CN104461565B - A kind of optical module test parameter collocation method and system - Google Patents
A kind of optical module test parameter collocation method and system Download PDFInfo
- Publication number
- CN104461565B CN104461565B CN201410819549.3A CN201410819549A CN104461565B CN 104461565 B CN104461565 B CN 104461565B CN 201410819549 A CN201410819549 A CN 201410819549A CN 104461565 B CN104461565 B CN 104461565B
- Authority
- CN
- China
- Prior art keywords
- test
- parameter
- test parameter
- optical module
- postponed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The invention discloses a kind of optical module test parameter collocation method and system, method to include：The step of extracting the test parameter in optical module test program；The step of test parameter is configured according to presumptive test condition；By described the step of arriving database with the test parameter postponed storage.The efficiency of test parameter configuration, can quickly realize the configuration of test parameter, facilitate follow-up test process automatically when the present invention improves optical module test.
Description
Technical field
The present invention relates to optical module testing field, more particularly to a kind of optical module test parameter collocation method and system.
Background technology
In existing optical module test process, the parameter configuration of test program needs to use required for test program manually
Parameter value manual configuration corresponding to parameter name and title is into database, and then testing results program, test program are run
During these configurations are obtained from database, because test program and parameter configuration are not closed procedures, so in database
The possibility that parameter required for the parameter and test program of configuration does not correspond to is high, and manual operation easily malfunctions, and is joining
The correctness of configuration parameter can not be also verified when number configuration, so can only see that test program is by testing results program
No to report an error to check whether the parameter of configuration is correct, this inspection is extremely wasted time and energy, and influences optical module testing efficiency.
The content of the invention
It is an object of the invention to overcome the above-mentioned deficiency in the presence of prior art, there is provided one kind automatically configures test ginseng
Number, the high optical module test parameter collocation method of testing efficiency and system.
In order to realize foregoing invention purpose, the technical solution adopted by the present invention is：A kind of optical module test parameter configuration side
Method, including：
The step of extracting the test parameter in optical module test program；
The step of test parameter is configured according to presumptive test condition；
By described the step of arriving database with the test parameter postponed storage.
Preferably, it is described extraction optical module test program in test parameter the step of be specially：Skill is reflected by .NET
Art is by all pre-defined parameters, functional object and/or the function subobject in the code of the compiled test program
Reflect, then corresponding parameter name, functional object and/or subfunction object oriented are found by predetermined mark object；Its
Described in make a reservation for mark object set in the written in code of the test program.
Preferably, at least one parameter defined in code of the presumptive test condition for the test program of extraction
Title and its value；It is described according to presumptive test condition configure the test parameter the step of be specially:According to described at least one
The individual corresponding test parameter of parameter name and its value configuration.
Preferably, in addition to the display test parameter and/or it is described with the test parameter postponed the step of.
Preferably, in addition to described in verification the step of the presumptive test condition whether is met with the test parameter postponed
Suddenly；If so, then arrive database with the test parameter postponed storage by described.
The present invention also provides a kind of optical module test parameter configuration system, including：
Parameter extraction module, for extracting the test parameter in optical module test program；
Parameter configuration module, for configuring the test parameter according to presumptive test condition；
Memory module, for arriving database with the test parameter postponed storage by described.
Preferably, the parameter extraction module is specifically used for passing through .NET reflection technologies by the compiled test program
Code in all pre-defined parameters, functional object and/or function subobject reflect, then pass through predetermined mark pair
As finding corresponding parameter name, functional object and/or subfunction object oriented；Wherein described predetermined mark object is in the survey
Set during the written in code for trying program.
Preferably, at least one parameter defined in code of the presumptive test condition for the test program of extraction
Title and its value；The parameter configuration module is specifically used for being configured accordingly according at least one parameter name and its value
The test parameter.
Preferably, in addition to display module, for showing the test parameter and/or described with the test postponed ginseng
Number.
Preferably, in addition to correction verification module, for receive the parameter configuration module output with the test postponed
Parameter, whether verification is described meets the presumptive test condition with the test parameter postponed；If so, then export the configuration
The test parameter afterwards is to memory module.
Compared with prior art, beneficial effects of the present invention：
Test parameter of the present invention in optical module test program is automatically extracted before test program is run, according to presumptive test
Condition configures the test parameter and complies with test request, then arrives data with the test parameter postponed storage by described
Storehouse, carry out the test of optical module when test program is run with the test parameter postponed from database extraction automatically.The present invention can be certainly
The dynamic quick configuration for realizing test parameter, facilitate the optical module test process of later testing sequence so that optical module testing efficiency
Greatly improve.
Brief description of the drawings：
Fig. 1 is the optical module test parameter collocation method flow chart of the embodiment of the present invention；
Fig. 2 is the optical module test parameter configuration system block diagram of the embodiment of the present invention.
Embodiment
With reference to embodiment, the present invention is described in further detail.But this should not be interpreted as to the present invention
The scope of above-mentioned theme is only limitted to following embodiment, all models that the present invention is belonged to based on the technology that present invention is realized
Enclose.
Test parameter of the present invention in optical module test program is automatically extracted before test program is run, according to presumptive test
Condition configures the test parameter and complies with test request, then arrives data with the test parameter postponed storage by described
Storehouse, carry out the test of optical module when test program is run with the test parameter postponed from database extraction automatically.The present invention can be certainly
The dynamic quick configuration for realizing test parameter, facilitate the optical module test process of later testing sequence so that optical module testing efficiency
Greatly improve.Illustrate below in conjunction with the accompanying drawings.
A kind of light module test method as shown in Figure 1, comprises the following steps：
S1, extract the step of test parameter in optical module test program.
Specifically, it is described extraction optical module test program in test parameter the step of be specially：Skill is reflected by .NET
Art is by all pre-defined parameters, functional object and/or the function subobject in the code of the compiled test program
Reflect, then corresponding parameter name, functional object and/or subfunction object oriented are found by predetermined mark object；Its
Described in make a reservation for mark object set in the written in code of the test program.
Predetermined mark object is used to the parameter name in code, function pair in code while test program is developed
As, subfunction object is identified.Such as：[AttributeFieldProperties("CPDac experienced value
at T0 which makes cp in the tuning range at T0",
true, EnumDataType.Numeric, DefaultValue = "64", IsLimit = true,
LowerLimit = 48,
UpperLimit = 128)]
private const string CONST_CPDAC_INIT_T0 = "CPDAC_INIT_T0";
This identifies the parameter that one parameter name of object identity is " CPDAC_INIT_T0 ", and the value of the parameter
Type, default value 64 and value scope 48-128.
All defined parameters, the object reflection in compiled test program are come out by .NET reflection function, so
Corresponding parameter name, functional object, subfunction object etc. are found by predetermined mark object again afterwards.
S2, according to presumptive test condition configure the test parameter the step of.
The presumptive test condition for extraction the test program code defined at least one parameter name and
Its value；It is described according to presumptive test condition configure the test parameter the step of be specially:According at least one parameter
Title and its corresponding test parameter of value configuration.So that above-mentioned parameter name is the parameter of " CPDAC_INIT_T0 " as an example,
The range of parameter values 48-128 extracted, then set the parameter value according to the scope.
' Multifunctional debugging ' function is included in test program（That is functional object）, include again in ' Multifunctional debugging ' function
' extinction ratio debugging ', ' luminous power debugging ' subfunction（That is subfunction object）.' debugging mesh is included in ' extinction ratio debugging ' subfunction
Scale value ' parameter, ' debugging algorithm ' parameter etc., parameter again can include parameter describe, the type of parameter（Numeric type, character
Type ...）, parameter choosing value scope（Can be selected in multiple monodromes or a value scope）.
Example：
[AttributeFunctionProperties(EnumFunctionTestID.ATE_V_TxMultiTuning,
"Thrd1", 20, "")]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetAPD,
false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetCP, true)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetER, false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_SetIbias,
false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_MeasPwr,
false)]
[AttributeContainSubFunction(EnumSubFunctionTestID.ATE_MeasER,
false)]
internal class ATE_V_TxMultiTuning : ATEFunctionBase{}
This section of code definition One function object, entitled ' ATE_V_TxMultiTuning ', 6 is included in the function
Individual subfunction ' ATE_SetAPD ', ' ATE_SetCP ', ' ATE_SetER ', ' ATE_SetIbias ', ' ATE_MeasPwr ',
' ATE_MeasER ', wherein, subfunction ' ATE_SetCP ' is optional subfunction, and other 5 subfunctions are all essential subfunctions.
[AttributeFieldProperties("Sets the APD upper limit.", false,
EnumDataType.Numeric, DefaultValue = "50")]
private const string CONST_PARAMETER_MAXIMUM = "Maximum";This defines one
Individual functional parameter, while the data type of the parameter is also defined, and default value.
So parameter configuration can configure the test program, only run ' extinction ratio debugging ' in ' Multifunctional debugging ' function
Subfunction, without running ' luminous power debugging ' subfunction, naturally it is also possible to included in configuration operation ' Multifunctional debugging ' function
All subfunctions, it can also configure and not run ' Multifunctional debugging ' function.
S3, by it is described with postpone the test parameter storage arrive database the step of.
Automatically the test of optical module is carried out when test program is run with the test parameter postponed from database extraction.The present invention
Automatically the configuration of test parameter can be quickly realized, facilitates the optical module test process of later testing sequence so that optical module is tested
Efficiency greatly improves.
Preferably, in one example, database is arrived automatically according to predetermined keyword storage after the completion of configuration, tests journey
Can be got parms configuration during sort run by the keyword from database, and easy-to-look-up relevant parameter, testing different indexs can
To set different keywords, searched and configured with fast and easy.
Preferably, in one example, in addition to the display test parameter and/or described join with the test postponed
Several steps, is so presented in visual form computer screen, and for configuration, personnel carry out operative configuration, more convenient.
Preferably, also include whether verification is described meets described make a reservation for the test parameter postponed in one example
The step of test condition；If so, then arrive database with the test parameter postponed storage by described.Such as parameter name is
Value after the parameter configuration of " CPDAC_INIT_T0 " is 30, not in value scope 48-128, is then reconfigured, if the parameter is matched somebody with somebody
The value postponed is 50, then arrives database with the test parameter postponed storage by described.Can so ensure parameter configuration can
By property, follow-up test is avoided to malfunction.
Test parameter of the present invention in optical module test program is automatically extracted before test program is run, according to presumptive test
Condition configures the test parameter and complies with test request, then arrives data with the test parameter postponed storage by described
Storehouse, carry out the test of optical module when test program is run with the test parameter postponed from database extraction automatically.The present invention can be certainly
The dynamic quick configuration for realizing test parameter, facilitate the optical module test process of later testing sequence so that optical module testing efficiency
Greatly improve.
Based on same design, the present invention also provides a kind of optical module test parameter configuration system, referring to optical module shown in Fig. 2
Test parameter configures system, including：Parameter extraction module 1, for extracting the test parameter in optical module test program；Parameter is matched somebody with somebody
Module 2 is put, for configuring the test parameter according to presumptive test condition；And memory module 3, for matching somebody with somebody what is postponed by described
Database is arrived in the test parameter storage.
Preferably, the parameter extraction module is specifically used for passing through .NET reflection technologies by the compiled test program
Code in all pre-defined parameters, functional object and/or function subobject reflect, then pass through predetermined mark pair
As finding corresponding parameter name, functional object and/or subfunction object oriented；Wherein described predetermined mark object is in the survey
Set during the written in code for trying program.
Preferably, at least one parameter defined in code of the presumptive test condition for the test program of extraction
Title and its value；The parameter configuration module is specifically used for being configured accordingly according at least one parameter name and its value
The test parameter.
Preferably, in addition to display module, for showing the test parameter and/or described with the test postponed ginseng
Number.
Preferably, in addition to correction verification module（It is not shown）, for receive parameter configuration module output with postponing
The test parameter, whether verification is described meets the presumptive test condition with the test parameter postponed；If so, then export
It is described with the test parameter postponed to memory module.It should be noted that optical module test parameter shown in Fig. 2 configures system
Embodiment is made with the collocation method embodiment of optical module test parameter shown in Fig. 1 based on same design, and modules function can join
See that embodiment of the method relevant portion describes, be no longer described in detail herein.
Test parameter of the present invention in optical module test program is automatically extracted before test program is run, according to presumptive test
Condition configures the test parameter and complies with test request, then arrives data with the test parameter postponed storage by described
Storehouse, carry out the test of optical module when test program is run with the test parameter postponed from database extraction automatically.The present invention can be certainly
The dynamic quick configuration for realizing test parameter, facilitate the optical module test process of later testing sequence so that optical module testing efficiency
Greatly improve.
The embodiment of the present invention is described in detail above in conjunction with accompanying drawing, but the present invention is not restricted to
Embodiment is stated, in the case of the spirit and scope of claims hereof are not departed from, those skilled in the art can make
Go out various modifications or remodeling.
Claims (2)
- A kind of 1. optical module test parameter collocation method, it is characterised in that including：The step of extracting the test parameter in optical module test program；The step of test parameter is configured according to presumptive test condition；By described the step of arriving database with the test parameter postponed storage；It is described extraction optical module test program in test parameter the step of be specially：By .NET reflection technologies by all pre-defined parameters, the function pair in the code of the compiled test program As and/or function subobject reflect, then by predetermined mark object find corresponding parameter name, functional object and/or Subfunction object oriented；Wherein described predetermined mark object is set in the written in code of the test program, and is being developed Predetermined mark object is used to the parameter name in code, functional object, subfunction object in code while test program It is identified；The presumptive test condition for extraction the test program code defined at least one parameter name and Its value；It is described according to presumptive test condition configure the test parameter the step of be specially:According at least one parameter name and its corresponding test parameter of value configuration；Also include：Show the test parameter and/or it is described with the test parameter postponed the step of；Also include verification is described to match somebody with somebody the step of whether test parameter postponed meets the presumptive test condition；If so, then By described database is arrived with the test parameter postponed storage.
- 2. a kind of optical module test parameter configures system, it is characterised in that including：Parameter extraction module, for extracting the test parameter in optical module test program；Parameter configuration module, for configuring the test parameter according to presumptive test condition；Memory module, for arriving database with the test parameter postponed storage by described；The parameter extraction module is specifically used in the code of the compiled test program by .NET reflection technologies All pre-defined parameters, functional object and/or function subobject reflect, then are found accordingly by predetermined mark object Parameter name, functional object and/or subfunction object oriented；Generation of the wherein described predetermined mark object in the test program Code is set when writing, and uses predetermined mark object to the parameter name in code in code while test program is developed Title, functional object, subfunction object are identified；The presumptive test condition for extraction the test program code defined at least one parameter name and its take Value；The parameter configuration module is specifically used for configuring the corresponding survey according at least one parameter name and its value Try parameter；Also include：Display module, for showing the test parameter and/or described with the test parameter postponed；Also include：Correction verification module, for receive parameter configuration module output with the test parameter postponed, verify the configuration Whether the test parameter afterwards meets the presumptive test condition；If so, then output is described with the test parameter postponed To memory module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410819549.3A CN104461565B (en) | 2014-12-25 | 2014-12-25 | A kind of optical module test parameter collocation method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410819549.3A CN104461565B (en) | 2014-12-25 | 2014-12-25 | A kind of optical module test parameter collocation method and system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104461565A CN104461565A (en) | 2015-03-25 |
| CN104461565B true CN104461565B (en) | 2018-02-13 |
Family
ID=52907676
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410819549.3A Active CN104461565B (en) | 2014-12-25 | 2014-12-25 | A kind of optical module test parameter collocation method and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104461565B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105653416B (en) * | 2015-12-24 | 2018-01-02 | 索尔思光电（成都）有限公司 | A kind of optical module performance parameter adjustment method and system |
| WO2020150863A1 (en) | 2019-01-21 | 2020-07-30 | 上海燎云信息科技有限公司 | Optical communication module testing method and apparatus and terminal device |
| CN114124693A (en) * | 2021-11-08 | 2022-03-01 | 中国联合网络通信集团有限公司 | Parameter configuration method, device and storage medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101183332A (en) * | 2007-11-21 | 2008-05-21 | 北京中星微电子有限公司 | Method and device for automatically generating testing datasets by program content |
| CN102760096A (en) * | 2011-04-27 | 2012-10-31 | 阿里巴巴集团控股有限公司 | Test data generation method, unit testing method and unit testing system |
| CN103198015A (en) * | 2013-03-21 | 2013-07-10 | 中国人民解放军国防科学技术大学 | Embedded software reliability test data generating method based on using probability |
| CN103268285A (en) * | 2013-05-31 | 2013-08-28 | 百度在线网络技术（北京）有限公司 | Method and device for automatic generation of robustness test case of API interface |
| CN104035873A (en) * | 2014-06-30 | 2014-09-10 | 青岛海信电器股份有限公司 | Method and device for generating testing codes |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050273685A1 (en) * | 2004-06-08 | 2005-12-08 | Sanjay Sachdev | Automated and customizable generation of efficient test programs for multiple electrical test equipment platforms |
-
2014
- 2014-12-25 CN CN201410819549.3A patent/CN104461565B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101183332A (en) * | 2007-11-21 | 2008-05-21 | 北京中星微电子有限公司 | Method and device for automatically generating testing datasets by program content |
| CN102760096A (en) * | 2011-04-27 | 2012-10-31 | 阿里巴巴集团控股有限公司 | Test data generation method, unit testing method and unit testing system |
| CN103198015A (en) * | 2013-03-21 | 2013-07-10 | 中国人民解放军国防科学技术大学 | Embedded software reliability test data generating method based on using probability |
| CN103268285A (en) * | 2013-05-31 | 2013-08-28 | 百度在线网络技术（北京）有限公司 | Method and device for automatic generation of robustness test case of API interface |
| CN104035873A (en) * | 2014-06-30 | 2014-09-10 | 青岛海信电器股份有限公司 | Method and device for generating testing codes |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104461565A (en) | 2015-03-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106528424B (en) | Test method and test platform based on background system service or interface | |
| CN105302716B (en) | Test method, device under the development mode of interflow | |
| CN104461565B (en) | A kind of optical module test parameter collocation method and system | |
| CN104794057B (en) | A kind of crossing event automated testing method and device | |
| CN106776324A (en) | Interface test method and device | |
| CN104391796B (en) | A kind of test case analytic method | |
| CN104899150B (en) | Automated testing method and system and automation platform based on object-oriented | |
| WO2005072305A3 (en) | Efficient modeling of embedded memories in bounded memory checking | |
| CN101145993A (en) | A multi-point access interface test method and its test system | |
| CN103955429B (en) | Determine the method and device of regression test scope | |
| CN107577591A (en) | A kind of method, apparatus and system of automatic test abnormal protection | |
| Feiler et al. | Reliability validation and improvement framework | |
| CN109408379A (en) | One kind is based on promotion jmeter interface automatic test data matching method | |
| CN105007230B (en) | A kind of system and method for testing more wireless routers | |
| CN101425064A (en) | Processing method and system for testing log | |
| CN104090838A (en) | Method for generating test case | |
| CN210016474U (en) | Distribution network test control equipment and system | |
| CN105022864B (en) | A kind of system testing point choosing method that matrix is relied on based on extension | |
| CN109657265B (en) | Automatic expansion and contraction method for PCB circuit and drilling | |
| CN103188117B (en) | Information interaction server simulation testing device and method | |
| CN106547697B (en) | A kind of the automation formula correctness management method and device of NISSIN ion injection machine table | |
| CN107133168A (en) | A kind of sequence of events Fault Locating Method | |
| US20140365535A1 (en) | Visual data definition for identifying data items in loosely-structured data | |
| Alvez et al. | Towards cross-checking WordNet and SUMO using meronymy | |
| CN105786873B (en) | Search result method of adjustment and device based on question and answer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |