CN104584194A - 衬底处理装置 - Google Patents

衬底处理装置 Download PDF

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CN104584194A
CN104584194A CN201380045437.0A CN201380045437A CN104584194A CN 104584194 A CN104584194 A CN 104584194A CN 201380045437 A CN201380045437 A CN 201380045437A CN 104584194 A CN104584194 A CN 104584194A
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梁日光
宋炳奎
金劲勋
金龙基
申良湜
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Abstract

根据本发明的实施方式,一种衬底处理装置,在其中进行衬底的处理,该衬底处理装置包括:主腔室本体,其具有开口的顶部形状,并具有形成在其上的通道,并使得衬底能够进入且退出;腔室盖,其被设置在主腔室本体的顶部上并关闭主腔室本体的开口的顶部以提供在其中进行衬底处理的处理空间;基座,其被设置在处理空间内并加热衬底;以及加热块,其被设置在通道的顶部和底部上并实现对经由通道被装载的衬底的预加热。

Description

衬底处理装置
技术领域
此处公开的本说明涉及用于处理衬底的装置,尤其涉及其中在通道(passage)上安装上加热块与下加热块以在衬底上执行初步加热的衬底处理装置。
背景技术
一种半导体装置,该半导体装置包括硅衬底上的多个层。这些层通过沉积处理沉积在衬底上。沉积处理具有对于评估已沉积的层以及选择沉积方法来说很重要的多个重大问题。
第一,重大问题中的一个示例就是每一沉积层的“质量”。“质量”代表成份、污染程度、缺陷密度以及机械和电气属性。沉积层的成份可根据沉积条件而改变。这对于获得特定成份来说非常重要。
第二,重大问题的另一示例就是晶圆上的一致厚度。特别是,沉积在具有非平面形状(具有阶梯部分)的图案上的层的厚度非常重要。此处,已沉积的膜的厚度是否一致可通过阶梯覆盖率来决定,覆盖率被定义为阶梯部分上所沉积的膜的最小厚度除以图案上所沉积的膜的厚度的比例。
有关沉积的其他问题可以是填充空间。这代表间隙填充,其中包括氧化物层的绝缘层被填入金属线之间。间隙被设置为多条金属线彼此之间的物理及电气隔离。
在这些问题中,一致性对于沉积处理是非常重要的问题之一。不一致的层会导致金属线上的高电阻从而增加机械损伤的可能性。
发明内容
技术问题
本发明提供一种衬底处理装置,其中在通道上安装上加热块与下加热块,以便在衬底装载到基座(susceptor)之前,在衬底上执行初步加热。
参照下列详细说明以及附图将使本发明的其他目的变得清楚。
技术方案
本发明的实施方式提供衬底处理装置,执行对于衬底的处理,该衬底处理装置包括:腔室本体,其具有开口的上侧部,所述腔室本体包括限定在所述腔室本体一侧内的通道以使得经由所述通道装载或卸载所述衬底;腔室盖,其被设置在所述腔室本体的所述开口的上侧部上以覆盖所述腔室本体的所述开口的上侧部,所述腔室盖提供处理空间,在所述处理空间中执行对于所述衬底的处理;基座,其被设置在所述处理空间内以加热设置在所述基座的上表面上的所述衬底;加热块,其被设置在所述通道上部或下部上以对经由所述通道装载的所述衬底进行初步加热;以及端部执行器,其经由所述通道与所述衬底一起移动并将所述衬底装载在所述基座的上表面上。
在一些实施方式中,所述腔室本体可以具有上开口和下开口,所述上开口和所述下开口被分别限定在所述通道的上部与下部内,并且所述衬底处理装置可以包括:上加热块,其被固定至所述上开口,所述上加热块具有与所述处理空间隔离开的上安装空间;以及下加热块,其被固定至所述下开口,所述下加热块具有与所述处理空间隔离开的下安装空间。
在另一些实施方式中,所述上加热块的上侧部与所述下方加热块的下侧部可以被开口,并且所述衬底处理装置包括:上盖,其覆盖所述上加热块的所述开口的上侧部以将所述上安装空间与外界隔离;以及下盖,其覆盖所述下加热块的所述开口的下侧部以将所述下安装空间与外界隔离。
在又一些实施方式中,该衬底处理装置还可以包括设置在所述基座外侧的、围绕所述基座的喷嘴环,所述喷嘴环向上喷射惰性气体。
在又一些实施方式中,所述腔室本体可以具有限定在与所述通道相对的一侧内的排放通道,并且所述衬底处理装置还可以包括导流部,该导流部被设置在所述基座外侧,并向所述排放通道引导所述处理气体,其中,所述导流部可以包括:圆形引导部,其具有与所述基座同心的弧形,所述圆形引导部具有多个引导孔;以及线形引导部,其连接至所述圆形引导部的两侧部,并且分别被设置在所述基座的两侧部上,所述线形引导部的每个具有与所述衬底的装载方向基本平行的引导表面。
有益效果
根据本发明的实施方式,由于在衬底被装载到举升销上之前,上加热块和下加热块被安装在通道上以对衬底进行初步加热,所以可以缩短在沉积处理期间通过利用基座加热衬底所需要的时间以改善生产率。
附图说明
图1为根据本发明实施方式的衬底处理装置的示意图;
图2为例示图1的衬底处理装置的处理进度状态的示意图;以及
图3为例示图1的衬底处理装置的处理空间的剖面图。
具体实施方式
以下将参照图1至图3来详细说明本发明的示例性实施方式。然而,能以不同形式的修改来具体表达本发明,并且不应受此处提出的实施方式的限制而解释本发明。而是提供这些实施方式以使得本公开充分且完整,并且使本发明的范畴充分传递给本领域技术人员。在附图中,为了例示的清楚性放大了组件的形状。另外,虽然将衬底作为示例来描述,但是本发明可适用于许多要处理的物体。
图1为根据本发明实施方式的衬底处理装置的示意图,并且图2为例示图1的衬底处理装置的处理进度状态的示意图。参照图1,衬底处理装置1包括主腔室10以及腔室盖15。主腔室10具有开口的上侧部。另外,通道8被限定在主腔室10的侧部内,经由该通道8使得衬底W是可接入的。经由主腔室10的侧部内限定的通道8,将衬底W装载到主腔室10中或从主腔室10卸载。闸阀5被设置在通道8外部,通道8可由闸阀5开启或关闭。
腔室盖15覆盖主腔室10的开口的上侧部以阻挡从外界的接入。气体供应孔38穿过腔室盖15的顶壁。因此,经由气体供应孔38将处理气体供应到主腔室10内。该处理气体被连接至处理气体储存槽90。另外,通过开启或关闭阀门93可调整处理气体流入率。处理气体可经由气体供应孔38被供应,以执行沉积处理。在必要的情况下,可经由连接至气体供应孔38的远程等离子系统(RPS)95,将其中混合了NF3和Ar的清洁气体供应至主腔室10内,以在主腔室10内执行清洁处理。
具有多个扩散孔35的喷头30被安装在腔室盖15的下表面上。喷头30将经由气体供应孔38供应的处理气体扩散至衬底W上。基座20安装在主腔室10内。另外,基座20被设置在衬底W的下面以加热衬底W。基座20可以具有大于衬底W的面积的面积,以便均匀加热衬底W。另外,基座20可具有与衬底W的形状相对应的圆碟形。基座20内安装加热器(未示出)。另外,基座20可以是能旋转的。
举升销(lift pin)25可穿过基座20的一侧部部分。经由通道8输送的衬底W被装载在举升销25的上部。举升销升降单元27被设置在举升销25下面来升降举升销25。如图2中所示,当装载了衬底W时,举升销25可下降使衬底W装载在基座20的顶部表面上,从而执行沉积处理。
处理空间3被限定在基座20与喷头30之间。对于衬底W的处理在衬底W被装载在处理空间3内的状态下执行。主腔室10从其底部表面凹陷以限定其中设置基座20的辅助空间4。喷嘴环70沿着辅助空间4中的基座20的周围设置,以防止经由基座20以及主腔室10的底部表面与基座20之间的间隙而引入处理气体。喷嘴环70具有多个喷孔73以从惰性气体储存槽75接收惰性气体,从而将惰性气体喷入处理空间3。
如图1中所示,通道8在其上部与下部中的每个中具有开口40a、50a,并且开口40a、50a与通道8接通。上加热块40与下加热块50关闭上开口与下开口,并具有上安装空间43和下安装空间53。上加热器45与下加热器55被分别设置在上安装空间43与下安装空间53内。上加热块40与下加热块50可先加热经由通道8进入的衬底。上加热块40与下加热块50可相对于通道8内衬底W进入的位置垂直地、彼此对称地设置,以便用相同温度对衬底W的顶部表面与底部表面进行初步加热。
下加热块50具有开口的下侧部。下盖57覆盖下加热块50的开口的下侧部,以将下加热块50内侧与外界隔离。因此,下加热块50内侧限定的下安装空间53与处理空间3被分隔开,并且与外界隔开。类似地,上加热块40具有开口的上侧部。上盖47覆盖上加热块40的开口的上侧部以将上加热块70的内侧与外界隔离开。因此,上加热块40内侧限定的上安装空间43与处理空间3分隔开,并且与外界隔开。
上加热器45与下加热器55分别设置在上安装空间43与下安装空间53内。Kanthal加热器可用作上加热器45与下加热器55中的每个。Kanthal可为Fe-Cr-Al合金,其中铁用作主材料。因此,Kanthal可具有高热阻和高电阻。
上加热器45和下加热器55都排列在与衬底W平行的方向上。上加热器45加热上加热块40。即,上加热器45经由上加热块70通过辐射间接加热衬底W。类似地,下加热器55加热下加热块50。即,下加热器55经由下加热块50间接加热衬底W。因此,可以最小化根据上加热器45或下加热器55的位置的衬底W上的热偏差。由上加热器45与下加热器55的位置所造成的温度偏差可经由上加热块40与下加热块50减缓以将衬底W上的热偏差最小化。衬底W上的热偏差可导致处理的不一致性。结果会造成所沉积的薄膜的厚度偏差。
因此,根据本发明,衬底W可在通道8上先加热。即,在装载衬底W之前可对衬底W进行初步加热,从而防止衬底W弯曲并且缩短将安装在基座20上的衬底W加热至沉积处理温度所需的时间。因为衬底W具有圆碟形,所以用于初步加热衬底W的上加热块40与下加热块50可连接至控制上加热块40和下加热块50的控制单元(未示出),以针对衬底W的中央部分与边缘部分,以不同次数并在不同温度之下操作上加热块40和下加热块50,从而执行初步加热。
如图2中所示,上加热器45和下加热器55分别安装在上安装空间43和下安装空间53内,经由上加热块40和下加热块50对衬底W进行初步加热。衬底W可由控制单元控制以默认速度和时间穿过上加热块40和下加热块50,以被初步加热。另外,上加热块40和下加热块50可由例如高纯度石英的材料形成。石英可以具有相对高的结构强度,并且在沉积处理环境下不会发生化学反应。因此,设置为保护腔室内壁的多个衬垫也可由石英材料形成。
经由气体供应孔38供应至处理空间3中的处理气体经由喷头30被扩散,然后沉积在衬底W上。在该沉积处理之后,反应副产品或反应气体可经由通道8的相对侧部内限定的排放通道80被抽出。排放泵85可经由排放端口83连接至排放通道80,以将处理气体抽取导入到处理空间3中,从而将抽出的处理气体排至外界。基座20可以是能旋转的,以让所扩散的处理气体均匀沉积在衬底W上。导流部60可设置在基座20之外以引导处理气体的流动,以使得处理气体流向排放通道80。衬底W的移动路径以及导流部60的结构将参考图3来说明。
图3为例示图1的衬底处理装置的处理空间的剖面图。参照图3,处于设置在端部执行器92上的状态下的衬底W经由闸阀5进入通道8。在穿过上加热块40和下加热块50的同时,进入的衬底W可被初步加热。上加热块40和下加热块50中的每个可以具有大体上等于或大于衬底W直径的宽度d。如上所述,可以由控制单元根据衬底W的区域控制安装在上安装空间43和下安装空间53中的上加热器45和下加热器55中的每个的密度。此外,该控制单元可控制衬底W的移动速度。
经初步加热的衬底W被安装在基座20上,以执行对于衬底W的沉积处理。
处理气体可经由喷头30扩散到衬底上。其上安装基板W的基座20可以是能旋转的,从而处理气体能够被均匀沉积在衬底W上。可提供导流部60以使处理气体被均匀沉积在衬底W上,并且使其中衬底W不与处理气体反应的处理空间3最小化。导流部60包括线形引导部63和圆形引导部67,线形引导部63被设置在主腔室10内,以将基座20之外衬底W不与处理气体反应的空间最小化,圆形引导部67将一致的处理气体导流向排放通道80。线形引导部63具有与衬底W的移动方向(或通道8的纵向)基本平行的引导表面63a。因为圆形引导部67具有多个引导孔,所以经由排放通道80抽出并且排至外界的处理气体可均匀逸散。
因此,衬底W可通过利用通道8上部上的上加热块40和下部上的下加热块50初步加热,以防止由于衬底W不均匀的热梯度而造成该衬底的弯曲。特别是,因为在衬底W移动时衬底W由上加热块40和下加热块50以扫描的形式加热,所以上加热块40和下加热块50不局部地集中在衬底W上,并且能够快速地将衬底W初步加热至高温。
此外,由于衬底W被以预设温度加热以在举升销25上装载经初步加热的衬底W,所以可缩短将衬底W加热至沉积处理所需的沉积温度所需要的时间,以改善生产率。在衬底W的装载过程期间执行初步加热,所以不需要初步加热的时间。如果衬底W仅由基座20加热至沉积温度,则加热时间由为了防止衬底W的弯曲的低速加热而增加,衬底W的弯曲由于为了最小化加热时间而进行的高速加热而发生。
此外,可安装导流部60以最小化处理空间。另外,可安装喷嘴环70以事先阻挡处理气体被引入基座20与主腔室10之间的空的空间,从而最大化衬底W与处理气体之间的反应。
虽然本发明以参考示例性实施方式来详细说明,但是本发明可以不同的形式具体实施。因此,以下所提出的技术理念与权利要求的范围都不受限于该较佳实施方式。
产业上的可利用性
本发明可应用于多种半导体制造设备及制造方法。

Claims (5)

1.一种衬底处理装置,该衬底处理装置包括:
腔室本体,其具有开口的上侧部,所述腔室本体包括限定在所述腔室本体一侧内的通道以使得经由所述通道装载或卸载所述衬底;
腔室盖,其被设置在所述腔室本体的所述开口的上侧部上以覆盖所述腔室本体的所述开口的上侧部,所述腔室盖提供处理空间,在所述处理空间中执行对于所述衬底的处理;
基座,其被设置在所述处理空间内以加热设置在所述基座的上表面上的所述衬底;
加热块,其被设置在所述通道上部或下部上以对经由所述通道装载的所述衬底进行初步加热;以及
端部执行器,其经由所述通道与所述衬底一起移动并将所述衬底装载在所述基座的上表面上。
2.如权利要求1所述的衬底处理装置,其中所述腔室本体具有上开口和下开口,所述上开口和所述下开口被分别限定在所述通道的上部与下部内,并且
所述衬底处理装置包括:
上加热块,其被固定至所述上开口,所述上加热块具有与所述处理空间隔离开的上安装空间;以及
下加热块,其被固定至所述下开口,所述下加热块具有与所述处理空间隔离开的下安装空间。
3.如权利要求2所述的衬底处理装置,其中,所述上加热块的上侧部与所述下方加热块的下侧部被开口,并且
所述衬底处理装置包括:
上盖,其覆盖所述上加热块的开口的上侧部以将所述上安装空间与外界隔离;以及
下盖,其覆盖所述下加热块的开口的下侧部以将所述下安装空间与外界隔离。
4.如权利要求1所述的衬底处理装置,该衬底处理装置还包括设置在所述基座外侧的、围绕所述基座的喷嘴环,所述喷嘴环向上喷射惰性气体。
5.如权利要求1所述的衬底处理装置,其中所述腔室本体具有限定在与所述通道相对的一侧内的排放通道,并且
所述衬底处理装置还包括导流部,该导流部被设置在所述基座外侧,并向所述排放通道引导所述处理气体,
其中,所述导流部包括:
圆形引导部,其具有与所述基座同心的弧形,所述圆形引导部具有多个引导孔;以及
多个线形引导部,其连接至所述圆形引导部的两个侧部,并且分别被设置在所述基座的两个侧部上,所述线形引导部中的每一个具有与所述衬底的装载方向基本平行的引导表面。
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