CN104280906A - Probe block and detector - Google Patents
Probe block and detector Download PDFInfo
- Publication number
- CN104280906A CN104280906A CN201410523203.9A CN201410523203A CN104280906A CN 104280906 A CN104280906 A CN 104280906A CN 201410523203 A CN201410523203 A CN 201410523203A CN 104280906 A CN104280906 A CN 104280906A
- Authority
- CN
- China
- Prior art keywords
- probe block
- connecting line
- connector
- current device
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Liquid Crystal (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
Abstract
The invention discloses a probe block and a detector. The detector is used for reducing burning risk of the probe block, and utilization rate of the probe block is increased. The probe block comprises a chip on film and a flexible circuit, the chip on film comprises a plurality of first connecting wires overlapped with circuits in a liquid crystal panel welding plate, and the flexible circuit comprises a plurality of second connecting wires connected with circuits in a signal generator. The probe block further comprises a connector, the connector comprises a plurality of third connecting wires correspondingly connected with one first connecting wire and one second connecting wire, at least one of the third connecting wire is provided with an anti-overload current device arranged on the third connecting wires with high-level input, and the anti-overload current device is used for reducing high level or directly disconnecting the third connecting wires.
Description
Technical field
The present invention relates to display, detection technique field, particularly relate to a kind of probe block and pick-up unit.
Background technology
In liquid crystal panel manufacture process, molding process is fitted at the color film glass completed and array glass, the liquid crystal panel of specific dimensions is obtained after cutting, for reducing costs, after one-tenth box, before subsides light polarizing film, counter plate carries out lighting inspection to the selection of most producers, can detect whether liquid crystal panel has bad point in this stage, as: bright spot or dim spot.
When lighting checks, first liquid crystal panel 10 is fixed on and checks on base station, as shown in Figure 1, brilliant film (Chip On Film is covered in probe block 11, COF) 103 overlap with the bonding wire dish (not shown) of liquid crystal panel 10, cover the connection of signal line in brilliant film and liquid crystal panel like this, wherein, COF refers to the crystal grain mantle be fixed on by integrated circuit (Integrated Circuit, IC) in flexible circuit board.COF103 comprises many connecting lines 111, flexible circuit (Flexible Printed Circuit, FPC) 101 comprise many connecting lines 112, connecting line 111 and connecting line 112 connect one to one, when carrying out lighting to liquid crystal panel and checking, the signal generator 12 be connected with FPC 101 lights liquid crystal panel to each connecting line 112 input signal in FPC 101.Because the circuit contraposition in the bonding wire dish of the circuit in COF 103 and liquid crystal panel can not ensure that 100% is accurate, there is minority and occur contraposition deviation, cause the situation of line short, there is the voltage of part signal stronger because signal generator 12 outputs in the signal of FPC 101, and then the voltage being input to COF 103 is also stronger, if now circuit has short circuit phenomenon to exist, burning of COF 103 will be caused.COF burns the phenomenon that rear liquid crystal panel lighting there will be abnormal show, and this phenomenon investigation is more difficult, and adjustment is got up consuming time longer, and the probe block maintenance difficult that another COF burns, the servicing time of probe block is long, and maintenance cost is higher.
In sum, prior art is carried out probe block when lighting checks to liquid crystal panel and is easily burnt, and the probe block maintenance difficult of burning, servicing time is long, and maintenance cost is high.
Summary of the invention
Embodiments provide a kind of probe block and pick-up unit, in order to reduce the risk that probe block burns, improve the utilization factor of probe block.
A kind of probe block that the embodiment of the present invention provides, comprise: cover brilliant film and flexible circuit, describedly cover brilliant film and comprise some the first connecting lines overlapped with the circuit in liquid crystal panel bonding wire dish, described flexible circuit comprises the second connecting line that the is some and connection in signal generator, this probe block also comprises connector
Described connector comprises some three connecting lines of connecting corresponding to the second connecting line described in the first connecting line and described in, and the 3rd connecting line described at least one is provided with preventing over-current device,
Described preventing over-current device is arranged on described 3rd connecting line of high level input, for reducing described high level, or directly disconnects described 3rd connecting line.
The probe block provided by the embodiment of the present invention, because probe block comprises connector, this connector comprises some three connecting lines of connecting corresponding to the second connecting line described in the first connecting line and described in, 3rd connecting line described at least one is provided with preventing over-current device, described preventing over-current device is arranged on described 3rd connecting line of high level input, for reducing described high level, or directly disconnect described 3rd connecting line, when there is deviation in the circuit contraposition in the bonding wire dish of the circuit covered in brilliant film and liquid crystal panel, the level signal being input to and covering brilliant film can be reduced, therefore, can reduce and cover burning of brilliant film, brilliant film is covered in protection, namely the risk that probe block burns is reduced, improve the utilization factor of probe block.
Preferably, described preventing over-current device comprises quota resistance or fuse.
Like this, quota resistance or fuse are more simple, convenient in practical devices design.
Preferably, when described preventing over-current device comprises quota resistance, the level signal on described first connecting line is through the level signal after the reduction of described preventing over-current device.
Like this, the level signal after preventing over-current device reduces is input to and covers in brilliant film, can reduce cover brilliant film burn risk, brilliant film is covered in protection.
Preferably, cover brilliant film described in and also comprise the probe overlapped with the circuit in described liquid crystal panel bonding wire dish.
Like this, overlapped by the bonding wire dish of probe and liquid crystal panel, lighting inspection can be carried out more accurately.
Preferably, described probe block also comprises the probe block shell for the protection of this probe block.
Like this, probe block shell can better protect described probe block.
Preferably, described connector is arranged on described flexible circuit and the described probe block shell covered between brilliant film.
Like this, convenient in actual design, simple.
Preferably, described connector also comprises registration holes and fixed screw, and described probe block shell comprises register pin, and described registration holes and described register pin carry out after contraposition is connected, and described fixed screw is used for fixing described register pin.
Like this, can improve by the design of registration holes, fixed screw and register pin the stability that connector is fixed on probe block shell.
The embodiment of the present invention additionally provides a kind of pick-up unit, comprises detection signal generator, and this device also comprises above-mentioned probe block.
The pick-up unit provided due to the embodiment of the present invention comprises above-mentioned probe block, can reduce the risk that probe block burns, improve the utilization factor of probe block when therefore this device is used for liquid crystal panel lighting inspection.
Accompanying drawing explanation
Fig. 1 is structural representation when probe block that prior art provides checks for liquid crystal panel lighting;
Fig. 2 is structural representation when probe block that the embodiment of the present invention provides checks for liquid crystal panel lighting;
The structural representation of a kind of probe block that Fig. 3 provides for the embodiment of the present invention.
Embodiment
Embodiments provide a kind of probe block and pick-up unit, in order to reduce the risk that probe block burns, improve the utilization factor of probe block.
The probe block that the specific embodiment of the invention provides is introduced in detail below in conjunction with accompanying drawing.
As shown in Figure 2, the specific embodiment of the invention provides a kind of probe block 20, comprise: COF 103 and FPC 101, COF 103 comprises some the first connecting lines 111 overlapped with the circuit in liquid crystal panel bonding wire dish, FPC 101 comprises the second connecting line 112 that the is some and connection in signal generator, this probe block 20 also comprises connector 21, wherein
Connector 21 comprises some with one first connecting line 111 and corresponding the 3rd connecting line 213 connected of one second connecting line 112, at least one 3rd connecting lines 213 are provided with preventing over-current device 22, preventing over-current device 22 is arranged on the 3rd connecting line 213 of high level input, for reducing the high level of input, or directly disconnect the 3rd connecting line 213.
Particularly, as shown in Figure 3, one article of second connecting line 112 in the specific embodiment of the invention in FPC 101 is accurately connected by article the 3rd connecting line 213 of in connector 21 with one article of first connecting line 111 of corresponding position in COF 103.In order to protect probe block, the probe block in the specific embodiment of the invention also comprises probe block shell 30, and preferably, connector 21 is arranged on the probe block shell 30 between FPC 101 and COF 103 by the specific embodiment of the invention.Further, in order to ensure the stability of connector 21, connector 21 in the specific embodiment of the invention also comprises registration holes 31, this registration holes 31 is for carrying out contraposition with the register pin (not shown) of probe block shell 30, and after contraposition, register pin is inserted in this registration holes 31, in order to better fixed connector 21, connector 21 in the specific embodiment of the invention also comprises fixed screw 32, this fixed screw 32 for tightening after register pin inserts registration holes 31, fixed locating stud, ensures the stable of connector 21.
When carrying out lighting and checking, can carry out overlapping to carry out lighting inspection in lighting test zone that is direct by the front end COF 103 of probe block and liquid crystal panel in the specific embodiment of the invention, also can in COF 103 linking probe, overlap to carry out lighting inspection by the lighting test zone of probe and liquid crystal panel, in practical application, overlapped with the testing result of carrying out lighting inspection more accurately by the lighting test zone of probe and liquid crystal panel, but the use of probe can increase testing cost.
When carrying out lighting to liquid crystal panel and checking, if the circuit in the bonding wire dish in the lighting test zone of the circuit in COF 103 and liquid crystal panel occurs that contraposition is unpunctual, can cause line short, especially when short circuit appears in the circuit by high voltage signal, COF 103 will be burnt.And in the specific embodiment of the invention, when signal generator output HIGH voltage signal is to FPC 101, connector 21 in the specific embodiment of the invention can reduce FPC 101 and be input to level signal in COF 103, reduce the risk that probe block burns, and then reduce probe block burn after maintenance cost, reduce servicing time, enhance productivity.
Introduce the principle of work of the connector in the specific embodiment of the invention below, as shown in Figure 3, FPC 101 comprises many connecting lines 112, COF 103 comprises many connecting lines 111, connecting line 111 is connected by the connecting line 213 in connector 21 with connecting line 112, each connecting line 112 connects from the different output terminals of signal generator, and each connecting line 111 overlaps with the circuit in the bonding wire dish of liquid crystal panel, and this bonding wire dish is positioned at the lighting test zone of liquid crystal panel.When the output terminal of signal generator exports high level signal to connecting line 112 in FPC101, in actual applications for the liquid crystal panel made and signal generator, the position of the connecting line 112 receiving high level signal in FPC 101 can be known in advance, because connecting line 111 is connected by the connecting line 213 in connector 21 with connecting line 112, therefore also can know and receive the connecting line 111 of high level signal and the position of connecting line 213, in the specific embodiment of the invention, preventing over-current device 22 is set in connector 21 inside, this device is arranged on the position of the connecting line 213 receiving high level signal, now connecting line 111 is undertaken connecting by the preventing over-current device 22 be arranged on connecting line 213 with the connection of connecting line 112, directly do not connected by connecting line 213.
Preventing over-current device 22 in the specific embodiment of the invention comprises quota resistance or fuse.If when preventing over-current device 22 inside comprises quota resistance, when carrying out lighting to liquid crystal panel and checking, if when there is short circuit by the circuit of high voltage signal, now because preventing over-current device 22 inside comprises quota resistance, the existence of quota resistance can play the effect of dividing potential drop, the electric current when existence of quota resistance makes short circuit in circuit can not improve suddenly, namely the level signal that COF 103 receives is through the level signal after preventing over-current device 22 reduction, can reduce the risk that COF 103 burns.
If when preventing over-current device 22 inside comprises fuse; when carrying out lighting to liquid crystal panel and checking; if when there is short circuit by the circuit of high voltage signal; now because preventing over-current device 22 inside comprises fuse; when the electric current occurred due to short circuit raises suddenly; the phenomenon that fuses instantaneously can be there is in fuse; namely the instantaneous trip circuit that suddenly improve at electric current is understood in the existence of fuse; after cutting off circuit, COF 103 can not receive high level signal for a long time, reaches the object of protection COF 103.
In addition; although the specific embodiment of the invention can not play the effect of protection COF to the circuit not having high voltage signal to input; but when voltage signal is lower; even if be short-circuited phenomenon in circuit; also can not produce larger electric current in circuit, at this moment COF generally can not burn, therefore; when short circuit appears in the circuit inputted not having high voltage signal, too much influence can not be caused to the use of COF.
In the specific embodiment of the invention when abnormal show appears in liquid crystal panel lighting, as long as check the preventing over-current device in each connector, just can be confirmed whether it is the reason that current overload causes, if the reason of current overload, only need to change connector and can remove fault, if the fuse be namely checked through in the preventing over-current device in connector fuses, fuse in connector can be changed to remove fault.Therefore, can reduce by specific embodiments of the invention the fault handling time that probe block burns the abnormal show caused, enhance productivity.
In sum; the specific embodiment of the invention is by a kind of probe block checked for liquid crystal panel lighting newly of design; the direct junction of FPC and COF in original design is changed into and uses connector to carry out the mode connected; this connector is design protection measure on the circuit having high voltage to pass through; when the situation of current overload is issued to the effect protecting COF; the generation of probe block burnout failure can be reduced, reduce the maintenance cost of probe block.
Obviously, those skilled in the art can carry out various change and modification to the present invention and not depart from the spirit and scope of the present invention.Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.
Claims (8)
1. a probe block, comprise: cover brilliant film and flexible circuit, describedly cover brilliant film and comprise some the first connecting lines overlapped with the circuit in liquid crystal panel bonding wire dish, described flexible circuit comprises the second connecting line that the is some and connection in signal generator, it is characterized in that, this probe block also comprises connector
Described connector comprises some three connecting lines of connecting corresponding to the second connecting line described in the first connecting line and described in, and the 3rd connecting line described at least one is provided with preventing over-current device,
Described preventing over-current device is arranged on described 3rd connecting line of high level input, for reducing described high level, or directly disconnects described 3rd connecting line.
2. probe block according to claim 1, is characterized in that, described preventing over-current device comprises quota resistance or fuse.
3. probe block according to claim 2, is characterized in that, when described preventing over-current device comprises quota resistance, the level signal on described first connecting line is through the level signal after the reduction of described preventing over-current device.
4. probe block according to claim 1, is characterized in that, described in cover brilliant film and also comprise the probe overlapped with the circuit in described liquid crystal panel bonding wire dish.
5. probe block according to claim 1, is characterized in that, described probe block also comprises the probe block shell for the protection of this probe block.
6. probe block according to claim 5, is characterized in that, described connector is arranged on described flexible circuit and the described probe block shell covered between brilliant film.
7. probe block according to claim 6, it is characterized in that, described connector also comprises registration holes and fixed screw, and described probe block shell comprises register pin, described registration holes and described register pin carry out after contraposition is connected, and described fixed screw is used for fixing described register pin.
8. a pick-up unit, comprises detection signal generator, it is characterized in that, described device also comprises the probe block described in the arbitrary claim of claim 1-7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410523203.9A CN104280906A (en) | 2014-09-30 | 2014-09-30 | Probe block and detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410523203.9A CN104280906A (en) | 2014-09-30 | 2014-09-30 | Probe block and detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104280906A true CN104280906A (en) | 2015-01-14 |
Family
ID=52255936
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410523203.9A Pending CN104280906A (en) | 2014-09-30 | 2014-09-30 | Probe block and detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104280906A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105277755A (en) * | 2015-11-23 | 2016-01-27 | 上海华岭集成电路技术股份有限公司 | Cantilever type probe system |
| CN106501973A (en) * | 2015-09-04 | 2017-03-15 | De&T株式会社 | The display unit check device lighting unit module control method for movement of flat faced display |
| CN108717159A (en) * | 2018-05-25 | 2018-10-30 | 上海华岭集成电路技术股份有限公司 | A kind of probe card for integrated circuit test and test system protection structure |
| CN113608387A (en) * | 2021-07-30 | 2021-11-05 | 惠科股份有限公司 | Chip on film and display device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1220477A (en) * | 1997-12-13 | 1999-06-23 | 布鲁诺·迪泽公司 | Luminescent material discharge lamp with overcurrent safety device |
| JP2009237280A (en) * | 2008-03-27 | 2009-10-15 | Mitsubishi Electric Corp | Display device |
| CN101592801A (en) * | 2008-05-28 | 2009-12-02 | 乐金显示有限公司 | LCD and restorative procedure thereof |
| TW201017191A (en) * | 2008-10-30 | 2010-05-01 | Lg Display Co Ltd | Auto prove device and method of testing liquid crystal panel using the same |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
| CN102859371A (en) * | 2010-04-14 | 2013-01-02 | 普罗-2000有限公司 | Probe sheet for LCD panel inspection, a probe unit comprising the probe sheet, and a method of manufacturing the probe sheet for LCD panel inspection |
-
2014
- 2014-09-30 CN CN201410523203.9A patent/CN104280906A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1220477A (en) * | 1997-12-13 | 1999-06-23 | 布鲁诺·迪泽公司 | Luminescent material discharge lamp with overcurrent safety device |
| JP2009237280A (en) * | 2008-03-27 | 2009-10-15 | Mitsubishi Electric Corp | Display device |
| CN101592801A (en) * | 2008-05-28 | 2009-12-02 | 乐金显示有限公司 | LCD and restorative procedure thereof |
| TW201017191A (en) * | 2008-10-30 | 2010-05-01 | Lg Display Co Ltd | Auto prove device and method of testing liquid crystal panel using the same |
| CN102859371A (en) * | 2010-04-14 | 2013-01-02 | 普罗-2000有限公司 | Probe sheet for LCD panel inspection, a probe unit comprising the probe sheet, and a method of manufacturing the probe sheet for LCD panel inspection |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106501973A (en) * | 2015-09-04 | 2017-03-15 | De&T株式会社 | The display unit check device lighting unit module control method for movement of flat faced display |
| CN106501973B (en) * | 2015-09-04 | 2019-08-23 | De&T株式会社 | The display unit check device lighting unit module control method for movement of flat-panel monitor |
| CN105277755A (en) * | 2015-11-23 | 2016-01-27 | 上海华岭集成电路技术股份有限公司 | Cantilever type probe system |
| CN108717159A (en) * | 2018-05-25 | 2018-10-30 | 上海华岭集成电路技术股份有限公司 | A kind of probe card for integrated circuit test and test system protection structure |
| CN113608387A (en) * | 2021-07-30 | 2021-11-05 | 惠科股份有限公司 | Chip on film and display device |
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| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20150114 |
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| RJ01 | Rejection of invention patent application after publication |