CN104391238A - Probe and testing device - Google Patents

Probe and testing device Download PDF

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Publication number
CN104391238A
CN104391238A CN201410725874.3A CN201410725874A CN104391238A CN 104391238 A CN104391238 A CN 104391238A CN 201410725874 A CN201410725874 A CN 201410725874A CN 104391238 A CN104391238 A CN 104391238A
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CN
China
Prior art keywords
needle body
frustum
spring
diameter
probe
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Granted
Application number
CN201410725874.3A
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Chinese (zh)
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CN104391238B (en
Inventor
孙俊民
薛金祥
王小虎
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BOE Technology Group Co Ltd
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BOE Technology Group Co Ltd
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Publication date
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Priority to CN201410725874.3A priority Critical patent/CN104391238B/en
Publication of CN104391238A publication Critical patent/CN104391238A/en
Application granted granted Critical
Publication of CN104391238B publication Critical patent/CN104391238B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The invention provides a probe and a testing device. The probe comprises a probe body and a signal wire. The signal wire comprises a wire core and an insulation layer wrapping the periphery of the wire core. The first end of the probe body is connected with the wire core, and the second end of the probe body is exposed for testing. The probe further comprises a clamping structure for clamping the probe body. By means of the clamping structure, the probe body can be firmly clamped, so that the problem that the probe body cannot stab stably or is easy to pull out in the testing process is solved, the testing signals can be led in normally, signal testing accuracy is ensured, and signal testing efficiency is further improved. Meanwhile, the probe body is convenient and quick to adjust by means of the clamping structure.

Description

A kind of probe and testing apparatus
Technical field
The present invention relates to semi-conductive electrical technical field of measurement and test, particularly, relate to a kind of probe and testing apparatus.
Background technology
Often need to use the terminal that probe unit carrys out connecting test instrument in the electrical performance testing process of semiconductor electrical performance testing and thin-film transistor LCD device array substrate (TFT LCD Array).
As shown in Figure 1, probe is generally made up of needle body 1 and signal wire 2.Signal wire 2 comprises three parts: outermost metal screen layer 23, intermediate insulating layer 22, the metal-cored i.e. core 21 of innermost layer.One end of needle body 1 is connected with the innermost layer of signal wire 2 is metal-cored, and the other end of needle body 1 is outside exposed, for the test signal of signal wire 2 is introduced into test position.
Whole signal wire 2 parcel is got rid of the interference of other signals by metal screen layer 23, and metal-cored is also that core 21 is generally hollow, mainly in order to needle body 1 be inserted into the inside and fix.Usually, the metal-cored internal diameter of hollow equals the diameter of needle body 1.At probe, the test signal in signal wire 2 is introduced in the process of test position, usually exposed one end of needle body 1 is needed to penetrate test position, make needle body 1 produce between penetrating in process is repeatedly easy to and is metal-cored thus to rub, thus cause the needle body after repeatedly penetrating 1 and metal-cored between connection loosen, make needle body 1 be easy to when penetrating test position occur pricking shakiness and running pin phenomenon, and then cause test signal introduce bad and test inaccurate; Meanwhile, needle body 1 is pricked shakiness or is run pin and also can have a strong impact on testing efficiency.
Summary of the invention
The present invention is directed to the above-mentioned technical matters existed in prior art, a kind of probe and testing apparatus are provided.This probe can make needle body by firm grip, thus makes needle body be not easy to occur pricking unstable or running pin phenomenon in test process, guarantees that test signal can normally be introduced, and then not only ensures the accuracy of signal testing, but also improve the efficiency of signal testing.
The invention provides a kind of probe for testing electrical property, comprise needle body and signal wire, described signal wire comprises core and is wrapped in the insulation course of described core periphery, the first end of described needle body is connected with described core, second end of described needle body is exposed outside for test, also comprise clamp structure, for clamping described needle body.
Preferably, described core is the hollow cylinder that can conduct electricity being wrapped in described insulation course inside, and the internal diameter of described hollow cylinder equals the diameter of described needle body;
Described clamp structure comprises frustum, described frustum offers the first through hole along its axis, the first end of described needle body is inserted in described hollow cylinder through described first through hole, and it is outer and near the larger bottom surface of the area of described frustum that the second end of described needle body is exposed to described frustum; The diameter of described first through hole is less than or equal to the diameter of described needle body;
Described frustum offers the breach running through its height in side along the bearing of trend of its axis, described breach and described first through hole through.
Preferably, described clamp structure also comprises pressure ring and spring, described pressure ring and described spring are all set on the side of described frustum, the internal diameter of described pressure ring and described spring is equal, and the diameter of the bottom surface that the area of frustum is larger described in the internal diameter < of pressure ring and described spring described in the diameter < of the less upper bottom surface of the area of described frustum.
Preferably, described pressure ring is than the bottom surface of described spring closer to described frustum, described spring is greater than the height of described frustum under non-stress along the height of the axis direction of described frustum, contacting with one end end face of described insulation course away from one end of described pressure ring of described spring.
Preferably, also comprise the outer cover be located at outside described clamp structure, described outer cover inside offers the second through hole, and the second end of described needle body is exposed outside described outer cover through described second through hole;
The inner wall of end of the close described needle body first end of described second through hole is provided with the first screw thread, described insulation course with described spring interface touch one end lateral surface on be provided with the second screw thread, described first screw thread and described second screw thread suitable.
Preferably, described signal wire also comprises metal screen layer, and it is peripheral that described metal screen layer is wrapped in described insulation course, for shielding external interference signal;
The described outer end covering on close described needle body second end of described second through hole is provided with stationary magazine creel, and the second end of described needle body is exposed outside described stationary magazine creel through described stationary magazine creel, and the diameter of described stationary magazine creel equals the diameter of described needle body.
Preferably, described outer cover and described stationary magazine creel all adopt isolation material, and described pressure ring and described spring adopt metal material.
Preferably, described frustum adopts rubber or plastic material.
The present invention also provides a kind of testing apparatus, comprises above-mentioned probe.
Beneficial effect of the present invention: probe provided by the present invention, by arranging clamp structure, make needle body can by firm grip, thus make needle body be not easy to occur pricking unstable or running pin phenomenon in test process, guarantee that test signal can normally be introduced, and then not only ensure the accuracy of signal testing, but also improve the efficiency of signal testing.Meanwhile, this clamp structure makes needle body regulate also more convenient.
Testing apparatus provided by the present invention, by adopting above-mentioned probe, improves testing efficiency and the testing precision of this testing apparatus.
Accompanying drawing explanation
Fig. 1 is the structure cut-open view of prior art middle probe;
Fig. 2 is the structure cut-open view of the embodiment of the present invention 1 middle probe;
Fig. 3 is the structural representation of frustum in Fig. 2;
Fig. 4 is the structural representation of clamp structure in Fig. 2;
Fig. 5 is the structural representation of outer cover and stationary magazine creel in Fig. 2.
Description of reference numerals wherein:
1. needle body; 11. first ends; 12. second ends; 2. signal wire; 21. cores; 22. insulation courses; 221. second screw threads; 23. metal screen layers; 3. clamp structure; 31. frustums; 311. first through holes; 312. bottom surface; 313. breach; 314. upper bottom surface; 32. pressure rings; 33. springs; 4. outer cover; 41. second through holes; 411. first screw threads; 5. stationary magazine creel.
Embodiment
For making those skilled in the art understand technical scheme of the present invention better, below in conjunction with the drawings and specific embodiments, a kind of probe provided by the invention and testing apparatus are described in further detail.
Embodiment 1:
The present embodiment provides a kind of probe for testing electrical property, as shown in Figure 2-5, comprise needle body 1 and signal wire 2, signal wire 2 comprises core 21 and is wrapped in the insulation course 22 of core 21 periphery, the first end 11 of needle body 1 is connected with core 21, and the second end 12 of needle body 1 is outside exposed, for test, also comprise clamp structure 3, for clamping needle body 1.
The setting of clamp structure 3, needle body 1 can be made by firm grip, thus make needle body 1 be not easy to occur pricking unstable or running pin phenomenon in test process, guarantee that test signal can normally be introduced, and then not only ensure the accuracy of signal testing, but also improve the efficiency of signal testing.
In the present embodiment, core 21 is for being wrapped in the hollow cylinder that can conduct electricity of insulation course 22 inside, and the internal diameter of hollow cylinder equals the diameter of needle body 1.So can guarantee the electric connection of needle body 1 and core 21.Clamp structure 3 comprises frustum 31, frustum 31 offers the first through hole 311 along its axis, the first end 11 of needle body 1 is inserted in hollow cylinder through the first through hole 311, and it is outer and near the larger bottom surface 312 of the area of frustum 31 that the second end 12 of needle body 1 is exposed to frustum 31; The diameter of the first through hole 311 is less than or equal to the diameter of needle body 1.Wherein, frustum 31 adopts rubber or plastic material.Setting like this, can make the clamping of frustum 31 pairs of needle bodies 1 tighter, makes needle body 1 be not easy prick unstable or run pin.
As shown in Figure 3, frustum 31 offers the breach 313 running through its height in side along the bearing of trend of its axis, breach 313 and the first through hole 311 through.The setting of breach 313, can make needle body 1 more convenient when dismounting, also helps the adjustment of the exposed length of part outside of needle body 1 simultaneously.
It should be noted that, what frustum 31 also can adopt other has certain flexible isolation material.
In the present embodiment, as shown in Figure 4, clamp structure 3 also comprises pressure ring 32 and spring 33, pressure ring 32 and spring 33 are all set on the side of frustum 31, the internal diameter of pressure ring 32 and spring 33 is equal, and the diameter of the larger bottom surface 312 of the area of the less diameter < pressure ring 32 of upper bottom surface 314 of the area of frustum 31 and the internal diameter < frustum 31 of spring 33.Wherein, pressure ring 32 and spring 33 adopt metal material.Setting like this, makes pressure ring 32 and spring 33 can not pass from thicker one end of frustum 31.Simultaneously, when spring 33 and pressure ring 32 are subject to the pressure towards the thicker one end of frustum 31, frustum 31 can compress by spring 33 and pressure ring 32, and the A/F of the breach 313 of frustum 31 side is reduced, thus make the corresponding reduction of the integral diameter of frustum 31, the entirety reduction of frustum 31 diameter can make the internal diameter of its inner first through hole 311 reduce, and then makes the clamping of frustum 31 pairs of needle bodies 1 more firm.
In the present embodiment, pressure ring 32 than the bottom surface 312 of spring 33 closer to frustum 31, because pressure ring 32 is less compared to the retractility of spring 33, so pressure ring 32 can make the clamping effect of frustum 31 pairs of needle bodies 1 better closer to the bottom surface 312 of frustum 31.Spring 33 is greater than the height of frustum 31 under non-stress along the height of the axis direction of frustum 31, contacting with one end end face of insulation course 22 away from one end of pressure ring 32 of spring 33.
In the present embodiment, as shown in Figure 5, probe also comprises the outer cover 4 be located at outside clamp structure 3, and outer cover 4 inside offers the second through hole 41, and the second end 12 of needle body 1 is exposed outside outer cover 4 through the second through hole 41.The inner wall of end of close needle body 1 first end 11 of the second through hole 41 is provided with the first screw thread 411, one end lateral surface contacted with spring 33 of insulation course 22 is provided with the second screw thread 221, first screw thread 411 and the second screw thread 221 suitable.Wherein, outer cover 4 adopts isolation material.
Suitable the screwing of the first screw thread 411 and the second screw thread 221 can make outer cover 4 and insulation course 22 be interconnected and tighten, pass through in the process of screwed tight at outer cover 4 and insulation course 22, bottom surface 312 direction of spring 33 towards frustum 31 can be compressed by one end end face contacted with spring 33 of insulation course 22, until spring 33 is concordant with the upper bottom surface 314 of frustum 31 by one end end face compressed.Now, spring 33 and pressure ring 32 can compress frustum 31, and make frustum 31 pairs of needle body 1 firm grip.
In the present embodiment, signal wire 2 also comprises metal screen layer 23, and it is peripheral that metal screen layer 23 is wrapped in insulation course 22, for shielding external interference signal.
Outer cover 4 is provided with stationary magazine creel 5 in the end of close needle body 1 second end 12 of the second through hole 41, and the second end 12 of needle body 1 is exposed outside stationary magazine creel 5 through stationary magazine creel 5, and the diameter of stationary magazine creel 5 equals the diameter of needle body 1.Wherein, stationary magazine creel 5 adopts isolation material.The arranging of stationary magazine creel 5 can make needle body 1 be not easy to run pin, thus the contact between the metal screen layer 23 avoiding needle body 1 and signal wire 2, and then avoids needle body 1 and the undesired signal in the external world is introduced into test position, disturbed test.
When the exposed length outside stationary magazine creel 5 of needle body 1 needs to regulate, manually being threaded between outer cover 4 with insulation course 22 can be rotated and loosen, along with loosening of connecting therebetween, the corresponding reduction of pressure of spring 33 and pressure ring 32 pairs of frustums 31, correspondingly, the corresponding increase of diameter of the first through hole 311 in frustum 31, now, can the exposed length of manual adjustments needle body 1, after regulating, again outer cover 4 and insulation course 22 are rotated and tighten up.So carry out installation to needle body 1 fix and regulate, substantially increase the efficiency of signal testing.
Embodiment 2:
The present embodiment provides a kind of probe for testing electrical property, and as different from Example 1, the clamp structure in the present embodiment only includes frustum, does not comprise pressure ring and spring.Wherein the structure of frustum is in the same manner as in Example 1.
Because frustum adopts rubber or plastic material, there is certain elasticity, so clamping can be kept to needle body, make needle body be not easy prick unstable or run pin.
Other structures of the present embodiment middle probe and material in the same manner as in Example 1, repeat no more herein.
The beneficial effect of embodiment 1-2: the probe in embodiment 1-2, by arranging clamp structure, make needle body can by firm grip, thus make needle body be not easy to occur pricking unstable or running pin phenomenon in test process, guarantee that test signal can normally be introduced, and then not only ensure the accuracy of signal testing, but also improve the efficiency of signal testing.Meanwhile, this clamp structure makes needle body regulate also more convenient.
Embodiment 3:
The present embodiment provides a kind of testing apparatus, comprises the probe of embodiment 1-2 in any one.
By adopting the probe of embodiment 1-2 in any one, improve testing efficiency and the testing precision of this testing apparatus.
Be understandable that, the illustrative embodiments that above embodiment is only used to principle of the present invention is described and adopts, but the present invention is not limited thereto.For those skilled in the art, without departing from the spirit and substance in the present invention, can make various modification and improvement, these modification and improvement are also considered as protection scope of the present invention.

Claims (9)

1. the probe for testing electrical property, comprise needle body and signal wire, described signal wire comprises core and is wrapped in the insulation course of described core periphery, the first end of described needle body is connected with described core, second end of described needle body is exposed outside for test, it is characterized in that, also comprise clamp structure, for clamping described needle body.
2. probe according to claim 1, is characterized in that, described core is the hollow cylinder that can conduct electricity being wrapped in described insulation course inside, and the internal diameter of described hollow cylinder equals the diameter of described needle body;
Described clamp structure comprises frustum, described frustum offers the first through hole along its axis, the first end of described needle body is inserted in described hollow cylinder through described first through hole, and it is outer and near the larger bottom surface of the area of described frustum that the second end of described needle body is exposed to described frustum; The diameter of described first through hole is less than or equal to the diameter of described needle body;
Described frustum offers the breach running through its height in side along the bearing of trend of its axis, described breach and described first through hole through.
3. probe according to claim 2, it is characterized in that, described clamp structure also comprises pressure ring and spring, described pressure ring and described spring are all set on the side of described frustum, the internal diameter of described pressure ring and described spring is equal, and the diameter of the bottom surface that the area of frustum is larger described in the internal diameter < of pressure ring and described spring described in the diameter < of the less upper bottom surface of the area of described frustum.
4. probe according to claim 3, it is characterized in that, described pressure ring is than the bottom surface of described spring closer to described frustum, described spring is greater than the height of described frustum under non-stress along the height of the axis direction of described frustum, contacting with one end end face of described insulation course away from one end of described pressure ring of described spring.
5. probe according to claim 4, is characterized in that, also comprises the outer cover be located at outside described clamp structure, and described outer cover inside offers the second through hole, and the second end of described needle body is exposed outside described outer cover through described second through hole;
The inner wall of end of the close described needle body first end of described second through hole is provided with the first screw thread, described insulation course with described spring interface touch one end lateral surface on be provided with the second screw thread, described first screw thread and described second screw thread suitable.
6. probe according to claim 5, is characterized in that, described signal wire also comprises metal screen layer, and it is peripheral that described metal screen layer is wrapped in described insulation course, for shielding external interference signal;
The described outer end covering on close described needle body second end of described second through hole is provided with stationary magazine creel, and the second end of described needle body is exposed outside described stationary magazine creel through described stationary magazine creel, and the diameter of described stationary magazine creel equals the diameter of described needle body.
7. probe according to claim 6, is characterized in that, described outer cover and described stationary magazine creel all adopt isolation material, and described pressure ring and described spring adopt metal material.
8. the probe according to claim 2-7 any one, is characterized in that, described frustum adopts rubber or plastic material.
9. a testing apparatus, is characterized in that, comprises the probe described in claim 1-8 any one.
CN201410725874.3A 2014-12-03 2014-12-03 A kind of probe and test equipment Expired - Fee Related CN104391238B (en)

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CN104391238B CN104391238B (en) 2017-08-04

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105092908A (en) * 2015-06-04 2015-11-25 合肥京东方光电科技有限公司 Test probe and test apparatus
WO2019011126A1 (en) * 2017-07-12 2019-01-17 惠科股份有限公司 Circuit board and detection apparatus thereof
CN111025105A (en) * 2019-12-27 2020-04-17 安徽明诚电力设备安装有限公司 Ring main unit equipment sleeve withstand voltage test device
CN111458540A (en) * 2020-05-22 2020-07-28 上海电连旭晟通信技术有限公司 Connecting device and electronic apparatus
CN111969097A (en) * 2020-10-20 2020-11-20 深圳市Tcl高新技术开发有限公司 LED chip test fixture, method and system and manufacturing method of test fixture

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CN203288680U (en) * 2013-05-13 2013-11-13 张余 Connecting terminal of storage battery
CN203337694U (en) * 2013-05-27 2013-12-11 深圳市策维科技有限公司 Test probe
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CN1518667A (en) * 2000-05-01 2004-08-04 日本发条株式会社 Conductive contactor and electric probe unit
CN2517131Y (en) * 2001-12-31 2002-10-16 浙江久立耐火电缆股份有限公司 Cable terminal binding post
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105092908A (en) * 2015-06-04 2015-11-25 合肥京东方光电科技有限公司 Test probe and test apparatus
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CN111025105A (en) * 2019-12-27 2020-04-17 安徽明诚电力设备安装有限公司 Ring main unit equipment sleeve withstand voltage test device
CN111025105B (en) * 2019-12-27 2021-11-16 安徽明诚电力设备安装有限公司 Ring main unit equipment sleeve withstand voltage test device
CN111458540A (en) * 2020-05-22 2020-07-28 上海电连旭晟通信技术有限公司 Connecting device and electronic apparatus
CN111969097A (en) * 2020-10-20 2020-11-20 深圳市Tcl高新技术开发有限公司 LED chip test fixture, method and system and manufacturing method of test fixture

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