CN104459228A - 时域反射仪去嵌入探头 - Google Patents
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
本发明涉及时域反射仪去嵌入探头。去嵌入探头包括被配置为连接到测试下装置的输入、存储器、连接到该输入的信号发生器,该信号发生器被配置为生成测试信号,以及控制器,其被连接到信号发生器并被配置为控制该信号发生器。去嵌入探头可以被用在测试和测量系统中。该测试和测量系统还包括测试和测量仪器,其包括连接到去嵌入探头的控制器的处理器和测试和测量输入,该处理器被配置为提供指令给控制器,以及该测试和测量输入接收来自去嵌入探头的输出。
Description
技术领域
所公开的技术一般涉及信号采集系统,并且更特别地,涉及一种具有内部信号发生器的去嵌入(de-embed)探头,用于减少由于测试下装置的探头尖端加载而引起的测量误差。
背景技术
如编号7460983的题为“信号分析系统和校准方法”的美国专利、编号7414411的题为“用于多信号探头的信号分析系统及校准方法”的美国专利、编号7408363的题为“用于利用任意负载处理采集信号采样的信号分析系统及校准方法”的美国专利以及编号7405575的题为“用于测量测试下装置的阻抗的信号分析系统及校准方法”的美国专利中所述的去嵌入探头,将其中的每一个通过引用全部并入本文中,这些去嵌入探头使用探头内部的跨越探头尖端的切换负载来进行测量。在制造时间测量去嵌入探头的S参数,并且将其存储在探头内部的S参数存储器中。然后用户将探头连接到测试下装置,并按下校准按钮。该范围取得两个或三个被平均的采集,每一个具有跨越探头尖端切换的不同去嵌入负载。
在采集之后,示波器可以将测试下装置的阻抗作为频率的函数进行计算,并且还在测试下装置处提供波形的完全去嵌入视图,如同探头和示波器从未被连接一样。这也可以通过将以上所讨论的方法结合到矢量网络分析仪中来完成,该矢量网络分析器将两个去嵌入探头固定设备与信号源和装置一起使用以操作为使用两个去嵌入探头的矢量网络分析仪,如编号14/267,697的、标题为“使用去嵌入探头的双端口矢量网络分析仪”的美国专利申请中所讨论的那样,其通过引用全部并入本文中。
源阻抗,作为被探测时域信号的频率的函数,可以由具有各种负载部件的去嵌入探头来确定,例如编号为14/261,834的、题为切换负载时域反射仪去嵌入探头的美国专利申请中所描述的去嵌入探头,其通过引用全部并入本文中。通过在去嵌入探头内的已知的负载条件下观察测试下装置的信号来确定源阻抗。
编号14/267,697的、标题为使用去嵌入探头的双端口系统网络分析的美国专利申请,讨论了如何从具有外部信号发生器和两个去嵌入探头的测试下装置确定S参数。
然而,所有这些切换负载去嵌入方法需要来自测试下装置(DUT)或外部信号发生器的测试信号来以可重复的方式激励系统跨越所有感兴趣的频率。在某些情况下,DUT信号可能没有合适的频率内容或者是可重复的,或者用户可能希望测量处于静止状态下的DUT阻抗。
发明内容
所需要的是具有内部信号发生器的去嵌入探头,而没有所需要的任何切换负载部件。所公开的技术的某些实施例包括一种去嵌入探头,其包括被配置为连接到测试下装置的两个输入、存储器、连接到该两个输入的信号发生器,该信号发生器被配置为生成测试信号,以及控制器,其被连接到该信号发生器并被配置为控制该信号发生器。
所公开技术的某些实施例还包括在测试和测量系统内使用以上描述的去嵌入探头。该测试和测量系统还包括测试和测量仪器,该测试和测量仪器包括连接到去嵌入探头的控制器的处理器以及测试和测量输入,该处理器被配置为提供指令给控制器,以及该测试和测量输入用以接收来自去嵌入探头的输出。
所公开技术的某些其他特定实施例包括一种用于在活动的测试下装置内执行测试信号的电压测量的方法。该方法包括将测试信号注入到测试下装置的节点中,以及将与测试下装置的信号有关的第一电压测量从与测试信号有关的第二电压测量分离。
附图说明
图1图示了所公开技术的去嵌入探头的框图。
图2图示了使用图1的去嵌入探头的测试和测量系统。
图3-5图示了根据所公开技术的其他实施例的去嵌入探头的框图。
具体实施方式
在不一定按比例绘制的附图中,所公开的系统和方法的相同或相应的元素由相同的附图标记来表示。
所公开的技术包括具有位于探头内的信号发生器102的去嵌入探头100。不同于编号14/261,834,标题为切换负载时域反射仪去嵌入探头的美国申请,该去嵌入探头只包含信号发生器,并且不包含任何切换负载。去嵌入探头100可以是具有标准探头尖端的标准探头。去嵌入探头100也可以被实现为插入式(plug-in)模块。去嵌入探头可以与任何数目的输入连接一起使用,例如但不限于焊入式(solder-in)探头尖端。
去嵌入探头100包括连接到输出118的放大器104,以及在去嵌入探头中发现的典型电路,并如上述专利申请中所讨论的那样。典型电路未在图1中被示出。
去嵌入探头100还包括存储器部件108。存储器部件108存储将与测试和测量仪器共享的探头100的所测量的S参数,使得可以提供波形的去嵌入视图。存储器部件108还可以存储探头已经结合的典型功能。此外,存储器部件108不限于单一部件。存储器部件108可以由多个存储器部件组成。
如上所提及的,去嵌入探头100还包括信号发生器102。信号发生器102由控制器110所控制,该控制器110与如图2中所示的测试和测量仪器200的处理器204进行通信。信号发生器102可以是如传统上用于TDR的阶梯信号发生器、脉冲发生器、扫频正弦波发生器或宽波段频率内容的另一个源。信号发生器102优选地与放大器104相集成,以便维持去嵌入探头的小尺寸。
去嵌入探头100可以被用于探测测试下装置202的活动节点和静态节点两者以提供必要的测量。期望的是能够在节点活动时测量测试下装置202的源阻抗,因为当从阻抗测量切换到去嵌入电压测量模式时,将测试下装置202从静态切换到活动操作往往是不方便的,乃至是不可能的。此外,源阻抗可能在静态和活动操作之间改变。
为了能够在测试下装置202的活动节点上实现测量,由于来自测试下装置202的信号的注入电流,如图2中所示的测试和测量仪器200的处理器204能够分离去嵌入探头100的输入114和116或尖端处的电压信号。
如图2中所看出的,测试和测量仪器200还包括数字化器208。来自探头100的输出一般为模拟信号。该模拟信号由数字化器208所数字化,使得处理器204可以作用于该信号。
所公开技术的一些实施例中,用于将来自信号发生器102的注入测试信号针对来自测试下装置202的信号进行区分的一种技术是相比于来自测试下装置202的信号在随机的时间注入测试信号。测试和测量仪器200可以对来自信号发生器102的注入信号进行触发。这些采集然后可以被平均。平均该采集将使得来自测试下装置202的信号的平均朝向零进行平均。由此,仅来自出自该信号发生器102的注入测试信号的电压测量可以通过对来自测试下装置202的信号的电压测量达成平均数来确定。
在所公开的技术的其他实施例中,通过在相对于来自测试下装置202的重复信号的触发点所固定的时间注入来自信号发生器102的测试信号,来自信号发生器102的注入测试信号可以与来自测试下装置202的信号分离。然后,可以在测试信号存在和测试信号不存在的情况下进行采集。该信号发生器102由控制器110控制。控制器110通过通信链路120从测试和测量仪器200中的处理器204接收指令。然后采集可以彼此相减以将由于来自信号发生器102的注入信号而引起的探头尖端处的电压测量和来自测试下装置202的信号的电压测量分离。然而,仍可能需要某些平均来降低位于采集内的随机噪声。
控制器110还可以控制来自信号发生器102的测试信号是被输入到输入114还是输入116。取决于必要的期望采集,信号发生器可以被输入到二者。来自信号发生器102的不同测试信号可以被发送到输入114和输入116。例如,输入116可以接收测试信号,该测试信号是发送给输入114的测试信号的逆。在一些实施例中,多个信号发生器(未示出)可以被用来生成用于输入114和116的不同测试信号。例如,当使用多个信号发生器时,一个信号发生器被连接到输入114,而一个信号发生器被连接到输入116。每个信号发生器发送测试信号给每个输入。
此外,为了避免与测试下装置202的正常操作相干扰,当测量测试下装置202的活动节点时,来自信号发生器102的测试信号的注入电流相比于测试下装置202的节点中的信号的电流必须是小的。然而,所注入的电流也不能过小。如果测试信号的注入电流相比于测试下装置202的信号电流过小,则阻抗测量的精度被降低和/或可能增加测量时间。
来自信号发生器的注入信号的幅度是可编程的,使得其可以被修整为来自测试下装置202的信号的大小。即,注入信号幅度是来自测试下装置的信号的百分比。然而,如果在没有DUT信号的情况下探测静态节点,则不能使用DUT信号的百分比。在该情况下,可以使用如果节点是活动的情况下将会存在的DUT信号的百分比。此外,测试和测量仪器200可以基于测试下装置202的测量信号的幅度来自动确定来自信号发生器102的测试信号的幅度。
也就是说,测试和测量仪器的用户可以将注入信号的期望幅度输入到测试和测量仪器200的用户接口206中,或者测试和测量仪器200可以自动选择注入信号的期望幅度。用户接口206与处理器204进行通信,并且将所期望的幅度通过通信链路120从处理器204发送到去嵌入探头100的控制器110。
去嵌入探头100的校准仍然需要去嵌入探头100的负载阻抗的测量,并将测量存储在存储器部件108中。此外,如果当注入被关闭时负载阻抗发生变化,则其也可以被测量并被存储在存储器部件108中。去嵌入探头100的通过响应(through-response)也需要被测量并被存储在存储器部件108中。
此外,被注入到测试下装置202的节点中的测试信号也将需要被测量并被存储。这可以经由具有已知负载(例如开放式探头尖端浮置)的去嵌入探头100通过采集来自信号发生器102的注入测试信号来实现。频域中的采集信号将是注入测试信号电流、探头负载阻抗和探头通过响应的乘积。
然而,去嵌入探头100并不限于如图1中所示的三端口去嵌入探头。去嵌入探头还可以是如图3中所示的四端口去嵌入探头300。四端口去嵌入探头300类似于三端口去嵌入探头100,除了两个输出302和304具备放大器306和308。此外,去嵌入探头也可以是单端的去嵌入探头400,其具有单个输入402和单个输出404,如图4中所示。
此外,来自信号发生器102的测试信号并不需要被直接提供给探头输入114和116。例如,测试信号可以在被发送给去嵌入探头500的输入114之前,被输入到如图5中所见的衰减器502。
去嵌入探头100、300、400和500可以被用来采集各种测量,这些测量可以通过输出118传送给测试和测量仪器的处理器202。例如,通过使用所公开的技术,可以确定节点源阻抗、如果未加载的情况下的来自测试下装置202的信号电压、如果在一些特定负载的情况下的来自测试下装置202的信号电压、以及从当前节点上的信号到另一被探测节点的传输增益。在探测该测试下装置202时,在频域中的所采集的测试信号是注入测试信号电流、测试下装置202与探头负载阻抗的并联组合、以及探头通过响应的乘积。对测试下装置202的阻抗进行求解虑及了驱动探头负载阻抗的测试下装置202阻抗的分压器效应的确定。将该分压器比率划分成所采集的测试下装置202信号提供了测试下装置202信号的未加载视图。测试下装置202从一个节点到另一个节点的传输增益是第二节点的所计算的未加载测试信号响应与第一节点上的加载(实际)注入电压的比率。
优选地,如上所述,去嵌入探头100、300、400和500是高阻抗去嵌入探头而不是传统的50Ω探头。即,去嵌入探头100、300、400和500的输入阻抗充分高于测试下装置202的特性阻抗。例如,探头输入阻抗在低频下可以是50KΩ,在高频下降到225Ω,而在典型的双端50Ω系统中测试下装置阻抗可以标称上是25Ω。
测试和测量仪器200中处理器204和存储器(未示出)存储可执行指令,以用于实现上面讨论的特征。体现在计算机可读介质上的计算机可读代码,在被执行时,使计算机执行上述操作中的任意。如本文所使用的,计算机是可以执行代码的任何装置。微处理器、可编程逻辑器件、多处理器系统、数字信号处理器、个人计算机等等都是这种计算机的示例。在一些实施例中,计算机可读介质可以是被配置为以非暂时性方式存储计算机可读代码的有形计算机可读介质。
已经在其优选实施例中描述和说明了所公开技术的原理,应当清楚的是,在不背离这些原理的情况下,所公开技术可以在布置和细节上被修改。我们要求保护来自以下权利要求的精神和范围内的所有修改和变化。
Claims (14)
1.一种去嵌入探头,包括:
输入,其被配置为连接到测试下装置;
存储器;
信号发生器,其被连接到所述输入,所述信号发生器被配置为生成测试信号;以及
控制器,其被连接到所述信号发生器并被配置为控制所述信号发生器。
2.如权利要求1所述的去嵌入探头,其中所述去嵌入探头的输入阻抗高于所述测试下装置的特性阻抗。
3.如权利要求2所述的去嵌入探头,其中所述去嵌入探头不包括任何可切换负载部件。
4.如权利要求2所述的去嵌入探头,所述控制器进一步被配置为将所述信号发生器接通和关断。
5.如权利要求2所述的去嵌入探头,所述控制器进一步被配置为调整所述测试信号的幅度。
6.如权利要求2所述的去嵌入探头,其中所述去嵌入探头包括被配置为连接到测试下装置的两个输入。
7.一种测试和测量系统,包括:
权利要求2的去嵌入探头;以及
测试和测量系统,其包括:
处理器,其被连接到所述去嵌入探头的所述控制器,所述处理器被配置为提供指令给所述控制器,以及
测试和测量输入,其用以接收来自所述去嵌入探头的输出。
8.如权利要求7所述的测试和测量系统,其中所述测试和测量系统进一步包括用户接口,其被配置为接受所述测试信号的期望幅度的指示。
9.如权利要求7所述的测试和测量系统,其中在所述测试和测量输入处基于来自测试下装置的接收信号的幅度,所述处理器自动选择所述测试信号的幅度,并且其中所述控制器进一步被配置为基于所述选择调整所述测试信号的幅度。
10.如权利要求7所述的测试和测量系统,其中所述测试和测量仪器的处理器从所述测试和测量仪器接收来自所述测试下装置的输出,并且计算所述测试下装置的源阻抗。
11.如权利要求7所述的测试和测量系统,其中所述测试和测量仪器的处理器接收来自所述测试下装置的输出,并在所述去嵌入探头连接到所述测试下装置之前计算所述测试下装置上出现的未加载信号。
12.一种用于在活动的测试下装置内执行测试信号的电压测量的方法,包括:
将测试信号注入到所述测试下装置的节点中;以及
将与所述测试下装置的信号有关的第一电压测量从与所述测试信号有关的第二电压测量分离。
13.如权利要求12所述的方法,其中相比于来自所述测试下装置的信号,随机注入所述测试信号,以及
其中,将与所述测试下装置的信号有关的第一电压测量从与所述测试信号有关的第二电压测量分离包括:
每次注入所述测试信号时触发采集,以及
对所述采集求平均以确定与所述测试信号有关的第二电压测量。
14.如权利要求12所述的方法,其中在对于来自所述测试下装置的信号固定的时间注入所述测试信号,以及
其中,将与所述测试下装置的信号有关的第一电压测量从与所述测试信号有关的第二电压测量分离包括:
当所述测试信号接通时获取采集,
当所述测试信号断开时获取采集,以及
从当所述测试信号接通时的采集减去当所述测试信号断开时的采集,以确定与所述测试信号有关的第二电压测量。
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US14/317,389 US20150084660A1 (en) | 2013-09-25 | 2014-06-27 | Time-domain reflectometer de-embed probe |
US14/317389 | 2014-06-27 |
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CN117310292B (zh) * | 2023-11-28 | 2024-01-30 | 深圳市鼎阳科技股份有限公司 | 一种高频电源探头输入阻抗的测量系统、方法及介质 |
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US20150084660A1 (en) | 2015-03-26 |
JP2015064358A (ja) | 2015-04-09 |
EP2853912A1 (en) | 2015-04-01 |
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