CN104267220B - A kind of microwave device test hold-down gear - Google Patents
A kind of microwave device test hold-down gear Download PDFInfo
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- CN104267220B CN104267220B CN201410553420.2A CN201410553420A CN104267220B CN 104267220 B CN104267220 B CN 104267220B CN 201410553420 A CN201410553420 A CN 201410553420A CN 104267220 B CN104267220 B CN 104267220B
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- briquetting
- microwave device
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- microwave
- screw
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Abstract
The invention discloses a kind of microwave device test hold-down gear, it is related to semiconducter device testing technical field of tools.The screw that can be fastened with test platform including briquetting and by the screw hole on briquetting, the briquetting insulating materials is constituted, and briquetting bottom surface is provided with the device recesses of the tight raised and microwave device adaptation of microwave device end foot press.The present invention ensure that microwave device is compressed all the time in test process with microstrip line, ensure the stability and accuracy of microwave device test, and the non-destructive of microwave device, simple structure of the present invention, with low cost, highly versatile, it is easily achieved, it is ensured that related scientific research production is smoothed out.
Description
Technical field
The present invention relates to semiconducter device testing technical field of tools.
Background technology
Microwave device can be made using semi-conducting material, in order to verify the direct current and microwave property of microwave device, it is necessary to right
It is tested.Test process needs to use test fixture, and device input, lead-out terminal and the connection of test fixture microstrip line are real
Existing direct current and microwave test.The critically important test index of several of device detection is stability, accuracy, non-destructive, non-destructive
Refer to that test process can not cause device damage.If the connection of input, lead-out terminal and microstrip line closely, does not easily cause device work
Make unstable, test parameter is inaccurate, or even device self-excitation can be caused and burnt.
The connection of microwave device input, lead-out terminal and microstrip line is usually realized using two methods in the prior art.One
The method of kind is to be welded using scolding tin, it is necessary to melting scolding tin using flatiron can just remove device after the completion of this method test, is operated
It is inconvenient, if device needs repeatedly test, test fixture microstrip line reliability decrease frequently can be caused using flatiron,
And machinery and fire damage are caused to device terminal.Another method is that terminal realizes hard contact to the bending of microstrip line direction, this kind of
Method easily causes device terminal mechanical damage, and with the continuous release of bending stress, causes between terminal and microstrip line
Contact can be increasingly not tightr.Microwave device is the device for realizing being amplified microwave signal, is carrying out device direct current survey
, it is necessary to apply certain direct-current working volts, such as 8V, 28V, 36V etc. to device using test fixture during examination, obtain device and satisfy
With the DC parameter such as electric current, pinch-off voltage, if device terminal is connected not closely with microstrip line, saturation current curve can be caused to produce
Raw distortion, test value is less than actual value., it is necessary to apply certain straight to device using test fixture when carrying out device microwave test
Stream operating voltage and microwave input signal, the signal of such as 10dBm obtain the microwaves such as device noise, gain, power, efficiency ginseng
Number, if device terminal is connected not closely with microstrip line, can cause device noise coefficient more than actual value, gain, power, efficiency
Test value is less than actual value.Therefore, if being connected not tight with microstrip line, device job insecurity can be caused, test parameter is not
Accurately, or even device self-excitation can be caused and is burnt.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of microwave device test hold-down gear, ensure that microwave
Device is compressed all the time in test process with microstrip line, it is ensured that the stability and accuracy of microwave device test, and microwave device
The non-destructive of part, simple structure of the present invention, with low cost, highly versatile, is easily achieved, it is ensured that related scientific research production is smoothly entered
OK.
In order to solve the above technical problems, the technical solution used in the present invention is：
A kind of microwave device test hold-down gear, including briquetting and can be tight with test platform by the screw hole on briquetting
Solid screw, the briquetting insulating materials constitutes, and briquetting bottom surface is provided with the tight raised and microwave device adaptation of microwave device end foot press
Device recesses.
Further technical scheme, hole and screw on described briquetting have 2, described positioned at the both ends of briquetting
Projection have 2, positioned at the both sides of device recesses.
Further technical scheme, is additionally provided with fastener above the briquetting, the screw sequentially passes through fastener and pressure
Block.
Further technical scheme, the fastener material therefor is brass.
Further technical scheme, the briquetting upper surface and fastener lower surface are smooth.
Further technical scheme, the insulating materials is polytetrafluoroethylene (PTFE).
It is using the beneficial effect produced by above-mentioned technical proposal：Ensure that microwave device in test process with it is micro-
Band line is compressed all the time, it is ensured that the stability and accuracy of microwave device, and microwave device non-destructive, structure of the present invention letter
Single, with low cost, highly versatile, it is easily achieved, it is ensured that related scientific research production is smoothed out, microwave device can be applied to each
Plant test, such as DC test, microwave test, thermal infrared imager test；Briquetting is provided with holds foot press tightly raised, by end pin and micro-strip
Line is compressed, and increased the tightness between them；Briquetting is made using the polytetrafluoroethylene (PTFE) of insulation, will not be brought to microwave test
Influence, it is to avoid briquetting causes mechanical damage to microwave device terminal；Fastener is applied with certain pressure to the center section of briquetting
Power, it is ensured that the tight projection of end foot press of briquetting will not be using the repeatedly rear deformation that softens, and end foot press is tight raised to microwave device end
The pressure of son will not reduce with increasing for testing time；The material of fastener is brass, improves the radiating of microwave device
Ability.
Brief description of the drawings
Fig. 1 is the structural representation of one embodiment of the invention；
Fig. 2 is the upward view of Fig. 1；
Fig. 3 is the structural representation of fastener in Fig. 1；
In the accompanying drawings：1st, briquetting, 2, fastener, 3, screw, 4, end foot press it is tightly raised, 5, device recesses, 6, screw hole.
Specific embodiment
The present invention is further detailed explanation with reference to the accompanying drawings and detailed description.
As shown in figure 1, a kind of microwave device test hold-down gear, including briquetting 1 and by the screw hole 6 on briquetting 1
The screw 3 that can be fastened with test platform, the briquetting 1 is made up of insulating materials, and it is tight that the bottom surface of briquetting 1 is provided with microwave device end foot press
The device recesses 5 of projection 4 and microwave device adaptation.As shown in Fig. 2 the hole and screw 3 on briquetting 1 have 2, positioned at briquetting 1
Both ends, raised 4 have 2, positioned at the both sides of device recesses 5.Briquetting 1 is additionally provided with fastener 2 above, and the screw 3 is successively
Through the screw hole 6 on fastener 2 and briquetting 1.The material therefor of fastener 2 is brass.The upper surface of briquetting 1 and the following table of fastener 2
Face is smooth.Insulating materials is polytetrafluoroethylene (PTFE).As shown in Figures 2 and 3, briquetting 1 and fastener 2 are cuboid.
When using, microwave device is fixed on the appropriate location of test platform with screw first, makes microwave device end pin
It is connected with microstrip line；Then microwave device is placed in device recesses 5, end foot press tight raised 4 is pressed on the end pin of microwave device,
End foot press tight raised 4 is closely connected with microstrip line, fastener 2 is placed on briquetting 1, with screw 3 by above three device
It is fixed on test platform.
When making the present invention, the true form according to chip under test designs the shape of device recesses 5, and its size is than tested core
The big 1mm in pin side on piece shell.
Below by device detection, using effect of the invention is illustrated.
The briquetting is applied to SiC MESFETT device detections, the mm of device grid width 27, test parameter be saturation current,
Power output, gain and efficiency under 3.2 GHz.Specific test result is as shown in table 1.Test microwave device DC parameter, passes through
Observation test curve, retest 10 times, it was demonstrated that microwave device working stability no-self excitation；Test microwave device microwave parameters, electricity
Pressure 60V.Retest 10 times, it was demonstrated that microwave device working stability, test parameter stabilization is accurate.
The device detection result of table 1
Claims (2)
1. a kind of microwave device test hold-down gear, it is characterised in that including briquetting（1）With by briquetting（1）On screw
Hole（6）The screw that can be fastened with test platform（3）, the briquetting（1）It is made up of insulating materials, briquetting（1）Bottom surface is provided with microwave
Device end foot press is tightly raised（4）The device recesses being adapted to microwave device（5）, described briquetting（1）On hole and screw（3）
There are 2, positioned at briquetting（1）Both ends, described projection（4）There are 2, positioned at device recesses（5）Both sides, it is described
Briquetting（1）Fastener is additionally provided with above（2）, the screw（3）Sequentially pass through fastener（2）And briquetting（1）, the fastener
（2）Material therefor is brass, the briquetting（1）Upper surface and fastener（2）Lower surface is smooth.
2. a kind of microwave device test hold-down gear according to claim 1, it is characterised in that the insulating materials
It is polytetrafluoroethylene (PTFE).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410553420.2A CN104267220B (en) | 2014-10-17 | 2014-10-17 | A kind of microwave device test hold-down gear |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410553420.2A CN104267220B (en) | 2014-10-17 | 2014-10-17 | A kind of microwave device test hold-down gear |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104267220A CN104267220A (en) | 2015-01-07 |
| CN104267220B true CN104267220B (en) | 2017-06-23 |
Family
ID=52158760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410553420.2A Active CN104267220B (en) | 2014-10-17 | 2014-10-17 | A kind of microwave device test hold-down gear |
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| CN (1) | CN104267220B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202485803U (en) * | 2012-03-28 | 2012-10-10 | 中国电子科技集团公司第十三研究所 | Junction temperature testing device for compound semiconductor microwave power chip |
| CN202522671U (en) * | 2011-12-31 | 2012-11-07 | 北京中微普业科技有限公司 | Testing clamp of wide-pin low-impedance large-power power tube |
| CN203519667U (en) * | 2013-10-21 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | Regulating and testing rack for sheet type microwave device |
| CN204142769U (en) * | 2014-10-17 | 2015-02-04 | 中国电子科技集团公司第十三研究所 | A kind of microwave device test hold down gag |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4947111A (en) * | 1989-04-06 | 1990-08-07 | Harris Corporation | Test fixture for multi-GHZ microwave integrated circuits |
| US4980636A (en) * | 1989-08-10 | 1990-12-25 | The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration | Universal nondestructive MM-wave integrated circuit test fixture |
| CN101329363A (en) * | 2007-06-18 | 2008-12-24 | 京元电子股份有限公司 | System and method for testing carrier plate and integrated circuit element |
| CN203811640U (en) * | 2014-05-22 | 2014-09-03 | 湖北蜂鸟科技股份有限公司 | Test fixture applicable to short-circuit test of lithium ion batteries |
-
2014
- 2014-10-17 CN CN201410553420.2A patent/CN104267220B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202522671U (en) * | 2011-12-31 | 2012-11-07 | 北京中微普业科技有限公司 | Testing clamp of wide-pin low-impedance large-power power tube |
| CN202485803U (en) * | 2012-03-28 | 2012-10-10 | 中国电子科技集团公司第十三研究所 | Junction temperature testing device for compound semiconductor microwave power chip |
| CN203519667U (en) * | 2013-10-21 | 2014-04-02 | 中国电子科技集团公司第三十八研究所 | Regulating and testing rack for sheet type microwave device |
| CN204142769U (en) * | 2014-10-17 | 2015-02-04 | 中国电子科技集团公司第十三研究所 | A kind of microwave device test hold down gag |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104267220A (en) | 2015-01-07 |
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