CN104297662A - Torsion ring for microwave device testing - Google Patents
Torsion ring for microwave device testing Download PDFInfo
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- CN104297662A CN104297662A CN201410615870.XA CN201410615870A CN104297662A CN 104297662 A CN104297662 A CN 104297662A CN 201410615870 A CN201410615870 A CN 201410615870A CN 104297662 A CN104297662 A CN 104297662A
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- microwave device
- torsion circle
- torsion
- torsion ring
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Abstract
The invention discloses a torsion ring for microwave device testing, and relates to the technical field of semiconductor device testing. The cross section of the outer ring wall of the torsion ring is circular. The cross section of the inner ring wall of the torsion ring is hexagonal. The inner ring wall and the outer ring wall of the torsion ring are matched with microwave device testing clamp input and output coaxial connector terminals in appearance and size. The torsion ring is made of polytetrafluoroethylene materials. Due to the fact that the polytetrafluoroethylene torsion ring with a reticulate structure is adopted, the problem that a testing clamp is not in tight connection in the testing process is successfully solved, the device testing stability, accuracy and non-destruction are ensured, the manufacturing cost is low, the torsion ring is easy to obtain, and it is ensured that related scientific research and production can be smoothly carried out.
Description
Technical field
The present invention relates to semiconducter device testing technical field.
Background technology
Based semiconductor material can make microwave device, in order to direct current and the microwave property of authentication microwave device, needs to test it.Test process needs to use test fixture, test fixture input, lead-out terminal or be connected with load, or is connected with test macro, realizes direct current and microwave test.Device detection several very important indicator is stability, accuracy, the non-destructive of test, and non-destructive refers to that test process can not cause fixture to damage.If test fixture input, lead-out terminal are connected with system not tight, easily cause test parameter inaccurate, affect measuring accuracy.
In common test, test fixture input, lead-out terminal adopt coaxial fitting form, and the parts that test macro is connected with input, lead-out terminal are also coaxial fitting.The metal spanner adopted realizes the connection of test fixture and test macro coaxial fitting.Because metal spanner and coaxial fitting are peripheral for firmly to contact, layer of metal generally can be electroplated in coaxial fitting periphery, easily causes peripheral metal to come off, and affects the indexs such as coaxial fitting differential loss.Meanwhile, if overexerted, coaxial fitting and test macro can be caused to be difficult to be separated, easily to cause coaxial fitting to be out of shape.If device needs repeatedly to test, use flatiron can cause test fixture test macro reliability decrease frequently, and mechanical damage is caused to device terminal.
Metal spanner cannot be used in the occasion of some narrow spaces, can only manual manipulation be used, operate very inconvenient, simultaneously because hand is firmly limited, cause test fixture coaxial fitting to be connected with test macro coaxial fitting not tight, affect test result accuracy.
Microwave device is the device realizing amplifying microwave signal, when carrying out device microwave test, need to use test fixture to apply certain direct-current working volts and microwave input signal to device, the signal of such as 10dBm, obtain the microwave parameters such as device noise, gain, power, efficiency, if test fixture coaxial fitting is connected not tight with test macro coaxial fitting, device noise coefficient can be caused to be greater than actual value, and gain, power, efficiency test value are less than actual value.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of microwave device test torsion circle, can realize microwave device non-destructive testing, easy to use, and can ensure accuracy and the stability of test result.
For solving the problems of the technologies described above, the technical solution used in the present invention is: a kind of microwave device test torsion circle, the xsect of torsion circle external annulus is circular, the xsect of torsion circle internal ring wall is hexagon, and the coaxial fitting terminal physical dimension inputed or outputed with microwave device test fixture is suitable, the material of described torsion circle is plastics or wooden.
Further, described plastics are polytetrafluoroethylmaterial material.
Further, described torsion circle external annulus surface is provided with resistance reticulate structure.
Further, described circle is concentric with hexagon.
Adopt the beneficial effect that produces of technique scheme to be: the present invention adopts polytetrafluoroethylmaterial material, achieve the compact siro spinning technology of the input of test fixture device, lead-out terminal and test fixture test macro, achieve non-destructive testing.Adopt simultaneously and make reticulate pattern joint in torsion circle periphery, add friction force between hand and torsion circle, test fixture is connected closely with test macro, improve accuracy and the stability of device detection.
Accompanying drawing explanation
Fig. 1 is the structural representation that the present invention overlooks;
Fig. 2 is the left view of Fig. 1;
Fig. 3 is using state schematic diagram of the present invention;
Wherein, 1 torsion circle, 2 torsion circle external annulus, 3 torsion circle internal ring walls, 4 resistance reticulate structures, 5 coaxial male terminal terminals, 6 coaxial negative tab terminals.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is further detailed explanation.
As shown in Figure 1, the present invention is a kind of microwave device test torsion circle, the xsect of torsion circle external annulus 2 is circular, the xsect of torsion circle internal ring wall 3 is hexagon, and the coaxial fitting terminal physical dimension inputed or outputed with microwave device test fixture is suitable, the material of described torsion circle 1 is plastics or wooden; Described plastics are polytetrafluoroethylmaterial material; Described torsion circle external annulus 2 surface is provided with resistance reticulate structure 4; Described circle is concentric with hexagon.
Making of the present invention and use:
1) according to coaxial physical dimension, use polytetrafluoroethylmaterial material, design and make torsion circle;
2) torsion circle is enclosed within test fixture input, exports on coaxial fitting;
3) test fixture coaxial fitting aligns with test macro coaxial fitting;
4) use hand twisting torsion circle, test fixture coaxial fitting is closely connected with test macro coaxial fitting;
Present invention employs polytetrafluoroethylmaterial material, on microwave test without impact; Have employed polytetrafluoroethylmaterial material, it can not cause mechanical damage to test fixture terminal, achieves non-destructive testing; Design process have employed AutoCAD and designs program, and manufacturing process relates to mechanical processing technique; Periphery design has made reticulate structure, increases the friction force between hand and button ring, ensures compact siro spinning technology between test fixture coaxial fitting and test macro coaxial fitting.Present invention employs the teflon torsion circle with reticulate structure, successfully solve the untight problem of connection that test fixture exists in test process, ensure device detection stability, accuracy and non-destructive.The method cost is low, easily realizes, and ensure that related scientific research is produced and carries out smoothly.
Embodiment:
The present invention is applied in GaN HEMT and the test of SiC MESFET microwave device.Embodiment is as described below.
Device and test describe: 1) grid width: 27 mm; 2) test parameter: output power, gain and efficiency under saturation current, 3.2 GHz.
The present invention is applied in GaN HEMT and the test of SiC MESFET microwave device, comprises the steps:
1) according to test fixture input, lead-out terminal (this example is SMA sun head) physical dimension, polytetrafluoroethylmaterial material is used, design torsion circle inner structure;
2) design torsion circle peripheral structure, adopt polytetrafluoroethylmaterial material, make torsion circle;
3) input of torsion circle connecting test fixture, lead-out terminal (this example is the coaxial male terminal terminal 5 of SMA) connecting test system coaxial joint connection (this example is the coaxial negative tab terminal 6 of SMA) is used;
4) microwave device microwave parameters is tested, GaN HEMT voltage 28V, SiC MESFET voltage 60V.Repeated test 10 times, proves microwave device working stability, and test parameter is accurately stable, as shown in table 1, table 2.
Table 1 GaN HEMT test result
Table 2 SiC MESFET test result
Obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Claims (4)
1. a microwave device test torsion circle, it is characterized in that: the xsect of torsion circle external annulus (2) is for circular, the xsect of torsion circle internal ring wall (3) is hexagon, and the coaxial fitting terminal physical dimension inputed or outputed with microwave device test fixture is suitable, the material of described torsion circle (1) is plastics or wooden.
2. a kind of microwave device test torsion circle according to claim 1, is characterized in that: described plastics are polytetrafluoroethylmaterial material.
3. a kind of microwave device test torsion circle according to claim 1, is characterized in that: described torsion circle external annulus (2) surface is provided with resistance reticulate structure (4).
4. a kind of microwave device test torsion circle according to claim 1, is characterized in that: described circle is concentric with hexagon.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410615870.XA CN104297662B (en) | 2014-11-05 | 2014-11-05 | A kind of microwave device test torsion circle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410615870.XA CN104297662B (en) | 2014-11-05 | 2014-11-05 | A kind of microwave device test torsion circle |
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| Publication Number | Publication Date |
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| CN104297662A true CN104297662A (en) | 2015-01-21 |
| CN104297662B CN104297662B (en) | 2018-02-27 |
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| CN201410615870.XA Active CN104297662B (en) | 2014-11-05 | 2014-11-05 | A kind of microwave device test torsion circle |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007019237A (en) * | 2005-07-07 | 2007-01-25 | Tokyo Seimitsu Co Ltd | Probing device for double-sided light emitting element |
| CN201078406Y (en) * | 2007-09-27 | 2008-06-25 | 许晓华 | Connector |
| CN201508371U (en) * | 2009-10-23 | 2010-06-16 | 西安金波科技有限责任公司 | Microstrip type connecting testing clamp |
| CN102095946A (en) * | 2009-12-15 | 2011-06-15 | 日月光封装测试(上海)有限公司 | General electrical testing device for packaging structures |
| CN204142776U (en) * | 2014-11-05 | 2015-02-04 | 中国电子科技集团公司第十三研究所 | A kind of microwave device test torsion circle |
-
2014
- 2014-11-05 CN CN201410615870.XA patent/CN104297662B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007019237A (en) * | 2005-07-07 | 2007-01-25 | Tokyo Seimitsu Co Ltd | Probing device for double-sided light emitting element |
| CN201078406Y (en) * | 2007-09-27 | 2008-06-25 | 许晓华 | Connector |
| CN201508371U (en) * | 2009-10-23 | 2010-06-16 | 西安金波科技有限责任公司 | Microstrip type connecting testing clamp |
| CN102095946A (en) * | 2009-12-15 | 2011-06-15 | 日月光封装测试(上海)有限公司 | General electrical testing device for packaging structures |
| CN204142776U (en) * | 2014-11-05 | 2015-02-04 | 中国电子科技集团公司第十三研究所 | A kind of microwave device test torsion circle |
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| CN104297662B (en) | 2018-02-27 |
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