CN104317043B - Analysis objective table - Google Patents
Analysis objective table Download PDFInfo
- Publication number
- CN104317043B CN104317043B CN201410637147.1A CN201410637147A CN104317043B CN 104317043 B CN104317043 B CN 104317043B CN 201410637147 A CN201410637147 A CN 201410637147A CN 104317043 B CN104317043 B CN 104317043B
- Authority
- CN
- China
- Prior art keywords
- platen
- crossbeam
- analysis object
- connection end
- support member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
Abstract
The invention provides an analysis objective table. The analysis objective table is used for solving the problem that the prior art is lack of an analysis objective table used for bearing and fixing samples to be analyzed. A clamping portion capable of moving in the length direction of a table board is used for adjusting the clamping position of a clamping piece according to the sizes of samples to be analyzed, samples to be analyzed are borne and clamped on the analysis objective table, and analysis of various failures can be carried out on samples to be analyzed under analysis tools such as eyepieces and microscopes conveniently.
Description
Technical field
A kind of the present invention relates to display fabrication techniques field, in particular it relates to analysis object stage.
Background technology
At present, liquid crystal electron analyzes a variety of bad of the process generation producing LCDs monomer in industry, including:
1) polaroid is bad, for example, and the foreign body in polaroid and bubble transfinite;
2) circuit board is bad, for example, falls part, rosin joint, adapter bad etc.;
3) backlight former material badness, for example, backlight white point, foreign body, spot etc. are bad.
Because bad point is less, be visually difficult to find that then needs acquisition corresponding analysis sample passes through during these are bad
The analytical tool such as eyepiece or microscope is analyzed.But lack the analysis carrying and fixing above-mentioned sample to be analysed in prior art
Object stage.
Content of the invention
Solve the above problems and be employed technical scheme comprise that a kind of analysis object stage, including:Platen, described platen includes using
In the work surface placing sample to be analysed and the back side relative with described work surface;
Can be along two clamping parts of described platen length direction movement;Described clamping part includes:Positioned at described platen width
The support member of direction both sides, and the crossbeam being rotatably connected with described support member;At least one being fixedly connected with described crossbeam
Individual intermediate plate, described intermediate plate is used for clamping sample to be analysed.
Preferably, described support member is provided with the first connection end;The end of described crossbeam is provided with the second connection end;Described
One connection end and described second connection end are connected by elastic component.
Preferably, described intermediate plate is put with the company with described crossbeam and is included long end and short end for boundary;The intermediate plate of described support sector
Long end be oppositely arranged for clamping sample to be analysed.
Preferably, described second connection end passes the end of described support member located at described crossbeam;Described end is provided with gear
Enclose for fixing described crossbeam in its axial direction;Described second connection end is fixedly connected with described crossbeam.
Preferably, described second connection end is with bolts with described crossbeam.
Preferably, described crossbeam and described back-up ring are provided with the screwed hole matching with described bolt.
Preferably, the side of described platen width is provided with raised line or groove along its length;Described support member sets
There are the groove with described raised line or fit depressions or raised line.
Preferably, described support member is provided with fastening bolt with described platen width side opposite segments, for by institute
State support member and the clamping of described platen.
Preferably, also include base plate, described base plate is located at the reverse side of described platen, and by positioned at described platen width
The two ends in degree direction are fixedly connected with described support member respectively.
Preferably, described platen also includes the leg at two ends on length direction;Described leg is perpendicular to described
Height on back direction is more than described base plate in the thickness on the direction of the described platen back side.
Preferably, described base plate includes the end positioned at described platen width both sides;
Described both ends are provided with the first connection end;The end of described crossbeam is provided with the second connection end;Described first connection
End is connected by elastic component with described second connection end.
Preferably, described elastic component is spring.
Preferably, the work surface of described platen is using the preparation of bakelite material.
The analysis object stage of the present invention, according to the size of sample to be analysed, by moving on the length direction of platen
The clip position to adjust intermediate plate for the clamping part, realize carrying on analysis object stage for the sample to be analysed and clamping, be conducive to
Sample to be analysed carries out various bad analyses under the analytical tool such as eyepiece or microscope.
Brief description
Fig. 1 is the perspective view analyzing object stage in the embodiment of the present invention 1;
Fig. 2 is the perspective view analyzing object stage in the embodiment of the present invention 2;
Description of reference numerals:
1. platen;11. work surfaces;13. grooves;14. legs;
2. clamping part;
21. support members;211. first connection ends;212. raised line;213. fastening bolt;
22. crossbeams;221. second connection ends;222. back-up ring;
23. intermediate plates;231. long ends;232. short end;
3. base plate;4. spring.
Specific embodiment
For making those skilled in the art more fully understand technical scheme, below in conjunction with the accompanying drawings and specific embodiment party
Formula is described in further detail to the present invention.
Embodiment 1:
As shown in figure 1, the present embodiment provides a kind of analysis object stage, including:Platen 1, described platen 1 is included for placing
The work surface 11 of sample to be analysed and the back side (Fig. 1 not shown) relative with described work surface 11;
Can be along two clamping parts 2 of described platen 1 length direction movement;Described clamping part 2 includes:Positioned at described platen 1
The support member 21 of width both sides, and the crossbeam 22 being rotatably connected with described support member 21;Fixing with described crossbeam 22
At least one intermediate plate 23 connecting, described intermediate plate 23 is used for clamping sample to be analysed.
The analysis object stage of the present embodiment according to the size of sample to be analysed, by moving on the length direction of platen 1
The clip position to adjust intermediate plate 23 for the dynamic clamping part 2, realizes carrying on analysis object stage for the sample to be analysed and clamping, has
Carry out various bad analyses beneficial to sample to be analysed under the analytical tool such as eyepiece or microscope.
Preferably, described intermediate plate 23 is put with the company with described crossbeam 22 and is included long end 231 and short end 232 for boundary;Described
The long end 231 holding the intermediate plate 23 in portion is oppositely arranged, for clamping sample to be analysed.
Preferably, described support member 21 is provided with the first connection end 211;The end of described crossbeam 22 is provided with the second connection end
221;Described first connection end 211 and described second connection end 221 are connected by elastic component.Preferably, above-mentioned second connection end
221 pass the end of support member 21 positioned at crossbeam 22, and wherein, the end of described crossbeam 22 is passed through back-up ring 222 and fixed;Preferably,
Described crossbeam 22 and described back-up ring 222 be provided with the screwed hole matching with described bolt.
Above-mentioned second connection end 221 can be bolt, be screwed into back-up ring 222 is fixing by bolt, by consolidating of back-up ring 222
Surely realize crossbeam 22 fixation axially.One end of elastic component connects to this bolt.It should be appreciated that above-mentioned second connects
Connecing end 221 and the connection of crossbeam 22 can also the connected mode such as key/pin.
So after intermediate plate 23 adjusting position, elastic force is delivered to the crossbeam 22 being fixedly connected with this bolt by bolt
On, and it is delivered to the long end 231 of the intermediate plate 23 being fixedly connected with crossbeam 22 by the rotation of crossbeam 22, in long end 231 and platen 1
Work surface 11 between formed clamping, such that it is able to by positioned at treating between the long end 231 of intermediate plate 23 and the work surface 11 of platen 1
Analysis sample clamping.Wherein, crossbeam 22 can be bolted to connection with intermediate plate 23.
For realizing clamping part 2 and platen 1 in the relative movement along along platen 1 length direction, the side of described platen 1 width
Raised line 212 is provided with along its length on face;Described support member 21 is provided with the groove 13 matching with described raised line 212.So convex
Bar 212 and groove 13 form slide rail it is ensured that being mutually shifted along along platen 1 length direction of clamping part 2 and platen 1.It should be understood that
Be it is also possible to the side of platen 1 width arrange groove 13, be provided with corresponding raised line 212 in support member 21.
Preferably, described support member 21 is provided with fastening bolt 213 with described platen 1 width side opposite segments, uses
In described support member 21 and described platen 1 are clamped.It should be appreciated that fastening bolt 213 can be bolt, when support member 21 moves
Move to appropriate location, tighten fastening bolt 213 so that the side with platen 1 of fastening bolt 213 is contacted thus by support member 21 and
Platen 1 is fixing.
Preferably, described platen 1 also includes the leg 14 at two ends on length direction;Described leg 14 is used for supporting table
Plate 1.
Preferably, the work surface 11 of described platen 1 is using the preparation of bakelite material, carries out antistatic design, for print
When the bad analysis such as printed circuit board (PCB) is fixing, prevent electrostatic breakdown.
Embodiment 2
As shown in Fig. 2 the present embodiment provides a kind of analysis object stage, as different from Example 1, analysis object stage also wraps
Include base plate 3, described base plate 3 is located at the reverse side of described platen 1, and by dividing positioned at the two ends of described platen 1 width
It is not fixedly connected with described support member 21.For example, it is possible to be bolted to connection.
Preferably, described platen 1 also includes the leg 14 at two ends on length direction;Described leg 14 is perpendicular to institute
State the height on platen 1 back side direction and be more than described base plate 3 in the thickness on described platen 1 back side direction.So energy
It is that base plate 3 moves freely at the back side of platen 1.
Preferably, described base plate 3 includes the end positioned at described platen 1 width both sides;Described both ends are provided with
First connection end 211, described first connection end 211 is connected by elastic component with described second connection end 221.Preferably, described
Elastic component is spring 4.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (12)
1. a kind of analysis object stage is it is characterised in that include:Platen, described platen includes the work for placing sample to be analysed
Make face and the back side relative with described work surface;
Can be along two clamping parts of described platen length direction movement;Described clamping part includes:Positioned at described platen width
The support member of both sides, and the crossbeam being rotatably connected with described support member;At least one folder being fixedly connected with described crossbeam
Piece, described intermediate plate is used for clamping sample to be analysed;
Described intermediate plate is put with the company with described crossbeam and is included long end and short end for boundary;The long end of the intermediate plate of described clamping part sets relatively
Put for clamping sample to be analysed.
2. analysis object stage as claimed in claim 1 is it is characterised in that described support member is provided with the first connection end;Described
The end of crossbeam is provided with the second connection end;Described first connection end and described second connection end are connected by elastic component.
3. analysis object stage as claimed in claim 2 is it is characterised in that described second connection end passes institute located at described crossbeam
State the end of support member;Described end is provided with back-up ring for fixing described crossbeam in its axial direction;Described second connection end with
Described crossbeam is fixedly connected.
4. analysis object stage as claimed in claim 3 is it is characterised in that described second connection end and described crossbeam adopt bolt
Connect.
5. analysis object stage as claimed in claim 4 is it is characterised in that described crossbeam and described back-up ring are provided with and described spiral shell
The screwed hole that bolt matches.
6. analysis object stage as claimed in claim 1 is it is characterised in that along length side on the side of described platen width
To being provided with raised line or groove;Described support member is provided with groove or raised line with described raised line or fit depressions.
7. as claimed in claim 1 analysis object stage it is characterised in that on described support member with described platen width
Side opposite segments are provided with fastening bolt, for clamping described support member and described platen.
8. it is characterised in that also including base plate, described base plate is located at described platen to analysis object stage as claimed in claim 1
Reverse side, and by being fixedly connected with described support member respectively positioned at the two ends of described platen width.
9. analysis object stage as claimed in claim 8 is it is characterised in that described platen also includes two ends on length direction
Leg;Described leg is more than described base plate perpendicular to the described platen back of the body in the height on the direction of the described platen back side
Thickness on the direction of face.
10. analysis object stage as claimed in claim 8 is it is characterised in that described base plate is included positioned at described platen width side
End to both sides;
Described both ends are provided with the first connection end;The end of described crossbeam is provided with the second connection end;Described first connection end with
Described second connection end is connected by elastic component.
The 11. analysis object stages as described in claim 2 or 10 are it is characterised in that described elastic component is spring.
The 12. analysis object stages as described in any one of claim 1-10 are it is characterised in that the work surface of described platen is to adopt
The preparation of bakelite material.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410637147.1A CN104317043B (en) | 2014-11-05 | 2014-11-05 | Analysis objective table |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410637147.1A CN104317043B (en) | 2014-11-05 | 2014-11-05 | Analysis objective table |
Publications (2)
Publication Number | Publication Date |
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CN104317043A CN104317043A (en) | 2015-01-28 |
CN104317043B true CN104317043B (en) | 2017-02-15 |
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Family Applications (1)
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CN201410637147.1A Expired - Fee Related CN104317043B (en) | 2014-11-05 | 2014-11-05 | Analysis objective table |
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Families Citing this family (3)
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CN205785992U (en) * | 2016-05-20 | 2016-12-07 | 青海师范大学 | A kind of leaf epidermis scraping instrument |
CN107272179A (en) * | 2017-07-05 | 2017-10-20 | 全讯射频科技(无锡)有限公司 | A kind of microscope carrier |
CN112611772B (en) * | 2020-12-02 | 2023-06-30 | 沪东中华造船(集团)有限公司 | Novel XRD asbestos sample detects plummer |
Citations (6)
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CN1163666A (en) * | 1995-07-31 | 1997-10-29 | 莱卡显微及系统有限公司 | Object holder for thin object carriers |
CN2831170Y (en) * | 2005-11-14 | 2006-10-25 | 麦克奥迪实业集团有限公司 | Slide linkage of microscope |
DE102006007197A1 (en) * | 2006-02-10 | 2007-08-16 | Technische Universität Dresden | Arrangement for an optical observation device for the inspection of cell cultures, comprises physiological sensors, which are closely adjacent to the intake area lying in the optical axis of the device and has chamber and container |
WO2011019276A1 (en) * | 2009-08-10 | 2011-02-17 | Technische Universiteit Delft | Method of manufacturing a micro unit and a micro unit for use in a microscope |
CN102313978A (en) * | 2010-06-30 | 2012-01-11 | 索尼公司 | Stage system and microscope |
CN102699724A (en) * | 2012-05-30 | 2012-10-03 | 上海电气核电设备有限公司 | Machining tooling fixture for welding joint tensile sample and clamping and positioning method for machining tooling fixture |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2541300A4 (en) * | 2010-08-06 | 2018-04-18 | NSK Ltd. | Manipulator system and method for manipulating microscopic object to be manipulated |
-
2014
- 2014-11-05 CN CN201410637147.1A patent/CN104317043B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1163666A (en) * | 1995-07-31 | 1997-10-29 | 莱卡显微及系统有限公司 | Object holder for thin object carriers |
CN2831170Y (en) * | 2005-11-14 | 2006-10-25 | 麦克奥迪实业集团有限公司 | Slide linkage of microscope |
DE102006007197A1 (en) * | 2006-02-10 | 2007-08-16 | Technische Universität Dresden | Arrangement for an optical observation device for the inspection of cell cultures, comprises physiological sensors, which are closely adjacent to the intake area lying in the optical axis of the device and has chamber and container |
WO2011019276A1 (en) * | 2009-08-10 | 2011-02-17 | Technische Universiteit Delft | Method of manufacturing a micro unit and a micro unit for use in a microscope |
CN102313978A (en) * | 2010-06-30 | 2012-01-11 | 索尼公司 | Stage system and microscope |
CN102699724A (en) * | 2012-05-30 | 2012-10-03 | 上海电气核电设备有限公司 | Machining tooling fixture for welding joint tensile sample and clamping and positioning method for machining tooling fixture |
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Publication number | Publication date |
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CN104317043A (en) | 2015-01-28 |
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