CN104375551A - Band gap voltage generation circuit - Google Patents
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- CN104375551A CN104375551A CN201410687830.6A CN201410687830A CN104375551A CN 104375551 A CN104375551 A CN 104375551A CN 201410687830 A CN201410687830 A CN 201410687830A CN 104375551 A CN104375551 A CN 104375551A
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Abstract
The invention relates to a band gap voltage generation circuit which comprises a biasing circuit and a voltage sampling circuit. The biasing circuit is used for providing first biasing current for a first transistor and providing second biasing current for a second transistor. The emitting electrode of the first transistor is connected with the biasing circuit at a first node so that the biasing circuit can be used for providing first biasing current for the first transistor, and the second transistor is connected with the biasing circuit at a second node so that the biasing circuit can be used for providing second biasing current for the second transistor. According to the voltage sampling circuit, a first sampling capacitor C1 is used for sampling voltage of the first node, a second sampling capacitor C2 is used for sampling the voltage difference of the first node and the second node, and output voltage is obtained on the basis of the voltage of the first sampling capacitor C1 and the voltage of the second sampling capacitor C2. The band gap voltage generation circuit can change output voltage by regulating the voltage distribution ratio, output voltage precision is improved, a small chip area is achieved, and reference voltage with low temperature compensation can be generated.
Description
Technical field
Electronic circuit field of the present invention, particularly relates to a kind of band gap voltage generative circuit.
Background technology
In the prior art, the implementation of band-gap voltage source as shown in Figure 1, in FIG, comprises resistance R1, R2, R3, PNP bipolar transistor Q1 and Q2, operational amplifier OP.Its output voltage VBG is voltage more accurately, and the base emitter voltage Vbe2 of base emitter voltage Vbe1 and Q2 of Q1 is negative temperature coefficient, and the difference of the base emitter voltage Vbe1 of base emitter voltage Vbe2 and Q1 of Q2 is positive temperature coefficient (PTC).Operational amplifier OP adjustment makes node VP voltage equal node VN voltage, so the voltage drop on resistance R3 equals Vbe2-Vbe1, and the electric current of resistance R1 equals the electric current of resistance R3, so the voltage drop on resistance R1 equals
for positive temperature coefficient (PTC) voltage, wherein R1 and R3 adopts identical type resistance, and its temperature coefficient is identical, so R1/R3 does not vary with temperature.Known output voltage VBG equals
the negative temperature coefficient partial-compensation of positive temperature coefficient (PTC) part (Vbe2-Vbe1) and Vbe2 can be realized by designing suitable R1/R3, thus realize the less output voltage VBG of temperature coefficient.But above-mentioned analysis is ideal situation, it does not consider the input imbalance of operational amplifier OP, in actual production, because operational amplifier OP internal components exists inconsistent phenomenon in process, cause different chip chamber, there is some difference for the positive and negative terminal input voltage of operational amplifier OP, and namely there is some difference for VP node and VN node voltage, supposes VP-VN=Vos, wherein VP is VP node voltage, VN is VN node voltage, then Vos just can be, also can be negative.The voltage drop VR1 that the voltage recalculated on R3 is reduced on (Vbe2-Vbe1)-Vos, R1 equals
the voltage of VN equals Vbe2-Vos, VBG=VN+VR1=Vbe2-Vos+ [(Vbe2-Vbe1)-Vos] * R1/R3=(Vbe2-Vbe1) * R1/R3+Vbe2-(R1/R3+1) * Vos, the error that visible Vos causes is-(R1/R3+1) * Vos, Vos is different for the performance of different chip, stochastic distribution, therefore, the input offset voltage of operational amplifier can affect precision and the noisiness of output reference voltage, and therefore this Vos have impact on the precision of output voltage VBG.
Summary of the invention
The object of the invention is the pressure reduction Vos of the positive and negative terminal input voltage solving operational amplifier to the problem of the Accuracy of output voltage VBG.
Embodiments provide a kind of band gap voltage generative circuit, described band gap voltage generative circuit comprises: the first switch controlling signal, second switch control signal, biasing circuit, the first transistor, transistor seconds, voltage sampling circuit;
Described biasing circuit, for providing the first bias current for described the first transistor, for described transistor seconds provides the second bias current;
The emitter of described the first transistor is connected at first node with described biasing circuit, for described biasing circuit for described the first transistor provides the first bias current;
Described transistor seconds is connected at Section Point with described biasing circuit, for described biasing circuit for described transistor seconds provides the second bias current;
Described voltage sampling circuit, comprises the first sampling capacitance C1 and the second sampling capacitance C2,
Utilize the voltage of the first sampling capacitance C1 sampling first node, utilize the voltage difference of the second sampling capacitance C2 sampling first node and Section Point, obtain output voltage based on the voltage on the voltage on the first sampling capacitance C1 and the second sampling capacitance C2.
Preferably, described biasing circuit comprises the first current source I1 and the second current source I2, and described the first transistor is the first bipolar transistor Q1, and described transistor seconds is the second bipolar transistor Q2;
The anode of described first current source I1 is connected to power supply, the anode of described second current source I2 is connected to power supply, the emitter of described first bipolar transistor Q1 is connected with the negative terminal of the first current source I1, ground connection after the collector of described first bipolar transistor Q1 is connected with base stage, the emitter of described second bipolar transistor Q2 is connected with the negative terminal of the second current source I2, and the collector of described second bipolar transistor Q2 is connected rear ground connection with base stage.
Preferably, described voltage sampling circuit comprises: the first K switch 1, second switch K2, the 3rd K switch the 3, four K switch the 4, five K switch 5, first resistance R1, the second resistance R2, the first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3;
Described first K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, described 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of described 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of described 5th K switch 5 is connected with one end of the 3rd sampling capacitance C3, the other end of described 3rd sampling capacitance C3 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3 conducting, described 4th K switch 4, 5th K switch 5 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3 is ended, described 4th K switch 4, 5th K switch 5 conducting, branch pressure voltage VA on described first sampling capacitance C1 and the voltage difference on the second sampling capacitance C2 are sampled on the 3rd sampling capacitance C3, obtain output voltage.
Preferably, described voltage sampling circuit comprises: the 3rd resistance R3, the 4th resistance R4;
Described 3rd resistance R3 and the 4th resistance R4 connects, and one end of described 3rd resistance R3 is connected with Section Point, and one end of described 4th resistance R4 is connected with the base stage of the second bipolar transistor Q2, collector, the 3rd sampling capacitance C3.
Preferably, described voltage sampling circuit comprises: the first K switch 1, second switch K2,3rd K switch the 3, four K switch the 4, five K switch 5,6th K switch the 6, seven K switch the 7, eight K switch 8, first resistance R1, second resistance R2, the first sampling capacitance C1, the second sampling capacitance C2,3rd sampling capacitance C3, the 4th sampling capacitance C4;
Described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, the control end of the 6th K switch 6 is connected with the first switch controlling signal, described 4th K switch 4, 7th K switch 7, the control end of the 8th K switch 8 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of described 5th K switch 5 and first node, the negative terminal of the first current source I1 is connected, the other end of described 5th K switch 5 and one end of the 8th K switch 8, one end of 3rd sampling capacitance C3 is connected, the other end of described 3rd sampling capacitance C3 and one end of the 6th K switch 6, one end of 7th K switch 7 is connected, the other end of described 6th K switch 6 is connected with the negative terminal of the second current source I2, the other end of described 7th K switch 7 is connected between the second sampling capacitance C2 and the 3rd K switch 3, the other end of described 8th switch is connected to one end of the 4th sampling capacitance C4, the other end of described 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 conducting, described 4th K switch 4, 7th K switch 7, 8th K switch 8 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, described second sampling capacitance C2 and the 3rd sampling capacitance C3 is in parallel, the voltage difference of described first node voltage V1 and Section Point voltage V2 be sampled the second sampling capacitance C2, and the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 is ended, described 4th K switch 4, 7th K switch 7, 8th K switch 8 conducting, the branch pressure voltage VA on described first sampling capacitance C1, voltage difference on voltage difference on second sampling capacitance C2 and the 3rd sampling capacitance C3 is sampled on the 4th sampling capacitance C4, obtains output voltage.
Preferably, described voltage sampling circuit comprises: the first K switch 1, second switch K2, the 3rd K switch 3,4th K switch the 4, five K switch 5, first resistance R1, the second resistance R2, first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3, the first sampling capacitance C4;
Described first K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, described 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with the negative terminal of the first current source I 1 after the 3rd sampling capacitance C3, the other end of described 3rd K switch 3 is connected with one end of second switch K2 after the second sampling capacitance C2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between the first sampling capacitance C1 and the first K switch 1, the other end of described 4th K switch 4 is connected between the second sampling capacitance C2 and second switch K2, one end of described 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of described 5th K switch 5 is connected to one end of the 4th sampling capacitance C4, the other end of described 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3 conducting, described 4th K switch 4, 5th K switch 5 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, described second sampling capacitance C2 and described 3rd sampling capacitance series connection, a part for the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, another part of the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3 is ended, described 4th K switch 4, 5th K switch 5 conducting, branch pressure voltage VA on described first sampling capacitance C1, described in another part on voltage difference described in a part on second sampling capacitance C2 and the 3rd sampling capacitance C3, voltage difference is sampled on the 4th sampling capacitance C4, obtain output voltage.
Preferably, the current value of described first current source I1 equals the current value of described second current source I2.
Preferably, the current value of described first current source I1 is greater than the current value of described second current source I2, and the emitter area of the first bipolar transistor Q1 is greater than the area of described first bipolar transistor Q2.
Preferably, the emitter area of described second bipolar transistor Q2 and the area ratio of described first bipolar transistor Q1 are (N
2-1): 1, wherein, N is progression, and N>=3.
Preferably, downsampling factor K=(the R1+R2)/R2 during voltage of described sampling first node, wherein, R1 is the resistance of the first resistance R1, and R2 is the resistance of the second resistance R2.
Band gap voltage generative circuit provided by the invention, owing to not adopting operational amplifier, thus eliminate the impact of the input offset voltage that operational amplifier produces, improve the precision of output voltage VBG, and owing to not adopting operational amplifier, without the need to consuming the larger loop compensation circuit of chip area, so have less chip area; And sub-band gap voltage can be produced, namely produce the reference voltage of lower temperature compensation; And by regulating dividing ratios, and output voltage VBG can be changed.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme of the embodiment of the present invention, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the circuit diagram of band gap voltage generative circuit in prior art;
The circuit diagram of the band gap voltage generative circuit that Fig. 2 provides for the embodiment of the present invention one;
The circuit diagram of the band gap voltage generative circuit that Fig. 3 provides for the embodiment of the present invention two;
The circuit diagram of the band gap voltage generative circuit that Fig. 4 provides for the embodiment of the present invention three;
The circuit diagram of the band gap voltage generative circuit that Fig. 5 provides for the embodiment of the present invention four.
Embodiment
For making the object of the embodiment of the present invention, technical scheme and advantage clearly, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
For ease of the understanding to the embodiment of the present invention, be further explained explanation below in conjunction with accompanying drawing with specific embodiment, embodiment does not form the restriction to the embodiment of the present invention.
In following embodiment, first switch controlling signal is CK1, second switch control signal is CK2, first switch controlling signal is CK1 and second switch control signal be CK2 is not overlapping clock, only show significant level with the first decibel meter, represent inactive level with second electrical level, such as, significant level can be high level " 1 ", and inactive level can be low level " 0 ".
Embodiment one
The circuit diagram of the band gap voltage generative circuit that Fig. 2 provides for the embodiment of the present invention one, as shown in Figure 2, this band gap voltage generative circuit comprises: the first switch controlling signal, second switch control signal, biasing circuit 201, the first transistor 202, voltage sampling circuit 203, transistor seconds 204;
Biasing circuit 201, is connected with power supply, for providing the first bias current for the first transistor, for transistor seconds 204 provides the second bias current, is operated in the range of linearity to make the first transistor 202 and transistor seconds 204; In fig. 2, eliminate power supply, and represent the output voltage of power supply with VIN;
The emitter of the first transistor 202 is connected at first node with biasing circuit 201, for biasing circuit 201 for the first transistor 202 provides the first bias current;
The emitter of transistor seconds 204 is connected at Section Point with biasing circuit 201, for biasing circuit for transistor seconds provides the second bias current;
Voltage sampling circuit 203, comprises the first sampling capacitance C1 and the second sampling capacitance C2,
Utilize the voltage of the first sampling capacitance C1 sampling first node, utilize the voltage difference of the second sampling capacitance C2 sampling first node and Section Point, obtain output voltage based on the voltage on the voltage on the first sampling capacitance C1 and the second sampling capacitance C2.
Particularly, biasing circuit 201 comprises the first current source I1 and the second current source I2, and the first transistor 202 is specially the first bipolar transistor Q1, and transistor seconds 204 is specially the second bipolar transistor Q2; The anode of the first current source I1 is connected to power supply, the anode of the second current source I2 is connected to power supply, the transmitting of the first bipolar transistor Q1 is connected with the negative terminal of the first current source I1, ground connection after the collector of the first bipolar transistor Q1 is connected with base stage, the emitter of the second bipolar transistor Q2 is connected with the negative terminal of the second current source I2, and the collector of the second bipolar transistor Q2 is connected rear ground connection with base stage.
The negative terminal of the first current source I1 is connected at first node with the emitter of the first bipolar transistor Q1, for the first current source I1 for the first bipolar transistor Q1 provides the first bias current, the range of linearity is operated in make the first bipolar transistor Q1, now, first node voltage is V1, the negative terminal of the second current source I2 is connected at Section Point with the emitter of the second bipolar transistor Q2, for the second current source I2 for the second bipolar transistor Q2 provides the second bias current, the range of linearity is operated in make the second bipolar transistor Q2, now, Section Point voltage is V2.
Voltage sampling circuit 203 comprises: the first K switch 1, second switch K2, the 3rd K switch the 3, four K switch the 4, five K switch 5, first resistance R1, the second resistance R2, the first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3;
First K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, described 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, first resistance R1 and the second resistance R2 is connected to the base stage of the first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of the first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of the 5th K switch 5 is connected with one end of the 3rd sampling capacitance C3, the other end of the 3rd sampling capacitance C3 and the base stage of the second bipolar transistor Q2, collector is connected,
When the first switch controlling signal is the first level, when second switch control signal is second electrical level, first K switch 1, second switch K2, 3rd K switch 3 conducting, 4th K switch 4, 5th K switch 5 is ended, first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after the first resistance R1 and the second resistance R2 dividing potential drop, the voltage difference of first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, when the first switch controlling signal is second electrical level, when second switch control signal is the first level, first K switch 1, second switch K2, 3rd K switch 3 is ended, 4th K switch 4, 5th K switch 5 conducting, voltage difference on branch pressure voltage VA on first sampling capacitance C1 and the second sampling capacitance C2 is sampled on the 3rd sampling capacitance C3, obtain output voltage VBG.
Further, the course of work is as follows:
First node voltage V1 equals the emitter base voltage Vbe1 of the first bipolar transistor Q1, Section Point voltage V2 equals the emitter base voltage Vbe2 of the second bipolar transistor Q2, first resistance R1 and the second resistance R2 carries out dividing potential drop to first node voltage V1, dividing ratios meets VA=V1/K, wherein K=(R1+R2)/R2, wherein R1 is the resistance value of resistance R1, R2 is the resistance value of resistance R2, VA is the magnitude of voltage of divider node, when the first switch controlling signal is high level, first K switch 1, second switch K2, 3rd K switch 3 conducting, 4th K switch 4, 5th K switch 5 is ended, the voltage VA of divider node is sampled on the first sampling capacitance C1, i.e. VC1=VA=V1/K=Vbe1/K, wherein VC1 is the voltage on electric capacity C1, the voltage difference V1-V2 of first node and Section Point is sampled on the second sampling capacitance C2, i.e. VC2=V1-V2=Vbe1-Vbe2=Δ Vbe, when second switch control signal CK2 is high level and the first switch controlling signal CK1 is low level, first K switch 1, second switch K2, the 3rd K switch 3 are ended, 4th K switch 4, the 5th K switch 5 conducting, now the first sampling capacitance C1 and the second sampling capacitance C2 connects, and in parallel with the 3rd sampling capacitance C3, be sampled after the voltage superposition of the voltage on the first sampling capacitance C1 and the second sampling capacitance C2 on the 3rd sampling capacitance C3.Now, the voltage VC3=VC1+VC2=Vbe1/K+ Δ Vbe on the 3rd sampling capacitance C3, wherein, Vbe1 is negative temperature coefficient voltage, and Δ Vbe is positive temperature coefficient (PTC) voltage.Therefore, by designing suitable K value, good temperature compensation can be realized.
In a preferred embodiment, the referential data of K is 17.2, but different according to concrete manufacturing process, and optimum K value there are differences.
In another preferred embodiment, the current value of the first current source I1 equals the current value of the second current source I2.
In another preferred embodiment, the current value of the first current source I1 is greater than the current value of the second current source I2, and the emitter area of the second bipolar transistor Q2 is greater than the emitter area of the first bipolar transistor Q1.
In another preferred embodiment, the second bipolar transistor Q2 emitter area is (N with the ratio of the first bipolar transistor Q1 emitter area
2-1): 1, N be more than or equal to 3 progression, better matching effect can be formed when layout design like this.Such as N=3, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 3x3, bosom be the first bipolar transistor Q1, around 8 transistors are the second bipolar transistor Q2; As N=5, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 5x5, bosom be the first bipolar transistor Q1, around 24 transistors are the second bipolar transistor Q2.Now, because the current density of bipolar transistor is proportional to its emitter current, be inversely proportional to its emitter area, therefore, first bipolar transistor Q1 is larger with the ratio of the current density of the second bipolar transistor Q2, and the magnitude of voltage of Δ Vbe is larger, and namely semaphore is larger, it is less that noise accounts for its ratio, and performance is more superior.
The embodiment of the present invention does not adopt operational amplifier, thus eliminate the impact of the input offset voltage that operational amplifier produces, improve the precision of output voltage VBG, and owing to not adopting operational amplifier, without the need to consuming the larger loop compensation circuit of chip area, so have less chip area; And sub-band gap voltage can be produced, namely produce the reference voltage of lower temperature compensation; And by regulating dividing ratios, and output voltage VBG can be changed.
Embodiment two
The circuit diagram of the band gap voltage generative circuit that Fig. 3 provides for the embodiment of the present invention two, as shown in Figure 3, in the present embodiment, compares with Fig. 2, adds the 3rd resistance R3 and the 4th resistance R4.
3rd resistance R3 and the 4th resistance R4 connects, and one end of the 3rd resistance R3 is connected with Section Point, and one end of the 4th resistance R4 is connected with the base stage of the second bipolar transistor Q2, collector, the 3rd sampling capacitance C3.
When the first resistance R1 and the second resistance R2 resistance less time, the electric current of the first resistance R1 and the second resistance R2 meeting partial current source I1, cause the impact of electric current by resistance change of the first bipolar transistor Q1, therefore with the 3rd resistance R3 and the 4th resistance R4 for described first bipolar transistor Q1 provides current compensation, with stabilizing circuit.
When the resistance value of the first resistance R1 and the second resistance R2 design larger time, the first resistance R1 and the second resistance R2 can be ignored to the shunting of the first bipolar transistor Q1, now do not need the 3rd resistance R3 and the 4th resistance R4 to go to carry out current compensation, therefore can remove the 3rd resistance R3 and the 4th resistance R4.As shown in Figure 2, when removing the 3rd resistance R3 and the 4th resistance R4, the area of chip is saved further.
Embodiment three
The circuit diagram of the band gap voltage generative circuit that Fig. 4 provides for the embodiment of the present invention three, as shown in Figure 4, in the diagram, the annexation between biasing circuit 201 and the first transistor 202, transistor seconds 204 is identical with Fig. 2.
The first transistor 202 is specially the first bipolar transistor Q1, and transistor seconds 204 is specially the second bipolar transistor Q2.
First current source I1 provides the first bias current for the first bipolar transistor Q1, the range of linearity is operated in make the first bipolar transistor Q1, now, produce first node voltage V1, second current source I2 provides the second bias current for the second bipolar transistor Q2, to make the second bipolar transistor Q2 be operated in the range of linearity, now, Section Point voltage V2 is produced.
Voltage sampling circuit 203 comprises the first K switch 1, second switch K2, the 3rd K switch 3,4th K switch the 4, five K switch the 5, six K switch 6,7th K switch 7,8th K switch 8, first resistance R1, the second resistance R2, first sampling capacitance C1, second sampling capacitance C2, the 3rd sampling capacitance C3, the 4th sampling capacitance C4;
First K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, the control end of the 6th K switch 6 is connected with the first switch controlling signal CK1, 4th K switch 4, 7th K switch 7, the control end of the 8th K switch 8 is connected with second switch control signal CK2, first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of the first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of described 5th K switch 5 and first node, the negative terminal of the first current source I1 is connected, the other end of described 5th K switch 5 and one end of the 8th K switch 8, one end of 3rd sampling capacitance C3 is connected, the other end of described 3rd sampling capacitance C3 and one end of the 6th K switch 6, one end of 7th K switch 7 is connected, the other end of described 6th K switch 6 is connected with the negative terminal of the second current source I2, the other end of described 7th K switch 7 is connected between the second sampling capacitance C2 and the 3rd K switch 3, the other end of described 8th switch is connected to one end of the 4th sampling capacitance C4, the other end of described 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When the first switch controlling signal is the first level, when second switch control signal is second electrical level, the first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 conducting, the 4th K switch 4, 7th K switch 7, 8th K switch 8 is ended, first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after the first resistance R1 and the second resistance R2 dividing potential drop, second sampling capacitance C2 and the 3rd sampling capacitance C3 is in parallel, the voltage difference of first node voltage V1 and Section Point voltage V2 be sampled the second sampling capacitance C2, and the voltage difference of first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when the first switch controlling signal is second electrical level, when second switch control signal is the first level, the first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 is ended, the 4th K switch 4, 7th K switch 7, 8th K switch 8 conducting, the branch pressure voltage VA on the first sampling capacitance C1, voltage difference on voltage difference on second sampling capacitance C2 and the 3rd sampling capacitance C3 is sampled on the 4th sampling capacitance C4, obtains output voltage VBG.
Further, the course of work is as follows:
First node voltage V1 equals the emitter base voltage Vbe1 of the first bipolar transistor Q1, Section Point voltage V2 equals the emitter base voltage Vbe2 of the second bipolar transistor Q2, first resistance R1 and the second resistance R2 carries out dividing potential drop to first node voltage V1, dividing ratios meets VA=V1/K, wherein K=(R1+R2)/R2, wherein R1 is the resistance value of resistance R1, R2 is the resistance value of resistance R2, VA is the magnitude of voltage of divider node, when the first switch controlling signal is high level, first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 conducting, 4th K switch 4, 7th K switch 7, 8th K switch 8 is ended, the voltage VA of divider node is sampled on the first sampling capacitance C1, i.e. VC1=VA=V1/K=Vbe1/K, wherein VC1 is the voltage on electric capacity C1, because the second sampling capacitance C2 and the 3rd sampling capacitance C3 is in parallel, the voltage difference V1-V2 of first node and Section Point is not only sampled on the second sampling capacitance C2, also be sampled on the 3rd sampling capacitance C3, i.e. VC2=VC3=V1-V2=Vbe1-Vbe2=Δ Vbe, when second switch control signal CK2 is high level and the first switch controlling signal CK1 is low level, first K switch 1, second switch K2, the 3rd K switch 3, the 5th K switch 5, the 6th K switch 6 are ended, 4th K switch 4, the 7th K switch 7, the 8th K switch 8 conducting, now, first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3 connect, and in parallel with the 4th sampling capacitance C4, be sampled on the 4th sampling capacitance C4 after the voltage superposition on the voltage of the voltage on the first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3.Now, the voltage VC4=VC1+VC2+VC3=2* Δ Vbe+Vbe1/K on the 4th sampling capacitance C4, wherein, Vbe1 is negative temperature coefficient voltage, and Δ Vbe is positive temperature coefficient (PTC) voltage.Therefore, by designing suitable K value, good temperature compensation can be realized.
In a preferred embodiment, the referential data of K is 17.2, but different according to concrete manufacturing process, and optimum K value there are differences.
In another preferred embodiment, the current value of the first current source I1 equals the current value of the second current source I2.
In another preferred embodiment, the current value of the first current source I1 is greater than the current value of the second current source I2, and the emitter area of the second bipolar transistor Q2 is greater than the emitter area of the first bipolar transistor Q1.
In another preferred embodiment, the second bipolar transistor Q2 emitter area is (N with the ratio of the first bipolar transistor Q1 emitter area
2-1): 1, N be more than or equal to 3 progression, better matching effect can be formed when layout design like this.Such as N=3, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 3x3, bosom be the first bipolar transistor Q1, around 8 transistors are the second bipolar transistor Q2; As N=5, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 5x5, bosom be the first bipolar transistor Q1, around 24 transistors are the second bipolar transistor Q2.Now, because the current density of bipolar transistor is proportional to its emitter current, be inversely proportional to its emitter area, therefore, first bipolar transistor Q1 is larger with the ratio of the current density of the second bipolar transistor Q2, and the magnitude of voltage of Δ Vbe is larger, and namely semaphore is larger, it is less that noise accounts for its ratio, and performance is more superior.
The embodiment of the present invention does not adopt operational amplifier, thus eliminate the impact of the input offset voltage that operational amplifier produces, improve the precision of output voltage VBG, and owing to not adopting operational amplifier, without the need to consuming the larger loop compensation circuit of chip area, so have less chip area; And sub-band gap voltage can be produced, namely produce the reference voltage of lower temperature compensation; And by regulating dividing ratios, and output voltage VBG can be changed.
Embodiment four
The circuit diagram of the band gap voltage generative circuit that Fig. 5 provides for the embodiment of the present invention four, as shown in Figure 5, in Figure 5, the annexation between biasing circuit 201 and the first transistor 202, transistor seconds 204 is identical with Fig. 2.The first transistor 202 is specially the first bipolar transistor Q1, and transistor seconds 204 is specially the second bipolar transistor Q2.
First current source I1 provides the first bias current for the first bipolar transistor Q1, the range of linearity is operated in make the first bipolar transistor Q1, now, produce first node voltage V1, second current source I2 provides the second bias current for the second bipolar transistor Q2, to make the second bipolar transistor Q2 be operated in the range of linearity, now, Section Point voltage V2 is produced.
Voltage sampling circuit 203 comprises: the first K switch 1, second switch K2, the 3rd K switch the 3, four K switch the 4, five K switch 5, first resistance R1, the second resistance R2, the first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3, the first sampling capacitance C4;
First K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of first K switch 1 is connected between the first resistance R1 and the second resistance R2, the other end of the first K switch 1 is connected to the other end of the first sampling capacitance C1, one end of 3rd K switch 3 is connected with the negative terminal of the first current source I1 after the 3rd sampling capacitance C3, the other end of the 3rd K switch 3 is connected with one end of second switch K2 after the second sampling capacitance C2, the other end of second switch K2 is connected with Section Point, one end of 4th K switch 4 is connected between the first sampling capacitance C1 and the first K switch 1, the other end of the 4th K switch 4 is connected between the second sampling capacitance C2 and second switch K2, one end of 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of the 5th K switch 5 is connected to one end of the 4th sampling capacitance C4, the other end of the 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When the first switch controlling signal is the first level, when second switch control signal is second electrical level, first K switch 1, second switch K2, 3rd K switch 3 conducting, 4th K switch 4, 5th K switch 5 is ended, first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after the first resistance R1 and the second resistance R2 dividing potential drop, second sampling capacitance C2 and described 3rd sampling capacitance series connection, a part for the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, another part of the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when the first switch controlling signal is second electrical level, when second switch control signal is the first level, first K switch 1, second switch K2, 3rd K switch 3 is ended, 4th K switch 4, 5th K switch 5 conducting, branch pressure voltage VA on first sampling capacitance C1, described in another part on voltage difference described in a part on second sampling capacitance C2 and the 3rd sampling capacitance C3, voltage difference is sampled on the 4th sampling capacitance C4, obtain output voltage VBG.
Further, the course of work is as follows:
First node voltage V1 equals the emitter base voltage Vbe1 of the first bipolar transistor Q1, Section Point voltage V2 equals the emitter base voltage Vbe2 of the second bipolar transistor Q2, first resistance R1 and the second resistance R2 carries out dividing potential drop to first node voltage V1, dividing ratios meets VA=V1/K, wherein K=(R1+R2)/R2, wherein R1 is the resistance value of resistance R1, R2 is the resistance value of resistance R2, VA is the branch pressure voltage value of divider node, when the first switch controlling signal is high level, first K switch 1, second switch K2, 3rd K switch 3 conducting, 4th K switch 4, 5th K switch 5 is ended, the voltage VA of divider node is sampled on the first sampling capacitance C1, i.e. VC1=VA=V1/K=Vbe1/K, wherein VC1 is the voltage on the first sampling capacitance C1, because the second sampling capacitance C2 and the 3rd sampling capacitance C3 connects, a part of the voltage difference V1-V2 of first node and Section Point is sampled on the second sampling capacitance C2, another part of the voltage difference V1-V2 of first node and Section Point is sampled on the 3rd sampling capacitance C3, i.e. VC2+VC3=V1-V2=Vbe1-Vbe2=Δ Vbe, wherein VC2 is the voltage on the second sampling capacitance C2, VC3 is the voltage on the 3rd sampling capacitance C3, when second switch control signal CK2 is high level and the first switch controlling signal CK1 is low level, first K switch 1, second switch K2, the 3rd K switch 3 are ended, 4th K switch 4, the 5th K switch 5 are led to, now, first sampling capacitance C1, the second sampling capacitance C2, and in parallel with the 4th sampling capacitance C4, be sampled on the 4th sampling capacitance C4 after the voltage superposition of the voltage on the first sampling capacitance C1, the second sampling capacitance C2.Now, if the resistance of design the second sampling capacitance C2 and the 3rd sampling capacitance C3 is equal, then can learn, described voltage difference is divided equally when connecting by the second sampling capacitance C2 and the 3rd sampling capacitance C3, i.e. VC2=VC3=Δ Vbe/2, now, voltage VC4=VC1+VC2+VC3=1/2* Δ Vbe+Vbe1/K on 4th sampling capacitance C4, wherein, Vbe1 is negative temperature coefficient voltage, and Δ Vbe is positive temperature coefficient (PTC) voltage.Therefore, by designing suitable K value, good temperature compensation can be realized.
In a preferred embodiment, the referential data of K is 17.2, but different according to concrete manufacturing process, and optimum K value there are differences.
In another preferred embodiment, the current value of the first current source I1 equals the current value of the second current source I2.
In another preferred embodiment, the current value of the first current source I1 is greater than the current value of the second current source I2, and the emitter area of the second bipolar transistor Q2 is greater than the emitter area of the first bipolar transistor Q1.
In another preferred embodiment, the second bipolar transistor Q2 emitter area is (N with the ratio of the first bipolar transistor Q1 emitter area
2-1): 1, N be more than or equal to 3 progression, better matching effect can be formed when layout design like this.Such as N=3, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 3x3, bosom be the first bipolar transistor Q1, around 8 transistors are the second bipolar transistor Q2; As N=5, the second bipolar transistor Q2 and the first bipolar transistor Q1 forms the array of 5x5, bosom be the first bipolar transistor Q1, around 24 transistors are the second bipolar transistor Q2.Now, because the current density of bipolar transistor is proportional to its emitter current, be inversely proportional to its emitter area, therefore, first bipolar transistor Q1 is larger with the ratio of the current density of the second bipolar transistor Q2, and the magnitude of voltage of Δ Vbe is larger, and namely semaphore is larger, it is less that noise accounts for its ratio, and performance is more superior.
The embodiment of the present invention does not adopt operational amplifier, thus eliminate the impact of the input offset voltage that operational amplifier produces, improve the precision of output voltage VBG, and owing to not adopting operational amplifier, without the need to consuming the larger loop compensation circuit of chip area, so have less chip area; And sub-band gap voltage can be produced, namely produce the reference voltage of lower temperature compensation; And by regulating dividing ratios, and output voltage VBG can be changed.Existing band-gap circuit limit due to self structure, generally can only produce the output voltage (its exact value is relevant with the emitter area of technique, bipolar transistor) of band gap voltage (about 1.25V), or the integral multiple of band gap voltage.Such as, and by the band gap voltage generative circuit that the application embodiment of the present invention provides, can produce the voltage lower than band gap voltage, 1.25V/K, as K=8.5, output voltage is 0.147V.
It should be noted that, in the circuit of Fig. 4 and Fig. 5, when the first resistance R1 and the second resistance R2 resistance less time, the electric current of the first resistance R1 and the second resistance R2 meeting partial current source I1, cause the impact of electric current by resistance change of the first bipolar transistor Q1, therefore the 3rd resistance R3 and the 4th resistance R4 can be added in figures 4 and 5, think that the first bipolar transistor Q1 provides current compensation, with stabilizing circuit.
Be understandable that, in the circuit of Fig. 2-Fig. 5, can by the electric capacity number increasing number of switches and sample to Δ Vbe, build the reference voltage level of the more Δ Vbe of superposition, so can build VBG=N* Δ Vbe+Vbe1/K, wherein N is positive number.
Professional should recognize further, in conjunction with unit and the algorithm steps of each example of embodiment disclosed herein description, can realize with electronic hardware, computer software or the combination of the two, in order to the interchangeability of hardware and software is clearly described, generally describe composition and the step of each example in the above description according to function.These functions perform with hardware or software mode actually, depend on application-specific and the design constraint of technical scheme.Professional and technical personnel can use distinct methods to realize described function to each specifically should being used for, but this realization should not thought and exceeds scope of the present invention.
Above-described embodiment; object of the present invention, technical scheme and beneficial effect are further described; be understood that; the foregoing is only the specific embodiment of the present invention; the protection domain be not intended to limit the present invention; within the spirit and principles in the present invention all, any amendment made, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. a band gap voltage generative circuit, is characterized in that, described band gap voltage generative circuit comprises: the first switch controlling signal, second switch control signal, biasing circuit, the first transistor, transistor seconds, voltage sampling circuit;
Described biasing circuit, for providing the first bias current for described the first transistor, for described transistor seconds provides the second bias current;
The emitter of described the first transistor is connected at first node with described biasing circuit, for described biasing circuit for described the first transistor provides the first bias current;
Described transistor seconds is connected at Section Point with described biasing circuit, for described biasing circuit for described transistor seconds provides the second bias current;
Described voltage sampling circuit, comprises the first sampling capacitance C1 and the second sampling capacitance C2,
Utilize the voltage of the first sampling capacitance C1 sampling first node, utilize the voltage difference of the second sampling capacitance C2 sampling first node and Section Point, obtain output voltage based on the voltage on the voltage on the first sampling capacitance C1 and the second sampling capacitance C2.
2. band gap voltage generative circuit according to claim 1, is characterized in that, described biasing circuit comprises the first current source I1 and the second current source I2, and described the first transistor is the first bipolar transistor Q1, and described transistor seconds is the second bipolar transistor Q2;
The anode of described first current source I1 is connected to power supply, the anode of described second current source I2 is connected to power supply, the emitter of described first bipolar transistor Q1 is connected with the negative terminal of the first current source I1, ground connection after the collector of described first bipolar transistor Q1 is connected with base stage, the emitter of described second bipolar transistor Q2 is connected with the negative terminal of the second current source I2, and the collector of described second bipolar transistor Q2 is connected rear ground connection with base stage.
3. the band gap voltage generative circuit according to any one of claim 1-2, it is characterized in that, described voltage sampling circuit comprises: the first K switch 1, second switch K2,3rd K switch 3,4th K switch the 4, five K switch 5, first resistance R1, second resistance R2, first sampling capacitance C1, the second sampling capacitance C2, the 3rd sampling capacitance C3;
Described first K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, described 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of described 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of described 5th K switch 5 is connected with one end of the 3rd sampling capacitance C3, the other end of described 3rd sampling capacitance C3 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3 conducting, described 4th K switch 4, 5th K switch 5 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3 is ended, described 4th K switch 4, 5th K switch 5 conducting, branch pressure voltage VA on described first sampling capacitance C1 and the voltage difference on the second sampling capacitance C2 are sampled on the 3rd sampling capacitance C3, obtain output voltage.
4. band gap voltage generative circuit according to claim 3, is characterized in that, described voltage sampling circuit comprises: the 3rd resistance R3, the 4th resistance R4;
Described 3rd resistance R3 and the 4th resistance R4 connects, and one end of described 3rd resistance R3 is connected with Section Point, and one end of described 4th resistance R4 is connected with the base stage of the second bipolar transistor Q2, collector, the 3rd sampling capacitance C3.
5. the band gap voltage generative circuit according to any one of claim 1-2, is characterized in that, described voltage sampling circuit comprises: the first K switch 1, second switch K2, the 3rd K switch the 3, four K switch 4,5th K switch the 5, six K switch the 6, seven K switch 7,8th K switch 8, first resistance R1, the second resistance R2, first sampling capacitance C1, second sampling capacitance C2, the 3rd sampling capacitance C3, the 4th sampling capacitance C4;
Described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, the control end of the 6th K switch 6 is connected with the first switch controlling signal, described 4th K switch 4, 7th K switch 7, the control end of the 8th K switch 8 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with first node, the other end of described 3rd K switch 3 is connected with one end of the second sampling capacitance C2, the other end of described second sampling capacitance C2 is connected with one end of second switch K2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between described first K switch 1 and the first sampling capacitance C1, the other end of described 4th K switch 4 is connected between second switch K2 and the 3rd K switch 3, one end of described 5th K switch 5 and first node, the negative terminal of the first current source I1 is connected, the other end of described 5th K switch 5 and one end of the 8th K switch 8, one end of 3rd sampling capacitance C3 is connected, the other end of described 3rd sampling capacitance C3 and one end of the 6th K switch 6, one end of 7th K switch 7 is connected, the other end of described 6th K switch 6 is connected with the negative terminal of the second current source I2, the other end of described 7th K switch 7 is connected between the second sampling capacitance C2 and the 3rd K switch 3, the other end of described 8th switch is connected to one end of the 4th sampling capacitance C4, the other end of described 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 conducting, described 4th K switch 4, 7th K switch 7, 8th K switch 8 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, described second sampling capacitance C2 and the 3rd sampling capacitance C3 is in parallel, the voltage difference of described first node voltage V1 and Section Point voltage V2 be sampled the second sampling capacitance C2, and the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3, 5th K switch 5, 6th K switch 6 is ended, described 4th K switch 4, 7th K switch 7, 8th K switch 8 conducting, the branch pressure voltage VA on described first sampling capacitance C1, voltage difference on voltage difference on second sampling capacitance C2 and the 3rd sampling capacitance C3 is sampled on the 4th sampling capacitance C4, obtains output voltage.
6. the band gap voltage generative circuit according to any one of claim 1-2, is characterized in that, described voltage sampling circuit comprises: the first K switch 1, second switch K2,3rd K switch the 3, four K switch the 4, five K switch 5, first resistance R1, second resistance R2, the first sampling capacitance C1, the second sampling capacitance C2,3rd sampling capacitance C3, the first sampling capacitance C4;
Described first K switch 1, second switch K2, the control end of the 3rd K switch 3 is connected with the first switch controlling signal, described 4th K switch 4, the control end of the 5th K switch 5 is connected with second switch control signal, described first resistance R1 and the second resistance R2 is connected to the base stage of described first bipolar transistor Q1 after connecting, collector, between one end of first sampling capacitance C1 and first node, one end of described first K switch 1 is connected between described first resistance R1 and the second resistance R2, the other end of described first K switch 1 is connected to the other end of described first sampling capacitance C1, one end of described 3rd K switch 3 is connected with the negative terminal of the first current source I1 after the 3rd sampling capacitance C3, the other end of described 3rd K switch 3 is connected with one end of second switch K2 after the second sampling capacitance C2, the other end of described second switch K2 is connected with Section Point, one end of described 4th K switch 4 is connected between the first sampling capacitance C1 and the first K switch 1, the other end of described 4th K switch 4 is connected between the second sampling capacitance C2 and second switch K2, one end of described 5th K switch 5 is connected between the 3rd K switch 3 and the second sampling capacitance C2, the other end of described 5th K switch 5 is connected to one end of the 4th sampling capacitance C4, the other end of described 4th sampling capacitance C4 and the base stage of the second bipolar transistor Q2, collector is connected,
When described first switch controlling signal is the first level, when described second switch control signal is second electrical level, described first K switch 1, second switch K2, 3rd K switch 3 conducting, described 4th K switch 4, 5th K switch 5 is ended, described first node voltage V1 is sampled on the first sampling capacitance C1 by the branch pressure voltage VA after described first resistance R1 and the second resistance R2 dividing potential drop, described second sampling capacitance C2 and described 3rd sampling capacitance series connection, a part for the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the second sampling capacitance C2, another part of the voltage difference of described first node voltage V1 and Section Point voltage V2 is sampled on the 3rd sampling capacitance C3, when described first switch controlling signal is second electrical level, when described second switch control signal is the first level, described first K switch 1, second switch K2, 3rd K switch 3 is ended, described 4th K switch 4, 5th K switch 5 conducting, branch pressure voltage VA on described first sampling capacitance C1, described in another part on voltage difference described in a part on second sampling capacitance C2 and the 3rd sampling capacitance C3, voltage difference is sampled on the 4th sampling capacitance C4, obtain output voltage.
7. the band gap voltage generative circuit according to any one of claim 1-6, is characterized in that, the current value of described first current source I1 equals the current value of described second current source I2.
8. the band gap voltage generative circuit according to any one of claim 1-6, it is characterized in that, the current value of described first current source I1 is greater than the current value of described second current source I2, and the emitter area of the first bipolar transistor Q1 is greater than the area of described first bipolar transistor Q2.
9. the band gap voltage generative circuit according to any one of claim 1-6, is characterized in that, the emitter area of described second bipolar transistor Q2 and the area ratio of described first bipolar transistor Q1 are (N
2-1): 1, wherein, N is progression, and N>=3.
10. the band gap voltage generative circuit according to any one of claim 1-6, it is characterized in that, downsampling factor K=(the R1+R2)/R2 during voltage of described sampling first node, wherein, R1 is the resistance of the first resistance R1, and R2 is the resistance of the second resistance R2.
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| US20100188141A1 (en) * | 2009-01-26 | 2010-07-29 | Fijitsu Microelectronics Limited | Constant-voltage generating circuit and regulator circuit |
| CN102176188A (en) * | 2011-03-30 | 2011-09-07 | 上海北京大学微电子研究院 | Band-gap reference voltage producing circuit |
| CN104020815A (en) * | 2014-06-13 | 2014-09-03 | 无锡中星微电子有限公司 | Low-detuning band-gap reference source circuit and low-detuning buffer circuit |
| CN203909654U (en) * | 2014-07-01 | 2014-10-29 | 杭州士兰微电子股份有限公司 | Band-gap reference circuit and integrated circuit |
| CN204314764U (en) * | 2014-11-25 | 2015-05-06 | 无锡中星微电子有限公司 | Band gap voltage generative circuit |
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| CN107390756B (en) * | 2016-05-16 | 2018-12-14 | 瑞昱半导体股份有限公司 | Reference voltage buffer circuit |
| CN107817860A (en) * | 2016-09-14 | 2018-03-20 | 中国科学院微电子研究所 | Low pressure band-gap reference circuit and voltage generating circuit |
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| CN111064453B (en) * | 2019-12-13 | 2023-07-04 | 南京中感微电子有限公司 | Voltage comparator |
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