CN104296683B - A kind of method measuring free-curved-surface-type - Google Patents
A kind of method measuring free-curved-surface-type Download PDFInfo
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- CN104296683B CN104296683B CN201410616939.0A CN201410616939A CN104296683B CN 104296683 B CN104296683 B CN 104296683B CN 201410616939 A CN201410616939 A CN 201410616939A CN 104296683 B CN104296683 B CN 104296683B
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- 238000000034 method Methods 0.000 title claims abstract description 17
- 239000012528 membrane Substances 0.000 claims abstract description 19
- 238000005259 measurement Methods 0.000 claims abstract description 16
- 238000005286 illumination Methods 0.000 claims abstract description 14
- 230000003287 optical effect Effects 0.000 claims abstract description 10
- 238000012634 optical imaging Methods 0.000 claims abstract description 9
- 239000000203 mixture Substances 0.000 claims description 9
- 238000002347 injection Methods 0.000 claims description 6
- 239000007924 injection Substances 0.000 claims description 6
- 239000005416 organic matter Substances 0.000 claims description 6
- 230000027756 respiratory electron transport chain Effects 0.000 claims description 6
- 239000000284 extract Substances 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 2
- 238000005424 photoluminescence Methods 0.000 claims 2
- 238000003384 imaging method Methods 0.000 abstract description 4
- 238000000879 optical micrograph Methods 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000007747 plating Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 52
- 239000010408 film Substances 0.000 description 20
- 238000005401 electroluminescence Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 101150030337 CCD7 gene Proteins 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
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CN201410616939.0A CN104296683B (en) | 2014-11-05 | 2014-11-05 | A kind of method measuring free-curved-surface-type |
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CN201410616939.0A CN104296683B (en) | 2014-11-05 | 2014-11-05 | A kind of method measuring free-curved-surface-type |
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CN104296683A CN104296683A (en) | 2015-01-21 |
CN104296683B true CN104296683B (en) | 2016-09-28 |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1105038B1 (en) * | 1998-08-20 | 2002-06-19 | Bioshape AG | Device for determining the surface shape of biological tissue |
CN1474637A (en) * | 2002-08-09 | 2004-02-11 | ��ʽ����뵼����Դ�о��� | Electroluminescence element and luminescent device using it |
CN101105390A (en) * | 2007-08-08 | 2008-01-16 | 北京交通大学 | Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
CN102305601A (en) * | 2011-05-18 | 2012-01-04 | 天津大学 | High-precision non-contact measurement method and device for three-dimensional profile of optical freeform curved surface |
CN102353342A (en) * | 2011-06-13 | 2012-02-15 | 苏州大学 | Free-curved-surface-type detecting system |
CN103090787A (en) * | 2013-01-29 | 2013-05-08 | 哈尔滨工业大学 | Confocal microscopy measuring device based on measured surface fluorescence excitation |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040124421A1 (en) * | 2002-09-20 | 2004-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and manufacturing method thereof |
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2014
- 2014-11-05 CN CN201410616939.0A patent/CN104296683B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1105038B1 (en) * | 1998-08-20 | 2002-06-19 | Bioshape AG | Device for determining the surface shape of biological tissue |
CN1474637A (en) * | 2002-08-09 | 2004-02-11 | ��ʽ����뵼����Դ�о��� | Electroluminescence element and luminescent device using it |
CN101105390A (en) * | 2007-08-08 | 2008-01-16 | 北京交通大学 | Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
CN102305601A (en) * | 2011-05-18 | 2012-01-04 | 天津大学 | High-precision non-contact measurement method and device for three-dimensional profile of optical freeform curved surface |
CN102353342A (en) * | 2011-06-13 | 2012-02-15 | 苏州大学 | Free-curved-surface-type detecting system |
CN103090787A (en) * | 2013-01-29 | 2013-05-08 | 哈尔滨工业大学 | Confocal microscopy measuring device based on measured surface fluorescence excitation |
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CN104296683A (en) | 2015-01-21 |
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Effective date of registration: 20231213 Address after: Room 1107, 11 / F, National University Science Park, Harbin Institute of technology, No. 434, youyou street, Nangang District, Harbin City, Heilongjiang Province, 150001 Patentee after: Liu Jian Patentee after: Zhao Yixuan Patentee after: Harbin Institute of Technology Asset Management Co.,Ltd. Address before: 150001 No. 92 West straight street, Nangang District, Heilongjiang, Harbin Patentee before: HARBIN INSTITUTE OF TECHNOLOGY |
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Effective date of registration: 20240205 Address after: Room 304-2, Building 16, No. 1616, Chuangxin Road, Songbei District, Harbin, Heilongjiang Province, 150001 Patentee after: Rongyi Shangke photoelectric technology (Harbin) Co.,Ltd. Country or region after: China Address before: Room 1107, 11 / F, National University Science Park, Harbin Institute of technology, No. 434, youyou street, Nangang District, Harbin City, Heilongjiang Province, 150001 Patentee before: Liu Jian Country or region before: China Patentee before: Zhao Yixuan Patentee before: Harbin Institute of Technology Asset Management Co.,Ltd. |