the substantial amounts of time.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention,
And can be practiced according to the content of specification, below with presently preferred embodiments of the present invention and coordinate accompanying drawing describe in detail as after.
The embodiment of the present invention is shown in detail by following examples and its accompanying drawing.
Brief description of the drawings
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the application, this hair
Bright schematic description and description is used to explain the present invention, does not constitute inappropriate limitation of the present invention.In the accompanying drawings：
Fig. 1 is a kind of axle side schematic diagram of embodiment of the present invention；
Fig. 2 is a kind of axle side schematic diagram of embodiment of the present invention.
Label declaration in figure：1st, lattice structure body examination test-run a machine, 2, lattice structure body to be learned, 3, bay insertion groove, 4, work(
Can detection switching servicing unit, 5, first end winding displacement plug is installed, the 6, second end winding displacement installs plug, 7, wire harness winding displacement group.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, the present invention is described in detail.
Shown in reference picture 1- Fig. 2, lattice structure body examination test-run a machine target dot matrix structure self study method of testing, including dot matrix
Intelligence test processing module is set in structure test machine 1 and lattice structure body 2 to be learned, the lattice structure body examination test-run a machine 1, with
The bay insertion groove 3 that outside is set is connected, and the junction of lattice structure body 2 to be learned is provided with first end winding displacement and installs plug
5th, the end winding displacement of wire harness winding displacement group 7 and second installs plug 6, is connected with each other successively, the lattice structure body examination test-run a machine 1 passes through bay
Insertion groove 3 is connected with lattice structure body 2 to be learned.
Further, the lattice structure body 2 to be learned is provided with Function detection switching servicing unit 4, the function inspection
Survey the approbating and reprobating and combining comprising sensor, switch, electronic component and connector of switching servicing unit 4.
Further, the sensor includes temperature sensor, pressure sensor, displacement transducer, velocity sensor, wet
Spend sensor, light sensor, infrared sensor, electromagnetic sensor；The switch includes mechanical switch, electronic switch,
Electro-mechanical switches and the device with switching function；The electronic component includes diode, triode, electric capacity and with multiple
The circuit board of electronic component；The connector includes metal connector, plastics connector and composite connector.
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, intelligence test processing module is by one
Row are automatic to perform step, can recognize that the specifications and models of lattice structure body to be learned, and automatically generates corresponding optimal test
Suite, its step is as follows：
Lattice structure body 2 to be learned is completed to be connected by step 1 by bay insertion groove 3 with lattice structure body examination test-run a machine 1；
Step 2 lattice structure body examination test-run a machine 1 starts intelligence test processing module；
Step 3 intelligence test processing module exports learning signal by bay insertion groove 3；
Step 4 learning signal is transmitted by lattice structure body 2 to be learned；
Step 5 lattice structure body examination test-run a machine 1 receives the learning signal transmitted by lattice structure body 2 to be learned；
Step 6 intelligence test processing module analyzes the composition and function for judging wire harness；
Step 7 intelligence test processing module passes through the output checking signal of bay insertion groove 3；
Step 8 checking signal is transmitted by lattice structure body 2 to be learned；
Step 9 lattice structure body examination test-run a machine 1 receives the checking signal transmitted by lattice structure body 2 to be learned；
The analysis of step 10 intelligence test processing module judges checking signal, and the wire harness specification and test after generation study are provided
Material.
Further, by Function detection when step 4 learning signal is transmitted by lattice structure body 2 to be learned
Switch the disturbance of servicing unit 4, after the learning signal that the step 5 lattice structure body examination test-run a machine 1 is received is disturbed
Learning signal.
Further, the step 7 intelligence test processing module passes through the output of bay insertion groove 3 checking signal and the step
When rapid 8 checking signal is transmitted by lattice structure body 2 to be learned, lattice structure body examination test-run a machine 1 can remind operating personnel
Or operation device operating function detection switching servicing unit 4, coordinate checking signal to be verified.
Further, the step 9 lattice structure body examination test-run a machine 1 receives what is transmitted by lattice structure body 2 to be learned
Verify that signal and the analysis of step 10 intelligence test processing module judge checking signal, when verifying that signal meets expected, complete
Lattice structure body 2 to be learned learns and verified.
Further, the step 9 lattice structure body examination test-run a machine 1 receives what is transmitted by lattice structure body 2 to be learned
Verify that signal and the analysis of step 10 intelligence test processing module judge checking signal, when verifying that signal does not meet expected, send
Information and instruction, remind operating function detection switching servicing unit 4, more than default prompting number of times or operation overtime, then prompting is tested
Card failure, request relearns operation or takes out the lattice structure body 2 to be learned of non-learning success.
Further, the step 4 to step 7 can weave into group, be repeated several times and occur, the step 8 to step 10 energy
Group is enough weaved into, is repeated several times and occurs.
Further, the step 3 to step 10 can weave into group, be repeated several times and occur.
The operation principle of the present embodiment is as follows：
First lattice structure body 2 to be learned is completed to be connected by bay insertion groove 3 with lattice structure body examination test-run a machine 1, then
Start the intelligence test processing module on lattice structure body examination test-run a machine 1, intelligence test processing module is exported by bay insertion groove 3
Learning signal, learning signal is transmitted by lattice structure body 2 to be learned, operating function detection switching servicing unit 4, disturbance
Learning signal, lattice structure body examination test-run a machine 1 receives the learning signal disturbed transmitted by lattice structure body 2 to be learned,
Intelligence test processing module analyzes the composition and function for judging wire harness, and intelligence test processing module is exported by bay insertion groove 3
Signal is verified, user's compounding practice Function detection switching servicing unit 4 is reminded, checking signal passes through lattice structure body 2 to be learned
It is transmitted, lattice structure body examination test-run a machine 1 receives the checking signal transmitted by lattice structure body 2 to be learned, intelligence test
Processing module analysis judges checking signal, according to the situation of correcting errors of checking signal, automatically generates the wire harness specification after study and survey
Examination data reminds user to re-operate study.
The preferred embodiments of the present invention are the foregoing is only, are not intended to limit the invention, for the skill of this area
For art personnel, the present invention can have various modifications and variations.Within the spirit and principles of the invention, that is made any repaiies
Change, equivalent substitution, improvement etc., should be included in the scope of the protection.
Claims (2)
1. lattice structure body examination test-run a machine target dot matrix structure self study test device, it is characterised in that：Including lattice structure body
Test machine（1）With lattice structure body to be learned（4）, the lattice structure body examination test-run a machine（1）Intelligence test processing module is inside set,
The bay insertion groove set with outside（3）Connection, the lattice structure body to be learned（4）Switch servicing unit with Function detection
（2）Connection, Function detection switching servicing unit（2）It is provided with first end winding displacement and plug is installed（5）, wire harness winding displacement group and the second end
Winding displacement installs plug（6）, it is connected with each other successively, the lattice structure body examination test-run a machine（1）Pass through bay insertion groove（3）With waiting to learn
Practise lattice structure body（4）Connection, the Function detection switches servicing unit（2）Comprising sensor, switch, electronic component and connect
Plug-in unit approbating and reprobating and combining, and the intelligence test processing module can recognize that and treated by a series of automatic execution steps
Learn the specifications and models of lattice structure body, and automatically generate corresponding optimum test procedure combination, its step is as follows：
Step 1）By lattice structure body to be learned（4）Pass through bay insertion groove（3）With lattice structure body examination test-run a machine（1）The company of completion
Connect；
Step 2）Lattice structure body examination test-run a machine（1）Start intelligence test processing module；
Step 3）Intelligence test processing module passes through bay insertion groove（3）Export learning signal；
Step 4）Learning signal passes through lattice structure body to be learned（4）It is transmitted；
Step 5）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）The learning signal of transmission；
Step 6）Intelligence test processing module analyzes the composition and function for judging wire harness；
Step 7）Intelligence test processing module passes through bay insertion groove（3）Output checking signal；
Step 8）Checking signal passes through lattice structure body to be learned（4）It is transmitted；
Step 9）Lattice structure body examination test-run a machine（1）Receive by lattice structure body to be learned（4）The checking signal of transmission；
Step 10）The analysis of intelligence test processing module judges checking signal, wire harness specification and test data after generation study.
2. the lattice structure body examination test-run a machine target dot matrix structure self study test device according to claim 1, its feature
It is：The sensor includes temperature sensor, pressure sensor, displacement transducer, velocity sensor, humidity sensor, light
Line sensor, infrared sensor, electromagnetic sensor；The switch includes mechanical switch, electronic switch, and electric mechanical is opened
Close and the device with switching function；The electronic component includes diode, triode, electric capacity and with multiple electronics member devices
The circuit board of part；The connector includes metal connector, plastics connector and composite connector.
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| CN104502784A (en) * | 2015-01-05 | 2015-04-08 | 苏州路之遥科技股份有限公司 | Target wire harness self-learning testing method for wire harness intelligent testing machine |
| CN104596568A (en) * | 2015-01-05 | 2015-05-06 | 苏州征之魂专利技术服务有限公司 | Lattice structure tester target lattice structure self-learning test method |
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| US20080103713A1 (en) * | 2006-10-27 | 2008-05-01 | Barford Lee A | Labeling Asymmetric Cables For Improved Network Clock Synchronization |
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| CN1693835A (en) * | 2005-02-04 | 2005-11-09 | 陈刚 | Method for caption displaying by firecracker in the sky and its launching system |
| CN201449431U (en) * | 2009-04-27 | 2010-05-05 | 中国人民解放军第二炮兵工程学院 | Wireless tester for cable path |
| CN201600422U (en) * | 2009-08-19 | 2010-10-06 | 营口文化配线有限公司 | Wiring harness breakover detecting device |
| CN101793483A (en) * | 2009-12-04 | 2010-08-04 | 西安信唯信息科技有限公司 | Numerical control firework advertisement caption system |
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