CN104297737A - Near-field testing equipment of digital array radar antenna and testing method thereof - Google Patents
Near-field testing equipment of digital array radar antenna and testing method thereof Download PDFInfo
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- CN104297737A CN104297737A CN201410576882.6A CN201410576882A CN104297737A CN 104297737 A CN104297737 A CN 104297737A CN 201410576882 A CN201410576882 A CN 201410576882A CN 104297737 A CN104297737 A CN 104297737A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
Abstract
The invention relates to near-field testing equipment of a digital array radar antenna. The near-field testing equipment comprises a near-field testing system and a DBF antenna near-field testing controller. The near-field testing system and the DBF antenna near-field testing controller are in both-way communication. The DBF antenna near-field testing controller and a digital array radar system are in both-way communication. The near-field testing system conducts DBF antenna testing on the digital array radar system through the DBF antenna near-field testing controller. The invention further discloses a testing method of the near-field testing equipment of the digital array radar antenna. By means of the near-field testing equipment of the digital array radar antenna and the testing method thereof, the complete machine performance of the digital array radar system can be directly tested by the near-field testing system, the near-field testing equipment can be directly connected with the digital array radar system in a butt joint mode, the DBF antenna near-field testing controller synchronizes and controls the timing sequence of the digital array radar system, hence, the near-field testing system and the digital array radar system can work cooperatively, and the integrity of the digital array radar system is guaranteed.
Description
Technical field
The present invention relates to radar antenna technical field of measurement and test, especially a kind of near-field test equipment of Digital Array Radar antenna and method of testing thereof.
Background technology
At present, domestic digital beam froming (DBF) directional diagram of method to digital array radar antenna that there is no directly is measured, and calculates DBF directional diagram by means of only outfield correction or radar system internal calibrations.In these two kinds of bearing calibrations, the former is because environment scattering and external interference affect comparatively large, and calibration accuracy and accuracy cannot well be confirmed; The latter needs just can carry out on radar complete machine, and due to the impact of the factors such as the error of self-inspection passage and mutual coupling, in radar machine, the index of self-inspection lobe is possible inconsistent with antenna actual outfield index, needs to revise these errors.
The large-scale near field system of the 35m × 16m only having NSI company of the U.S. to design for TOSHIBA openly reported in the world at present.The 8 railway digital receivers that system is provided by NSI company carry out DBF antenna measurement, but do not have the docking of realization and DBF radar system, greatly reduce the compatibility of test macro and radar system.
For the actual demand of DBF antenna system development task, a set of DBF antenna damnification system that can directly dock with DBF radar machine system must be developed, realize the near-field test diagnosis of DBF antenna, Controlling and compensating.
Summary of the invention
Primary and foremost purpose of the present invention be to provide a kind of can directly and Digital Array Radar system carry out the near-field test equipment of the Digital Array Radar antenna of interoperability test.
For achieving the above object, present invention employs following technical scheme: a kind of near-field test equipment of Digital Array Radar antenna, comprise near field test system, also comprise DBF antenna near-field test controller, both-way communication between near field test system and DBF antenna near-field test controller, both-way communication between DBF antenna near-field test controller and Digital Array Radar system, near field test system carries out DBF antenna measurement by DBF antenna near-field test controller to digital array radar system.
Described DBF antenna near-field test controller divides amplifying circuit, DB37 parallel port circuit, FPGA controller and RJ45 network interface circuit to form by merit, described merit divides the input end of amplifying circuit to be connected with the output terminal of Digital Array Radar system, merit divides amplifying circuit to divide two-way to export, one tunnel is connected with the input end of near field test system, and another road is connected with the first input end of FPGA controller; The input end of described DB37 parallel port circuit is connected with the output terminal of near field test system, the output terminal of DB37 parallel port circuit is connected with the second input end of FPGA controller, FPGA controller respectively with near field test system, RJ45 network interface circuit, the communication of Digital Array Radar system bidirectional, RJ45 network interface circuit and the intrasystem network port circuit both-way communication of Digital Array Radar.
Another object of the present invention is to the method for testing of the near-field test equipment providing a kind of Digital Array Radar antenna, the method comprises the step of following order:
(1) DBF antenna near-field test controller gathers the clock signal of Digital Array Radar system, and sends it near field test system, and this clock signal is as the clock signal of DBF antenna near-field test controller and near field test system;
(2) test starts, and near field test system sends frequency information, ripple position information, test monitoring signal, cloth phase leading signal to Digital Array Radar system by DBF antenna near-field test controller;
(3) in test process, when testing radar accepting state, near field test system sends data acquisition trigger pip by DBF antenna near-field test controller to Digital Array Radar system, number of notifications word array radar system starts to receive Near-field Data, Digital Array Radar system the Near-field Data received is sent near field test system to carry out store, display and processing, complete test; When testing radar emission state, DBF antenna near-field test controller receives the impulse sampling trigger pip that Digital Array Radar system sends, and send it near field test system, notice near field test system starts to carry out Near-field Data collection, near field test system stores the Near-field Data collected, display and processing, completes test.
The merit of described DBF antenna near-field test controller divides the 10MHz IN clock signal of amplifying circuit to digital array radar system to extract, divide after amplification through merit and export respectively to FPGA controller and near field test system, as the clock signal of DBF antenna near-field test controller and near field test system.
The FPGA controller of described DBF antenna near-field test controller is to the D0 of DB37 parallel port circuit---and the information data of D21 position signal i.e. the 1st bit data position D0 to the 22nd bit data position D21 is extracted, 1st bit data position D0 is defined as ripple position information to the 16th bit data position D15,17th bit data position D16 is defined as frequency information to the 22nd bit data position D21, ripple position information and frequency information are sent to Digital Array Radar system by DBF antenna near-field test controller, inform the test mode that Digital Array Radar system is current.
The 23rd bit data position D22 signal of FPGA controller to DB37 parallel port circuit of described DBF antenna near-field test controller extracts, export to Digital Array Radar system after D22 IN signal shaping, Digital Array Radar system is supplied to as test monitoring signal and Monitor OUT signal, test state and non-test state are judged, being test state during low level, is non-test state during high level.
The 24th bit data position D23 signal of FPGA controller to DB37 parallel port circuit of described DBF antenna near-field test controller extracts, export to Digital Array Radar system after D23 IN signal filtering shaping, be supplied to Digital Array Radar system as cloth phase leading signal and Beam Trigger OUT signal, number of notifications word array radar system carries out the switching of frequency, ripple position.
When carrying out reception test to radar system, the data acquisition trigger pip Event IN of described DBF antenna near-field test controller near field test system extracts, export to Digital Array Radar system after filter shape, be supplied to Digital Array Radar system as data acquisition trigger pip Event OUT, number of notifications word array radar system carries out data acquisition; When carrying out transmission test to radar system, the impulse sampling trigger pip Pulse IN of described DBF antenna near-field test controller to digital array radar system extracts, export near field test system after shaping, be supplied near field test system as impulse sampling trigger pip Pulse OUT, notice near field test system carries out data acquisition.
As shown from the above technical solution, present invention achieves the direct test of near field test system to digital array radar system overall performance, solve the difficult problem that Digital Array Radar machine system cannot carry out directly test.The present invention can directly be docked with Digital Array Radar system, by DBF antenna near-field test controller to the control and synchronization of digital array radar system sequential, achieve the collaborative work of near field test system and Digital Array Radar system, reach the object to the test of digital array radar system overall performance, and ensure that the integrality of Digital Array Radar system.
Accompanying drawing explanation
Fig. 1,2 is the circuit block diagram of the present invention and Digital Array Radar system.
Fig. 3 is the circuit timing diagram of DBF antenna near-field test controller in Fig. 1.
Embodiment
A kind of near-field test equipment of Digital Array Radar antenna, comprise near field test system 1, also comprise DBF antenna near-field test controller 3, both-way communication between near field test system 1 and DBF antenna near-field test controller 3, both-way communication between DBF antenna near-field test controller 3 and Digital Array Radar system 2, near field test system 1 carries out DBF antenna measurement by DBF antenna near-field test controller 3 pairs of digital array radar systems 2, as shown in Figure 1.
As shown in Figure 2, described DBF antenna near-field test controller 3 divides amplifying circuit 31, DB37 parallel port circuit 34, FPGA controller 32 and RJ45 network interface circuit 33 to form by merit, described merit divides the input end of amplifying circuit 31 to be connected with the output terminal of Digital Array Radar system 2, merit divides amplifying circuit 31 points of two-way to export, one tunnel is connected with the input end of near field test system 1, and another road is connected with the first input end of FPGA controller 32; The input end of described DB37 parallel port circuit 34 is connected with the output terminal of near field test system 1, the output terminal of DB37 parallel port circuit 34 is connected with the second input end of FPGA controller 32, FPGA controller 32 respectively with near field test system 1, RJ45 network interface circuit 33, Digital Array Radar system 2 both-way communication, RJ45 network interface circuit 33 and the network port circuit both-way communication in Digital Array Radar system 3.Described merit is divided amplifying circuit 31 to be responsible for carrying out merit to the received signal and is divided, samples and amplify; DB37 parallel port circuit 34 is responsible for carrying out to the received signal receiving and transmitting; FPGA controller 32 is responsible for carrying out shaping, filtering, extraction and definition to the received signal.
Described DB37 parallel port circuit 34 containing 24 bit data positions, successively called after the 1st data bit D0, the 2nd data bit D1 ..., the 24th data bit D23; Wherein, the 1st data bit D0 to the 22nd data bit D21 of DB37 parallel port circuit 34 is responsible for the frequency and the ripple position information that receive near field test system 1, and is transferred to Digital Array Radar system 2 through FPGA controller 32, RJ45 network interface circuit 33; The test monitoring signal and the Monitor OUT signal that receive near field test system 1 are responsible in 23rd data bit D22 position of DB37 parallel port circuit 34, and are transferred to Digital Array Radar system 2 through FPGA controller 32; 24th data bit D23 of DB37 parallel port circuit 34 is responsible for the leading signal transmission of cloth phase and the Beam Trigger OUT signal that receive near field test system 1, and is transferred to Digital Array Radar system 2 through FPGA controller 32.
This method of testing comprises: first, DBF antenna near-field test controller 3 gathers the clock signal of Digital Array Radar system 2, and sending it near field test system 1, this clock signal is as the clock signal of DBF antenna near-field test controller 3 and near field test system 1; Secondly, test starts, and near field test system 1 sends frequency information, ripple position information, test monitoring signal, cloth phase leading signal to Digital Array Radar system 2 by DBF antenna near-field test controller 3; Again, in test process, when testing radar accepting state, near field test system 1 sends data acquisition trigger pip by DBF antenna near-field test controller 3 to Digital Array Radar system 2, number of notifications word array radar system 2 starts to receive Near-field Data, the Near-field Data received is sent near field test system 1 carries out storing, display and processing by Digital Array Radar system 2, completes test; When testing radar emission state, DBF antenna near-field test controller 3 receives the impulse sampling trigger pip that Digital Array Radar system 2 sends, and send it near field test system 1, notice near field test system 1 starts to carry out Near-field Data collection, near field test system 1 stores the Near-field Data collected, display and processing, completes test.
Below in conjunction with Fig. 1,2,3 the present invention is further illustrated.
The merit of described DBF antenna near-field test controller 3 divides the 10MHz IN clock signal of amplifying circuit 31 pairs of digital array radar systems 2 to extract, divide after amplification through merit and export respectively to FPGA controller 32 and near field test system 1, as the clock signal of DBF antenna near-field test controller 3 and near field test system 1.Guarantee that near field test system 1 observes timing synchronization with Digital Array Radar system 2, thus realize the quick test of the control of the antenna frequencies of near field test system 1 pair of digital array radar system 2 and ripple position, multifrequency or many ripples position.
The information data of the D0 of FPGA controller 32 pairs of DB37 parallel port circuit 34 of described DBF antenna near-field test controller 3---D21 position signal i.e. the 1st bit data position D0 to the 22nd bit data position D21 is extracted, 1st bit data position D0 is defined as ripple position information to the 16th bit data position D15,17th bit data position D16 is defined as frequency information to the 22nd bit data position D21, ripple position information and frequency information are sent to Digital Array Radar system 2 by DBF antenna near-field test controller 3, inform the test mode that Digital Array Radar system 2 is current.
23rd bit data position D22 signal of FPGA controller 32 pairs of DB37 parallel port circuit 34 of described DBF antenna near-field test controller 3 extracts, export to Digital Array Radar system 2 after D22 IN signal shaping, Digital Array Radar system 2 is supplied to as test monitoring signal and Monitor OUT signal, test state and non-test state are judged, being test state during low level, is non-test state during high level.
24th bit data position D23 signal of FPGA controller 32 pairs of DB37 parallel port circuit 34 of described DBF antenna near-field test controller 3 extracts, export to Digital Array Radar system 2 after D23 IN signal filtering shaping, be supplied to Digital Array Radar system as cloth phase leading signal and Beam Trigger OUT signal, number of notifications word array radar system carries out the switching of frequency, ripple position.Frequency, the switching instant unification of ripple position triggers with cloth phase leading signal, before Event OUT signal arrives, frequency and ripple position has been switched in test process, before in the test process referred to before said test, Event OUT signal arrives, when carrying out reception test to radar system, the data acquisition trigger pip Event IN of described DBF antenna near-field test controller 3 pairs of near field test system 1 extracts, export to Digital Array Radar system 2 after filter shape, Digital Array Radar system 2 is supplied to as data acquisition trigger pip Event OUT, number of notifications word array radar system 2 carries out data acquisition, when carrying out transmission test to radar system, the impulse sampling trigger pip Pulse IN of described DBF antenna near-field test controller 3 pairs of digital array radar systems 2 extracts, export near field test system 1 after shaping, be supplied near field test system 1 as impulse sampling trigger pip Pulse OUT, notice near field test system 1 carries out data acquisition.
Below each signal in the present invention is set forth further.
10MHz IN signal: the clock signal provided by Digital Array Radar system 2, amplitude 5V, frequency is 10MHz.
10MHz OUT signal: clock signal, is provided by DBF antenna near-field test controller 3, and 10MHz OUT signal is that 10MHz IN signal divides after amplification through merit and exports, and be supplied near field test system 1, amplitude 5V, frequency is 10MHz.
D22 IN signal: directly provided by near field test system 1, and the signal being the 23rd bit data position D22 transmission of DB37 parallel port circuit 34.The amplitude of D22 IN signal is 5V, and be test state during low level, be non-test state during high level, signal period, pulsewidth are calculated according to test mode voluntarily by near field test system 1.
Monitor OUT signal: the test monitoring signal provided by DBF antenna near-field test controller 3, for the judgement to test mode and non-test state.Monitor OUT signal is that the 23rd bit data position D22 IN signal of DB37 parallel port circuit 34 exports via after the shaping of DBF antenna near-field test controller 3, is supplied to Digital Array Radar system 2.Cycle, the pulsewidth of Monitor OUT signal are identical with D22 IN, amplitude 3.3V, and being test state during low level, is non-test state during high level.
D23 IN signal: the signal directly provided by near field test system 1, and be responsible for transmission by the 24th bit data position D23 of DB37 parallel port circuit 34.D23 IN signal is positive pulse signal, amplitude 5V, and pulsewidth 10 μ s, the signal period is calculated according to test mode voluntarily by near field test system 1.
Beam Trigger OUT signal: the cloth phase leading signal of radar system, is provided by DBF antenna near-field test controller 3.Beam Trigger OUT signal is that the 24th data bit D23 IN signal of DB37 parallel port circuit 34 exports after DBF antenna near-field test controller 3 filter shape, is supplied to Digital Array Radar system 2.Beam Trigger OUT signal definition is: carry out shaping when Monitor OUT signal is low level to D23 IN signal, and rising edge triggers, and export positive pulse signal, amplitude 3.3V, pulsewidth 10 μ s, the signal period is identical with D23 IN; The no-output when Monitor OUT signal is high level.
Event IN signal: data acquisition trigger pip, is directly provided by near field test system 1.Undersuing, amplitude 5V, pulsewidth 10 μ s, the signal period is calculated according to test mode voluntarily by near field test system 1.
Event OUT signal: data acquisition trigger pip, is provided by DBF antenna near-field test controller 3.Event OUT signal is that Event IN signal exports via after DBF antenna near-field test controller 3 filter shape, is supplied to Digital Array Radar system 2.Event OUT signal definition is: when Monitor OUT signal is low level, carry out anti-phase to Event IN signal, and negative edge triggers, and export positive pulse signal, amplitude 3.3V, pulsewidth 10 μ s, the signal period is identical with Event IN signal; The no-output when Monitor OUT signal is high level.
Pulse IN signal: the impulse sampling trigger pip provided by Digital Array Radar system 2 is positive pulse signal, amplitude 5V, pulsewidth 10 μ s, and periodic regime is 625 μ s to 1000 μ s, and pulse number is 1 to 4.
Pulse OUT signal: the impulse sampling trigger pip provided by DBF antenna near-field test controller 3, Pulse OUT signal exports via after DBF antenna near-field test controller 3 filter shape for the impulse sampling trigger pip Pulse IN signal provided by Digital Array Radar system 2, is supplied near field test system 1.Pulse OUT signal definition is: when Monitor OUT signal is low level, DBF antenna near-field test controller 3 produces amplitude 3.3V, pulsewidth 10 μ s, and the cycle is the positive pulse of 625 μ s; When Monitor OUT signal is high level, carry out shaping to Pulse IN signal, rising edge triggers, and exports positive pulse signal, amplitude 3.3V, pulsewidth 10 μ s, and signal period, pulse number are identical with Pulse IN signal.
Present invention achieves exomonental accurate control, achieve the low-duty-cycle pulses test of radar emission state, solve the near-field test problem of high duty ratio under the full battle array emission state of high power digital array radar antanna, high-average power, high risk.By the control to transponder pulse sequential and number, adopt and only launch the mode of limited pulse in the data acquisition moment, significantly reduce dutycycle and launch average power, having ensured the security of near field test system 1 and Digital Array Radar system 2.
Present invention achieves the real-time control of near field test system 1 pair of digital array radar system 2 sequential.When radar accepting state is tested, data acquisition trigger pip is provided by near field test system 1, realize controlling by DBF antenna near-field test controller 3 pairs of digital array radar systems 2, Digital Array Radar system 2 sends corresponding information according to these trigger pips, amplitude, phase information collection store by near field test system 1, thus complete whole testing process.DBF antenna near-field test controller 3 extracts the frequency of near field test system 1, ripple position information and trigger collection signal and other various control signals, carries out corresponding state setting after compiling according to fixing protocol format by the form number of notifications word array radar system 2 of network interface and TTL pulse.After being provided with, Digital Array Radar system 2 pairs of Near-field Datas gather, and send that near field test system 1 stores accordingly, display and processing to, form the test data of complete set.
In sum, present invention achieves the direct test of near field test system 1 pair of digital array radar system 2 overall performance, solve the difficult problem that Digital Array Radar machine system cannot carry out directly test.The present invention can directly be docked with Digital Array Radar system 2, by the control and synchronization of DBF antenna near-field test controller 3 pairs of digital array radar system 2 sequential, achieve the collaborative work of near field test system 1 and Digital Array Radar system 2, reach the object to the test of digital array radar system 2 overall performance, and ensure that the integrality of Digital Array Radar system 2.
Claims (8)
1. the near-field test equipment of a Digital Array Radar antenna, comprise near field test system, it is characterized in that: also comprise DBF antenna near-field test controller, both-way communication between near field test system and DBF antenna near-field test controller, both-way communication between DBF antenna near-field test controller and Digital Array Radar system, near field test system carries out DBF antenna measurement by DBF antenna near-field test controller to digital array radar system.
2. the near-field test equipment of a kind of Digital Array Radar antenna according to claim 1, it is characterized in that: described DBF antenna near-field test controller divides amplifying circuit, DB37 parallel port circuit, FPGA controller and RJ45 network interface circuit to form by merit, described merit divides the input end of amplifying circuit to be connected with the output terminal of Digital Array Radar system, merit divides amplifying circuit to divide two-way to export, one tunnel is connected with the input end of near field test system, and another road is connected with the first input end of FPGA controller; The input end of described DB37 parallel port circuit is connected with the output terminal of near field test system, the output terminal of DB37 parallel port circuit is connected with the second input end of FPGA controller, FPGA controller respectively with near field test system, RJ45 network interface circuit, the communication of Digital Array Radar system bidirectional, RJ45 network interface circuit and the intrasystem network port circuit both-way communication of Digital Array Radar.
3. a method of testing for the near-field test equipment of Digital Array Radar antenna, is characterized in that the method comprises the step of following order:
(1) DBF antenna near-field test controller gathers the clock signal of Digital Array Radar system, and sends it near field test system, and this clock signal is as the clock signal of DBF antenna near-field test controller and near field test system;
(2) test starts, and near field test system sends frequency information, ripple position information, test monitoring signal, cloth phase leading signal to Digital Array Radar system by DBF antenna near-field test controller;
(3) in test process, when testing radar accepting state, near field test system sends data acquisition trigger pip by DBF antenna near-field test controller to Digital Array Radar system, number of notifications word array radar system starts to receive Near-field Data, Digital Array Radar system the Near-field Data received is sent near field test system to carry out store, display and processing, complete test; When testing radar emission state, DBF antenna near-field test controller receives the impulse sampling trigger pip that Digital Array Radar system sends, and send it near field test system, notice near field test system starts to carry out Near-field Data collection, near field test system stores the Near-field Data collected, display and processing, completes test.
4. the method for testing of the near-field test equipment of a kind of Digital Array Radar antenna according to claim 3, it is characterized in that: the merit of described DBF antenna near-field test controller divides the 10MHz IN clock signal of amplifying circuit to digital array radar system to extract, divide after amplification through merit and export respectively to FPGA controller and near field test system, as the clock signal of DBF antenna near-field test controller and near field test system.
5. the method for testing of the near-field test equipment of a kind of Digital Array Radar antenna according to claim 3, it is characterized in that: the FPGA controller of described DBF antenna near-field test controller is to the D0 of DB37 parallel port circuit---the information data of D21 position signal i.e. the 1st bit data position D0 to the 22nd bit data position D21 is extracted, 1st bit data position D0 is defined as ripple position information to the 16th bit data position D15, 17th bit data position D16 is defined as frequency information to the 22nd bit data position D21, ripple position information and frequency information are sent to Digital Array Radar system by DBF antenna near-field test controller, inform the test mode that Digital Array Radar system is current.
6. the method for testing of the near-field test equipment of a kind of Digital Array Radar antenna according to claim 3, it is characterized in that: the 23rd bit data position D22 signal of FPGA controller to DB37 parallel port circuit of described DBF antenna near-field test controller extracts, export to Digital Array Radar system after D22 IN signal shaping, Digital Array Radar system is supplied to as test monitoring signal and Monitor OUT signal, test state and non-test state are judged, being test state during low level, is non-test state during high level.
7. the method for testing of the near-field test equipment of a kind of Digital Array Radar antenna according to claim 3, it is characterized in that: the 24th bit data position D23 signal of FPGA controller to DB37 parallel port circuit of described DBF antenna near-field test controller extracts, export to Digital Array Radar system after D23 IN signal filtering shaping, be supplied to Digital Array Radar system as cloth phase leading signal and Beam Trigger OUT signal, number of notifications word array radar system carries out the switching of frequency, ripple position.
8. the method for testing of the near-field test equipment of a kind of Digital Array Radar antenna according to claim 3, it is characterized in that: when carrying out reception test to radar system, the data acquisition trigger pip Event IN of described DBF antenna near-field test controller near field test system extracts, export to Digital Array Radar system after filter shape, be supplied to Digital Array Radar system as data acquisition trigger pip Event OUT, number of notifications word array radar system carries out data acquisition; When carrying out transmission test to radar system, the impulse sampling trigger pip Pulse IN of described DBF antenna near-field test controller to digital array radar system extracts, export near field test system after shaping, be supplied near field test system as impulse sampling trigger pip Pulse OUT, notice near field test system carries out data acquisition.
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| CN108594028A (en) * | 2018-05-07 | 2018-09-28 | 北京中微普业科技有限公司 | A kind of antenna near-field test equipment and test system and method |
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| CN107991541A (en) * | 2017-11-27 | 2018-05-04 | 中国电子科技集团公司第三十八研究所 | A kind of near field antenna test control device and its test method |
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