CN104422866A - Test circuit and test device - Google Patents
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- CN104422866A CN104422866A CN201310372966.3A CN201310372966A CN104422866A CN 104422866 A CN104422866 A CN 104422866A CN 201310372966 A CN201310372966 A CN 201310372966A CN 104422866 A CN104422866 A CN 104422866A
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Abstract
The embodiment of the invention discloses a test circuit and a test device. The test circuit includes a direct current voltage-stabilized power source, an alternating current-direct current conversion circuit, an over-temperature detection circuit, a first control switch, a second control switch, an accumulative timer and at least two measured two light-emitting diodes, wherein the first control switch is connected in series between a working power source input end of the direct current voltage-stabilized power source and a commercial power source, the second control switch and the at least two measured light-emitting diodes are connected in series between a positive pole output end and a negative pole output end of the direct current voltage-stabilized power source, the over-temperature detection circuit detects the temperature of each measured light-emitting diode and drives the second control switch to be switched off when the temperature of at least one of the measured light-emitting diodes exceeds a high temperature threshold value, and the accumulative timer drives the first control switch to be switched off when preset test time comes. With the test circuit and the test device of the invention adopted, aging test efficiency can be improved, and a test period can be shortened, and manpower and material resources can be saved.
Description
Technical field
The present invention relates to electronic circuit field, be specifically related to a kind of test circuit and proving installation.
Background technology
In the burn-in test of light emitting diode (Light Emitted Diode, LED), in order to shorten test period, usually tested LED is placed in high-temperature cabinet, and the temperature of high-temperature cabinet is set to the higher limit close to LED junction temperature.Tested LED tests corresponding photoelectric parameter after being energized in hot environment and being aged to certain hour, such as, aging 100,240,500,1000,2000 ... corresponding photoelectric parameter is tested after hour.
Method of testing common is at present that digestion time is to carry out timing by manually beating stopwatch or record, and testing efficiency is low.And the light decay burn-in test due to LED is the test process that is energized for a long time, high-temperature cabinet may occur that in long-term work process temperature is too high, exceed the higher limit of the LED junction temperature that supplier specifies, thus cause the light decay data difference measured comparatively large, or tested LED burns.This likely forces the light decay burn-in test procedure ends of carried out some months even last year, and retests.
To sum up, current LED ageing testing method test period is long, and man power and material's cost is high.
Summary of the invention
Embodiments provide a kind of test circuit and test circuit, the testing efficiency of LED burn-in test can be improved, save test period and manpower and materials.
A kind of test circuit that first aspect present invention provides, comprises D.C. regulated power supply, AC/DC change-over circuit, excess temperature testing circuit, the first gauge tap, the second gauge tap, tired timer and at least 2 tested light emitting diodes, wherein,
Described first gauge tap is connected in series between the working power input end of described D.C. regulated power supply and mains supply; Between the cathode output end that described second gauge tap and described at least 2 tested light emitting diodes are connected in series in described D.C. regulated power supply and cathode output end;
The input end of described AC/DC change-over circuit is connected to described mains supply, mains electricity is converted to direct current and exports from its output terminal;
The power end of described excess temperature testing circuit is connected to the output terminal of described AC/DC change-over circuit, described excess temperature testing circuit detects the temperature of each described tested light emitting diode, drives described second gauge tap to disconnect when the temperature of tested light emitting diode exceedes high temperature threshold value described at least one;
The working power input end of described tired timer is connected to described mains supply, and described tired timer drives described first gauge tap to disconnect when arriving and presetting the test duration.
Alternatively, described first gauge tap and described second gauge tap are respectively the first relay and the second relay.
Alternatively, the temperature sensing circuit that described excess temperature testing circuit comprises switching tube, reference voltage generating circuit and adapts with the quantity of described tested light emitting diode, wherein,
Described reference voltage generating circuit comprises the first divider resistance and voltage stabilizing diode, the first end of described first divider resistance is connected to the output terminal of described AC/DC change-over circuit, second end of described first divider resistance is connected to the negative electrode of described voltage stabilizing diode, the negative electrode of described voltage stabilizing diode is the output terminal output reference voltage of described reference voltage generating circuit, and the anode of described voltage stabilizing diode is connected to earth point;
Each described temperature sensing circuit comprises a thermistor, second divider resistance, an integrated operational amplifier and first diode, the first end of described thermistor is connected to the output terminal of described AC/DC change-over circuit, second end of described thermistor is connected to the first end of described second divider resistance and the inverting input of described integrated operational amplifier, the in-phase input end of described integrated operational amplifier is connected to the output terminal of described reference voltage generating circuit, the output terminal of described integrated operational amplifier is connected to the negative electrode of described first diode, the anode of described first diode is the output terminal of described temperature sensing circuit, second end of described second divider resistance is connected to earth point,
The output terminal of each described temperature sensing circuit is connected to the driving pin of described switching tube, the positive pole of described switching tube is connected to the first end of the coil of described second relay, second end of the coil of described second relay is connected to the output terminal of described AC/DC change-over circuit, and the negative pole of described switching tube is connected to earth point.
Alternatively, described excess temperature testing circuit also comprises the first hummer and the second diode, and described first hummer is connected in series between the second end of the coil of described second relay and the output terminal of described AC/DC change-over circuit; The anode of described second diode is connected to the first end of described second relay coil, and the negative electrode of described second diode is connected to the second end of described second relay coil.
Alternatively, described AC/DC change-over circuit comprises transformer, rectifier bridge and three-terminal voltage-stabilizing chip, wherein,
The two ends of described primary transformer coil are connected to live wire and the zero line of described mains supply respectively, the two ends of described secondary transformer are connected to two input ends of rectifier bridge respectively, the cathode output end of described rectifier bridge is connected to the output terminal of described three-terminal voltage-stabilizing chip, the output terminal of described three-terminal voltage-stabilizing chip is the output terminal of described AC/DC change-over circuit, and the described earth point of three-terminal voltage-stabilizing chip and the cathode output end of described rectifier bridge are connected to earth point.
Alternatively, described AC/DC change-over circuit also comprises the first electric capacity and the second electric capacity, the first end of wherein said first electric capacity is connected to the input end of described three-terminal voltage-stabilizing chip, the first end of described second electric capacity is connected to the output terminal of described three-terminal voltage-stabilizing chip, and the second end of described first electric capacity and the second end of described second electric capacity are connected to earth point.
Alternatively, the common port of described tired timer is connected to the output terminal of described AC/DC output circuit, the first end of the coil of described first relay is connected to the normally closed contact of described tired timer, and the second end of the coil of described first relay is connected to earth point.
Alternatively, described test circuit also comprises the second hummer, and the first end of described second hummer is connected to the normally opened contact of described tired timer, and the second end of described second hummer is connected to earth point.
Alternatively, described test circuit also comprises current-limiting resistance, in the loop of at least 2 light emitting diode, described second gauge tap and described D.C. regulated power supply formations described in described current-limiting resistance is connected on.
Second aspect present invention also provides a kind of proving installation, comprises high-temperature cabinet, heat sink and the test circuit as described in any one possible implementation of first aspect present invention or first aspect, wherein:
Described at least 2 light emitting diodes in described test circuit are arranged on described heat sink, and described heat sink is placed in described high-temperature cabinet; Described excess temperature testing circuit in described test circuit detects the heat sink temperature of described light emitting diode position.
Test circuit provided by the invention detects the junction temperature of each LED in the light decay burn-in test process of LED, and the loop exporting excess temperature signal control LED when detecting that the junction temperature of at least one LED exceedes temperature threshold disconnects.The present invention can avoid high-temperature cabinet temperature too high in the long-term light decay burn-in test process of carrying out LED, ensures carrying out smoothly of light decay burn-in test, saves test period and manpower and materials.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the circuit diagram of a kind of test circuit that the embodiment of the present invention provides.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Please refer to Fig. 1, Fig. 1 is the circuit diagram of a kind of test circuit that the embodiment of the present invention provides, and comprising:
Comprise D.C. regulated power supply 101, AC/DC change-over circuit 102, excess temperature testing circuit 103, first gauge tap 104, second gauge tap 105, tired timer 106 and at least 2 tested light emitting diodes 107, wherein,
First gauge tap 104 is connected in series between the working power input end of D.C. regulated power supply 101 and mains supply; Between the cathode output end that second gauge tap 105 and at least 2 tested light emitting diodes are connected in series in D.C. regulated power supply 101 and cathode output end.
Wherein, first gauge tap 104 can be connected on one of the working power input end of D.C. regulated power supply 101 between lead-out terminal and the live wire of mains supply, or of working power input end being connected on D.C. regulated power supply 101 is between lead-out terminal and the zero line of mains supply.
The input end of AC/DC change-over circuit 102 is connected to mains supply, mains electricity is converted to direct current and exports from its output terminal;
The power end of excess temperature testing circuit 103 is connected to the output terminal of AC/DC change-over circuit 102, excess temperature testing circuit 103 detects the temperature of each tested light emitting diode, drives described second gauge tap to disconnect when the temperature of at least one tested light emitting diode exceedes high temperature threshold value.
Wherein, high temperature threshold value is a temperature value of the junction temperature higher limit close to light emitting diode vendors dictate.
The working power input end of tired timer 106 is connected to mains supply, and tired timer 106 drives the first gauge tap 104 to disconnect when arriving and presetting the test duration.
Alternatively, the first gauge tap 104 and described second gauge tap 105 are respectively the first relay K 1 and the second relay K 2.
Alternatively, the temperature sensing circuit that excess temperature testing circuit 103 comprises switching tube Q1, reference voltage generating circuit and adapts with the quantity of tested light emitting diode, wherein,
Reference voltage generating circuit comprises the first divider resistance R2 and voltage stabilizing diode Z1, the first end of the first divider resistance R2 is connected to the output terminal of AC/DC change-over circuit 102, second end of the first divider resistance R2 is connected to the negative electrode Z1 of voltage stabilizing diode, the negative electrode A of voltage stabilizing diode Z1 is the output terminal output reference voltage of reference voltage generating circuit, and the anode of voltage stabilizing diode Z1 is connected to earth point;
Each temperature sensing circuit comprises a thermistor, second divider resistance, an integrated operational amplifier and first diode, the first end of thermistor is connected to the output terminal of AC/DC change-over circuit 102, second end of thermistor is connected to the first end of the second divider resistance and the inverting input of integrated operational amplifier, the in-phase input end of integrated operational amplifier is connected to the output terminals A of reference voltage generating circuit, the output terminal of integrated operational amplifier is connected to the negative electrode of the first diode, the anode of the first diode is the output terminal of temperature sensing circuit, second end of the second divider resistance is connected to earth point,
The output terminal of each temperature sensing circuit is connected to the driving pin of switching tube Q1, the positive pole of switching tube Q1 is connected to the first end of the coil K2-1 of the second relay K 2, second end of the coil K2-1 of the second relay is connected to the output terminal of AC/DC change-over circuit 102, and the negative pole of switching tube Q1 is connected to earth point.
Wherein, two terminals of one group of normally closed contact K2-2 of relay K 2 are connected in LED loop, whether the coil K2-1 of relay K is connected in excess temperature testing circuit, be energized by excess temperature testing circuit control coil, thus controls normally closed contact disconnection when high temperature appears in tested LED.
Wherein, thermistor can be arranged near tested LED, as LED heat sink on installation site near.The heat sink of LED adopts aluminium base usually.
Alternatively, the temperature sensing circuit that excess temperature testing circuit comprises reference voltage generating circuit and adapts with the quantity of light emitting diode, the present embodiment comprises 5 tested LED for light emitting diode testing circuit and is described, those of ordinary skill in the art's easy understand, can be any number under the prerequisite that the quantity of the LED in light emitting diode testing circuit meets at external dc power power, the present embodiment comprises 5 tested LED and corresponding 5 excess temperature testing circuits are not limitation of the invention, and is only a kind of embodiment.
As shown in Figure 1, U1, U2, U3, U4, U5 are respectively the integrated operational amplifier of first to the 5th excess temperature testing circuit, can choose LM358 or LM324.RT1, RT2, RT3, RT4, RT5 are respectively the thermistor of first to the 5th excess temperature testing circuit, and RT1-RT5 is the thermistor of negative temperature system.R3, R4, R5, R6, R7 are respectively the second divider resistance of first to the 5th excess temperature testing circuit.D1, D2, D3, D4, D5 are respectively the first diode of first to the 5th excess temperature testing circuit, play one-way conduction effect.
Alternatively, excess temperature testing circuit 103 can also comprise the first hummer B1 and the second diode D6, between the second end that the first hummer B1 is connected in series in the coil K2-1 of the second relay K 2 and the output terminal of AC/DC change-over circuit 102; The anode of the second diode D6 is connected to the first end of the second relay coil K2-1, and the negative electrode of the second diode D6 is connected to second end of the second relay coil K2-1.
Alternatively, AC/DC change-over circuit 102 comprises transformer T1, rectifier bridge BD1 and three-terminal voltage-stabilizing chip U6, wherein,
The two ends of transformer T1 primary coil are connected to live wire and the zero line of mains supply respectively, the two ends of transformer T1 secondary coil are connected to two input ends of rectifier bridge BD1 respectively, the cathode output end of rectifier bridge BD1 is connected to the output terminal of three-terminal voltage-stabilizing chip U6, the output terminal of three-terminal voltage-stabilizing chip U6 is the output terminal of AC/DC change-over circuit 102, and the earth point of three-terminal voltage-stabilizing chip U6 and the cathode output end of rectifier bridge BD1 are connected to earth point.
Alternatively, AC/DC change-over circuit 102 also comprises the first electric capacity C1 and the second electric capacity C2, wherein the first end of the first electric capacity C1 is connected to the input end of three-terminal voltage-stabilizing chip U6, the first end of the second electric capacity C2 is connected to the output terminal of three-terminal voltage-stabilizing chip U6, and second end of the first electric capacity C1 and second end of the second electric capacity C2 are connected to earth point.
Alternatively, the common port of tired timer 106 is connected to the output terminal of AC/DC output circuit 102, the first end of the coil K1-1 of the first relay K 1 is connected to the normally closed contact of tired timer 106, and second end of the coil K1-1 of the first relay is connected to earth point.
Wherein, tired timer can be ELR-4A-H.
Alternatively, the test circuit that the present embodiment provides can also comprise the second hummer B2, and the first end of the second hummer B2 is connected to the normally opened contact of tired timer 106, and the second end of the second hummer is connected to earth point.
Alternatively, the test circuit that the present embodiment provides can also comprise current-limiting resistance R1, and current limliting electricity R1 is connected in the loop of at least 2 light emitting diodes, the second gauge tap and D.C. regulated power supply formation.
Thermistor RT1-RT5 is separately fixed on LED temperature measuring point by the present embodiment, one group of contact K2-2 of tested LED and relay K 2 is connected between the both positive and negative polarity of D.C. regulated power supply, and the break-make of D.C. regulated power supply is subject to the control of normally closed some K2-2 of relay K 2.After the AC/DC change-over circuit of test circuit switches on power, civil power carries out transformation through transformer T1 and obtains AC12V voltage, obtain DC12V voltage carrying out rectification through rectifier bridge BD1, carry out after filtering through C1, export three-terminal voltage-stabilizing chip U6 and carry out voltage stabilizing, the constant voltage DC of U6 output terminal, carries out peak absorbance by C2 further, obtains the DC voltage that quality is higher.RT1-RT5 selects according to the higher limit of LED junction temperature.A reference voltage is provided by Z1, LED temperature variation is monitored because RT1-RT5 is fixed in LED aluminum base plate, after LED temperature rises, the temperature of thermistor also can and then rise, resistance reduces, the voltage that second divider resistance is got just is higher than the voltage of Z1, integrated operational amplifier exports high level, make the gate pole of SCR thyristor charged, SCR turn on thyristors, audible alarm is carried out in hummer B conducting, relay coil K-1 obtains electric simultaneously, relay K-2 normally closed contact disconnects, external dc power output terminal and LED are disconnected, thus protection LED, hummer B reports to the police and has also pointed out tester, adjustment temperature can be carried out immediately after tester hears alarm equipment alarm, ensure the accuracy of test data and protect sample, the temperature detected when any one in RT1-RT5 is higher than high temperature threshold value, the voltage that in R3-R7, corresponding resistance is got all can more than the voltage of Z1, in U1-U5, corresponding integrated transporting discharging exports high level, now SCR turn on thyristors, reach the effect of control LED break-make.
When the present embodiment carries out LED burn-in test, first thermistor RT1-RT5 is separately fixed on LED temperature measuring point, connect the power supply of tired timer, then to set on tired timer ELR-4A-H when needing test light parameter light source want the aging time, connect the input end of AC/DC change-over circuit recently to mains supply.Start working after tired timer ELR-4A-H powers on, mains supply carries out transformation through transformer T1 and obtains AC12V voltage, obtain DC12V voltage carrying out rectification through BD1 rectifier bridge, then filtering is carried out through C1, through three-terminal voltage-stabilizing chip U6 stable output DC voltage, eventually pass C2 and carry out absorption peak voltage, obtain stable 12V VD, VD divides a road to common port 7 pin of tired timer ELR-4A-H, the coil K1-1 of relay K 1 is made to obtain electric by normally closed contact 8, thus the one group of normally opened contact K1-2 controlling the relay K 1 be connected between D.C. regulated power supply and its power supply closes, D.C. regulated power supply is energized, VD divides an other road to generate to reference voltage to produce reference voltage.Thermosensitive circuit RT1-RT5 will select according to high temperature threshold value and reference voltage.After LED temperature rises, the temperature of thermistor also can and then rise, resistance will reduce, the voltage that second divider resistance is got just is higher than the voltage of Z1, integrated operational amplifier exports high level, make switching tube Q1 conducting, B1 reports to the police, second relay K 2 coil K2-1 obtains electric simultaneously, second relay K 2 normally closed contact K2-2 disconnects, D.C. regulated power supply output terminal and tested LED are disconnected, thus protect tested LED, B1 reports to the police and has also pointed out tester, adjustment temperature can be carried out after tester hears alarm equipment alarm, ensure accuracy and the sample of test data.When the setting-up time of tired timer ELR-4A-H arrives setting-up time, normally closed contact 8 pin and common port 7 pin of tired timer ELR-4A-H disconnect, common port 7 pin and the conducting of normally opened contact 6 pin, make hummer B2 alarm tester testing photoelectronic parameter, first relay K 1 coil K1-1 also relay simultaneously, make D.C. regulated power supply power-off, tested LED is disconnected.
The present embodiment utilizes temperature detection to control, and achieves temperature protection control circuit, has the simple and safe advantage such as reliably.The present embodiment adopts tired timer self-clocking in addition, without the need to manual intervention, improves testing efficiency, saves testing cost, also can save the cycle of product development.
Present invention also offers a kind of embodiment of proving installation, comprise the test circuit of any one possibility of high-temperature cabinet, heat sink and Fig. 1 described in embodiment, wherein:
At least 2 light emitting diodes in test circuit are arranged on heat sink, and heat sink is placed in high-temperature cabinet; Excess temperature testing circuit in test circuit detects the heat sink temperature of light emitting diode position.
Wherein, the temperature of high-temperature cabinet is arranged on the higher limit close to tested junction temperature of light emitting diode.
Alternatively, each thermistor of the temperature sensing circuit in test circuit detects the heat sink temperature of light emitting diode position corresponding to this each thermistor.
The test circuit that the present embodiment provides can monitor the temperature of high-temperature cabinet in real time, and cut off the current supply circuit of tested light emitting diode when high-temperature cabinet exceedes high temperature threshold value and alert notice tester, simultaneously this enforcement can self-clocking, improve testing efficiency, save testing cost, also can save the cycle of product development.
Above disclosedly be only present pre-ferred embodiments, certainly can not limit the interest field of the present invention with this, therefore according to the equivalent variations that the claims in the present invention are done, still belong to the scope that the present invention is contained.
Claims (10)
1. a test circuit, is characterized in that, comprises D.C. regulated power supply, AC/DC change-over circuit, excess temperature testing circuit, the first gauge tap, the second gauge tap, tired timer and at least 2 tested light emitting diodes, wherein,
Described first gauge tap is connected in series between the working power input end of described D.C. regulated power supply and mains supply; Between the cathode output end that described second gauge tap and described at least 2 tested light emitting diodes are connected in series in described D.C. regulated power supply and cathode output end;
The input end of described AC/DC change-over circuit is connected to described mains supply, mains electricity is converted to direct current and exports from its output terminal;
The power end of described excess temperature testing circuit is connected to the output terminal of described AC/DC change-over circuit, described excess temperature testing circuit detects the temperature of each described tested light emitting diode, drives described second gauge tap to disconnect when the temperature of tested light emitting diode exceedes high temperature threshold value described at least one;
The working power input end of described tired timer is connected to described mains supply, and described tired timer drives described first gauge tap to disconnect when arriving and presetting the test duration.
2. circuit according to claim 1, is characterized in that, described first gauge tap and described second gauge tap are respectively the first relay and the second relay.
3. circuit according to claim 2, is characterized in that, the temperature sensing circuit that described excess temperature testing circuit comprises switching tube, reference voltage generating circuit and adapts with the quantity of described tested light emitting diode, wherein,
Described reference voltage generating circuit comprises the first divider resistance and voltage stabilizing diode, the first end of described first divider resistance is connected to the output terminal of described AC/DC change-over circuit, second end of described first divider resistance is connected to the negative electrode of described voltage stabilizing diode, the negative electrode of described voltage stabilizing diode is the output terminal output reference voltage of described reference voltage generating circuit, and the anode of described voltage stabilizing diode is connected to earth point;
Each described temperature sensing circuit comprises a thermistor, second divider resistance, an integrated operational amplifier and first diode, the first end of described thermistor is connected to the output terminal of described AC/DC change-over circuit, second end of described thermistor is connected to the first end of described second divider resistance and the inverting input of described integrated operational amplifier, the in-phase input end of described integrated operational amplifier is connected to the output terminal of described reference voltage generating circuit, the output terminal of described integrated operational amplifier is connected to the negative electrode of described first diode, the anode of described first diode is the output terminal of described temperature sensing circuit, second end of described second divider resistance is connected to earth point,
The output terminal of each described temperature sensing circuit is connected to the driving pin of described switching tube, the positive pole of described switching tube is connected to the first end of the coil of described second relay, second end of the coil of described second relay is connected to the output terminal of described AC/DC change-over circuit, and the negative pole of described switching tube is connected to earth point.
4. circuit according to claim 3, it is characterized in that, described excess temperature testing circuit also comprises the first hummer and the second diode, and described first hummer is connected in series between the second end of the coil of described second relay and the output terminal of described AC/DC change-over circuit; The anode of described second diode is connected to the first end of described second relay coil, and the negative electrode of described second diode is connected to the second end of described second relay coil.
5. circuit according to claim 3, is characterized in that, described AC/DC change-over circuit comprises transformer, rectifier bridge and three-terminal voltage-stabilizing chip, wherein,
The two ends of described primary transformer coil are connected to live wire and the zero line of described mains supply respectively, the two ends of described secondary transformer are connected to two input ends of rectifier bridge respectively, the cathode output end of described rectifier bridge is connected to the output terminal of described three-terminal voltage-stabilizing chip, the output terminal of described three-terminal voltage-stabilizing chip is the output terminal of described AC/DC change-over circuit, and the described earth point of three-terminal voltage-stabilizing chip and the cathode output end of described rectifier bridge are connected to earth point.
6. circuit according to claim 5, it is characterized in that, described AC/DC change-over circuit also comprises the first electric capacity and the second electric capacity, the first end of wherein said first electric capacity is connected to the input end of described three-terminal voltage-stabilizing chip, the first end of described second electric capacity is connected to the output terminal of described three-terminal voltage-stabilizing chip, and the second end of described first electric capacity and the second end of described second electric capacity are connected to earth point.
7. circuit according to claim 2, it is characterized in that, the common port of described tired timer is connected to the output terminal of described AC/DC output circuit, the first end of the coil of described first relay is connected to the normally closed contact of described tired timer, and the second end of the coil of described first relay is connected to earth point.
8. circuit according to claim 7, is characterized in that, described test circuit also comprises the second hummer, and the first end of described second hummer is connected to the normally opened contact of described tired timer, and the second end of described second hummer is connected to earth point.
9. circuit according to claim 1, is characterized in that, described test circuit also comprises current-limiting resistance, in the loop of at least 2 light emitting diode, described second gauge tap and described D.C. regulated power supply formations described in described current-limiting resistance is connected on.
10. a proving installation, is characterized in that, comprises high-temperature cabinet, heat sink and the test circuit as described in any one of claim 1 to 9, wherein:
Described at least 2 light emitting diodes in described test circuit are arranged on described heat sink, and described heat sink is placed in described high-temperature cabinet; Described excess temperature testing circuit in described test circuit detects the heat sink temperature of described light emitting diode position.
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| CN201310372966.3A CN104422866A (en) | 2013-08-23 | 2013-08-23 | Test circuit and test device |
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| CN201310372966.3A CN104422866A (en) | 2013-08-23 | 2013-08-23 | Test circuit and test device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105807807A (en) * | 2016-05-10 | 2016-07-27 | 倍科质量技术服务（东莞）有限公司 | LM-80 aging test system based on multilayer liquid cooling device and control method |
| CN110763969A (en) * | 2019-08-08 | 2020-02-07 | 浙江大学 | Light emitting diode and solar cell aging test system |
| CN114625198A (en) * | 2020-12-10 | 2022-06-14 | 圣邦微电子（北京）股份有限公司 | Over-temperature protection threshold value measuring device and measuring method thereof |
-
2013
- 2013-08-23 CN CN201310372966.3A patent/CN104422866A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105807807A (en) * | 2016-05-10 | 2016-07-27 | 倍科质量技术服务（东莞）有限公司 | LM-80 aging test system based on multilayer liquid cooling device and control method |
| CN110763969A (en) * | 2019-08-08 | 2020-02-07 | 浙江大学 | Light emitting diode and solar cell aging test system |
| CN114625198A (en) * | 2020-12-10 | 2022-06-14 | 圣邦微电子（北京）股份有限公司 | Over-temperature protection threshold value measuring device and measuring method thereof |
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| WD01 | Invention patent application deemed withdrawn after publication |